ELDRS Report_RH1814MW_Fab Lot WF004231 2.pdf

ELDRS Report
10-417 110310 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Enhanced Low Dose Rate Sensitivity (ELDRS) Radiation Testing of the
RH1814MW Quad Op Amp for Linear Technology
Customer: Linear Technology (PO 57472L)
RAD Job Number: 10-417
Part Type Tested: Linear Technology RH1814MW Quad Op Amp
Commercial Part Number: RH1814MW
Traceability Information: Fab Lot# WF004231.2, Wafer# 2, Assembly Lot# 567912.1. Information obtained
from Linear Technology PO#57472L. Date code marking on the package is 1024A, see Appendix A for a
photograph of the device and part markings.
Quantity of Units: 12 units total, 5 units for biased irradiation, 5 units for unbiased irradiation and 2 control
units. Serial numbers 295 to 298 and 300 were biased during irradiation, serial numbers 301, 302, 304 to 306
were unbiased during irradiation and serial numbers 307 and 308 were used as the controls. See Appendix B for
the radiation bias connection table.
External Traveler: None Required
Pre-Irradiation Burn-In: Burn-In performed by Linear Technology prior to receipt by RAD.
TID Dose Rate and Test Increments: 10mrad(Si)/s with readings at pre-irradiation, 10, 20, 30, 40, and 50
krad(Si).
TID Overtest and Post-Irradiation Anneal: No overtest. 24-hour room temperature anneal followed by a 168hour 100°C anneal. Both anneals shall be performed in the same electrical bias condition as the irradiations.
Electrical measurements shall be made following each anneal increment.
TID Test Standard: MIL-STD-883H, Method 1019.8, Condition D
TID Electrical Test Conditions: Pre-irradiation, and within one hour following each radiation exposure.
Hardware and Software: LTS2020 Automated Tester, Entity ID TS04, Calibration Date: 04-28-10, Calibration
Due 04-28-11. LTS2101 Family Board, Entity ID FB02. LTS0600 Test Fixture, Entity ID TF03. RH1814W
BGSS-080826 DUT Board. Test Program: RH1814W.SRC
Facility and Radiation Source: Radiation Assured Devices Longmire Laboratories, Colorado Springs, CO using
the GB-150 low dose rate Co60 source. Dosimetry performed by Air Ionization Chamber (AIC) traceable to
NIST. RAD’s dosimetry has been audited by DSCC and RAD has been awarded Laboratory Suitability for MILSTD-750 TM 1019.5
Irradiation and Test Temperature: Ambient room temperature for irradiation and test controlled to 24°C ± 6°C
per MIL-STD-883.
Low Dose Rate Test Result: PASSED. The units showed no significant
degradation with total dose. All parameters remained within their datasheet
specifications to the maximum dose level tested of 50krad(Si). Further the units
do not exhibit ELDRS as defined in the current test method.
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ELDRS Report
10-417 110310 R1.1
Radiation Assured Devices
5017 N. 30th Street
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(719) 531-0800
1.0. Overview and Background
It is well known that total dose ionizing radiation can cause parametric degradation and ultimately
functional failure in electronic devices. The damage occurs via electron-hole pair production, transport
and trapping in the dielectric regions. In advanced CMOS technology nodes (0.6µm and smaller) the
bulk of the damage is manifested in the thicker isolation regions, such as shallow trench or local
oxidation of silicon (LOCOS) oxides (also known as "birds-beak" oxides). However, many linear and
mixed signal devices that utilize bipolar minority carrier elements exhibit an enhanced low dose rate
sensitivity (ELDRS). At this time there is no known or accepted a priori method for predicting
susceptibility to ELDRS or simulating the low dose rate sensitivity with a "conventional" room
temperature 50-300rad(Si)/s irradiation (Condition A in MIL-STD-883 TM 1019.8). Over the past 10
years a number of accelerating techniques have been examined, including an elevated temperature
anneal, such as that used for MOS devices (see ASTM-F-1892 for more technical details) and irradiating
at various temperatures. However, none of these techniques have proven useful across the wide variety
of linear and/or mixed signal devices used in spaceborne applications.
The latest requirement incorporated in MIL-STD-883 TM 1019 requires that devices that could
potentially exhibit ELDRS "shall be tested either at the intended application dose rate, at a prescribed
low dose rate to an overtest radiation level, or with an accelerated test such as an elevated temperature
irradiation test that includes a parameter delta design margin". While the recently released MIL-STD883 TM 1019 allows for accelerated testing, the requirements for this are to essentially perform a low
dose rate ELDRS test to verify the suitability of the acceleration method on the component of interest
before the acceleration technique can be instituted. Based on the limitations of accelerated testing and to
meet the requirements of MIL-STD-883 TM1019.8 Condition D, we have performed a low dose rate test
at 10mrad(Si)/s.
2.0. Radiation Test Apparatus
The low dose rate testing described in this final report was performed using the facilities at Radiation
Assured Devices' Longmire Laboratories in Colorado Springs, CO. The low dose rate source is a GB150 irradiator modified to provide a panoramic exposure. The Co-60 rods are held in the base of the
irradiator heavily shielded by lead. During the irradiation exposures the rod is raised by an electronic
timer/controller and the exposure is performed in air. The dose rate for this irradiator in this
configuration ranges from approximately 1mrad(Si)/s to a maximum of approximately 50rad(Si)/s,
determined by the distance from the source. For low dose rate testing described in this report, the
devices are placed approximately 2-meters from the Co-60 rods. The irradiator calibration is maintained
by Radiation Assured Devices' Longmire Laboratories using air ionization chamber (AIC) dosimetry
traceable to the National Institute of Standards and Technology (NIST). Figure 2.1 shows a photograph
of the GB-150 Co-60 irradiator at RAD's Longmire Laboratory facility.
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ELDRS Report
10-417 110310 R1.1
Radiation Assured Devices
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Colorado Springs, CO 80919
(719) 531-0800
Figure 2.1. Radiation Assured Devices' Co-60 irradiator. The dose rate is obtained by positioning the
device-under-test at a fixed distance from the gamma cell. The dose rate for this irradiator varies from
approximately 50rad(Si)/s close to the rods down to <1mrad(Si)/s at a distance of approximately 4-meters.
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ELDRS Report
10-417 110310 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
3.0. Radiation Test Conditions
The RH1814MW Quad Operational Amplifier described in this final report was irradiated using a split
5V supply and with all pins tied to ground, that is biased and unbiased. See Appendix B for details on
the biasing conditions during radiation exposure. In our opinion, this bias circuit satisfies the
requirements of MIL-STD-883H TM1019.8 Section 3.9.3 Bias and Loading Conditions which states
"The bias applied to the test devices shall be selected to produce the greatest radiation induced damage
or the worst-case damage for the intended application, if known. While maximum voltage is often worst
case some bipolar linear device parameters (e.g. input bias current or maximum output load current)
exhibit more degradation with 0 V bias."
The devices were irradiated to a maximum total ionizing dose level of 50krad(Si) with incremental
readings at 10krad(Si), 20krad(Si), 30krad(Si) and 40krad(Si). Electrical testing occurred within one
hour following the end of each irradiation segment. For intermediate irradiations, the units were tested
and returned to total dose exposure within two ours from the end of the previous radiation increment.
The radiation exposure bias board was positioned in the Co-60 cell to provide the targeted dose rate of
10mrad(Si)/s and was located inside a lead-aluminum enclosure. The lead-aluminum enclosure is
required under MIL-STD-883H TM1019.8 Section 3.4 that reads as follows: "Lead/Aluminum (Pb/Al)
container. Test specimens shall be enclosed in a Pb/Al container to minimize dose enhancement effects
caused by low-energy, scattered radiation. A minimum of 1.5 mm Pb, surrounding an inner shield of at
least 0.7 mm Al, is required. This Pb/Al container produces an approximate charged particle equilibrium
for Si and for TLDs such as CaF2. The radiation field intensity shall be measured inside the Pb/Al
container (1) initially, (2) when the source is changed, or (3) when the orientation or configuration of the
source, container, or test-fixture is changed. This measurement shall be performed by placing a
dosimeter (e.g., a TLD) in the device-irradiation container at the approximate test-device position. If it
can be demonstrated that low energy scattered radiation is small enough that it will not cause dosimetry
errors due to dose enhancement, the Pb/Al container may be omitted".
The final dose rate within the lead-aluminum box was determined based on TLD dosimetry
measurements just prior to the beginning of the total dose irradiations. The final dose rate for this work
was 10mrad(Si)/s with a precision of ±5%.
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ELDRS Report
10-417 110310 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
4.0. Tested Parameters
During the radiation lot acceptance testing the following pre- and post-irradiation electrical parameters
were measured:
1. Positive Supply Current
2. Negative Supply Current
3. Input Offset Voltage (Op Amp 1-4)
4. Input Offset Current (Op Amp 1-4)
5. + Input Bias Current (Op Amp 1-4)
6. - Input Bias Current (Op Amp 1-4)
7. CMRR (Op Amp 1-4)
8. PSRR (Op Amp 1-4)
9. Large Signal Voltage Gain RL=500 (Op Amp 1-4)
10. Large Signal Voltage Gain RL=100 (Op Amp 1-4)
11. Channel Separation (Op Amp 1-4, all permutations)
12. Output Voltage Swing High RL=500 (Op Amp 1-4)
13. Output Voltage Swing High RL=100 (Op Amp 1-4)
14. Output Voltage Swing Low RL=500 (Op Amp 1-4)
15. Output Voltage Swing Low RL=100 (Op Amp 1-4)
16. Maximum Output Source Current (Op Amp 1-4)
17. Maximum Output Sink Current (Op Amp 1-4)
18. Positive Short-Circuit Current (Op Amp 1-4)
19. Negative Short-Circuit Current (Op Amp 1-4)
The parametric data was obtained as "read and record" and all the raw data plus an attributes summary
are contained in this report as well as in a separate Excel file. The attributes data contains the average,
standard deviation and the average with the KTL values applied. The KTL value used in this work is
2.742 per MIL-HDBK-814 using one sided tolerance limits of 90/90 and a 5-piece sample size. The
90/90 KTL values were selected to match the statistical levels specified in the MIL-PRF-38535
sampling plan for the qualification of a radiation hardness assured (RHA) component. Note that the
following criteria must be met for a device to pass the low dose rate test: following the radiation
exposure each of the 5 pieces irradiated under electrical bias shall pass the specification value. The units
irradiated without electrical bias and the KTL statistics are included in this report for reference only. If
any of the 5 pieces irradiated under electrical bias exceed the datasheet specifications, then the lot could
be logged as a failure.
Further, MIL-STD-883H, TM 1019.8 Section 3.13.1.1 Characterization test to determine if a part
exhibits ELDRS' states the following: Select a minimum random sample of 21 devices from a
population representative of recent production runs. Smaller sample sizes may be used if agreed upon
between the parties to the test. All of the selected devices shall have undergone appropriate elevated
temperature reliability screens, e.g. burn-in and high temperature storage life. Divide the samples into
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ELDRS Report
10-417 110310 R1.1
Radiation Assured Devices
5017 N. 30th Street
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(719) 531-0800
four groups of 5 each and use the remaining part for a control. Perform pre-irradiation electrical
characterization on all parts assuring that they meet the Group A electrical tests. Irradiate 5 samples
under a 0 volt bias and another 5 under the irradiation bias given in the acquisition specification at 50300 rad(Si)/s and room temperature. Irradiate 5 samples under a 0 volt bias and another 5 under
irradiation bias given in the acquisition specification at < 10mrad(Si)/s and room temperature. Irradiate
all samples to the same dose levels, including 0.5 and 1.0 times the anticipated specification dose, and
repeat the electrical characterization on each part at each dose level. Post irradiation electrical
measurements shall be performed per paragraph 3.10 where the low dose rate test is considered
Condition D. Calculate the radiation induced change in each electrical parameter (para) for each
sample at each radiation level. Calculate the ratio of the median para at low dose rate to the median
para at high dose rate for each irradiation bias group at each total dose level. If this ratio exceeds 1.5
for any of the most sensitive parameters then the part is considered to be ELDRS susceptible. This test
does not apply to parameters which exhibit changes that are within experimental error or whose values
are below the pre-irradiation electrical specification limits at low dose rate at the specification dose.
Therefore, the data in this report can be analyzed along with the high dose rate report titled "Total
Ionizing Dose (TID) Radiation Testing of the RH1814MW Quad Op Amp for Linear Technology" to
demonstrate that these parts do not exhibit ELDRS as defined in the current test method.
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ELDRS Report
10-417 110310 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
5.0. ELDRS Test Results
Based on this criterion the RH1814MW Quad Operational Amplifier (from the lot date code identified
on the first page of this test report) PASSED the enhanced low dose rate sensitivity test to the maximum
tested dose level of 50krad(Si) with all parameters remaining within their datasheet specifications.
Figures 5.1 through 5.152 show plots of all the measured parameters versus total ionizing dose while
Tables 5.1 - 5.152 show the corresponding raw data for each of these parameters. In the data plots the
solid diamonds are the average of the measured data points for the sample irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the units irradiated with all
pins tied to ground. The black lines (solid or dashed) are the average of the data points after application
of the KTL statistics on the sample irradiated in the biased condition while the shaded lines (solid or
dashed) are the average of the data points after application of the KTL statistics on the sample irradiated
in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
In addition to the radiation test results, the data plots and tables described above contain anneal data.
The anneals are performed to better understand the underlying physical mechanisms responsible for
radiation-induced parametric shifts and are not part of the criteria used to establish whether or not the lot
passes or fails the low dose rate test. In all cases the parts either improved or exhibited no change during
the anneal.
The control units, as expected, show no significant changes to any of the parameters. Therefore we can
conclude that the electrical testing remained in control throughout the duration of the tests and the
observed degradation was due to the radiation exposure. Appendix D lists the figures used in this section
to facilitate the location of a particular parameter.
