ETC NT256S72V89A0G-7K

NT256S72V89A0G
256MB : 32M x 72
Unbuffered SDRAM Module
32Mx72 bit One Bank Unbuffered SDRAM Module
based on 32Mx8, 4Banks, 8K Refresh, 3.3V Synchronous DRAMs with SPD
Features
l
168-Pin Unbuffered 8-Byte Dual In-Line Memory Module
l
Automatic and controlled Precharge commands
l
Intended for PC133 applications
l
Programmable Operation:
- Clock Frequency: 133MHz
- CAS Latency: 2, 3
- Clock Cycle: 7.5ns
- Burst Type: Sequential or Interleave
- Clock Assess Time: 5.4ns
- Burst Length: 1, 2, 4, 8
l
Inputs and outputs are LVTTL (3.3V) compatible
- Operation: Burst Read and Write or Multiple Burst Read with
l
Single 3.3V ± 0.3V Power Supply
l
Single Pulsed RAS interface
l
Suspend Mode and Power Down Mode
Single Write
l
SDRAMs have 4 internal banks
l
8192 Refresh cycles distributed across 64ms
l
Module has 1 physical bank
l
Gold contacts
l
Fully Synchronous to positive Clock Edge
l
SDRAMs in TSOP Type II Package
l
Data Mask for Byte Read/Write control
l
Serial Presence Detect with Write Protect
l
Auto Refresh (CBR) and Self Refresh
Description
NT256S72V89A0G is unbuffered 168-pin Synchronous DRAM Dual In-Line Memory Modules (DIMM) which is organized as 32Mx72
high-speed memory arrays and is configured as one 32M x 72 physical bank. The DIMM uses nine 32Mx8 SDRAMs in 400mil TSOP II
packages. The DIMM achieves high-speed data transfer rates of up to 133MHz by employing a prefetch / pipeline hybrid architecture that
supports the JEDEC 1N rule while allowing very low burst power.
All control, address, and data input/output circuits are synchronized with the positive edge of the externally supplied clock inputs.
All inputs are sampled at the positive edge of each externally supplied clock (CK0, CK2). Internal operating modes are defined by combinations
of RAS , CAS , WE , S0 / S2 , DQMB, and CKE0 signals. A command decoder initiates the necessary timings for each operation. A 15-bit
address bus accepts address information in a row / column multiplexing arrangement.
Prior to any Access operation, the CAS latency, burst type, burst length, and Burst operation type must be programmed into the DIMM by
address inputs A0-A9 during the Mode Register Set cycle. The DIMM uses serial presence detects implemented via a serial EEPROM using
the two-pin IIC protocol. The first 128 bytes of serial PD data are used by the DIMM manufacturer. The last 128 bytes are available to the
customer.
Ordering Information
Speed
Part Number
Organization
MHz.
CL
t RCD
t RP
143MHz
3
3
3
133MHz
2
2
2
133MHz
3
3
3
100MHz
2
2
2
125MHz
3
3
3
100MHz
2
2
2
Leads
Power
Gold
3.3V
NT256S72V89A0G-7K
NT256S72V89A0G-75B
32Mx72
NT256S72V89A0G-8B
* CL = CAS Latency
Preliminary 09 / 2001
1
© NANYA TECHNOLOGY CORP.
NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
NT256S72V89A0G
256MB : 32M x 72
Unbuffered SDRAM Module
Pin Description
CK0, CK2
Clock Inputs
DQ0-DQ63
Data input/output
CK1, CK3
CKE0
Unused (terminated) Clock Inputs
CB0-CB7
Check Bit Data input/output
Clock Enable
DQMB0-DQMB7
Data Mask
RAS
Row Address Strobe
VDD
Power (3.3V)
CAS
Column Address Strobe
VSS
Ground
WE
Write Enable
NC
No Connect
S0 , S2
Chip Selects
SCL
Serial Presence Detect Clock Input
A0-A9, A11, A12
Address Inputs
SDA
Serial Presence Detect Data input/output
A10 / AP
Address Input/Autoprecharge
SA0-2
Serial Presence Detect Address Inputs
BA0, BA1
SDRAM Bank Address Inputs
WP
Serial Presence Detect Write Protect Input
Pinout
Pin
Front
Pin
Back
Pin
Front
Pin
Back
Pin
Front
Pin
Back
1
VSS
85
VSS
29
DQMB1
113
DQMB5
57
DQ18
141
DQ50
2
DQ0
86
DQ32
30
S0
114
NC
58
DQ19
142
DQ51
3
DQ1
87
DQ33
31
NC
115
RAS
59
VDD
143
VDD
4
DQ2
88
DQ34
32
VSS
116
VSS
60
DQ20
144
DQ52
5
DQ3
89
DQ35
33
A0
117
A1
61
NC
145
NC
6
VDD
90
VDD
34
A2
118
A3
62
NC
146
NC
7
DQ4
91
DQ36
35
A4
119
A5
63
NC
147
NC
8
DQ5
92
DQ37
36
A6
120
A7
64
VSS
148
VSS
9
DQ6
93
DQ38
37
A8
121
A9
65
DQ21
149
DQ53
10
DQ7
94
DQ39
38
A10/AP
122
BA0
66
DQ22
150
DQ54
11
DQ8
95
DQ40
39
BA1
123
A11
67
DQ23
151
DQ55
12
VSS
96
VSS
40
VDD
124
VDD
68
VSS
152
VSS
13
DQ9
97
DQ41
41
VDD
125
*CK1
69
DQ24
153
DQ56
14
DQ10
98
DQ42
42
CK0
126
A12
70
DQ25
154
DQ57
15
DQ11
99
DQ43
43
VSS
127
VSS
71
DQ26
155
DQ58
16
DQ12
100
DQ44
44
NC
128
CKE0
72
DQ27
156
DQ59
17
DQ13
101
DQ45
45
S2
129
NC
73
VDD
157
VDD
18
VDD
102
VDD
46
DQMB2
130
DQMB6
74
DQ28
158
DQ60
19
DQ14
103
DQ46
47
DQMB3
131
DQMB7
75
DQ29
159
DQ61
20
DQ15
104
DQ47
48
NC
132
NC
76
DQ30
160
DQ62
21
CB0
105
CB4
49
VDD
133
VDD
77
DQ31
161
DQ63
22
CB1
106
CB5
50
NC
134
NC
78
VSS
162
VSS
23
VSS
107
VSS
51
NC
135
NC
79
CK2
163
*CK3
24
NC
108
NC
52
CB2
136
CB6
80
NC
164
NC
25
NC
109
NC
53
CB3
137
CB7
81
WP
165
SA0
26
VDD
110
VDD
54
VSS
138
VSS
82
SDA
166
SA1
27
WE
111
CAS
55
DQ16
139
DQ48
83
SCL
167
SA2
28
DQMB0
112
DQMB4
56
DQ17
140
DQ49
84
VDD
168
VDD
Note: All pin assignments are consistent for all 8-byte unbuffered versions. Check bits (CB0-CB7) are applicable only to the x72 DIMM;
*CK1 and CK3 are terminated .
Preliminary 09 / 2001
2
© NANYA TECHNOLOGY CORP.
NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
NT256S72V89A0G
256MB : 32M x 72
Unbuffered SDRAM Module
SDRAM DIMM Block Diagram (1 Bank, 32Mx8 SDRAMs)
S0
DQMB0
DQMB4
*
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQM
DQ0
DQ1
DQ2
DQ3
CS
DQ32
DQ33
DQ34
DQ35
DQ36
DQ37
DQ38
DQ39
D0
DQ4
DQ5
DQ6
DQ7
DQMB1
DQM
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
CS
D5
DQMB5
DQ8
DQ9
DQ10
DQ11
DQ12
DQ13
DQ14
DQ15
DQM
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
CB0
CB1
CB2
CB3
CB4
CB5
CB6
CB7
DQM
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
CS
DQ40
DQ41
DQ42
DQ43
DQ44
DQ45
DQ46
DQ47
D1
DQM
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
CS
D6
CS
D2
S2
DQMB2
DQ16
DQ17
DQ18
DQ19
DQ20
DQ21
DQ22
DQ23
DQMB6
DQM
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
CS
DQ48
DQ49
DQ50
DQ51
DQ52
DQ53
DQ54
DQ55
D3
DQMB3
DQ24
DQ25
DQ26
DQ27
DQ28
DQ29
DQ30
DQ31
DQM
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
CS
D7
DQMB7
DQM
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
CS
DQ56
DQ57
DQ58
DQ59
DQ60
DQ61
DQ62
DQ63
D4
DQM
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
CS
D8
SPD
RAS
RAS : SDRAMs D0-D8
SCL
CAS
CAS : SDRAMs D0-D8
CKE0
CKE0 : SDRAMs D0-D8
WP
47k
WE
WE : SDRAMs D0-D8
A0-A12
A0-A11 : SDRAMs D0-D8
BA0
BA0 : SDRAMs D0-D8
BA1
BA1 : SDRAMs D0-D8
A1
SA0
VDD
CLK : SDRAMs D0-D2, D5-D6, 3.3pF Cap.
