TI TPS51200DRCR

TPS51200
www.ti.com
SLUS812 – FEBRUARY 2008
SINK/SOURCE DDR TERMINATION REGULATOR
FEATURES
APPLICATIONS
• Input Voltage: Supports 2.5-V Rail and 3.3-V
Rail
• VLDOIN Voltage Range: 1.1 V to 3.5 V
• Sink/Source Termination Regulator Includes
Droop Compensation
• Requires Minimum Output Capacitance of
20-µF (typically 3 × 10-µF MLCCs) for Memory
Termination Applications (DDR)
• PGOOD to Monitor Output Regulation
• EN Input
• REFIN Input Allows for Flexible Input Tracking
Either Directly or Through Resistor Divider
• Remote Sensing (VOSNS)
• ±10-mA Buffered Reference (REFOUT)
• Built-in Soft Start, UVLO and OCL
• Thermal Shutdown
• Meets DDR, DDR2 JEDEC Specifications;
Supports DDR3 and Low-Power DDR3/DDR4
VTT Applications
• SON-10 PowerPAD™Package
•
1
2
•
•
Memory Termination Regulator for DDR,
DDR2, DDR3, and Low Power DDR3/DDR4
Notebook/Desktop/Server
Telecom/Datacom, GSM Base Station,
LCD-TV/PDP-TV, Copier/Printer, Set-Top Box
DESCRIPTION
The TPS51200 is a sink/source Double Data Rate
(DDR) termination regulator specifically designed for
low input voltage, low-cost, low-noise systems where
space is a key consideration.
The TPS51200 maintains a fast transient response
and only requires a minimum output capacitance of
20 µF. The TPS51200 supports a remote sensing
function and all power requirements for DDR, DDR2,
DDR3, and Low Power DDR3/DDR4 VTT bus
termination.
In addition, the TPS51200 provides an open-drain
PGOOD signal to monitor the output regulation and
an EN signal that can be used to discharge VTT
during S3 (suspend to RAM) for DDR applications.
The TPS51200 is available in the thermally-efficient
SON-10 PowerPAD package, and is rated both
Green and Pb-free. It is specified from -40°C to
+85°C.
STANDARD DDR APPLICATION
TPS51200
VIN 10
VDDQ
1
REFIN
VLDOIN
2
VLDOIN PGOOD
9
VTT
3
VO
GND
8
4
PGND
EN
7
5
VOSNS REFOUT
6
3.3 VIN
PGOOD
SLP_S3
VTTREF
0.1 mF
UDG-08025
1
2
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PowerPAD is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2008, Texas Instruments Incorporated
TPS51200
www.ti.com
SLUS812 – FEBRUARY 2008
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
ORDERING INFORMATION
TA
PACKAGE
DEVICE NUMBER
–40°C to 85°C
DRC Plastic Small Outline
TPS51200DRCT
TPS51200DRCR
PINS
MEDIUM
MINIMUM
QUANTITY
10
Tape and Reel
250
3000
ABSOLUTE MAXIMUM RATINGS (1)
Over operating free-air temperature range, unless otherwise noted.
VALUE
Input voltage range (2)
Output voltage range (2)
Tstg
(1)
(2)
VIN, VLDOIN, VOSNS, REFIN
–0.3 to 3.6
EN
–0.3 to 6.5
PGND to GND
–0.3 to 0.3
VO, REFOUT
–0.3 to 3.6
PGOOD
–0.3 to 6.5
Storage temperature
UNIT
V
V
°C
–55 to 150
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
All voltage values are with respect to the network ground terminal unless otherwise noted.
DISSIPATION RATINGS TABLE (1)
(1)
PACKAGE
TA = 25°C
POWER RATING
DERATING FACTOR
ABOVE TA = 25°C
TA = 85°C
POWER RATING
10-Pin SON
1.92 W
19 mW/°C
0.79 W
PowerPAD size: 3.0 × 1.9 mm, 4 standard thermal vias. Based on the above environment, junction to thermal pad resistance θJP is
10.24°C/W. Junction to ambient thermal resistance θJA is 52.06°C/W.
RECOMMENDED OPERATING CONDITIONS
PARAMETER
Supply voltages
VIN
TYP
MAX
2.375
3.500
–0.1
3.5
0.5
1.8
VO, PGOOD
–0.1
3.5
REFOUT
–0.1
1.8
PGND
–0.1
0.1
–40
85
EN, VLDOIN, VOSNS
REFIN
Voltage range
MIN
Operating free-air temperature, TA
2
UNIT
V
°C
Copyright © 2008, Texas Instruments Incorporated
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SLUS812 – FEBRUARY 2008
ELECTRICAL CHARACTERISTICS
Over recommended free-air temperature range, VVIN = 3.3 V,VVLDOIN = 1.8 V, VREFIN = 0.9 V, VVOSNS = 0.9 V, VEN = VVIN, COUT
= 3 × 10 µF and circuit shown in Section 1. (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
SUPPLY CURRENT
IIN
Supply current
TA = 25 °C, VEN = 3.3 V, No Load
0.7
1
TA = 25 °C, VEN = 0 V, VREFIN = 0, No Load
65
80
200
400
1
50
µA
0.1
50
µA
1
µA
15
mV
15
mV
–15
15
mV
–25
25
mV
3
4.5
A
3.5
5.5
A
18
25
Ω
IIN(SDN)
Shutdown current
ILDOIN
Supply current ofVLDOIN
TA = 25 °C, VEN = 3.3 V, No Load
ILDOIN(SDN)
Shutdown current of VLDOIN
TA = 25 °C, VEN = 0 V, No Load
Input current, REFIN
VEN = 3.3 V
TA = 25 °C, VEN = 0 V, VREFIN > 0.4 V, No Load
mA
µA
INPUT CURRENT
IREFIN
VO OUTPUT
VREFOUT = 1.25 V (DDR1), IO = 0 A
VVOSNS
Output DC voltage, VO
VREFOUT = 0.9 V (DDR2), IO = 0 A
VLDOIN = 1.5 V, VREFOUT = 0.75 V (DDR3), IO = 0 A
