Reliability Report: Litelink III CPC5620.CPC5621.CPC5622 32L SOIC Qualification Report No.: 2012-020 Reliability Report Reliability Data for Litelink III CPC5620.CPC5621.CPC5622 32L SOIC Report Title: Reliability Data for Litelink III CPC5620.CPC5621.CPC5622 32L SOIC Report Number: 2012-020 Date: 8/13/12 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-273-5273, WWW.IXYSIC.COM Page 1 of 5 Reliability Report: Litelink III CPC5620.CPC5621.CPC5622 32L SOIC Qualification Report No.: 2012-020 Introduction: This report summarizes the Reliability data of IXYS Integrated Circuits Division Litelink III CPC5620.CPC5621.CPC5622. The Reliability data presented here were collected during IXYS IC Division’s product qualification and Reliability Monitor program. The purpose of this qualification was to verify IXYS IC Division Quality and Reliability requirements as outlined in the internal specifications. The Litelink III CPC5620.CPC5621.CPC5622 is manufactured at IXYS IC Division and assembled at ATEC in the Philippines. The process is IXYS IC Division P10 and Litelink III CPC5620.CPC5621.CPC5622 is available in a 32L SOIC package type. Reliability Tests: Table 1 below provides the qualification tests that were performed. The stress tests and sample size are chosen based on the IXYS IC Division internal specifications and with the approval of the product development team and quality assurance. Table 1: Litelink III CPC5620.CPC5621.CPC5622 Reliability Tests Product Package Stress Test CPC5621A/ CPC5622A 32L SOIC CPC5621A/ CPC5622A 32L SOIC CPC5621A/ CPC5622A 32L SOIC CPC5621A/ CPC5622A 32L SOIC CPC5621A/ CPC5622A 32L SOIC THB Applicable Specs and Readpoints JESD22, A101 Stress Conditions 85°C, 85% 1000 hrs # Lots Sample Size Total 4 77 308 Thermal Shock Mil-Std-883, M1011 4 55 220 Temp Cycle 4 55 220 2 50 100 2 15 30 2 9 18 High Temp Storage 0 to 100°C, 10/10 dwells, 15 cycles Mil-Std-883, N1010,-55 to 125°C, “B” 10/10 dwells, 300 cycles JESD22-A103C 125°C, 1000hrs ESD HBM JESD22, A114-E 1.5kΩ, 100pF IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-273-5273, WWW.IXYSIC.COM Page 2 of 5 Reliability Report: Litelink III CPC5620.CPC5621.CPC5622 32L SOIC Qualification Report No.: 2012-020 Reliability Test Results: The stress tests and associated results for Litelink III CPC5620.CPC5621.CPC5622 qualification are summarized in Table 2. The devices chosen for the qualification were from standard material manufactured through normal production test flow and electrically tested to datasheet limits prior to stressing. Then reliability stresses were conducted and electrically tested to datasheet limit at each interval and final readpoints. Table 2: Litelink III CPC5620.CPC5621.CPC5622 Reliability Test Results Product/ Package Stress/ Kits CPC5621A 32L SOIC CPC5621A 32L SOIC CPC5622A 32L SOIC CPC5622A 32L SOIC CPC5621A 32L SOIC THB T38184 THB T48921 THB T40840 THB T51364 Thermal Shock T38184 Thermal Shock T48921 Thermal Shock T40840 Thermal Shock T51364 Temp Cycle T38184 Temp Cycle T48921 Temp Cycle T40840 CPC5621A 32L SOIC CPC5622A 32L SOIC CPC5622A 32L SOIC CPC5621A 32L SOIC CPC5621A 32L SOIC CPC5622A 32L SOIC Readpoint 1 Readpoint 2 Readpoint 3 / Reject/ / Reject/ / Reject/ SS SS SS 168 hrs. 500 hrs. 1000 hrs. 0/77 0/77 0/77 168 hrs. 500 hrs. 1000 hrs. 0/77 0/77 0/77 168 hrs. 500 hrs. 1000 hrs. 0/77 0/77 0/77 168 hrs. 500 hrs. 1000 hrs. 0/77 0/77 0/77 15 Cycles 0/55 Comments 15 Cycles 0/55 15 Cycles 0/55 15 Cycles 0/55 300 Cycles 0/55 300 Cycles 0/55 300 Cycles 0/55 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-273-5273, WWW.IXYSIC.COM Page 3 of 5 Reliability Report: Litelink III CPC5620.CPC5621.CPC5622 32L SOIC Qualification Report No.: 2012-020 Product/ Package Stress/ Kits CPC5622A 32L SOIC Temp Cycle T51364 High Temp Storage T48921 High Temp Storage T51364 CPC5621A 32L SOIC CPC5622A 32L SOIC Readpoint 1 Readpoint 2 Readpoint 3 / Reject/ / Reject/ / Reject/ SS SS SS 300 Cycles 0/55 168 hrs. 0/50 500 hrs. 0/50 1000 hrs. 0/50 168 hrs. 0/50 500 hrs. 0/50 1000 hrs. 0/50 Comments ESD Testing Results: As part of this qualification, the product Litelink III CPC5620.CPC5621.CPC5622 was subjected to Human Body Model (HBM) ESD Sensitivity Classification testing using a KeyTek Zapmaster system. The results are summarized in Table 3. All samples were electrically tested to data sheet limits before and after ESD stressing and they passed after +/- 1000V zapping. Table3: Litelink III CPC5620.CPC5621.CPC5622 ESD Characterization Results ESD Kit Package ESD Test RC Highest Class Model Number Spec Network Passed HBM CPC5621A/ 32L SOIC JESD22, 1000V 1C 1.5kΩ, CPC5622A A114-E 100pF T38184 T48921 T40840 T51364 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-273-5273, WWW.IXYSIC.COM Page 4 of 5 Reliability Report: Litelink III CPC5620.CPC5621.CPC5622 32L SOIC Qualification Report No.: 2012-020 FIT (Failure in Time) Rate of Litelink III CPC5620.CPC5621.CPC5622 Table 4 below summarizes the FIT rate from the THB data. For THB stress, FITs were calculated based on the 85°C /85% RH test condition with 40°C/60% RH ambient use conditions at the activation energy of 0.7 eV and equivalent device hours. The FIT rate came out to be 26.29 FITs. Table 4: Litelink III CPC5620.CPC5621.CPC5622 FIT Rate Summary Product/ Lot # of # of Hours Test Eq. Device Stress Number Devices Failed Tested Temp Hours (°°C) CPC5621A/ T38184 308 0 1000 85 34,996,805 CPC5622A T48921 THB T40840 T51364 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-273-5273, WWW.IXYSIC.COM Page 5 of 5 FITs @ 60% CL 26.29