PHILIPS TDA8769

INTEGRATED CIRCUITS
DATA SHEET
TDA8769
12-bit, 60/80/105 Msps
Analog-to-Digital Converter (ADC)
Nyquist/high IF sampling
Objective specification
Supersedes data of 2003 Apr 07
2003 Dec 09
Philips Semiconductors
Objective specification
12-bit, 60/80/105 Msps Analog-to-Digital Converter
(ADC) Nyquist/high IF sampling
CONTENTS
12
PACKAGE OUTLINE
13
SOLDERING
13.1
Introduction to soldering surface mount
packages
Reflow soldering
Wave soldering
Manual soldering
Suitability of surface mount IC packages for
wave and reflow soldering methods
1
FEATURES
2
APPLICATIONS
3
GENERAL DESCRIPTION
4
QUICK REFERENCE DATA
5
ORDERING INFORMATION
6
BLOCK DIAGRAM
7
PINNING
14
DATA SHEET STATUS
8
LIMITING VALUES
15
DEFINITIONS
9
THERMAL CHARACTERISTICS
16
DISCLAIMERS
10
CHARACTERISTICS
11
APPLICATION INFORMATION
11.1
11.2
11.3
11.4
11.5
11.5.1
11.5.1.1
11.5.1.2
11.5.2
11.5.2.1
11.5.2.2
11.5.2.3
11.5.2.4
11.5.2.5
11.5.2.6
Output coding and control signals
TDA8769 in 3G radio receivers
Application diagrams
Demonstration board
Definitions
Static parameters
Integral non-linearity (INL)
Differential non-linearity (DNL)
Dynamic parameters
Signal-to-noise and distortion (SINAD)
Effective number of bits (ENOB)
Total harmonic distortion (THD)
Signal-to-noise ratio (SNR)
Spurious free dynamic range (SFDR)
Intermodulation distortion (IMD2 and IMD3)
2003 Dec 09
13.2
13.3
13.4
13.5
2
TDA8769
Philips Semiconductors
Objective specification
12-bit, 60/80/105 Msps Analog-to-Digital Converter
(ADC) Nyquist/high IF sampling
1
TDA8769
• Advanced Frequency Modulation (FM) radio
FEATURES
• 12-bit resolution
• Imaging (camera scanner and medical)
• Optimized for both Nyquist and high IF sampling
• Cable modem or set top box
• High-speed sampling rate up to 105 MHz
• Radar and satellite hub systems.
• Maximum analog input frequency of 330 MHz (see
Application section)
3
• Only 2 clock cycles latency
The TDA8769 is a BiCMOS 12-bit Analog-to-Digital
Converter (ADC) optimized for GSM/EDGE, W-CDMA and
CDMA2000 radio transceivers, high data rate radios and
other applications such as advanced FM radio and
professional imaging. Its main innovation is the RF
sampling, based on a high-speed clock of up to 105 Msps
combined with high input frequencies of up to 250 MHz.
It converts the analog input signal into 12-bit binary coded
digital words at a maximum sampling rate of 105 MHz.
• 5 V power supplies and 3.3 V output power supply
• Binary or two’s-complement CMOS outputs
• Programmable Complete Conversion Signal (CCS)
CMOS output
• In-range CMOS compatible output
• CMOS compatible static digital inputs
• LVTTL and LVCMOS compatible digital outputs
The TDA8769 analog performances have been proven in
various multi-carrier 3G radio receivers, providing the
best-in-class Adjacent Channel Selectivity (ACS) up to
80 dB.
• Differential clock input PECL; sine wave and TTL
compatible
• Integrated track-and-hold amplifier
• Differential analog input
Moreover the TDA8769 offers the lowest clock cycle
latency, which enables competitive and optimized
feedback loops in controlled systems.
• External amplitude range control
• Full-scale controllable from 1.5 to 1.9 V (p-p)
• Voltage controlled regulator included
All static digital inputs (TH, CEN, OTC, DEL0 and DEL1)
are CMOS compatible and all outputs are LVTTL and
LVCMOS compatible. A sine wave clock input signal can
also be used.
• Temperature range from −40 to +85 °C.
2
GENERAL DESCRIPTION
APPLICATIONS
• Cellular infrastructure (2.5G, 3G, etc.)
4
• Base stations and “Zero-IF” or direct IF sampling
subsystems
Tbf.
QUICK REFERENCE DATA
• Wireless and wired broadband communications
• Wireless Local Loop (WLL)
• Local Multipoint Distribution Service (LMDS)
5
ORDERING INFORMATION
PACKAGE
TYPE NUMBER
NAME
TDA8769HW/6
TDA8769HW/8
HTQFP48
DESCRIPTION
plastic thermal enhanced thin quad flat package;
48 leads; body 7 × 7 × 1.0 mm; heatsink
TDA8769HW/10
2003 Dec 09
VERSION
SOT545-2
SAMPLING
FREQUENCY
(MHz)
60
80
105
3
Philips Semiconductors
Objective specification
12-bit, 60/80/105 Msps Analog-to-Digital Converter
(ADC) Nyquist/high IF sampling
6
TDA8769
BLOCK DIAGRAM
16
FSREF
VCCA1
DEL0 DEL1 CLK CLKN
handbook, full pagewidth
13
15
39
38
VCCA3
2
VCCA4
3
VCCD1 VCCD2
44
40
17
VREF
REFERENCE
TDA8769
VREF
36
CLOCK
DRIVER
11
19
AMP
INN
IN
TH
CMADC
n.c.
TRACK
LATCH
47
46
42
&
23 to 34
12
35
ADC
LATCH
HOLD
1
22
CMADC
REFERENCE
5
48
20
CEN
4
43
41
18
AGND1 AGND3 AGND4 DGND1 DGND2
PINNING
PIN
TYPE(1)
CMADC
1
O
regulator output common mode ADC output
VCCA1
2
P
analog supply voltage 1 (5.0 V)
VCCA3
3
P
analog supply voltage 3 (5.0 V)
AGND3
4
G
analog ground 3
DEC
5
I/O
n.c.
6
−
not connected
n.c.
7
−
not connected
n.c.
8
−
not connected
n.c.
9
−
not connected
n.c.
10
−
not connected
VREF
11
I
reference voltage input
n.c.
12
−
not connected
FSREF
13
O
reference output
n.c.
14
−
not connected
DEL1
15
I
complete conversion sampling delay input 1
DEL0
16
I
complete conversion sampling delay input 0
VCCD2
17
P
digital supply voltage 2 (5.0 V)
2003 Dec 09
VCCO
IR
6 to 10, 12,
14, 21, 45
Fig.1 Block diagram.