VVOTOL
Output voltage tolerance to
REFOUT
–2A < IVO < 2A
IVOSRCL
VO source vurrent Limit
With reference to REFOUT, VOSNS = 90% × VREFOUT
IVOSNCL
VO sink current Limit
With reference to REFOUT, VOSNS = 110% × VREFOUT
IDSCHRG
Discharge current, VO
VREFIN = 0 V, VVO = 0.3 V, VEN = 0 V, TA = 25°C
1.25
–15
V
0.9
–15
V
0.75
V
POWERGOOD COMPARATOR
VTH(PG)
VO PGOOD threshold
PGOOD window lower threshold with respect to REFOUT
–23.5%
–20%
–17.5%
PGOOD window upper threshold with respect to REFOUT
17.5%
20%
23.5%
PGOOD hysteresis
TPGSTUPDLY
PGOOD startup delay
Startup rising edge, VOSNS within 15% of REFOUT
VPGOODLOW
Output low voltage
ISINK = 4 mA
TPBADDLY
PGOOD bad delay
VOSNS is outside of the ±20% PGOOD window
IPGOODLK
Leakage current (1)
VOSNS = VREFIN (PGOOD high impedance),
PGOOD = VIN + 0.2 V
5%
2
ms
0.4
V
µs
10
1
µA
REFIN AND REFOUT
VREFIN
REFIN voltage range
VREFINUVLO
REFIN undervoltage lockout
VREFINUVHYS
REFIN undervoltage lockout
hysteresis
VREFOUT
REFOUT voltage
0.5
REFIN rising
360
390
1.8
V
420
mV
20
mV
REFIN
V
–10 mA < IREFOUT < 10 mA, VREFIN = 1.25 V
–15
15
–10 mA < IREFOUT < 10 mA, VVREFIN = 0.9 V
–15
15
–10 mA < IREFOUT < 10 mA, VREFIN = 0.75V
–15
15
–10 mA < IREFOUT < 10 mA, VREFIN = 0.6 V
–15
mV
VREFOUTTOL
REFOUT voltage tolerance to
VREFIN
IREFOUTSRCL
REFOUT source current limit
VREFOUT = 0 V
10
40
mA
IREFOUTSNCL
REFOUT sink current limit
VREFOUT = 0 V
10
40
mA
(1)
15
Ensured by design. Not production tested.
3
Copyright © 2008, Texas Instruments Incorporated
Product Folder Link(s): TPS51200
TPS51200
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SLUS812 – FEBRUARY 2008
ELECTRICAL CHARACTERISTICS (continued)
Over recommended free-air temperature range, VVIN = 3.3 V,VVLDOIN = 1.8 V, VREFIN = 0.9 V, VVOSNS = 0.9 V, VEN = VVIN, COUT
= 3 × 10 µF and circuit shown in Section 1. (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
2.2
2.3
2.375
UNIT
UVLO / EN LOGIC THRESHOLD
Wake up, TA = 25°C
VVINUVVIN
UVLO threshold
VENIH
High-level input voltage
Enable
VENIL
Low-level input voltage
Enable
VENYST
Hysteresis voltage
Enable
IENLEAK
Logic input leakage current
EN, TA = 25°C
Hysteresis
50
V
mV
1.7
0.3
V
1
µA
0.5
–1
THERMAL SHUTDOWN
TSON
(2)
Thermal shutdown threshold (2)
Shutdown temperature
Hysteresis
150
25
°C
Ensured by design. Not production tested.
4
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SLUS812 – FEBRUARY 2008
DEVICE INFORMATION
DRC PACKAGE
TPS51200
(Bottom View)
VOSNS 5
PGND 4
VO 3
VLDOIN 2
REFIN 1
6 REFOUT
7 EN
8 GND
9 PGOOD
10 VIN
TERMINAL FUNCTIONS
TERMINAL
NAME
NO.
I/O
EN
7
I
For DDR VTT application, connect EN to SLP_S3. For any other application(s), use EN as the ON/OFF
function.
DESCRIPTION
GND
8
–
Ground.Signal ground. Connect to negative terminal of the output capacitor.
PGND
4
–
Power ground output for the LDO
PGOOD
9
O
PGOOD output. Indicates regulation.
REFIN
1
I
Reference input
REFOUT
6
O
Reference output. Connect to GND through 0.1-µF ceramic capacitor.
VIN
10
I
2.5-V or 3.3-V power supply A ceramic decoupling capacitor with a value between 1-µF and 4.7-µF is
required.
VLDOIN
2
I
Supply voltage for the LDO
VO
3
O
Power output for the LDO
VOSNS
5
I
Voltage sense output for the LDO. Connect to positive terminal of the output capacitor or the load.
5
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SLUS812 – FEBRUARY 2008
FUNCTIONAL BLOCK DIAGRAM
REFIN
+
1
2.3 V
VIN 10
VOSNS
2
VLDOIN
6
REFOUT
3
VO
4
PGND
9
PGOOD
UVLO
+
Gm
DchgREF
5
+
7
GND
8
ENVTT
DchgVTT
Gm
REFINOK
+
+
+
EN
Startup
Delay
+
UDG-08019
6
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TPS51200
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SLUS812 – FEBRUARY 2008
DETAILED DESCRIPTION
VO SINK/SOURCE REGULATOR
The TPS51200 is a sink/source tracking termination regulator specifically designed for low input voltage,
low-cost, and low external component count systems where space is a key application parameter. The
TPS51200 integrates a high-performance, low-dropout (LDO) linear regulator that is capable of both sourcing
and sinking current. The LDO regulator employs a fast feedback loop so that small ceramic capacitors can be
used to support the fast load transient response. To achieve tight regulation with minimum effect of trace
resistance, a remote sensing terminal, VOSNS, should be connected to the positive terminal of the output
capacitor(s) as a separate trace from the high current path from VO.
