BSS 98 SIPMOS ® Small-Signal Transistor • N channel • Enhancement mode • Logic Level • VGS(th) = 0.8...1.6 V Pin 1 Pin 2 S Pin 3 G Type VDS ID RDS(on) Package Marking BSS 98 50 V 0.3 A 3.5 Ω TO-92 SS98 Type BSS 98 BSS 98 BSS 98 Ordering Code Q62702-S053 Q62702-S517 Q62702-S635 D Tape and Reel Information E6288 E6296 E6325 Maximum Ratings Parameter Symbol Drain source voltage VDS V Drain-gate voltage Values 50 V DGR RGS = 20 kΩ 50 Gate source voltage VGS ± 14 Gate-source peak voltage,aperiodic Vgs ± 20 Continuous drain current ID TA = 25 °C A 0.3 IDpuls DC drain current, pulsed TA = 25 °C 1.2 Ptot Power dissipation TA = 25 °C Semiconductor Group Unit W 0.63 1 12/05/1997 BSS 98 Maximum Ratings Parameter Symbol Values Unit Chip or operating temperature Tj -55 ... + 150 °C Storage temperature Tstg -55 ... + 150 Thermal resistance, chip to ambient air 1) RthJA ≤ 200 DIN humidity category, DIN 40 040 K/W E IEC climatic category, DIN IEC 68-1 55 / 150 / 56 Electrical Characteristics, at Tj = 25°C, unless otherwise specified Parameter Symbol Values min. typ. Unit max. Static Characteristics Drain- source breakdown voltage V(BR)DSS VGS = 0 V, ID = 0.25 mA, Tj = 25 °C V 50 - - 0.8 1.2 1.6 VDS = 50 V, VGS = 0 V, Tj = 25 °C - 0.05 0.5 VDS = 50 V, VGS = 0 V, Tj = 125 °C - - 5 VDS = 30 V, VGS = 0 V, Tj = 25 °C - - 100 Gate threshold voltage VGS(th) VGS=VDS, ID = 1 mA Zero gate voltage drain current Gate-source leakage current IDSS IGSS VGS = 20 V, VDS = 0 V Drain-Source on-state resistance - 10 100 Ω RDS(on) - 1.8 3.5 VGS = 4.5 V, ID = 0.3 A - 2.8 6 2 nA nA VGS = 10 V, ID = 0.3 A Semiconductor Group µA 12/05/1997 BSS 98 Electrical Characteristics, at Tj = 25°C, unless otherwise specified Parameter Symbol Values min. typ. Unit max. Dynamic Characteristics Transconductance gfs VDS≥ 2 * ID * RDS(on)max, ID = 0.3 A Input capacitance 0.12 pF - 40 55 - 15 25 - 5 8 Crss VGS = 0 V, VDS = 25 V, f = 1 MHz Turn-on delay time - Coss VGS = 0 V, VDS = 25 V, f = 1 MHz Reverse transfer capacitance 0.23 Ciss VGS = 0 V, VDS = 25 V, f = 1 MHz Output capacitance S td(on) ns VDD = 30 V, VGS = 10 V, ID = 0.29 A RG = 50 Ω Rise time - 5 8 - 6 9 - 12 16 - 15 20 tr VDD = 30 V, VGS = 10 V, ID = 0.29 A RG = 50 Ω Turn-off delay time td(off) VDD = 30 V, VGS = 10 V, ID = 0.29 A RG = 50 Ω Fall time tf VDD = 30 V, VGS = 10 V, ID = 0.29 A RG = 50 Ω Semiconductor Group 3 12/05/1997 BSS 98 Electrical Characteristics, at Tj = 25°C, unless otherwise specified Symbol Values