SYMBOL
OTC
D0 to D11
POWER
MANAGEMENT
DEC
7
CCS
DESCRIPTION
decoupling node
4
37
OGND
MBL884
Philips Semiconductors
Objective specification
12-bit, 60/80/105 Msps Analog-to-Digital Converter
(ADC) Nyquist/high IF sampling
PIN
TYPE(1)
DGND2
18
G
digital ground 2
OTC
19
I
control input two’s complement output (active HIGH)
CEN
20
I
chip enable input (CMOS level; active LOW)
n.c.
21
−
not connected
IR
22
O
in-range output
D11
23
O
data output bit 11 (MSB)
D10
24
O
data output bit 10
D9
25
O
data output bit 9
D8
26
O
data output bit 8
D7
27
O
data output bit 7
D6
28
O
data output bit 6
D5
29
O
data output bit 5
D4
30
O
data output bit 4
D3
31
O
data output bit 3
D2
32
O
data output bit 2
D1
33
O
data output bit 1
D0
34
O
data output bit 0 (LSB)
SYMBOL
DESCRIPTION
VCCO
35
P
supply voltage of data output (3.3 V)
CCS
36
O
complete conversion signal output
OGND
37
G
ground of data output
CLKN
38
I
complementary clock input
CLK
39
I
clock input
VCCD1
40
P
digital supply voltage 1 (5.0 V)
DGND1
41
G
digital ground 1
TH
42
I
track-and-hold enable input (CMOS level; active HIGH)
AGND4
43
G
analog ground 4
VCCA4
44
P
analog supply voltage 4 (5.0 V)
n.c.
45
−
not connected
IN
46
I
analog input voltage
INN
47
I
complementary analog input voltage
AGND1
48
G
analog ground 1
AGND5
exposed
die pad
G
analog ground 5
Note
1. P = power supply, G = ground, I = input and O = output.
2003 Dec 09
5
TDA8769
Philips Semiconductors
Objective specification
TDA8769
37 OGND
38 CLKN
39 CLK
40 VCCD1
41 DGND1
42 TH
43 AGND4
44 VCCA4
45 n.c.
46 IN
handbook, full pagewidth
47 INN
48 AGND1
12-bit, 60/80/105 Msps Analog-to-Digital Converter
(ADC) Nyquist/high IF sampling
CMADC
1
36 CCS
VCCA1
2
35 VCCO
VCCA3
3
34 D0
AGND3
4
33 D1
DEC
5
32 D2
n.c.
6
31 D3
TDA8769HW
n.c.
7
30 D4
n.c.
8
29 D5
n.c.
9
28 D6
n.c. 10
27 D7
exposed die pad
D10 24
D11 23
IR 22
n.c. 21
CEN 20
OTC 19
DGND2 18
VCCD2 17
DEL0 16
25 D9
DEL1 15
n.c. 12
n.c. 14
26 D8
FSREF 13
VREF 11
MBL885
Fig.2 Pin configuration.
8
LIMITING VALUES
Tbf.
9
THERMAL CHARACTERISTICS
SYMBOL
PARAMETER
CONDITIONS
VALUE
UNIT
Rth(j-a)
thermal resistance from junction to ambient
in free air; (tbf)
25
K/W
Rth(c-a)
thermal resistance from case to ambient
in free air; (tbf)
(tbf)
K/W
2003 Dec 09
6
Philips Semiconductors
Objective specification
12-bit, 60/80/105 Msps Analog-to-Digital Converter
(ADC) Nyquist/high IF sampling
TDA8769
10 CHARACTERISTICS
VCCA = 4.75 to 5.25 V; VCCD = 4.75 to 5.25 V; VCCO = 2.7 to 3.6 V; AGND connected to DGND; Tamb = −40 to +85 °C;
VIN(p−p) − VINN(p−p) = 1.9 V − 0.5 dBFS; VVREF = VCCA3 − 1.75 V; Vi(CM ) = VCCA3 − 1.6 V; typical values measured at
VCCA = VCCD = 5 V, VCCO = 3.0 V, Tamb = 25 °C and CL = 10 pF; unless otherwise specified.
SYMBOL
PARAMETER
CONDITIONS
TEST(1)
MIN.
TYP.
MAX.
UNIT
Supplies
VCCA
analog supply
voltage
4.75
5.0
5.25
V
VCCD
digital supply
voltage
4.75
5.0
5.25
V
VCCO
output supply
voltage
2.7
3.0
3.6
V
ICCA
analog supply
current
−
109
(tbf)
mA
ICCD
digital supply
current
−
48
(tbf)
mA
ICCO
output supply
current
fCLK = 80 Msps;
fi = 21.4 MHz
−
17.5
(tbf)
mA
Ptot
total power
dissipation
fCLK = 60 Msps;
fi = 21.4 MHz
−
825
(tbf)
mW
fCLK = 80 Msps;
fi = 21.4 MHz
−
840
(tbf)
mW
fCLK = 105 Msps;
fi = 21.4 MHz
−
855
(tbf)
mW
PECL mode
3.19
−
3.52
V
TTL mode
DGND
−
0.8
V
PECL mode
3.83
−
4.12
V
TTL mode
Clock inputs: pins CLK and CLKN; note 2
INPUTS
VIL
VIH
IIL
IIH
LOW-level input
voltage
referenced to DGND;
VCCD = 5 V
HIGH-level input referenced to DGND;
voltage
VCCD = 5 V
LOW-level input
current
2.0
−
VCCD
V
VCLK or VCLKN = 3.52 V
(tbf)
−
−
µA
VCLK or VCLKN = 0.80 V
(tbf)
−
−
mA
−
−
(tbf)
µA
−
−
(tbf)
mA
∆VCLK = VCLK − VCLKN;
AC mode; DC voltage
level = 2.5 V
(tbf)
1.5
(tbf)
V
HIGH-level input VCLK or VCLKN = 3.83 V
current
VCLK or VCLKN = 2.00 V
∆VCLK
differential AC
input voltage for
switching
Ri
input resistance
fCLK = 105 Msps
−
(tbf)
−
MΩ
Ci
input
capacitance
fCLK = 105 Msps
−
(tbf)
−
pF
2003 Dec 09
7
Philips Semiconductors
Objective specification
12-bit, 60/80/105 Msps Analog-to-Digital Converter
(ADC) Nyquist/high IF sampling
SYMBOL
PARAMETER
CONDITIONS
TEST(1)
TDA8769
MIN.
