SCAS689 − FEBRUARY 2003 D Phase-Lock Loop Clock Driver for Double D D D D D D D Enters Low-Power Mode When No CLK Data-Rate Synchronous DRAM Applications Spread Spectrum Clock Compatible Operating Frequency: 60 MHz to 200 MHz Low Jitter (cycle-cycle): ±50 ps Low Static Phase Offset: ±50 ps Low Jitter (Period): ±35 ps Distributes One Differential Clock Input to 10 Differential Outputs D D D D D Input Signal Is Applied or PWRDWN Is Low Operates From Dual 2.5-V Supplies Available in a 48-Pin TSSOP Package or 56-Ball MicroStar Junior BGA Package Consumes < 100-µA Quiescent Current External Feedback Pins (FBIN, FBIN) Are Used to Synchronize the Outputs to the Input Clocks Meets/Exceeds the Latest DDR JEDEC Spec JESD82−1 description The CDCV857B is a high-performance, low-skew, low-jitter zero delay buffer that distributes a differential clock input pair (CLK, CLK) to 10 differential pairs of clock outputs (Y[0:9], Y[0:9]) and one differential pair of feedback clock outputs (FBOUT, FBOUT). The clock outputs are controlled by the clock inputs (CLK, CLK), the feedback clocks (FBIN, FBIN), and the analog power input (AVDD). When PWRDWN is high, theoutputs switch in phase and frequency with CLK. When PWRDWN is low, all outputs are disabled to a high-impedance state (3-state) and the PLL is shut down (low-power mode). The device also enters this low-power mode when the input frequency falls below a suggested detection frequency that is below 20 MHz (typical 10 MHz). An input frequency detection circuit detects the low frequency condition and, after applying a >20-MHz input signal, this detection circuit turns the PLL on and enables the outputs. When AVDD is strapped low, the PLL is turned off and bypassed for test purposes. The CDCV857B is also able to track spread spectrum clocking for reduced EMI. Since the CDCV857B is based on PLL circuitry, it requires a stabilization time to achieve phase-lock of the PLL. This stabilization time is required following power up. The CDCV857B is characterized for both commercial and industrial temperature ranges. AVAILABLE OPTIONS TA 0°C to 85°C TSSOP (DGG) MicroStar Junior BGA (GQL) CDCV857BDGG CDCV857BGQL −40°C to 85°C CDCV857BIGG — FUNCTION TABLE (Select Functions) INPUTS OUTPUTS PLL AVDD GND PWRDWN CLK CLK Y[0:9] Y[0:9] FBOUT FBOUT H L H L H L H Bypassed/Off GND H H L H L H L Bypassed/Off X L L H Z Z Z Z Off X L H L Z Z Z Z Off 2.5 V (nom) H L H L H L H On 2.5 V (nom) H H L H L H L On 2.5 V (nom) X <20 MHz <20 MHz Z Z Z Z Off Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. MicroStar Junior is a trademark of Texas Instruments Incorporated. Copyright 2003, Texas Instruments Incorporated ! " #$%! " &$'(#! )!% )$#!" # ! "&%##!" &% !*% !%" %+" "!$%!" "!)) ,!- )$#! &#%"". )%" ! %#%""(- #($)% !%"!. (( &%!%" POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 1 SCAS689 − FEBRUARY 2003 5 44 6 43 7 42 8 41 9 40 10 39 11 38 12 37 13 36 14 35 15 34 16 33 17 32 18 31 19 30 20 29 21 28 22 27 23 26 24 25 2 Y5 GND V DDQ Y5 5 6 A Y1 Y1 B Y6 Y6 C NC GND GND Y2 Y2 VDDQ VDDQ CLK CLK D NC NC GND GND NC Y7 Y7 NC E F NC NC G NC NC H NC NC PWRDN VDDQ FBIN FBIN VDDQ FBOUT VDDQ AVDD AGND GND Y3 Y3 POST OFFICE BOX 655303 FBOUT GND J Y8 Y8 K • DALLAS, TEXAS 75265 Y9 45 4 Y9 4 3 GND 46 2 V DDQ 47 3 1 GND 2 GND Y5 Y5 VDDQ Y6 Y6 GND GND Y7 Y7 VDDQ PWRDWN FBIN FBIN VDDQ FBOUT FBOUT GND Y8 Y8 VDDQ Y9 Y9 GND V DDQ 48 Y4 1 Y4 GND Y0 Y0 VDDQ Y1 Y1 GND GND Y2 Y2 VDDQ VDDQ CLK CLK VDDQ AVDD AGND GND Y3 Y3 VDDQ Y4 Y4 GND V DDQ GND DGG PACKAGE (TOP VIEW) Y0 Y0 MicroStar Junior (GQL) Package (TOP VIEW) SCAS689 − FEBRUARY 2003 functional block diagram 3 2 PWRDWN AVDD 5 37 16 6 Power Down and Test Logic 10 9 20 19 22 23 