Hardware Documentation D at a S h e e t ® HAL 855 Programmable Linear Hall-Effect Sensor with Arbitrary Output Characteristic Edition Nov. 26, 2008 DSH000149_003EN HAL855 DATA SHEET Copyright, Warranty, and Limitation of Liability The information and data contained in this document are believed to be accurate and reliable. The software and proprietary information contained therein may be protected by copyright, patent, trademark and/or other intellectual property rights of Micronas. All rights not expressly granted remain reserved by Micronas. Micronas assumes no liability for errors and gives no warranty representation or guarantee regarding the suitability of its products for any particular purpose due to these specifications. By this publication, Micronas does not assume responsibility for patent infringements or other rights of third parties which may result from its use. Commercial conditions, product availability and delivery are exclusively subject to the respective order confirmation. Micronas Trademarks – HAL Micronas Patents Sensor programming with VDD-Modulation protected by Micronas Patent No. EP 0 953 848. Choppered Offset Compensation protected by Micronas patents no. US5260614, US5406202, EP0525235, and EP0548391. Third-Party Trademarks All other brand and product names or company names may be trademarks of their respective companies. Any information and data which may be provided in the document can and do vary in different applications, and actual performance may vary over time. All operating parameters must be validated for each customer application by customers’ technical experts. Any new issue of this document invalidates previous issues. Micronas reserves the right to review this document and to make changes to the document’s content at any time without obligation to notify any person or entity of such revision or changes. For further advice please contact us directly. Do not use our products in life-supporting systems, aviation and aerospace applications! Unless explicitly agreed to otherwise in writing between the parties, Micronas’ products are not designed, intended or authorized for use as components in systems intended for surgical implants into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the product could create a situation where personal injury or death could occur. No part of this publication may be reproduced, photocopied, stored on a retrieval system or transmitted without the express written consent of Micronas. 2 Nov. 26, 2008; DSH000149_003EN Micronas HAL855 DATA SHEET Contents Page Section Title 5 5 5 6 6 6 6 6 1. 1.1. 1.2. 1.3. 1.4. 1.5. 1.6. 1.7. Introduction Major Applications Features Marking Code Operating Junction Temperature Range (TJ) Hall Sensor Package Codes Solderability and Welding Pin Connections and Short Descriptions 7 7 9 13 13 14 2. 2.1. 2.2. 2.3. 2.3.1. 2.3.2. Functional Description General Function Digital Signal Processing and EEPROM Calibration Procedure General Procedure Example: Calibration of an Angle Sensor 16 16 20 20 20 21 21 22 24 25 26 3. 3.1. 3.2. 3.3. 3.4. 3.4.1. 3.5. 3.6. 3.6.1. 3.7. 3.8. Specifications Outline Dimensions Dimensions of Sensitive Area Position of Sensitive Areas Absolute Maximum Ratings Storage and Shelf Life Recommended Operating Conditions Characteristics Specification of Biphase-M Output Magnetic Characteristics Diagnosis Functions 27 27 27 28 28 29 30 30 30 31 32 32 4. 4.1. 4.2. 4.3. 4.4. 4.5. 4.6. 4.7. 4.7.1. 4.7.2. 4.7.3. 4.7.4. Application Notes Use of Two HAL855 in Parallel Operation Measurement of a PWM Output Signal Measurement of a Biphase-M Output Signal Temperature Compensation Ambient Temperature EMC and ESD Start-Up Behavior First Operation (Power-Up) Operation after Reset in Biphase-M Mode with Provide Part Number Option Enabled Power-Down Operation Power Drop Operation 33 33 33 37 38 38 40 5. 5.1. 5.2. 5.3. 5.4. 5.5. 5.6. Programming of the Sensor Definition of Programming Telegram Definition of the Telegram Telegram Codes Number Formats Register Information Programming Information Micronas Nov. 26, 2008; DSH000149_003EN 3 HAL855 DATA SHEET Contents, continued Page Section Title 42 6. Data Sheet History 4 Nov. 26, 2008; DSH000149_003EN Micronas HAL855 DATA SHEET Programmable Linear Hall-Effect Sensor with Arbitrary Output Characteristic Release Note: Revision bars indicate significant changes to the previous edition. Micronas. The sensors are designed for automotive or industrial applications. They operate with ambient temperatures from −40 °C up to 150 °C. The HAL855 is available in the very small leaded package TO92UT-1 and TO92UT-2. 1. Introduction 1.1. Major Applications The HAL855 is a member of the Micronas family of programmable linear Hall sensors. As an extension to the HAL8x5 family, the HAL855 offers an arbitrary output characteristic and individual programming of different sensors which are in parallel to the same supply voltage. Due to the sensor’s versatile programming characteristics, the HAL855 is the optimal system solution for applications such as: – contactless potentiometers, – rotary position measurement (e.g., pedal sensor), – fluid level measurement, The HAL855 is an universal magnetic field sensor based on the Hall effect. The IC is designed and produced in sub-micron CMOS technology and can be used for angle or distance measurements if combined with a rotating or moving magnet. The major characteristics like magnetic field range, output characteristic, output format, sensitivity, shift (offset), PWM period and the temperature coefficients are programmable in a non-volatile memory. The output characteristic can be set with 32 setpoints. The HAL855 features a temperature-compensated Hall plate with choppered offset compensation, an A/D-converter, digital signal processing, an EEPROM memory with redundancy and lock function for the calibration data, a serial interface for programming the EEPROM, and protection devices at all pins. The internal digital signal processing is of great benefit because analog offsets, temperature shifts, and mechanical stress do not degrade the sensor accuracy. The HAL855 is programmable by means of modulating the supply voltage. No additional programming pin is needed. The easy programmability allows a 2-point calibration by adjusting the output signal directly to the input signal (like mechanical angle, distance, or current). Individual adjustment of each sensor during the customer’s manufacturing process is possible. With this calibration procedure, the tolerances of the sensor, the magnet, and the mechanical positioning can be compensated in the final assembly. This offers a lowcost alternative for all applications that presently need mechanical adjustment or laser trimming for calibrating the system. In addition, the temperature compensation of the Hall IC can be fitted to all common magnetic materials, by programming first and second order temperature coefficients of the Hall sensor sensitivity. This enables operation over the full temperature range with high accuracy. The calculation of the individual sensor characteristics and the programming of the EEPROM memory can easily be done with a PC and the application kit from Micronas – linear position detection, and – magnetic field detection. 