16N60 Series

16N60 Series
SEMICONDUCTOR
RoHS
RoHS
Nell High Power Products
N-Channel Power MOSFET
(16A, 600Volts)
DESCRIPTION
The Nell 16N60 is a three-terminal silicon
device with current conduction capability of 16A,
fast switching speed, low on-state resistance,
breakdown voltage rating of 600V ,and max.
threshold voltage of 4 volts.
They are designed for use in applications. such
as switched mode power supplies, DC to DC
converters, PWM motor controls, server/telecom
power, FPD TV power, ATX power, and industrial
power applications.
D
G
D
G
S
TO-220AB
(16 N60A )
D
S
D
FEATURES
RDS(ON) = 0.17Ω @ VGS = 10V
Ultra low gate charge(52.3nC max.)
Low reverse transfer capacitance
(C RSS = 5pF typical)
Fast switching capability
100% avalanche energy specified
Improved dv/dt capability
150°C operation temperature
G
D
S
TO-3PB
(16N60B)
D (Drain)
PRODUCT SUMMARY
ID (A)
16
VDSS (V)
600
RDS(ON) (Ω)
0.17 @ V GS = 10V
QG(nC) max.
52.3
G
(Gate)
S (Source)
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Page 1 of 10
TO-220F
(16N60AF)
16N60 Series
SEMICONDUCTOR
RoHS
RoHS
Nell High Power Products
ABSOLUTE MAXIMUM RATINGS (TC = 25°C unless otherwise specified)
SYMBOL
TEST CONDITIONS
PARAMETER
VALUE
VDSS
Drain to Source voltage
T J =25°C to 150°C
600
V DGR
Drain to Gate voltage
R GS =20KΩ
600
V GS
ID
Gate to Source voltage
V
±30
T C =25°C
Continuous Drain Current
16
T C =100°C
10.1
A
I DM
Pulsed Drain current(Note 1)
I AR
Avalanche current(Note 1)
E AR
Repetitive avalanche energy(Note 1)
I AR =16A, R GS =50Ω, V GS =10V
1.34
E AS
Single pulse avalanche energy(Note 2)
I AS =5.3A, L=7.1mH
355
dv/dt
48
5.3
100
Peak diode recovery dv/dt(Note 3)
20
V/ns
T C =25°C
PD
Derate above 25 ° C
T STG
TL
mJ
MOSFET dv/dt ruggedness(Note 3)
Total power dissipation
TJ
UNIT
T C =25°C
TO-220AB/TO-3PB
134.4
TO-220F
35.7
TO-220AB/TO-3PB
1.08
TO-220F
0.29
W/ ºC
Operation junction temperature
-55 to 150
Storage temperature
-55 to 150
Maximum soldering temperature, for 10 seconds
W
ºC
300
1.6mm from case
Mounting torque, #6-32 or M3 screw
10 (1.1)
lbf . in (N . m)
Note: 1. Repetitive rating: pulse width limited by junction temperature. .
2 . I AS = 5.3A, V DD = 50V, R GS = 25Ω, starting T J =25°C.
3 . I SD ≤ 16A, di/dt ≤ 200 A/µs, V DD = 380V, starting T J = 25°C.
THERMAL RESISTANCE
SYMBOL
Rth(j-c)
Min.
PARAMETER
Thermal resistance, junction to case
Typ.
TO-220AB/TO-3PB
Thermal resistance, case to heatsink
TO-3PB
3.5
Thermal resistance, junction to ambient
TO-3PB
TO-220AB/TO220F
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0.24
ºC/W
TO-220AB/TO-220F
Rth(j-a)
UNIT
0.93
TO-220F
Rth(c-s)
Max.
Page 2 of 10
0.5
40
62.5
16N60 Series
SEMICONDUCTOR
RoHS
RoHS
Nell High Power Products
ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise specified)
SYMBOL
PARAMETER
TEST CONDITIONS
Min.
Typ.
Max.