CK2
CLK : SDRAMs D3-D4, D7-D8, 3.3pF Cap.
A2
SDA
SA1 SA2
D0 - D8
0.33uF
0.1uF
VSS
CK0
Preliminary 09 / 2001
A0
CK1,CK3
10pF
D0 - D8
* All resistor values are 10 ohms except as shown.
3
© NANYA TECHNOLOGY CORP.
NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
NT256S72V89A0G
256MB : 32M x 72
Unbuffered SDRAM Module
Input/Output Functional Description
Symbol
Type
Signal
CK0 , CK2
Input
Pulse
CKE0
Input
Level
their associated clock.
Active
Activates the SDRAM CK0 and CK2 signals when high and deactivates them when low.
By deactivating the clocks, CKE0 low initiates the Power Down mode, Suspend mode, or
Active
Input
Pulse
Active
Input
Pulse
Low
BA0, BA1
Input
Level
the Self-Refresh mode.
Enables the associated SDRAM command decoder when low and disables the
command decoder when high. When the command decoder is disabled, new commands
Low
RAS , CAS , WE
The system clock inputs. All of the SDRAM inputs are sampled on the rising edge of
Edge
High
S0 , S2
Function
Polarity
Positive
-
are ignored but previous operations continue.
When sampled at the positive rising edge of the clock, RAS , CAS , WE define the
operation to be executed by the SDRAM.
Selects which SDRAM bank is to be active.
During a Bank Activate command cycle, A0-A12 defines the row address (RA0-RA12)
when sampled at the rising clock edge.
During a Read or Write command cycle, A0-A9 defines the column address (CA0-CA9)
when sampled at the rising clock edge. In addition to the column address, AP is used to
A0 - A9
A10/AP
invoke Autoprecharge operation at the end of the Burst Read or Write cycle. If AP is high,
Input
Level
-
autoprecharge is selected and BA0/BA1 define the bank to be precharged. If AP is low,
autoprecharge is disabled.
A11, A12
During a Precharge command cycle, AP is used in conjunction with BA0/BA1 to control
which bank(s) to precharge. If AP is high all 4 banks will be precharged regardless of the
state of BA0/BA1. If AP is low, then BA0/BA1 are used to define which bank to
pre-charge.
DQ0 - DQ63,
Input
Level
CB0 - CB7
-
/Output
Data and Check Bit input/output pins operate in the same manner as on conventional
DRAMs.
The Data input/output mask places the DQ buffers in a high impedance state when
Active
DQMB0 -DQMB7
Input
Pulse
sampled high. In Read mode, DQM has a latency of two clock cycles and controls the
output buffers like an output enable. In Write mode, DQM has a latency of zero and
High
operates as a byte mask by allowing input data to be written if it is low but blocks the
Write operation if DQM is high.
SA0 – SA2
Input
Level
-
Serial Presence Detect EEPROM address.
Serial Data. Bi-directional signal used to transfer data into and out of the Serial Presence
Input
SDA
Address inputs. Connected to either VDD or VSS on the system board to configure the
Level
-
/Output
Detect EEPROM. Since the SDA signal is Open Drain/Open Collector at the EEPROM, a
pull-up resistor is required on the system board.
Serial Clock. Used to clock all Serial Presence Detect data into and out of the EEPROM.
SCL
Input
Pulse
-
Since the SCL signal is inactive in the “high” state, a pull-up resistor is recommended on
the system board.