1.2. Features – high-precision linear Hall effect sensors with different output formats – various programmable magnetic characteristics with non-volatile memory – programmable output characteristic (32 setpoints with 9-bit resolution) – programmable output formats (PWM or serial Biphase-M) – programmable PWM period – open-drain output – digital signal processing – temperature characteristics programmable for matching all common magnetic materials – programming by modulation of the supply voltage – lock function and built-in redundancy for EEPROM memory – operates from –40 °C up to 150 °C ambient temperature – operates from 4.5 V up to 18 V supply voltage – operates with static magnetic fields and dynamic magnetic fields up to 2 kHz – choppered offset compensation – overvoltage protection on all pins – reverse-voltage protection on VDD pin – magnetic characteristics extremely robust against mechanical stress – short-circuit-protected output – EMC-optimized design – programmable slew rate for optimized EMI behavior Nov. 26, 2008; DSH000149_003EN 5 HAL855 DATA SHEET 1.3. Marking Code 1.6. Solderability and Welding The HAL855 has a marking on the package surface (branded side). This marking includes the name of the sensor and the temperature range. Soldering Type HAL855 During soldering reflow processing and manual reworking, a component body temperature of 260°C should not be exceeded. Temperature Range A K Welding 855A 855K Device terminals should be compatible with laser and resistance welding. Please note that the success of the welding process is subject to different welding parameters which will vary according to the welding technique used. A very close control of the welding parameters is absolutely necessary in order to reach satisfying results. Micronas, therefore, does not give any implied or express warranty as to the ability to weld the component. 1.4. Operating Junction Temperature Range (TJ) The Hall sensors from Micronas are specified to the chip temperature (junction temperature TJ). A: TJ = −40 °C to +170 °C K: TJ = −40 °C to +140 °C The relationship between ambient temperature (TA) and junction temperature is explained in Section 4.5. on page 29. 1.5. Hall Sensor Package Codes HALXXXPA-T Temperature Range: A and K Package: UT for TO92UT-1/-2 Type: 855 1.7. Pin Connections and Short Descriptions Pin No. Pin Name Type Short Description 1 VDD IN Supply Voltage and Programming Pin 2 GND 3 OUT Ground OUT Open-Drain Output and Selection Pin Example: HAL855UT-K → Type: 855 → Package: TO92UT → Temperature Range: TJ = −40°C to +140°C Hall sensors are available in a wide variety of packaging versions and quantities. For more detailed information, please refer to the brochure: “Micronas Hall Sensors: Ordering Codes, Packaging, Handling”. HAL855 1 VDD 3 OUT 2 GND Fig. 1–1: Pin configuration 6 Nov. 26, 2008; DSH000149_003EN Micronas HAL855 DATA SHEET 2. Functional Description 2.1. General Function When no command is detected or processed and the supply voltage is within the recommended operating range the PWM or Biphase-M output is enabled. The HAL855 is a monolithic integrated circuit which provides an output signal proportional to the magnetic flux through the Hall plate. It is possible to program several sensors individually if they are in parallel to the same supply and ground line. The selection of each sensor is done via its output pin. The external magnetic field component perpendicular to the branded side of the package generates a Hall voltage. The Hall IC is sensitive to magnetic north and south polarity. This voltage is converted to a digital value, processed in the Digital Signal Processing Unit (DSP) according to the settings of the EEPROM registers, converted to the different digital output formats (PWM and Biphase-M serial protocol) and provided by an open-drain output transistor stage. The function and the parameters for the DSP are explained in Section 2.2. on page 9. Internal temperature compensation circuitry and the choppered offset compensation enables operation over the full temperature range with minimal changes in accuracy and high offset stability. The circuitry also rejects offset shifts due to mechanical stress from the package. The non-volatile memory consists of redundant EEPROM cells. In addition, the sensor IC is equipped with devices for overvoltage and reversevoltage protection at all pins. HAL 855 The setting of the LOCK register disables the programming of the EEPROM memory for all time. This register cannot be reset. VPull-up As long as the LOCK register is not set, the output characteristic can be adjusted by programming the EEPROM registers. The IC is addressed by modulating the supply voltage (see Fig. 2–1). After detecting a command, the sensor reads or writes the memory and answers with a digital signal on the output pin. The output is switched off during the communication. VOUT (V) VDD (V) 8 7 6 0 5 OUT VDD GND Fig. 2–1: Programming with VDD modulation VDD Bandgap Reference Temperature Dependent Bias Oscillator Switched Hall Plate A/D Converter Digital Signal Processing Supply Level Detection Lock Control HAL855 Open-Drain Output OUT EEPROM Memory GND Fig. 2–2: HAL855 block diagram Micronas Nov. 26, 2008; DSH000149_003EN 7 HAL855 DATA SHEET Digital Output Register 14 bit Digital Signal Processing A/D Converter Digital Filter TC TCSQ 6 bit 5 bit Adder Mode Register Filter Range 3 bit 3 bit Multiplier Find Interval Adder Interpolate between Limits Get Limits Output Conditioning Offset Slope Shift Setpoints Lock Micronas Customer Correction 14 bit 10 bit 32 x 9 bit 1 bit Register Settings EEPROM Memory Lock Control Fig. 2–3: Details of EEPROM and digital signal processing 8 Nov. 26, 2008; DSH000149_003EN Micronas HAL855 DATA SHEET 2.2. Digital Signal Processing and EEPROM The DSP is the major part of this sensor and performs the signal conditioning. The parameters for the DSP are stored in the EEPROM registers. The details are shown in Fig. 2–3 on page 8. Terminology: SLOPE: name of the register or register value Slope: name of the parameter The EEPROM registers consist of three groups: Group 1 contains the registers for the adaption of the sensor to the magnetic system: MODE for selecting the magnetic field range and filter frequency, TC and TCSQ for the temperature characteristics of the magnetic sensitivity. operating range of the A/D converter is from −30 mT ... +30 mT up to −150 mT... +150 mT. During further processing, the digital signal is calculated based on the values of slope, shift, and the defined output characteristic. The result is converted to the different digital output formats (PWM and Biphase-M) and stabilized by a open-drain output transistor stage. The DIGITAL OUTPUT value at any given magnetic field depends on the settings of the magnetic field range, the low-pass filter, TC, TCSQ values and the programmed output characteristic. The DIGITAL OUTPUT range is min. 0 to max. 4095. Note: During application design, it should be taken into consideration that DIGITAL OUTPUT should not saturate in the operational range of the specific application. The parameters SLOPE and SHIFT are used for the individual calibration of the sensor in the magnetic cirucit. – The parameter Shift corresponds to the output signal at B = 0 mT. – The parameter Slope defines the magnetic sensitivity. % 100 HAL 855 90 Group 2 contains the registers for defining the output characteristics: OUTPUT FORMAT, OUTPUT PERIOD or OUTPUT BITTIME, SLEW RATE and OUTPUT CHARACTERISTIC. The shape of the output signal is determined by the output characteristic, which, in turn, is defined by the 32 setpoints of the sensor. A value for each of the setpoints must be defined. The setpoints are distributed evenly along the magnetic field axis allowing linear interpolation between the 32 setpoints (see Fig. 2–4). PWM 80 70 60 50 40 30 Logarithmic Group 3 contains the PARTNUMBER, the Micronas registers, and LOCK for the locking of all registers. After locking, the PARTNUMBER register is only available in Biphase-M output mode. The Micronas registers are programmed and locked during production and are read-only for the customer. These registers are used for oscillator frequency trimming and several other special settings. 