MITSUBISHI RF MOSFET MODULE ELECTROSTATIC SENSITIVE DEVICE OBSERVE HANDLING PRECAUTIONS RA18H1213G 1.24-1.30GHz 18W 12.5V, 3 Stage Amp. For MOBILE RADIO DESCRIPTION The RA18H1213G is a 18-watt RF MOSFET Amplifier Module for 12.5-volt mobile radios that operate in the 1.24- to 1.30-GHz range. The battery can be connected directly to the drain of the enhancement-mode MOSFET transistors. Without the gate voltage (VGG=0V), only a small leakage current flows into the drain and the RF input signal attenuates up to 60 dB. The output power and drain current increase as the gate voltage increases. With a gate voltage around 4V (minimum), output power and drain current increases substantially. The nominal output power becomes available at 4.5V (typical) and 5V (maximum). At VGG=5V, the typical gate current is 1 mA. This module is designed for non-linear FM modulation, but may also be used for linear modulation by setting the drain quiescent current with the gate voltage and controlling the output power with the input power. FEATURES • Enhancement-Mode MOSFET Transistors (IDD≅0 @ VDD=12.5V, VGG=0V) • Pout>18W, ηT>20% @ VDD=12.5V, VGG=5V, Pin=200mW • Broadband Frequency Range: 1.24-1.30GHz • Low-Power Control Current IGG=1mA (typ) at VGG=5V • Module Size: 66 x 21 x 9.88 mm • Linear operation is possible by setting the quiescent drain current with the gate voltage and controlling the output power with the input power BLOCK DIAGRAM 2 3 1 4 5 1 RF Input (Pin) 2 Gate Voltage (VGG), Power Control 3 Drain Voltage (VDD), Battery 4 RF Output (Pout) 5 RF Ground (Case) PACKAGE CODE: H2S ORDERING INFORMATION: ORDER NUMBER SUPPLY FORM RA18H1213G-01 Antistatic tray, 10 modules/tray RA18H1213G MITSUBISHI ELECTRIC 1/9 5 April 2004 ELECTROSTATIC SENSITIVE DEVICE MITSUBISHI RF POWER MODULE RA18H1213G OBSERVE HANDLING PRECAUTIONS MAXIMUM RATINGS (Tcase=+25°C, unless otherwise specified) SYMBOL PARAMETER VDD CONDITIONS Drain Voltage VGG<5V, ZG=ZL=50Ω VGG Gate Voltage VDD<12.5V, Pin=0mW, ZG=ZL=50Ω Pin Input Power Pout Output Power f=1.24-1.30GHz, ZG=ZL=50Ω Operation Case Temperature Range f=1.24-1.30GHz, ZG=ZL=50Ω Tcase(OP) Tstg Storage Temperature Range RATING UNIT 17 V 6 V 300 mW 30 W -30 to +110 °C -40 to +110 °C The above parameters are independently guaranteed. ELECTRICAL CHARACTERISTICS (Tcase=+25°C, ZG=ZL=50Ω, unless otherwise specified) SYMBOL PARAMETER f Frequency Range Pout Output Power ηT Total Efficiency nd 2fo 2 ρin Input VSWR IGG Gate Current Gp Linear power gain IMD3 IMD5 — — CONDITIONS Harmonic MIN TYP 1.24 MAX UNIT 1.30 GHz 18 W 20 % VDD=12.5V, VGG=5V, Pin=200mW -30 3:1 — 1 VDD=12.5V, VGG=5V, Pin=10dBm rd 3 Inter Modulation Distortion VDD=12.5V, VGG=5V Delta f=f1-f2=10KHz th 5 Inter Modulation Distortion Pout=14W P.E.P. (Pin control) VDD=10.0-15.5V, Pin=0-25dBm, Stability Pout=1 to 18W (VGG control), Load VSWR=3:1 VDD=15.2V, Pin=200mW, Load VSWR Tolerance Pout=18W (VGG control), Load VSWR=8:1 mA 23 dB -20 dBc -25 dBc No parasitic oscillation — No degradation or destroy — All parameters, conditions, ratings, and limits are subject to change without notice. RA18H1213G MITSUBISHI ELECTRIC 2/9 5 April 2004 MITSUBISHI RF POWER MODULE ELECTROSTATIC SENSITIVE DEVICE