Efficiency through technology
RELIABILITY REPORT
1/06
Power Semiconductor Devices
January 2004 - December 2005
IXYS Corporation
3540 Bassett Street
Santa Clara CA 95054
USA
IXDN0007
Published 2006
IXYS Semiconductor GmbH
Edisonstrasse 15
D-68623 Lampertheim
Germany
Humidity Test
QUALITY AND RELIABILITY
Failure Modes: Degradation of electrical leakage
characteristics due to moisture penetration into plastic
packages.
Sensitive Parameters: BVDSS, BVCES, VDRRM, VRRM,
IDSS, ICES, IDRM, IRRM, IGSS, IGES,
VTH.
IXYS is committed to setting a new standard for
excellence in Power Semiconductors. Reflecting our
dedication to industry leadership in the manufacture of
medium to high power devices, reliability has
assumed a primary position in raw material selection,
design, and process technology.
Reliability utilizes information derived from applied
research, engineering design, analysis of field
applications and accelerated stress testing and
integrates this knowledge to optimize device design
and manufacturing processes.
All areas that impact reliability have received
considerable attention in order to achieve our goal to
be the # 1 Reliability Supplier of Power
Semiconductor products. We believe IXYS products
should be the most reliable components in your
system.
We have committed significant resources to
continuously improve and optimize our device design,
wafer fab processes, assembly processes and test
capabilities. As a result of this investment, IXYS has
realized a dramatic improvement in reliability
performance on all standardized tests throughout the
product line.
Excellence in product reliability is “built-in”, not testedin. Moreover, it requires a total systems approach,
involving all parties: from design to raw materials to
manufacturing.
In addition to qualifying new products released to the
market, life and environmental tests are periodically
performed on standard products to maintain feedback
on assembly and fabrication performance to assure
product reliability. Further information on reliability of
power devices is provided on www.ixys.com.
Power Cycle
Failure Modes: Thermal fatigue of silicon-metal and
metal-metal interfaces due to heating and cooling can
cause
thermal
and
electrical
performance
degradation.
Sensitive Parameters: RthJC, RDS(on), VCE(sat), VT, VF, IDSS,
ICES, IDRM, IRRM, BVDSS, BVCES, VDRRM,
VRRM.
TERMS IN TABLES
SUMMARY TABLES 1 AND 2:
AF: acceleration factor
AF = exp { Ea *[ (T2 -T1) / ( T2 * T1 ) ] / k }
(1)
Ea: activation energy; @ HTRB Ea = 1.0 eV
@ HTGB Ea = 0.4 eV
-5
k: Boltzmann’s constant 8.6·10 eV/K
T1: abs. application junction temperature (273+Tj) K
T2: abs. test junction temperature (273+Tj) K
UCL: upper confidence limit (60%)
Total Failures @ 60% UCL:
RELIABILITY TESTS
High Temperature Reverse Bias (HTRB)
N = r + dr
Failure Modes: Gradual degradation of break-down
characteristics due to presence of foreign materials
and polar/ionic contaminants disturbing the electric
field termination structure.
Sensitive Parameters: BVDSS, BVCES, VDRRM, VRRM,
IDSS, ICES, IDRM, IRRM, VTH.
(2)
r: number of failed devices
dr: additional term, depending on both r and UCL
MTTF: Mean Time To Failures = 1/Failure Rate
9
FIT: 1 FIT = 1 failure / 10 hrs
High Temperature Gate Bias (HTGB)
TABLES 3:
Failure Modes: Rupture of the gate oxide due to
localized thickness variations, structural anomalies,
particulates in the oxide, channel inversion due to
presence of mobile ions in the gate oxide.
Sensitive Parameters: IGSS, IGES,VTH, IDSS, ICES.
∆T: max Tj - min Tj during Test
DEFINITION OF FAILURE
Failure criteria are defined according to IEC 60747
standard series
Temperature Cycle
Failure modes: Thermal fatigue of silicon-metal and
metal-metal interfaces due to heating and cooling,
causing thermal and electrical performance degradation.
Sensitive Parameters: RthJC, RDS(on), VCE(sat), VT, VF.
2
Summary of Tables 1A - 1J: HTRB
Failure Rate [FIT] 125°C, 60% UCL
Failure Rate [FIT] 90°C, 60% UCL
Total Lots Tested
Total Devices Tested
Total
Actual
Failures
60% UCL {eq. (2)}
Total Equivalent Device Hours
@ 125°C {AF eq. (1)}
MTTF
125°C 60% UCL
(Years)
90°C 60% UCL
Table 1A
Table 1B
Table 1C
Table 1D
Table 1E
Table 1F
Table 1G
Table 1H
MOSFET/IGBT
MOSFET/IGBT
Thyr./Diode
Controller/
FRED
Schottky
Thyr./Diode
ISOPLUS
discrete device *)
Module
Module
Rec. Bridge*)
*)
Diode*)
discrete device*)
456
27
144
4167
1
2,00
49821
2983
14
123
1
2,00
8213
492
26
279
1
2,00
8142
488
15
150
0
0,92
3142
188
26
450
0
0,92
12995
778
17
310
1
2,00
2380
143
15
250
0
0,92
15
289
0
-
4390560
251
4185
40144
2
38
243512
14
232
113000
14
234
292800
36
607
153901
9
147
386499
48
801
314282
-
Summary of Table 2A - 2C: HTGB
Failure Rate [FIT] 125°C, 60% UCL
Failure Rate [FIT] 90°C, 60% UCL
Total Lots Tested
Total Devices Tested
Total
Actual
Failures
60% UCL {eq. (2)}
Total Equivalent Device Hours
@ 125°C {AF eq. (1)}
MTTF
125°C 60% UCL
(Years)
90°C 60% UCL
Table 2A
Table 2B
Table 2C
MOSFET/IGBT
MOSFET/IGBT
ISOPLUS
discrete device *)
Module
263
85
118
3471
0
0,92
21140
6819
11
110
0
0,92
5
95
0
-
3501200
434
1347
43520
5
17
132560
-
*) including ISOPLUS
3
Summary of Tables 3A - 3H: Power Cycle
Total Lots Tested
Total Devices Tested
Total Failures
Total Device Cycles
Table 3A
Table 3C
Table3D
Table 3E
Table 3F
Table 3G
Table 3H
MOSFET/IGBT
Thyr./Diode
Controller/