20 Linear Sine 10 0 0 4 Logarithmic 8 12 16 20 24 28 32 Setpoint Linear Fig. 2–4: Example for different Sine output characteristics An external magnetic field generates a Hall voltage on the Hall plate. The A/D-converter converts the amplified positive or negative Hall voltage (operates with magnetic north and south poles at the branded side of the package) to a digital value. The digital signal is filtered in the internal low-pass filter and manipulated according to the settings stored in the EEPROM. The digital value after signal processing is readable in the DIGITAL OUTPUT register. Depending on the programmable magnetic range of the Hall IC, the Micronas Nov. 26, 2008; DSH000149_003EN 9 HAL855 DATA SHEET Mode Output Format The MODE register consists of four “sub”-registers defining the magnetic and output behavior of the sensor. The RANGE bits are the three lowest bits of the MODE register; they define the magnetic field range of the A/D converter. The next three bits (FILTER) define the −3 dB frequency of the digital low pass filter. The next sub-register is the FORMAT register, and it defines the different output formats as described below. This sub-register also consists of 3 bits. The last three MSBs define the OUTPUT PERIOD of the PWM signal. The HAL855 provides two different output formats: a PWM and Biphase-M output. PMW output is a pulse width modulated output. The signal is defined by the ratio of pulse width to pulse period. The Biphase-M output is a serial protocol. A logical “0” is coded as no output level change within the bit time. A logical “1” is coded as an output level change between 50% and 80% of the bit time. After each bit, an output level change occurs (see Section 3.6.1. on page 24). Range Table 2–3: OUTPUT FORMAT register definition Table 2–1: RANGE register definition Magnetic Field Range Bit Setting −30 mT...30 mT 0 −40 mT...40 mT 4 −60 mT...60 mT 5 −75 mT...75 mT 1 −80 mT...80 mT 6 −90 mT...90 mT 2 −100 mT...100 mT 7 −150 mT...150 mT 3 Output Format Bit Setting PWM 2 Biphase-M 41) Biphase-M (test) 52) 1) 2) In case of OUTPUT FORMAT = 4 the continuous Biphase-M output will be active after locking the device. In order to test the Biphase-M output with non-locked sensors OUTPUT FORMAT = 5 has to be used. writing OUTPUT FORMAT = 5 will activate the Biphase-M output for test purpose. The test can be deactivated by switching the device off. Output Period Filter The OUTPUT PERIOD register defines the PWM period of the output signal. Table 2–2: FILTER register definition Table 2–4: OUTPUT PERIOD register definition −3 dB Frequency Bit Setting 80 Hz 0 PWM Output Period Bit Setting 160 Hz 1 128 ms; 12-bit resolution 0 500 Hz 2 64 ms; 12-bit resolution 1 1 kHz 3 32 ms; 12-bit resolution 2 2 kHz 4 16 ms; 12-bit resolution 3 8 ms; 12-bit resolution 4 4 ms; 11-bit resolution 5 2 ms; 10-bit resolution 6 1 ms; 9-bit resolution 7 10 Nov. 26, 2008; DSH000149_003EN Micronas HAL855 DATA SHEET Output Bittime Slope The OUTPUT BITTIME register defines the bit time of the Biphase-M output signal. OUTPUT BITTIME is “sub”-register of the SPECIAL CUSTOMER register. The SLOPE register contains the parameter for the multiplier in the DSP. The Slope is programmable between −4 and 4. The register can be changed in steps of 0.00049. Slope = 1 corresponds to an increase of the output signal by 100% if the digital value at the A/D-converter output increases by 2048. Table 2–5: OUTPUT BITTIME register definition Biphase-M Output Bit Time Bit Setting 40 μs 0 84 µs 1 168 µs 2 320 µs 3 700 µs 11 1.6 ms 4 3.2 ms 5 6.4 ms 7 For all calculations, the digital value after the digital signal processing is used. This digital information is readable from the DIGITAL OUTPUT register. Shift The SHIFT register contains the parameter for the adder in the DSP. Shift is the output signal without external magnetic field (B = 0 mT) and programmable from −100% up to 100%. For calibration in the system environment, a 2-point adjustment procedure is recommended. The suitable Slope and Shift values for each sensor can be calculated individually by this procedure. Part Number Note: Setting the Biphase-M bit time to 40 μs simultaneously switches the programming telegram to the same bit time. Hence after writing the OUTPUT BITTIME register the timing of the programming device has to be set accordingly. In case of Biphase-M output, a part number can be defined. This part number will be sent during power-on of the sensor if the PARTNUMBER ENABLE bit is set. Afterwards, the sensor will send the digital value corresponding to the applied magnetic field. – The PARTNUMBER ENABLE bit is part of the SPECIAL CUSTOMER register. – The OUTPUT PERIOD register defines the time interval for which the part number is sent. TC and TCSQ The temperature dependence of the magnetic sensitivity can be adapted to different magnetic materials in order to compensate for the change of the magnetic strength with temperature. The adaption is done by programming the TC (Linear Temperature Coefficient) and the TCSQ registers (Quadratic Temperature Coefficient). Thereby, the slope and the curvature of the temperature dependence of the magnetic sensitivity can be matched to the magnet and the sensor assembly. As a result, the output signal characteristic can be fixed over the full temperature range. The sensor can compensate for linear temperature coefficients ranging from about −2100 ppm/K up to 600 ppm/K and quadratic coefficients from about −5 ppm/K2 to 5 ppm/K2. Please refer to Section 4.4. on page 28 for the recommended settings for different linear temperature coefficients. Output Characteristic The OUTPUT CHARACTERISTIC register defines the shape of the sensor output signal. It consists of 32 setpoints. Each setpoint can be set to values between 0 and 511 LSB. The output characteristic has to be monotonic increasing (Setpoint0 ≤ Setpoint1 ≤ SetpointN). LOCKR By setting this 1-bit register, all registers will be locked, and the sensor will no longer respond to any supply voltage modulation. This bit is active after the first power-off and power-on sequence after setting the LOCK bit. Warning: This register cannot be reset! Micronas Nov. 26, 2008; DSH000149_003EN 11 HAL855 DATA SHEET Digital Output Slew Rate This 12-bit register delivers the actual digital value of the applied magnetic field after the signal processing. This register can only be read out, and it is the basis for the calibration procedure of the sensor in the system environment. The SLEW RATE register is a “sub”-register of the CURRENTSOURCE register. The output fall time of the HAL855 depends on the SLEW RATE register setting and the external load circuit. Note: The output rise time is purely due to the external load and is not controlled by the SLEW RATE register. Offset Correction The OFFSET CORRECTION register allows to adjust the digital offset of the built-in A/D-converter. The digital offset can be programmed to −3/4, −1/2, −1/4, 0, +1/4, +1/2, +3/4 of full-scale. Table 2–6: OFFSET CORRECTION register definition Offset Correction Bit Setting −3/4 28 −1/2 29 −1/4 30 0 0 1/4 17 1/2 18 3/4 19 12 Table 2–7: SLEW RATE register definition Typ. Slew Rate (3.6 kΩ pull-up, 4.7 nF) Bit Setting 0.3 µs 0 0.8 µs 1 1.2 µs 2 1.5 µs 3 Note: The slew rate can be programmed to optimize the EMI behavior of the application. Nov. 26, 2008; DSH000149_003EN Micronas HAL855 DATA SHEET 2.3. Calibration Procedure Step 2: Initialize DSP 2.3.1. General Procedure As the DIGITAL OUTPUT register value depends on the settings of SLOPE, SHIFT and the OUTPUT CHARACTERISTIC, these registers have to be initialized with defined values, first: For calibration in the system environment, the application kit from Micronas is recommended. It contains the hardware for the generation of the serial telegram for programming (Programmer Board Version 5.1) and the corresponding software (PC85x) for the input of the register values. For the individual calibration of each sensor in the customer application, a two-point adjustment is recommended (see Fig. 2–5 on page 14 for an example). The calibration shall be done as follows: – ShiftINITIAL = 50% – OUTPUT CHARACTERISTIC = ’Linear Standard’ (Setpoint 0 = 0, Setpoint 1 = 16, Setpoint 2 = 32, ..., Setpoint 31 = 496). – SlopeINITIAL depends on the setting of the digital low-pass filter (see Table 2–8). Table 2–8: Initial slope values Step 1: Input of the registers which need not be adjusted individually −3 dB Frequency SlopeINITIAL The magnetic circuit, the magnetic material with its temperature characteristics, the filter frequency, the part number and the output format are given for this application. 