TYP.
MAX.
UNIT
TIMING
−
−
9
Msps
maximum clock
frequency
TDA8769HW/6
60
−
−
MHz/
Msps
maximum clock
frequency
TDA8769HW/8
80
−
−
MHz/
Msps
maximum clock
frequency
TDA8769HW/10
105
−
−
MHz/
Msps
fclk(min)
minimum clock
frequency
fclk(max)
VTH = VCCD
tCLKH
clock HIGH
pulse width
fi = 21.4 MHz
(tbf)
−
−
ns
tCLKL
clock LOW pulse fi = 21.4 MHz
width
(tbf)
−
−
ns
Analog inputs: pins IN and INN
IIL
LOW-level input
current
VVREF = VCCA3 − 1.75 V;
VTH = HIGH
−
10
−
µA
IIH
HIGH-level input VVREF = VCCA3 − 1.75 V;
current
VTH = HIGH
−
10
−
µA
Ri
input resistance
D
−
8.4
−
MΩ
Ci
input
capacitance
D
−
250
500
fF
Vi(CM)
common mode
input voltage
D
VCCA3 − 1.2 VCCA3 − 1.6
VCCA3 − 1.7
V
VIN = VINN;
output code = 2047
Digital inputs: pins OTC, SH, DEL1, DEL0 and CEN
VIL
LOW-level input
voltage
DGND
−
0.3VCCD
V
VIH
HIGH-level input
voltage
0.7VCCD
−
VCCD
V
IIL
LOW-level input
current
(tbf)
−
IIH
HIGH-level input VIH = 0.7VCCD
current
−
−
(tbf)
µA
VIL = 0.3VCCD
µA
Voltage controlled regulator output: pin CMADC
Vo(CM)
common mode
output voltage
−
VCCA3 − 1.6
−
V
IL(CM)
load current
−
1
2
mA
2003 Dec 09
8
Philips Semiconductors
Objective specification
12-bit, 60/80/105 Msps Analog-to-Digital Converter
(ADC) Nyquist/high IF sampling
SYMBOL
PARAMETER
CONDITIONS
TEST(1)
TDA8769
MIN.
TYP.
MAX.
UNIT
Reference voltage input: pin VREF; note 3
Vref(FS)
full-scale fixed
voltage
fi = 25 MHz;
fCLK = 105 Msps
−
VCCA3 − 1.75 −
V
Vi(p-p)
input voltage
(peak-to-peak
value)
Vi = VIN − VINN;
VVREF = VCCA3 − 1.75 V;
Vi(CM) = VCCA3 − 1.6 V
−
1.9
−
V
Iref
input current
−
0.3
10
µA
Full-scale voltage controlled regulator output: pin FSREF
Vo(FS)
1.9 V full-scale
output voltage
−
VCCA3 − 1.75 −
V
IL(FS)
load current
−
1
2
mA
Digital outputs: pins D11 to D0 and IR
OUTPUT LEVELS
VOL
LOW-level
output voltage
IOL = 2 mA
DGND
−
DGND + 0.5 V
VOH
HIGH-level
output voltage
IOH = −0.4 mA
VCCO − 0.5
−
VCCO
V
IOZ
output current in
3-state
output level between
0.5 V and VCCO
−20
−
+20
µA
TIMING; see Fig. 3
td(s)
sampling delay
CL = 10 pF; note 4
−
(tbf)
(tbf)
ns
th(o)
output hold time
CL = 10 pF
(tbf)
3.7
−
ns
td(o)
output delay
CL = 10 pF
−
4.6
(tbf)
ns
3-STATE OUTPUT DELAY
tdZH
enable to HIGH
state
−
2.8
−
ns
tdZL
enable to LOW
state
−
7.5
−
ns
tdHZ
disable from
HIGH state
−
7.2
−
ns
tdLZ
disable from
LOW state
−
2.9
−
ns
DEL0 = LOW;
DEL1 = HIGH
−
0
−
ns
DEL0 = HIGH;
DEL1 = LOW
−
1.2
−
ns
DEL0 = HIGH;
DEL1 = HIGH
−
2.2
−
ns
Timing complete conversion signal: pin CCS
td(CCS)
complete
conversion
signal delay
2003 Dec 09
CL = 10 pF; see Table 4
and Fig 4
9
Philips Semiconductors
Objective specification
12-bit, 60/80/105 Msps Analog-to-Digital Converter
(ADC) Nyquist/high IF sampling
SYMBOL
PARAMETER
CONDITIONS
TEST(1)
TDA8769
MIN.
TYP.
MAX.
UNIT
Analog signal processing (50% clock duty factor)
INL
integral
non-linearity
fCLK = 20 Msps;
fi = 400 kHz
−
±1.7
(tbf)
LSB
DNL
differential
non-linearity
fCLK = 20 Msps;
fi = 400 kHz; no missing
code guaranteed
−
±0.4
(tbf)
LSB
Eoffset
offset error
VCCA = VCCD = 5 V;
VCCO = 3.0 V;
Tamb = 25 °C;
output code = 2047
−
−5
−
mV
EG
gain error
VCCA = VCCD = 5 V;
amplitude
VCCO = 3.0 V;
Tamb = 25 °C
(spread from
device to device)
(tbf)
−
(tbf)
%FS
B
analog
bandwidth
fCLK = 105 Msps; −3 dB;
full-scale input; note 5
−
330
−
MHz
THD
total harmonic
distortion
TDA8769HW/6
B = Nyquist; note 6
−
−74
−
dBc
total harmonic
distortion
TDA8769HW8
B = Nyquist; note 6
fi = 21.4 MHz
−
−74
−
dBc
fi = 50 MHz
−
−68
−
dBc
total harmonic
distortion
TDA8769HW/10
B = Nyquist; note 6
fi = 21.4 MHz
−
−67
−
dBc
fi = 78 MHz
−
−63
−
dBc
Nth(rms)
thermal noise
(RMS value)
shorted input;
VTH = VCCD;
fclk = 105 Msps
−
(tbf)
−
LSB
SNR
signal-to-noise
ratio
TDA8769HW/6
fi = 21.4 MHz; note 7
−
66
−
dBc
signal-to-noise
ratio
TDA8769HW/8
fi = 21.4 MHz; note 7
−
66
−
dBc
B = Nyquist
−
66
−
dBc
B = 5 MHz
−
72.4
−
dBc
−
64
−
dBc
B = Nyquist
−
62
−
dBc
B = 5 MHz
−
72
−
dBc
signal-to-noise
ratio
TDA8769HW/10
2003 Dec 09
D
fi = 21.4 MHz
B = Nyquist
B = Nyquist
fi = 50 MHz; note 7
fi = 21.4 MHz; note 7
B = Nyquist
fi = 78 MHz; note 7
10
Philips Semiconductors
Objective specification
12-bit, 60/80/105 Msps Analog-to-Digital Converter
(ADC) Nyquist/high IF sampling
SYMBOL
SFDR
PARAMETER
spurious free
dynamic range
TDA8769HW/6
fi = 21.4 MHz
spurious free
dynamic range
TDA8769HW/8
fi = 21.4 MHz
TEST(1)
TYP.