FRED
Schottky
Thyr./Diode
Isoplus
discrete device *)
Module
Rec. Bridge*)
*)
Diode*)
discrete device*)
19
440
0
3920000
6
60
0
1150000
7
70
0
310000
10
180
0
520000
6
120
0
640000
8
140
0
480000
3
60
0
500000
Summary of Tables 4A - 4J: Temperature Cycle
Total Lots Tested
Total Devices Tested
Total Failures
Total Device Cycles
Table 4A
Table 4B
Table 4C
Table4D
Table 4E
Table 4F
Table 4G
Table 4H
Table 4J
MOSFET/IGBT
MOSFET/IGBT
Thyr./Diode
Controller/
FRED
Schottky
Thyr./Diode
Isoplus
Breakover
discrete device *)
Module
Module
Rec. Bridge*)
*)
Diode*)
discrete device*)
27
706
0
150600
13
130
0
9000
27
315
0
25000
17
170
1
11200
25
410
0
30400
19
390
0
32000
24
408
0
24900
25
530
0
44000
Diode
Summary of Tables 5A - 5H: Humidity Test
Total Lots Tested
Total Devices Tested
Total Failures
Total Device Hours
Table 5A
Table 5C
Table5D
Table 5E
Table 5F
Table 5G
Table 5H
Table 5J
MOSFET/IGBT
Thyr./Diode
Controller/
FRED
Schottky
Thyr./Diode
Isoplus
Breakover
discrete device *)
Module
Rec. Bridge*)
*)
Diode*)
discrete device*)
4
90
0
6720
5
50
0
33360
5
50
0
16720
7
128
0
8448
2
40
1
3840
2
40
0
1920
*) including ISOPLUS
4
Diode
5
100
0
5760
4
80
0
3840
5
100
0
6000
HTRB (Tables 1A .. 1J)
TABLE 1A: MOSFET/IGBT single device
Date Code
# Part Number
or
Test #
1 IRF450
CK0420
2 IXBH40N160
1047
3 IXBH9N160G
1103
4 IXBP5-N160G
1337
5 IXDH20N120
1436
6 IXDH30N120D1
1007
7 IXDN55N120D1
1393
8 IXER35N120D1
1400
9 IXFH12N100F
N/A
10 IXFH12N80P
SK0524
11 IXFH13N50
CK0539
12 IXFH15N80
MP0510
13 IXFH20N60
SK0446
14 IXFH20N60
MK0537
15 IXFH20N60
SK0544
16 IXFH21N50
SK0407
17 IXFH21N50Q
MP0423
18 IXFH22N50P
N/A
19 IXFH23N80Q
SK0401
20 IXFH23N80Q
MP0510
21 IXFH24N50
MP0419
22 IXFH26N50Q
MP0431
23 IXFH26N50Q
MK0532
24 IXFH26N60Q
SK0405
25 IXFH26N60Q
SP0403
26 IXFH26N60Q
SK0446
27 IXFH26N60Q
SK0446
28 IXFH26N60Q
SK0451
29 IXFH26N90
AP0538
30 IXFH32N50
SK0531
31 IXFH36N50P
SP0436
32 IXFH40N30Q
SP0543
33 IXFH44N50P
SP0518
34 IXFH48N50Q
SP0434
35 IXFH50N20
SK0538
36 IXFH69N30P
SK0527
37 IXFH6N100Q
TK0401
38 IXFH80N10Q
SK0416
39 IXFH80N10Q
SK0510
40 IXFH9N80
CP0423
41 IXFK26N90
AP0517
42 IXFK27N80
CP0441
43 IXFK30N100Q2
SP0446
44 IXFK34N80
SP0345
45 IXFK34N80
AP0526
46 IXFK48N50
SP0417
47 IXFK64N50P
SP0518
48 IXFN48N50
SP0417
49 IXFR36N60P
SP0517
50 IXFX21N100Q
SP0436
51 IXFX27N80Q
SP0419
52 IXFX34N80
SP0422
53 IXFX38N80Q2
SP0403
54 IXFX48N50Q
SK0543
55 IXFX48N50Q
ZP0545
56 IXFX48N60P
SP0518
57 IXFX52N60Q2
SP0541
58 IXGH160N30P
SP0433
Voltage
[V]
400
1280
1280
1280
960
960
960
960
720
640
400
640
480
480
480
400
400
400
640
640
400
400
400
480
480
480
480
480
720
400
400
240
400
400
160
240
800
80
80
640
720
640
800
640
640
400
400
400
480
800
640
640
640
400
400
480
480
240
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
150
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
1000
168
168
168
168
168
168
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
20
20
20
20
20
10
20
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
5
Failures
0
0
0
0
0
0
0
0
0
0
1
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
30000
20000
3360
3360
3360
3360
1680
3360
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
IGSS @ 1000h
TABLE 1A (cont'd): MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
59 IXGH240N30PC
SP0537
240
60 IXGH2N100
TP0450
800
61 IXGH30N60A
CP0423
480
62 IXGH40N60C2
CP0433
480
63 IXGH96N30P
SP0433
240
64 IXGP86N30PB
SK0535
240
65 IXGQ86N30PB
K0543
240
66 IXGQ86N30PBD1
SK0534
240
67 IXGQ86N30PCD1
SK0534
240
68 IXGR40N60C2
SP0337
480
69 IXKC20N60C
1018
480
70 IXKR40N60C
987
480
71 IXLF19N250
1387
1800
72 IXTA36N30P
SK0509
240
73 IXTA36N30P
K0526
240
74 IXTA36N30P
K0537
240
75 IXTA50N25T
K545
200
76 IXTA60N20T
K545
160
77 IXTA75N10P
K0531
80
78 IXTH04N100P
TPN/A
800
79 IXTH04N100P
TPN/A
800
80 IXTH20N60
MP0419
480
81 IXTH75N15
SK0402
120
82 IXTH75N15
SK0415
120
83 IXTH75N15
SK0425
120
84 IXTH75N15
SK0439
120
85 IXTH75N15
SK0442
120
86 IXTH75N15
SK0442
120
87 IXTH75N15
SK0442
120
88 IXTH75N15
SK0450
120
89 IXTH75N15
SK0515
120
90 IXTH88N30P
SK0348
240
91 IXTK102N30P
SS0349
240
92 IXTK34N80
SP0546
640
93 IXTK62N25
SS0348
200
94 IXTK62N25
SP0414
200
95 IXTK62N25
SS0420
200
96 IXTK62N25
SS0428
200
97 IXTK62N25
SS0444
200
98 IXTK62N25
SS0516
200
99 IXTK62N25
SS0517
200
100 IXTK62N25
SS0517
200
101 IXTK62N25
SS0524
200
102 IXTK80N25
SS0347
200
103 IXTK82N25P
SS0403
200
104 IXTK88N30P
SS0403
240
105 IXTN79N20
1140
160
106 IXTP08N100P
SK0448
800
107 IXTQ100N25P
SK0433
200
108 IXTQ22N60P
SK0539
480
109 IXTQ23N60Q
MK0421
480
110 IXTQ26N50P
SK0435
400
111 IXTQ30N60P
SK0517
480
112 IXTQ36N30P
SK0405
240
113 IXTQ42N25P
SK0405
200
114 IXTQ50N20P
SK0405
160
115 IXTQ62N15P
SK0405
120
116 IXTQ64N25P
SK0405
200
117 IXTQ64N25P
SK0535
200
118 IXTQ69N30P
SK0425
240
119 IXTQ69N30P
SK0535
240
120 IXTQ74N20P
SK0403
160
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
168
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
6
Sample
Size
30
30
27
30
30
30
30
30
30
30
20
20
20
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
10
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
30000
30000
27000
30000
30000
30000
30000
30000
30000
30000
20000
20000
20000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
1680
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
TABLE 1A (cont'd): MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Temp.