80 0.2578 160 0.2578 500 0.1938 Therefore, the values of the following registers should be identical for all sensors of the customer application. 1000 0.1938 2000 0.3398 – FILTER (according to the maximum signal frequency) – RANGE (according to the maximum magnetic field at the sensor position) – TC and TCSQ (depends on the material of the magnet and the other temperature dependencies of the application) – OUTPUT FORMAT (according to the application requirements) – OUTPUT PERIOD (according to the application requirements) – PARTNUMBER (in case Biphase-M output format is used) – OFFSET CORRECTION – SLEW RATE Write the appropriate settings into the HAL855 registers. Micronas Step 3: Define Calibration Points For highest accuracy of the sensor, calibration points near the minimum and maximum input signal are recommended. Define nominal values DOUT1NOM and DOUT2NOM of the DIGITAL OUTPUT register at the calibration points 1 and 2, respectively. Note: Micronas software PC85x uses default settings DOUT1NOM = 0 and DOUT2NOM = 3968. The output is clamped to Setpoint 0 and Setpoint 31. In the case of “Linear Standard’”, Setpoint 0 corresponds to DIGITAL OUTPUT = 0, while Setpoint 31 corresponds to DIGITAL OUTPUT = 3968. Nov. 26, 2008; DSH000149_003EN 13 HAL855 DATA SHEET Step 4: Calculation of Shift and Slope 2.3.2. Example: Calibration of an Angle Sensor Set the system to calibration point 1 and read the register DIGITAL OUTPUT. The result is the value DOUT1. The following description explains the calibration procedure using an angle sensor with a HAL855 as an example. The required output characteristic is shown in Fig. 2–5. Now, set the system to calibration point 2, read the register DIGITAL OUTPUT, and get the value DOUT2. – the angle range is from −25° to 25° – temperature coefficient of the magnet: −500 ppm/K With these values, the settings for Sensitivity and Shift are calculated as: ( DOUT2 NOM – DOUT1 NOM ) Slope = Slope INITIAL × --------------------------------------------------------------------------( DOUT2 – DOUT1 ) % 100 HAL 855 Second Calibration Point 100% ( DOUT2 – 2048 ) × Slope Shift = -------------- × ⎛ DOUT2 NOM – ----------------------------------------------------------------⎞ ⎠ 4096 ⎝ Slope INITIAL Output 90 Duty Cycle 80 70 Write the calculated values for Slope, Shift, and the desired output characteristic into the EEPROM. The sensor is now calibrated for the customer application. 60 As long as the LOCK bit is not set, the calibration procedure can be applied repeatedly. 40 Note: For a recalibration, the calibration procedure has to be started at the beginning (step 1). A new initialization is necessary, as the initial values for SlopeINITIAL, ShiftINITIAL and output characteristic are overwritten in step 4. 50 30 Linear 20 Sine First Calibration Point 10 -30 -20 -10 0 10 20 30 ° Angle Linear Fig. 2–5: 0 for output characteristics Sine Example Step 5: Locking the Sensor The last step is activating the LOCK function with the “LOCK” command. Please note that the LOCK function becomes effective after power-down and power-up of the Hall IC. The sensor is now locked and does not respond to any programming or reading commands. Warning: This register cannot be reset! 14 Nov. 26, 2008; DSH000149_003EN Micronas HAL855 DATA SHEET Step 1: Input of the registers which need not be adjusted individually Manual Calculation: The register values for the following registers are given for all applications: 2. read the register DIGITAL OUTPUT. 1. Set the system to calibration point 1 (angle 1 = 25°) For our example, the result is DIGITAL OUTPUT = DOUT1 = 3291. – FILTER Select the filter frequency: 500 Hz 3. Set the system to calibration point 2 (angle 2 = −25°) – RANGE Select the magnetic field range: 40 mT 4. read the register DIGITAL OUTPUT again. – TC For this magnetic material: 6 For our example, the result is DIGITAL OUTPUT = DOUT2 = 985. – TCSQ For this magnetic material: 14 With these measurements and the pre-programming of the sensor, the values for Slope and Shift are calculated as: – OUTPUT FORMAT Select the output format: PWM – OUTPUT PERIOD Select the output format: 8 ms 3968 Slope = ------------------------------- × 0.1938 = – 0.3335 ( 985 – 3291 ) – PARTNUMBER For this example: 1 – OFFSET CORRECTION For this example: none 100% ( 985 – 2048 ) × ( – 0.3335 ) Shift = -------------- × ⎛ 3968 – --------------------------------------------------------------⎞ = 52.22% ⎠ 4096 ⎝ 0.1938 – SLEW RATE For this example: 0 (fastest) Enter these values in the software, and use the “write and store” command for permanently writing the values in the registers. Write the calculated values for Slope and Shift and a linear output characteristic ranging from 10% to 90% output duty cycle into the EEPROM memory. Software Calibration: Step 2: Initialize DSP – SHIFT Select Shift: 50% – SLOPE Select Slope: 0.1938 (see Table 2–8 on page 13) – OUTPUT CHARACTERISTIC Select output characteristic: ’Linear Standard’ Step 3: Define Calibration Points The Micronas software PC85x uses default settings DOUT1NOM = 0 and DOUT2NOM = 3968. DOUT1NOM corresponds to the angle position −25°, DOUT2NOM to +25°. Step 4: Calculation of Shift and Slope There are two ways to calculate the values for Shift and Slope. Use the menu CALIBRATE from the PC software and enter the values for the registers which are not adjusted individually. Set the system to calibration point 1 (angle 1 = 25°), hit the button “Digital Output1”, set the system to calibration point 2 (angle 2 = −25°), hit the button “Digital Output2”, and hit the button “Calculate”. The software will then calculate the appropriate Shift and Slope. This calculation has to be done individually for each sensor. Now, select an output characteristic from the selection box “Output Characteristics” and then press the button “write and store” for programming the sensor. Step 5: Locking the Sensor The last step is activating the LOCK function with the “LOCK” command. Please note that the LOCK function becomes effective after power-down and power-up of the Hall IC. The sensor is now locked and does not respond to any programming or reading commands. Warning: This register cannot be reset! Micronas Nov. 26, 2008; DSH000149_003EN 15 HAL855 DATA SHEET 3. Specifications 3.1. Outline Dimensions Fig. 3–1: TO92UT-2: Plastic Transistor Standard UT package, 3 leads, not spread Weight approximately 0.12 g 16 Nov. 26, 2008; DSH000149_003EN Micronas HAL855 DATA SHEET Fig. 3–2: TO92UT-1: Plastic Transistor Standard UT package, 3 leads, spread Weight approximately 