REFERENCE INPUT (REFIN)
The output voltage, VO, is regulated to REFOUT. When REFIN is configured for standard DDR termination
applications, REFIN can be set by an external equivalent ratio voltage divider connected to the memory supply
bus (VDDQ). The TPS51200 supports REFIN voltage from 0.5 V to 1.8 V, making it versatile and ideal for many
types of low-power LDO applications.
REFERENCE OUTPUT (REFOUT)
When it is configured for DDR termination applications, REFOUT generates the DDR VTT reference voltage for
the memory application. It is capable of supporting both a sourcing and sinking load of 10 mA. REFOUT
becomes active when REFIN voltage rises to 0.390 V and VIN is above the UVLO threshold. When REFOUT is
less than 0.375 V, it is disabled and subsequently discharges to GND through an internal 10-kΩ MOSFET.
REFOUT is independent of the EN pin state.
SOFT-START
The soft-start function of the VO pin is achieved via a current clamp. The current clamp allows the output
capacitors to be charged with low and constant current, providing a linear ramp-up of the output voltage. When
VO is outside of the powergood window, the current clamp level is one-half of the full overcurrent limit (OCL)
level. When VO rises or falls within the PGOOD window, the current clamp level switches to the full OCL level.
The soft-start function is completely symmetrical; it works not only from GND to the REFOUT voltage, but also
from VLDOIN to the REFOUT voltage.
EN CONTROL (EN)
When EN is driven high, the TPS51200 VO regulator begins normal operation. When EN is driven low, VO is
discharges to GND through an internal 18-Ω MOSFET. REFOUT remains on when EN is driven low.
POWERGOOD FUNCTION (PGOOD)
The TPS51200 provides an open-drain PGOOD output that goes high when the VO output is within ±20% of
REFOUT. PGOOD de-asserts within 10 µs after the output exceeds the size of the powergood window. During
initial VO startup, PGOOD asserts high 2 ms (typ) after the VO enters power good window. Because PGOOD is
an open-drain output, a 100-kΩ, pull-up resistor between PGOOD and a stable active supply voltage rail is
required.
VO CURRENT PROTECTION
The LDO has a constant overcurrent limit (OCL). Note that the OCL level reduces by one-half when the output
voltage is not within the powergood window. This reduction is a non-latch protection.
VIN UVLO PROTECTION
For VIN undervoltage lockout (UVLO) protection, the TPS51200 monitors VIN voltage. When the VIN voltage is
lower than the UVLO threshold voltage, both the VO and REFOUT regulators are powered off. This shutdown is
a non-latch protection.
7
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SLUS812 – FEBRUARY 2008
THERMAL SHUTDOWN
The TPS51200 monitors the its junction temperature. If the device junction temperature exceeds its threshold
value, (typically 150°C), the VO and REFOUT regulators are both shut off, discharged by the internal discharge
MOSFETs. This shutdown is a non-latch protection.
8
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APPLICATION INFORMATION
VIN CAPACITOR
Add a ceramic capacitor, with a value between 1.0-µF and 4.7-µF, placed close to the VIN pin, to stabilize the
bias supply (2.5- V rail or 3.3- V rail) from any parasitic impedance from the supply.
VLDO INPUT CAPACITOR
Depending on the trace impedance between the VLDOIN bulk power supply to the device, a transient increase of
source current is supplied mostly by the charge from the VLDOIN input capacitor. Use a 10-µF (or greater)
ceramic capacitor to supply this transient charge. Provide more input capacitance as more output capacitance is
used at VO. In general, use one-half of the COUT value for input.
OUTPUT CAPACITOR
For stable operation, the total capacitance of the VO output terminal must be greater than 20 µF. Attach three,
10-µF ceramic capacitors in parallel to minimize the effect of equivalent series resistance (ESR) and equivalent
series inductance (ESL). If the ESR is greater than 2 mΩ, insert an R-C filter between the output and the VOSNS
input to achieve loop stability. The R-C filter time constant should be almost the same as or slightly lower than
the time constant of the output capacitor and its ESR.
Low VIN Applications
TPS51200 can be used in an application system where either a 2.5-V rail or a 3.3-V rail is available. If only a 5-V
rail is available, TPS51100 can be used instead. The TPS51200 minimum input voltage requirement is 2.375 V.
If a 2.5-V rail is used, ensure that the absolute minimum voltage (both DC and transient) at the device pin is be
2.375 V or greater. The voltage tolerance for a 2.5-V rail input is between –5% and 5% accuracy, or better.
S3 and Pseudo-S5 Support
The TPS51200 provides S3 support by an EN function. The EN pin could be connected to an SLP_S3 signal in
the end application. Both REFOUT and VO are on when EN = high (S0 state). REFOUT is maintained while VO
is turned off and discharged via an internal discharge MOSFET when EN = low (S3 state). When EN = low and
the REFIN voltage is less than 0.390 V, TPS51200 enters pseudo-S5 state. Both VO and REFOUT outputs are
turned off and discharged to GND through internal MOSFETs when pseudo-S5 support is engaged (S4/S5
state). Figure 1 shows a typical startup and shutdown timing diagram for an application that uses S3 and
pseudo-S5 support.
Tracking Startup and Shutdown
The TPS51200 also supports tracking startup and shutdown when EN is tied directly to the system bus and not
used to turn on or turn off the device. During tracking startup, VO follows REFOUT once REFIN voltage is
greater than 0.39 V. REFIN follows the rise of VDDQ rail via a voltage divider. The typical soft-start time for the
VDDQ rail is approximately 3 ms, however it may vary depending on the system configuration. The SS time of
the VO output no longer depends on the OCL setting, but it is a function of the SS time of the VDDQ rail.
PGOOD is asserted 2 ms after VO is within ±20% of REFOUT. During tracking shutdown, VO falls following
REFOUT until REFOUT reaches 0.37 V. Once REFOUT falls below 0.37 V, the internal discharge MOSFETs are
turned on and quickly discharge both REFOUT and VO to GND. PGOOD is deasserted once VO is beyond the
±20% range of REFOUT. Figure 2 shows the typical timing diagram for an application that uses tracking startup
and shutdown.