RA18H1213G OBSERVE HANDLING PRECAUTIONS TYPICAL PERFORMANCE (Tcase=+25°C, ZG=ZL=50Ω, unless otherwise specified) 2nd, 3rd HARMONICS versus FREQUENCY OUTPUT POWER, TOTAL EFFICIENCY, and INPUT VSWR versus FREQUENCY 80 -20 VDD=12.5V VGG=5V Pin=200mW TOTAL EFFICIENCY ηT(%) 50 40 ηT 30 20 10 ρin 1240 1260 1280 1300 FREQUENCY f(MHz) 0 1320 6 Gp 20 4 IDD f=1240MHz, VDD=12.5V, VGG=5V 10 2 0 0 0 5 10 15 20 1240 1260 1280 1300 FREQUENCY f(MHz) 10 Pout 40 30 6 IDD 20 f=1270MHz, VDD=12.5V, VGG=5V 0 0 0 5 6 20 4 IDD f=1300MHz, VDD=12.5V, VGG=5V 10 15 20 OUTPUT POWER Pout(W) Gp 5 2 40 6 20 4 10 2 0 4 2 0 6 RA18H1213G 8 10 12 14 DRAIN VOLTAGE VDD(V) 16 OUTPUT POWER Pout(W) 6 0 16 50 DRAIN CURRENT IDD(A) OUTPUT POWER Pout(W) 8 10 8 10 12 14 DRAIN VOLTAGE VDD(V) OUTPUT POWER and DRAIN CURRENT versus DRAIN VOLTAGE 10 Pout 8 Pout 6 IDD 30 IDD 30 25 50 20 25 0 0 OUTPUT POWER and DRAIN CURRENT versus DRAIN VOLTAGE 40 20 10 f=1240MHz, VGG=5V, Pin=200mW INPUT POWER Pin(dBm) f=1270MHz, VGG=5V, Pin=200mW 15 50 DRAIN CURRENT IDD(A) OUTPUT POWER Pout(dBm) POWER GAIN Gp(dB) 8 Pout 0 10 OUTPUT POWER and DRAIN CURRENT versus DRAIN VOLTAGE 10 0 2 INPUT POWER Pin(dBm) 50 10 4 10 25 OUTPUT POWER, POWER GAIN and DRAIN CURRENT versus INPUT POWER 30 8 Gp INPUT POWER Pin(dBm) 40 1320 50 OUTPUT POWER Pout(dBm) POWER GAIN Gp(dB) 30 8 2rd OUTPUT POWER, POWER GAIN and DRAIN CURRENT versus INPUT POWER DRAIN CURRENT IDD(A) OUTPUT POWER Pout(dBm) POWER GAIN Gp(dB) Pout nd -60 10 40 3 -50 -70 1220 OUTPUT POWER, POWER GAIN and DRAIN CURRENT versus INPUT POWER 50 -40 DRAIN CURRENT IDD(A) 0 1220 10 -30 10 f=1300MHz, VGG=5V, Pin=200mW 40 IDD 8 30 6 Pout 20 4 10 2 0 0 6 8 10 12 14 DRAIN VOLTAGE VDD(V) MITSUBISHI ELECTRIC 3/9 DRAIN CURRENT IDD(A) VDD=12.5V VGG=5V Pin=200mW 20 60 DRAIN CURRENT IDD(A) Pout 30 HARMONICS (dBc) 70 INPUT VSWR ρin (-) OUTPUT POWER Pout(W) 40 16 5 April 2004 MITSUBISHI RF POWER MODULE ELECTROSTATIC SENSITIVE DEVICE RA18H1213G OBSERVE HANDLING PRECAUTIONS TYPICAL PERFORMANCE (Tcase=+25°C, ZG=ZL=50Ω, unless otherwise specified) 50 40 10 IDD 8 Pout 30 6 20 4 10 2 0 0 3 3.5 4 4.5 5 5.5 GATE VOLTAGE VGG(V) 60 OUTPUT POWER P out(W) 12 f=1240MHz, VDD=12.5V, Pin=200mW DRAIN CURRENT I DD(A) OUTPUT POWER P out(W) 60 OUTPUT POWER and DRAIN CURRENT versus GATE VOLTAGE 8 Pout 30 6 20 4 10 2 0 0 3 3.5 4 4.5 5 5.5 GATE VOLTAGE VGG(V) 6 20 4 10 2 0 3.5 4 4.5 5 5.5 GATE VOLTAGE VGG(V) f=1240MHz VDD=12.5V VGG=5V -30 6 IMD3 IMD5 -40 -50 -60 6 26 3rd,5th.INTERMODULATION DISTORTIN versus OUTPUT POWER CHARACTERISTICS 28 30 32 34 36 38 40 42 OUTPUT POWER(dBm P.E.P.) 44 3rd,5th.INTERMODULATION DISTORTIN versus OUTPUT POWER CHARACTERISTICS -20 f=1270MHz VDD=12.5V VGG=5V -30 IMD3 IMD5 -40 -50 -60 IMD3,IMD5 (dBc) -20 IMD3,IMD5 (dBc) 30 -20 IMD3,IMD5 (dBc) IDD 8 Pout 3rd,5th.INTERMODULATION DISTORTIN versus OUTPUT POWER CHARACTERISTICS DRAIN CURRENT I DD(A) OUTPUT POWER P out(W) 10 40 40 3 12 50 10 IDD 0 OUTPUT POWER and DRAIN CURRENT versus GATE VOLTAGE f=1300MHz, VDD=12.5V, Pin=200mW 50 6 60 12 f=1270MHz, VDD=12.5V, Pin=200mW DRAIN CURRENT I DD(A) OUTPUT POWER and DRAIN CURRENT versus GATE VOLTAGE f=1300MHz VDD=12.5V VGG=5V -30 IMD3 -40 IMD5 -50 -60 26 RA18H1213G 28 30 32 34 36 38 40 42 OUTPUT POWER(dBm