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ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Positive Supply Current @+/-5V (A)
1.50E-02
1.45E-02
1.40E-02
1.35E-02
1.30E-02
1.25E-02
1.20E-02
1.15E-02
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.1. Plot of Positive Supply Current @+/-5V (A) versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
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ELDRS Report
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Table 5.1. Raw data for Positive Supply Current @+/-5V (A) versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
Positive Supply Current @+/-5V (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
50
1.28E-02
1.28E-02
1.22E-02
1.27E-02
1.31E-02
1.23E-02
1.08E-02
1.29E-02
1.22E-02
1.24E-02
1.29E-02
1.29E-02
24-hr
Anneal
60
1.29E-02
1.29E-02
1.22E-02
1.26E-02
1.31E-02
1.23E-02
1.09E-02
1.29E-02
1.22E-02
1.24E-02
1.29E-02
1.29E-02
168-hr
Anneal
70
1.30E-02
1.30E-02
1.23E-02
1.28E-02
1.32E-02
1.25E-02
1.10E-02
1.30E-02
1.23E-02
1.25E-02
1.28E-02
1.29E-02
1.28E-02
3.41E-04
1.38E-02
1.19E-02
1.27E-02
3.04E-04
1.36E-02
1.19E-02
1.27E-02
3.55E-04
1.37E-02
1.18E-02
1.28E-02
3.58E-04
1.38E-02
1.19E-02
1.22E-02
7.70E-04
1.43E-02
1.01E-02
1.44E-02
N/A
1.21E-02
7.69E-04
1.42E-02
1.00E-02
1.44E-02
PASS
1.21E-02
7.68E-04
1.43E-02
1.00E-02
1.44E-02
PASS
1.23E-02
7.64E-04
1.43E-02
1.02E-02
1.44E-02
PASS
0
1.29E-02
1.28E-02
1.22E-02
1.26E-02
1.31E-02
1.25E-02
1.10E-02
1.30E-02
1.24E-02
1.25E-02
1.29E-02
1.29E-02
Total Dose (krad(Si))
10
20
30
40
1.30E-02 1.30E-02 1.29E-02 1.30E-02
1.29E-02 1.29E-02 1.28E-02 1.29E-02
1.23E-02 1.22E-02 1.22E-02 1.23E-02
1.27E-02 1.27E-02 1.27E-02 1.28E-02
1.32E-02 1.31E-02 1.31E-02 1.32E-02
1.25E-02 1.24E-02 1.24E-02 1.24E-02
1.10E-02 1.09E-02 1.09E-02 1.09E-02
1.30E-02 1.30E-02 1.30E-02 1.30E-02
1.24E-02 1.23E-02 1.23E-02 1.23E-02
1.25E-02 1.25E-02 1.25E-02 1.25E-02
1.30E-02 1.29E-02 1.29E-02 1.29E-02
1.29E-02 1.29E-02 1.29E-02 1.29E-02
1.27E-02
3.41E-04
1.37E-02
1.18E-02
1.28E-02
3.48E-04
1.38E-02
1.19E-02
1.28E-02
3.43E-04
1.37E-02
1.18E-02
1.27E-02
3.47E-04
1.37E-02
1.18E-02
1.23E-02
7.72E-04
1.44E-02
1.01E-02
1.44E-02
PASS
1.23E-02
7.72E-04
1.44E-02
1.02E-02
1.44E-02
PASS
1.22E-02
7.65E-04
1.43E-02
1.01E-02
1.44E-02
PASS
1.22E-02
7.62E-04
1.43E-02
1.01E-02
1.44E-02
N/A
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ELDRS Report
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Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Negative Supply Current @+/-5V (A)
-1.20E-02
-1.25E-02
-1.30E-02
-1.35E-02
-1.40E-02
-1.45E-02
-1.50E-02
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.2. Plot of Negative Supply Current @+/-5V (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
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ELDRS Report
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Table 5.2. Raw data for Negative Supply Current @+/-5V (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Negative Supply Current @+/-5V (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
-1.29E-02
-1.28E-02
-1.23E-02
-1.27E-02
-1.31E-02
-1.23E-02
-1.09E-02
-1.29E-02
-1.22E-02
-1.24E-02
-1.29E-02
-1.29E-02
24-hr
Anneal
60
-1.29E-02
-1.29E-02
-1.22E-02
-1.27E-02
-1.32E-02
-1.24E-02
-1.09E-02
-1.30E-02
-1.23E-02
-1.24E-02
-1.29E-02
-1.30E-02
168-hr
Anneal
70
-1.30E-02
-1.30E-02
-1.23E-02
-1.28E-02
-1.33E-02
-1.25E-02
-1.10E-02
-1.30E-02
-1.24E-02
-1.25E-02
-1.29E-02
-1.29E-02
0
-1.29E-02
-1.29E-02
-1.22E-02
-1.27E-02
-1.32E-02
-1.25E-02
-1.10E-02
-1.30E-02
-1.24E-02
-1.26E-02
-1.29E-02
-1.29E-02
10
-1.30E-02
-1.30E-02
-1.23E-02
-1.27E-02
-1.32E-02
-1.25E-02
-1.10E-02
-1.31E-02
-1.24E-02
-1.26E-02
-1.30E-02
-1.30E-02
Total Dose (krad(Si))
20
30
-1.30E-02 -1.29E-02
-1.29E-02 -1.29E-02
-1.23E-02 -1.22E-02
-1.27E-02 -1.27E-02
-1.32E-02 -1.32E-02
-1.25E-02 -1.25E-02
-1.10E-02 -1.10E-02
-1.30E-02 -1.30E-02
-1.23E-02 -1.23E-02
-1.25E-02 -1.25E-02
-1.29E-02 -1.30E-02
-1.29E-02 -1.30E-02
-1.28E-02
3.42E-04
-1.18E-02
-1.37E-02
-1.29E-02
3.53E-04
-1.19E-02
-1.38E-02
-1.28E-02
3.47E-04
-1.19E-02
-1.38E-02
-1.28E-02
3.48E-04
-1.18E-02
-1.37E-02
-1.29E-02
3.45E-04
-1.19E-02
-1.38E-02
-1.28E-02
3.06E-04
-1.19E-02
-1.36E-02
-1.28E-02
3.57E-04
-1.18E-02
-1.38E-02
-1.29E-02
3.63E-04
-1.19E-02
-1.39E-02
-1.23E-02
7.71E-04
-1.02E-02
-1.44E-02
-1.44E-02
PASS
-1.23E-02
7.72E-04
-1.02E-02
-1.44E-02
-1.44E-02
PASS
-1.23E-02
7.66E-04
-1.02E-02
-1.44E-02
-1.44E-02
PASS
-1.22E-02
7.62E-04
-1.02E-02
-1.43E-02
-1.44E-02
N/A
-1.23E-02
7.73E-04
-1.01E-02
-1.44E-02
-1.44E-02
N/A
-1.21E-02
7.71E-04
-1.00E-02
-1.43E-02
-1.44E-02
PASS
-1.22E-02
7.75E-04
-1.01E-02
-1.43E-02
-1.44E-02
PASS
-1.23E-02
7.70E-04
-1.02E-02
-1.44E-02
-1.44E-02
PASS
40
-1.30E-02
-1.29E-02
-1.23E-02
-1.28E-02
-1.32E-02
-1.24E-02
-1.10E-02
-1.30E-02
-1.23E-02
-1.25E-02
-1.30E-02
-1.29E-02
An ISO 9001:2008 and DSCC Certified Company
11
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Voltage @+/-5V #1 (V)
5.00E-03
4.00E-03
3.00E-03
2.00E-03
1.00E-03
0.00E+00
-1.00E-03
-2.00E-03
-3.00E-03
-4.00E-03
-5.00E-03
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.3. Plot of Input Offset Voltage @+/-5V #1 (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
12
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.3. Raw data for Input Offset Voltage @+/-5V #1 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Input Offset Voltage @+/-5V #1 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
50
1.14E-04
-4.44E-04
-2.61E-04
3.45E-04
-2.95E-04
3.97E-04
8.60E-05
1.72E-04
-7.95E-04
3.19E-04
3.30E-05
2.30E-05
24-hr
Anneal
60
1.17E-04
-4.44E-04
-2.66E-04
3.42E-04
-2.92E-04
3.93E-04
7.80E-05
1.72E-04
-8.09E-04
3.18E-04
3.40E-05
1.90E-05
168-hr
Anneal
70
-2.40E-05
-6.05E-04
-3.91E-04
1.76E-04
-4.28E-04
1.95E-04
-8.50E-05
6.30E-05
-9.65E-04
1.03E-04
2.80E-05
8.00E-06
0
4.60E-05
-5.20E-04
-3.25E-04
2.78E-04
-3.55E-04
2.68E-04
-5.90E-05
1.07E-04
-9.56E-04
1.47E-04
3.90E-05
4.00E-05
10
5.70E-05
-5.19E-04
-3.30E-04
2.81E-04
-3.59E-04
2.87E-04
-3.80E-05
1.22E-04
-9.36E-04
1.72E-04
3.80E-05
3.60E-05
Total Dose (krad(Si))
20
30
7.40E-05 9.00E-05
-4.95E-04 -4.72E-04
-3.04E-04 -2.90E-04
3.07E-04 3.25E-04
-3.44E-04 -3.22E-04
3.09E-04 3.40E-04
-1.50E-05 2.20E-05
1.34E-04 1.51E-04
-9.04E-04 -8.70E-04
1.99E-04 2.42E-04
3.60E-05 3.40E-05
3.40E-05 1.90E-05
-1.75E-04
3.27E-04
7.22E-04
-1.07E-03
-1.74E-04
3.31E-04
7.33E-04
-1.08E-03
-1.52E-04
3.31E-04
7.56E-04
-1.06E-03
-1.34E-04
3.30E-04
7.70E-04
-1.04E-03
-1.15E-04
3.29E-04
7.87E-04
-1.02E-03
-1.08E-04
3.26E-04
7.86E-04
-1.00E-03
-1.09E-04
3.26E-04
7.85E-04
-1.00E-03
-2.54E-04
3.20E-04
6.24E-04
-1.13E-03
-9.86E-05
4.93E-04
1.25E-03
-1.45E-03
-1.50E-03
PASS
1.50E-03
PASS
-7.86E-05
4.93E-04
1.27E-03
-1.43E-03
-2.00E-03
PASS
2.00E-03
PASS
-5.54E-05
4.89E-04
1.28E-03
-1.40E-03
-2.00E-03
PASS
2.00E-03
PASS
-2.30E-05
4.88E-04
1.31E-03
-1.36E-03
-2.67E-03
N/A
2.67E-03
N/A
6.40E-06
4.87E-04
1.34E-03
-1.33E-03
-3.33E-03
N/A
3.33E-03
N/A
3.58E-05
4.80E-04
1.35E-03
-1.28E-03
-4.00E-03
PASS
4.00E-03
PASS
3.04E-05
4.85E-04
1.36E-03
-1.30E-03
-4.00E-03
PASS
4.00E-03
PASS
-1.38E-04
4.73E-04
1.16E-03
-1.44E-03
-4.00E-03
PASS
4.00E-03
PASS
40
1.09E-04
-4.52E-04
-2.74E-04
3.42E-04
-3.02E-04
3.71E-04
5.50E-05
1.68E-04
-8.39E-04
2.77E-04
3.40E-05
2.20E-05
An ISO 9001:2008 and DSCC Certified Company
13
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Voltage @+/-5V #2 (V)
5.00E-03
4.00E-03
3.00E-03
2.00E-03
1.00E-03
0.00E+00
-1.00E-03
-2.00E-03
-3.00E-03
-4.00E-03
-5.00E-03
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.4. Plot of Input Offset Voltage @+/-5V #2 (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
14
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.4. Raw data for Input Offset Voltage @+/-5V #2 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Input Offset Voltage @+/-5V #2 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
50
-3.90E-05
-7.01E-04
-6.70E-05
2.77E-04
-3.38E-04
3.64E-04
-9.60E-05
-1.93E-04
1.55E-04
-2.49E-04
-6.70E-05
2.91E-04
24-hr
Anneal
60
-3.90E-05
-7.03E-04
-7.20E-05
2.72E-04
-3.38E-04
3.57E-04
-1.02E-04
-1.97E-04
1.43E-04
-2.57E-04
-6.60E-05
2.87E-04
168-hr
Anneal
70
-2.18E-04
-8.08E-04
-2.43E-04
1.34E-04
-5.09E-04
1.64E-04
-2.57E-04
-3.10E-04
-6.70E-05
-4.29E-04
-6.80E-05
2.86E-04
0
-9.30E-05
-7.63E-04
-1.42E-04
2.00E-04
-4.35E-04
1.80E-04
-2.14E-04
-2.48E-04
-1.40E-05
-3.79E-04
-6.30E-05
3.00E-04
10
-8.70E-05
-7.59E-04
-1.38E-04
2.04E-04
-4.30E-04
2.02E-04
-1.98E-04
-2.33E-04
8.00E-06
-3.54E-04
-5.80E-05
3.00E-04
Total Dose (krad(Si))
20
30
-7.90E-05 -6.60E-05
-7.32E-04 -7.15E-04
-1.12E-04 -9.10E-05
2.30E-04 2.52E-04
-4.05E-04 -3.74E-04
2.34E-04 2.79E-04
-1.75E-04 -1.52E-04
-2.29E-04 -2.19E-04
3.60E-05 7.30E-05
-3.34E-04 -3.09E-04
-5.90E-05 -5.80E-05
2.97E-04 2.87E-04
-2.47E-04
3.66E-04
7.57E-04
-1.25E-03
-2.42E-04
3.66E-04
7.62E-04
-1.25E-03
-2.20E-04
3.64E-04
7.79E-04
-1.22E-03
-1.99E-04
3.64E-04
7.99E-04
-1.20E-03
-1.80E-04
3.65E-04
8.21E-04
-1.18E-03
-1.74E-04
3.67E-04
8.32E-04
-1.18E-03
-1.76E-04
3.65E-04
8.26E-04
-1.18E-03
-3.29E-04
3.52E-04
6.37E-04
-1.29E-03
-1.35E-04
2.19E-04
4.66E-04
-7.36E-04
-1.50E-03
PASS
1.50E-03
PASS
-1.15E-04
2.20E-04
4.88E-04
-7.18E-04
-2.00E-03
PASS
2.00E-03
PASS
-9.36E-05
2.27E-04
5.30E-04
-7.17E-04
-2.00E-03
PASS
2.00E-03
PASS
-6.56E-05
2.39E-04
5.89E-04
-7.21E-04
-2.67E-03
N/A
2.67E-03
N/A
-3.56E-05
2.48E-04
6.45E-04
-7.16E-04
-3.33E-03
N/A
3.33E-03
N/A
-3.80E-06
2.57E-04
7.02E-04
-7.09E-04
-4.00E-03
PASS
4.00E-03
PASS
-1.12E-05
2.56E-04
6.91E-04
-7.14E-04
-4.00E-03
PASS
4.00E-03
PASS
-1.80E-04
2.32E-04
4.57E-04
-8.17E-04
-4.00E-03
PASS
4.00E-03
PASS
40
-4.30E-05
-6.99E-04
-7.20E-05
2.70E-04
-3.55E-04
3.20E-04
-1.21E-04
-2.06E-04
1.13E-04
-2.84E-04
-6.50E-05
2.89E-04
An ISO 9001:2008 and DSCC Certified Company
15
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Voltage @+/-5V #3 (V)
5.00E-03
4.00E-03
3.00E-03
2.00E-03
1.00E-03
0.00E+00
-1.00E-03
-2.00E-03
-3.00E-03
-4.00E-03
-5.00E-03
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.5. Plot of Input Offset Voltage @+/-5V #3 (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
16
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.5. Raw data for Input Offset Voltage @+/-5V #3 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Input Offset Voltage @+/-5V #3 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
50
-6.70E-04
7.02E-04
1.72E-04
-3.26E-04
-5.66E-04
-3.82E-04
-1.12E-04
-2.87E-04
4.15E-04
6.60E-05
-2.49E-04
3.29E-04
24-hr
Anneal
60
-6.70E-04
7.06E-04
1.64E-04
-3.33E-04
-5.65E-04
-3.94E-04
-1.19E-04
-2.94E-04
4.02E-04
6.20E-05
-2.46E-04
3.23E-04
168-hr
Anneal
70
-8.63E-04
5.72E-04
2.90E-05
-5.04E-04
-7.43E-04
-5.71E-04
-3.08E-04
-4.44E-04
2.20E-04
-1.52E-04
-2.49E-04
3.20E-04
0
-7.29E-04
6.47E-04
9.60E-05
-3.75E-04
-6.56E-04
-5.41E-04
-2.18E-04
-3.63E-04
2.49E-04
-1.80E-05
-2.50E-04
3.32E-04
10
-7.22E-04
6.52E-04
1.06E-04
-3.93E-04
-6.47E-04
-5.12E-04
-2.02E-04
-3.51E-04
2.74E-04
-2.00E-06
-2.43E-04
3.33E-04
Total Dose (krad(Si))
20
30
-7.12E-04 -6.95E-04
6.66E-04 6.83E-04
1.31E-04 1.47E-04
-3.71E-04 -3.56E-04
-6.23E-04 -6.01E-04
-4.84E-04 -4.53E-04
-1.82E-04 -1.60E-04
-3.38E-04 -3.25E-04
3.03E-04 3.41E-04
1.00E-05 3.20E-05
-2.47E-04 -2.43E-04
3.29E-04 3.24E-04
-2.03E-04
5.75E-04
1.37E-03
-1.78E-03
-2.01E-04
5.76E-04
1.38E-03
-1.78E-03
-1.82E-04
5.76E-04
1.40E-03
-1.76E-03
-1.64E-04
5.75E-04
1.41E-03
-1.74E-03
-1.46E-04
5.76E-04
1.43E-03
-1.72E-03
-1.38E-04