MAX.
UNIT
77
−
dBc
−
77
−
dBc
B = Nyquist
−
70
−
dBc
B = 5 MHz
−
80.8
−
dBc
−
68
−
dBc
B = Nyquist
−
67
−
dBc
B = 5 MHz
−
84
−
dBc
effective number fi = 21.4 MHz; note 8
of bits
B = Nyquist
TDA8769HW/6
−
10.6
−
bit
effective number fi = 21.4 MHz; note 8
of bits
B = Nyquist
TDA8769HW/8
fi = 50 MHz; note 8
−
10.6
−
bit
B = Nyquist
−
10.3
−
bit
B = 5 MHz
−
11.7
−
bit
−
10
−
bit
B = Nyquist
−
9.6
−
bit
B = 5 MHz
−
11.8
−
bit
−
(tbf)
−
dBFS
−
82
−
dBFS
−
(tbf)
−
B = Nyquist
B = Nyquist
fi = 50 MHz
fi = 21.4 MHz
B = Nyquist
fi = 78 MHz
effective number fi = 21.4 MHz; note 8
of bits
B = Nyquist
TDA8769HW/10
fi = 78 MHz; note 8
IM2
second order
intermodulation
distortion
fi1 = 15 MHz and
fi2 = 18 MHz; note 10
IM3
third order
intermodulation
distortion
fi1 = 15 MHz and
fi2 = 18 MHz; note 10
bit error rate
fi = 25 MHz;
VIN = 16LSB at code
2047; fclk = 105 Msps
BER
MIN.
−
spurious free
dynamic range
TDA8769HW/10
ENOB
CONDITIONS
TDA8769
fclk= 80 Msps
fclk= 80 Msps
Notes
1. Explanation tests:
a) D = guaranteed by design
b) C = guaranteed by characterization
c) I = industrially tested for 100%.
2003 Dec 09
11
Philips Semiconductors
Objective specification
12-bit, 60/80/105 Msps Analog-to-Digital Converter
(ADC) Nyquist/high IF sampling
TDA8769
2. The circuit has two clock inputs: CLK and CLKN. There are 5 modes of operation:
a) PECL mode 1: (DC level varies proportionally with VCCD) CLK and CLKN inputs are at differential PECL levels.
b) PECL mode 2: (DC level varies proportionally with VCCD) CLK input is at PECL level and sampling is taken on
the falling edge of the clock input signal. A DC level of 3.65 V has to be applied on CLKN decoupled to GND via
a 100 nF capacitor.
c) PECL mode 3: (DC level varies proportionally with VCCD) CLKN input is at PECL level and sampling is taken on
the rising edge of the clock input signal. A DC level of 3.65 V has to be applied on CLK decoupled to GND via a
100 nF capacitor.
d) Differential AC driving mode 4: When driving the CLK input directly and with any AC signal of minimum 1 V (p-p)
and with a DC level of 2.5 V, the sampling takes place at the falling edge of the clock signal. When driving the
CLKN input with the same signal, sampling takes place at the rising edge of the clock signal. It is recommended
to decouple the CLKN or CLK input to DGND via a 100 nF capacitor.
e) TTL mode 5: CLK input is at TTL level and sampling is taken on the falling edge of the clock input signal. In that
case CLKN pin has to be connected to the ground.
3. The ADC input range can be adjusted with an external reference connected to pin VREF. This voltage has to be
referenced to VCCA.
4. Output data acquisition: the output data is available after the maximum delay of td(s).
5. The −3 dB analog bandwidth is determined by the 3 dB reduction in the reconstructed output, the input being a
full-scale sine wave.
6. The total harmonic distortion is obtained with the addition of the first five harmonics.
7. The signal-to-noise ratio takes into account all harmonics above five and noise up to Nyquist frequency.
8. The effective number of bits, or ENOB, are obtained via a Fast Fourier Transform (FFT). The calculation takes into
account all harmonics and noise up to half of the clock frequency (Nyquist frequency). Conversion to signal-to-noise
and distortion, or SINAD, is given by SINAD = ENOB × 6.02 + 1.76 dB.
9. Intermodulation measured relative to either tone with analog input frequencies of (tbf) and (tbf) MHz. The two input
signals have the same amplitude and the total amplitude of both signals provides full-scale input to the converter
(−6 dB below full-scale for each input signal).
10. IM2 is the ratio of the RMS value of either input tone to the RMS value of the worst case second order intermodulation
product. IM3 is the ratio of the RMS value of either input tone to the RMS value of the worst case third order
intermodulation product.
2003 Dec 09
12
Philips Semiconductors
Objective specification
12-bit, 60/80/105 Msps Analog-to-Digital Converter
(ADC) Nyquist/high IF sampling
handbook, full pagewidth
CKP
TDA8769
n
50%
td(o)
data
n−1
D0 to D11
data
n
VCCO − 0.5 V
data
n+1
0.5 V
th(o)
tds(i)
VI
sample
n
sample
n+1
sample
n+2
sample
n+3
sample
n+4
MDB034
Fig.3 Output timing diagram.
handbook, full pagewidth
D0 to D11
td(CCS)
CCS
MBL874
Fig.4 Complete conversion signal timing diagram.