0.12 g Micronas Nov. 26, 2008; DSH000149_003EN 17 HAL855 DATA SHEET Fig. 3–3: TO92UT-2: Dimensions ammopack inline, not spread 18 Nov. 26, 2008; DSH000149_003EN Micronas HAL855 DATA SHEET Fig. 3–4: TO92UT-1: Dimensions ammopack inline, spread Micronas Nov. 26, 2008; DSH000149_003EN 19 HAL855 DATA SHEET 3.2. Dimensions of Sensitive Area 0.25 mm x 0.25 mm 3.3. Position of Sensitive Areas TO92UT-1/-2 y 1.5 mm nominal A4 0.3 mm nominal Bd 0.3 mm 3.4. Absolute Maximum Ratings Stresses beyond those listed in the “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only. Functional operation of the device at these conditions is not implied. Exposure to absolute maximum rating conditions for extended periods will affect device reliability. This device contains circuitry to protect the inputs and outputs against damage due to high static voltages or electric fields; however, it is advised that normal precautions be taken to avoid application of any voltage higher than absolute maximum-rated voltages to this high-impedance circuit. All voltages listed are referenced to ground (GND). Symbol Parameter Pin No. Min. Max. Unit VDD Supply Voltage 1 −14.51) 18 V −IDD Reverse Supply Current 1 − 502) mA IZ Current through Protection Device 1 or 3 −502) 502) mA VOUT Output Voltage 3 −0.3 >144) 14 184) V V IOUT Continuous Output Current 3 −502) 502) mA TJ Junction Temperature Range −40 −40 150 1703) °C NPROG Number of Programming Cycles − 100 1) 2) 3) 4) 20 t < 1 min. as long as TJmax is not exceeded t < 1000h t < 100h Nov. 26, 2008; DSH000149_003EN Micronas HAL855 DATA SHEET 3.4.1. Storage and Shelf Life The permissible storage time (shelf life) of the sensors is unlimited, provided the sensors are stored at a maximum of 30 °C and a maximum of 85% relative humidity. At these conditions, no Dry Pack is required. Solderability is guaranteed for one year from the date code on the package. 3.5. Recommended Operating Conditions Functional operation of the device beyond those indicated in the “Recommended Operating Conditions/Characteristics” is not implied and may result in unpredictable behavior of the device and may reduce reliability and lifetime. All voltages listed are referenced to ground (GND). Symbol Parameter Pin No. Min. Typ. Max. Unit VDD Supply Voltage 1 4.5 5 5.5 V VDD Battery Supply Voltage 1 8 12 18 V 6 12 18 Remarks TJ >125°C, RP = 120 Ω TJ <125°C, RP = 120 Ω VPull-up Output Pull-up Voltage 3 3 5 12 V IOUT Continuous Output Current 3 − − 20 mA CP Protection Capacitance 1,2 4.7 4.7 1000 nF CL Load Capacitance 2,3 0.33 4.7 100 nF Note: Please contact Micronas application support or check available application notes in case of usage of the sensor beyond recommended operating conditions. Micronas Nov. 26, 2008; DSH000149_003EN 21 HAL855 DATA SHEET 3.6. Characteristics at TJ = −40 °C to +170 °C, VDD = 4.5 V to 14 V, after programming and locking of the device, at Recommended Operation Conditions if not otherwise specified in the column “Conditions”. Typical Characteristics for TJ = 25 °C and VDD = 5 V. All voltages listed are referenced to ground (GND). Symbol Parameter Pin No. Min. Typ. Max. Unit Conditions IDD Supply Current over Temperature Range 1 − 7 8 mA TJ > 125°C − 7 10 mA TJ < 125°C IOH Output Leakage Current over Temperature Range 3 − − 10 µA VDDZ Overvoltage Protection at Supply 1 − 22 − V VOZ Overvoltage Protection at Output 3 − 22 − V Resolution 2,3 − − 12 bit 1) INL Integral Non-Linearity over Temperature Range 2,3 −0.5 0 0.5 % 2) fPWM PWM Output Frequency over Temperature Range 3 920 1000 1080 Hz PWM period: 1 ms; 9 bit res. 460 500 540 Hz PWM period: 2 ms; 10 bit res. 230 250 270 Hz PWM period: 4 ms; 11 bit res. 115 125 135 Hz PWM period: 8 ms; 12 bit res. 57 62.5 68 Hz PWM period: 16 ms; 12 bit res. 28 31 34 Hz PWM period: 32 ms; 12 bit res. 13 15 17 Hz PWM period: 64 ms; 12 bit res. 6.5 7.5 8.5 Hz PWM period: 128 ms;12 bit res. 0.03 0.04 0.05 ms Biphase-M bit time: 40 μs 2 3.2 4 ms Biphase-M bit time: 3.2 ms Biphase-M Output Bittime over Temperature Range 3 tp1 Biphase-M Output Timing for Logical 1 3 50 65 80 % fADC Internal ADC Frequency over Temperature Range − 110 128 150 kHz VDD = 4.5 V to 14 V tr(O) Response Time of Internal Signal3) 3 − − 5 4 2 1 10 8 4 2 ms ms ms ms 3 dB filter frequency = 80 Hz 3 dB filter frequency = 160 Hz 3 dB filter frequency = 500 Hz 3 dB filter frequency = 2 kHz − 0.1 0.5 ms − 6 5 3 2 11 9 5 3 ms ms ms ms tp0 td(O) Delay Time of Internal Signal tPOD Power-Up Time (time to reach stabilized internal signal)3) − 3 − − 1) 2) 3) 22 3 dB filter frequency = 80 Hz 3 dB filter frequency = 160 Hz 3 dB filter frequency = 500 Hz 3 dB filter frequency = 2 kHz if the Hall IC is programmed suitably if more than 50% of the selected magnetic field range are used and the Hall IC is programmed suitably The output signal is updated at the begin of each PWM period or Biphase-M period. The update time depends on the output format settings. Nov. 26, 2008; DSH000149_003EN Micronas HAL855 DATA SHEET Symbol Parameter Pin No. tLVD Power-Down Time (time until output is off) VLVD Power-Down Voltage 1 VPOD Power-On Reset Voltage BW RDS,On Min. Typ. Max. Unit 50 75 µs − 3.5 − V 1 − 3.6 − V Small Signal Bandwidth (−3 dB) 3 − 2 − kHz “On” Resistance RDS of Output Transistor 3 − 50 100 Ω Conditions BAC < 10 mT; 3 dB Filter frequency = 2 kHz TO92UT Packages Thermal Resistance Rthja Junction to Air − − − 235 K/W Measured with a 1s0p board Rthjc Junction to Case − − − 61 K/W Measured with a 1s0p board Rthjs Junction to Solder Point − − − 128 K/W Measured with a 1s1p board Micronas Nov. 26, 2008; DSH000149_003EN 23 HAL855 DATA SHEET 3.6.1. Specification of Biphase-M Output Definition of Biphase-M Pulses In case of output format Biphase-M, a continuous data stream is provided. It consists of: A logical “0” is coded as no output level change within the bit time. A logical “1” is coded as an output level change between 50% and 80% of the bit time. After each bit, an output level change occurs. – 1 SYNC bit defining the bit time tp0, – 14 data bits (DAT) – 1 parity bit (DP) Data Bits (DAT) – a gap (signal quiescent) of 8 x tp0 The 12 MSB of the 14 data bits (DAT) contain the digital output reading. The complete signal period is T = 24 x tp0. The signal quiescent level and the polarity of the SYNC bit is shown in Fig. 3–5. Type SYNC Bit Polarity HAL855 negative Data Parity Bit (DP) This parity bit is “1” if the number of zeros within the 14 data bits is even. The parity bit is “0” if the number of zeros is odd. Note: If the part number output is activated the part number will be transmitted 2 times after power-up (see also (see Fig. 4–6 on page 31). The first Biphase-M protocol respectively the first PWM period after power-up is not valid. HAL855: VOUT SYNC BIT DAT DP 8 x tp0 Fig. 3–5: Output format Biphase-M: continuous data stream 24 Nov. 26, 2008; DSH000149_003EN Micronas HAL855 DATA SHEET 3.7. Magnetic Characteristics at TJ = −40 °C to +170 °C, VDD = 4.5 V to 14 V, after programming and locking of the device, at Recommended Operation Conditions if not otherwise specified in the column “Conditions”. Typical Characteristics for TJ = 25 °C and VDD = 5 V. Symbol Parameter Pin No. Min. Typ. Max. Unit Conditions BOffset Magnetic Offset 3 −1 0 1 mT B = 0 mT, TJ = 25 °C ΔBOffset/ΔT Magnetic Offset Change due to TJ −15 0 15 μT/K B = 0 mT Δα Error of Linear Temperature Coefficient of Magnetic Sensitivity −400 0 400 ppm/K TC and TCSQ suitable for the application NLSB(T) Integral Non-Linearity of Temperature Dependence of Sensitivity − − 1 2 − − % % α < 2000 ppm/K α >= 2000 ppm/K Magnetic Hysteresis −20 BHysteresis TC and TCSQ suitable for the application Definition of Sensitivity