P.E.P.) 44 26 28 30 32 34 36 38 40 42 OUTPUT POWER(dBm P.E.P.) MITSUBISHI ELECTRIC 4/9 44 5 April 2004 MITSUBISHI RF POWER MODULE ELECTROSTATIC SENSITIVE DEVICE RA18H1213G OBSERVE HANDLING PRECAUTIONS OUTLINE DRAWING (mm) 66.0 ±0.5 7.25 ±0.8 51.5 ±0.5 3 2.0 ±0.5 2 4 4.0 ±0.3 9.5 ±0.5 5 1 14.0 ±1 2-R2 ±0.5 17.0 ±0.5 60.0 ±0.5 21.0 ±0.5 3.0 ±0.3 Ø0.45 ±0.15 12.0 ±1 16.5 ±1 43.5 ±1 (50.4) (9.88) 2.3 ±0.3 7.5 ±0.5 0.09 ±0.02 3.1 +0.6/-0.4 55.5 ±1 1 RF Input (Pin) 2 Gate Voltage (VGG) 3 Drain Voltage (VDD) 4 RF Output (Pout) 5 RF Ground (Case) RA18H1213G MITSUBISHI ELECTRIC 5/9 5 April 2004 MITSUBISHI RF POWER MODULE ELECTROSTATIC SENSITIVE DEVICE RA18H1213G OBSERVE HANDLING PRECAUTIONS TEST BLOCK DIAGRAM Power Meter DUT 1 Signal Generator Preamplifier Attenuator Attenuator Directional Coupler 3 2 Spectrum Analyzer 4 ZL=50Ω ZG=50Ω C1 5 Directional Coupler Attenuator Power Meter C2 + DC Power Supply VGG + DC Power Supply VDD C1, C2: 4700pF, 22uF in parallel 1 RF Input (Pin) 2 Gate Voltage (VGG) 3 Drain Voltage (VDD) 4 RF Output (Pout) 5 RF Ground (Case) EQUIVALENT CIRCUIT 2 3 1 4 5 RA18H1213G MITSUBISHI ELECTRIC 6/9 5 April 2004 ELECTROSTATIC SENSITIVE DEVICE OBSERVE HANDLING PRECAUTIONS MITSUBISHI RF POWER MODULE RA18H1213G PRECAUTIONS, RECOMMENDATIONS, and APPLICATION INFORMATION: Construction: This module consists of an alumina substrate soldered onto a copper flange. For mechanical protection, a plastic cap is attached with silicone. The MOSFET transistor chips are die bonded onto metal, wire bonded to the substrate, and coated with resin. Lines on the substrate (eventually inductors), chip capacitors, and resistors form the bias and matching circuits. Wire leads soldered onto the alumina substrate provide the DC and RF connection. Following conditions must be avoided: a) Bending forces on the alumina substrate (for example, by driving screws or from fast thermal changes) b) Mechanical stress on the wire leads (for example, by first soldering then driving screws or by thermal expansion) c) Defluxing solvents reacting with the resin coating on the MOSFET chips (for example, Trichlorethylene) d) Frequent on/off switching that causes thermal expansion of the resin e) ESD, surge, overvoltage in combination with load VSWR, and oscillation ESD: This MOSFET module is sensitive to ESD voltages down to 1000V. Appropriate ESD precautions are required. Mounting: Heat sink flatness must be less than 50 µm (a heat sink that is not flat or particles between module and heat sink may cause the ceramic substrate in the module to crack by bending forces, either immediately when driving screws or later when thermal expansion forces are added). A thermal compound between module and heat sink is recommended for low thermal contact resistance and to reduce the bending stress on the ceramic substrate caused by the temperature difference to the heat sink. The module must first be screwed to the heat sink, then the leads can be soldered to the printed circuit board. M3 screws are recommended with a tightening torque of 0.4 to 0.6 Nm. Soldering and Defluxing: This module is designed for manual soldering. The leads must be soldered after the module is screwed onto the heat