5.71E-04
1.43E-03
-1.70E-03
-1.40E-04
5.72E-04
1.43E-03
-1.71E-03
-3.02E-04
5.97E-04
1.33E-03
-1.94E-03
-1.78E-04
3.06E-04
6.62E-04
-1.02E-03
-1.50E-03
PASS
1.50E-03
PASS
-1.59E-04
3.06E-04
6.81E-04
-9.99E-04
-2.00E-03
PASS
2.00E-03
PASS
-1.38E-04
3.07E-04
7.05E-04
-9.81E-04
-2.00E-03
PASS
2.00E-03
PASS
-1.13E-04
3.12E-04
7.43E-04
-9.69E-04
-2.67E-03
N/A
2.67E-03
N/A
-8.82E-05
3.15E-04
7.76E-04
-9.52E-04
-3.33E-03
N/A
3.33E-03
N/A
-6.00E-05
3.16E-04
8.06E-04
-9.26E-04
-4.00E-03
PASS
4.00E-03
PASS
-6.86E-05
3.15E-04
7.96E-04
-9.33E-04
-4.00E-03
PASS
4.00E-03
PASS
-2.51E-04
3.06E-04
5.88E-04
-1.09E-03
-4.00E-03
PASS
4.00E-03
PASS
40
-6.78E-04
7.02E-04
1.64E-04
-3.35E-04
-5.83E-04
-4.21E-04
-1.36E-04
-3.08E-04
3.79E-04
4.50E-05
-2.46E-04
3.25E-04
An ISO 9001:2008 and DSCC Certified Company
17
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Voltage @+/-5V #4 (V)
5.00E-03
4.00E-03
3.00E-03
2.00E-03
1.00E-03
0.00E+00
-1.00E-03
-2.00E-03
-3.00E-03
-4.00E-03
-5.00E-03
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.6. Plot of Input Offset Voltage @+/-5V #4 (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
18
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.6. Raw data for Input Offset Voltage @+/-5V #4 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Input Offset Voltage @+/-5V #4 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
50
-1.34E-04
-3.10E-04
-9.20E-05
1.80E-04
9.00E-06
-3.60E-05
3.44E-04
4.47E-04
3.04E-04
5.46E-04
-1.91E-04
1.07E-04
24-hr
Anneal
60
-1.31E-04
-3.13E-04
-9.80E-05
1.74E-04
1.10E-05
-4.70E-05
3.38E-04
4.47E-04
2.91E-04
5.42E-04
-1.88E-04
1.04E-04
168-hr
Anneal
70
-2.54E-04
-4.69E-04
-2.41E-04
4.20E-05
-1.96E-04
-2.08E-04
1.44E-04
3.34E-04
8.50E-05
3.79E-04
-1.90E-04
1.04E-04
0
-2.01E-04
-3.70E-04
-1.45E-04
1.22E-04
-4.30E-05
-2.01E-04
1.55E-04
3.77E-04
1.43E-04
3.67E-04
-1.89E-04
1.22E-04
10
-1.93E-04
-3.75E-04
-1.34E-04
1.08E-04
-5.30E-05
-1.77E-04
1.85E-04
3.89E-04
1.64E-04
3.95E-04
-1.85E-04
1.20E-04
Total Dose (krad(Si))
20
30
-1.75E-04 -1.60E-04
-3.50E-04 -3.31E-04
-1.30E-04 -1.12E-04
1.38E-04 1.55E-04
-3.50E-05 -1.50E-05
-1.49E-04 -1.13E-04
2.16E-04 2.55E-04
3.99E-04 4.15E-04
1.91E-04 2.28E-04
4.26E-04 4.67E-04
-1.89E-04 -1.86E-04
1.18E-04 1.03E-04
-1.27E-04
1.83E-04
3.74E-04
-6.29E-04
-1.29E-04
1.78E-04
3.58E-04
-6.17E-04
-1.10E-04
1.80E-04
3.83E-04
-6.03E-04
-9.26E-05
1.80E-04
4.00E-04
-5.85E-04
-7.48E-05
1.82E-04
4.24E-04
-5.74E-04
-6.94E-05
1.81E-04
4.27E-04
-5.65E-04
-7.14E-05
1.80E-04
4.22E-04
-5.65E-04
-2.24E-04
1.82E-04
2.76E-04
-7.23E-04
1.68E-04
2.35E-04
8.12E-04
-4.75E-04
-1.50E-03
PASS
1.50E-03
PASS
1.91E-04
2.33E-04
8.30E-04
-4.47E-04
-2.00E-03
PASS
2.00E-03
PASS
2.17E-04
2.30E-04
8.47E-04
-4.14E-04
-2.00E-03
PASS
2.00E-03
PASS
2.50E-04
2.27E-04
8.74E-04
-3.73E-04
-2.67E-03
N/A
2.67E-03
N/A
2.83E-04
2.23E-04
8.94E-04
-3.27E-04
-3.33E-03
N/A
3.33E-03
N/A
3.21E-04
2.21E-04
9.26E-04
-2.84E-04
-4.00E-03
PASS
4.00E-03
PASS
3.14E-04
2.24E-04
9.29E-04
-3.01E-04
-4.00E-03
PASS
4.00E-03
PASS
1.47E-04
2.34E-04
7.88E-04
-4.94E-04
-4.00E-03
PASS
4.00E-03
PASS
40
-1.40E-04
-3.16E-04
-9.60E-05
1.78E-04
0.00E+00
-7.70E-05
2.93E-04
4.35E-04
2.69E-04
4.96E-04
-1.85E-04
1.07E-04
An ISO 9001:2008 and DSCC Certified Company
19
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Current @+/-5V #1 (A)
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.7. Plot of Input Offset Current @+/-5V #1 (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
20
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.7. Raw data for Input Offset Current @+/-5V #1 (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Input Offset Current @+/-5V #1 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
50
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
-2.00E-08
-5.00E-08
2.00E-08
2.00E-08
24-hr
Anneal
60
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
-2.00E-08
-4.00E-08
2.00E-08
2.00E-08
168-hr
Anneal
70
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
-1.00E-08
2.00E-08
2.00E-08
0
8.99E-09
3.75E-09
-1.63E-09
-1.85E-09
-3.10E-09
-4.79E-09
5.71E-09
8.50E-09
-4.98E-09
2.07E-09
2.19E-08
1.67E-08
10
1.02E-08
4.48E-09
-7.00E-11
-8.10E-10
-2.37E-09
-2.53E-09
4.96E-09
9.54E-09
-8.26E-09
-6.49E-09
2.18E-08
1.64E-08
Total Dose (krad(Si))
20
30
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 -1.00E-08
-2.00E-08 -3.00E-08
2.00E-08 2.00E-08
2.00E-08 2.00E-08
1.23E-09
5.07E-09
1.51E-08
-1.27E-08
2.28E-09
5.09E-09
1.62E-08
-1.17E-08
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
1.30E-09
6.09E-09
1.80E-08
-1.54E-08
-4.00E-07
PASS
4.00E-07
PASS
-5.56E-10
7.60E-09
2.03E-08
-2.14E-08
-5.00E-07
PASS
5.00E-07
PASS
-4.00E-09
8.94E-09
2.05E-08
-2.85E-08
-5.00E-07
PASS
5.00E-07
PASS
-8.00E-09
1.30E-08
2.78E-08
-4.38E-08
-5.83E-07
N/A
5.83E-07
N/A
-8.00E-09
1.30E-08
2.78E-08
-4.38E-08
-6.67E-07
N/A
6.67E-07
N/A
-1.40E-08
2.19E-08
4.61E-08
-7.41E-08
-7.50E-07
PASS
7.50E-07
PASS
-1.20E-08
1.79E-08
3.71E-08
-6.11E-08
-7.50E-07
PASS
7.50E-07
PASS
-2.00E-09
4.47E-09
1.03E-08
-1.43E-08
-7.50E-07
PASS
7.50E-07
PASS
40
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
-1.00E-08
-3.00E-08
2.00E-08
2.00E-08
An ISO 9001:2008 and DSCC Certified Company
21
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Current @+/-5V #2 (A)
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.8. Plot of Input Offset Current @+/-5V #2 (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
22
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.8. Raw data for Input Offset Current @+/-5V #2 (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Input Offset Current @+/-5V #2 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
50
0.00E+00
2.00E-08
0.00E+00
-1.00E-08
0.00E+00
0.00E+00
1.00E-08
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
24-hr
Anneal
60
0.00E+00
2.00E-08
0.00E+00
-1.00E-08
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
168-hr
Anneal
70
0.00E+00
2.00E-08
0.00E+00
-1.00E-08
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0
9.00E-10
1.86E-08
-8.80E-10
-8.44E-09
3.70E-10
-3.51E-09
7.22E-09
1.13E-09
3.71E-09
-3.77E-09
7.37E-09
1.73E-09
10
8.20E-10
2.00E-08
-1.05E-09
-1.00E-08
-1.19E-09
-4.99E-09
8.09E-09
-2.00E-10
3.98E-09
-4.04E-09
7.88E-09
1.53E-09
Total Dose (krad(Si))
20
30
0.00E+00 0.00E+00
2.00E-08 2.00E-08
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
2.11E-09
9.95E-09
2.94E-08
-2.52E-08
1.72E-09
1.11E-08
3.20E-08
-2.86E-08
4.00E-09
8.94E-09
2.85E-08
-2.05E-08
4.00E-09
8.94E-09
2.85E-08
-2.05E-08
2.00E-09
1.10E-08
3.20E-08
-2.80E-08
2.00E-09
1.10E-08
3.20E-08
-2.80E-08
2.00E-09
1.10E-08
3.20E-08
-2.80E-08
2.00E-09
1.10E-08
3.20E-08
-2.80E-08
9.56E-10
4.72E-09
1.39E-08
-1.20E-08
-4.00E-07
PASS
4.00E-07
PASS
5.68E-10
5.50E-09
1.56E-08
-1.45E-08
-5.00E-07
PASS
5.00E-07
PASS
0.00E+00
0.00E+00
0.00E+00
0.00E+00
-5.00E-07
PASS
5.00E-07
PASS
0.00E+00
0.00E+00
0.00E+00
0.00E+00
-5.83E-07
N/A
5.83E-07
N/A
0.00E+00
0.00E+00
0.00E+00
0.00E+00
-6.67E-07
N/A
6.67E-07
N/A
2.00E-09
4.47E-09
1.43E-08
-1.03E-08
-7.50E-07
PASS
7.50E-07
PASS
0.00E+00
0.00E+00
0.00E+00
0.00E+00
-7.50E-07
PASS
7.50E-07
PASS
0.00E+00
0.00E+00
0.00E+00
0.00E+00
-7.50E-07
PASS
7.50E-07
PASS
40
0.00E+00
2.00E-08
0.00E+00
-1.00E-08
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
An ISO 9001:2008 and DSCC Certified Company
23
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Current @+/-5V #3 (A)
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.9. Plot of Input Offset Current @+/-5V #3 (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
24
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.9. Raw data for Input Offset Current @+/-5V #3 (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Input Offset Current @+/-5V #3 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
50
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
-1.00E-08
0.00E+00
1.00E-08
0.00E+00
0.00E+00
1.00E-08
1.00E-08
24-hr
Anneal
60
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
1.00E-08
1.00E-08
168-hr
Anneal
70
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
1.00E-08
1.00E-08
0
4.38E-09
1.25E-09
1.81E-09
-1.44E-09
4.02E-09
-4.64E-09
0.00E+00
4.67E-09
-1.51E-09
-4.45E-09
1.17E-08
1.04E-08
10
4.12E-09
3.00E-10
4.70E-10
-1.62E-09
4.07E-09
-5.37E-09
-3.00E-11
6.94E-09
-1.43E-09
-3.98E-09
1.20E-08
1.14E-08
Total Dose (krad(Si))
20
30
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
1.00E-08 1.00E-08
1.00E-08 0.00E+00
2.00E-09
2.35E-09
8.46E-09
-4.45E-09
1.47E-09
2.53E-09
8.42E-09
-5.48E-09
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
-1.19E-09
3.82E-09
9.29E-09
-1.17E-08
-4.00E-07
PASS
4.00E-07
PASS
-7.74E-10
4.79E-09
1.24E-08
-1.39E-08
-5.00E-07
PASS
5.00E-07
PASS
0.00E+00
0.00E+00
0.00E+00
0.00E+00
-5.00E-07
PASS
5.00E-07
PASS
0.00E+00
0.00E+00
0.00E+00
0.00E+00
-5.83E-07
N/A
5.83E-07
N/A
0.00E+00
0.00E+00
0.00E+00
0.00E+00
-6.67E-07
N/A
6.67E-07
N/A
0.00E+00
7.07E-09
1.94E-08
-1.94E-08
-7.50E-07
PASS
7.50E-07
PASS
0.00E+00
0.00E+00
0.00E+00
0.00E+00
-7.50E-07
PASS
7.50E-07
PASS
0.00E+00
0.00E+00
0.00E+00
0.00E+00
-7.50E-07
PASS
7.50E-07
PASS
40
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
1.00E-08
1.00E-08
An ISO 9001:2008 and DSCC Certified Company
25
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Current @+/-5V #4 (A)
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.10. Plot of Input Offset Current @+/-5V #4 (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
26
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.10. Raw data for Input Offset Current @+/-5V #4 (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Input Offset Current @+/-5V #4 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
50
0.00E+00
0.00E+00
1.00E-08
1.00E-08
0.00E+00
1.00E-08
0.00E+00
0.00E+00
1.00E-08
-1.00E-08
1.00E-08
0.00E+00
24-hr
Anneal
60
0.00E+00
0.00E+00
1.00E-08
1.00E-08
0.00E+00
2.00E-08
0.00E+00
0.00E+00
1.00E-08
0.00E+00
1.00E-08
0.00E+00
168-hr
Anneal
70
0.00E+00
0.00E+00
1.00E-08
1.00E-08
0.00E+00
2.00E-08
0.00E+00
0.00E+00
1.00E-08
0.00E+00
1.00E-08
0.00E+00
0
5.03E-09
-6.59E-09
1.34E-08
1.55E-08
-7.55E-09
2.23E-08
5.41E-09
6.60E-09
1.69E-08
-6.78E-09
1.32E-08
4.00E-09
10
2.80E-09
-6.24E-09
1.29E-08
1.41E-08
-7.28E-09
1.89E-08
4.80E-09
6.43E-09
1.64E-08
-5.95E-09
1.40E-08
3.36E-09
Total Dose (krad(Si))
20
30
0.00E+00 0.00E+00
0.00E+00 0.00E+00
1.00E-08 1.00E-08
1.00E-08 1.00E-08
-1.00E-08 0.00E+00
2.00E-08 2.00E-08
0.00E+00 0.00E+00
0.00E+00 0.00E+00
2.00E-08 1.00E-08
0.00E+00 0.00E+00
1.00E-08 1.00E-08
0.00E+00 0.00E+00
3.95E-09
1.08E-08
3.36E-08
-2.57E-08
3.26E-09
1.01E-08
3.11E-08
-2.46E-08
2.00E-09
8.37E-09
2.49E-08
-2.09E-08
4.00E-09
5.48E-09
1.90E-08
-1.10E-08
4.00E-09
5.48E-09
1.90E-08
-1.10E-08
4.00E-09
5.48E-09
1.90E-08
-1.10E-08
4.00E-09
5.48E-09
1.90E-08
-1.10E-08
4.00E-09
5.48E-09
1.90E-08
-1.10E-08
8.87E-09
1.12E-08
3.97E-08
-2.19E-08
-4.00E-07
PASS
4.00E-07
PASS
8.11E-09
9.95E-09
3.54E-08
-1.92E-08
-5.00E-07
PASS
5.00E-07
PASS
8.00E-09
1.10E-08
3.80E-08
-2.20E-08
-5.00E-07
PASS
5.00E-07
PASS
6.00E-09
8.94E-09
3.05E-08
-1.85E-08
-5.83E-07
N/A
5.83E-07
N/A
6.00E-09
8.94E-09
3.05E-08
-1.85E-08
-6.67E-07
N/A
6.67E-07
N/A
2.00E-09
8.37E-09
2.49E-08
-2.09E-08
-7.50E-07
PASS
7.50E-07
PASS
6.00E-09
8.94E-09
3.05E-08
-1.85E-08
-7.50E-07
PASS
7.50E-07
PASS
6.00E-09
8.94E-09
3.05E-08
-1.85E-08
-7.50E-07
PASS
7.50E-07
PASS
40
0.00E+00
0.00E+00
1.00E-08
1.00E-08
0.00E+00
2.00E-08
0.00E+00
0.00E+00
1.00E-08
0.00E+00
1.00E-08
0.00E+00