46 47 CLK CLK FBIN FBIN 13 44 14 36 43 PLL 39 35 40 29 30 27 26 32 33 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 Y0 Y0 Y1 Y1 Y2 Y2 Y3 Y3 Y4 Y4 Y5 Y5 Y6 Y6 Y7 Y7 Y8 Y8 Y9 Y9 FBOUT FBOUT 3 SCAS689 − FEBRUARY 2003 Terminal Functions TERMINAL NAME AGND DGG GQL 17 H1 AVDD CLK, CLK 16 G2 13, 14 F1, F2 FBIN, FBIN 35, 36 FBOUT, FBOUT 32, 33 1, 7, 8, 18, 24, 25, 31, 41, 42, 48 A3, A4, C1, C2, C5, C6, H2, H5, K3, K4 GND PWRDWN DESCRIPTION Ground for 2.5-V analog supply 2.5-V Analog supply I Differential clock input F5, F6 I Feedback differential clock input H6, G5 O Feedback differential clock output Ground 37 E6 VDDQ 4, 11, 12, 15, 21, 28, 34, 38, 45 B3, B4, E1, E2, E5, G1, G6, J3, J4 I Output enable for Y and Y Y[0:9] 3, 5, 10, 20, 22, 27, 29, 39, 44, 46 A1, B2, D1, J2, K1, A6, B5, D6, J5, K6 O Buffered output copies of input clock, CLK Y[0:9] 2, 6, 9, 19, 23, 26, 30, 40, 43, 47 A2, B1, D2, J1, K2, A5, B6, D5, J6, K5 O Buffered output copies of input clock, CLK 2.5-V Supply absolute maximum ratings over operating free-air temperature (unless otherwise noted)† Supply voltage range, VDDQ, AVDD . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.5 V to 3.6 V Input voltage range, VI (see Notes 1 and 2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to VDDQ + 0.5 V Output voltage range, VO (see Notes 1 and 2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to VDDQ + 0.5 V Input clamp current, IIK (VI < 0 or VI > VDDQ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±50 mA Output clamp current, IOK (VO < 0 or VO > VDDQ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±50 mA Continuous output current, IO (VO = 0 to VDDQ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±50 mA Continuous current to GND or VDDQ . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±100 mA Package thermal impedance, θJA (see Note 3): GQL package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 137.6°C/W Storage temperature range Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to 150°C † Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. NOTES: 1. The input and output negative voltage ratings may be exceeded if the input and output clamp current ratings are observed. 2. This value is limited to 3.6 V maximum. 3. The package thermal impedance is calculated in accordance with JESD 51. 4 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 SCAS689 − FEBRUARY 2003 recommended operating conditions (see Note 4) MIN VDDQ AVDD Supply voltage TYP MAX 2.3 2.7 V VDDQ − 0.12 2.7 V −0.3 VDDQ/2 – 0.18 0.7 V CLK, CLK, FBIN, FBIN Low-level input voltage, VIL PWRDWN CLK, CLK, FBIN, FBIN High-level input voltage, VIH PWRDWN VDDQ/2 + 0.18 1.7 DC input signal voltage (see Note 5) VDDQ + 0.3 VDDQ + 0.3 –0.3 Differential input signal voltage, VID (see Note 6) dc CLK, FBIN 0.36 ac CLK, FBIN 0.7 Input differential pair cross voltage, VIX (see Note 7) VDDQ + 0.6 VDDQ + 0.6 VDDQ/2 – 0.2 VDDQ/2 + 0.2 −12 High-level output current, IOH Low-level output current, IOL Input slew rate, SR Commercial Operating free-air temperature, TA UNIT Industrial V V V V mA 12 mA 1 4 V/ns 0 85 −40 85 °C NOTES: 4. The unused inputs must be held high or low to prevent them from floating. 5. The dc input signal voltage specifies the allowable dc execution of the differential input. 6. The differential input signal voltage specifies the differential voltage |VTR − VCP| required for switching, where VTR is the true input level and VCP is the complementary input level. 