Active
WP
Input
Level
On the DIMM, this input is connected to the EEPROM Write Protect input and is also tied
High
VDD , VSS
Supply
Preliminary 09 / 2001
Hardware Write Protect. When WP is active, writing to the EEPROM array is inhibited.
to ground through a 47K ohm pull-down resistor.
Power and ground for the module.
4
© NANYA TECHNOLOGY CORP.
NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
NT256S72V89A0G
256MB : 32M x 72
Unbuffered SDRAM Module
Absolute Maximum Ratings
Symbol
Parameter
Rating
Units
Notes
V
1
0 to +70
°C
1
-55 to +125
VDD
Power Supply Voltage
VIN
Input Voltage
-0.3 to VDD +0.3
Output Voltage
-0.3 to VDD +0.3
VOUT
TA
TSTG
PD
IOUT
-0.3 to +4.6
Operating Temperature (ambient)
°C
1
Power Dissipation
9
W
1
Short Circuit Output Current
50
mA
1
Storage Temperature
1.1. Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device.
This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
Recommended DC Operating Conditions (T A =0 to 70 °C)
Rating
Symbol
1.
Parameter
Min.
Typ.
Max.
Units
Notes
VDD
Power Voltage
3.0
3.3
3.6
V
1
VIH
Input High Voltage
2.0
-
VDD + 0.3
V
1,2
VIL
Input Low Voltage
-0.3
-
0.8
V
1,3
VOH
Output High Voltage
2.4
-
-
V
VOL
Output Low Voltage
-
-
0.4
V
I IL
Input Leakage current
-10
-
10
uA
All voltages referenced to VSS .
2.
VIH (max) = VDD / VDDQ + 1.2V for pulse width ≤ 5ns
3.
VIL (min) = VSS / VSSQ - 1.2V for pulse width ≤ 5ns .
Capacitance (T A =25 °C , f =1MHz, V DD =3.3 ± 0.3V)
Symbol
Parameter
Max.
CI1
Input Capacitance (A0-A9, A10/AP, A11, BA0, BA1, RAS , CAS , WE )
77
CI2
Input Capacitance (CKE0)
58
CI3
Input Capacitance ( S0 - S2 )
33
CI4
Input Capacitance (CK0 - CK3)
40
CI5
Input Capacitance (DQMB0 - DQMB7)
21
CI6
Input Capacitance (SA0 - SA2, SCL, WP)
9
CIO1
Input/Output Capacitance (DQ0 - DQ63, CB0 - CB7)
10
CIO2
Input/Output Capacitance (SDA)
11
Unit
pF
DC Output Load Circuit
3.3 V
1200 ohms
VOH(DC) = 2.4V,IOH= -2mA
Output
VOL(DC) = 0.4V,IOL= -2mA
50 pF
Preliminary 09 / 2001
870 ohms
5
© NANYA TECHNOLOGY CORP.
NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
NT256S72V89A0G
256MB : 32M x 72
Unbuffered SDRAM Module
Operating, Standby, and Refresh Currents (TA =0 to 70 °C , VDD =3.3 ± 0.3V)
Parameter
Speed
Test condition
Symbol
Unit
Note
1035
mA
1, 2
16
16
mA
16
16
16
mA
270
270
180
mA
3
72
72
72
mA
4
54
54
54
mA
5
540
540
360
mA
3
1080
1080
810
mA
2, 6
1575
1575
1395
mA
- 7K
- 75B
- 8B
1170
1080
16
1 bank operation , tRC = tRC(mim), tCK = min
Operating current
ICC1
Active-Precharge Command cycling
without burst operation
Precharge
CKE0 ≤ VIL (max), tCK = min,
ICC2P
standby current
in power-down mode
Precharge
CKE0 ≤ VIL (max), tCK =oo,
ICC2PS
ICC2N
S0 , S2 = VIH (min)
CKE0 ≥ VIH (min), tCK = min
S0 , S2 = VIH (min)
standby current in non
power-down mode
S0 , S2 = VIH (min)
ICC2NS
CKE0 ≥ VIH (min), tCK =oo,
S0 , S2 = VIH (min)
No Operating current
ICC3P
CKE0 ≤ VIL (max), tCK =min.
