CPC7512

Reliability Report-CPC7512Z Qualification No: 2014-008
Reliability Report
Reliability Data for CPC7512Z
Report Title:
CPC7512Z Qualification Report
Report Number: 2014-008
Date:
7/30/14
IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA
Tel: 1-978-524-6700, Fax:1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM
Page 1 of 4
Reliability Report-CPC7512Z Qualification No: 2014-008
Introduction:
This report summarizes the Reliability data of IXYS Integrated Circuits Division CPC7512Z.
The Reliability data presented here were collected during IXYS IC Division product
qualification. The purpose of this qualification was to verify IXYS IC Division Quality and
Reliability requirements as outlined in IXYS IC Division internal specifications. The
CPC7512Z is manufactured at IXYS IC Division and assembled at ATEC in the Philippines.
The process is P10 and CPC7512Z is available in a 20L SOIC package type.
Reliability Tests:
Table 1 below provides the qualification tests that were performed. The stress tests and sample
size are chosen based on IXYS IC Division internal specification and with the approval of the
product development team and quality assurance.
Table 1: CPC7512Z Reliability Tests Plan
Product/
Package
CPC7512Z/
20L SOIC
Stress
Test
HTRB
CPC7512Z/
20L SOIC
ESD
Applicable
Specs
Mil-Std-883
M1005
JESD22-A-108
JESD22A114-E
Conditions
125°C, 80%
WVDC, 1000 hrs
All Pins, 1.5kΩ, 100pF
# of Sample Total
Lots Size (SS) SS
1
111
111
1
9
9
Reliability Test Results:
The stress tests and associated results for CPC7512Z qualification are summarized in Table 2.
The devices chosen for the qualification were from standard material manufactured through
normal production test flow and electrically tested to datasheet limits prior to stressing. Then
reliability stresses were conducted and electrically tested to datasheet limit at each interval and
final readpoints.
Table 2: CPC7512Z Reliability Tests Results
Product/
Package
Stress/
Kits
CPC7512Z/
20L SOIC
HTRB/
TE3424
Readpoint Final
/ Reject/
SS
1000 hrs.
0/111
IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA
Tel: 1-978-524-6700, Fax:1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM
Page 2 of 4
Reliability Report-CPC7512Z Qualification No: 2014-008
ESD Testing Results:
As part of this qualification, CPC7512Z was subjected to Human Body Model (HBM) ESD
Sensitivity Classification testing using the KeyTek Zapmaster test system. The results are
summarized in Table 3. All samples were electrically tested to data sheet limits before and after
ESD stressing and they passed up to +/-1500V of HBM.
ESD
Model
HBM
Product/
Kit
CPC7512Z/
TE3424
Table 3: CPC7512Z ESD Results
Package
ESD Test RC
Highest
Spec
Network
Passed
20L SOIC JESD22, 1.5kΩ, 100pF 1500V
A114-E
Class
1C
FIT (Failure in Time) Rate of CPC7512Z:
Table 4 provides sample size with testing summary for HTRB stress from this qualification. For
HTRB, FIT rates were calculated based on the Acceleration Factor (AF) and equivalent device
hours at 0.7eV of activation energy at 125°C test temperature and 40°C ambient use
temperatures. The FIT rates came out to be 32.45 FITs for HTRB.
Qual
Lot #
Stress
Test
1
HTRB
Table 4: CPC7512Z FIT Rate Summary
Product/
# of
# of
Hours
Equivalent
Kits #
Devices Fail
Tested
Dev. Hours
CPC7512Z/
TE3424
111
0
1000
FIT Rate
@ 60% CL
28,350,062
32.45
Conclusion:
The qualification of CPC7512Z has completed and has met the FITs rate requirement for
release.
IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA
Tel: 1-978-524-6700, Fax:1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM
Page 3 of 4
Reliability Report-CPC7512Z Qualification No: 2014-008
Approval:
Prepared by: _Martha W. Brandt*_____________________________7/30/14_
Martha W. Brandt
Date
Quality Engineer
Approved by:_Ajit Patel*_ __________________________________7/30/14__
Ajit Patel
Date
Product Engineer
Approved by: _George Belezos*_____________________________7/30/14__
George Belezos
Date
Manager of Quality
Approved by: _James Archibald* ____________________________7/30/14__
James Archibald
Date
Director, Development Engineering
*Signature on File
IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA
Tel: 1-978-524-6700, Fax:1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM
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