sink. The soldering temperature must be lower than 260°C for a maximum of 10 seconds, or lower than 350°C for a maximum of three seconds. Ethyl Alcohol is recommend for removing flux. Trichlorethylene solvents must not be used (they may cause bubbles in the coating of the transistor chips which can lift off the bond wires). Thermal Design of the Heat Sink: At Pout=18W, VDD=12.5V and Pin=200mW each stage transistor operating conditions are: Pin Pout Rth(ch-case) IDD @ ηT=20% VDD Stage (W) (W) (°C/W) (A) (V) st 1 0.2 1.3 4.5 0.55 nd 12.5 2 1.3 6.0 3.2 2.00 rd 3 6.0 18.0 1.6 4.50 The channel temperatures of each stage transistor Tch = Tcase + (VDD x IDD - Pout + Pin) x Rth(ch-case) are: Tch1 = Tcase + (12.5V x 0.55A – 1.3W + 0.2W) x 4.5°C/W = Tcase + 26.0°C Tch2 = Tcase + (12.5V x 2.00A – 6.0W + 1.3W) x 3.2°C/W = Tcase + 65.0 °C Tch3 = Tcase + (12.5V x 4.50A - 18.0W + 6.0W) x 1.6°C/W = Tcase + 70.8 °C For long-term reliability, it is best to keep the module case temperature (Tcase) below 90°C. For an ambient temperature Tair=60°C and Pout=18W, the required thermal resistance Rth (case-air) = ( Tcase - Tair) / ( (Pout / ηT ) - Pout + Pin ) of the heat sink, including the contact resistance, is: Rth(case-air) = (90°C - 60°C) / (18W/20% – 18W + 0.2W) = 0.42 °C/W When mounting the module with the thermal resistance of 0.42 °C/W, the channel temperature of each stage transistor is: Tch1 = Tair + 56.0 °C Tch2 = Tair + 95.0 °C Tch3 = Tair + 100.8 °C The 175°C maximum rating for the channel temperature ensures application under derated conditions. RA18H1213G MITSUBISHI ELECTRIC 7/9 5 April 2004 ELECTROSTATIC SENSITIVE DEVICE OBSERVE HANDLING PRECAUTIONS MITSUBISHI RF POWER MODULE RA18H1213G Output Power Control: Depending on linearity, the following two methods are recommended to control the output power: a) Non-linear FM modulation: By the gate voltage (VGG). When the gate voltage is close to zero, the RF input signal is attenuated up to 60 dB and only a small leakage current flows from the battery into the drain. Around VGG=4V, the output power and drain current increases substantially. Around VGG=4.5V (typical) to VGG=5V (maximum), the nominal output power becomes available. b) Linear AM modulation: By RF input power Pin. The gate voltage is used to set the drain’s quiescent current for the required linearity. Oscillation: To test RF characteristics, this module is put on a fixture with two bias decoupling capacitors each on gate and drain, a 4.700 pF chip capacitor, located close to the module, and a 22 µF (or more) electrolytic capacitor. When an amplifier circuit around this module shows oscillation, the following may be checked: a) Do the bias decoupling capacitors have a low inductance pass to the case of the module? b) Is the load impedance ZL=50Ω? c) Is the source impedance ZG=50Ω? Frequent on/off switching: In base stations, frequent on/off switching can cause thermal expansion of the resin that coats the transistor chips and can result in reduced or no output power. The bond wires in the resin will break after long-term thermally induced mechanical stress. Quality: Mitsubishi Electric is not liable for failures resulting from base station operation