An ISO 9001:2008 and DSCC Certified Company
27
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @+/-5V #1 (A)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-05
8.00E-06
6.00E-06
4.00E-06
2.00E-06
0.00E+00
-2.00E-06
-4.00E-06
-6.00E-06
-8.00E-06
-1.00E-05
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.11. Plot of Positive Input Bias Current @+/-5V #1 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
28
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.11. Raw data for Positive Input Bias Current @+/-5V #1 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Positive Input Bias Current @+/-5V #1 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
40
1.80E-07
1.90E-07
1.60E-07
1.70E-07
1.90E-07
1.70E-07
1.80E-07
1.90E-07
1.60E-07
1.50E-07
1.80E-07
1.80E-07
50
1.80E-07
1.90E-07
1.60E-07
1.70E-07
1.90E-07
1.80E-07
2.00E-07
2.00E-07
1.70E-07
1.60E-07
1.80E-07
1.80E-07
24-hr
Anneal
60
1.80E-07
1.90E-07
1.60E-07
1.80E-07
1.90E-07
1.80E-07
2.00E-07
2.00E-07
1.70E-07
1.60E-07
1.80E-07
1.80E-07
1.74E-07
1.14E-08
2.05E-07
1.43E-07
1.78E-07
1.30E-08
2.14E-07
1.42E-07
1.78E-07
1.30E-08
2.14E-07
1.42E-07
1.80E-07
1.22E-08
2.14E-07
1.46E-07
1.58E-07
1.30E-08
1.94E-07
1.22E-07
1.66E-07
1.67E-08
2.12E-07
1.20E-07
-5.83E-06
N/A
5.83E-06
N/A
1.70E-07
1.58E-08
2.13E-07
1.27E-07
-6.67E-06
N/A
6.67E-06
N/A
1.82E-07
1.79E-08
2.31E-07
1.33E-07
-7.50E-06
PASS
7.50E-06
PASS
1.82E-07
1.79E-08
2.31E-07
1.33E-07
-7.50E-06
PASS
7.50E-06
PASS
1.60E-07
1.58E-08
2.03E-07
1.17E-07
-7.50E-06
PASS
7.50E-06
PASS
Total Dose (krad(Si))
20
30
1.70E-07 1.70E-07
1.80E-07 1.90E-07
1.60E-07 1.60E-07
1.70E-07 1.70E-07
1.80E-07 1.80E-07
1.60E-07 1.70E-07
1.60E-07 1.70E-07
1.80E-07 1.90E-07
1.40E-07 1.50E-07
1.40E-07 1.50E-07
1.80E-07 1.80E-07
1.80E-07 1.80E-07
0
1.60E-07
1.70E-07
1.50E-07
1.60E-07
1.70E-07
1.50E-07
1.50E-07
1.70E-07
1.20E-07
1.40E-07
1.80E-07
1.80E-07
10
1.60E-07
1.80E-07
1.50E-07
1.60E-07
1.70E-07
1.50E-07
1.60E-07
1.80E-07
1.30E-07
1.40E-07
1.80E-07
1.80E-07
1.62E-07
8.37E-09
1.85E-07
1.39E-07
1.64E-07
1.14E-08
1.95E-07
1.33E-07
1.72E-07
8.37E-09
1.95E-07
1.49E-07
1.46E-07
1.82E-08
1.96E-07
9.62E-08
-4.00E-06
PASS
4.00E-06
PASS
1.52E-07
1.92E-08
2.05E-07
9.93E-08
-5.00E-06
PASS
5.00E-06
PASS
1.56E-07
1.67E-08
2.02E-07
1.10E-07
-5.00E-06
PASS
5.00E-06
PASS
An ISO 9001:2008 and DSCC Certified Company
29
168-hr
Anneal
70
1.60E-07
1.70E-07
1.40E-07
1.50E-07
1.70E-07
1.60E-07
1.70E-07
1.80E-07
1.40E-07
1.50E-07
1.80E-07
1.80E-07
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @+/-5V #2 (A)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-05
8.00E-06
6.00E-06
4.00E-06
2.00E-06
0.00E+00
-2.00E-06
-4.00E-06
-6.00E-06
-8.00E-06
-1.00E-05
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.12. Plot of Positive Input Bias Current @+/-5V #2 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
30
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.12. Raw data for Positive Input Bias Current @+/-5V #2 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Positive Input Bias Current @+/-5V #2 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
40
1.70E-07
1.80E-07
1.40E-07
1.70E-07
1.80E-07
1.70E-07
1.70E-07
1.70E-07
1.70E-07
1.80E-07
1.70E-07
1.70E-07
50
1.70E-07
1.90E-07
1.40E-07
1.70E-07
1.80E-07
1.80E-07
1.80E-07
1.70E-07
1.80E-07
1.90E-07
1.70E-07
1.60E-07
24-hr
Anneal
60
1.80E-07
1.90E-07
1.40E-07
1.80E-07
1.80E-07
1.80E-07
1.80E-07
1.70E-07
1.80E-07
1.90E-07
1.70E-07
1.70E-07
1.66E-07
1.52E-08
2.08E-07
1.24E-07
1.68E-07
1.64E-08
2.13E-07
1.23E-07
1.70E-07
1.87E-08
2.21E-07
1.19E-07
1.74E-07
1.95E-08
2.27E-07
1.21E-07
1.54E-07
1.95E-08
2.07E-07
1.01E-07
1.66E-07
8.94E-09
1.91E-07
1.41E-07
-5.83E-06
N/A
5.83E-06
N/A
1.72E-07
4.47E-09
1.84E-07
1.60E-07
-6.67E-06
N/A
6.67E-06
N/A
1.80E-07
7.07E-09
1.99E-07
1.61E-07
-7.50E-06
PASS
7.50E-06
PASS
1.80E-07
7.07E-09
1.99E-07
1.61E-07
-7.50E-06
PASS
7.50E-06
PASS
1.58E-07
8.37E-09
1.81E-07
1.35E-07
-7.50E-06
PASS
7.50E-06
PASS
Total Dose (krad(Si))
20
30
1.70E-07 1.70E-07
1.80E-07 1.80E-07
1.40E-07 1.40E-07
1.70E-07 1.70E-07
1.70E-07 1.70E-07
1.50E-07 1.60E-07
1.50E-07 1.60E-07
1.60E-07 1.70E-07
1.50E-07 1.60E-07
1.70E-07 1.80E-07
1.70E-07 1.70E-07
1.60E-07 1.70E-07
0
1.60E-07
1.70E-07
1.30E-07
1.60E-07
1.60E-07
1.40E-07
1.40E-07
1.60E-07
1.40E-07
1.60E-07
1.70E-07
1.70E-07
10
1.60E-07
1.70E-07
1.30E-07
1.60E-07
1.60E-07
1.50E-07
1.40E-07
1.60E-07
1.50E-07
1.70E-07
1.70E-07
1.70E-07
1.56E-07
1.52E-08
1.98E-07
1.14E-07
1.56E-07
1.52E-08
1.98E-07
1.14E-07
1.66E-07
1.52E-08
2.08E-07
1.24E-07
1.48E-07
1.10E-08
1.78E-07
1.18E-07
-4.00E-06
PASS
4.00E-06
PASS
1.54E-07
1.14E-08
1.85E-07
1.23E-07
-5.00E-06
PASS
5.00E-06
PASS
1.56E-07
8.94E-09
1.81E-07
1.31E-07
-5.00E-06
PASS
5.00E-06
PASS
An ISO 9001:2008 and DSCC Certified Company
31
168-hr
Anneal
70
1.60E-07
1.70E-07
1.20E-07
1.60E-07
1.60E-07
1.60E-07
1.50E-07
1.60E-07
1.50E-07
1.70E-07
1.70E-07
1.70E-07
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @+/-5V #3 (A)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-05
8.00E-06
6.00E-06
4.00E-06
2.00E-06
0.00E+00
-2.00E-06
-4.00E-06
-6.00E-06
-8.00E-06
-1.00E-05
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.13. Plot of Positive Input Bias Current @+/-5V #3 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
32
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.13. Raw data for Positive Input Bias Current @+/-5V #3 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Positive Input Bias Current @+/-5V #3 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
40
1.70E-07
1.70E-07
1.30E-07
1.90E-07
2.00E-07
1.70E-07
1.60E-07
1.90E-07
1.60E-07
1.90E-07
1.70E-07
1.80E-07
50
1.80E-07
1.80E-07
1.40E-07
1.90E-07
2.10E-07
1.80E-07
1.70E-07
1.90E-07
1.70E-07
2.00E-07
1.70E-07
1.80E-07
24-hr
Anneal
60
1.80E-07
1.80E-07
1.40E-07
1.90E-07
2.10E-07
1.80E-07
1.70E-07
2.00E-07
1.70E-07
2.00E-07
1.70E-07
1.70E-07
1.70E-07
2.55E-08
2.40E-07
1.00E-07
1.72E-07
2.68E-08
2.46E-07
9.84E-08
1.80E-07
2.55E-08
2.50E-07
1.10E-07
1.80E-07
2.55E-08
2.50E-07
1.10E-07
1.56E-07
2.70E-08
2.30E-07
8.19E-08
1.68E-07
1.10E-08
1.98E-07
1.38E-07
-5.83E-06
N/A
5.83E-06
N/A
1.74E-07
1.52E-08
2.16E-07
1.32E-07
-6.67E-06
N/A
6.67E-06
N/A
1.82E-07
1.30E-08
2.18E-07
1.46E-07
-7.50E-06
PASS
7.50E-06
PASS
1.84E-07
1.52E-08
2.26E-07
1.42E-07
-7.50E-06
PASS
7.50E-06
PASS
1.60E-07
1.41E-08
1.99E-07
1.21E-07
-7.50E-06
PASS
7.50E-06
PASS
Total Dose (krad(Si))
20
30
1.70E-07 1.70E-07
1.70E-07 1.70E-07
1.30E-07 1.30E-07
1.90E-07 1.80E-07
1.90E-07 2.00E-07
1.60E-07 1.60E-07
1.50E-07 1.60E-07
1.80E-07 1.80E-07
1.50E-07 1.60E-07
1.70E-07 1.80E-07
1.70E-07 1.70E-07
1.70E-07 1.80E-07
0
1.60E-07
1.70E-07
1.20E-07
1.70E-07
1.80E-07
1.50E-07
1.40E-07
1.70E-07
1.40E-07
1.60E-07
1.70E-07
1.80E-07
10
1.70E-07
1.70E-07
1.20E-07
1.80E-07
1.80E-07
1.50E-07
1.40E-07
1.70E-07
1.50E-07
1.70E-07
1.70E-07
1.80E-07
1.60E-07
2.35E-08
2.24E-07
9.57E-08
1.64E-07
2.51E-08
2.33E-07
9.52E-08
1.70E-07
2.45E-08
2.37E-07
1.03E-07
1.52E-07
1.30E-08
1.88E-07
1.16E-07
-4.00E-06
PASS
4.00E-06
PASS
1.56E-07
1.34E-08
1.93E-07
1.19E-07
-5.00E-06
PASS
5.00E-06
PASS
1.62E-07
1.30E-08
1.98E-07
1.26E-07
-5.00E-06
PASS
5.00E-06
PASS
An ISO 9001:2008 and DSCC Certified Company
33
168-hr
Anneal
70
1.60E-07
1.60E-07
1.10E-07
1.70E-07
1.80E-07
1.50E-07
1.50E-07
1.80E-07
1.50E-07
1.70E-07
1.70E-07
1.80E-07
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @+/-5V #4 (A)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-05
8.00E-06
6.00E-06
4.00E-06
2.00E-06
0.00E+00
-2.00E-06
-4.00E-06
-6.00E-06
-8.00E-06
-1.00E-05
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.14. Plot of Positive Input Bias Current @+/-5V #4 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
34
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.14. Raw data for Positive Input Bias Current @+/-5V #4 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Positive Input Bias Current @+/-5V #4 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
40
1.80E-07
1.70E-07
1.80E-07
2.00E-07
1.80E-07
1.80E-07
1.80E-07
1.80E-07
1.70E-07
1.90E-07
1.60E-07
1.80E-07
50
1.80E-07
1.80E-07
1.80E-07
2.00E-07
1.80E-07
1.90E-07
1.90E-07
1.90E-07
1.70E-07
2.10E-07
1.60E-07
1.70E-07
24-hr
Anneal
60
1.80E-07
1.80E-07
1.80E-07
2.00E-07
1.80E-07
2.00E-07
1.90E-07
1.90E-07
1.70E-07
2.10E-07
1.60E-07
1.70E-07
1.74E-07
8.94E-09
1.99E-07
1.49E-07
1.82E-07
1.10E-08
2.12E-07
1.52E-07
1.84E-07
8.94E-09
2.09E-07
1.59E-07
1.84E-07
8.94E-09
2.09E-07
1.59E-07
1.64E-07
8.94E-09
1.89E-07
1.39E-07
1.74E-07
8.94E-09
1.99E-07
1.49E-07
-5.83E-06
N/A
5.83E-06
N/A
1.80E-07
7.07E-09
1.99E-07
1.61E-07
-6.67E-06
N/A
6.67E-06
N/A
1.90E-07
1.41E-08
2.29E-07
1.51E-07
-7.50E-06
PASS
7.50E-06
PASS
1.92E-07
1.48E-08
2.33E-07
1.51E-07
-7.50E-06
PASS
7.50E-06
PASS
1.64E-07
8.94E-09
1.89E-07
1.39E-07
-7.50E-06
PASS
7.50E-06
PASS
Total Dose (krad(Si))
20
30
1.70E-07 1.70E-07
1.70E-07 1.70E-07
1.70E-07 1.70E-07
1.90E-07 1.90E-07
1.70E-07 1.70E-07
1.70E-07 1.80E-07
1.60E-07 1.70E-07
1.70E-07 1.80E-07
1.50E-07 1.60E-07
1.60E-07 1.80E-07
1.60E-07 1.70E-07
1.70E-07 1.70E-07
0
1.60E-07
1.60E-07
1.60E-07
1.80E-07
1.60E-07
1.60E-07
1.40E-07
1.70E-07
1.40E-07
1.40E-07
1.60E-07
1.70E-07
10
1.60E-07
1.60E-07
1.60E-07
1.90E-07
1.70E-07
1.60E-07
1.50E-07
1.70E-07
1.40E-07
1.50E-07
1.60E-07
1.80E-07
1.64E-07
8.94E-09
1.89E-07
1.39E-07
1.68E-07
1.30E-08
2.04E-07
1.32E-07
1.74E-07
8.94E-09
1.99E-07
1.49E-07
1.50E-07
1.41E-08
1.89E-07
1.11E-07
-4.00E-06
PASS
4.00E-06
PASS
1.54E-07
1.14E-08
1.85E-07
1.23E-07
-5.00E-06
PASS
5.00E-06
PASS
1.62E-07
8.37E-09
1.85E-07
1.39E-07
-5.00E-06
PASS
5.00E-06
PASS
An ISO 9001:2008 and DSCC Certified Company
35
168-hr
Anneal
70
1.60E-07
1.60E-07
1.60E-07
1.80E-07
1.60E-07
1.70E-07
1.60E-07
1.70E-07
1.50E-07
1.70E-07
1.60E-07
1.70E-07
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @+/-5V #1 (A)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-05
8.00E-06
6.00E-06
4.00E-06
2.00E-06
0.00E+00
-2.00E-06
-4.00E-06
-6.00E-06
-8.00E-06
-1.00E-05
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.15. Plot of Negative Input Bias Current @+/-5V #1 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
36
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.15. Raw data for Negative Input Bias Current @+/-5V #1 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Negative Input Bias Current @+/-5V #1 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
40
1.70E-07
1.80E-07
1.60E-07
1.80E-07
1.90E-07
1.80E-07
1.80E-07
1.90E-07
1.70E-07
1.90E-07
1.60E-07
1.70E-07
50
1.70E-07
1.90E-07
1.60E-07
1.80E-07
1.90E-07
1.90E-07
1.90E-07
2.00E-07
1.80E-07
2.10E-07
1.60E-07
1.60E-07
24-hr
Anneal
60
1.70E-07
1.90E-07
1.60E-07
1.80E-07
1.90E-07
1.90E-07
1.90E-07
2.00E-07
1.80E-07
2.10E-07
1.60E-07
1.60E-07
1.72E-07
1.30E-08
2.08E-07
1.36E-07
1.76E-07
1.14E-08
2.07E-07
1.45E-07
1.78E-07
1.30E-08
2.14E-07
1.42E-07
1.78E-07
1.30E-08
2.14E-07
1.42E-07
1.58E-07
1.30E-08
1.94E-07
1.22E-07
1.70E-07
7.07E-09
1.89E-07
1.51E-07
-5.83E-06
N/A
5.83E-06
N/A
1.82E-07
8.37E-09
2.05E-07
1.59E-07
-6.67E-06
N/A
6.67E-06
N/A
1.94E-07
1.14E-08
2.25E-07
1.63E-07
-7.50E-06
PASS
7.50E-06
PASS
1.94E-07
1.14E-08
2.25E-07
1.63E-07
-7.50E-06
PASS
7.50E-06
PASS
1.64E-07
1.14E-08
1.95E-07
1.33E-07
-7.50E-06
PASS
7.50E-06
PASS
Total Dose (krad(Si))
20
30
1.60E-07 1.60E-07
1.80E-07 1.80E-07
1.60E-07 1.60E-07
1.70E-07 1.70E-07
1.80E-07 1.90E-07
1.60E-07 1.70E-07
1.60E-07 1.70E-07
1.70E-07 1.80E-07
1.50E-07 1.60E-07
1.50E-07 1.70E-07