9
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SLUS812 – FEBRUARY 2008
3.3VIN
VVDDQ = 1.5 V
0.390 V
0.370 V
VLDOIN
REFIN
REFOUT
(VTTREF)
EN
(S3_SLP)
VVO = 0.75 V
Tss
VO
TSS =
PGOOD
CO x VO
IOOCL
2 ms
UDG-08021
Figure 1. Typical Timing Diagram for S3 and pseudo-S5 Support
3.3VIN
EN
VLDOIN
REFIN
REFOUT
(VTTREF)
VO
tSS determined
by the SS time
of VLDOIN
VVO = 0.75 V
PGOOD
UDG-08020
2ms
Figure 2. Typical Timing Diagram of Tracking Startup and Shutdown
10
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Output Tolerance Consideration for VTT DIMM Applications
The TPS51200 is specifically designed to power up the memory termination rail (as shown in Figure 3). The DDR
memory termination structure determines the main characteristics of the VTT rail, which is to be able to sink and
source current while maintaining acceptable VTT tolerance. See Figure 4 for typical characteristics for a single
memory cell.
Vtt
SPD
DQ
CA
Vdd
Vtt
Vdd
CA
Vdd
DQ
DDR3 240 Pin Socket
VO
10 mF
10 mF
TPS51200
10 mF
UDG-08022
Figure 3. Typical Application Diagram for DDR3 VTT DIMM using TPS51200
VDDQ
VTT
Q1
25 W
RS
20 W
Ouput
Buffer
(Driver)
Receiver
Q2
VOUT
VIN
VSS
UDG-08023
Figure 4. DDR Physical Signal System Bi-Directional SSTL Signaling
In Figure 4, when Q1 is on and Q2 is off:
• Current flows from VDDQ via the termination resistor to VTT
• VTT sinks current
In Figure 4, when Q2 is on and Q1 is off:
•
•
Current flows from VTT via the termination resistor to GND
VTT sources current
11
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SLUS812 – FEBRUARY 2008
Because VTT accuracy has a direct impact on the memory signal integrity, it is imperative to understand the
tolerance requirement on VTT. Based on JEDEC VTT specifications for DDR and DDR2 (JEDEC standard: DDR
JESD8-9B May 2002; DDR2 JESD8-15A Sept 2003).
VTTREF – 40 mV < VTT < VTTREF + 40 mV, for both dc and ac conditions
The specification itself indicates that VTT must keep track of VTTREF for proper signal conditioning.
The TPS51200 ensures the regulator output voltage to be:
VTTREF –25 mV < VTT < VTTREF + 25mV, for both DC and AC conditions and –2 A < IVTT < 2 A
The regulator output voltage is measured at the regulator side, not the load side. The tolerance is applicable to
DDR, DDR2, DDR3 and Low Power DDR3/DDR4 applications (see Table 1 for detailed information). To meet the
stability requirement, a minimum output capacitance of 20 µF is needed. Considering the actual tolerance on the
MLCC capacitors, three 10-µF ceramic capacitors are sufficient to meet the above requirement.
Table 1. DDR, DDR2, DDR3 and LP DDR3 Termination Technology and Their Differences
DDR
FSB Data Rates
200, 266, 333 and 400 MHz 400, 533, 677 and 800 MHz
Motherboard termination to
VTT for all signals
Termination
Termination
Current Demand
Max source/sink transient
currents of up to 2.6A to
2.9A
2.5V Core and I/O 1.25V
VTT
Voltage Level
DDR2
DR3
Low Power
DDR3
800, 1066, 1330 and 1600 MHz
Same as DDR3
On-die termination for data group.
VTT termination for address,
command and control signals
On-die termination for data group.
VTT termination for address,
command and control signals
Same as DDR3
Not as demanding
Not as demanding
Same as DDR3
Only 34 signals (address,
• command, control) tied to
VTT
Only 34 signals (address,
• command, control) tied to
VTT
• ODT handles data signals
• ODT handles data signals
Less than 1A of burst current
Less than 1A of burst current
1.8V Core and I/O 0.9V VTT
1.5V Core and I/O 0.75V VTT
1.2V Core and
I/O 0.6V VTT
The TPS51200 is designed as a Gm driven LDO. The voltage droop between the reference input and the output
regulator is determined by the transconductance and output current of the device. The typical Gm is 250 S at 2 A
and changes with respect to the load in order to conserve the quiescent current (that is, the Gm is very low at no
load condition). The Gm LDO regulator is a single pole system. Its unity gain bandwidth for the voltage loop is
only determined by the output capacitance, as a result of the bandwidth nature of the Gm (see Equation 1) .
FUGBW =
Gm
2 ´ p ´ COUT
(1)
where
•
•
•
FUGBW is the unity gain bandwidth
Gm is transconductance
COUT is the output capacitance
There are two limitations to this type of regulator when it comes to the output bulk capacitor requirement. In order
to maintain stablility, the zero location contributed by the ESR of the output capacitors should be greater than the
-3-dB point of the current loop. This constraint means that higher ESR capacitors should not be used in the
design. In addition, the impedance characteristics of the ceramic capacitor should be well understood in order to
prevent the gain peaking effect around the Gm –3-dB point because of the large ESL, the output capacitor and
parasitic inductance of the VO trace.
12
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Figure 5. Bode Plot for a Typical DDR3 Configuration
Figure 5 shows the bode plot simulation for a typical DDR3 configuration of the TPS51200, where:
•
•
•
•
•
•
•
VIN = 3.3 V
VVLDOIN = 1.5 V
VVO = 0.75 V
IIO = 2 A
3 × 10-µF capacitors included
ESR = 2.5 mΩ
ESL = 800 pH
The unity-gain bandwidth is approximately 1 MHz and the phase margin is 52°. The 0-dB level is crossed, the
gain peaks because of the ESL effect. However, the peaking is kept well below 0 dB.
Figure 6 shows the load regulation and Figure 7 shows the transient response for a typical DDR3 configuration.