2003 Dec 09
13
Philips Semiconductors
Objective specification
12-bit, 60/80/105 Msps Analog-to-Digital Converter
(ADC) Nyquist/high IF sampling
TDA8769
11 APPLICATION INFORMATION
11.1
Output coding and control signals
Table 1
Output coding with differential inputs (typical values to AGND); VIN(p−p) − VINN(p−p) = 1.9 V − 0.5 dBFS;
VVREF = VCCA3 − 1.75 V
CODE
VIN(p-p)
VINN(p-p)
IR
BINARY OUTPUTS
(D11 TO D0)
TWO’S COMPLEMENT
OUTPUTS (D11 TO D0)
Underflow
<2.925
>3.875
0
000000000000
100000000000
0
2.925
3.875
1
000000000000
100000000000
1
−
−
000000000001
100000000001
:
2047
:
:
:
:
:
3.4
3.4
011111111111
111111111111
:
:
:
:
4094
−
−
111111111110
011111111110
4095
3.875
2.925
111111111111
011111111111
Overflow
>3.875
<2.925
111111111111
011111111111
Table 2
0
Mode selection
CONTROL INPUT TWO’S
COMPLEMENT OUTPUT
(OTC)
CHIP ENABLE NOT
(CEN)
0
0
binary; active
1
0
two’s complement; active
don’t care
1
high impedance
Table 3
OUTPUT DATA (D0 TO D11 AND IR)
Track-and-hold selection
CONTROL INPUT TRACK-AND-HOLD (TH)
Table 4
11.2
MODE
1
active
0
inactive; tracking
Complete conversion signal selection
DEL1
DEL0
OUTPUT SIGNAL
0
0
inactive
0
1
active (for timing values, see Chapter 10)
1
0
1
1
TDA8769 in 3G radio receivers
TDA8769 has been proven in many 3G receivers with various operating conditions regarding input frequency, signal
input frequency bandwidth and sampling frequency. TDA8769 provides a maximum analog input frequency of 250 MHz.
It allows a significant cost reduction of the RF front-end, from two mixers to only one, even in multicarrier architecture.
Table 5 shows possible applications with the TDA8769 in High IF sampling mode.
2003 Dec 09
14
Philips Semiconductors
Objective specification
12-bit, 60/80/105 Msps Analog-to-Digital Converter
(ADC) Nyquist/high IF sampling
Table 5
TDA8769
Examples of possible fi, fclk and fi bandwidth combinations supported
fi (MHz)
fclk (MHz)
fi BW (MHz)
SNR (dB)
SFDR (dBc)
250
9.60
0.20
66.5
79.9
243.95
9.60
0.20
62.6
68.5
243.95
19.20
0.20
68.4
77.2
243.95
52.00
0.20
65.7
80.0
190
40.00
1.25
72.0
80.0
106
76.80
5.00
70.8
83.6
86
76.80
5.00
72.2
87.1
80
61.44
10.00
(tbf)
(tbf)
70
40.00
5.00
70
70
69.99
58.98
1.25
(tbf)
(tbf)
27
51.2
3.5
(tbf)
(tbf)
10.8
32.5
0.30
84.3
83.0
For a dual carrier W_CDMA receiver, the most important parameters are the sensitivity and Adjacent Channel Selectivity
(ACS). In W-CDMA, it can be far below the noise floor, is defined by the Sensitivity to Noise Ratio (SENR). Its value is
negative due to the gain processing. The Adjacent Channel Power Ratio (ACPR) is the difference between the peak and
noise floor. It represents the ratio of the adjacent channel power and the average power of the channel. The ACS is
defined by the sum of SENR and ACPR. Figure 5 illustrates the relation between these parameters.
On a typical application with the TDA8769 device, the ACS obtained is 80 dB with an ACPR of 70 dB and a SENR of
10 dB. Moreover, the Noise Figure (NF) of the TDA8769 is 31.5 dB.
handbook, full pagewidth
interfering
channel
wanted
channel
ACS
ACPR
noise floor
SENR
NF
sensitivity
thermal noise
MBL875
Fig.5 Adjacent channel selectivity and analog-to-digital converter sensitivity.
2003 Dec 09
15
Philips Semiconductors
Objective specification
12-bit, 60/80/105 Msps Analog-to-Digital Converter
(ADC) Nyquist/high IF sampling
11.3
TDA8769
Application diagrams
TDA8769
TDA8769
CLK CLKN
270 Ω
270 Ω
CLK CLKN
Q
TTL
TTL
D
50 Ω
MDB036
Q
MDB035
Fig.6 TTL to PECL translator application.
2003 Dec 09
Fig.7 TTL single-ended clock application.
16
Philips Semiconductors
Objective specification
12-bit, 60/80/105 Msps Analog-to-Digital Converter
(ADC) Nyquist/high IF sampling
tbf
Fig.8 Application diagram.
2003 Dec 09
17
TDA8769
Philips Semiconductors
Objective specification
12-bit, 60/80/105 Msps Analog-to-Digital Converter
(ADC) Nyquist/high IF sampling
Demonstration board
TR1
T1_6T_KK81
IN
4
R1
100 Ω
DGND
5
6
VCCA
DGND
ON
R3
100 Ω
TH
S1
1K2
1
VCCA
AGND
AGND
AGND
R2
50 Ω
VCCD1
AGND
R125680
J2
DGND
CLK
48
S2
EXT
P1
5 kΩ
CMADC
1K2
VCCA1
AGND
VCCA3
AGND VCCA
AGND3
AGND
DEC
n.c.
n.c.
C4
100
nF
n.c.
n.c.
n.c.
AGND
VREF
TB2
VCCA
47
46
44
43
42
41
40
CLKN
OGND
CLK
VCCD1
DGND1
TH
VCCA4
45
39
DGND
37
38
DGND
36
1
2
35
3
34
33
4
IC1
5
6
32
31
TDA8769HW
7
30
8
29
9
28
27
10
26
11
25
12
CCS
VCCO
VCCO
D0
PCN12A_44P_2.54DS
J1
D1
D2
B1
D3
B2
D4
B3
D5
B4
D6
CSS
D7
D0
D8
EXT
P2
1 kΩ
1K2
DGND
R4
2.4 kΩ
VCCD2
ON
S4
AGND
19
20
21
22
23
D11
18
B9
B10
B11
AGND
B12
DGND
B13
DGND
B14
VCCD2
VCCD2
ON
S8
DEL1
B6
B8
24
D10
17
IR
16
n.c.
S3
15
CEN
FSREF
100 nF
R5
1.2 kΩ
14
OTC
13
DGND2
VCCA
B5
B7
D9
C5
VCCD2
VCCA
n.c.
AGND
n.c.
VCCA
IN
C14
330
nF
AGND4
CMADC
DEL0
AGND
VCCD1
DEL1
220 nF
50 Ω
3 TB1
2
AGND1
R125680
J1
C1
INN
handbook, full pagewidth
n.c.
