TPCS8214 TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (U-MOSⅣ) TPCS8214 Lithium Ion Battery Applications Unit: mm • Small footprint due to small and thin package • Low drain-source ON resistance: RDS (ON) = 10.5mΩ (typ.) • High forward transfer admittance: |Yfs| = 10S (typ.) • Low leakage current: IDSS = 10 μA (max) (VDS = 30 V) • Enhancement mode: Vth = 0.5~1.4 V (VDS = 10 V, ID = 200μA) • Common drain Absolute Maximum Ratings (Ta = 25°C) Characteristics Symbol Rating Unit Drain-source voltage VDSS 30 V Drain-gate voltage (RGS = 20 kΩ) VDGR 30 V Gate-source voltage V Drain current VGSS ±12 DC (Note 1) ID 6 Pulse (Note 1) IDP 24 PD (1) 1.1 Single-device Drain power operation (Note 3a) dissipation Single-device value (t = 10 s) (Note 2a) at dual operation (Note 3b) Single-device operation (Note 3a) Drain power dissipation Single-device value (t = 10 s) (Note 2b) at dual operation (Note 3b) A W PD (2) 0.75 PD (1) 0.6 JEDEC ⎯ JEITA ⎯ TOSHIBA 2-3R1E Weight: 0.035 g (typ.) W PD (2) 0.35 Single pulse avalanche energy (Note 4) EAS 9.4 mJ Avalanche current IAR 6 A Repetitive avalanche energy Single-device value at dual operation (Note 2a, 3b, 5) EAR 0.075 mJ Channel temperature Tch 150 °C Storage temperature range Tstg −55~150 °C Circuit Configuration 8 7 6 5 1 2 3 4 Note: (Note 1), (Note 2), (Note 3), (Note 4) and (Note 5): See the next page. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). This transistor is an electrostatic-sensitive device. Please handle with caution. WARNING 【Handling Precaution for Power MOSFET in use of Protection Circuit for Battery Pack】 Flame-retardant resins of UL94-V0 flammability class are used in packages, however, they are not noncombustible.Use a unit example PTC Thermistor, which can shut off the power supply if a short-circuit occurs. If the power supply is not shut off on the occurring short-circuit,a large short-circuit current will flow continuously, which may cause the device to catch fire or smoke. 1 2007-01-16 TPCS8214 Thermal Characteristics Characteristics Single-device operation (Note 3a) Thermal resistance, channel to ambient (Note 2a) Single-device value at (t = 10 s) dual operation (Note 3b) Single-device operation (Note 3a) Thermal resistance, channel to ambient (Note 2b) Single-device value at (t = 10 s) dual operation (Note 3b) Symbol Max Rth (ch-a) (1) 114 Rth (ch-a) (2) 167 Rth (ch-a) (1) 208 Rth (ch-a) (2) 357 Unit °C/W °C/W Marking (Note 6) Part No. (or abbreviation code) S8214 A line indicates lead (Pb)-free package or lead (Pb)-free finish. Lot No. Note 1: Please use devices on condition that the channel temperature is below 150°C.Note 2: a) Device mounted on a glass-epoxy board (a) b) Device mounted on a glass-epoxy board (b) FR-4 25.4 × 25.4 × 0.8 (unit: mm) FR-4 25.4 × 25.4 × 0.8 (unit: mm) (a) (b) Note 3: a) The power dissipation and thermal resistance values are shown for a single device (During single-device operation, power is only applied to one device.) b) The power dissipation and thermal resistance values are shown for a single device (During dual operation, power is evenly applied to both devices.) Note 4: VDD = 24 V, Tch = 25°C (initial), L = 0.2mH, RG = 25 Ω, IAR = 6 A Note 5: Repetitive rating: pulse width limited by max channel temperature Note 6: ○ on lower right of the marking indicates Pin 1. ※ Weekly code: (Three digits) Week of manufacture (01 for the first week of a year: sequential number up to 52 or 53) Year of manufacture (The last digits of a year) 2 2007-01-16 TPCS8214 Electrical Characteristics (Ta = 25°C) Characteristics Symbol Test Condition Min Typ. Max Unit Gate leakage current IGSS VGS = ±10 V, VDS = 0 V ⎯ ⎯ ±10 μA Drain cut-OFF current IDSS VDS = 30 V, VGS = 0 V ⎯ ⎯ 10 μA V (BR) DSS ID = 10 mA, VGS = 0 V 30 ⎯ ⎯ V (BR) DSX ID = 10 mA, VGS = −12 V 15 ⎯ ⎯ Vth VDS = 10 V, ID = 200 μA 0.5 ⎯ 1.4 VGS = 2.5 V, ID = 4.2 A ⎯ 12.5 18.5 VGS = 4.0 V, ID = 4.8 A ⎯ 11 13.5 VGS = 4.5 V, ID = 4.8 A ⎯ 10.5 13 VDS = 10 V, ID = 3.0 A 5 10 ⎯ ⎯ 3240 ⎯ ⎯ 285 ⎯ ⎯ 315 ⎯ ⎯ 21 ⎯ ⎯ 33 ⎯ ⎯ 15 ⎯ ⎯ 66 ⎯ ⎯ 42 ⎯ ⎯ 7 ⎯ ⎯ 14 ⎯ Gate threshold voltage