When the regulator is subjected to ±1.5-A load step and release, the output voltage measurement shows no
difference between the dc and ac conditions.
13
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OUTPUT VOLTAGE
vs
OUTPUT CURRENT
790
VOUT – Output Voltage – mV
VIN = 3.3 V
0°C
780
25°C
770
760
-40°C
750
740
730
720
710
700
-3
DDR3
-40°C
0°C
25°C
85°C
-2
85°C
-1
0
1
IOUT – Output Current – A
2
3
Figure 6. DC Regulaltion
Figure 7. Transient
LDO Design Guidelines
The minimum input to output voltage difference (headroom) decides the lowest usable supply voltage Gm-driven
to drive a certain load. For TPS51200, a minimum of 300 mV (VLDOINMIIN – VOMAX) is needed in order to
support a Gm driven sourcing current of 2 A based on a design of VIN = 3.3 V and COUT = 3 × 10µF. Because the
TPS51200 is essentially a Gm driven LDO, its impedance characteristics are both a function of the 1/Gm and
RDS(on) of the sourcing MOSFET (see Figure 8). The current inflection point of the design is between 2 A and 3 A.
When ISRC is less than the inflection point, the LDO is considered to be operating in the Gm region; when ISRC is
greater than the inflection point but less than the overcurrent limit point, the LDO is operating in the RDS(on)
region. The maximum sourcing RDS(on) is 0.144 Ω with VIN = 3.0 V and TJ = 125°C.
14
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VVO – Output Voltage – V
SLUS812 – FEBRUARY 2008
1/Gm
Inflection
Point
(between
2 A and 3 A)
1/RDS(on)
Overcurrent
Limit
ISRC - Source Current - A
UDG-08026
Figure 8. TPS51200 Impedance Characteristics
15
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SLUS812 – FEBRUARY 2008
THERMAL DESIGN
Because the TPS51200 is a linear regulator, the VO current flows in both source and sink directions, thereby
dissipating power from the device. When the device is sourcing current, the voltage difference between VLDOIN
and VO times IO (IIO) current becomes the power dissipation as shown in Equation 2.
PDISS _ SRC =
(VVLDOIN
- VVO ) x IO _ SRC
(2)
In this case, if VLDOIN is connected to an alternative power supply lower than the VDDQ voltage, overall power
loss can be reduced. For the sink phase, VO voltage is applied across the internal LDO regulator, and the power
dissipation, PDISS_SNK can be calculated by Equation 3.
PDISS _ SNK = VVO ´ IO _ SNK
(3)
Because the device does not sink and source current at the same time and the IO current may vary rapidly with
time, the actual power dissipation should be the time average of the above dissipations over the thermal
relaxation duration of the system. Another source of power consumption is the current used for the internal
current control circuitry from the VIN supply and the VLDOIN supply. This can be estimated as 5 mW or less
during normal operatiing conditions. This power must be effectively dissipated from the package.
Maximum power dissipation allowed by the package is calculated by Equation 4.
PPKG = [TJ(MAX) – TA(MAX)]/ θJA
PPKG =
(TJ(max) ´ TA(max) )
qJA
(4)
where
•
•
•
TJ(MAX) is +125°C
TA(MAX) is the maximum ambient temperature in the system
θJA is the thermal resistance from junction to ambient
The thermal performance of an LDO is greatly depends on the printed circuit board (PCB) layout. The TPS51200
is housed in a thermally-enhanced PowerPAD™ package that has an exposed die pad underneath the body. For
improved thermal performance, this die pad must be attached to ground via thermal land on the PCB. This
ground trace acts as a both a heatsink and heatspreader. The typical thermal resistance, θJA, 52.06°C/W, is
achieved based on a land pattern of 3 mm × 1.9 mm with four vias (0.33-mm via diameter, the standard thermal
via size) without air flow (see Figure 9).
Land Pad
3 mm x 1.9 mm
Exposed Thermal
Die Pad,
2.48 mm x 1.74 mm
UDG-08018
Figure 9. Recommend Land Pad Pattern for TPS51200
To further improve the thermal performance of this device, using a larger than recommended thermal land as
well as increasing the number of vias helps lower the thermal resistance from junction to thermal pad. The typical
thermal resistance from junction to thermal pad, θJP, is 10.24°C/W (based on the recommend land pad and four
standard thermal vias).
16
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SLUS812 – FEBRUARY 2008
For further information regarding the PowerPAD™ package and the recommended board layout, refer to the
PowerPAD™ package application note (SLMA002). This document is available at www.ti.com.
LAYOUT CONSIDERATIONS
Consider the following points before starting the TPS51200 layout design.
• The input bypass capacitor for VLDOIN should be placed as close as possible to the pin with short and wide
connections.
• The output capacitor for VO should be placed close to the pin with short and wide connection in order to
avoid additional ESR and/or ESL trace inductance.
• VOSNS should be connected to the positive node of VO output capacitor(s) as a separate trace from the high
current power line. This configuration is strongly recommended to avoid additional ESR and/or ESL. If
sensing the voltage at the point of the load is required, it is recommended to attach the output capacitor(s) at
that point. Also, it is recommended to minimize any additional ESR and/or ESL of ground trace between the
GND pin and the output capacitor(s).
• Consider adding low-pass filter at VOSNS if the ESR of the VO output capacitor(s) is larger than 2 mΩ.
• REFIN can be connected separately from VLDOIN. Remember that this sensing potential is the reference
voltage of REFOUT. Avoid any noise-generating lines.
• The negative node of the VO output capacitor(s) and the REFOUT capacitor should be tied together by
avoiding common impedance to the high current path of the VO source/sink current.
• The GND and PGND pins should be connected to the thermal land underneath the die pad with multiple vias
connecting to the internal system ground planes (for better result, use at least two internal ground planes).
Use as many vias as possible to reduce the impedance between PGND/GND and the system ground plane.
Also, place bulk caps close to the DIMM load point, route the VOSNS to the DIMM load sense point.