11.4
TDA8769
B15
A1
A2
A3
A4
A5
A6
A7
A8
A9
A10
A11
A12
A13
A14
A15
A16
A17
A18
A19
B16
B17
DEL0
B18
DGND
DGND
B19
VCCD2
S6
1K2
ON
VCCD2
S7
1K2
OFF
OTC
IC4 2
CEN
DGND
DGND C12
10
nF
C3
100
nF
C2
330
nF
5
3
VCC
GND
AGND
DGND
DGND
2
VCCO
DGND
VCCD1 (40)
FL3
470D_0D0_S
C17
10
nF
C15
100
nF
C13
330
nF
A20
A21
A22
IR
D3
LS6T670
3
AGND
B22
1
C19
10
nF
AGND
B21
R10
150 Ω
4
C18
10
nF
B20
TRIG
R9
50 Ω
4 74AHC1GUO4GW
DGND
R11
150 Ω
VCCA (44)
(2/3)
FL1
470D_0D0_S
R125680
J3
VCCO
DGND
DGND
DGND
VCCD2 (17)
FL2
470D_0D0_S
C20
10
nF
C6
100
nF
C11
330
nF
TM2
DGND TM3
FL4
HF70A08S AGND
DGND
DGND
D1
BYD17G
12 V
J5
MSTBA2.5_20_5D8
GND
J5
IN
1
20 V
2
C7
22
µF
MC7805D2T
1
IC2
2
3
VCCO (35)
TM1
OUT
16 V
GND
C8
4.7
µF
R6
750 Ω
IN
C9
470
nF
LM317D2T
3
IC3
1
2
TP1
OUT
R8
240
Ω
R7
330
DGND
Ω
ADJ
C10
1µF
C16
10
nF
DGND
DGND
DGND
DGND
D2
PWR
LGT679_C0
DGND
DGND
DGND
Fig.9 Demonstration board schematic.
2003 Dec 09
18
MBL876
Philips Semiconductors
Objective specification
TDA8769
C1
J2
J1
12-bit, 60/80/105 Msps Analog-to-Digital Converter
(ADC) Nyquist/high IF sampling
TM2
R1
P2
S3
IC4
C12
J3
TM3
R9
C11
D3
R10
C10
TP1
R11
C8
D2
R5
IC3
C16
J4
S4
S5
C20
C5
FL2
R7
R8
C9
C7
1
FL4
S6
S7
C2
C3
IC1
R6
D1
TB2
C5
R4
C17 C18
C19
J5
1
2
FL1
C4
TM1
C15
R2
P1
R3
C14
S1
S2
TR1
IC2
FL3
1TB1
C13
MBL878
MBL877
Fig.10 Component placement, top view.
2003 Dec 09
Fig.11 Component placement, bottom view.
19
Philips Semiconductors
Objective specification
12-bit, 60/80/105 Msps Analog-to-Digital Converter
(ADC) Nyquist/high IF sampling
MBL879
MBL880
Fig.12 Printed-circuit board tracks, layout 1.
Fig.13 Printed-circuit board tracks, layout 2.
MBL881
Fig.14 Printed-circuit board tracks, layout 3.
2003 Dec 09
TDA8769
20
Philips Semiconductors
Objective specification
12-bit, 60/80/105 Msps Analog-to-Digital Converter
(ADC) Nyquist/high IF sampling
11.5
where:
Definitions
11.5.1
11.5.1.1
TDA8769
i = 0 to 2n − 2
STATIC PARAMETERS
Integral non-linearity (INL)
Vin = input voltage for code i
INL is defined as the deviation of the transfer function from
a best fit straight line (linear regression computation). The
INL of code i is obtained from the following equation:
S = slope of the ideal straight line.
V in ( i ) – V in ( ideal )
INL ( i ) = ---------------------------------------------S
Figure 15 shows the spectrum of a single tone full-scale
input sine wave with frequency ft, conforming to coherent
sampling and digitized by the ADC under test. Coherent
f
M
sampling means that ----t = ----- , where M is the number of
fs
N
11.5.2
where:
i = code value
cycles, N the number of samples and both M and N being
a relative prime.
Vin = input voltage for code i
S = slope of the ideal straight line (code width).
11.5.1.2
DYNAMIC PARAMETERS
Remark: The parameter Pnoise used in the following
equations includes the power of the random noise,
non-linearities, sampling time errors and quantization
noise.
Differential non-linearity (DNL)
DNL is the deviation in code width from the value of one
LSB. The DNL of code i is obtained from the following
equation:
V in ( i + 1 ) – V in ( i )
DNL ( i ) = -------------------------------------------S
MBL882
handbook, full pagewidth
0
−20
magnitude
IMD3
−40
−60
−80
−100
−120
−140
−160
0
2.5
5
7.5
10
12.5
15
17.5
20
22.5
25
measured output range (MHz)
Fig.15 Spectrum of a full-scale input sine wave with frequency ft.
2003 Dec 09
21
27
Philips Semiconductors
Objective specification
12-bit, 60/80/105 Msps Analog-to-Digital Converter
(ADC) Nyquist/high IF sampling
11.5.2.1
Signal-to-noise and distortion (SINAD)
11.5.2.4
SINAD is the ratio of the signal power to the noise plus
distortion power, excluding the DC component, at a given
sample rate and input frequency:
Signal-to-noise ratio (SNR)
SNR is the ratio of the signal power to the noise power,
excluding the harmonics and DC component of the signal:
P signal
SNR = 10log 10  ---------------- dB
 P noise 
P signal
SINAD = 10log 10  -------------------------------------- dB.
 P noise + distortion
11.5.2.5
11.5.2.2
TDA8769
Effective number of bits (ENOB)
Spurious free dynamic range (SFDR)
ENOB is derived from SINAD and gives the theoretical
resolution an ideal ADC would require to obtain the same
SINAD measured on the actual ADC. A good
approximation is:
The SFDR specifies the available signal range as the
spectral distance between the amplitude of the
fundamental and the amplitude of the largest spurious
signal, harmonic and non-harmonic, excluding the
DC component.
SINAD – 1.76
ENOB = ------------------------------------6.02
a1
SFDR = 10log 10  -------------------- dB
 max ( s )
11.5.2.3
11.5.2.6
Total harmonic distortion (THD)
Intermodulation distortion (IMD2 and IMD3)
THD is the ratio of the power of the harmonics to the power
of the signal frequency. The equation for k − 1 harmonics
is:
Figure 16 shows the spectral analysis of a dual tone sine
wave input, at frequencies ft1 and ft2, meeting the
coherence criterion.