1.60E-07 1.60E-07
1.60E-07 1.70E-07
0
1.50E-07
1.70E-07
1.50E-07
1.60E-07
1.70E-07
1.50E-07
1.50E-07
1.60E-07
1.30E-07
1.40E-07
1.60E-07
1.60E-07
10
1.50E-07
1.80E-07
1.50E-07
1.60E-07
1.80E-07
1.60E-07
1.50E-07
1.70E-07
1.40E-07
1.50E-07
1.60E-07
1.70E-07
1.60E-07
1.00E-08
1.87E-07
1.33E-07
1.64E-07
1.52E-08
2.06E-07
1.22E-07
1.70E-07
1.00E-08
1.97E-07
1.43E-07
1.46E-07
1.14E-08
1.77E-07
1.15E-07
-4.00E-06
PASS
4.00E-06
PASS
1.54E-07
1.14E-08
1.85E-07
1.23E-07
-5.00E-06
PASS
5.00E-06
PASS
1.58E-07
8.37E-09
1.81E-07
1.35E-07
-5.00E-06
PASS
5.00E-06
PASS
An ISO 9001:2008 and DSCC Certified Company
37
168-hr
Anneal
70
1.50E-07
1.70E-07
1.40E-07
1.60E-07
1.70E-07
1.60E-07
1.60E-07
1.80E-07
1.50E-07
1.70E-07
1.60E-07
1.60E-07
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @+/-5V #2 (A)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-05
8.00E-06
6.00E-06
4.00E-06
2.00E-06
0.00E+00
-2.00E-06
-4.00E-06
-6.00E-06
-8.00E-06
-1.00E-05
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.16. Plot of Negative Input Bias Current @+/-5V #2 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
38
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.16. Raw data for Negative Input Bias Current @+/-5V #2 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Negative Input Bias Current @+/-5V #2 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
40
1.70E-07
1.70E-07
1.40E-07
1.90E-07
1.80E-07
1.70E-07
1.60E-07
1.70E-07
1.70E-07
1.90E-07
1.70E-07
1.70E-07
50
1.80E-07
1.70E-07
1.40E-07
1.90E-07
1.80E-07
1.80E-07
1.80E-07
1.70E-07
1.80E-07
1.90E-07
1.70E-07
1.60E-07
24-hr
Anneal
60
1.80E-07
1.70E-07
1.40E-07
1.90E-07
1.90E-07
1.80E-07
1.80E-07
1.80E-07
1.80E-07
2.00E-07
1.70E-07
1.60E-07
1.64E-07
1.52E-08
2.06E-07
1.22E-07
1.70E-07
1.87E-08
2.21E-07
1.19E-07
1.72E-07
1.92E-08
2.25E-07
1.19E-07
1.74E-07
2.07E-08
2.31E-07
1.17E-07
1.52E-07
1.92E-08
2.05E-07
9.93E-08
1.68E-07
1.48E-08
2.09E-07
1.27E-07
-5.83E-06
N/A
5.83E-06
N/A
1.72E-07
1.10E-08
2.02E-07
1.42E-07
-6.67E-06
N/A
6.67E-06
N/A
1.80E-07
7.07E-09
1.99E-07
1.61E-07
-7.50E-06
PASS
7.50E-06
PASS
1.84E-07
8.94E-09
2.09E-07
1.59E-07
-7.50E-06
PASS
7.50E-06
PASS
1.60E-07
1.22E-08
1.94E-07
1.26E-07
-7.50E-06
PASS
7.50E-06
PASS
Total Dose (krad(Si))
20
30
1.70E-07 1.70E-07
1.60E-07 1.60E-07
1.40E-07 1.40E-07
1.80E-07 1.80E-07
1.70E-07 1.70E-07
1.60E-07 1.70E-07
1.40E-07 1.50E-07
1.60E-07 1.70E-07
1.50E-07 1.60E-07
1.70E-07 1.90E-07
1.60E-07 1.70E-07
1.60E-07 1.70E-07
0
1.60E-07
1.50E-07
1.30E-07
1.70E-07
1.60E-07
1.50E-07
1.30E-07
1.50E-07
1.40E-07
1.70E-07
1.70E-07
1.70E-07
10
1.60E-07
1.60E-07
1.30E-07
1.70E-07
1.60E-07
1.50E-07
1.40E-07
1.60E-07
1.50E-07
1.70E-07
1.70E-07
1.70E-07
1.54E-07
1.52E-08
1.96E-07
1.12E-07
1.56E-07
1.52E-08
1.98E-07
1.14E-07
1.64E-07
1.52E-08
2.06E-07
1.22E-07
1.48E-07
1.48E-08
1.89E-07
1.07E-07
-4.00E-06
PASS
4.00E-06
PASS
1.54E-07
1.14E-08
1.85E-07
1.23E-07
-5.00E-06
PASS
5.00E-06
PASS
1.56E-07
1.14E-08
1.87E-07
1.25E-07
-5.00E-06
PASS
5.00E-06
PASS
An ISO 9001:2008 and DSCC Certified Company
39
168-hr
Anneal
70
1.60E-07
1.50E-07
1.20E-07
1.70E-07
1.60E-07
1.60E-07
1.50E-07
1.60E-07
1.50E-07
1.80E-07
1.70E-07
1.60E-07
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @+/-5V #3 (A)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-05
8.00E-06
6.00E-06
4.00E-06
2.00E-06
0.00E+00
-2.00E-06
-4.00E-06
-6.00E-06
-8.00E-06
-1.00E-05
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.17. Plot of Negative Input Bias Current @+/-5V #3 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
40
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.17. Raw data for Negative Input Bias Current @+/-5V #3 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Negative Input Bias Current @+/-5V #3 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
40
1.70E-07
1.80E-07
1.40E-07
1.90E-07
2.00E-07
1.80E-07
1.60E-07
1.80E-07
1.60E-07
1.90E-07
1.60E-07
1.70E-07
50
1.70E-07
1.80E-07
1.40E-07
1.90E-07
2.00E-07
1.90E-07
1.70E-07
1.80E-07
1.70E-07
2.00E-07
1.60E-07
1.60E-07
24-hr
Anneal
60
1.70E-07
1.80E-07
1.40E-07
1.90E-07
2.00E-07
1.90E-07
1.70E-07
1.80E-07
1.70E-07
2.00E-07
1.60E-07
1.70E-07
1.70E-07
2.45E-08
2.37E-07
1.03E-07
1.76E-07
2.30E-08
2.39E-07
1.13E-07
1.76E-07
2.30E-08
2.39E-07
1.13E-07
1.76E-07
2.30E-08
2.39E-07
1.13E-07
1.54E-07
2.07E-08
2.11E-07
9.71E-08
1.70E-07
1.22E-08
2.04E-07
1.36E-07
-5.83E-06
N/A
5.83E-06
N/A
1.74E-07
1.34E-08
2.11E-07
1.37E-07
-6.67E-06
N/A
6.67E-06
N/A
1.82E-07
1.30E-08
2.18E-07
1.46E-07
-7.50E-06
PASS
7.50E-06
PASS
1.82E-07
1.30E-08
2.18E-07
1.46E-07
-7.50E-06
PASS
7.50E-06
PASS
1.62E-07
1.30E-08
1.98E-07
1.26E-07
-7.50E-06
PASS
7.50E-06
PASS
Total Dose (krad(Si))
20
30
1.60E-07 1.70E-07
1.70E-07 1.70E-07
1.30E-07 1.30E-07
1.90E-07 1.90E-07
1.90E-07 1.90E-07
1.60E-07 1.70E-07
1.50E-07 1.60E-07
1.70E-07 1.70E-07
1.50E-07 1.60E-07
1.80E-07 1.90E-07
1.60E-07 1.60E-07
1.60E-07 1.70E-07
0
1.60E-07
1.70E-07
1.20E-07
1.70E-07
1.70E-07
1.50E-07
1.40E-07
1.60E-07
1.50E-07
1.70E-07
1.60E-07
1.70E-07
10
1.60E-07
1.70E-07
1.30E-07
1.80E-07
1.80E-07
1.60E-07
1.40E-07
1.70E-07
1.50E-07
1.70E-07
1.60E-07
1.70E-07
1.58E-07
2.17E-08
2.17E-07
9.86E-08
1.64E-07
2.07E-08
2.21E-07
1.07E-07
1.68E-07
2.49E-08
2.36E-07
9.97E-08
1.54E-07
1.14E-08
1.85E-07
1.23E-07
-4.00E-06
PASS
4.00E-06
PASS
1.58E-07
1.30E-08
1.94E-07
1.22E-07
-5.00E-06
PASS
5.00E-06
PASS
1.62E-07
1.30E-08
1.98E-07
1.26E-07
-5.00E-06
PASS
5.00E-06
PASS
An ISO 9001:2008 and DSCC Certified Company
41
168-hr
Anneal
70
1.50E-07
1.60E-07
1.20E-07
1.70E-07
1.70E-07
1.60E-07
1.50E-07
1.70E-07
1.50E-07
1.80E-07
1.60E-07
1.70E-07
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @+/-5V #4 (A)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-05
8.00E-06
6.00E-06
4.00E-06
2.00E-06
0.00E+00
-2.00E-06
-4.00E-06
-6.00E-06
-8.00E-06
-1.00E-05
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.18. Plot of Negative Input Bias Current @+/-5V #4 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
42
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.18. Raw data for Negative Input Bias Current @+/-5V #4 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Negative Input Bias Current @+/-5V #4 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
40
1.80E-07
1.80E-07
1.60E-07
1.90E-07
1.90E-07
1.70E-07
1.70E-07
1.80E-07
1.50E-07
2.00E-07
1.50E-07
1.70E-07
50
1.80E-07
1.80E-07
1.70E-07
1.90E-07
1.90E-07
1.80E-07
1.90E-07
1.90E-07
1.60E-07
2.20E-07
1.50E-07
1.70E-07
24-hr
Anneal
60
1.80E-07
1.90E-07
1.70E-07
1.90E-07
1.90E-07
1.80E-07
1.80E-07
1.90E-07
1.60E-07
2.20E-07
1.50E-07
1.70E-07
1.74E-07
8.94E-09
1.99E-07
1.49E-07
1.80E-07
1.22E-08
2.14E-07
1.46E-07
1.82E-07
8.37E-09
2.05E-07
1.59E-07
1.84E-07
8.94E-09
2.09E-07
1.59E-07
1.62E-07
8.37E-09
1.85E-07
1.39E-07
1.68E-07
1.64E-08
2.13E-07
1.23E-07
-5.83E-06
N/A
5.83E-06
N/A
1.74E-07
1.82E-08
2.24E-07
1.24E-07
-6.67E-06
N/A
6.67E-06
N/A
1.88E-07
2.17E-08
2.47E-07
1.29E-07
-7.50E-06
PASS
7.50E-06
PASS
1.86E-07
2.19E-08
2.46E-07
1.26E-07
-7.50E-06
PASS
7.50E-06
PASS
1.60E-07
1.58E-08
2.03E-07
1.17E-07
-7.50E-06
PASS
7.50E-06
PASS
Total Dose (krad(Si))
20
30
1.70E-07 1.70E-07
1.70E-07 1.80E-07
1.60E-07 1.60E-07
1.80E-07 1.80E-07
1.80E-07 1.80E-07
1.50E-07 1.60E-07
1.50E-07 1.60E-07
1.70E-07 1.80E-07
1.30E-07 1.50E-07
1.70E-07 1.90E-07
1.50E-07 1.50E-07
1.70E-07 1.70E-07
0
1.60E-07
1.60E-07
1.50E-07
1.70E-07
1.70E-07
1.40E-07
1.40E-07
1.60E-07
1.20E-07
1.50E-07
1.50E-07
1.70E-07
10
1.60E-07
1.70E-07
1.50E-07
1.70E-07
1.70E-07
1.40E-07
1.50E-07
1.70E-07
1.30E-07
1.60E-07
1.50E-07
1.70E-07
1.62E-07
8.37E-09
1.85E-07
1.39E-07
1.64E-07
8.94E-09
1.89E-07
1.39E-07
1.72E-07
8.37E-09
1.95E-07
1.49E-07
1.42E-07
1.48E-08
1.83E-07
1.01E-07
-4.00E-06
PASS
4.00E-06
PASS
1.50E-07
1.58E-08
1.93E-07
1.07E-07
-5.00E-06
PASS
5.00E-06
PASS
1.54E-07
1.67E-08
2.00E-07
1.08E-07
-5.00E-06
PASS
5.00E-06
PASS
An ISO 9001:2008 and DSCC Certified Company
43
168-hr
Anneal
70
1.60E-07
1.60E-07
1.50E-07
1.70E-07
1.70E-07
1.50E-07
1.60E-07
1.70E-07
1.40E-07
1.80E-07
1.50E-07
1.70E-07
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Common Mode Rejection Ratio @+/-5V #1 (dB)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
4.00E+01
3.00E+01
2.00E+01
1.00E+01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.19. Plot of Common Mode Rejection Ratio @+/-5V #1 (dB) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
44
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.19. Raw data for Common Mode Rejection Ratio @+/-5V #1 (dB) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Common Mode Rejection Ratio @+/-5V #1 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
8.92E+01
7.21E+01
8.71E+01
1.12E+02
1.01E+02
8.74E+01
8.92E+01
8.81E+01
8.90E+01
8.89E+01
8.83E+01
9.10E+01
24-hr
Anneal
60
8.94E+01
7.31E+01
8.15E+01
9.03E+01
9.05E+01
8.74E+01
8.93E+01
8.81E+01
8.91E+01
8.89E+01
8.82E+01
9.11E+01
168-hr
Anneal
70
8.88E+01
7.36E+01
7.20E+01
7.76E+01
7.96E+01
8.78E+01
8.98E+01
8.85E+01
8.96E+01
8.95E+01
8.83E+01
9.11E+01
0
8.92E+01
8.81E+01
8.94E+01
9.01E+01
8.92E+01
8.81E+01
9.03E+01
8.87E+01
9.01E+01
9.00E+01
8.83E+01
9.10E+01
10
8.92E+01
8.30E+01
8.46E+01
8.63E+01
8.55E+01
8.80E+01
9.01E+01
8.86E+01
8.99E+01
8.99E+01
8.83E+01
9.11E+01
Total Dose (krad(Si))
20
30
8.86E+01 8.86E+01
7.49E+01 7.43E+01
8.26E+01 9.01E+01
8.33E+01 8.64E+01
8.32E+01 8.56E+01
8.79E+01 8.77E+01
9.00E+01 8.97E+01
8.85E+01 8.84E+01
8.98E+01 8.96E+01
8.97E+01 8.94E+01
8.83E+01 8.83E+01
9.11E+01 9.10E+01
8.92E+01
7.06E-01
9.12E+01
8.73E+01
8.57E+01
2.29E+00
9.20E+01
7.94E+01
8.25E+01
4.88E+00
9.59E+01
6.91E+01
8.50E+01
6.25E+00
1.02E+02
6.79E+01
9.02E+01
1.28E+01
1.25E+02
5.52E+01
9.22E+01
1.51E+01
1.34E+02
5.09E+01
8.50E+01
7.59E+00
1.06E+02
6.42E+01
7.83E+01
6.60E+00
9.64E+01
6.03E+01
8.94E+01
9.90E-01
9.21E+01
8.67E+01
7.50E+01
PASS
8.93E+01
9.32E-01
9.19E+01
8.67E+01
7.30E+01
PASS
8.92E+01
9.21E-01
9.17E+01
8.66E+01
7.30E+01
PASS
8.90E+01
8.64E-01
9.13E+01
8.66E+01
6.93E+01
N/A
8.88E+01
8.29E-01
9.11E+01
8.65E+01
6.57E+01
N/A
8.85E+01
7.60E-01
9.06E+01
8.64E+01
6.20E+01
PASS
8.85E+01
7.72E-01
9.07E+01
8.64E+01
6.20E+01
PASS
8.90E+01
8.56E-01
9.14E+01
8.67E+01
6.20E+01
PASS
40
8.89E+01
7.31E+01
1.09E+02
9.13E+01
8.89E+01
8.76E+01
8.95E+01
8.83E+01
8.93E+01
8.92E+01
8.83E+01
9.10E+01
An ISO 9001:2008 and DSCC Certified Company
45
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Common Mode Rejection Ratio @+/-5V #2 (dB)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
4.00E+01
3.00E+01
2.00E+01
1.00E+01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.20. Plot of Common Mode Rejection Ratio @+/-5V #2 (dB) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
46
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.20. Raw data for Common Mode Rejection Ratio @+/-5V #2 (dB) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Common Mode Rejection Ratio @+/-5V #2 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
8.91E+01
9.21E+01
9.36E+01
9.78E+01
8.38E+01
8.98E+01
8.89E+01
8.98E+01
9.04E+01
8.80E+01
8.81E+01
9.02E+01
24-hr
Anneal
60
8.93E+01
8.50E+01
9.34E+01
9.67E+01
9.04E+01
8.98E+01
8.89E+01
8.99E+01
9.04E+01
8.80E+01
8.81E+01
9.02E+01
168-hr
Anneal
70
8.90E+01
7.60E+01
7.61E+01
7.64E+01
7.63E+01
9.04E+01
8.94E+01
9.02E+01
9.09E+01
8.83E+01
8.81E+01
9.02E+01
0
8.93E+01
8.61E+01
8.93E+01
9.12E+01
8.91E+01
9.08E+01
8.98E+01
9.05E+01
9.15E+01
8.86E+01
8.81E+01
9.02E+01
10
8.92E+01
8.23E+01
8.52E+01
8.60E+01
8.49E+01
9.07E+01
8.97E+01