• In order to effectively remove heat from the package, properly prepare the thermal land. Apply solder directly
to the package’s thermal pad. The wide traces of the component and the side copper connected to the
thermal land pad help to dissipate heat. Numerous vias 0,33 mm in diameter connected from the thermal land
to the internal/solder side ground plane(s) should also be used to help dissipation.
• Please consult the TPS51200-EVM User's Guide (SLUUxxx) for detailed layout recommendations.
17
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SLUS812 – FEBRUARY 2008
TYPICAL CHARACTERISTICS
For Figure 10 through Figure 24, 3 × 10-µF MLCCs (0805) are used on the output.
OUTPUT VOLTAGE
vs
OUTPUT CURRENT
OUTPUT VOLTAGE
vs
OUTPUT CURRENT
940
1.30
VIN = 3.3 V
930
VOUT – Output Voltage – mV
VOUT– Output Voltage – V
1.28
1.26
-40°C
0°C
1.24
1.22
DDR
-40°C
0°C
25°C
85°C
1.20
920
910 -40°C
0°C
900
890
DDR2
-40°C
0°C
25°C
85°C
880
85°C
1.18
85°C
870
-3
-2
-1
0
1
IOUT – Output Current – A
2
-3
3
Figure 11.
OUTPUT VOLTAGE
vs
OUTPUT CURRENT
OUTPUT VOLTAGE
vs
OUTPUT CURRENT
85°C
VIN = 3.3 V
0°C
VOUT – Output Voltage – mV
760
-40°C
750
740
730
700
-3
2
3
DDR3
-40°C
0°C
25°C
85°C
VIN = 3.3 V
650
25°C
770
710
-1
0
1
IOUT – Output Current – A
670
780
720
-2
Figure 10.
790
VOUT – Output Voltage – mV
VIN = 3.3 V
25°C
25°C
85°C
25°C
630
610
0°C
-40°C
590
DDR3
-40°C
0°C
25°C
85°C
570
550
-2
-1
0
1
IOUT – Output Current – A
2
3
-3
Figure 12.
-2
-1
0
1
IOUT – Output Current – A
2
3
Figure 13.
18
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TYPICAL CHARACTERISTICS (continued)
For Figure 10 through Figure 24, 3 × 10-µF MLCCs (0805) are used on the output.
OUTPUT VOLTAGE
vs
OUTPUT CURRENT
OUTPUT CURRENT
vs
OUTPUT VOLTAGE
1.30
1.00
VIN = 2.5 V
VIN = 2.5 V
1.25
1.20
VOUT – Output Voltage – V
VOUT– Output Voltage – V
0.95
1.15
25°C
1.10
1.05
1.00
DDR
85°C
-40°C
0°C
25°C
85°C
0.95
-40°C
-40°C
0.90
0.85
0.80
85°C
DDR2
0.75
0°C
0.90
25°C
&
0°C
-40°C
0°C
25°C
85°C
0.70
-3
-2
-1
0
1
IOUT – Output Current – A
2
3
-3
-2
-1
0
1
IOUT – Output Current – A
Figure 14.
Figure 15.
OUTPUT VOLTAGE
vs
OUTPUT CURRENT
OUTPUT VOLTAGE
vs
OUTPUT CURRENT
2
3
750
800
VIN = 2.5 V
VIN = 2.5 V
85°C
85°C
VOUT – Output Voltage – mV
VOUT– Output Voltage – V
700
750
-40°C
0°C
25°C
700
DDR3
-40°C
0°C
25°C
85°C
-2
25°C
600
-40°C
LP DDR3
550
-40°C
0°C
25°C
85°C
0°C
500
650
-3
650
-1
0
1
IOUT – Output Current – A
2
3
-3
Figure 16.
-2
-1
0
1
IOUT – Output Current – A
2
3
Figure 17.
19
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TYPICAL CHARACTERISTICS (continued)
For Figure 10 through Figure 24, 3 × 10-µF MLCCs (0805) are used on the output.
REFOUT VOLTAGE
vs
REFOUT CURRENT
REFOUT VOLTAGE
vs
REFOUT CURRENT
1.255
905
1.254
25°C
904
VREFOUT – Output Voltage – mV
VREFOUT – Output Voltage – V
25°C
1.253
1.252
1.251
1.250
-40°C
1.249
DDR
1.248
1.247
-15
-40°C
25°C
85°C
-5
0
5
10
IREFOUT – Output Current – mA
15
899
LP DDR3
-40°C
25°C
85°C
-10
85°C
-5
0
5
10
IREFOUT – Output Current – mA
REFOUT VOLTAGE
vs
REFOUT CURRENT
REFOUT VOLTAGE
vs
REFOUT CURRENT
15
605
25°C
752
-40°C
750
749
DDR3
-10
603
602
601
-40°C
600
599
LP DDR3
598
-40°C
25°C
85°C
85°C
-5
25°C
604
VREFOUT – Output Voltage – mV
VREFOUT – Output Voltage – mV
900
Figure 19.
753
747
-15
-40°C
Figure 18.
754
748
901
897
-15
755
751
902
898
85°C
-10
903
0
5
IREFOUT – Output Current – mA
598
-15
Figure 20.
-40°C
25°C
85°C
-10
85°C
-5
0
5
10
IREFOUT – Output Current – mA
15
Figure 21.
20
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TYPICAL CHARACTERISTICS (continued)
For Figure 10 through Figure 24, 3 × 10-µF MLCCs (0805) are used on the output.
DROPOUT VOLTAGE
vs
OUTPUT CURRENT
GAIN AND PHASE
vs
FREQUENCY
1.25 V
1.6
60
Phase
150
50
1.4
100
0.90 V
1.2
0.6 V
1.0
0.8
0.75 V
30
50
20
0
10
Gain
-50
Phase – Degrees
40
Gain – dB
VDRPOUT – Output Voltage – V
200
70
1.8
0
0.6
-100
-10
VOUT(V)
0.60
0.75
0.90
1.25
0.4
0.2
-20
-30
1k
0
0
0.5
1.0
1.5
2.0
2.5
IOUT – Output Current – A
3.0
DDR2
Gain
Phase
10 k
3.5
-150
100 k
f – Frequency - Hz
Figure 22.