Test #
[V]
[°C]
121 IXTQ74N20P
SK0405
160
150
122 IXTQ74N20P
SK0515
160
125
123 IXTQ75N10P
SK0405
80
125
124 IXTQ80N28T
SK0519
224
125
125 IXTQ80N28T
SK0518
224
125
126 IXTQ82N25P
SW0435
200
125
127 IXTQ82N25P
SK0431
200
125
128 IXTQ82N25P
SK0450
200
125
129 IXTQ82N25P
SS0506
200
125
130 IXTQ82N25P
SK0514
200
125
131 IXTQ82N25P
SK0519
200
125
132 IXTQ82N25P
SK0519
200
125
133 IXTQ82N25P
SK0538
240
125
134 IXTQ82N27P
SK0449
216
125
135 IXTQ88N30P
SK0402
240
125
136 IXTQ88N30P
SK0515
240
125
137 IXTQ88N30P
K0525Z
240
125
138 IXTQ88N30P
SK0538
240
125
139 IXTQ96N15P
SK0402
120
125
140 IXTQ96N15P
SK0449
120
125
141 IXTQ96N15P
SK0513
120
125
142 IXTQ96N20P
SK0403
160
125
143 IXTQ96N20P
SK0405
160
150
144 IXUN350N10
1354
80
125
Time
[hrs]
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
Sample
Size
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
10
Failures
TABLE 1B: MOSFET/IGBT Module
Date Code
# Part Number
or
Test #
1 MKI100-12F8
932
2 MKI50-12F7
932
3 MKI75-06A7T
1368
4 MUBW15-12A7
964
5 MUBW25-06A6K
1240
6 MUBW30-12E6K
1127
7 MUBW30-12E6K
1127
8 MUBW35-12E7
1242
9 MUBW50-06A7T
1144
10 MWI25-12E7
1013
11 MWI50-12E7
1380
12 MWI60-06G6K
1347
13 VII130-06P1
1274
14 VMM90-09F
1201
Time
[hrs]
1000
1000
168
120
1000
168
168
168
168
168
168
500
168
168
Sample
Size
5
5
8
10
10
10
10
9
10
10
6
10
10
10
Failures
Voltage
[V]
960
960
480
1120
480
960
1120
1120
480
960
960
480
480
720
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
7
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
10000
Remark
Device Hours
Remark
[hrs]
5000
I_CES @1000h (diode)
5000
1344
1200
10000
1680
1680
1512
1680
1680
1008
5000
1680
1680
TABLE 1C: Thyristor/Diode Module
Date Code
# Part Number
or
Test #
1 MCC 161-22
1416
2 MCC122-16
1023
3 MCC122-16
1023
4 MCC132-16
1509
5 MCC162-18
874
6 MCC162-16
1175
7 MCC162-16
922
8 MCC26-16
912
9 MCC310-16
870
10 MCC310-16
969
11 MCC312-16
1170
12 MCC44-18
1027
13 MCC44-18
1359
14 MCC44-18
1359
15 MCC44-18
1232A
16 MCC44-18
1232B
17 MCC56-18
888
18 MCC56-16
1246
19 MCC95-16
1421
20 MCO100-16
1156
21 MCO25-16
1155
22 MCO50-16
1154
23 MDD26-16
1173
24 MDD26-16
1173
25 MDD95-16
971
26 MDD95-16
971
Voltage
[V]
1540
1120
1120
1120
1260
1120
1120
1120
1120
1120
1120
1260
1260
1260
1260
1260
1260
1120
1120
1120
1120
1120
1120
1120
1120
1120
Temp.
[°C]
125
125
130
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
150
150
125
Time
[hrs]
168
168
1000
168
168
168
168
168
168
168
168
1000
168
168
1000
1000
168
168
1000
1000
1000
1000
168
1000
1000
168
Sample
Size
9
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
20
20
10
10
10
10
10
Failures
TABLE 1D: Controller/Rectifier Bridge
Date Code
# Part Number
or
Test #
1 MMO75-16io1
1379
2 MMO75-17AB
1002
3 VBO105-18NO7
1090
4 VBO25-16AO2
1057
5 VBO40-16NO6
1014
6 VHF36-16io5
1176
7 VHFD37-16
1184
8 VUO121-16NO1
999
9 VUO121-16NO1
1352
10 VUO34-18
907
11 VUO36-16NO8
1252
12 VUO36-16NO8
1252
13 VUO52 (DIL)
1010
14 VUO52-18N01
1286
15 VWO140-16io1
1420
Voltage
[V]
1120
1190
1260
1120
1120
1120
1120
1120
1120
1260
1120
1120
840
1120
1120
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
150
125
125
125
125
Time
[hrs]
168
168
168
168
168
168
168
1000
1000
1000
1000
168
1000
168
168
Sample
Size
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
Failures
8
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
1512
1680
10000
1680
1680
1680
1680
1680
1680
1680
1680
10000
1680
1680
10000
10000
1680
1680
10000
20000
20000
10000
1680
10000
10000
1680
Device Hours
[hrs]
1680
1680
1680
1680
1680
1680
1680
10000
10000
10000
10000
1680
10000
1680
1680
Remark
I_R @1000h
Remark
TABLE 1E: FRED
#
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
DPG60C300QB
DPG60C400QB
DSEC240-04A
DSEC240-06A
DSEC240-06A
DSEC30-06A
DSEC59-02AQ
DSEC59-03AQ
DSEC60-03AR
DSEC60-04A
DSEE15-12CC
DSEI20-12A
DSEI2x101-06A
DSEI2x61-12P
DSEP12-12A
DSEP15-12CR
DSEP15-12CR
DSEP29-06B
DSEP30-06A
DSEP30-06A
DSEP30-06CR
DSEP60-12A
DSEP8-02A
MEK300-06"DA"
MEK95-06 DA
MEO500-06DA
Date Code
or
Test #
1481
1446
1148
1215
1215
1049
1159
1266
1121
889
1220
1169
1235
1004
960
1168
1168
1263
1114
1114
902
1118
1362
1381
1312
1279
Voltage
[V]
240
320
320
480
480
480
160
240
240
320
480
960
480
960
960
960
960
480
600
480
480
960
160
480
480
480
Temp.
