NELLSEMI N

RoHS
RoHS
N-60EPU06 Series
SEMICONDUCTOR
Nell High Power Products
FRED
Ultrafast Soft Recovery Diode, 60 A
FEATURES
N-60APU06
N-60EPU06
Ultrafast recovery
175 °C operating junction temperature
Designed and qualified for industrial level
-
BENEFITS
Cathode
to base
Reduced RFI and EMI
Cathode
to base
2
Higher frequency operation
2
Reduced snubbing
Reduced parts count
1
Cathode
DESCRIPTION/APPLICATIONS
These diodes are optimized to reduce losses and EMI/RFI
in high frequency power conditioning systems.
The softness of the recovery eliminates the need for a
snubber in most applications. These devices are ideally
suited for HF welding, power converters and other
applications where switching losses are not significant
portion of the total losses.
3
Anode
3
Anode
1
Anode
TO-247AC modified
TO-247AB
PRODUCT SUMMARY
trr
34 ns
IF(AV)
60 A
VR
600 V
ABSOLUTE MAXIMUM RATINGS
PARAMETER
SYMBOL
Cathode to anode voltage
TEST CONDITIONS
VR
Continuous forward current
VALUES
UNITS
600
V
IF(AV)
TC = 116 °C
60
Single pulse forward current
IFSM
TC = 25 °C
600
Maximum repetitive forward current
IFRM
Square wave, 20 kHz
120
Operating junction and storage temperatures
ELECTRICAL SPECIFICATIONS
PARAMETER
Breakdown voltage,
blocking voltage
Forward voltage
VF
Reverse leakage current
IR
Junction capacitance
CT
- 55 to 175
TJ, TStg
°C
(TJ = 25 ºC unless otherwise specified)
SYMBOL
VBR,
Vr
A
TEST CONDITIONS
MIN.
TYP.
MAX.
600
-
-
IF = 60 A
-
1.50
1.75
IF = 60 A, TJ = 125 ºC
-
1.30
1.55
IR= 100 µA
IF = 60 A, TJ = 175 ºC
-
1.20
1.40
VR= VR rated
-
-
50
TJ = 150 ºC, V R = VR rated
-
-
500
VR= 600 V
-
39
-
Page 1 of 6
UNITS
V
µA
pF
N-60EPU06 Series
SEMICONDUCTOR
RoHS
RoHS
Nell High Power Products
DYNAMIC RECOVERY CHARACTERISTICS
PARAMETER
Reverse recovery time
SYMBOL
trr
(TJ = 25 ºC unless otherwise specified)
TEST CONDITIONS
MIN.
TYP.
MAX.
I F = 0.5A, I R = 1A, I RR =0.25A (RG#1 CKT)
-
38
45
I F = 1A, dI F /dt = 200 A/µs, V R =30V
-
30
45
T J = 25°C
-
81
-
-
164
-
-
7.4
-
-
17
-
T J = 25°C
-
300
-
T J = 125°C
-
1394
-
MIN.
TYP.
MAX.
-
-
0.63
-
0.2
-
-
5.5
-
-
0.2
-
oz.
-
2.4
(20)
N⋅ m
(lbf . in)
T J = 125°C
Peak recovery current
lRRM
Reverse recovery charge
Qrr
IF = 60 A
dIF/dt = 200 A/µs
VR = 200 V
T J = 25°C
T J = 125°C
UNITS
ns
A
nC
THERMAL - MECHANICAL SPECIFICATIONS
PARAMETER
SYMBOL
Thermal resistance,
junction to case
RthJC
Thermal resistance,
case to heatsink
RthCS
TEST CONDITIONS
°C/W
Mounting surface, flat, smooth
and greased
Weight
1.2
(10)
Mounting torque
Marking device
UNITS
Case style TO-247AC modified
60EPU06
Case style TO-247AC
60APU06
Page 2 of 6
g
N-60EPU06 Series
SEMICONDUCTOR
RoHS
RoHS
Nell High Power Products
Fig.2 Typical values of reverse current vs.
reverse voltage
1000
Reverse current-l R (µA)
1000
100
T j =175°
T j =125°
T j =25°
10
1
100
T j =175°
10
T j =125°
1
0.1
T j =25°
0.01
0.001
0
0.5
1
1.5
3
2.5
2
0
100
Forward voltage drop-V F (A)
200
300
400
Reverse voltage-V R (V)
Fig.3 Typical junction capacitance vs. reverse voltage
Junction Capactiance(pF)
1000
100
T j =25°
10
0
100
200
300
400
500
600
Reverse voltage-V R (V)
Fig4. Maximum thermal impedance Z thJC characteristics
1
Thermal impedance-Z thJC (°C/W)
lnstantaneous forward current-I F (A)
Fig.1 Typical forward voltage drop characteristics
0.7
0.5
0.3
0.1
0.1
0.05
Tj
t1
t2
Ri (°C/W)
Ti (s)
0.06226
0.32503
0.24271
0.00049
0.01294
0.24310
Notes:
1. Duty factor D=t on /period
2. Peak T J =P DM xZ thJC +T c
t3 Tc
0.01
0.00001
0.0001
0.001
0.01
0.1
Rectangular pulse duration-t on (s)
Page 3 of 6
1
10
100
500
600
N-60EPU06 Series
SEMICONDUCTOR
RoHS
RoHS
Nell High Power Products
Fig.6 Forward Power Loss Characteristics
180
140
150
120
Average Power Loss (Watts)
Allowable Case Temperature (°C)
Fig.5 Max. Allowable Case Temperature
Vs. Average Forward Current
DC
120
90
Square Wave (D=0.50)
80% Rated Vr applied
60
30
RMS Limit
100
80
D = 0.01
D = 0.02
D = 0.05
D = 0.10
D = 0.20
D = 0.50
DC
60
40
20
see note (3)
0
0
0
20
40
60
80
0
100
Average Forward Current IF(AV) (A)
40
60
80
100
Average Forward Current IF(AV) (A)
Fig.7 Typical Stored Charge vs. dI F /dt
Fig.8 Typical Reverse Recovery Time vs. dI F /dt
300
3000
T j =125°C
T j =25°C
T j =125°C
T j =25°C
2500
250
I F = 30A
I F = 60A
I F = 30A
2000
I F = 60A
200
trr (ns)
Qrr (nC)
20
1500
150
1000
100
500
50
0
0
100
1000
10
100
dIF/dt (A/µs)
dIF/dt (A/µs)
Ordering Information Tabel
Device code
N
-
1
60
E
P
U
2
3
4
5
1
-
Nell
2
-
Current rating
3
-
Single Diode
4
-
TO-247AC (Modified)
5
-
Ultrafast Recovery
6
-
Voltage Rating (06 = 600 V)
06
(60 = 60A)
Page 4 of 6
E = 2 pins
A = 3 pins
1000
N-60EPU06 Series
SEMICONDUCTOR
RoHS
RoHS
Nell High Power Products
Fig.9 Reverse recovery parameter test circuit
Fig.10 Reverse recovery waveform and definitions
Page 5 of 6
N-60EPU06 Series
SEMICONDUCTOR
RoHS
RoHS
Nell High Power Products
Outine Table
N-60EPU06
Outine Table
N-60APU06
Page 6 of 6