1M
-200
10 M
Figure 23.
GAIN AND PHASE
vs
FREQUENCY
200
60
50
Phase
40
150
100
30
Gain – dB
50
20
0
10
Gain
-50
0
-100
-10
-20
-30
1k
DDR3
Gain
Phase
10 k
-150
100 k
f – Frequency - Hz
1M
-200
10 M
Figure 24.
21
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SLUS812 – FEBRUARY 2008
DESIGN EXAMPLES
Design Example 1
This design example describes a 3.3-VIN, DDR2 Configuration
R1
10 kW
TPS51200
1
VVDDQ = 1.8 V
R2
10 kW
VVLDOIN = VVDDQ = 1.8 V
C7
10 mF
C2
10 mF
3.3 VIN
R3
100 kW
2
VLDOIN PGOOD
9
3
VO
GND
8
4
PGND
EN
7
5
VOSNS REFOUT
6
C6
4.7 mF
PGOOD
C8
10 mF
VVTT = 0.9 V
C1
10 mF
VIN 10
REFIN
C4
1000 pF
C3
10 mF
SLP_S3
VTTREF
C5
0.1 mF
UDG-08028
Figure 25. 3.3-VIN, DDR2 Configuration
Design Example 1 List of Materials
REFERENCE
DESIGNATOR
R1, R2
R3
DESCRIPTION
Resistor
SPECIFICATION
GRM21BR70J106KE76L
Murata
100 kΩ
10 µF, 6.3 V
C4
1000 pF
Capacitor
MANUFACTURER
10 kΩ
C1, C2, C3
C5
PART NUMBER
0.1 µF
C6
4.7 µF, 6.3 V
GRM21BR60J475KA11L
Murata
C7, C8
10 µF, 6.3 V
GRM21BR70J106KE76L
Murata
22
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Design Example 2
This design example describes a 3.3-VIN, DDR3 Configuration
R1
10 kW
TPS51200
1
VVDDQ = 1.5 V
R2
10 kW
VVLDOIN = VVDDQ = 1.5 V
C7
10 mF
C2
10 mF
3.3 VIN
R3
100 kW
2
VLDOIN PGOOD
9
3
VO
GND
8
4
PGND
EN
7
5
VOSNS REFOUT
6
C6
4.7 mF
PGOOD
C8
10 mF
VVTT = 0.75 V
C1
10 mF
VIN 10
REFIN
C4
1000 pF
C3
10 mF
SLP_S3
VTTREF
C5
0.1 mF
UDG-08029
Figure 26. 3.3-VIN, DDR3 Configuration
Design Example 2 List of Materials
REFERENCE
DESIGNATOR
R1, R2
R3
DESCRIPTION
Resistor
SPECIFICATION
GRM21BR70J106KE76L
Murata
100 kΩ
10 µF, 6.3 V
C4
1000 pF
Capacitor
MANUFACTURER
10 kΩ
C1, C2, C3
C5
PART NUMBER
0.1 µF
C6
4.7 µF, 6.3 V
GRM21BR60J475KA11L
Murata
C7, C8
10 µF, 6.3 V
GRM21BR70J106KE76L
Murata
23
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Design Example 3
This design example describes a 2.5-VIN, DDR3 Configuration
R1
10 kW
TPS51200
1
VVDDQ = 1.5 V
R2
10 kW
VVLDOIN = VVDDQ = 1.5 V
C7
10 mF
C2
10 mF
2.5 VIN
R3
100 kW
2
VLDOIN PGOOD
9
3
VO
GND
8
4
PGND
EN
7
5
VOSNS REFOUT
6
C6
4.7 mF
PGOOD
C8
10 mF
VVTT = 0.75 V
C1
10 mF
VIN 10
REFIN
C4
1000 pF
C3
10 mF
SLP_S3
VTTREF
C5
0.1 mF
UDG-08030
Figure 27. 2.5-VIN, DDR3 Configuration
Design Example 3 List of Materials
REFERENCE
DESIGNATOR
R1, R2
R3
DESCRIPTION
Resistor
SPECIFICATION
GRM21BR70J106KE76L
Murata
100 kΩ
10 µF, 6.3 V
C4
1000 pF
Capacitor
MANUFACTURER
10 kΩ
C1, C2, C3
C5
PART NUMBER
0.1 µF
C6
4.7 µF, 6.3 V
GRM21BR60J475KA11L
Murata
C7, C8
10 µF, 6.3 V
GRM21BR70J106KE76L
Murata
24
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Design Example 4
This design example describes a 3.3-VIN, LP DDR3 Configuration
R1
10 kW
TPS51200
1
VVDDQ = 1.2 V
R2
10 kW
VVLDOIN = VVDDQ = 1.2 V
C7
10 mF
C2
10 mF
3.3 VIN
R3
100 kW
2
VLDOIN PGOOD
9
3
VO
GND
8
4
PGND
EN
7
5
VOSNS REFOUT
6
C6
4.7 mF
PGOOD
C8
10 mF
VVTT = 0.6 V
C1
10 mF
VIN 10
REFIN
C4
1000 pF
C3
10 mF
SLP_S3
VTTREF
C5
0.1 mF
UDG-08031
Figure 28. 3.3-VIN, LP DDR3 Configuration
Design Example 4 List of Materials
REFERENCE
DESIGNATOR
R1, R2
R3
DESCRIPTION
Resistor
SPECIFICATION
GRM21BR70J106KE76L
Murata
100 kΩ
10 µF, 6.3 V
C4
1000 pF
Capacitor
MANUFACTURER
10 kΩ
C1, C2, C3
C5
PART NUMBER
0.1 µF
C6
4.7 µF, 6.3 V
GRM21BR60J475KA11L
Murata
C7, C8
10 µF, 6.3 V
GRM21BR70J106KE76L
Murata
25
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Design Example 5
This design example describes a 3.3-VIN, DDR3 Tracking Configuration
R1
10 kW
TPS51200
1
VVDDQ = 1.5 V
R2
10 kW
VVLDOIN = VVDDQ = 1.5 V
C7
10 mF
C2
10 mF
3.3 VIN
R3
100 kW
2
VLDOIN PGOOD
9
3
VO
GND
8
4
PGND
EN
7
5
VOSNS REFOUT
6
C6
4.7 mF
PGOOD
C8
10 mF
VVTT = 0.75 V
C1
10 mF
VIN 10
REFIN
C4
1000 pF
C3
10 mF
VTTREF
C5
0.1 mF
UDG-08032
Figure 29. 3.3-VIN, DDR3 Tracking Configuration
Design Example 5 List of Materials
REFERENCE
DESIGNATOR
R1, R2
R3
DESCRIPTION
Resistor
SPECIFICATION
GRM21BR70J106KE76L
Murata
100 kΩ
10 µF, 6.3 V
C4
1000 pF
Capacitor
MANUFACTURER
10 kΩ
C1, C2, C3
C5
PART NUMBER
0.1 µF
C6
4.7 µF, 6.3 V
GRM21BR60J475KA11L
Murata
C7, C8
10 µF, 6.3 V
GRM21BR70J106KE76L
Murata
26
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Design Example 6
This design example describes a 3.3-VIN, LDO Configuration.