[°C]
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
150
125
125
125
125
125
125
125
125
125
125
Time
[hrs]
1000
1000
168
1000
1000
168
1000
1000
168
168
1000
168
168
168
168
1000
168
168
168
168
168
168
168
168
168
1000
Sample
Size
20
20
20
10
10
20
20
20
20
20
20
20
10
10
20
20
20
20
20
20
20
20
20
10
10
10
Failures
Date Code
or
Test #
984
985
1143
1225
1065
1467
1401
1238
1050
961
1256
1187
1377
1111
1261
998
910
Voltage
[V]
144
200
100
200
100
100
45
45
20
45
150
200
80
80
36
48
64
Temp.
[°C]
125
125
125
125
125
125
125
125
100
125
125
125
125
125
100
100
125
Time
[hrs]
168
168
168
1000
168
168
1000
1000
168
168
1000
1000
168
1000
168
1000
1000
Sample
Size
20
20
20
10
10
10
20
20
20
20
20
20
20
20
20
20
20
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
20000
20000
3360
10000
10000
3360
20000
20000
3360
3360
20000
3360
1680
1680
3360
20000
3360
3360
3360
3360
3360
3360
3360
1680
1680
10000
Remark
Device Hours
[hrs]
3360
3360
3360
10000
1680
1680
20000
20000
3360
3360
20000
20000
3360
20000
3360
20000
20000
Remark
TABLE 1F: Schottky Diode
#
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
DGS15-018CS
DGS19-025CS
DSS160-01A
DSS2x101-02A
DSS2x41-01A
DSS2x41-01A
DSS31-0045A
DSS61-0045A
DSSK48-0025B
DSSK60-0045A
DSSK60-015A
DSSK60-02A
DSSK70-008A
DSSK70-008AR
DSSK80-0045B
DSSK80-006BR
DSSS35-008AR
9
0
0
0
0
0
0
0
0
0
0
0
1
0
0
0
0
0
I_R @1000h
TABLE 1G: Thyristor/Diode single device
Date Code
# Part Number
or
Voltage
Test #
[V]
1 CS19-12ho1S
1366
840
2 CS20-14io1
1364
980
3 CS30-16io1
1001
1120
4 DSA17-16A
1092
1120
5 DSA17-16A
1195
1120
6 DSA17-16A
1195
1120
7 DSA9-18F
1307
1260
8 DSAI35-16A
900
1120
9 DSI30-16A
1319
1120
10 DSI45-16AR
1264
1120
11 DSI75-16D
1164
1120
12 DSP25-16A
877
1120
13 DSP25-16A
886
1120
14 DSP45-16A
1167
1120
15 DSP8-08A
1146
560
Temp.
[°C]
125
125
125
150
150
150
125
150
150
150
150
150
150
125
150
Time
[hrs]
1000
1000
168
168
1000
1000
168
168
168
168
168
168
168
168
168
Sample
Size
20
20
20
10
20
20
10
10
20
10
10
20
20
20
20
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
20000
20000
3360
1680
20000
20000
1680
1680
3360
1680
1680
3360
3360
3360
3360
Remark
Device Hours
[hrs]
3360
20000
20000
3360
3360
1680
20000
20000
20000
20000
19000
3360
20000
20000
20000
Remark
Device Hours
[hrs]
3360
3360
3360
Remark
TABLE 1H: ISOPLUS
Date Code
or
Test #
1121
1220
1168
1168
902
1264
1111
910
1021
1291
977
1400
1018
987
1387
Voltage
[V]
240
480
960
960
480
1120
80
64
840
1120
1120
960
480
480
1800
Temp.
[°C]
125
125
150
125
125
150
125
125
125
125
125
125
125
125
125
Time
[hrs]
168
1000
1000
168
168
168
1000
1000
1000
1000
1000
168
1000
1000
1000
Sample
Size
20
20
20
20
20
10
20
20
20
20
19
20
20
20
20
Failures
TABLE 1J: Breakover Diode
Date Code
# Part Number
or
Test #
1 IXBOD1-08
1085
2 IXBOD1-08
1248
3 IXBOD1-10
868
Voltage
[V]
640
640
800
Temp.
[°C]
125
125
125
Time
[hrs]
168
168
168
Sample
Size
20
20
20
Failures
#
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
Part Number
DSEC60-03AR
DSEE15-12CC
DSEP15-12CR
DSEP15-12CR
DSEP30-06CR
DSI45-16AR
DSSK70-008AR
DSSS35-008AR
FBS10-12SCC
FUO22-16N
FUO50-16N
IXER35N120D1
IXKC20N60C
IXKR40N60C
IXLF19N250
10
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
HTGB (Tables 2A .. 2C)
TABLE 2A: MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Test #
[V]
1
IRF450
CK0420
16
2
IXDH30N120D1
1094
16
3
IXEH40N120D1
1482
16
4
IXFH10N80P
SP0514
16
5
IXFH12N80P
SK0524
16
6
IXFH13N50
CK0539
16
7
IXFH14N80P
SP0525
16
8
IXFH15N80
MP0510
16
9
IXFH20N60
SK0446
16
10 IXFH20N60
MK0537
16
11 IXFH20N80P
SK0524
16
12 IXFH21N50
SK0407
16
13 IXFH21N50Q
MP0423
16
14 IXFH22N50P
N/A
16
15 IXFH23N80Q
SK0401
16
16 IXFH23N80Q
MP0510
16
17 IXFH24N50
MP0419
16
18 IXFH26N50Q
MP0431
16
19 IXFH26N50Q
MK0532
16
20 IXFH26N60Q
SK0451
16
21 IXFH26N60Q
SK0604
16
22 IXFH36N50P
SP0436
16
23 IXFH40N30Q
SP0543
16
24 IXFH44N50P
SP0518
16
25 IXFH48N50Q
SP0434
16
26 IXFH50N20
SK0538
16
27 IXFH69N30P
SK0527
16
28 IXFH80N10Q
SK0416
16
29 IXFH80N10Q
SK0510
16
30 IXFH9N80
CP0423
16
31 IXFK34N80
AP0526
16
32 IXFK48N50
SP0417
16
33 IXFK64N50P
SP0518
16
34 IXFN48N50
SP0417
16
35 IXFR36N60P
SP0517
16
36 IXFX21N100Q
SP0436
16
37 IXFX27N80Q
SP0419
16
38 IXFX32N80P
SP0531
16
39 IXFX34N80
SP0422
16
40 IXFX38N80Q2
SP0403
16
41 IXFX48N50Q
SK0543
16
42 IXFX48N50Q
ZP0545
16
43 IXFX48N60P
SP0518
16
44 IXFX52N60Q2
TM3849
16
45 IXGD86N30PCD1
SK0529
16
46 IXGH160N30P
SP0433
24
47 IXGH240N30PC
SP0537
16
48 IXGH40N60C2
CP0433
16
49 IXGH96N30P
SP0433
24
50 IXGQ160N30P
SK0503
16
51 IXGQ160N30PB
SK0601
16
52 IXGR40N60C2
SP0337
16
53 IXKR40N60C
1287
16
54 IXLF19N250
1142
16
55 IXLF19N250
1387
16
56 IXLF19N250A
1292
16
57 IXTA36N30P
SK0509
16
58 IXTA36N30P
K0526
16
Temp.