UNIT
OFF CHARACTERISTICS
V(BR)DSS
▲V (BR)DSS/▲T J
I DSS
Drain to source breakdown voltage
I D = 1mA, V GS = 0V
Breakdown voltage temperature coefficient
I D = 1mA, V DS =V GS
Drain to source leakage current
600
V
V/ºC
0.73
V DS =600V, V GS =0V
T C = 25°C
10
V DS =480V, V GS =0V
T C =125°C
100
μA
Gate to source forward leakage current
V GS = 30V, V DS = 0V
100
Gate to source reverse leakage current
V GS = -30V, V DS = 0V
-100
I GSS
nA
ON CHARACTERISTICS
R DS(ON)
Static drain to source on-state resistance
V GS = 10V, l D = 8A
V GS(TH)
Gate threshold voltage
V GS =V DS , I D =250μA
Forward transconductance
V DS = 40V
l D = 8A
g fs
0.17
2
TO-3PB
20
TO-220AB/TO-220F
13
0.199
Ω
4
V
S
DYNAMIC CHARACTERISTICS
C ISS
Input capacitance
C OSS
Output capacitance
C RSS
Reverse transfer capacitance
C OSS
Output capacitance
V DS = 380V, V GS = 0V, f =1MHz
Effective output capacitance
V DS = 0 to 480V, V GS = 0V
C oss eff.
V DS = 100V, V GS = 0V, f =1MHz
1630
2170
70
95
5
10
40
60
pF
176
SWITCHING CHARACTERISTICS
t d(ON)
tr
t d(OFF)
tf
QG
Q GS
Turn-on delay time
Rise time
Turn-off delay time
V DD = 380V, V GS = 10V
I D = 8A, R GS = 4.7Ω (Note1,2)
Fall time
Total gate charge
Gate to source charge
Q GD
Gate to drain charge (Miller charge)
ESR
Equivalent series resistance (G-S)
V DD = 380V, V GS = 10V
I D = 8A, (Note1,2)
15.8
41.6
15.5
41
60.3
130.6
20.2
50.4
40.2
52.3
6.7
ns
nC
12.9
Drain open
2.9
Ω
SOURCE TO DRAIN DIODE RATINGS AND CHARACTERISTICS (TC = 25°C unless otherwise specified)
SYMBOL
VSD
Is (Is D )
PARAMETER
TEST CONDITIONS
Min.
Typ.
Max.
UNIT
V
Diode forward voltage
I SD = 8A, V GS = 0V
1.2
Continuous source to drain current
Integral reverse P-N junction
diode in the MOSFET
16
D (Drain)
A
I SM
Pulsed source current
48
G
(Gate)
S (Source)
t rr
Reverse recovery time
Q rr
Reverse recovery charge
I SD = 8A, V GS = 0V,
dI F /dt = 100A/µs
Note: 1. Pulse test: Pulse width ≤ 300 µs, duty cycle ≤ 2%.
2. Essentially independent of operating temperature.
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Page 3 of 10
319
ns
4.4
μC
16N60 Series
SEMICONDUCTOR
RoHS
RoHS
Nell High Power Products
ORDERING INFORMATION SCHEME
16 N 60
B
Current rating, ID
16 = 16A
MOSFET series
N = N-Channel
Voltage rating, VDS
60 = 600V
Package type
A = TO-220AB
AF = TO-220F
B = TO-3P(B)
■ Gate charge test circuit & waveform
V GS
Qg
RL
10V
V DS
V GS
Q gs
Q gd
(D.U.T)
1mA
Charge
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Page 4 of 10
16N60 Series
SEMICONDUCTOR
RoHS
RoHS
Nell High Power Products
■ RESISTIVE SWITCHING TEST CIRCUIT & WAVEFORM
RL
V DS
V DS
90%
V DD
V GS
RG
D.U.T.
10%
V GS
10V
t d(ON)
t d(OFF)
tr
t on
tf
t off
■ UNCLAMPED INDUCTIVE SWITCHING TEST CIRCUIT & WAVEFORMS
L
V DS
E AS =
1
L l 2
2 · AS
BV DSS
lD
l AS
RG
V DD
l D (t)
D.U.T.