R1
10 kW
TPS51200
2.5 V
1
R2
3.86 kW
VVLDOIN = VVLDOREF = 2.5 V
C7
10 mF
C2
10 mF
3.3 VIN
R3
100 kW
2
VLDOIN PGOOD
9
3
VO
GND
8
4
PGND
EN
7
5
VOSNS REFOUT
6
C6
4.7 mF
PGOOD
C8
10 mF
VVLDO = 1.8 V
C1
10 mF
VIN 10
REFIN
C4
1000 pF
C3
10 mF
ENABLE
REFOUT
C5
0.1 mF
UDG-08033
Figure 30. 3.3-VIN, LDO Configuration
Design Example 6 List of Materials
REFERENCE
DESIGNATOR
DESCRIPTION
R1
R2
SPECIFICATION
MANUFACTURER
GRM21BR70J106KE76L
Murata
10 kΩ
Resistor
3.86 kΩ
R3
100 kΩ
C1, C2, C3
10 µF, 6.3 V
C4
C5
PART NUMBER
1000 pF
Capacitor
0.1 µF
C6
4.7 µF, 6.3 V
GRM21BR60J475KA11L
Murata
C7, C8
10 µF, 6.3 V
GRM21BR70J106KE76L
Murata
27
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Design Example 7
This design example describes a 3.3-VIN, DDR3 Configuration with LFP.
R1
10 kW
TPS51200
1
VVDDQ = 1.5 V
R2
10 kW
VIN 10
REFIN
C4
1000 pF
R3
100 kW
VVLDOIN = VVDDQ = 1.5 V
C7
10 mF
3.3 VIN
2
VLDOIN PGOOD
9
3
VO
GND
8
4
PGND
EN
7
5
VOSNS REFOUT
6
C6
4.7 mF
PGOOD
C8
10 mF
VVTT = 0.75 V
R4(1)
C1
10 mF
C2
10 mF
C3
10 mF
SLP_S3
VTTREF
C5
0.1 mF
C9(1)
UDG-08034
Figure 31. 3.3-VIN, DDR3 Configuration with LFP
Design Example 7 List of Materials
REFERENCE
DESIGNATOR
DESCRIPTION
R1, R2
R3
R4
SPECIFICATION
PART NUMBER
MANUFACTURER
GRM21BR70J106KE76L
Murata
4.7 µF, 6.3 V
GRM21BR60J475KA11L
Murata
10 µF, 6.3 V
GRM21BR70J106KE76L
Murata
10 kΩ
Resistor
100 kΩ
(1)
C1, C2, C3
10 µF, 6.3 V
C4
1000 pF
C5
Capacitor
C6
C7, C8
C9
(1)
0.1 µF
(1)
The values of R4 and C9 should be chosen to reduce the parasitic effect of the trace (between VO and the output MLCCs) and the
output capacitors (ESR and ESL).
28
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PACKAGE OPTION ADDENDUM
www.ti.com
9-Jun-2008
PACKAGING INFORMATION
Orderable Device
Status (1)
Package
Type
Package
Drawing
Pins Package Eco Plan (2)
Qty
TPS51200DRCR
ACTIVE
SON
DRC
10
3000 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
TPS51200DRCRG4
ACTIVE
SON
DRC
10
3000 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
TPS51200DRCT
ACTIVE
SON
DRC
10
250
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
TPS51200DRCTG4
ACTIVE
SON
DRC
10
250
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
Lead/Ball Finish
MSL Peak Temp (3)
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in
a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check
http://www.ti.com/productcontent for the latest availability information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements
for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered
at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and
package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS
compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame
retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder
temperature.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is
provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the
accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take
reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on
incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited
information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI
to Customer on an annual basis.
Addendum-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
16-May-2008
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
Package Package Pins
Type Drawing
SPQ
Reel
Reel
Diameter Width
(mm) W1 (mm)
A0 (mm)
B0 (mm)
K0 (mm)
P1
(mm)
W
Pin1
(mm) Quadrant
TPS51200DRCR
SON
DRC
10
3000
330.0
12.4
3.3
3.3
1.1
8.0
12.0
Q2
TPS51200DRCT
SON
DRC
10
250
180.0
12.4
3.3
3.3
1.1
8.0
12.0
Q2
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
16-May-2008
*All dimensions are nominal
Device
Package Type
Package Drawing
Pins
SPQ
Length (mm)
Width (mm)
Height (mm)
TPS51200DRCR
SON
DRC
10
3000
346.0
346.0
29.0
TPS51200DRCT
SON
DRC
10
250
190.5
212.7
31.8
Pack Materials-Page 2
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