9.04E+01
9.13E+01
8.85E+01
8.81E+01
9.02E+01
Total Dose (krad(Si))
20
30
8.85E+01 8.85E+01
8.00E+01 8.41E+01
8.02E+01 8.24E+01
8.11E+01 8.38E+01
8.01E+01 8.03E+01
9.05E+01 9.03E+01
8.96E+01 8.94E+01
9.03E+01 9.02E+01
9.11E+01 9.09E+01
8.83E+01 8.82E+01
8.81E+01 8.81E+01
9.02E+01 9.02E+01
8.90E+01
1.84E+00
9.41E+01
8.39E+01
8.55E+01
2.50E+00
9.24E+01
7.87E+01
8.20E+01
3.70E+00
9.21E+01
7.18E+01
8.38E+01
3.01E+00
9.21E+01
7.56E+01
8.66E+01
3.65E+00
9.66E+01
7.66E+01
9.13E+01
5.21E+00
1.06E+02
7.70E+01
9.09E+01
4.41E+00
1.03E+02
7.88E+01
7.87E+01
5.71E+00
9.44E+01
6.31E+01
9.02E+01
1.11E+00
9.33E+01
8.72E+01
7.50E+01
PASS
9.01E+01
1.09E+00
9.31E+01
8.71E+01
7.30E+01
PASS
9.00E+01
1.08E+00
9.29E+01
8.70E+01
7.30E+01
PASS
8.98E+01
1.04E+00
9.26E+01
8.69E+01
6.93E+01
N/A
8.96E+01
9.99E-01
9.23E+01
8.69E+01
6.57E+01
N/A
8.94E+01
9.43E-01
9.19E+01
8.68E+01
6.20E+01
PASS
8.94E+01
9.50E-01
9.20E+01
8.68E+01
6.20E+01
PASS
8.98E+01
1.02E+00
9.26E+01
8.70E+01
6.20E+01
PASS
40
8.85E+01
9.08E+01
8.64E+01
8.65E+01
8.09E+01
9.01E+01
8.91E+01
9.00E+01
9.07E+01
8.81E+01
8.81E+01
9.02E+01
An ISO 9001:2008 and DSCC Certified Company
47
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Common Mode Rejection Ratio @+/-5V #3 (dB)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
4.00E+01
3.00E+01
2.00E+01
1.00E+01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.21. Plot of Common Mode Rejection Ratio @+/-5V #3 (dB) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
48
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.21. Raw data for Common Mode Rejection Ratio @+/-5V #3 (dB) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Common Mode Rejection Ratio @+/-5V #3 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
8.91E+01
9.30E+01
7.69E+01
9.76E+01
1.03E+02
8.80E+01
8.98E+01
8.97E+01
9.01E+01
8.71E+01
8.89E+01
8.88E+01
24-hr
Anneal
60
8.93E+01
9.54E+01
7.46E+01
9.59E+01
8.69E+01
8.80E+01
8.99E+01
8.97E+01
9.01E+01
8.71E+01
8.89E+01
8.88E+01
168-hr
Anneal
70
8.93E+01
7.39E+01
7.68E+01
7.64E+01
8.02E+01
8.83E+01
9.04E+01
9.00E+01
9.07E+01
8.74E+01
8.89E+01
8.88E+01
0
8.98E+01
8.87E+01
9.31E+01
8.89E+01
8.98E+01
8.87E+01
9.07E+01
9.02E+01
9.10E+01
8.77E+01
8.89E+01
8.88E+01
10
8.97E+01
8.33E+01
8.76E+01
8.49E+01
8.62E+01
8.86E+01
9.06E+01
9.02E+01
9.09E+01
8.76E+01
8.89E+01
8.88E+01
Total Dose (krad(Si))
20
30
8.90E+01 8.89E+01
7.87E+01 8.06E+01
8.62E+01 9.60E+01
8.21E+01 8.42E+01
8.35E+01 8.54E+01
8.85E+01 8.84E+01
9.05E+01 9.03E+01
9.01E+01 9.00E+01
9.07E+01 9.05E+01
8.75E+01 8.74E+01
8.89E+01 8.89E+01
8.88E+01 8.88E+01
9.00E+01
1.77E+00
9.49E+01
8.52E+01
8.63E+01
2.45E+00
9.30E+01
7.96E+01
8.39E+01
3.91E+00
9.46E+01
7.32E+01
8.70E+01
5.82E+00
1.03E+02
7.11E+01
8.67E+01
3.63E+00
9.67E+01
7.68E+01
9.20E+01
9.98E+00
1.19E+02
6.46E+01
8.84E+01
8.64E+00
1.12E+02
6.47E+01
7.93E+01
6.01E+00
9.58E+01
6.28E+01
8.97E+01
1.41E+00
9.35E+01
8.58E+01
7.50E+01
PASS
8.96E+01
1.41E+00
9.34E+01
8.57E+01
7.30E+01
PASS
8.95E+01
1.37E+00
9.32E+01
8.57E+01
7.30E+01
PASS
8.93E+01
1.35E+00
9.30E+01
8.56E+01
6.93E+01
N/A
8.92E+01
1.32E+00
9.28E+01
8.55E+01
6.57E+01
N/A
8.89E+01
1.31E+00
9.25E+01
8.53E+01
6.20E+01
PASS
8.90E+01
1.33E+00
9.26E+01
8.53E+01
6.20E+01
PASS
8.94E+01
1.41E+00
9.32E+01
8.55E+01
6.20E+01
PASS
40
8.89E+01
8.31E+01
8.28E+01
8.81E+01
9.09E+01
8.82E+01
9.01E+01
8.98E+01
9.03E+01
8.73E+01
8.89E+01
8.88E+01
An ISO 9001:2008 and DSCC Certified Company
49
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Common Mode Rejection Ratio @+/-5V #4 (dB)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
4.00E+01
3.00E+01
2.00E+01
1.00E+01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.22. Plot of Common Mode Rejection Ratio @+/-5V #4 (dB) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
50
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.22. Raw data for Common Mode Rejection Ratio @+/-5V #4 (dB) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Common Mode Rejection Ratio @+/-5V #4 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
8.67E+01
8.97E+01
9.44E+01
9.23E+01
7.93E+01
8.90E+01
9.10E+01
8.93E+01
9.08E+01
8.86E+01
8.89E+01
8.87E+01
24-hr
Anneal
60
8.68E+01
8.33E+01
9.79E+01
1.08E+02
8.20E+01
8.90E+01
9.09E+01
8.93E+01
9.09E+01
8.87E+01
8.89E+01
8.87E+01
168-hr
Anneal
70
8.68E+01
7.60E+01
7.31E+01
7.73E+01
7.45E+01
8.95E+01
9.16E+01
8.95E+01
9.14E+01
8.92E+01
8.89E+01
8.87E+01
0
8.71E+01
9.10E+01
8.99E+01
9.16E+01
8.82E+01
8.99E+01
9.20E+01
8.99E+01
9.20E+01
8.95E+01
8.88E+01
8.87E+01
10
8.71E+01
8.56E+01
8.45E+01
8.64E+01
8.38E+01
8.98E+01
9.19E+01
8.98E+01
9.19E+01
8.94E+01
8.89E+01
8.88E+01
Total Dose (krad(Si))
20
30
8.64E+01 8.64E+01
8.25E+01 8.69E+01
8.05E+01 8.27E+01
8.13E+01 8.23E+01
7.81E+01 7.85E+01
8.96E+01 8.95E+01
9.17E+01 9.15E+01
8.97E+01 8.95E+01
9.17E+01 9.14E+01
8.92E+01 8.90E+01
8.89E+01 8.89E+01
8.88E+01 8.87E+01
8.96E+01
1.89E+00
9.48E+01
8.44E+01
8.55E+01
1.32E+00
8.91E+01
8.19E+01
8.17E+01
3.05E+00
9.01E+01
7.34E+01
8.33E+01
3.42E+00
9.27E+01
7.40E+01
8.64E+01
6.39E+00
1.04E+02
6.89E+01
8.85E+01
5.88E+00
1.05E+02
7.24E+01
9.16E+01
1.12E+01
1.22E+02
6.10E+01
7.75E+01
5.41E+00
9.24E+01
6.27E+01
9.07E+01
1.22E+00
9.40E+01
8.73E+01
7.50E+01
PASS
9.06E+01
1.21E+00
9.39E+01
8.73E+01
7.30E+01
PASS
9.04E+01
1.21E+00
9.37E+01
8.71E+01
7.30E+01
PASS
9.02E+01
1.18E+00
9.34E+01
8.69E+01
6.93E+01
N/A
9.00E+01
1.13E+00
9.31E+01
8.69E+01
6.57E+01
N/A
8.97E+01
1.09E+00
9.27E+01
8.68E+01
6.20E+01
PASS
8.98E+01
1.06E+00
9.27E+01
8.68E+01
6.20E+01
PASS
9.02E+01
1.17E+00
9.34E+01
8.70E+01
6.20E+01
PASS
40
8.63E+01
9.58E+01
8.53E+01
8.68E+01
7.79E+01
8.93E+01
9.13E+01
8.95E+01
9.11E+01
8.88E+01
8.89E+01
8.87E+01
An ISO 9001:2008 and DSCC Certified Company
51
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Power Supply Rejection Ratio #1 (dB)
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.23. Plot of Power Supply Rejection Ratio #1 (dB) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
52
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.23. Raw data for Power Supply Rejection Ratio #1 (dB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Power Supply Rejection Ratio #1 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.00E+02
8.48E+01
9.89E+01
9.94E+01
9.86E+01
9.92E+01
1.02E+02
1.06E+02
9.49E+01
1.08E+02
9.79E+01
1.29E+02
24-hr
Anneal
60
1.01E+02
8.49E+01
1.01E+02
1.00E+02
9.98E+01
9.90E+01
1.03E+02
1.06E+02
9.48E+01
1.08E+02
9.79E+01
1.31E+02
168-hr
Anneal
70
1.01E+02
9.04E+01
9.89E+01
1.06E+02
1.02E+02
9.92E+01
1.02E+02
1.06E+02
9.45E+01
1.10E+02
9.78E+01
1.35E+02
0
1.01E+02
9.11E+01
1.02E+02
1.07E+02
1.03E+02
9.86E+01
1.02E+02
1.06E+02
9.40E+01
1.07E+02
9.80E+01
1.27E+02
10
1.01E+02
9.11E+01
1.02E+02
1.07E+02
1.03E+02
9.86E+01
1.02E+02
1.06E+02
9.41E+01
1.08E+02
9.78E+01
1.28E+02
Total Dose (krad(Si))
20
30
1.01E+02 1.01E+02
8.99E+01 8.84E+01
9.93E+01 9.88E+01
1.04E+02 1.03E+02
1.01E+02 1.00E+02
9.88E+01 9.89E+01
1.02E+02 1.02E+02
1.06E+02 1.06E+02
9.44E+01 9.46E+01
1.08E+02 1.09E+02
9.78E+01 9.79E+01
1.29E+02 1.29E+02
1.01E+02
5.86E+00
1.17E+02
8.46E+01
1.01E+02
5.87E+00
1.17E+02
8.46E+01
9.91E+01
5.48E+00
1.14E+02
8.41E+01
9.82E+01
5.66E+00
1.14E+02
8.27E+01
9.67E+01
5.83E+00
1.13E+02
8.07E+01
9.64E+01
6.54E+00
1.14E+02
7.85E+01
9.73E+01
6.95E+00
1.16E+02
7.83E+01
9.97E+01
5.76E+00
1.15E+02
8.39E+01
1.01E+02
5.38E+00
1.16E+02
8.67E+01
7.80E+01
PASS
1.02E+02
5.50E+00
1.17E+02
8.65E+01
7.70E+01
PASS
1.02E+02
5.43E+00
1.17E+02
8.69E+01
7.50E+01
PASS
1.02E+02
5.54E+00
1.17E+02
8.67E+01
7.17E+01
N/A
1.02E+02
5.45E+00
1.17E+02
8.70E+01
6.83E+01
N/A
1.02E+02
5.40E+00
1.17E+02
8.74E+01
6.50E+01
PASS
1.02E+02
5.28E+00
1.17E+02
8.76E+01
6.50E+01
PASS
1.02E+02
6.02E+00
1.19E+02
8.59E+01
6.50E+01
PASS
40
1.00E+02
8.64E+01
9.81E+01
1.00E+02
9.87E+01
9.91E+01
1.02E+02
1.06E+02
9.47E+01
1.08E+02
9.78E+01
1.31E+02
An ISO 9001:2008 and DSCC Certified Company
53
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Power Supply Rejection Ratio #2 (dB)
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.24. Plot of Power Supply Rejection Ratio #2 (dB) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
54
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.24. Raw data for Power Supply Rejection Ratio #2 (dB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Power Supply Rejection Ratio #2 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.01E+02
9.17E+01
9.51E+01
9.40E+01
9.59E+01
1.04E+02
9.71E+01
1.03E+02
1.17E+02
9.20E+01
1.05E+02
1.04E+02
24-hr
Anneal
60
1.01E+02
9.22E+01
9.62E+01
9.45E+01
9.64E+01
1.03E+02
9.69E+01
1.03E+02
1.15E+02
9.20E+01
1.05E+02
1.04E+02
168-hr
Anneal
70
1.03E+02
9.34E+01
9.89E+01
9.95E+01
1.01E+02
1.04E+02
9.71E+01
1.03E+02
1.15E+02
9.19E+01
1.05E+02
1.04E+02
0
1.03E+02
9.40E+01
9.97E+01
1.00E+02
1.02E+02
1.02E+02
9.68E+01
1.03E+02
1.13E+02
9.15E+01
1.05E+02
1.04E+02
10
1.03E+02
9.38E+01
9.98E+01
1.00E+02
1.02E+02
1.03E+02
9.69E+01
1.03E+02
1.14E+02
9.16E+01
1.05E+02
1.04E+02
Total Dose (krad(Si))
20
30
1.03E+02 1.02E+02
9.20E+01 9.15E+01
9.80E+01 9.70E+01
9.79E+01 9.67E+01
1.00E+02 9.89E+01
1.03E+02 1.03E+02
9.69E+01 9.70E+01
1.03E+02 1.03E+02
1.15E+02 1.15E+02
9.17E+01 9.18E+01
1.05E+02 1.05E+02
1.04E+02 1.04E+02
9.97E+01
3.40E+00
1.09E+02
9.04E+01
9.97E+01
3.54E+00
1.09E+02
9.00E+01
9.82E+01
4.00E+00
1.09E+02
8.72E+01
9.73E+01
3.95E+00
1.08E+02
8.64E+01
9.58E+01
3.75E+00
1.06E+02
8.55E+01
9.56E+01
3.54E+00
1.05E+02
8.59E+01
9.62E+01
3.42E+00
1.06E+02
8.68E+01
9.91E+01
3.59E+00
1.09E+02
8.93E+01
1.01E+02
8.02E+00
1.23E+02
7.92E+01
7.80E+01
PASS
1.01E+02
8.17E+00
1.24E+02
7.90E+01
7.70E+01
PASS
1.02E+02
8.51E+00
1.25E+02
7.84E+01
7.50E+01
PASS
1.02E+02
8.63E+00
1.26E+02
7.83E+01
7.17E+01
N/A
1.02E+02
9.34E+00
1.28E+02
7.68E+01
6.83E+01
N/A
1.02E+02
9.23E+00
1.28E+02
7.71E+01
6.50E+01
PASS
1.02E+02
8.71E+00
1.26E+02
7.81E+01
6.50E+01
PASS
1.02E+02
8.52E+00
1.25E+02
7.87E+01
6.50E+01
PASS
40
1.01E+02
9.09E+01
9.57E+01
9.46E+01
9.65E+01
1.03E+02
9.71E+01
1.03E+02
1.17E+02
9.19E+01
1.05E+02
1.04E+02
An ISO 9001:2008 and DSCC Certified Company
55
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Power Supply Rejection Ratio #3 (dB)
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.25. Plot of Power Supply Rejection Ratio #3 (dB) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
56
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.25. Raw data for Power Supply Rejection Ratio #3 (dB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Power Supply Rejection Ratio #3 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
9.39E+01
9.50E+01
1.16E+02
9.19E+01
1.13E+02
9.09E+01
9.77E+01
1.08E+02
1.04E+02
9.60E+01
9.96E+01
1.07E+02
24-hr
Anneal
60
9.40E+01
9.66E+01
1.08E+02
9.23E+01
1.20E+02
9.07E+01
9.76E+01
1.07E+02
1.04E+02
9.59E+01
9.96E+01
1.06E+02
168-hr
Anneal
70
9.42E+01
9.85E+01
1.12E+02
9.49E+01
1.17E+02
9.05E+01
9.79E+01
1.07E+02
1.04E+02
9.60E+01
9.97E+01
1.07E+02
0
9.39E+01
1.02E+02
1.22E+02
9.53E+01
1.14E+02
9.01E+01
9.73E+01
1.07E+02
1.04E+02
9.56E+01
9.98E+01
1.07E+02
10
9.39E+01
1.02E+02
1.23E+02
9.52E+01
1.14E+02
9.01E+01
9.73E+01
1.07E+02
1.04E+02
9.56E+01
9.96E+01
1.07E+02
Total Dose (krad(Si))
20
30
9.41E+01 9.41E+01
9.86E+01 9.69E+01
1.10E+02 1.10E+02
9.41E+01 9.34E+01
1.25E+02 1.25E+02
9.03E+01 9.04E+01
9.74E+01 9.74E+01
1.07E+02 1.07E+02
1.04E+02 1.04E+02
9.58E+01 9.59E+01
9.97E+01 9.96E+01
1.07E+02 1.06E+02
1.06E+02
1.22E+01
1.39E+02
7.20E+01
1.06E+02
1.24E+01
1.40E+02
7.14E+01
1.04E+02
1.31E+01
1.40E+02