Errors over Temperature A ideal Hall-effect device would not be affected by temperature. Its temperature compensation would allow to compensate for a linear temperature coefficient αIDEAL of a permanent magnet. S IDEAL = 1 + α IDEAL × ( T – T 0 ) The temperature dependence of the sensitivity of a real sensor is not ideally linear. Its linear temperature coefficient α is determined by a linear least square fit. 0 20 μT Micronas specifies temperature: Range = 30 mT, Filter = 500 Hz two sensitivity errors over 1. the error of the linear temperature coefficient α: Δα = α – α IDEAL 2. the maximum residual error over temperature resulting from the least square fit, i.e., the integral non-linearity of the temperature dependence of sensitivity: NL SB ( T ) = max T res ( T ) S B = S 0 × ( 1 + α × ( T – T 0 ) + res ( T ) ) S0 and α are the fit parameters, res(T) the residual error. Micronas Nov. 26, 2008; DSH000149_003EN 25 HAL855 DATA SHEET 3.8. Diagnosis Functions The HAL855 features various diagnosis functions, such as undervoltage detection and open-circuit detection. A description of the sensor’s behavior is shown in the table below (Typical Characteristics for TJ = 25 °C). Parameter Min. Typ. Max. Unit Output Behavior Undervoltage Detection Level VDD, UV 3.0 3.5 4.0 V No PWM output signal (output on high-level) Open VDD Line − − − − No PWM output signal (output on high-level) Open GND Line − − − − No PWM output signal Note: The undervoltage detection is activated only after locking the sensor! 26 Nov. 26, 2008; DSH000149_003EN Micronas HAL855 DATA SHEET 4. Application Notes 4.1. Use of Two HAL855 in Parallel Operation Micronas recommends the following application circuits for HAL855. The first is recommended for applications with connection to a regualted 5 V supply; the second schould be used for applications connected dicrectly to the car battery and a pull-up to a 5 V line. Two different HAL855 sensors which are operated in parallel to the same supply and ground line can be programmed individually. In order to select the IC which should be programmed, both Hall ICs are deactivated by the “Deactivate” command on the common supply line. Then, the appropriate IC is activated by an “Activate” pulse on its output. Only the activated sensor will react to all following read, write, and program commands. If the second IC has to be programmed, the “Deactivate” command is sent again, and the second IC can be selected. For both circuits, it is recommended to connect a ceramic 4.7 nF capacitor between ground and the supply voltage, respectively, the output pin. System side Sensor side Detailed information can be found in the application note for the programmer board. Vsupply = 5 V ±0.5 V Rpull-up 1 VDD CP = 4.7 nF GND CL = 4.7 nF OUT 2 VDD 3 OUT A & Select A Fig. 4–1: Application circuit HAL855 10 nF HAL855 Sensor A HAL855 Sensor B OUT B & Select B Vpull-up = 5 V ±0.5 V System side Vsupply = 8 V...18 V VDD GND Rpull-up OUT 4.7 nF Sensor side 4.7 nF GND RP = 120 Ω 1 CP = 4.7 nF CL = 4.7 nF Fig. 4–3: Parallel operation of two HAL855 2 3 4.2. Measurement of a PWM Output Signal Fig. 4–2: Application circuit HAL855 for connection with car battery In case that the PWM output mode is activated, the magnetic field information is coded in the duty cycle of the PWM signal. The duty cycle is defined as the ratio between the high time “s” and the period “d” of the PWM signal (see Fig. 4–4). Note: The PWM signal is updated with the falling edge. Hence, for signal evaluation, the triggerlevel must be the falling edge of the PWM signal. Out d s Vhigh Vlow Update time Fig. 4–4: Definition of PWM signal Micronas Nov. 26, 2008; DSH000149_003EN 27 HAL855 DATA SHEET 4.3. Measurement of a Biphase-M Output Signal In order to read the Biphase-M signal Micronas suggests to use a port interrupt which is configured to generate interrupts with both the falling and rising edge of the incoming signal. Table 4–1: Temperature compensation, continued Typ. Temperature Coefficient of Magnet (ppm/K) TC TCSQ 180 16 1 With each interrupt a timer shall be read out. The first two edges (SYNC bit) define the bit time tp0. Comparing subsequent timer readouts with tp0 successively decodes the Biphase-M pattern. 150 15 1 130 14 1 60 13 2 4.4. Temperature Compensation 40 12 2 10 11 2 −20 10 2 −50 9 2 −70 8 2 −100 7 3 −180 6 3 −200 5 3 −230 4 3 −260 3 3 −280 2 4 The relationship between the temperature coefficient of the magnet and the corresponding TC and TCSQ codes for linear compensation is given in the following table. In addition to the linear change of the magnetic field with temperature, the curvature can be adjusted as well. For this purpose, other TC and TCSQ combinations are required which are not shown in the table. Micronas also offers a software named TC-Calc to optimize the TC and TCSQ values for each individual application based on customer measurement results. Please contact Micronas for more detailed information. Table 4–1: Temperature compensation Typ. Temperature Coefficient of Magnet (ppm/K) TC TCSQ 600 31 0 −360 1 4 570 30 0 −390 0 4 540 29 0 −410 −31 4 520 28 0 −490 −30 5 490 27 0 −510 −29 5 470 26 0 −540 −28 5 440 25 0 −610 −27 6 420 24 0 −640 −26 6 360 23 1 −670 −25 6 330 22 1 −740 −24 7 300 21 1 −780 −23 7 280 20 1 −840 −22 8 260 19 1 −880 −21 8 240 18 1 −950 −20 9 200 17 1 −980 −19 9 −1010 −18 9 28 Nov. 26, 2008; DSH000149_003EN Micronas HAL855 DATA SHEET Table 4–1: Temperature compensation, continued 4.5. Ambient Temperature Due to the internal power dissipation, the temperature on the silicon chip (junction temperature TJ) is higher than the temperature outside the package (ambient temperature TA). Typ. Temperature Coefficient of Magnet (ppm/K) TC TCSQ −1080 −17 10 −1150 −16 11 −1180 −15 11 −1270 −14 12 −1290 −13 12 −1360 −12 13 −1430 −11 14 −1460 −10 14 −1540 −9 15 −1600 −8 16 −1670 −7 17 −1740 −6 18 −1810 −5 19 −1880 −4 20 Tjmax = 170 −1950 −3 21 The current through the output is calculated as follows: −2020 −2 22 VPull-up = 5 V −2100 −1 23 RPull-up = 470 Ω T J = T A + ΔT At static conditions and continuous operation, the following equation applies: ΔT = IDD × VDD × R thjx + I Out × V OutLow × R thjx For typical values, use the typical parameters. For worst case calculation, use the max. parameters for IDD and Rth, and the max. value for VDD from the application. Example with typical given values: IDD = 0.007 A VDD = 5 V Rthja = 235 K/W RDS,on = 50 Ω VPull – up 5V I Out = ---------------------------------------------- = ------------- ∼ 0.01A R Pull – up + RDS, on 520Ω V OutLow = I Out × RDS, on = 0.01A × 50Ω = 0.5V ΔT is calculated as follows: K K ΔT = 0.007A × 5V × 235 ----- + 0.01 A × 0. 5V × 235 ----- = 9.4 W W The maximum ambient temperature TAmax can be calculated as: T Amax = T Jmax – ΔT Micronas Nov. 26, 2008; DSH000149_003EN 29 HAL855 DATA SHEET 4.6. EMC and ESD For applications with disturbances by capacitive or inductive coupling on the supply line or radiated disturbances, the application circuits shown in Fig. 4–1 on page 27 are recommended. Applications with this arrangement should pass the EMC tests according to the product standards ISO 7637 part 1 to part 3. Please contact Micronas for the detailed investigation reports with the EMC and ESD results. Note: Micronas recommends to supply the HAL855 with a stabilized 5 V supply. 4.7. Start-Up Behavior 4.7.1. First Operation (Power-Up) VDD First PWM/Biphase-M signal starts 5V 3V VDD,UVmin. VOUT (3-wire mode) Biphase-M format time tPOD Output undefined Output undefined The first period contains no valid data time PWM format No valid signal Valid signal Fig. 4–5: Power-up diagram Note: The first PWM-period respectively the first Biphase-M protocol is not valid. 