7. The differential cross-point voltage is expected to track variations of VCC and is the voltage at which the differential signals must be crossing. electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS VIK Input voltage All inputs VOH High-level output voltage VOL Low-level output voltage VOD Output voltage swing} VOX Output differential cross-voltagew II IOZ Input current High-impedance state output current IDDPD Power-down current on VDDQ + AVDD AIDD Supply current on AVDD VDDQ = 2.3 V, II = –18 mA VDDQ = min to max, IOH = –1 mA VDDQ = 2.3 V, IOH = –12 mA VDDQ = min to max, IOL = 1 mA MIN TYP† UNIT –1.2 V VDDQ – 0.1 1.7 V 0.1 VDDQ = 2.3 V, IOL = 12 mA Differential outputs are terminated with 120 Ω /CL = 14 pF (See Figure 3) MAX 0.6 1.1 V VDDQ – 0.4 V VDDQ/2 – 0.15 VDDQ = 2.7 V, VI = 0 V to 2.7 V VDDQ = 2.7 V, VO= VDDQ or GND CLK and CLK = 0 MHz; PWRDWN = Low; Σ of IDD and AIDD fO = 170 MHz fO = 200 MHz VDDQ/2 VDDQ/2 + 0.15 ±10 µA ±10 µA 20 100 µA 7 10 9 12 mA CI Input capacitance VDDQ = 2.5 V, VI = VDDQ or GND 2 2.5 3.5 pF † All typical values are at a respective nominal VDDQ. ‡ The differential output signal voltage specifies the differential voltage VTR − VCP, where VTR is the true output level and VCP is the complementary output level. § The differential cross-point voltage is expected to track variations of VDDQ and is the voltage at which the differential signals must be crossing. The frequency range is 100 MHz to 200 MHz. POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 5 SCAS689 − FEBRUARY 2003 electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) (continued) TYP† MAX fO = 170 MHz fO = 200 MHz 100 110 105 120 Differential outputs terminated with 120 Ω/CL = 0 pF fO = 170 MHz 200 240 fO = 200 MHz 210 250 Differential outputs terminated with 120 Ω/CL = 14 pF fO = 170 MHz 260 300 fO = 200 MHz 280 320 PARAMETER TEST CONDITIONS Without load IDD Dynamic current on VDDQ MIN UNIT mA ∆C Part-to-part input capacitance variation VDDQ = 2.5 V, VI = VDDQ or GND 1 pF CI(∆) Input capacitance difference between CLK and CLKB, FBIN, and FBINB VDDQ = 2.5 V, VI = VDDQ or GND 0.25 pF 3.5 pF CO Output capacitance VDDQ = 2.5 V, VO = VDDQ or GND † All typical values are at a respective nominal VDDQ. 2.5 3 timing requirements over recommended ranges of supply voltage and operating free-air temperature MIN MAX UNIT 60 200 MHz 40% 60% Operating clock frequency fCLK Application clock frequency Input clock duty cycle Stabilization time{ (PLL mode) Stabilization time} (Bypass mode) 10 µs 30 ns † The time required for the integrated PLL circuit to obtain phase lock of its feedback signal to its reference signal. For phase lock to be obtained, a fixed-frequency, fixed-phase reference signal must be present at CLK and VDD must be applied. Until phase lock is obtained, the specifications for propagation delay, skew, and jitter parameters given in the switching characteristics table are not applicable. This parameter does not apply for input modulation under SSC application. ‡ A recovery time is required when the device goes from power-down mode into bypass mode (AVDD at GND). switching characteristics PARAMETER tPLHw tPHLw tjit(per)W TEST CONDITIONS TYP Low to high level propagation delay time Test mode/CLK to any output 3.5 High-to low level propagation delay time Test mode/CLK to any output 3.5 Jitter (period), See Figure 7 tjit(cc)W Jitter (cycle-to-cycle), See Figure 4 tjit(hper)W Half-period jitter, See Figure 8 tslr(o) Output clock slew rate, See Figure 9 Static phase offset, See Figure 5 tsk(o) Output skew, See Figure 6 ns ns 60 ps ps 100/133/167/200 MHz −35 35 66 MHz −75 75 100/133/167/200 MHz −50 50 −100 100 −75 75 100/133/167/200 MHz Load: 120 Ω/14 pF 100/133/167/200 MHz 1 2 –100 100 –50 50 Load: 120 Ω/14 pF tr, tf Output rise and fall times (20% − 80%) Load: 120 Ω/14 pF § Refers to the transition of the