Parameter min. typ. Unit max. Reverse Diode Inverse diode continuous forward current IS TA = 25 °C Inverse diode direct current,pulsed - 0.3 - - 1.2 VSD VGS = 0 V, IF = 0.6 A Semiconductor Group - ISM TA = 25 °C Inverse diode forward voltage A V - 4 1 1.4 12/05/1997 BSS 98 Power dissipation Ptot = ƒ(TA) Drain current ID = ƒ(TA) parameter: VGS ≥ 10 V 0.32 0.70 W A 0.60 Ptot ID 0.55 0.24 0.50 0.45 0.20 0.40 0.16 0.35 0.30 0.12 0.25 0.20 0.08 0.15 0.10 0.05 0.00 0 0.04 20 40 60 80 100 120 °C 160 0.00 0 20 40 60 80 100 120 TA °C 160 TA Safe operating area ID=f(VDS) Drain-source breakdown voltage V(BR)DSS = ƒ(Tj) parameter : D = 0.01, TC=25°C 60 V 58 V(BR)DSS 57 56 55 54 53 52 51 50 49 48 47 46 45 -60 -20 20 60 100 °C 160 Tj Semiconductor Group 5 12/05/1997 BSS 98 Typ. output characteristics ID = ƒ(VDS) parameter: tp = 80 µs , Tj = 25 °C 0.70 Typ. drain-source on-resistance RDS (on) = ƒ(ID) parameter: tp = 80 µs, Tj = 25 °C 11 Ptot = 1W A lk i h j 0.60 ID a b Ω g VGS [V] a 2.0 0.55 f 0.50 0.45 0.40 e 0.35 0.30 b 2.5 c 3.0 d 3.5 e 4.0 f 4.5 g 5.0 h 6.0 d i 7.0 0.25 j 8.0 0.20 k 9.0 l 10.0 c RDS (on) c d e f 9 8 7 6 5 4 0.15 3 g 2 h i kl j 0.10 VGS [V] = b 0.05 a 0.00 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 1 V 0 0.00 5.0 a 2.0 b 2.5 c 3.0 0.10 d 3.5 e f 4.0 4.5 0.20 g 5.0 0.30 h i 6.0 7.0 0.40 VDS k l 9.0 10.0 A 0.60 ID Typ. transfer characteristics ID = f(VGS) parameter: tp = 80 µs VDS≥ 2 x ID x RDS(on)max Typ. forward transconductance gfs = f (ID) parameter: tp = 80 µs, VDS≥2 x ID x RDS(on)max 0.65 ID j 8.0 0.30 A S 0.55 0.26 gfs 0.50 0.24 0.22 0.45 0.20 0.40 0.18 0.35 0.16 0.30 0.14 0.25 0.12 0.10 0.20 0.08 0.15 0.06 0.10 0.04 0.05 0.00 0 1 2 3 Semiconductor Group 4 5 6 7 8 V VGS 10 6 0.02 0.00 0.00 0.10 0.20 0.30 0.40 A ID 0.55 12/05/1997 BSS 98 Drain-source on-resistance RDS (on) = ƒ(Tj) parameter: ID = 0.3 A, VGS = 10 V Gate threshold voltage VGS (th) = ƒ(Tj) parameter: VGS = VDS, ID = 1 mA 9 2.6 Ω V 2.2 RDS (on) VGS(th) 7 2.0 1.8 6 98% 1.6 5 1.4 98% typ 1.2 4 1.0 3 2% 0.8 typ 0.6 2 0.4 1 0.2 0 -60 -20 20 60 100 °C 0.0 -60 160 -20 20 60 100 °C Tj 160 Tj Typ. capacitances C = f (VDS) parameter:VGS=0V, f = 1 MHz Forward characteristics of reverse diode IF = ƒ(VSD) parameter: Tj, tp = 80 µs 10 3 10 1 pF A IF C 10 2 10 0 Ciss Coss 10 1 10 -1 Tj = 25 °C typ Tj = 150 °C typ Crss Tj = 25 °C (98%) Tj = 150 °C (98%) 10 0 0 5 10 Semiconductor Group 15 20 25 30 V VDS 40 10 -2 0.0 0.4 0.8 1.2 1.6 2.0 2.4 V 3.0 VSD 7 12/05/1997