30 Nov. 26, 2008; DSH000149_003EN Micronas HAL855 DATA SHEET 4.7.2. Operation after Reset in Biphase-M Mode with Provide Part Number Option Enabled VDD First signal starts 5V OUTPUT time tPOD Part number max. 100 ms No valid signal DATA Valid signal Fig. 4–6: Biphase-M after reset Note: The part number is transmitted twice. The transmission time depends on the chosen bit time, but is max. 100 ms. Micronas Nov. 26, 2008; DSH000149_003EN 31 HAL855 DATA SHEET 4.7.3. Power-Down Operation Last PWM/Biphase-M signal starts 5V VDD,UV VOUT (3-wire mode) time tLVD Output undefined Biphase-M format Output undefined PWM format Valid signal No valid signal Fig. 4–7: Power-down operation 4.7.4. Power Drop Operation VDD PWM/Biphase-M signal stops New PWM/Biphase-M signal starts VDD 5V 5V Power-on reset Low voltage on VOUT (3-wire mode) time tPOD tLVD Output undefined Biphase-M format Output undefined PWM format Valid signal No valid signal The first period contains no valid data Valid signal Fig. 4–8: Power-drop operation 32 Nov. 26, 2008; DSH000149_003EN Micronas HAL855 DATA SHEET 5. Programming of the Sensor 5.1. Definition of Programming Telegram The sensor is addressed by modulating a serial telegram on the supply voltage. The sensor answers with a serial telegram on the output pin. The bits in the serial telegram have a different bit time for the VDD-line and the sensors answer. The bit time for the VDD-line is defined through the length of the Sync Bit at the beginning of each telegram. The bit time for the sensors answer is defined through the Acknowledge Bit. A logical “0” is coded as no output level change within the bit time. A logical “1” is coded as an output level change between 50% and 80% of the bit time. After each bit, an output level change occurs. 5.2. Definition of the Telegram Each telegram starts with the Sync Bit (logical 0), 3 bits for the Command (COM), the Command Parity Bit (CP), 4 bits for the Address (ADR), and the Address Parity Bit (AP). There are 4 kinds of telegrams: – Write a register (see Fig. 5–2 on page 35) After the AP Bit, follow 14 Data Bits (DAT) and the Data Parity Bit (DP). If the telegram is valid and the command has been processed, the sensor answers with an Acknowledge Bit (logical 0) on the output. Note: The sensor can only be programmed with programmer board version 5.1. If you have an older version, please contact Micronas or your supplier. – Read a register (see Fig. 5–3 on page 35) After evaluating this command, the sensor answers with the Acknowledge Bit, 14 Data Bits, and the Data Parity Bit on the output. – Programming the EEPROM cells In order to permanently store the written data into the EEPROM cells, an erase and program command have to be sent to the sensor. After the recognition of the erase and program commands, the HAL855 answers with an acknowledge pulse on its Micronas output signal. After the acknowledge pulse, a pulse on the VDD-line is created to start the charging of the EEPROM cells. Then, the supply voltage is kept constant during the charging time. To stop the charging, a further command is sent to the HAL855. This stopping command can be a further programming command or a read command (see Fig. 5–5 on page 36). – Lock a sensor To lock the EEPROM registers, the lock bit has to be programmed. Write the lock bit into the lock register. If the telegram is valid and the command has been processed, the sensor answers with an Acknowledge Bit (logical 0) on the output. In order to store the lock bit permanently, an erase and program command have to be sent to the sensor. The same procedure as mentioned above (Programming the EEPROM cells Fig. 5–5 on page 36). The EEPROM registers are locked after a power on reset. Note: It is mandatory to lock the sensor before performing any kind of reliability tests or after the last programming of the sensor. The HAL855 has its full performance only after setting the LOCK bit. – Activate a sensor (see Fig. 5–4 on page 35) If more than one sensor is connected to the supply line, selection can be done by first deactivating all sensors. With an Activate pulse on the appropriate output pin, an individual sensor can be selected. All following commands will only be accepted from the activated sensor. tr tf high-level tp0 logical 0 tp0 or low-level tp1 high-level tp0 logical 1 low-level tp0 or tp1 Fig. 5–1: Definition of logical 0 and 1 bit Nov. 26, 2008; DSH000149_003EN 33 HAL855 DATA SHEET Table 5–1: Telegram parameters (All voltages are referenced to GND.) Symbol Parameter Pin No. Min. Typ. Max. Unit VDDL Supply Voltage for Low Level during Programming 1 5 5.5 6 V VDDH Supply Voltage for High Level during Programming 1 6.8 8.0 8.5 V tr Rise Time 1 − − 0.05 ms tf Fall Time 1 − − 0.05 ms tp0 Bit Time on VDD 1 1.7 1.75 1.8 ms tp0 is defined through the Sync Bit tpOUT Bit Time on Output Pin 3 2 3 4 ms tpOUT is defined through the Acknowledge Bit tp1 Voltage Change for Logical 1 1, 3 50 65 80 % % of tp0 or tpOUT tPROG Programming Time for EEPROM 1 95 100 105 ms VDD,PROG Supply Voltage during Programming 1 4.9 5 5.1 V trp Rise Time of Charging Pulse 1 0.2 0.5 1 ms tfp Fall Time of Charging Pulse 1 0 − 1 ms tw Delay Time of Charging Pulse after Acknowledge 1 0.5 0.7 1 ms Vact Voltage for an Activate Pulse 3 0 0 0.5 V tact Duration of an Activate Pulse 3 0.05 0.1 − ms 34 Nov. 26, 2008; DSH000149_003EN Conditions Micronas HAL855 DATA SHEET WRITE Sync COM CP ADR AP DAT DP VDD VOUT Fig. 5–2: Telegram for coding a Write command READ Sync COM CP ADR AP VDD Acknowledge DAT DP VOUT Fig. 5–3: Telegram for coding a Read command VOUT VACT tf tACT tr Fig. 5–4: Activate pulse Micronas Nov. 26, 2008; DSH000149_003EN 35 Sync PROM ERASE COM1 CP1 ADR1 AP1 Sync COM2 CP2 READ ADR2 AP2 Sync COM3 CP3 ADR3 AP3 VDD Acknowledge Acknowledge DAT DP DATA SHEET Micronas STORE SEQUENCE VOUT A Start the Charge Pump Detail A Stop the Charge Pump VDD VOUT 2 x Delay Time Programming Time = 100 ms Nov. 26, 2008; DSH000149_003EN Fig. 5–5: Telegram for programming the EEPROM HAL855 36 HAL855 DATA SHEET 5.3. Telegram Codes Data Bits (DAT) Sync Bit The 14 Data Bits contain the register information. Each telegram starts with the Sync Bit. This logical “0” pulse defines the exact timing for tp0. The registers use different number formats for the Data Bits. These formats are explained in Section 5.4. on page 38 Command Bits (COM) In the Write command, the last bits are valid. If, for example, the TC register (7 bits) is written, only the last 7 bits are valid. The Command code contains 3 bits and is a binary number. Table 5–2 shows the available commands and the corresponding codes for the HAL855. In the Read command, the first bits are valid. If, for example, the TC register (7 bits) is read, only the first 6 bits are valid. Command Parity Bit (CP) This parity bit is “1” if the number of zeros within the 3 Command Bits is odd. The parity bit is “0”, if the number of zeros is even. Data Parity Bit (DP) This parity bit is “1” if the number of zeros within the binary number is even. The parity bit is “0” if the number of zeros is odd. Address Bits (ADR) The Address code contains 4 bits and is a binary number. (see Table 5–3 on page 39) shows the available addresses for the HAL855 registers. Acknowledge After each telegram, the output answers with the Acknowledge signal. This logical “0” pulse defines the exact timing for tpOUT. Address Parity Bit (AP) This parity bit is “1” if the number of zeros within the 4 Address bits is odd. The parity bit is “0” if the number of zeroes is even. Table 5–2: Available commands Command Code Explanation READ 0 read a Setup EEPROM register (like TC, TCSQ, magnetic