[°C]
125
150
150
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
125
150
150
150
150
125
125
Time
[hrs]
1000
168
168
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
168
168
500
1000
1000
1000
11
Sample
Size
30
20
20
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
25
10
10
20
30
30
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
30000
3360
3360
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
4200
1680
5000
20000
30000
30000
Remark
TABLE 2A (cont`d): MOSFET/IGBT single device
Date Code
# Part Number
or
Voltage
Temp.
Test #
[V]
[°C]
59 IXTA36N30P
K0537
16
125
60 IXTA36N30P
SK0603
16
125
61 IXTA50N25T
K545
16
125
62 IXTA50N25T
SK0604
16
125
63 IXTA50N28T
K545
16
125
64 IXTA60N20T
K545
16
125
65 IXTA60N20T
SK0601
16
125
66 IXTA75N10P
K0531
16
125
67 IXTM1N100
TP0424
16
125
68 IXTM1N100
TP0424
16
125
69 IXTM1N100
TP0424
16
125
70 IXTH100N25P
SK0347
16
125
71 IXTH1785
TP0403
16
125
72 IXTH28N50Q
MK0352
16
125
73 IXTH75N15
SK0450
16
125
74 IXTH75N15
SK0515
16
125
75 IXTH88N30P
SK0348
16
125
76 IXTK102N30P
SS0349
16
125
77 IXTK34N80
SP0546
16
125
78 IXTK62N25
SS0444
16
125
79 IXTK62N25
SS0516
16
125
80 IXTK62N25
SS0524
16
125
81 IXTK82N25P
SS0403
16
125
82 IXTK88N30P
SS0403
16
125
83 IXTQ100N25P
SK0433
16
125
84 IXTQ22N60P
SK0539
16
125
85 IXTQ22N60P
SK0604
16
125
86 IXTQ23N60Q
MK0421
16
125
87 IXTQ26N50P
SK0435
16
125
88 IXTQ30N60P
SK0517
16
125
89 IXTQ36N30P
SK0405
16
125
90 IXTQ42N25P
SK0405
16
125
91 IXTQ50N20P
SK0405
16
125
92 IXTQ62N15P
SK0405
16
125
93 IXTQ64N25P
SK0405
16
125
94 IXTQ64N25P
SK0535
16
125
95 IXTQ69N30P
SK0450
16
125
96 IXTQ69N30P
SK0535
16
125
97 IXTQ74N20P
SK0403
16
125
98 IXTQ74N20P
SK0405
16
150
99 IXTQ74N20P
SK0515
16
125
100 IXTQ75N10P
SK0405
16
125
101 IXTQ80N28T
SK0519
16
125
102 IXTQ80N28T
SK0519
16
125
103 IXTQ82N25P
SK0347
16
125
104 IXTQ82N25P
SW0435
16
125
105 IXTQ82N25P
SK0450
16
125
106 IXTQ82N25P
SK0514
16
125
107 IXTQ82N25P
SK0538
16
125
108 IXTQ82N27P
SK0449
16
125
109 IXTQ88N30P
SK0402
16
125
110 IXTQ88N30P
SK0515
16
125
111 IXTQ88N30P
K0525Z
16
125
112 IXTQ88N30P
SK0538
16
125
113 IXTQ88N30P
SK0605
16
125
114 IXTQ96N15P
SK0402
16
125
115 IXTQ96N15P
SK0449
16
125
116 IXTQ96N15P
SK0513
16
125
117 IXTQ96N20P
SK0403
16
125
118 IXTQ96N20P
SK0405
16
150
Time
[hrs]
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
1000
12
Sample
Size
30
30
30
30
30
30
30
30
32
32
32
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
30
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
30000
30000
30000
30000
30000
30000
30000
30000
32000
32000
32000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
30000
Remark
TABLE 2B: MOSFET/IGBT Module
Date Code
# Part Number
or
Test #
1 MUBW15-12A7
964
2 MUBW25-12A7
873
3 MUBW30-12E6K
1127
4 MUBW35-12E7
1285
5 MUBW50-12E8
1469
6 VII130-06P1
1274
7 VIO25-06P1
1087
8 VMO1200-01F
1442
9 VMO440-02F
1308
10 VMO440-02F
1308
11 VWM350-0075
1288
Voltage
[V]
16
16
16
16
16
20
16
16
20
16
16
Temp.
[°C]
125
125
150
125
125
150
150
125
125
150
150
Time
[hrs]
1000
168
168
168
168
168
168
1000
168
168
168
Sample
Size
10
10
10
10
10
10
10
10
10
10
10
Failures
Voltage
[V]
16
16
16
16
16
Temp.
[°C]
125
150
150
150
150
Time
[hrs]
1000
168
168
500
1000
Sample
Size
30
25
10
10
20
Failures
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
10000
1680
1680
1680
1680
1680
1680
10000
1680
1680
1680
Remark
Device Hours
[hrs]
30000
4200
1680
5000
20000
Remark
TABLE 2C: ISOPLUS
#
Part Number
1
2
3
4
5
IXGR40N60C2
IXKR40N60C
IXLF19N250
IXLF19N250
IXLF19N250A
Date Code
or
Test #
SP0337
1287
1142
1387
1292
13
0
0
0
0
0
POWER CYCLE (Tables 3A ..3H)
TABLE 3A: MOSFET/IGBT single device
Date Code
# Part Number
or
Tj(max)
Test #
[°C]
1 IXDH30N120D1
1007
125
2 IRF450
CK0420
3 IXDH35N60B
1063
125
4 IXEH25N120D1
1277
125
5 IXFH21N50Q
MP0423
6 IXFH24N50
MP0419
7 IXFH26N60Q
MK0436
8 IXFH80N10Q
SK0510
9 IXFK27N80
CP0441
10 IXFX48N60P
SP0518
11 IXGQ160N30P
SK0503
12 IXLF19N250
1387
125
13 IXTH75N15
SK0442
14 IXTK62N25
DT0245
15 IXTK62N25
SS0420
16 IXTK62N25
SS0436
17 IXTQ30N60P
SK0517
18 IXTQ82N25P
SW0435
19 IXTQ82N25P
SS0506
-
TABLE 3C: Thyristor/Diode Module
Date Code
# Part Number
or
Test #
1 MCC162-14
1375
2 MCC56-14
1472
3 MCC95-12
1351
4 MCD40-16
1474
5 MDD172-16
992
6 MDD172-16
1133
Tj(max)
[°C]
125
125
125
125
125
125
TABLE 3D: Controller, Rectifier Bridge
Date Code
# Part Number
or
Tj(max)
Test #
[°C]
1 MMO36-16
875
125
2 VBO25-12NO2
1192
125
3 VBO68-16NO7
995
125
4 VUO121-16NO1
999
125
5 VUO28-08NO7
1249
125