10V
V DD
V DS (t)
tp
Time
tP
■ PEAK DIODE RECOVERY dv/dt TEST CIRCUIT & WAVEFORMS
D.U.T.
+
V GS
(Driver)
D=
Gate Pulse Width
Gate Pulse Period
10V
V DS
l FM , Body Diode Forward Current
l SD
(D.U.T)
I SD
L
di/dt
l RM
Body Diode Reverse Current
RG
Driver
V GS
Same Type
as DUT
* dv/dt controlled by R G
* l SD controlled by pulse period
V DD
Body Diode Recovery dv/dt
V DS
(D.U.T)
V DD
Body Diode
Forward Voltage Drop
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Page 5 of 10
Nell High Power Products
■ TYPICAL CHARACTERISTICS
Fig.1 On-State characteristics
Fig.2 Transfer characteristics
100
V GS
Top: 15V
10V
8V
7V
6V
5V
4.5V
4V
10
Drain current, l D (A)
Drain Current, l D (A)
100
1
150ºC
10
25ºC
-55ºC
1
Note:
1. V DS = 20V
2. 250µs Pulse Test
Note:
1. 250µs Pulse Test
2. T C = 25°C
0.1
0.1
10
1
0.1
20
8
Gate-Source voltage, V GS (V)
Fig.3 On-Resistance variation vs. drain
current and gate voltage
Fig.4 Body diode forward voltage variation
vs. Source current and Temperatue
0.6
100
Reverse drain current, l S (A)
Drain-Source On-Resistance, R DS(ON) (Ω)
6
4
2
Drain-Source voltage, V DS (V)
0.5
0.4
V GS = 10V
0.3
V GS = 20V
0.2
Note:
T C = 25°C
10
30
20
40
25ºC
10
Note:
1. V GS = 0V
2. 250µs Pulse Test
1
0.2
0.1
0
150ºC
50
Drain current, I D (A)
C iss = C gs +C gd ( C ds = shorted )
C oss = C ds +C gd
C rss = C gd
7500
Coss
Note:
1. V GS = 0V
2. f = 1 MHz
5000
2500
0.6
0.8
1.4
1.6
Ciss
V DS = 120V
V DS = 380V
10
V DS = 480V
8
6
4
2
Note: l D = 8A
0
1
10
100
0
600
Drain-Source voltage, V DS (V)
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1.2
12
Crss
0
0.1
1.0
Fig.6 Gate charge characteristics
Gate-Source voltage,V GS (V)
1000
0.4
Body diode forward voltage, V SD (V)
Fig.5 Capacitance characteristics
Capacitance (pF)
RoHS
RoHS
16N60 Series
SEMICONDUCTOR
10
20
30
40
Total gate charge, Q G (nC)
Page 6 of 10
50
16N60 Series
SEMICONDUCTOR
RoHS
RoHS
Nell High Power Products
Fig.7 Breakdown voltage variation vs.
Temperature
Fig.8 On-Resistance variation vs.
Temperature
3.0
Drain-Source On-Resistance,
R Ds(ON) (Normalized)
Drain-Source breakdown voltage,
BV Dss (Normalized)
1.2
1.1
1.0
0.9
Note:
1. V GS = 0V
2. l D = 1mA
250μA
0.8
-100
-50
0
50
100
150
2.5
2.0
1.5
1.0
Note:
1. V GS = 10V
2. l D = 8A
0.5
0.0
-100
200
-50
0
50
100
150
Junction temperature, T j (°C)
Junction temperature, T J (°C)
Fig.9 Maximum safe operating area
( 16N60A/16N60B )
Fig.10 Maximum safe operating area
(16N60AF)
100
100
20μs
20μs
100μs
10
Drain current, l D (A)
Drain current, l D (A)
100μs
1ms
10ms
Operation in This Area is
Limited by R DS (on)
DC
1
0.1
10
1ms
10ms
1
Operation in This Area is
Limited by R DS (on)
DC
0.1
Note:
1. T C = 25 ° C
2. T J = 150°C
3. Sing Pulse
0.01
1
Note:
1. T C = 25 ° C
2. T J = 150°C
3. Sing Pulse
10
100
0.01
1
1000
Drain-Source voltage, V DS (V)
20
15
10
5
0
25
50
75
100
125
150
Case temperature, T J (°C)
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10
100
Drain-Source voltage, V DS (V)
Fig.11 Maximum drain current vs.
