2SK2175 Silicon N-Channel MOS FET November 1996 Application High speed power switching Features • • • • • • Low on-resistance High speed switching Low drive current 4 V gate drive device can be driven from 5 V source Suitable for Switching regulator, DC-DC converter Avalanche ratings Outline TO-220AB D 1 2 3 1. Gate 2. Drain (Flange) G 3. Source S 2SK2175 Absolute Maximum Ratings (Ta = 25°C) Item Symbol Ratings Unit Drain to source voltage VDSS 60 V Gate to source voltage VGSS ±20 V Drain current ID 15 A 60 A 15 A 10 A 8.5 mJ 30 W Drain peak current ID(pulse)* Body to drain diode reverse drain current IDR Avalanche current Avalanche energy IAP* 3 EAR* 3 2 1 Channel dissipation Pch* Channel temperature Tch 150 °C Storage temperature Tstg –55 to +150 °C Notes 1. PW ≤ 10 µs, duty cycle ≤ 1 % 2. Value at Tc = 25 °C 3. Value at Tch = 25 °C, Rg ≥ 50 Ω 2 2SK2175 Electrical Characteristics (Ta = 25°C) Item Symbol Min Typ Max Unit Test conditions Drain to source breakdown voltage V(BR)DSS 60 — — V ID = 10 mA, VGS = 0 Gate to source breakdown voltage V(BR)GSS ±20 — — V IG = ±100 µA, VDS = 0 Gate to source leak current IGSS — — ±10 µA VGS = ±16 V, VDS = 0 Zero gate voltage drain current IDSS — — 250 µA VDS = 50 V, VGS = 0 Gate to source cutoff voltage 1.0 — 2.25 V ID = 1 mA, VDS = 10 V — 0.10 0.13 Ω ID = 8 A 1 VGS = 10 V* — 0.13 0.18 Ω ID = 8 A 1 VGS = 4 V* VGS(off) Static drain to source on state RDS(on) resistance Forward transfer admittance |yfs| 4.5 8 — S ID = 8 A 1 VDS = 10 V* Input capacitance Ciss — 390 — pF VDS = 10 V VGS = 0 f = 1 MHz Output capacitance Coss — 190 — pF Reverse transfer capacitance Crss — 45 — pF Turn-on delay time td(on) — 10 — ns Rise time tr — 65 — ns Turn-off delay time td(off) — 90 — ns Fall time tf — 90 — ns Body to drain diode forward voltage VDF — 1.3 — V IF = 15 A, VGS = 0 Body to drain diode reverse recovery time trr — 90 — ns IF = 15 A, VGS = 0, diF / dt = 50 A / µs Note ID = 8 A VGS = 10 V RL = 3.75 Ω 1. Pulse Test 3 2SK2175 4 2SK2175 5 2SK2175 6 2SK2175 Avalanche Test Circuit and Waveform V DS Monitor EAR = L 1 2 • L • I AP • 2 I AP Monitor VDSS VDSS – V DD V (BR)DSS I AP Rg D. U. T V DS VDD ID Vin 15 V 50Ω 0 VDD 7 2SK2175 Normalized Transient Thermal Impedance vs. Pulse Width Normalized Transient Thermal Impedance γ s (t) 3 Tc = 25°C 1 D=1 0.5 0.3 0.2 0.1 θ ch – c(t) = γ s (t) • θ ch – c θ ch – c = 4.16 °C/W, Tc = 25 °C 0.1 0.05 0.03 PDM 0.02 1 lse 0.0 t pu o h 1s 0.01 10 µ D= PW T PW T 100 µ 1m 10 m Pulse Width 100 m 1 Switching Time Test Circuit Waveform Vout Monitor Vin Monitor 10 PW (S) 90% D.U.T. RL Vin Vin 10 V 50Ω V DD = 30 V Vout 10% 10% 90% td(on) 8 tr 10% 90% td(off) tf 2SK2175 Notice When using this document, keep the following in mind: 1. This document may, wholly or partially, be subject to change without notice. 2. All rights are reserved: No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without Hitachi’s permission. 3. Hitachi will not be held responsible for any damage to the user that may result from accidents or any other reasons during operation of the user’s unit according to this document. 4. Circuitry and other examples described herein are meant merely to indicate the characteristics and performance of Hitachi’s semiconductor products. Hitachi assumes no responsibility for any intellectual property claims or other problems that may result from applications based on the examples described herein. 5. No license is granted by implication or otherwise under any patents or other rights of any third party or Hitachi, Ltd. 6. MEDICAL APPLICATIONS: Hitachi’s products are not authorized for use in MEDICAL APPLICATIONS without the written consent of the appropriate officer of Hitachi’s sales company. Such use includes, but is not limited to, use in life support systems. Buyers of Hitachi’s products are requested to notify the relevant Hitachi sales offices when planning to use the products in MEDICAL APPLICATIONS. 9