TOSHIBA MP4513

MP4513
TOSHIBA Power Transistor Module Silicon NPN Triple Diffused Type (Darlington power transistor 4 in 1)
MP4513
Industrial Applications
High Power Switching Applications.
Hammer Drive, Pulse Motor Drive and Inductive Load
Switching.
·
Package with heat sink isolated to lead (SIP 12 pin)
·
High collector power dissipation (4 devices operation)
·
High collector current: IC (DC) = 5 A (max)
Unit: mm
: PT = 5 W (Ta = 25°C)
·
High DC current gain: hFE = 1000 (min) (VCE = 3 V, IC = 3 A)
·
Diode included for absorbing fly-back voltage.
Maximum Ratings (Ta = 25°C)
Characteristics
Symbol
Rating
Unit
Collector-base voltage
VCBO
100
V
Collector-emitter voltage
VCEO
100
V
Emitter-base voltage
VEBO
5
V
DC
IC
5
Pulse
ICP
8
IB
0.1
A
PC
3.0
W
Collector current
Continuous base current
A
JEDEC
―
JEITA
―
TOSHIBA
2-32B1A
Weight: 6.0 g (typ.)
Collector power dissipation
(1 device operation, Ta = 25°C)
Collector power
dissipation
Ta = 25°C
(4 devices operation)
Tc = 25°C
5.0
PT
Isolation voltage
Junction temperature
Storage temperature range
W
25
VIsol
1000
V
Tj
150
°C
Tstg
−55 to 150
°C
Array Configuration
2
3
4
5
1
9
8
10
11
12
6
7
R1 R2
R1 ≈ 5 kΩ
R2 ≈ 150 Ω
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MP4513
Thermal Characteristics
Characteristics
Thermal resistance of junction to
ambient
Symbol
Max
Unit
ΣRth (j-a)
25
°C/W
ΣRth (j-c)
5.0
°C/W
TL
260
°C
(4 devices operation, Ta = 25°C)
Thermal resistance of junction to case
(4 devices operation, Tc = 25°C)
Maximum lead temperature for
soldering purposes
(3.2 mm from case for 10 s)
Electrical Characteristics (Ta = 25°C)
Characteristics
Symbol
Test Condition
Min
Typ.
Max
Unit
Collector cut-off current
ICBO
VCB = 100 V, IE = 0 A
―
―
10
µA
Collector cut-off current
ICEO
VCE = 100 V, IB = 0 A
―
―
10
µA
Emitter cut-off current
IEBO
VEB = 5 V, IC = 0 A
0.3
―
2.0
mA
Collector-base breakdown voltage
V (BR) CBO
IC = 1 mA, IE = 0 A
100
―
―
V
Collector-emitter breakdown voltage
V (BR) CEO
IC = 30 mA, IB = 0 A
100
―
―
V
hFE (1)
VCE = 3 V, IC = 0.5 A
1000
―
―
hFE (2)
VCE = 3 V, IC = 3 A
1000
―
―
Collector-emitter
VCE (sat)
IC = 3 A, IB = 12 mA
―
―
2.0
Base-emitter
VBE (sat)
IC = 3 A, IB = 12 mA
―
―
2.5
fT
VCE = 3 V, IC = 0.5 A
―
10
―
MHz
VCB = 10 V, IE = 0 A, f = 1 MHz
―
40
―
pF
―
0.5
―
―
4.0
―
―
2.5
―
Saturation voltage
Transition frequency
Collector output capacitance
Turn-on time
Cob
ton
Input
Storage time
20 µs
tstg
IB2
IB1
Switching time
―
V
µs
VCC = 30 V
IB2
Fall time
Output
IB1
10 Ω
DC current gain
tf
IB1 = −IB2 = 12 mA, duty cycle ≤ 1%
Emitter-Collector Diode Ratings and Characteristics (Ta = 25°C)
Characteristics
Symbol
Test Condition
Min
Typ.
Max
Unit
Forward current
IFM
―
―
―
5
A
Surge current
IFSM
Forward voltage
VF
Reverse recovery time
trr
Reverse recovery charge
Qrr
t = 1 s, 1 shot
―
―
8
A
IF = 1 A, IB = 0 A
―
1.1
1.8
V
―
3.0
―
µs
―
40
―
µC
IF = 5 A, VBE = −3 V, dIF/dt = −50 A/µs
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2002-11-20
MP4513
Flyback-Diode Rating and Characteristics (Ta = 25°C)
Characteristics
Symbol
Test Condition
Min
Typ.