P harmonics
THD = 10log 10  ------------------------- dB
 P signal 
The 2nd and 3rd order intermodulation distortion products,
IMD2 and IMD3 respectively, are defined with a dual tone
input. IMD2 is defined as the ratio of the RMS value of
either tone to the RMS value of the second order
intermodulation product, IMD3 with the third order
intermodulation product. The IMD is given by:
where:
2
2
P harmonics = a 2 + a 3 + ... + a k
P signal = a 1
2
2
P intermod
IMD = 10log 10  --------------------- dB
 P signal 
As usual the value of k = 6 (i.e. the calculation of THD is
done with the first 5 harmonics).
2003 Dec 09
22
Philips Semiconductors
Objective specification
12-bit, 60/80/105 Msps Analog-to-Digital Converter
(ADC) Nyquist/high IF sampling
TDA8769
where:
P intermod = a
P signal = a
a
2
im ( ft )
2
2
ft1
im ( ft1 – ft2 )
+a
2
ft2
–a
2
im ( ft1 + ft2 )
+a
2
im ( ft1 – 2ft2 )
+a
2
im ( ft1 + 2ft2 )
+…+a
2
im ( 2ft1 – ft2 )
+a
2
im ( f2t1 + ft2 )
.
is the power of the intermodulation component at ft.
MBL883
handbook, full pagewidth
a1
magnitude
SFDR
a2
a3
ak
measured output range (MHz)
Fig.16 Spectral analysis with dual tone.
2003 Dec 09
23
Philips Semiconductors
Objective specification
12-bit, 60/80/105 Msps Analog-to-Digital Converter
(ADC) Nyquist/high IF sampling
TDA8769
12 PACKAGE OUTLINE
HTQFP48: plastic thermal enhanced thin quad flat package; 48 leads;
body 7 x 7 x 1 mm; exposed die pad
SOT545-2
c
y
exposed die pad side
X
Dh
36
25
37
A
24
ZE
e
E HE
Eh
(A 3)
A A2 A1
w M
θ
bp
Lp
L
pin 1 index
13
48
detail X
1
12
ZD
w M
bp
v M A
e
D
B
HD
v M B
0
2.5
5 mm
scale
DIMENSIONS (mm are the original dimensions)
A
UNIT max.
mm
1.2
A1
A2
A3
bp
c
D(1)
Dh
E(1)
Eh
e
HD
HE
L
Lp
v
w
y
0.15
0.05
1.05
0.95
0.25
0.27
0.17
0.20
0.09
7.1
6.9
4.6
4.4
7.1
6.9
4.6
4.4
0.5
9.1
8.9
9.1
8.9
1
0.75
0.45
0.2
0.08
0.08
ZD(1) ZE(1)
θ
0.89
0.61
7°
0°
0.89
0.61
Note
1. Plastic or metal protrusions of 0.25 mm maximum per side are not included.
OUTLINE
VERSION
REFERENCES
IEC
JEDEC
JEITA
ISSUE DATE
99-08-04
03-04-07
SOT545-2
2003 Dec 09
EUROPEAN
PROJECTION
24
Philips Semiconductors
Objective specification
12-bit, 60/80/105 Msps Analog-to-Digital Converter
(ADC) Nyquist/high IF sampling
To overcome these problems the double-wave soldering
method was specifically developed.
13 SOLDERING
13.1
Introduction to soldering surface mount
packages
If wave soldering is used the following conditions must be
observed for optimal results:
This text gives a very brief insight to a complex technology.
A more in-depth account of soldering ICs can be found in
our “Data Handbook IC26; Integrated Circuit Packages”
(document order number 9398 652 90011).
• Use a double-wave soldering method comprising a
turbulent wave with high upward pressure followed by a
smooth laminar wave.
• For packages with leads on two sides and a pitch (e):
There is no soldering method that is ideal for all surface
mount IC packages. Wave soldering can still be used for
certain surface mount ICs, but it is not suitable for fine pitch
SMDs. In these situations reflow soldering is
recommended.
13.2
TDA8769
– larger than or equal to 1.27 mm, the footprint
longitudinal axis is preferred to be parallel to the
transport direction of the printed-circuit board;
– smaller than 1.27 mm, the footprint longitudinal axis
must be parallel to the transport direction of the
printed-circuit board.
Reflow soldering
The footprint must incorporate solder thieves at the
downstream end.
Reflow soldering requires solder paste (a suspension of
fine solder particles, flux and binding agent) to be applied
to the printed-circuit board by screen printing, stencilling or
pressure-syringe dispensing before package placement.
Driven by legislation and environmental forces the
worldwide use of lead-free solder pastes is increasing.
• For packages with leads on four sides, the footprint must
be placed at a 45° angle to the transport direction of the
printed-circuit board. The footprint must incorporate
solder thieves downstream and at the side corners.
Several methods exist for reflowing; for example,
convection or convection/infrared heating in a conveyor
type oven. Throughput times (preheating, soldering and
cooling) vary between 100 and 200 seconds depending
on heating method.
During placement and before soldering, the package must
be fixed with a droplet of adhesive. The adhesive can be
applied by screen printing, pin transfer or syringe
dispensing. The package can be soldered after the
adhesive is cured.
Typical reflow peak temperatures range from
215 to 270 °C depending on solder paste material. The
top-surface temperature of the packages should
preferably be kept:
Typical dwell time of the leads in the wave ranges from
3 to 4 seconds at 250 °C or 265 °C, depending on solder
material applied, SnPb or Pb-free respectively.
• below 225 °C (SnPb process) or below 245 °C (Pb-free
process)
A mildly-activated flux will eliminate the need for removal
of corrosive residues in most applications.
– for all BGA, HTSSON-T and SSOP-T packages
13.4
– for packages with a thickness ≥ 2.5 mm
Fix the component by first soldering two
diagonally-opposite end leads. Use a low voltage (24 V or
less) soldering iron applied to the flat part of the lead.
Contact time must be limited to 10 seconds at up to
300 °C.
– for packages with a thickness < 2.5 mm and a
volume ≥ 350 mm3 so called thick/large packages.
• below 240 °C (SnPb process) or below 260 °C (Pb-free
process) for packages with a thickness < 2.5 mm and a
volume < 350 mm3 so called small/thin packages.
When using a dedicated tool, all other leads can be
soldered in one operation within 2 to 5 seconds between
270 and 320 °C.
Moisture sensitivity precautions, as indicated on packing,
must be respected at all times.