6 VUO60-12
993
125
7 VUO82-16NO7
1328
125
∆Τ
[K]
80
100
80
80
100
100
100
100
100
100
100
80
100
100
100
100
100
100
100
∆Τ
[K]
80
80
80
80
80
80
∆Τ
[K]
80
80
80
80
80
80
80
Number
of
Cycles
2000
10000
2000
2000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
10000
Sample
Size
20
24
20
20
24
24
24
24
24
24
24
20
24
24
24
24
24
24
24
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
40000
240000
40000
40000
240000
240000
240000
240000
240000
240000
240000
200000
240000
240000
240000
240000
240000
240000
240000
Number
of
Cycles
10000
20000
10000
5000
50000
20000
Sample
Size
10
10
10
10
10
10
Failures
Device Cycles
0
0
0
0
0
0
100000
200000
100000
50000
500000
200000
Number
of
Cycles
10000
5000
2000
2000
2000
5000
5000
Sample
Size
10
10
10
10
10
10
10
Failures
Device Cycles
0
0
0
0
0
0
0
100000
50000
20000
20000
20000
50000
50000
14
Remark
Remark
Remark
TABLE 3E: FRED
Date Code
or
Test #
1206
956
1139
1440
1046
960
1378
905
1045
1262
Tj(max)
[°C]
125
125
125
145
150
150
107
125
125
135
∆Τ
[K]
80
80
80
105
105
105
105
80
80
90
Number
of
Cycles
2000
4000
5000
2000
2000
2000
2000
5000
5000
2000
Sample
Size
20
20
10
20
20
20
20
10
20
20
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
40000
80000
50000
40000
40000
40000
40000
50000
100000
40000
TABLE 3F: Schottky Diode
Date Code
# Part Number
or
Test #
1 DSS61-0045A
1238
2 DSSK40-0015B
1336
3 DSSK60-015A
1256
4 DSSK70-0015B
901
5 DSSK80-003B
1071
6 DSSK80-0045B
1223
Tj(max)
[°C]
125
125
125
125
125
125
∆Τ
[K]
80
80
80
80
80
80
Number
of
Cycles
4000
2000
20000
2000
2000
2000
Sample
Size
20
20
20
20
20
20
Failures
Device Cycles
0
0
0
0
0
0
80000
40000
400000
40000
40000
40000
TABLE 3G: Thyristor/Diode single device
Date Code
# Part Number
or
Tj(max)
Test #
[°C]
1 CS19-12ho1
978
125
2 CS20-22moF1
952
125
3 CS35-14io4
1473
125
4 CS45-16io1
1165
125
5 DSA1-18D
1435
150
6 DSA17-16A
1092
130
7 DSI30-12A
1036
125
8 DSP25-16A
886
150
∆Τ
[K]
80
80
80
80
105
100
80
105
Number
of
Cycles
4000
10000
2000
2000
2000
2000
2000
2000
Sample
Size
20
20
10
20
20
10
20
20
Failures
Device Cycles
0
0
0
0
0
0
0
0
80000
200000
20000
40000
40000
20000
40000
40000
∆Τ
[K]
80
80
80
Number
of
Cycles
10000
5000
10000
Sample
Size
20
20
20
Failures
Device Cycles
0
0
0
200000
100000
200000
#
Part Number
1
2
3
4
5
6
7
8
9
10
DSEC30-02A
DSEI120-06A
DSEI2x101-06A
DSEI60-02A
DSEI60-12A
DSEP12-12A
DSEP15-06A
DSEP2x31-12A
DSEP30-12CR
DSEP60-06A
Remark
Remark
Remark
TABLE 3H: ISOPLUS
#
Part Number
1
2
3
CS20-22moF1
DSEP30-12CR
IXLF19N250
Date Code
or
Test #
952
1045
1387
Tj(max)
[°C]
125
125
125
15
Remark
TEMPERATURE CYCLE (Tables 4A ..4J)
TABLE 4A: MOSFET/IGBT single device
Date Code
Low
# Part Number
or
Temp.
Test #
[°C]
1 FII50-12EL
1294
-55
2 FMM151-0075P
1145
-55
3 IRFP450
CK 0420
-55
4 IXBH40N160
935
-55
5 IXBP5-N160G
1337
-55
6 IXDA20N120AS
967
-40
7 IXDN404SI
SC 351
-55
8 IXDR30N120D1
1411
-55
9 IXER35N120D1
1207
-55
10 IXFF24N100
1390
-55
11 IXFH21N50Q
MP 0423
-55
12 IXFH24N50
MP 0419
-55
13 IXKC20N60C
1018
-55
14 IXKC20N60C
1074
-55
15 IXKR25N80C
1189
-40
16 IXKR40N60C
987
-40
17 IXKR40N60C
1033
-40
18 IXLF19N250
1387
-55
19 IXLF19N250A
1292
-55
20 IXTM1N100
TP 0423
-55
21 IXTM1N100
TP 0423
-55
22 IXTM1N100
TP 0424
-55
23 IXTN79N20
1140
-40
24 IXTQ64N25P
SK 0414
-55
25 IXTQ69N30P
SK 0342
-65
26 IXTQ69N30P
SK 0411
-55
27 IXTQ96N15P
SK 0412
-55
High
Temp.
[°C]
150
150
125
150
150
150
150
150
150
150
125
125
150
150
150
150
150
150
150
125
125
125
150
150
155
150
150
Number
of
Cycles
100
100
100
100
50
100
1000
50
50
100
100
100
50
100
50
100
100
100
100
100
100
100
50
250
100
250
250
Sample
Size
20
20
30
20
20
20
80
20
20
20
30
30
20
40
20
20
10
20
20
32
32
32
10
30
30
30
30
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
2000
2000
3000
2000
1000
2000
80000
1000
1000
2000
3000
3000
1000
4000
1000
2000
1000
2000
2000
3200
3200
3200
500
7500
3000
7500
7500
TABLE 4B: MOSFET/IGBT Module
Date Code
# Part Number
or
Test #
1 MKI50-06A7
1172
2 MUBW15-12A7
964
3 MUBW15-12A7
1466
4 MUBW30-12A6K
1373
5 MUBW35-06A6
1244
6 MUBW35-12E7
1285
7 MUBW50-12E8
945
8 MUBW50-12E8
1082
9 MWI50-06A7T
1144
10 MWI50-12A7
1017
11 VMM90-09F
1201
12 VMO1200-01F
1442
13 VMO440-02FL
936
High
Temp.
[°C]
150
150
150
150
125
150
150
150
150
150
150
150
150
Number
of
Cycles
50
100
50
50
100
50
50
50
100
100
50
100
50
Sample
Size
10
10
10
10
10
10
10
10
10
10
10
10
10
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
500
1000
500
500
1000
500
500
500
1000
1000
500
1000
500
Low
Temp.