6.82E+01
1.04E+02
1.35E+01
1.41E+02
6.67E+01
1.01E+02
1.07E+01
1.31E+02
7.21E+01
1.02E+02
1.14E+01
1.33E+02
7.06E+01
1.02E+02
1.17E+01
1.34E+02
7.00E+01
1.03E+02
1.06E+01
1.32E+02
7.44E+01
9.87E+01
6.68E+00
1.17E+02
8.04E+01
7.80E+01
PASS
9.87E+01
6.67E+00
1.17E+02
8.05E+01
7.70E+01
PASS
9.90E+01
6.73E+00
1.17E+02
8.05E+01
7.50E+01
PASS
9.90E+01
6.68E+00
1.17E+02
8.07E+01
7.17E+01
N/A
9.92E+01
6.79E+00
1.18E+02
8.06E+01
6.83E+01
N/A
9.93E+01
6.69E+00
1.18E+02
8.10E+01
6.50E+01
PASS
9.92E+01
6.69E+00
1.18E+02
8.08E+01
6.50E+01
PASS
9.92E+01
6.75E+00
1.18E+02
8.07E+01
6.50E+01
PASS
40
9.38E+01
9.49E+01
1.13E+02
9.23E+01
1.13E+02
9.06E+01
9.76E+01
1.08E+02
1.04E+02
9.59E+01
9.96E+01
1.07E+02
An ISO 9001:2008 and DSCC Certified Company
57
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Power Supply Rejection Ratio #4 (dB)
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.26. Plot of Power Supply Rejection Ratio #4 (dB) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
58
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.26. Raw data for Power Supply Rejection Ratio #4 (dB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Power Supply Rejection Ratio #4 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.19E+02
9.35E+01
9.88E+01
9.80E+01
9.40E+01
1.15E+02
1.01E+02
1.11E+02
1.09E+02
1.05E+02
1.08E+02
1.00E+02
24-hr
Anneal
60
1.17E+02
9.45E+01
9.95E+01
9.87E+01
9.41E+01
1.16E+02
1.01E+02
1.11E+02
1.10E+02
1.05E+02
1.08E+02
9.98E+01
168-hr
Anneal
70
1.13E+02
9.75E+01
1.02E+02
1.09E+02
1.00E+02
1.18E+02
1.01E+02
1.10E+02
1.09E+02
1.05E+02
1.08E+02
9.99E+01
0
1.13E+02
9.91E+01
1.05E+02
1.12E+02
1.01E+02
1.20E+02
1.00E+02
1.10E+02
1.10E+02
1.05E+02
1.08E+02
9.99E+01
10
1.13E+02
9.89E+01
1.05E+02
1.12E+02
1.01E+02
1.19E+02
1.01E+02
1.10E+02
1.09E+02
1.05E+02
1.08E+02
9.99E+01
Total Dose (krad(Si))
20
30
1.13E+02 1.15E+02
9.69E+01 9.55E+01
1.02E+02 1.01E+02
1.06E+02 1.03E+02
9.94E+01 9.78E+01
1.18E+02 1.16E+02
1.01E+02 1.01E+02
1.10E+02 1.10E+02
1.09E+02 1.09E+02
1.05E+02 1.05E+02
1.08E+02 1.08E+02
9.98E+01 9.98E+01
1.06E+02
6.13E+00
1.23E+02
8.91E+01
1.06E+02
6.26E+00
1.23E+02
8.88E+01
1.04E+02
6.37E+00
1.21E+02
8.61E+01
1.02E+02
7.45E+00
1.23E+02
8.19E+01
1.01E+02
9.73E+00
1.28E+02
7.43E+01
1.01E+02
1.06E+01
1.30E+02
7.16E+01
1.01E+02
9.54E+00
1.27E+02
7.47E+01
1.04E+02
6.57E+00
1.22E+02
8.64E+01
1.09E+02
7.13E+00
1.28E+02
8.94E+01
7.80E+01
PASS
1.09E+02
6.75E+00
1.27E+02
9.02E+01
7.70E+01
PASS
1.09E+02
6.42E+00
1.26E+02
9.10E+01
7.50E+01
PASS
1.08E+02
5.48E+00
1.23E+02
9.32E+01
7.17E+01
N/A
1.08E+02
5.49E+00
1.23E+02
9.32E+01
6.83E+01
N/A
1.08E+02
5.37E+00
1.23E+02
9.37E+01
6.50E+01
PASS
1.09E+02
5.80E+00
1.24E+02
9.27E+01
6.50E+01
PASS
1.09E+02
6.38E+00
1.26E+02
9.12E+01
6.50E+01
PASS
40
1.18E+02
9.39E+01
9.88E+01
9.96E+01
9.49E+01
1.15E+02
1.01E+02
1.11E+02
1.09E+02
1.05E+02
1.08E+02
9.98E+01
An ISO 9001:2008 and DSCC Certified Company
59
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Large Signal Voltage Gain @+/-5V RL=500 #1 (V/mV)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
5.00E+00
4.50E+00
4.00E+00
3.50E+00
3.00E+00
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.27. Plot of Large Signal Voltage Gain @+/-5V RL=500 #1 (V/mV) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
60
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.27. Raw data for Large Signal Voltage Gain @+/-5V RL=500 #1 (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Large Signal Voltage Gain @+/-5V RL=500 #1 (V/mV)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
60
4.20E+00
4.00E+00
4.00E+00
4.00E+00
4.10E+00
4.00E+00
4.50E+00
4.10E+00
4.20E+00
4.00E+00
4.30E+00
4.40E+00
168-hr
Anneal
70
4.30E+00
4.40E+00
4.30E+00
4.30E+00
4.40E+00
4.20E+00
4.80E+00
4.20E+00
4.40E+00
4.20E+00
4.30E+00
4.40E+00
0
4.31E+00
4.50E+00
4.34E+00
4.40E+00
4.46E+00
4.40E+00
5.00E+00
4.35E+00
4.64E+00
4.48E+00
4.34E+00
4.36E+00
10
4.28E+00
4.46E+00
4.31E+00
4.37E+00
4.44E+00
4.34E+00
4.93E+00
4.31E+00
4.57E+00
4.41E+00
4.33E+00
4.36E+00
Total Dose (krad(Si))
20
30
4.20E+00 4.20E+00
4.40E+00 4.30E+00
4.30E+00 4.20E+00
4.30E+00 4.20E+00
4.40E+00 4.30E+00
4.30E+00 4.20E+00
4.80E+00 4.70E+00
4.30E+00 4.20E+00
4.50E+00 4.40E+00
4.30E+00 4.20E+00
4.30E+00 4.30E+00
4.40E+00 4.40E+00
4.40E+00
7.96E-02
4.62E+00
4.18E+00
4.37E+00
7.68E-02
4.58E+00
4.16E+00
4.32E+00
8.37E-02
4.55E+00
4.09E+00
4.24E+00
5.48E-02
4.39E+00
4.09E+00
4.16E+00
5.48E-02
4.31E+00
4.01E+00
4.08E+00 4.06E+00 4.34E+00
8.37E-02 8.94E-02 5.48E-02
4.31E+00 4.31E+00 4.49E+00
3.85E+00 3.81E+00 4.19E+00
4.57E+00
2.64E-01
5.29E+00
3.85E+00
1.50E+00
PASS
4.51E+00
2.55E-01
5.21E+00
3.82E+00
1.40E+00
PASS
4.44E+00
2.19E-01
5.04E+00
3.84E+00
1.30E+00
PASS
4.34E+00
2.19E-01
4.94E+00
3.74E+00
1.20E+00
N/A
4.24E+00
2.19E-01
4.84E+00
3.64E+00
1.10E+00
N/A
4.16E+00
2.07E-01
4.73E+00
3.59E+00
1.00E+00
PASS
40
4.20E+00
4.20E+00
4.10E+00
4.10E+00
4.20E+00
4.10E+00
4.60E+00
4.10E+00
4.30E+00
4.10E+00
4.30E+00
4.40E+00
50
4.20E+00
4.10E+00
4.00E+00
4.00E+00
4.10E+00
4.00E+00
4.50E+00
4.10E+00
4.20E+00
4.00E+00
4.40E+00
4.40E+00
An ISO 9001:2008 and DSCC Certified Company
61
4.16E+00
2.07E-01
4.73E+00
3.59E+00
1.00E+00
PASS
4.36E+00
2.61E-01
5.08E+00
3.64E+00
1.00E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Large Signal Voltage Gain @+/-5V RL=500 #2 (V/mV)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
5.00E+00
4.50E+00
4.00E+00
3.50E+00
3.00E+00
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.28. Plot of Large Signal Voltage Gain @+/-5V RL=500 #2 (V/mV) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
62
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.28. Raw data for Large Signal Voltage Gain @+/-5V RL=500 #2 (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Large Signal Voltage Gain @+/-5V RL=500 #2 (V/mV)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
60
4.20E+00
4.00E+00
4.10E+00
3.90E+00
4.20E+00
4.00E+00
4.40E+00
4.10E+00
4.00E+00
4.20E+00
4.20E+00
4.20E+00
168-hr
Anneal
70
4.30E+00
4.30E+00
4.20E+00
4.30E+00
4.50E+00
4.20E+00
4.60E+00
4.20E+00
4.20E+00
4.30E+00
4.20E+00
4.20E+00
0
4.33E+00
4.42E+00
4.35E+00
4.36E+00
4.52E+00
4.43E+00
4.81E+00
4.32E+00
4.39E+00
4.47E+00
4.20E+00
4.26E+00
10
4.31E+00
4.41E+00
4.32E+00
4.34E+00
4.48E+00
4.36E+00
4.74E+00
4.29E+00
4.32E+00
4.43E+00
4.20E+00
4.24E+00
Total Dose (krad(Si))
20
30
4.30E+00 4.20E+00
4.30E+00 4.20E+00
4.30E+00 4.20E+00
4.30E+00 4.20E+00
4.40E+00 4.40E+00
4.30E+00 4.20E+00
4.60E+00 4.60E+00
4.20E+00 4.20E+00
4.20E+00 4.20E+00
4.40E+00 4.30E+00
4.20E+00 4.20E+00
4.30E+00 4.20E+00
4.40E+00
7.86E-02
4.61E+00
4.18E+00
4.37E+00
7.13E-02
4.57E+00
4.17E+00
4.32E+00
4.47E-02
4.44E+00
4.20E+00
4.24E+00
8.94E-02
4.49E+00
3.99E+00
4.16E+00
8.94E-02
4.41E+00
3.91E+00
4.08E+00 4.08E+00 4.32E+00
1.30E-01 1.30E-01 1.10E-01
4.44E+00 4.44E+00 4.62E+00
3.72E+00 3.72E+00 4.02E+00
4.48E+00
1.91E-01
5.01E+00
3.96E+00
1.50E+00
PASS
4.43E+00
1.83E-01
4.93E+00
3.92E+00
1.40E+00
PASS
4.34E+00
1.67E-01
4.80E+00
3.88E+00
1.30E+00
PASS
4.30E+00
1.73E-01
4.77E+00
3.83E+00
1.20E+00
N/A
4.20E+00
1.73E-01
4.67E+00
3.73E+00
1.10E+00
N/A
4.14E+00
1.67E-01
4.60E+00
3.68E+00
1.00E+00
PASS
40
4.20E+00
4.10E+00
4.10E+00
4.10E+00
4.30E+00
4.10E+00
4.50E+00
4.10E+00
4.10E+00
4.20E+00
4.20E+00
4.20E+00
50
4.20E+00
4.00E+00
4.10E+00
3.90E+00
4.20E+00
4.00E+00
4.40E+00
4.10E+00
4.00E+00
4.20E+00
4.20E+00
4.20E+00
An ISO 9001:2008 and DSCC Certified Company
63
4.14E+00
1.67E-01
4.60E+00
3.68E+00
1.00E+00
PASS
4.30E+00
1.73E-01
4.77E+00
3.83E+00
1.00E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Large Signal Voltage Gain @+/-5V RL=500 #3 (V/mV)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
5.00E+00
4.50E+00
4.00E+00
3.50E+00
3.00E+00
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.29. Plot of Large Signal Voltage Gain @+/-5V RL=500 #3 (V/mV) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
64
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.29. Raw data for Large Signal Voltage Gain @+/-5V RL=500 #3 (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Large Signal Voltage Gain @+/-5V RL=500 #3 (V/mV)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
60
4.40E+00
3.80E+00
4.10E+00
4.10E+00
4.10E+00
4.30E+00
4.40E+00
4.10E+00
4.00E+00
4.20E+00
4.20E+00
4.20E+00
168-hr
Anneal
70
4.50E+00
4.20E+00
4.30E+00
4.40E+00
4.40E+00
4.40E+00
4.60E+00
4.20E+00
4.20E+00
4.30E+00
4.20E+00
4.20E+00
0
4.55E+00
4.28E+00
4.38E+00
4.53E+00
4.48E+00
4.65E+00
4.87E+00
4.34E+00
4.38E+00
4.48E+00
4.21E+00
4.22E+00
10
4.51E+00
4.25E+00
4.32E+00
4.49E+00
4.43E+00
4.59E+00
4.81E+00
4.29E+00
4.32E+00
4.43E+00
4.22E+00
4.22E+00
Total Dose (krad(Si))
20
30
4.50E+00 4.40E+00
4.20E+00 4.10E+00
4.30E+00 4.20E+00
4.40E+00 4.30E+00
4.40E+00 4.30E+00
4.50E+00 4.40E+00
4.70E+00 4.60E+00
4.30E+00 4.20E+00
4.20E+00 4.20E+00
4.40E+00 4.30E+00
4.20E+00 4.20E+00
4.20E+00 4.20E+00
4.44E+00
1.13E-01
4.75E+00
4.13E+00
4.40E+00
1.11E-01
4.70E+00
4.10E+00
4.36E+00
1.14E-01
4.67E+00
4.05E+00
4.26E+00
1.14E-01
4.57E+00
3.95E+00
4.18E+00
1.48E-01
4.59E+00
3.77E+00
4.10E+00 4.10E+00 4.36E+00
2.12E-01 2.12E-01 1.14E-01
4.68E+00 4.68E+00 4.67E+00
3.52E+00 3.52E+00 4.05E+00
4.54E+00
2.17E-01
5.14E+00
3.95E+00
1.50E+00
PASS
4.49E+00
2.13E-01
5.07E+00
3.90E+00
1.40E+00
PASS
4.42E+00
1.92E-01
4.95E+00
3.89E+00
1.30E+00
PASS
4.34E+00
1.67E-01
4.80E+00
3.88E+00
1.20E+00
N/A
4.28E+00
1.48E-01
4.69E+00
3.87E+00
1.10E+00
N/A
4.18E+00
1.48E-01
4.59E+00
3.77E+00
1.00E+00
PASS
40
4.40E+00
4.00E+00
4.10E+00
4.20E+00
4.20E+00
4.30E+00
4.50E+00
4.20E+00
4.10E+00
4.30E+00
4.20E+00
4.20E+00
50
4.40E+00
3.80E+00
4.10E+00
4.10E+00
4.10E+00
4.20E+00
4.40E+00
4.10E+00
4.00E+00
4.20E+00
4.20E+00
4.20E+00
An ISO 9001:2008 and DSCC Certified Company
65
4.20E+00
1.58E-01
4.63E+00
3.77E+00
1.00E+00
PASS
4.34E+00
1.67E-01
4.80E+00
3.88E+00
1.00E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Large Signal Voltage Gain @+/-5V RL=500 #4 (V/mV)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
5.00E+00
4.50E+00
4.00E+00
3.50E+00
3.00E+00
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.30. Plot of Large Signal Voltage Gain @+/-5V RL=500 #4 (V/mV) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
66
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.30. Raw data for Large Signal Voltage Gain @+/-5V RL=500 #4 (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Large Signal Voltage Gain @+/-5V RL=500 #4 (V/mV)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
60
4.20E+00
3.90E+00
4.00E+00
4.00E+00
4.10E+00
4.00E+00
4.50E+00
4.10E+00
4.00E+00
4.10E+00
4.40E+00
4.40E+00
168-hr
Anneal
70
4.20E+00
4.40E+00
4.20E+00
4.30E+00
4.40E+00
4.20E+00
4.70E+00
4.20E+00
4.20E+00
4.30E+00
4.40E+00
4.30E+00
0
4.29E+00
4.50E+00
4.26E+00
4.36E+00
4.43E+00
4.43E+00
4.94E+00
4.33E+00
4.40E+00
4.52E+00
4.40E+00
4.36E+00
10
4.26E+00
4.49E+00
4.24E+00
4.32E+00
4.41E+00
4.36E+00
4.86E+00
4.29E+00
4.33E+00
4.45E+00
4.39E+00
4.36E+00
Total Dose (krad(Si))
20
30
4.20E+00 4.20E+00
4.40E+00 4.30E+00
4.20E+00 4.10E+00
4.30E+00 4.20E+00
4.40E+00 4.30E+00
4.30E+00 4.20E+00
4.80E+00 4.60E+00
4.20E+00 4.20E+00
4.30E+00 4.20E+00
4.30E+00 4.20E+00
4.40E+00 4.40E+00
4.40E+00 4.40E+00
4.37E+00
1.01E-01
4.65E+00
4.09E+00
4.34E+00
1.04E-01
4.63E+00
4.06E+00
4.30E+00
1.00E-01
4.57E+00
4.03E+00
4.22E+00
8.37E-02
4.45E+00
3.99E+00
4.12E+00
8.37E-02
4.35E+00
3.89E+00
4.04E+00 4.04E+00 4.30E+00
5.48E-02 1.14E-01 1.00E-01
4.19E+00 4.35E+00 4.57E+00
3.89E+00 3.73E+00 4.03E+00