Case temperature
Drain current, l D (A)
200
Page 7 of 10
1000
16N60 Series
SEMICONDUCTOR
RoHS
RoHS
Nell High Power Products
Thermal response, Rth(j-c) (°C/W)
Fig.11-1 Transient thermal response curve
for 16N60B & 16N60A
2
1
D = 0.5
0.2
0.1
0.1
P DM
0.05
0.02
t1
0.01
0.01
Notes:
1. Rth(j-c) (t) = 0.93°C/W Max.
2. Duty factor, D = t1/ t 2
3. TJM - TC = PDM * Rth(j-c) (t)
Single pulse
0.005
10 -5
t2
10 -4
10 -3
10 -2
10 -1
1
Rectangular pulse duration (sec)
Thermal response, Rth(j-c) (°C/W)
Fig.11-2 Transient thermal response curve
for 16N60AF
5
D = 0.5
1
0.2
0.1
P DM
0.05
0.1
0.02
t1
0.01
Notes:
Single pulse
0.01
10 -5
10 -4
10 -3
1. Rth(j-c) (t) = 3.5°C/W Max.
2. Duty factor, D = t1/ t 2
3. TJM - TC = PDM * Rth(j-c) (t)
10 -2
10 -1
1
Rectangular pulse duration (sec)
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t2
Page 8 of 10
10
100
16N60 Series
SEMICONDUCTOR
RoHS
RoHS
Nell High Power Products
Case Style
TO-220AB
10.54 (0.415) MAX.
9.40 (0.370)
9.14 (0.360)
4.70 (0.185)
4.44 (0.1754)
3.91 (0.154)
3.74 (0.148)
1.39 (0.055)
1.14 (0.045)
2.87 (0.113)
2.62 (0.103)
3.68 (0.145)
3.43 (0.135)
PIN
2
1
16.13 (0.635)
15.87 (0.625)
3
4.06 (0.160)
3.56 (0.140)
15.32 (0.603)
14.55 (0.573)
8.89 (0.350)
8.38 (0.330)
29.16 (1.148)
28.40 (1.118)
2.79 (0.110)
2.54 (0.100)
1.45 (0.057)
1.14 (0.045)
14.22 (0.560)
13.46 (0.530)
2.67 (0.105)
2.41 (0.095)
0.90 (0.035)
0.70 (0.028)
2.65 (0.104)
2.45 (0.096)
0.56 (0.022)
0.36 (0.014)
5.20 (0.205)
4.95 (0.195)
D (Drain)
All dimensions in millimeters(inches)
G
(Gate)
S (Source)
19.9±0.3
4.0
20.0 min
4.0 max
1.8
2.0
15.6±0.4
9.6
5.0 ±0 . 2
TO-3P(B)
4.8±0.2
2.0±0.1
Φ3.2 ± 0,1
2
3
5.45±0.1
G
D
S
1
2
3
+0.2
1.05 -0.1
+0.2
0.65 -0.1
5.45±0.1
1.4
D (Drain)
G
(Gate)
All dimensions in millimeters(inches)
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Page 9 of 10
S (Source)
16N60 Series
SEMICONDUCTOR
RoHS
RoHS
Nell High Power Products
Case Style
TO-220F
10.6
10.4
3.4
3.1
2.8
2.6
3.7
3.2 7.1
6.7
16.0
15.8
16.4
15.4
2
1
3
10°
3.3
3.1
13.7
13.5
2.54
TYP
0.9
0.7
0.48
0.44
2.54
TYP
2.85
2.65
4.8
4.6
D (Drain)
G
(Gate)
S (Source)
All dimensions in millimeters
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Page 10 of 10