13.3
Wave soldering
Conventional single wave soldering is not recommended
for surface mount devices (SMDs) or printed-circuit boards
with a high component density, as solder bridging and
non-wetting can present major problems.
2003 Dec 09
Manual soldering
25
Philips Semiconductors
Objective specification
12-bit, 60/80/105 Msps Analog-to-Digital Converter
(ADC) Nyquist/high IF sampling
13.5
TDA8769
Suitability of surface mount IC packages for wave and reflow soldering methods
SOLDERING METHOD
PACKAGE(1)
WAVE
REFLOW(2)
BGA, HTSSON..T(3), LBGA, LFBGA, SQFP, SSOP..T(3), TFBGA,
USON, VFBGA
not suitable
suitable
DHVQFN, HBCC, HBGA, HLQFP, HSO, HSOP, HSQFP, HSSON,
HTQFP, HTSSOP, HVQFN, HVSON, SMS
not suitable(4)
suitable
PLCC(5), SO, SOJ
suitable
suitable
not
recommended(5)(6)
suitable
SSOP, TSSOP, VSO, VSSOP
not
recommended(7)
suitable
CWQCCN..L(8), PMFP(9), WQCCN..L(8)
not suitable
LQFP, QFP, TQFP
not suitable
Notes
1. For more detailed information on the BGA packages refer to the “(LF)BGA Application Note” (AN01026); order a copy
from your Philips Semiconductors sales office.
2. All surface mount (SMD) packages are moisture sensitive. Depending upon the moisture content, the maximum
temperature (with respect to time) and body size of the package, there is a risk that internal or external package
cracks may occur due to vaporization of the moisture in them (the so called popcorn effect). For details, refer to the
Drypack information in the “Data Handbook IC26; Integrated Circuit Packages; Section: Packing Methods”.
3. These transparent plastic packages are extremely sensitive to reflow soldering conditions and must on no account
be processed through more than one soldering cycle or subjected to infrared reflow soldering with peak temperature
exceeding 217 °C ± 10 °C measured in the atmosphere of the reflow oven. The package body peak temperature
must be kept as low as possible.
4. These packages are not suitable for wave soldering. On versions with the heatsink on the bottom side, the solder
cannot penetrate between the printed-circuit board and the heatsink. On versions with the heatsink on the top side,
the solder might be deposited on the heatsink surface.
5. If wave soldering is considered, then the package must be placed at a 45° angle to the solder wave direction.
The package footprint must incorporate solder thieves downstream and at the side corners.
6. Wave soldering is suitable for LQFP, TQFP and QFP packages with a pitch (e) larger than 0.8 mm; it is definitely not
suitable for packages with a pitch (e) equal to or smaller than 0.65 mm.
7. Wave soldering is suitable for SSOP, TSSOP, VSO and VSSOP packages with a pitch (e) equal to or larger than
0.65 mm; it is definitely not suitable for packages with a pitch (e) equal to or smaller than 0.5 mm.
8. Image sensor packages in principle should not be soldered. They are mounted in sockets or delivered pre-mounted
on flex foil. However, the image sensor package can be mounted by the client on a flex foil by using a hot bar
soldering process. The appropriate soldering profile can be provided on request.
9. Hot bar or manual soldering is suitable for PMFP packages.
2003 Dec 09
26
Philips Semiconductors
Objective specification
12-bit, 60/80/105 Msps Analog-to-Digital Converter
(ADC) Nyquist/high IF sampling
TDA8769
14 DATA SHEET STATUS
LEVEL
DATA SHEET
STATUS(1)
PRODUCT
STATUS(2)(3)
Development
DEFINITION
I
Objective data
II
Preliminary data Qualification
This data sheet contains data from the preliminary specification.
Supplementary data will be published at a later date. Philips
Semiconductors reserves the right to change the specification without
notice, in order to improve the design and supply the best possible
product.
III
Product data
This data sheet contains data from the product specification. Philips
Semiconductors reserves the right to make changes at any time in order
to improve the design, manufacturing and supply. Relevant changes will
be communicated via a Customer Product/Process Change Notification
(CPCN).
Production
This data sheet contains data from the objective specification for product
development. Philips Semiconductors reserves the right to change the
specification in any manner without notice.
Notes
1. Please consult the most recently issued data sheet before initiating or completing a design.
2. The product status of the device(s) described in this data sheet may have changed since this data sheet was
published. The latest information is available on the Internet at URL http://www.semiconductors.philips.com.
3. For data sheets describing multiple type numbers, the highest-level product status determines the data sheet status.
15 DEFINITIONS
16 DISCLAIMERS
Short-form specification  The data in a short-form
specification is extracted from a full data sheet with the
same type number and title. For detailed information see
the relevant data sheet or data handbook.
Life support applications  These products are not
designed for use in life support appliances, devices, or
systems where malfunction of these products can
reasonably be expected to result in personal injury. Philips
Semiconductors customers using or selling these products
for use in such applications do so at their own risk and
agree to fully indemnify Philips Semiconductors for any
damages resulting from such application.
Limiting values definition  Limiting values given are in
accordance with the Absolute Maximum Rating System
(IEC 60134). Stress above one or more of the limiting
values may cause permanent damage to the device.
These are stress ratings only and operation of the device
at these or at any other conditions above those given in the
Characteristics sections of the specification is not implied.
Exposure to limiting values for extended periods may
affect device reliability.
Right to make changes  Philips Semiconductors
reserves the right to make changes in the products including circuits, standard cells, and/or software described or contained herein in order to improve design
and/or performance. When the product is in full production
(status ‘Production’), relevant changes will be
communicated via a Customer Product/Process Change
Notification (CPCN). Philips Semiconductors assumes no
responsibility or liability for the use of any of these
products, conveys no licence or title under any patent,
copyright, or mask work right to these products, and
makes no representations or warranties that these
products are free from patent, copyright, or mask work
right infringement, unless otherwise specified.
Application information  Applications that are
described herein for any of these products are for
illustrative purposes only. Philips Semiconductors make
no representation or warranty that such applications will be
suitable for the specified use without further testing or
modification.
2003 Dec 09
27
Philips Semiconductors – a worldwide company
Contact information
For additional information please visit http://www.semiconductors.philips.com.
Fax: +31 40 27 24825
For sales offices addresses send e-mail to: [email protected].
SCA75
© Koninklijke Philips Electronics N.V. 2003
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner.
The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed
without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license
under patent- or other industrial or intellectual property rights.
Printed in The Netherlands
R78/02/pp28
Date of release: 2003
Dec 09
Document order number:
9397 750 11706