time or operating conditions exceeding those of mobile radios. This module technology results from more than 20 years of experience, field proven in tens of millions of mobile radios. Currently, most returned modules show failures such as ESD, substrate crack, and transistor burnout, which are caused by improper handling or exceeding recommended operating conditions. Few degradation failures are found. Keep safety first in your circuit designs! Mitsubishi Electric Corporation puts the maximum effort into making semiconductor products better and more reliable, but there is always the possibility that trouble may occur. Trouble with semiconductors may lead to personal injury, fire or property damage. Remember to give due consideration to safety when making your circuit designs, with appropriate measures such as (i) placement of substitutive, auxiliary circuits, (ii) use of non-flammable material, or (iii) prevention against any malfunction or mishap. RA18H1213G MITSUBISHI ELECTRIC 8/9 5 April 2004 SALES CONTACT JAPAN: Mitsubishi Electric Corporation Semiconductor Sales Promotion Department 2-2-3 Marunouchi, Chiyoda-ku Tokyo, Japan 100 Email: [email protected] Phone: +81-3-3218-4854 Fax: +81-3-3218-4861 GERMANY: Mitsubishi Electric Europe B.V. Semiconductor Gothaer Strasse 8 D-40880 Ratingen, Germany Email: [email protected] Phone: +49-2102-486-0 Fax: +49-2102-486-4140 HONG KONG: Mitsubishi Electric Hong Kong Ltd. Semiconductor Division 41/F. Manulife Tower, 169 Electric Road North Point, Hong Kong Email: [email protected] Phone: +852 2510-0555 Fax: +852 2510-9822 FRANCE: Mitsubishi Electric Europe B.V. Semiconductor 25 Boulevard des Bouvets F-92741 Nanterre Cedex, France Email: [email protected] Phone: +33-1-55685-668 Fax: +33-1-55685-739 SINGAPORE: Mitsubishi Electric Asia PTE Ltd Semiconductor Division 307 Alexandra Road #3-01/02 Mitsubishi Electric Building, Singapore 159943 Email: [email protected] Phone: +65 64 732 308 Fax: +65 64 738 984 ITALY: Mitsubishi Electric Europe B.V. Semiconductor Centro Direzionale Colleoni, Palazzo Perseo 2, Via Paracelso I-20041 Agrate Brianza, Milano, Italy Email: [email protected] Phone: +39-039-6053-10 Fax: +39-039-6053-212 TAIWAN: Mitsubishi Electric Taiwan Company, Ltd., Semiconductor Department 9F, No. 88, Sec. 6 Chung Shan N. Road Taipei, Taiwan, R.O.C. Email: [email protected] Phone: +886-2-2836-5288 Fax: +886-2-2833-9793 U.K.: Mitsubishi Electric Europe B.V. Semiconductor Travellers Lane, Hatfield Hertfordshire, AL10 8XB, England Email: [email protected] Phone: +44-1707-278-900 Fax: +44-1707-278-837 U.S.A.: Mitsubishi Electric & Electronics USA, Inc. Electronic Device Group 1050 East Arques Avenue Sunnyvale, CA 94085 Email: [email protected] Phone: 408-730-5900 Fax: 408-737-1129 AUSTRALIA: Mitsubishi Electric Australia, Semiconductor Division 348 Victoria Road Rydalmere, NSW 2116 Sydney, Australia Email: [email protected] Phone: +61 2 9684-7210 +61 2 9684 7212 +61 2 9684 7214 +61 3 9262 9898 Fax: +61 2 9684-7208 +61 2 9684 7245 CANADA: Mitsubishi Electric Sales Canada, Inc. 4299 14th Avenue Markham, Ontario, Canada L3R OJ2 Phone: 905-475-7728 Fax: 905-475-1918 RA18H1213G MITSUBISHI ELECTRIC 9/9 5 April 2004