S0 , S2 = VIH (min)
( Active state : 4 bank)
ICC3N
(Power Down Mode)
CKE0 ≥ VIH (min), tCK =min
S0 , S2 = VIH (min)
Operating current
( Burst mode )
tCK =min , Read/ Write command cycling,
ICC4
Multiple banks active, gapless data, BL=4
Auto(CBR)
refresh current
Self refresh current
ICC5
tCK =min, CBR command cycling
ICC6
CKE0 ≤ 0.2V
27
27
27
mA
ISB
VIN = GND or VDD
30
30
30
µA
7
SCL Clock Frequency=100 MHz
1
1
1
µA
8
Serial PD Device
Standby Current
Serial PD Device Active
ICCA
Power Supply Current
1. These parameters depend on the cycle rate and are measured with the cycle determined by the minimum value of t CK and t RC . Input
signals are changed up to three times during t RC (min).
2. The specified values are obtained with the output open.
3. Input signals are changed once during three clock cycles.
4. Input signals are stable.
5. Active standby current will be higher if Clock Suspend is entered during a Burst Read cycle (add 1mA per DQ).
6. Input signals are changed once during t ck(min) .
7. VDD =3.3V
8. Input pulse levels VDD x 0.1 to VDD x 0.9, input rise and fall times 10ns, input and output timing levels VDD x 0.5, output load 1 TTL gate and
CL=100pF.
Preliminary 09 / 2001
6
© NANYA TECHNOLOGY CORP.
NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
NT256S72V89A0G
256MB : 32M x 72
Unbuffered SDRAM Module
AC Characteristics (TA =0 to 70 °C , VDD =3.3 ± 0.3V)
1. An initial pause of 200us,with DQMB0-7 and CKE0 held high, is required after power-up. A Precharge All Banks command must be given
followed by a minimum of eight Auto (CBR) Refresh cycles before or after the Mode Register Set operation.
2. The Transition time is measured between VIH and VIL (or between VIH and VIL ).
3. In addition to meeting the transition rate specification, the CK0, CK2, and CKE0 signals must transit between VIH and VIL (or between VIL
and VIH ) in a monotonic manner.
4. AC timing tests have VIL =0.8Vand VIH = 2.0 V with the timing referenced to the 1.40V crossover point.
5. AC measurements assume t T =1.2 ns.
AC Output Load Circuits
tT
tCKL
Clock
tSETUP
tCKH
VIH
1.4V
VIL
tHOLD
Output
Zo = 50 ohm
Input
1.4V
tAC
50 pF
AC Output Load Circuit
tOH
tLZ
Output
Preliminary 09 / 2001
1.4V
7
© NANYA TECHNOLOGY CORP.
NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
NT256S72V89A0G
256MB : 32M x 72
Unbuffered SDRAM Module
AC Timing Parameters
Clock and Clock Enable Parameters
- 7K
Symbol
- 75B
- 8B
Parameter
Unit
Min.
Max.
Min.
Max.
Min.
Max.
Note
tCK3
Clock Cycle Time, CAS Latency = 3
7
1000
7.5
1000
8
1000
ns
tCK2
Clock Cycle Time, CAS Latency = 2
7.5
1000
10
1000
10
1000
ns
tAC3(B)
Clock Access Time, CAS Latency = 3
-
5.4
-
5.4
-
6
ns
1
tAC2(B)
Clock Access Time, CAS Latency = 2
-
5.4
-
6
-
6
ns
1
tCKH
Clock High Pulse Width
2.5
-
2.5
-
3
-
ns
2
tCKL
Clock Low Pulse Width
2.5
-
2.5
-
3
-
ns
2
tCES
Clock Enable Set-up Time
1.5
-
1.5
-
2
-
ns
tCEH
Clock Enable Hold Time
0.8
-
0.8
-
1
-
ns
tSB
Power down mode Entry Time
0
7.5
0
7.5
0
12
ns
tT
Transition Time (Rise and Fall)
0.5
10
0.5
10
0.5
10
ns
1.
Access time is measured at 1.4V. In AC Characteristics section, see notes.
2.
t CKH is the pulse width of CLK measured from the positive edge to the negative edge referenced to V IH (min). t CKL is the pulse width of
CLK measured from the negative edge to the positive edge referenced to V IL (max).
Common Parameters
- 7K
Symbol
- 75B
- 8B
Parameter
Unit
Min.
Max.
Min.
Max.