Max
Unit
Forward current
IFM
―
―
―
3
A
Reverse current
IR
VR = 100 V
―
―
0.4
µA
Reverse voltage
VR
IR = 100 µA
100
―
―
V
Forward voltage
VF
IF = 1 A
―
―
1.8
V
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MP4513
IC – VCE
IC – VBE
10
8
8
Common emitter
Tc = 25°C
VCE = 3 V
(A)
5
6
2
1
4
0.5
0.3
2
6
IC
3
Collector current
Collector current
IC
(A)
Common emitter
8
4
Tc = 100°C
25
−55
2
0.2
IB = 0.1 mA
0
0
0
2
4
6
8
Collector-emitter voltage
10
VCE
0
0
12
0.8
(V)
1.6
2.4
3.2
Base-emitter voltage VBE
hFE – IC
4.0
(V)
VCE – IB
30000
2.4
VCE = 3 V
VCE
25
5000
3000
Collector-emitter voltage
hFE
10000
DC current gain
(V)
Common emitter
Tc = 100°C
−55
1000
500
300
100
0.03
0.1
0.3
1
Collector current
3
IC
10
30
2.0
IC = 5 A
1.6
3
2
1.2
1
0.1
0.8
0.4
Common emitter
Tc = 25°C
0
0.03
(A)
0.1
0.3
1
3
Base current
VCE (sat) – IC
Base-emitter saturation voltage
VBE (sat) (V)
Collector-emitter saturation voltage
VCE (sat) (V)
IC/IB = 250
3
Tc = −55°C
1
25
0.3
0.1
30
100
10
Common emitter
0.5
10
(mA)
VBE (sat) – IC
10
5
IB
100
0.3
1
Collector current
3
IC
Common emitter
5
3
Tc = −55°C
1
(A)
25
100
0.5
0.3
0.1
10
IC/IB = 250
0.3
1
Collector current
4
3
IC
10
(A)
2002-11-20
MP4513
rth – tw
300
Curves should be applied in thermal
Transient thermal resistance
rth (°C/W)
100
50
30
(4)
limited area.
(single nonrepetitive pulse)
Below figure show thermal resistance per
1 unit versus pulse width.
10
5
3
-No heat sink and attached on a circuit board(1) 1 device operation
(2) 2 devices operation
(3) 3 devices operation
Circuit board
(4) 4 devices operation
1
0.3
0.001
0.01
0.1
1
10
Pulse width
tw
100
PT – Ta
8
Total power dissipation
1
0.5
0.3
0.1
*: Single nonrepetitive pulse
Tc = 25°C
0.05 Curves must be derated linearly
VCEO max
with increase in temperature.
0.03
3
10
30
100
1
(4)
(3)
4 (2)
Circuit board
(1)
2
40
80
120
160
200
Ambient temperature Ta (°C)
300
(V)
∆Tj – PT
160
(°C)
Collector-emitter voltage VCE
6
0
0
Junction temperature increase ∆Tj
Collector current
PT
100 µs*
10 ms*
1 ms*
IC
(A)
3
(1) 1 device operation
(2) 2 devices operation
(3) 3 devices operation
(4) 4 devices operation
Attached on a circuit board
(W)
IC max (pulsed)*
5
1000
(s)
Safe Operating Area
20
10
(3)
(2)
(1)
(1)
(2) (3) (4)
120
Attached on a circuit board
80
Circuit board
(1) 1 device operation
(2) 2 devices operation
(3) 3 devices operation
(4) 4 devices operation
40
0
0
2
4
6
Total power dissipation
5
8
PT
10
(W)
2002-11-20
MP4513
RESTRICTIONS ON PRODUCT USE
000707EAA
· TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability
Handbook” etc..
· The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this
document shall be made at the customer’s own risk.
· The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other
rights of the third parties which may result from its use. No license is granted by implication or otherwise under
any intellectual property or other rights of TOSHIBA CORPORATION or others.
· The information contained herein is subject to change without notice.
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2002-11-20