Drain-source ON resistance RDS (ON) Forward transfer admittance |Yfs| Input capacitance Ciss Reverse transfer capacitance Crss Output capacitance Coss Rise time Turn-ON time VDS = 10 V, VGS = 0 V, f = 1 MHz tr ton Turn-OFF time Total gate charge (gate-source plus gate-drain) 4.7 Ω Switching time Fall time tf toff ID = 3 A 5V VGS 0V VDD ∼ − 15 V VOUT RL = 4.7Ω Drain-source breakdown voltage Duty < = 1%, tw = 10 μs Qg Gate-source charge 1 Qgs1 Gate-drain (“miller”) charge Qgd VDD ∼ − 24 V, VGS = 5 V, ID = 6 A V V mΩ S pF ns nC Source-Drain Ratings and Characteristics (Ta = 25°C) Characteristics Drain reverse current Forward voltage (diode) Pulse (Note 1) Symbol Test Condition Min Typ. Max Unit IDRP ⎯ ⎯ ⎯ 24 A ⎯ ⎯ −1.2 V VDSF IDR = 6 A, VGS = 0 V 3 2007-01-16 TPCS8214 ID – VDS ID – VDS 10 20 4.5 2 1.9 Common source 1.8 Ta = 25°C, Pulse test (A) 8 3.1 ID 4 6 1.7 Drain current Drain current ID (A) 2.5 4 1.6 2 16 2.5 Common source 2 Ta = 25°C 3.1 4 4.5 Pulse test 1.9 12 1.8 8 1.7 4 VGS = 1.5 V 1.6 VGS = 1.5 V 0 0 0.2 0.4 0.6 0.8 Drain-source voltage VDS 0 0 1.0 (V) 1 2 ID – VGS (V) VDS – VGS Common source VDS (V) VDS = 10 V Pulse test (A) 8 Drain−source voltage ID Drain current 5 0.5 Common source 6 25 4 2 100 0 0 1 Ta = −55°C Ta = 25°C Pulse test 0.4 0.3 0.2 ID = 1.5 A 3 12 0.1 6 0 0 3 2 Gate-source voltage VGS (V) 2 4 8 6 Gate-source voltage VGS |Yfs| – ID 10 12 (V) RDS (ON) – ID 100 100 Common source Ta = −55°C 25 100 Ta = 25°C 50 Drain-source ON resistance RDS (ON) (mΩ) 50 Forward transfer admittance |Yfs| (S) 4 Drain-source voltage VDS 12 10 3 30 10 5 3 Common source Pulse test 30 3.1 VGS = 2.5 V 10 4 4.5 5 3 VDS = 10 V Pulse test 1 0.1 0.3 0.5 1 3 5 10 30 50 1 0.1 100 Drain current ID (A) 0.3 0.5 1 3 5 10 30 50 100 Drain current ID (A) 4 2007-01-16 TPCS8214 RDS (ON) – Ta IDR – VDS 30 100 (A) Pulse test 20 IDR ID = 6 A 3 Drain reverse current 1.5 VGS = 2.5 V 10 0 −80 4.5 30 10 3 10 5 5 3 1 0.5 Common source 0.3 Ta = 25°C Pulse test −40 0 40 80 120 0.1 0 160 −0.2 −0.4 C – VDS 2.0 Vth (V) Coss Crss 100 Common source Ta = 25°C VGS = 0 V f = 1 MHz 1 0.1 10 ID = 200 μA Pulse test 1.2 0.8 0.4 −40 0.4 (3) VDS (V) (4) 50 100 120 160 30 0.2 0 0 80 Dynamic input/output characteristics Drain−source voltage Drain power dissipation PD (W) 0.6 40 (V) Device mounted on a glass-epoxy board (a) (Note 2a) (1) Single-device operation (Note 3a) (2) Single-device value at dual operation (Note 3b) Device mounted on a glass-epoxy board (b) (Note 2b) (3) Single-device operation (Note 3a) (4) Single-device value at dual operation (Note 3b) t = 10 s (2) 0 Ambient temperature Ta (°C) PD – Ta 1 (V) VDS = 10 V 1.6 100 Drain−source voltage VDS (1) −1.2 Common source 0 −80 1 −1.0 150 VDD = 24 V 20 6 10 2 VDD = 12, 24 V 6 Common source ID = 6 A Ta = 25°C, Pulse test 10 20 30 40 Total gate charge Ambient temperature Ta (°C) 5 4 VGS VDS 12 0 0 200 6 (V) Capacitance Gate threshold voltage 1000 C (pF) Ciss 0.8 −0.8 Vth – Ta 10000 1.2 −0.6 Drain-source voltage VDS Ambient temperature Ta (°C) 10 VGS = −1 V 0 1 50 Qg 60 VGS 3.1 4 50 Gate-source voltage Drain-source ON resistance RDS (ON) (mΩ) Common source 0 70 (nC) 2007-01-16 TPCS8214 rth − tw (4) Device mounted on a glass-epoxy board (a) (Note 2a) 500 (1) Single-device operation (Note 3a) (2) Single-device value at dual operation (Note 3b) 300 Device mounted on a glass-epoxy board (b) (Note 2b) (3) Single-device operation (Note 3a) (4) Single-device value at dual operation (Note 3b) (3) (2) (1) 100 50 Transient thermal impedance rth (°C/W) 1000 30 10 5 3 1 0.5 0.3 Single pulse 0.1 0.001 0.01 0.1 1 10 100 1000 Pulse width tw (s) Safe operating area 100 Single-device value at dual operation (Note 3b) 1 ms * 10 Drain current ID (A) ID max (Pulse) * 10 ms * 1 * Single pulse Ta = 25°C Curves must be derated linearly with increase in temperature. 0.1 0.1 1 VDSS max 10 Drain−source voltage VDS 100 (V) 6 2007-01-16 TPCS8214 RESTRICTIONS ON PRODUCT USE 20070701-EN • The information contained herein is subject to change without notice. • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 7 2007-01-16