ZXMN2A04DN8 DUAL 20V N-CHANNEL ENHANCEMENT MODE MOSFET SUMMARY V(BR)DSS= 20V; RDS(ON)= 0.025 ; ID= 7.7A DESCRIPTION This new generation of TRENCH MOSFETs from Zetex utilizes a unique structure that combines the benefits of low on-resistance with fast switching speed. This makes them ideal for high efficiency, low voltage, power management applications. FEATURES SO8 • Low on-resistance • Fast switching speed • Low threshold • Low gate drive • Low profile SOIC package APPLICATIONS • DC - DC converters • Power management functions • Disconnect switches • Motor control ORDERING INFORMATION DEVICE REEL TAPE WIDTH QUANTITY PER REEL ZXMN2A04DN8TA 7’‘ 12mm 500 units ZXMN2A04DN8TC 13’‘ 12mm 2500 units PINOUT DEVICE MARKING ZXMN 2A04D Top view ISSUE 1 - JULY 2004 1 SEMICONDUCTORS ZXMN2A04DN8 ABSOLUTE MAXIMUM RATINGS PARAMETER SYMBOL LIMIT UNIT Drain-Source Voltage V DSS 20 V V GS ⫾12 V ID 7.7 A (V GS =10V; T A =70°C) (b) (d) 6.2 A (V GS =10V; T A =25°C) (a) (d) 5.9 A Gate Source Voltage Continuous Drain Current (V GS =10V; T A =25°C) (b) (d) Pulsed Drain Current (c) I DM 38 A Continuous Source Current (Body Diode) (b) IS 2.9 A Pulsed Source Current (Body Diode) (c) I SM 38 A Power Dissipation at T A =25°C (a) (d) PD 1.25 W Linear Derating Factor Power Dissipation at T A =25°C (a) (e) Linear Derating Factor 10 mW/°C PD 1.8 W 14 mW/°C Power Dissipation at T A =25°C (b) (d) PD Linear Derating Factor T j :T stg Operating and Storage Temperature Range 2.1 W 17 mW/°C -55 to +150 °C THERMAL RESISTANCE PARAMETER SYMBOL VALUE UNIT Junction to Ambient (a) (d) R ⍜JA 100 °C/W Junction to Ambient (b) (e) R ⍜JA 70 °C/W (b) (d) R ⍜JA 60 °C/W Junction to Ambient NOTES: (a) For a dual device surface mounted on 25mm x 25mm FR4 PCB with coverage of single sided 1oz copper in still air conditions. (b) For a dual device surface mounted on FR4 PCB measured at t ⱕ10 sec. (c) Repetitive rating 25mm x 25mm FR4 PCB, D=0.02 pulse width=300µs - pulse width limited by maximum junction temperature. Refer to Trnsient Thermal Impedance Graph. (d) For a dual device with one active die. (e) For dual device with 2 active die running at equal power. ISSUE 1 - JULY 2004 SEMICONDUCTORS 2 ZXMN2A04DN8 CHARACTERISTICS ISSUE 1 - JULY 2004 3 SEMICONDUCTORS ZXMN2A04DN8 ELECTRICAL CHARACTERISTICS (at TA = 25°C unless otherwise stated) PARAMETER SYMBOL MIN. 20 TYP. MAX. UNIT CONDITIONS STATIC V I D =250A, V GS =0V Drain-Source Breakdown Voltage V (BR)DSS Zero Gate Voltage Drain Current I DSS 0.5 A Gate-Body Leakage I GSS 100 nA V I =250A, V DS = V GS 0.025 Ω V GS =4.5V, I D =5.9A 0.035 ⍀ V GS =2.5V, I D =5A V DS =10V,I D =5.9A Gate-Source Threshold Voltage V GS(th) Static Drain-Source On-State R DS(on) 0.7 Resistance (1) Forward Transconductance (3) g fs 40 S V DS =20V, V GS =0V V GS =⫾12V, V DS =0V D DYNAMIC (3) Input Capacitance C iss 1880 pF Output Capacitance C oss 506 pF Reverse Transfer Capacitance C rss 386 pF V DS =10V, V GS =0V, f=1MHz SWITCHING (2) (3) Turn-On Delay Time t d(on) 7.9 ns Rise Time tr 14.8 ns Turn-Off Delay Time t d(off) 50.5 ns Fall Time tf 30.6 ns Gate Charge Qg 22.1 nC Total Gate Charge Qg 40.5 nC Gate-Source Charge Q gs 5.6 nC V DS =10V,V GS =4.5V, Gate-Drain Charge Q gd 8.0 nC I D =5.9A V SD 0.85 V DD =10V, I D =1A R G ≅6⍀, V GS =5V V DS =15V,V GS =5V, I D =3.5A SOURCE-DRAIN DIODE Diode Forward Voltage (1) 0.95 V T J =25°C, I S =5.1A, V GS =0V Reverse Recovery Time (3) t rr Reverse Recovery Charge (3) Q rr 18.0 ns T J =25°C, I F =1.9A, 8.9 nC di/dt= 100A/µs NOTES: (1) Measured under pulsed conditions. Width=300s. Duty cycle ⱕ 2% . (2) Switching characteristics are independent of operating junction temperature. (3) For design aid only, not subject to production testing. ISSUE 1 - JULY 2004 SEMICONDUCTORS 4 ZXMN2A04DN8 TYPICAL CHARACTERISTICS ISSUE 1 - JULY 2004 5 SEMICONDUCTORS ZXMN2A04DN8 TYPICAL CHARACTERISTICS ISSUE 1 - JULY 2004 SEMICONDUCTORS 6 ZXMN2A04DN8 PACKAGE OUTLINE PACKAGE DIMENSIONS INCHES ⍜ MIN MAX MIN MAX A 0.053 0.069 1.35 1.75 A1 0.004 0.010 0.10 0.25 D 0.189 0.197 4.80 5.00 H 0.228 0.244 5.80 6.20 E 0.150 0.157 3.80 4.00 L 0.016 0.050 0.40 1.27 L H D E MILLIMETERS DIM Pin 1 A c e 0.050 BSC 1.27 BSC b e A1 Seating Plane CONTROLLING DIMENSIONS ARE IN INCHES APPROX IN MILLIMETRES b 0.013 0.020 0.33 0.51 c 0.008 0.010 0.19 0.25 ⍜ 0⬚ 8⬚ 0⬚ 8⬚ h 0.010 0.020 0.25 0.50 © Zetex Semiconductors plc 2004 Europe Americas Asia Pacific Corporate Headquarters Zetex GmbH Streitfeldstraße 19 D-81673 München Germany Zetex Inc 700 Veterans Memorial Hwy Hauppauge, NY 11788 USA Zetex (Asia) Ltd 3701-04 Metroplaza Tower 1 Hing Fong Road, Kwai Fong Hong Kong Zetex plc Lansdowne Road, Chadderton Oldham, OL9 9TY United Kingdom Telefon: (49) 89 45 49 49 0 Fax: (49) 89 45 49 49 49 [email protected] Telephone: (1) 631 360 2222 Fax: (1) 631 360 8222 [email protected] Telephone: (852) 26100 611 Fax: (852) 24250 494 [email protected] Telephone (44) 161 622 4444 Fax: (44) 161 622 4446 [email protected] These offices are supported by agents and distributors in major countries world-wide. This publication is issued to provide outline information only which (unless agreed by the Company in writing) may not be used, applied or reproduced for any purpose or form part of any order or contract or be regarded as a representation relating to the products or services concerned. The Company reserves the right to alter without notice the specification, design, price or conditions of supply of any product or service. For the latest product information, log on to www.zetex.com ISSUE 1 - JULY 2004 7 SEMICONDUCTORS