Min.
Max.
Note
tCS
Command Setup Time
1.5
-
1.5
-
2
-
ns
tCH
Command Hold Time
0.8
-
0.8
-
1
-
ns
tAS
Address and Bank Select Set-up Time
1.5
-
1.5
-
2
-
ns
tAH
Address and Bank Select Hold Time
0.8
-
0.8
-
1
-
ns
tRCD
RAS to CAS Delay
20
-
20
-
20
-
ns
1
tRC
Bank Cycle Time
60
-
67.5
-
70
-
ns
1
tRFC
Auto Refresh to Active/Auto Refresh
60
-
67.5
-
70
-
tRAS
Active Command Period
45
100K
45
100K
50
100K
ns
1
tRP
Precharge Time
20
-
20
-
20
-
ns
1
tRRD
Bank to Bank Delay Time
15
-
15
-
20
-
ns
1
tCCD
CAS to CAS Delay Time
1
-
1
-
1
-
CLK
1.These parameters account for the number of clock cycle and depend on the operating frequency of the clock, as follows: the num
ber of clock cycles = specified value of timing / clock period (count fractions as a whole number).
Mode Register Set Cycle
- 7K
Symbol
tRSC
- 75B
- 8B
Parameter
Mode Register Set Cycle Time
Min.
Max.
Min.
Max.
Min.
Max.
2
-
2
-
2
-
Unit
Note
CLK
1
1.These parameters account for the number of clock cycle and depend on the operating frequency of the clock, as follows: the num
ber of clock cycles = specified value of timing / clock period (count fractions as a whole number).
Preliminary 09 / 2001
8
© NANYA TECHNOLOGY CORP.
NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
NT256S72V89A0G
256MB : 32M x 72
Unbuffered SDRAM Module
Read Cycle
- 7K
Symbol
tOH
- 75B
- 8B
Parameter
Unit
Min.
Max.
Min.
Max.
Min.
Max.
-
-
-
-
2.5
-
ns
2.7
-
2.7
-
3
-
ns
0
-
0
-
ns
Note
Data Out Hold Time
tLZ
Data Out to Low Impedance Time
0
-
tHZ3
Data Out to High Impedance Time
3
5.4
3
5.4
3
6
ns
tDQZ
DQM Data Out Disable Latency
2
-
2
-
2
-
CLK
1
1. Referenced to the time at which the output achieves the open circuit condition, not to output voltage levels.
Refresh Cycle
- 7K
Symbol
- 75B
- 8B
Parameter
tREF
Refresh Period
tSREX
Self Refresh Exit Time
Unit
Min.
Max.
Min.
Max.
Min.
Max.
-
64
-
64
-
64
ms
10
-
10
-
10
-
ns
Note
Write Cycle
- 7K
Symbol
- 75B
- 8B
Parameter
Unit
Min.
Max.
Min.
Max.
Min.
Max.
tDS
Data In Set-up Time
1.5
-
1.5
-
2
-
ns
tDH
Data In Hold Time
0.8
-
0.8
-
1
-
ns
tDPL
Data input to Precharge
15
-
15
-
15
-
ns
5
-
5
-
5
-
CLK
5
-
-
-
-
-
CLK
0
-
0
-
0
-
ns
Note
Data In to Active Delay
tDAL3
CAS Latency = 3
Data In to Active Delay
tDAL2
CAS Latency = 2
tDQW
DQM Write Mask Latency
Preliminary 09 / 2001
9
© NANYA TECHNOLOGY CORP.
NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
NT256S72V89A0G
256MB : 32M x 72
Unbuffered SDRAM Module
Serial Presence Detect -- Part 1 of 2
32Mx72 SDRAM DIMM based on 32Mx8, 4Banks, 8K Refresh, 3.3v SDRAMs with SPD
Byte
-7K
0
Number of Serial PD Bytes Written during Production
1
Total Number of Bytes in Serial PD device
2
Fundamental Memory Type
3
Serial PD Data Entry
SPD Entry Value
Description
-75B
(Hexadecimal)
-8B
-7K
-75
128
80
256
08
SDRAM
04
Number of Row Addresses on Assembly
13
0D
4
Number of Column Addresses on Assembly
10
0A
5
Number of DIMM Bank
1
01
6.