noninverting output. ¶ This parameter is assured by design but can not be 100% production tested. POST OFFICE BOX 655303 UNIT −60 66 MHz t(Ø) MAX 66 MHz 66 MHz 6 MIN • DALLAS, TEXAS 75265 70 600 ps ps V/ns ps 100 ps 900 ps SCAS689 − FEBRUARY 2003 PARAMETER MEASUREMENT INFORMATION VDD VYx R = 60 Ω R = 60 Ω VDD/2 VYx CDCV857B GND Figure 1. IBIS Model Output Load VDD/2 CDCV857B C = 14 pF R = 10 Ω Z = 60 Ω SCOPE −VDD/2 Z = 50 Ω R = 50 Ω V(TT) Z = 60 Ω R = 10 Ω Z = 50 Ω C = 14 pF R = 50 Ω V(TT) −VDD/2 V(TT) = GND −VDD/2 Figure 2. Output Load Test Circuit POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 7 SCAS689 − FEBRUARY 2003 VDD CDCV857B C = 14 pF PROBE GND Z = 60 Ω C = 1 pF R = 120 Ω R = 1 MΩ V(TT) Z = 60 Ω C = 1 pF C = 14 pF R = 1 MΩ V(TT) GND V(TT) = GND GND Figure 3. Output Load Test Circuit for Crossing Point Yx, FBOUT Yx, FBOUT tc(n) tc(n+1) tjit(cc) = tc(n) − tc(n+1) Figure 4. Cycle-to-Cycle Jitter 8 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 SCAS689 − FEBRUARY 2003 PARAMETER MEASUREMENT INFORMATION CLK CLK FBIN FBIN t( ) n ∑1 t ( ) n+1 n=N t( ) = t( ) n N (N > 1000 Samples) Figure 5. Phase Offset Yx Yx Yx, FBOUT Yx, FBOUT tsk(o) Figure 6. Output Skew POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 9 SCAS689 − FEBRUARY 2003 PARAMETER MEASUREMENT INFORMATION Yx, FBOUT Yx, FBOUT tc(n) Yx, FBOUT Yx, FBOUT 1 fo tjit(per) = tcn − 1 fo fO = Average input frequency measured at CLK/CLK Figure 7. Period Jitter Yx, FBOUT Yx, FBOUT t(hper_n+1) t(hper_n) 1 fo tjit(hper) = t(hper_n) − 1 2xfo n = any half cycle fO = Average input frequency measured at CLK/CLK Figure 8. Half-Period Jitter VOH, VIH 80% Clock Inputs and Outputs 80% 20% 20% VOL, VIL tr t slr(IńO) V * V 20% + 80% t r(IńO) tf t slf(IńO) V * V 20% + 80% t f(IńO) Figure 9. Input and Output Slew Rates 10 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 PACKAGE OPTION ADDENDUM www.ti.com 4-Mar-2005 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Drawing Pins Package Eco Plan (2) Qty CDCV857BDGG ACTIVE TSSOP DGG 48 40 Pb-Free (RoHS) CU NIPDAU CDCV857BDGGR ACTIVE TSSOP DGG 48 2000 None Call TI Call TI CDCV857BGQLR ACTIVE VFBGA GQL 56 1000 None Call TI Level-2A-220C-4 WKS CDCV857BIDGG ACTIVE TSSOP DGG 48 40 Pb-Free (RoHS) CU NIPDAU Level-1-250C-UNLIM CDCV857BIDGGR ACTIVE TSSOP DGG 48 2000 Pb-Free (RoHS) CU NIPDAU Level-1-250C-UNLIM Lead/Ball Finish MSL Peak Temp (3) Level-1-250C-UNLIM (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - May not be currently available - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. None: Not yet available Lead (Pb-Free). Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Green (RoHS & no Sb/Br): TI defines "Green" to mean "Pb-Free" and in addition, uses package materials that do not contain halogens, including bromine (Br) or antimony (Sb) above 0.1% of total product weight. (3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDECindustry standard classifications, and peak solder temperature. Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release. In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis. Addendum-Page 1 MECHANICAL DATA MTSS003D – JANUARY 1995 – REVISED JANUARY 1998 DGG (R-PDSO-G**) PLASTIC SMALL-OUTLINE PACKAGE 48 PINS SHOWN 0,27 0,17 0,50 48 0,08 M 25 6,20 6,00 8,30 7,90 0,15 NOM Gage Plane 1 0,25 24 0°– 8° A 0,75 0,50 Seating Plane 0,15 0,05 1,20 MAX PINS ** 0,10 48 56 64 A MAX 12,60 14,10 17,10 A MIN 12,40 13,90 16,90 DIM 4040078 / F 12/97 NOTES: A. B. C. D. All linear dimensions are in millimeters. This drawing is subject to change without notice. Body dimensions do not include mold protrusion not to exceed 0,15. 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