range, etc.) READL 6 read a Characteristics EEPROM register (setpoints 0 to 15) READH 7 read a Characteristics EEPROM register (setpoints 16 to 31) WRITE 3 write a Setup EEPROM register (like TC, TCSQ, Magnetic range, etc.) WRITEL 1 write a Characteristics EEPROM register (setpoints 0 to 15) WRITEH 2 write a Characteristics EEPROM register (setpoints 16 to 31) PROM 4 program all non-volatile registers ERASE 5 erase all non-volatile registers Please note: The LOCK bit is set by using the WRITE command followed by a PROM. Micronas Nov. 26, 2008; DSH000149_003EN 37 HAL855 DATA SHEET 5.4. Number Formats SHIFT Binary number: – The register range is from −1024 up to 1023. – The register value is calculated by: The most significant bit is given as first, the least significant bit as last digit. Shift SHIFT = -------------- × 1024 100% Example: 101001 represents 41 decimal. SLOPE Signed binary number: The first digit represents the sign of the following binary number (1 for negative, 0 for positive sign). Example: – The register range is from −8192 up to 8191. – The register value is calculated by: 0101001 represents +41 decimal 1101001 represents −41 decimal SLOPE = Slope × 2048 TC and TCSQ Two’s-complementary number: – The TC register range is from −31 up to 31. The first digit of positive numbers is “0”, the rest of the number is a binary number. Negative numbers start with “1”. In order to calculate the absolute value of the number, calculate the complement of the remaining digits and add “1”. – The TCSQ register range is from 0 up to 31. Example: Note: The word length TC register is 7 bit. The 6 LSBs represent a signed binary number. The MSB has to be ignored. 0101001 represents +41 decimal 1010111 represents −41 decimal MODE – The register range is from 0 up to 16383 and contains the settings for PERIOD, FORMAT, FILTER, and RANGE: 5.5. Register Information CURRENTSOURCE – The register range is from 0 to 1023 and contains the settings for LOW CURRENT, HIGH CURRENT, and SLEW RATE: CURRENTSOURCE = SLEW RATE × 256 + LOW CURRENT × 8 + HIGH CURR ENT MODE = PERIOD × 512 + FORMAT × 64 + FILTER × 8 + RANGE Please refer to the data sheet for the available PERIOD, FORMAT, FILTER, and RANGE values. DIGITAL-READOUT PARTNUMBER – The register range is from 0 up to 2047. – This register is read only. – The register range is from 0 up to 4095. OFFSET CORRECTION – The register range is from 0 to 31 – The MSB is set to activate the offset correction. 38 Nov. 26, 2008; DSH000149_003EN Micronas HAL855 DATA SHEET DEACTIVATE SPECIAL CUSTOMER – The register range is from 0 to 63 and contains the settings for OUTPUT BITTIME and PARTNUMBER ENABLE: SPECIAL CUSTOMER = PARTNUMBER ENABLE × 16 + OUTPUT BITTIME This register can only be written. – The register has to be written with 2063 decimal (80F hexadecimal) for the deactivation. – The sensor can be reset with an Activate pulse on the output pin or by switching off and on the supply voltage. Note: When output format PWM is used the default values for the PARTNUMBER ENABLE bit must not be modified: HAL855: PARTNUMBER ENABLE = 1 Table 5–3: Available register addresses for HAL855 Register Code Data Bits Format Customer Remark Currentsource 1 10 binary read/write/program In case of HAL855: used to define output slew rate In case of HAL856: used to define output current levels (IDD_HIGH and IDD_LOW) Partnumber 2 11 binary read/write/program Only with Biphase-M mode Shift 3 11 two’s compl. read/write/program Slope 4 14 signed binary read/write/program Mode 5 14 binary read/write/program Range, filter, and output format settings Lock 6 1 binary write/program Lock bit Digital Readout 7 12 binary read Digital value after signal processing Offset Correction 8 5 two’s compl. (4 LSBs) read/write/program Compensation of system offsets Specialcust. 9 6 binary read/write/program Special customer register To define Biphase-M bittime and Partnumber Enable TC 11 6 signed binary (6 LSBs) read/write/program Linear temperature coefficient TCSQ 12 5 binary read/write/program Quadratic temperature coefficient DEACTIVATE 15 11 binary write Deactivate the sensor Curve Low 0 ... 15 9 binary write/read/program Setpoints 0 to 15 Curve High 0 ... 15 9 binary write/read/program Setpoints 16 to 31 Micronas Nov. 26, 2008; DSH000149_003EN 39 HAL855 DATA SHEET 5.6. Programming Information If the content of any register is to be changed, the desired value must first be written into the corresponding RAM register. Before reading out the RAM register again, the register value must be permanently stored in the EEPROM. Permanently storing a value in the EEPROM is done by first sending an ERASE command followed by sending a PROM command and a read command. The address within the ERASE and PROM commands is not important. ERASE and PROM act on all registers in parallel. If all HAL855 registers are to be changed, all writing commands can be sent one after the other, followed by sending one ERASE and PROM command at the end. During all communication sequences, the customer has to check if the communication with the sensor was successful. This means that the acknowledge and the parity bits sent by the sensor have to be checked by the customer. If the Micronas programmer board is used, the customer has to check the error flags sent from the programmer board. It is recommended to use the programmer board version 5.1. Further information for the programming of the sensor can be found in the application note for the programmer board. Note: For production and qualification tests, it is mandatory to set the LOCK bit after final adjustment and programming of HAL855. The LOCK function is active after the next power-up of the sensor. The success of the LOCK process should be checked by reading at least one sensor register after locking and/or by an analog check of the sensors output signal. Electrostatic Discharges (ESD) may disturb the programming pulses. Please take precautions against ESD. 40 Nov. 26, 2008; DSH000149_003EN Micronas HAL855 DATA SHEET intentionally left vacant Micronas Nov. 26, 2008; DSH000149_003EN 41 HAL855 DATA SHEET 6. Data Sheet History 1. Data Sheet: “HAL85x Programmable Linear HallEffect Sensor”, Dec. 5, 2005, 6251-604-1DS. First release of the data sheet. Major changes: – Section 3.6. Characteristics changed – Section 2. Functional Description: new features added – Section 2.3. Calibration Procedure: completely updated 2. Data Sheet: “HAL855 Programmable Linear HallEffect Sensor with Arbitrary Output Characteristic”, Oct. 23, 2008, DSH000149_001EN. First release of the HAL855 data sheet. Major changes: – The previous data sheet for HAL85x has been separated into two individual data sheets, one each for HAL855 and for HAL856. This document describes HAL855 only. – Section 1.6."Solderability and Welding" updated – Section 4.4."Temperature Compensation" updated – Section 4.7."Start-Up Behavior" added 3. Data Sheet: “HAL855 Programmable Linear HallEffect Sensor with Arbitrary Output Characteristic”, Oct. 29, 2008, DSH000149_002EN. Second release of the HAL855 data sheet. Minor change: – Section 3.4."Absolute Maximum Ratings": VOUT updated 4. Data Sheet: “HAL855 Programmable Linear HallEffect Sensor with Arbitrary Output Characteristic”, Nov. 26, 2008, DSH000149_003EN. Third release of the HAL855 data sheet. Originally created for HW version HACD-4-4. Minor change: – Note regarding usage of the sensor beyond recommended operating conditions added Micronas GmbH Hans-Bunte-Strasse 19 ⋅ D-79108 Freiburg ⋅ P.O. Box 840 ⋅ D-79008 Freiburg, Germany Tel. +49-761-517-0 ⋅ Fax +49-761-517-2174 ⋅ E-mail: [email protected] ⋅ Internet: www.micronas.com 42 Nov. 26, 2008; DSH000149_003EN Micronas