SSM9985GM N-CHANNEL ENHANCEMENT MODE POWER MOSFET PRODUCT SUMMARY Low On-Resistance Fast Switching Speed Surface Mount Package D D D D S 40V RDS(ON) 15mΩ ID G SO-8 BVDSS 10A S S DESCRIPTION The advanced power MOSFETs from Silicon Standard Corp. provide the designer with the best combination of fast switching, ruggedized device design, ultra low on-resistance and cost-effectiveness. D G S Pb-free; RoHS-compliant ABSOLUTE MAXIMUM RATINGS Symbol Parameter VDS Drain-Source Voltage VGS Gate-Source Voltage ID@TA=25℃ ID@TA=70℃ Rating Units 40 V ± 20 V Continuous Drain Current 3 10 A Continuous Drain Current 3 8 A 48 A 1 IDM Pulsed Drain Current PD@TA=25℃ Total Power Dissipation 2.5 W Linear Derating Factor 0.02 W/℃ TSTG Storage Temperature Range -55 to 150 ℃ TJ Operating Junction Temperature Range -55 to 150 ℃ THERMAL DATA Symbol Rthj-amb 10/31/2007 Rev.1.00 Parameter Thermal Resistance Junction-ambient 3 Max. www.SiliconStandard.com Value Unit 50 ℃/W 1 SSM9985GM ELECTRICAL CHARACTERISTICS o (TJ=25 C unless otherwise specified) Symbol Parameter Test Conditions Min. Typ. 40 - - V - 0.032 - V/℃ VGS=10V, ID=10A - - 15 mΩ VGS=4.5V, ID=5A - - 25 mΩ VDS=VGS, ID=250uA 1 - 3 V BVDSS Drain-Source Breakdown Voltage ΔBVDSS/ΔTj Breakdown Voltage Temperature Coefficient Reference to 25℃, ID=1mA RDS(ON) Static Drain-Source On-Resistance VGS(th) Gate Threshold Voltage gfs Forward Transconductance IDSS 2 VDS=10V, ID=10A - 35 - S o VDS=40V, VGS=0V - - 1 uA o Drain-Source Leakage Current (Tj=70 C) VDS=32V ,VGS=0V - - 25 uA Gate-Source Leakage VGS= ± 20V - - ±100 nA ID=10A - 14.7 - nC Drain-Source Leakage Current (Tj=25 C) IGSS VGS=0V, ID=250uA Max. Units 2 Qg Total Gate Charge Qgs Gate-Source Charge VDS=20V - 7.1 - nC Qgd Gate-Drain ("Miller") Charge VGS=4.5V - 6.8 - nC VDS=20V - 11.5 - ns 2 td(on) Turn-on Delay Time tr Rise Time ID=1A - 6.3 - ns td(off) Turn-off Delay Time RG=3.3Ω,VGS=10V - 28.2 - ns tf Fall Time RD=20Ω - 12.6 - ns Ciss Input Capacitance VGS=0V - 1725 - pF Coss Output Capacitance VDS=25V - 235 - pF Crss Reverse Transfer Capacitance f=1.0MHz - 145 - pF Min. Typ. VD=VG=0V , VS=1.3V - - 1.92 A Tj=25℃, IS=2.3A, VGS=0V - - 1.3 V SOURCE-DRAIN DIODE Symbol IS VSD Parameter Test Conditions Continuous Source Current ( Body Diode ) Forward On Voltage 2 Max. Units Notes: 1.Pulse width limited by Max. junction temperature. 2.Pulse width <300us , duty cycle <2%. 3.Surface mounted on 1 in2 copper pad of FR4 board ; 125 ℃/W when mounted on Min. copper pad. 10/31/2007 Rev.1.00 www.SiliconStandard.com 2 SSM9985GM 50 45 10V 6.0V 5.0V T C =25 o C 10V 6.0V 5.0V 4.5V T C =150 o C 40 ID , Drain Current (A) ID , Drain Current (A) 4.5V 30 20 V GS =4.0V 30 V GS =4.0V 15 10 0 0 0 1 2 3 0 4 1 2 3 4 V DS , Drain-to-Source Voltage (V) V DS , Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics Fig 2. Typical Output Characteristics 2 80 I D =10A T C =25 ℃ I D =10A V GS =10V Normalized RDS(ON) RDS(ON) (mΩ ) 60 40 1.4 0.8 20 0 0.2 2 4 6 8 10 12 -50 0 100 150 T j , Junction Temperature ( C) Fig 3. On-Resistance v.s. Gate Voltage 10/31/2007 Rev.1.00 50 o V GS (V) Fig 4. Normalized On-Resistance v.s. Junction Temperature www.SiliconStandard.com 3 SSM9985GM 12 3 ID , Drain Current (A) 10 8 PD (W) 2 6 4 1 2 0 0 25 50 75 100 125 150 0 50 T c , Case Temperature ( o C) 100 150 o T c , Case Temperature ( C) Fig 5. Maximum Drain Current v.s. Fig 6. Typical Power Dissipation Case Temperature 1 100 10 ID (A) 1ms 10ms 1 100ms 1s 0.1 10s T C =25 o C Single Pulse Normalized Thermal Response (R thja) Duty Factor = 0.5 100us 0.2 0.1 0.1 0.05 0.02 0.01 PDM t 0.01 T Single Pulse Duty Factor = t/T Peak Tj = P DM x Rthja + Ta Rthja=125 oC/W DC 0.01 0.001 0.1 1 10 100 0.0001 0.001 0.01 0.1 1 10 100 1000 V DS (V) t , Pulse Width (s) Fig 7. Maximum Safe Operating Area Fig 8. Effective Transient Thermal Impedance 10/31/2007 Rev.1.00 www.SiliconStandard.com 4 SSM9985GM f=1.0MHz 12 10000 VGS , Gate to Source Voltage (V) I D =10A Ciss 9 V DS =12V V DS =16V VDS =20V C (pF) 1000 6 Coss Crss 100 3 0 10 0 5 10 15 20 25 1 7 13 19 25 31 V DS (V) Q G , Total Gate Charge (nC) Fig 9. Gate Charge Characteristics Fig 10. Typical Capacitance Characteristics 3.5 100 3 10 2.5 o o Tj=25 C VGS(th) (V) IS(A) Tj=150 C 1 2 1.5 0.1 1 0.5 0.01 0 0.4 0.8 1.2 -50 Fig 11. Forward Characteristic of Reverse Diode 10/31/2007 Rev.1.00 0 50 100 150 T j , Junction Temperature ( o C ) V SD (V) Fig 12. Gate Threshold Voltage v.s. Junction Temperature www.SiliconStandard.com 5 SSM9985GM VDS 90% RD VDS D 0.5 x RATED V DS G RG TO THE OSCILLOSCOPE + 10% VGS S 10 v VGS - td(on) Fig 13. Switching Time Circuit td(off) tf tr Fig 14. Switching Time Waveform VG VDS 4.5V 0.5 x RATED V DS G S QG TO THE OSCILLOSCOPE D QGS QGD VGS + 1~ 3 mA IG I D Charge Fig 15. Gate Charge Circuit Q Fig 16. Gate Charge Waveform Information furnished by Silicon Standard Corporation is believed to be accurate and reliable. However, Silicon Standard Corporation makes no guarantee or warranty, expressed or implied, as to the reliability, accuracy, timeliness or completeness of such information and assumes no responsibility for its use, or for infringement of any patent or other intellectual property rights of third parties that may result from its use. Silicon Standard reserves the right to make changes as it deems necessary to any products described herein for any reason, including without limitation enhancement in reliability, functionality or design. No license is granted, whether expressly or by implication, in relation to the use of any products described herein or to the use of any information provided herein, under any patent or other intellectual property rights of Silicon Standard Corporation or any third parties. 10/31/2007 Rev.1.00 www.SiliconStandard.com 6