[°C]
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
16
Remark
MOSFET Drivers
Remark
TABLE 4C: Thyristor/Diode Module
Date Code
# Part Number
or
Test #
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
MCC162-14
MCC255-14
MCC26-12
MCC26-16
MCC26-16
MCC26-16
MCC26-16
MCC310-12
MCC312-16
MCC312-16
MCC44-12
MCC44-16
MCC56-12
MCC95-12
MCC95-16
MCC95-16
MCD310-12
MCD95-14
MCD95-16
MCO25-16
MCO450-14
MCO50-16
MDD172-12
MDD172-16
MDD172-16
MDD95-16
VCC105-14
1175
1120
1255
926
1324
1333
1389
970
1302
1302
1101
1181
1449
1389
1278
976
1257
939
1342
1155
1418
1154
1083
1372
1133
1058
1115
TABLE 4D: Controller, Rectifier Bridge
Date Code
# Part Number
or
Test #
1 VBE60-06A
908
2 VBO19-16DT1
1113
3 VBO19-16DT1
1272
4 VBO25-16AO2
1028
5 VHFD37-14
1003
6 VUB120-16NO2
1300
7 VUO121-16NO1
1070
8 VUO121-16NO1
999
9 VUO28-08NO7
1249
10 VUO34
918
11 VUO36-16
883
12 VUO36-16
1428
13 VUO52
887
14 VUO52
887
15 VVY40-16
913
16 VW2x60-14
1039
17 VW2x60-14
1443
Low
Temp.
[°C]
High
Temp.
[°C]
Number
of
Cycles
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
50
50
50
100
100
100
100
50
200
200
50
50
50
100
100
50
50
50
50
50
50
50
100
50
100
100
100
Low
Temp.
[°C]
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
-40
High
Temp.
[°C]
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
100
50
50
100
50
50
100
100
10
100
20
40
100
100
50
50
50
Sample
Size
10
10
10
10
10
10
10
10
5
10
10
10
10
40
10
10
10
10
10
20
10
10
10
10
10
20
10
Sample
Size
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
17
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
500
500
500
1000
1000
1000
1000
500
1000
2000
500
500
500
4000
1000
500
500
500
500
1000
500
500
1000
500
1000
2000
1000
Failures
Device Cycles
0
0
0
0
0
0
0
1
0
0
0
0
0
0
0
0
0
1000
500
500
1000
500
500
1000
1000
100
1000
200
400
1000
1000
500
500
500
Remark
Remark
I_R@ 100 Cycles
TABLE 4E: FRED
Date Code
or
Test #
1037
1204
1339
1269
1159
1121
1397
1174
1174
1169
1005
1126
1190
960
1514
1263
1468
1009
902
1268
1438
1437
1365
917
1279
Low
Temp.
[°C]
-55
-55
-55
-55
-55
-55
-40
-40
-40
-40
-40
-40
-40
-55
-55
-50
-40
-40
-55
-55
-55
-55
-40
-40
-40
High
Temp.
[°C]
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
50
100
50
100
100
50
20
200
200
100
100
50
100
100
50
50
50
20
50
100
50
50
50
50
50
Sample
Size
20
20
20
20
20
20
10
10
10
20
10
20
20
20
20
20
10
10
20
20
20
20
10
10
10
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1000
2000
1000
2000
2000
1000
200
2000
2000
2000
1000
1000
2000
2000
1000
1000
500
200
1000
2000
1000
1000
500
500
500
TABLE 4F: Schottky Diode
Date Code
# Part Number
or
Test #
1 DGSK36-03CS
996
2 DGSK8-025A
1106
3 DSS2x160-01A
1117
4 DSS2x41-01A
899
5 DSS40-0008D
1131
6 DSS61-0045A
1238
7 DSSK40-008B
1260
8 DSSK48-0025B
1050
9 DSSK50-01A
1166
10 DSSK60-0045A
961
11 DSSK60-0045B
1457
12 DSSK60-015A
1256
13 DSSK60-015AR
1304
14 DSSK60-02A
1187
15 DSSK70-0015B
901
16 DSSK80-0008D
1394
17 DSSK80-0025B
1119
18 DSSS30-01AR
983
19 DSSS35-008AR
910
Low
Temp.
[°C]
-55
-55
-40
-40
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
High
Temp.
[°C]
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
100
100
100
100
100
100
50
50
50
50
50
100
100
100
50
50
100
100
100
Sample
Size
20
20
20
10
20
20
20
20
20
20
20
20
20
20
20
20
20
40
20
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
2000
2000
2000
1000
2000
2000
1000
1000
1000
1000
1000
2000
2000
2000
1000
1000
2000
4000
2000
#
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
DSEC29-02A
DSEC29-06AC
DSEC30-02A
DSEC30-06A
DSEC59-02AQ
DSEC60-03AR
DSEI 2x121-02A
DSEI120-12A
DSEI120-12A
DSEI20-12A
DSEI2x121-02P
DSEI30-10A
DSEI36-06AS
DSEP12-12A
DSEP15-12CR
DSEP29-06B
DSEP2x25-12C
DSEP2x25-12C
DSEP30-06CR
DSEP40-03AS
DSEP8-12A
DSEP9-06CR
MEK150-04E
MEK350-02DA
MEO500-06DA
18
Remark
Remark
TABLE 4G: Thyristor/Diode single device
Date Code
Low
# Part Number
or
Temp.
Test #
[°C]
1 CS19-12H01
1404
-40
2 CS20-14io1
1364
-40
3 CS20-22moF1
979
-55
4 CS20-22moF1
979
-55
5 CS20-22moF1
952
-55
6 CS30-16io1
1001
-40
7 CS35-14io1
1011
-40
8 CS35-14io4
1473
-40
9 CS45-12io1
1199
-40
10 CS45-16io1
890
-40
11 CS45-16io1R
1284
-40
12 CS8-12io2
914
-40
13 CS8-12io2
1388
-40
14 DS75-04D
1243
-40
15 DSA17-16A
1092
-40
16 DSA17-16A
1195
-40
17 DSA17-16A
1195
-40
18 DSA2-18A
1398
-40
19 DSA75-18B
1388
-40
20 DSA9-18F
1307
-40
21 DSI30-16A
1075
-40
22 DSI75-16
1160
-40
23 DSP25-16A
1273
-40
24 DSP8-08A
1146
-40
High
Temp.
[°C]
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
50
100
100
100
100
50
20
20
50
50
50
20
50
50
20
100
100
20
50
20
100
20
50
50
Sample
Size
20
20
20
20
20
20
10
10
20
20
20
10
20
10
10
20
18
20
20
10
20
10
20
20
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1000
2000
2000
2000
2000
1000
200
200
1000
1000
1000
200
1000
500
200
2000
1800
400
1000
200
2000
200
1000
1000
Remark
TABLE 4H: ISOPLUS
Date Code
or
Test #
952
979
979
1284
1204
1121
1514
902
1437
1304
983
910
1021
1294
1145
1411
1207
1390
1018
1074
1189
987
1033
1387
1292
Low
Temp.