Data Width of Assembly
X72
48
7
Data Width of Assembly (cont’)
8
Voltage Interface Level of this Assembly
X72
00
LVTTL
01
9
SDRAM Device Cycle Time at CL=3
10
SDRAM Device Access Time from Clock at CL=3
11
DIMM Configuration Type
12
Refresh Rate/Type
13
Primary SDRAM Width
14
Error Checking SDRAM Device Width
15
SDRAM Device Attributes: Min CLk Delay, Random Col Access
1 Clock
01
16
SDRAM Device Attributes: Burst Length Supported
1,2,4,8
0F
4
04
17
Note
-8B
7ns
7.5ns
8ns
70
75
80
5.4ns
5.4ns
6ns
54
54
60
SDRAM Device Attributes:
Number of Device Banks
2/3
ECC
02
SR/1x(7.8us)
82
X8
08
X8
08
18
SDRAM Device Attributes: CAS Latencies Supported
2/3
2/3
06
06
19
SDRAM Device Attributes: CS Latency
0
01
20
SDRAM Device Attributes: WE Latency
0
01
21
SDRAM Device Attributes
Unbuffered
00
22
SDRAM Device Attributes: General
06
Wr-1/Rd Burst, Precharge All,
Auto-Precharge, VDD +/-
0E
10%
23
Minimum Clock Cycle at CL=2
7.5ns
24
Maximum Data Access Time from Clock at CL=2
5.4ns
25
Minimum Clock Cycle Time at CL=1
N/A
00
26
Maximum Data Access Time from Clock at CL=1
N/A
00
27
Minimum Row Precharge Time(tRP)
15ns
20ns
20ns
0F
14
14
28
Minimum Row Active to Row Active delay (tRRD)
15ns
15ns
20ns
0F
0F
14
29
Minimum RAS to CAS delay (tRCD)
15ns
20ns
20ns
0F
14
14
30
Minimum RAS Pulse Width (tRAS)
45ns
45ns
50ns
2D
2D
32
31
Module Bank Density
32
Address and Command Setup Time Before Clock
1.5ns
1.5ns
2ns
15
15
20
33
Address and Command Hold Time After Clock
0.8ns
0.8ns
1ns
08
08
10
34
Data Input Setup Time Before Clock
1.5ns
1.5ns
2ns
15
15
20
35
Data Input Hold Time After Clock
0.8ns
0.8ns
1ns
08
08
10
SPD Revision
63
Checksum for byte 0 - 62
Preliminary 09 / 2001
10ns
75
A0
A0
6ns
6ns
54
60
60
256MB
36-61 Reserved
62
10ns
40
Undefined
1.2A
1.2A
00
1.2A
Checksum Data
12
12
12
1E
64
AB
10
© NANYA TECHNOLOGY CORP.
NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
NT256S72V89A0G
256MB : 32M x 72
Unbuffered SDRAM Module
Serial Presence Detect -- Part 2 of 2
32Mx72 SDRAM DIMM based on 32Mx8, 4Banks, 8K Refresh, 3.3V SDRAMs with SPD
Byte
-7K
64-71
72
Manufacturer’s JEDED ID Code
Module Part number
91-92
Module Revision Code
93-94
Module Manufacturing Data
95-98
Module Serial Number
127
Modules Supports this Clock Frequency
yy= Binary coded decimal year code, 0-99(Decimal), 00-63(Hex)
ww= Binary coded decimal year code, 01-52(Decimal), 01-34(Hex)
3.
NANYA 11decimal (bank four) 0000 1011 binary 0B Hex.
Preliminary 09 / 2001
N/A
-75B
00
00
00
Year/Week Code
yy/ww
Serial Number
00
Undefined
00
100MHz
64
Undefined
-8B
3
00
N/A
N/A
Concurrent AP
128-255 Open for customer Use
1.
-7K
Note
7F7F7F0B00000000
CK0, CK2,CL3, CL2
Attributes for Clock Frequency defined in byte 126
2.
-8B
N/A
N/A
99-125 Reserved
126
-75B
(Hexadecimal)
NANYA
Module Manufacturing Location
73-90
Serial PD Data Entry
SPD Entry Value
Description
00
1,2
AF
00
11
© NANYA TECHNOLOGY CORP.
NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
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