[°C]
-55
-55
-55
-40
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-55
-40
-40
-40
-55
-55
High
Temp.
[°C]
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
150
Number
of
Cycles
100
100
100
50
100
50
50
50
50
100
100
100
100
100
100
50
50
100
50
100
50
100
100
100
100
Sample
Size
20
20
20
20
20
20
20
20
20
20
40
20
20
20
20
20
20
20
20
40
20
20
10
20
20
Failures
Device Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
2000
2000
2000
1000
2000
1000
1000
1000
1000
2000
4000
2000
2000
2000
2000
1000
1000
2000
1000
4000
1000
2000
1000
2000
2000
TABLE 4J: Breakover Diode
Date Code
# Part Number
or
Test #
1 IXBOD1-08
1085
2 IXBOD1-08
1248
Low
Temp.
[°C]
-40
-40
High
Temp.
[°C]
150
150
Number
of
Cycles
100
50
Sample
Size
20
20
Failures
Device Cycles
0
0
2000
1000
#
Part Number
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
CS20-22moF1
CS20-22moF1
CS20-22moF1
CS45-16io1R
DSEC29-06AC
DSEC60-03AR
DSEP15-12CR
DSEP30-06CR
DSEP9-06CR
DSSK60-015AR
DSSS30-01AR
DSSS35-008AR
FBS10-12SCC
FII50-12EL
FMM151-0075P
IXDR30N120D1
IXER35N120D1
IXFF24N100
IXKC20N60C
IXKC20N60C
IXKR25N80C
IXKR40N60C
IXKR40N60C
IXLF19N250
IXLF19N250A
19
Remark
Remark
HUMIDITY TEST (Tables 5A ..5H)
TABLE 5A: MOSFET/IGBT single device
Date Code
# Part Number
or
Temp.
Test #
[°C]
1 IXBH40N140
1188
121
2 IXER35N120D1
909
121
3 IXLF19N250
1387
121
4 IXTQ69N30P
SK 0342
125
Rel. H.
[%]
100
100
100
100
Time
[hrs]
48
48
96
96
Sample
Size
20
20
20
30
Failures
TABLE 5B: MOSFET/IGBT Module
Date Code
# Part Number
or
Test #
1 MUBW15-12A7
964
2 MUBW25-06A6K
1240
3 MWI30-12E6K
1200
4 VMO1200-01
1442
5 VMO440-02F
1308
Temp.
[°C]
85
85
85
85
85
Rel. H.
[%]
85
85
85
85
85
Time
[hrs]
1000
1000
168
1000
168
Sample
Size
10
10
10
10
10
Failures
TABLE 5C: Thyristor/Diode Module
Date Code
# Part Number
or
Test #
1 MCC250-16io1
1104
2 MCC310-16io1
1171
3 MCC44-18
1027
4 MCD56-16io1B
1193
5 MCD56-16io8
1341
Temp.
[°C]
85
85
85
85
85
Rel. H.
[%]
85
85
85
85
85
Time
[hrs]
168
168
1000
168
168
Sample
Size
10
10
10
10
10
Failures
TABLE 5D: Controller, Rectifier Bridge
Date Code
# Part Number
or
Test #
1 VBO160-16NO7
1091
2 VHF36-16io5
1176
3 VUO52-16
1079
4 VUO82-16NO7
1151
5 VUO82-16NO7
1251
Temp.
[°C]
85
85
85
85
85
Rel. H.
[%]
85
85
85
85
85
Time
[hrs]
168
168
168
168
168
Sample
Size
10
10
10
10
10
Failures
Date Code
or
Test #
1297
1446
1159
1121
889
1190
1168
Temp.
[°C]
121
121
121
121
121
121
121
Rel. H.
[%]
100
100
100
100
100
100
100
Time
[hrs]
48
96
96
48
48
96
48
Sample
Size
20
8
20
20
20
20
20
Failures
Date Code
or
Test #
1238
1256
Temp.
[°C]
121
121
Rel. H.
[%]
100
100
Time
[hrs]
96
96
Sample
Size
20
20
Failures
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Device Hours
[hrs]
960
960
1920
2880
Remark
Device Hours
[hrs]
10000
10000
1680
10000
1680
Remark
Device Hours
[hrs]
1680
1680
10000
1680
1680
Remark
Device Hours
[hrs]
1680
1680
1680
1680
1680
Remark
Device Hours
[hrs]
960
768
1920
960
960
1920
960
Remark
Device Hours
[hrs]
1920
1920
Remark
TABLE 5E: FRED
#
Part Number
1
2
3
4
5
6
7
DH60-18A
DPG60C400QB
DSEC59-02AQ
DSEC60-03AR
DSEC60-04A
DSEI36-06AS
DSEP15-12CR
0
0
0
0
0
0
0
TABLE 5F: Schottky Diode
#
Part Number
1
2
DSS61-0045A
DSSK60-015A
20
0
1
I_R @ 96h
TABLE 5G: Thyristor/Diode single device
Date Code
# Part Number
or
Temp.
Test #
[°C]
1 CS45-16io1
890
121
2 DSP8-12AC
1208
121
Rel. H.
[%]
100
100
Time
[hrs]
48
48
Sample
Size
20
20
Failures
0
0
Device Hours
[hrs]
960
960
Remark
Device Hours
[hrs]
960
960
960
960
1920
Remark
Device Hours
[hrs]
960
960
960
960
Remark
TABLE 5H: ISOPLUS
Date Code
or
Test #
1121
1168
1188
909
1387
Temp.
[°C]
121
121
121
121
121
Rel. H.
[%]
100
100
100
100
100
Time
[hrs]
48
48
48
48
96
Sample
Size
20
20
20
20
20
Failures
TABLE 5J: Breakover diode
Date Code
# Part Number
or
Test #
1 IXBOD1-08
1085
2 IXBOD1-08
1248
3 IXBOD1-09
1340
4 IXBOD1-10
868
Temp.
[°C]
121
121
121
121
Rel. H.
[%]
100
100
100
100
Time
[hrs]
48
48
48
48
Sample
Size
20
20
20
20
Failures
#
Part Number
1
2
3
4
5
DSEC60-03AR
DSEP15-12CR
IXBH40N140
IXER35N120D1
IXLF19N250
0
0
0
0
0
0
0
0
0
MSLA classification standard Table: according to IEC 60749-20
#
Part Number
1
2
3
4
DSP8-08S
DSP8-08S
DSS6-0025BS
DSSK18-025
Date Code
Sample
Size
Housing style
Passed
class*
K317
K318
LSA408
L405
20
20
20
20
TO-263
TO-263
TO-252
TO-263
C
C
C
C
* "C" storage allowed <30°C; 85% relative humidity (no DRY-Pack required)
21
Remark