4.52E+00
2.41E-01
5.18E+00
3.86E+00
1.50E+00
PASS
4.46E+00
2.33E-01
5.09E+00
3.82E+00
1.40E+00
PASS
4.38E+00
2.39E-01
5.03E+00
3.73E+00
1.30E+00
PASS
4.28E+00
1.79E-01
4.77E+00
3.79E+00
1.20E+00
N/A
4.22E+00
2.17E-01
4.81E+00
3.63E+00
1.10E+00
N/A
4.10E+00
1.73E-01
4.57E+00
3.63E+00
1.00E+00
PASS
40
4.20E+00
4.10E+00
4.00E+00
4.10E+00
4.20E+00
4.10E+00
4.60E+00
4.10E+00
4.10E+00
4.20E+00
4.40E+00
4.40E+00
50
4.10E+00
4.00E+00
4.00E+00
4.00E+00
4.10E+00
4.00E+00
4.40E+00
4.10E+00
4.00E+00
4.00E+00
4.40E+00
4.40E+00
An ISO 9001:2008 and DSCC Certified Company
67
4.14E+00
2.07E-01
4.71E+00
3.57E+00
1.00E+00
PASS
4.32E+00
2.17E-01
4.91E+00
3.73E+00
1.00E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Large Signal Voltage Gain @+/-5V RL=100 #1 (V/mV)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
4.00E+00
3.50E+00
3.00E+00
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.31. Plot of Large Signal Voltage Gain @+/-5V RL=100 #1 (V/mV) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
68
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.31. Raw data for Large Signal Voltage Gain @+/-5V RL=100 #1 (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Large Signal Voltage Gain @+/-5V RL=100 #1 (V/mV)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
60
3.20E+00
3.00E+00
3.00E+00
2.90E+00
3.10E+00
3.20E+00
3.60E+00
3.20E+00
3.40E+00
3.20E+00
3.40E+00
3.50E+00
168-hr
Anneal
70
3.40E+00
3.40E+00
3.30E+00
3.30E+00
3.40E+00
3.40E+00
3.80E+00
3.30E+00
3.60E+00
3.30E+00
3.40E+00
3.40E+00
0
3.42E+00
3.62E+00
3.45E+00
3.47E+00
3.54E+00
3.52E+00
3.96E+00
3.45E+00
3.77E+00
3.53E+00
3.42E+00
3.44E+00
10
3.40E+00
3.58E+00
3.42E+00
3.44E+00
3.52E+00
3.47E+00
3.90E+00
3.41E+00
3.72E+00
3.46E+00
3.42E+00
3.45E+00
Total Dose (krad(Si))
20
30
3.40E+00 3.30E+00
3.40E+00 3.30E+00
3.30E+00 3.20E+00
3.30E+00 3.20E+00
3.40E+00 3.30E+00
3.40E+00 3.30E+00
3.80E+00 3.70E+00
3.40E+00 3.30E+00
3.60E+00 3.60E+00
3.40E+00 3.30E+00
3.40E+00 3.40E+00
3.50E+00 3.40E+00
3.50E+00
7.94E-02
3.72E+00
3.28E+00
3.47E+00
7.62E-02
3.68E+00
3.26E+00
3.36E+00
5.48E-02
3.51E+00
3.21E+00
3.26E+00
5.48E-02
3.41E+00
3.11E+00
3.14E+00
1.14E-01
3.45E+00
2.83E+00
3.04E+00 3.04E+00 3.36E+00
1.14E-01 1.14E-01 5.48E-02
3.35E+00 3.35E+00 3.51E+00
2.73E+00 2.73E+00 3.21E+00
3.65E+00
2.15E-01
4.24E+00
3.06E+00
1.00E+00
PASS
3.59E+00
2.11E-01
4.17E+00
3.01E+00
9.00E-01
PASS
3.52E+00
1.79E-01
4.01E+00
3.03E+00
8.00E-01
PASS
3.44E+00
1.95E-01
3.97E+00
2.91E+00
7.33E-01
N/A
3.40E+00
2.00E-01
3.95E+00
2.85E+00
6.67E-01
N/A
3.30E+00
2.00E-01
3.85E+00
2.75E+00
6.00E-01
PASS
40
3.30E+00
3.10E+00
3.10E+00
3.00E+00
3.20E+00
3.30E+00
3.70E+00
3.30E+00
3.50E+00
3.20E+00
3.40E+00
3.40E+00
50
3.20E+00
3.00E+00
3.00E+00
2.90E+00
3.10E+00
3.20E+00
3.60E+00
3.20E+00
3.40E+00
3.10E+00
3.40E+00
3.40E+00
An ISO 9001:2008 and DSCC Certified Company
69
3.32E+00
1.79E-01
3.81E+00
2.83E+00
6.00E-01
PASS
3.48E+00
2.17E-01
4.07E+00
2.89E+00
6.00E-01
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Large Signal Voltage Gain @+/-5V RL=100 #2 (V/mV)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
4.00E+00
3.50E+00
3.00E+00
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.32. Plot of Large Signal Voltage Gain @+/-5V RL=100 #2 (V/mV) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
70
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.32. Raw data for Large Signal Voltage Gain @+/-5V RL=100 #2 (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Large Signal Voltage Gain @+/-5V RL=100 #2 (V/mV)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
60
3.30E+00
3.00E+00
3.00E+00
2.90E+00
3.20E+00
3.20E+00
3.50E+00
3.30E+00
3.20E+00
3.40E+00
3.30E+00
3.40E+00
168-hr
Anneal
70
3.40E+00
3.40E+00
3.20E+00
3.30E+00
3.50E+00
3.40E+00
3.60E+00
3.30E+00
3.30E+00
3.50E+00
3.30E+00
3.40E+00
0
3.43E+00
3.56E+00
3.44E+00
3.44E+00
3.58E+00
3.53E+00
3.77E+00
3.44E+00
3.51E+00
3.61E+00
3.33E+00
3.36E+00
10
3.41E+00
3.54E+00
3.40E+00
3.41E+00
3.55E+00
3.48E+00
3.72E+00
3.41E+00
3.45E+00
3.57E+00
3.34E+00
3.36E+00
Total Dose (krad(Si))
20
30
3.40E+00 3.30E+00
3.40E+00 3.20E+00
3.30E+00 3.20E+00
3.30E+00 3.10E+00
3.40E+00 3.40E+00
3.40E+00 3.30E+00
3.70E+00 3.60E+00
3.40E+00 3.30E+00
3.40E+00 3.30E+00
3.50E+00 3.50E+00
3.30E+00 3.30E+00
3.40E+00 3.40E+00
3.49E+00
7.36E-02
3.69E+00
3.29E+00
3.46E+00
7.55E-02
3.67E+00
3.26E+00
3.36E+00
5.48E-02
3.51E+00
3.21E+00
3.24E+00
1.14E-01
3.55E+00
2.93E+00
3.16E+00
1.34E-01
3.53E+00
2.79E+00
3.06E+00 3.08E+00 3.36E+00
1.34E-01 1.64E-01 1.14E-01
3.43E+00 3.53E+00 3.67E+00
2.69E+00 2.63E+00 3.05E+00
3.57E+00
1.27E-01
3.92E+00
3.22E+00
1.00E+00
PASS
3.53E+00
1.26E-01
3.87E+00
3.18E+00
9.00E-01
PASS
3.48E+00
1.30E-01
3.84E+00
3.12E+00
8.00E-01
PASS
3.40E+00
1.41E-01
3.79E+00
3.01E+00
7.33E-01
N/A
3.36E+00
8.94E-02
3.61E+00
3.11E+00
6.67E-01
N/A
3.28E+00
1.10E-01
3.58E+00
2.98E+00
6.00E-01
PASS
40
3.30E+00
3.10E+00
3.10E+00
3.00E+00
3.30E+00
3.30E+00
3.50E+00
3.30E+00
3.30E+00
3.40E+00
3.30E+00
3.40E+00
50
3.20E+00
3.00E+00
3.00E+00
2.90E+00
3.20E+00
3.20E+00
3.40E+00
3.20E+00
3.20E+00
3.40E+00
3.30E+00
3.40E+00
An ISO 9001:2008 and DSCC Certified Company
71
3.32E+00
1.30E-01
3.68E+00
2.96E+00
6.00E-01
PASS
3.42E+00
1.30E-01
3.78E+00
3.06E+00
6.00E-01
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Large Signal Voltage Gain @+/-5V RL=100 #3 (V/mV)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
4.00E+00
3.50E+00
3.00E+00
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.33. Plot of Large Signal Voltage Gain @+/-5V RL=100 #3 (V/mV) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
72
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.33. Raw data for Large Signal Voltage Gain @+/-5V RL=100 #3 (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Large Signal Voltage Gain @+/-5V RL=100 #3 (V/mV)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
60
3.50E+00
2.80E+00
3.00E+00
3.00E+00
3.10E+00
3.50E+00
3.50E+00
3.30E+00
3.20E+00
3.40E+00
3.30E+00
3.40E+00
168-hr
Anneal
70
3.60E+00
3.20E+00
3.20E+00
3.40E+00
3.40E+00
3.60E+00
3.70E+00
3.30E+00
3.30E+00
3.50E+00
3.30E+00
3.30E+00
0
3.66E+00
3.39E+00
3.46E+00
3.64E+00
3.55E+00
3.79E+00
3.83E+00
3.46E+00
3.51E+00
3.63E+00
3.35E+00
3.36E+00
10
3.64E+00
3.38E+00
3.42E+00
3.62E+00
3.52E+00
3.73E+00
3.79E+00
3.42E+00
3.45E+00
3.60E+00
3.34E+00
3.35E+00
Total Dose (krad(Si))
20
30
3.60E+00 3.60E+00
3.20E+00 3.10E+00
3.30E+00 3.20E+00
3.50E+00 3.30E+00
3.40E+00 3.30E+00
3.70E+00 3.60E+00
3.70E+00 3.60E+00
3.40E+00 3.30E+00
3.40E+00 3.30E+00
3.50E+00 3.50E+00
3.40E+00 3.40E+00
3.40E+00 3.40E+00
3.54E+00
1.16E-01
3.86E+00
3.22E+00
3.52E+00
1.17E-01
3.84E+00
3.19E+00
3.40E+00
1.58E-01
3.83E+00
2.97E+00
3.30E+00
1.87E-01
3.81E+00
2.79E+00
3.18E+00
2.17E-01
3.77E+00
2.59E+00
3.08E+00 3.08E+00 3.36E+00
2.17E-01 2.59E-01 1.67E-01
3.67E+00 3.79E+00 3.82E+00
2.49E+00 2.37E+00 2.90E+00
3.64E+00
1.66E-01
4.10E+00
3.19E+00
1.00E+00
PASS
3.60E+00
1.61E-01
4.04E+00
3.16E+00
9.00E-01
PASS
3.54E+00
1.52E-01
3.96E+00
3.12E+00
8.00E-01
PASS
3.46E+00
1.52E-01
3.88E+00
3.04E+00
7.33E-01
N/A
3.44E+00
1.34E-01
3.81E+00
3.07E+00
6.67E-01
N/A
3.36E+00
1.14E-01
3.67E+00
3.05E+00
6.00E-01
PASS
40
3.50E+00
2.90E+00
3.10E+00
3.20E+00
3.20E+00
3.50E+00
3.60E+00
3.30E+00
3.30E+00
3.50E+00
3.40E+00
3.40E+00
50
3.40E+00
2.80E+00
3.00E+00
3.10E+00
3.10E+00
3.40E+00
3.50E+00
3.30E+00
3.20E+00
3.40E+00
3.30E+00
3.30E+00
An ISO 9001:2008 and DSCC Certified Company
73
3.38E+00
1.30E-01
3.74E+00
3.02E+00
6.00E-01
PASS
3.48E+00
1.79E-01
3.97E+00
2.99E+00
6.00E-01
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Large Signal Voltage Gain @+/-5V RL=100 #4 (V/mV)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
4.00E+00
3.50E+00
3.00E+00
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.34. Plot of Large Signal Voltage Gain @+/-5V RL=100 #4 (V/mV) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
74
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.34. Raw data for Large Signal Voltage Gain @+/-5V RL=100 #4 (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Large Signal Voltage Gain @+/-5V RL=100 #4 (V/mV)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
60
3.20E+00
2.90E+00
3.00E+00
2.90E+00
3.10E+00
3.20E+00
3.50E+00
3.20E+00
3.20E+00
3.20E+00
3.50E+00
3.40E+00
168-hr
Anneal
70
3.40E+00
3.40E+00
3.20E+00
3.30E+00
3.40E+00
3.40E+00
3.70E+00
3.30E+00
3.30E+00
3.30E+00
3.50E+00
3.40E+00
0
3.42E+00
3.63E+00
3.39E+00
3.45E+00
3.52E+00
3.54E+00
3.87E+00
3.45E+00
3.51E+00
3.55E+00
3.46E+00
3.44E+00
10
3.40E+00
3.60E+00
3.36E+00
3.42E+00
3.50E+00
3.49E+00
3.82E+00
3.42E+00
3.47E+00
3.48E+00
3.46E+00
3.45E+00
Total Dose (krad(Si))
20
30
3.40E+00 3.30E+00
3.40E+00 3.20E+00
3.20E+00 3.20E+00
3.30E+00 3.20E+00
3.40E+00 3.30E+00
3.40E+00 3.40E+00
3.70E+00 3.60E+00
3.40E+00 3.30E+00
3.40E+00 3.30E+00
3.40E+00 3.30E+00
3.50E+00 3.50E+00
3.40E+00 3.40E+00
3.48E+00
9.60E-02
3.74E+00
3.22E+00
3.46E+00
9.69E-02
3.72E+00
3.19E+00
3.34E+00
8.94E-02
3.59E+00
3.09E+00
3.24E+00
5.48E-02
3.39E+00
3.09E+00
3.12E+00
1.30E-01
3.48E+00
2.76E+00
3.02E+00 3.02E+00 3.34E+00
1.30E-01 1.30E-01 8.94E-02
3.38E+00 3.38E+00 3.59E+00
2.66E+00 2.66E+00 3.09E+00
3.58E+00
1.63E-01
4.03E+00
3.14E+00
1.00E+00
PASS
3.53E+00
1.60E-01
3.97E+00
3.10E+00
9.00E-01
PASS
3.46E+00
1.34E-01
3.83E+00
3.09E+00
8.00E-01
PASS
3.38E+00
1.30E-01
3.74E+00
3.02E+00
7.33E-01
N/A
3.36E+00
1.34E-01
3.73E+00
2.99E+00
6.67E-01
N/A
3.26E+00
1.34E-01
3.63E+00
2.89E+00
6.00E-01
PASS
40
3.30E+00
3.00E+00
3.10E+00
3.00E+00
3.20E+00
3.30E+00
3.60E+00
3.30E+00
3.30E+00
3.30E+00
3.50E+00
3.40E+00
50
3.20E+00
2.90E+00
3.00E+00
2.90E+00
3.10E+00
3.20E+00
3.50E+00
3.20E+00
3.20E+00
3.20E+00
3.50E+00
3.40E+00
An ISO 9001:2008 and DSCC Certified Company
75
3.26E+00
1.34E-01
3.63E+00
2.89E+00
6.00E-01
PASS
3.40E+00
1.73E-01
3.87E+00
2.93E+00
6.00E-01
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Channel Separation @+/-5V 1:2 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.35. Plot of Channel Separation @+/-5V 1:2 (dB) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
76
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.35. Raw data for Channel Separation @+/-5V 1:2 (dB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Channel Separation @+/-5V 1:2 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.14E+02
1.25E+02
1.10E+02
1.24E+02
1.14E+02
1.22E+02
1.13E+02
1.20E+02
1.17E+02
1.09E+02
1.20E+02
1.07E+02
24-hr
Anneal
60
1.27E+02
1.14E+02
1.22E+02
1.24E+02
1.18E+02
1.13E+02
1.11E+02
1.25E+02
1.24E+02
1.21E+02
1.14E+02
1.19E+02
168-hr
Anneal
70
1.26E+02
1.29E+02
1.10E+02
1.22E+02
1.21E+02
1.10E+02
1.10E+02
1.23E+02
1.15E+02
1.08E+02
1.15E+02
1.06E+02
0
1.13E+02
1.07E+02
1.02E+02
1.12E+02
1.19E+02
1.35E+02
1.22E+02
1.17E+02
1.12E+02
1.22E+02
1.21E+02
1.09E+02
10
1.11E+02
1.07E+02
1.17E+02
1.24E+02
1.23E+02
1.16E+02
1.34E+02
1.10E+02
1.08E+02
1.20E+02
1.21E+02
1.05E+02
Total Dose (krad(Si))
20
30
1.13E+02 1.14E+02
1.16E+02 1.24E+02
1.08E+02 1.12E+02
1.21E+02 1.09E+02
1.09E+02 1.21E+02
1.13E+02 1.11E+02
1.12E+02 1.17E+02
1.22E+02 1.14E+02
1.18E+02 1.13E+02
1.14E+02 1.17E+02
1.17E+02 1.13E+02
1.07E+02 1.14E+02
1.10E+02
6.31E+00
1.28E+02
9.31E+01
1.16E+02
7.28E+00
1.36E+02
9.65E+01
1.13E+02
5.40E+00
1.28E+02
9.86E+01
1.16E+02
6.33E+00
1.33E+02
9.86E+01
1.20E+02
9.55E+00
1.46E+02
9.38E+01
1.17E+02
6.85E+00
1.36E+02
9.86E+01
1.21E+02
5.08E+00
1.35E+02
1.07E+02
1.21E+02
7.28E+00
1.41E+02
1.01E+02
1.22E+02
8.62E+00
1.45E+02
9.81E+01
8.20E+01
PASS
1.18E+02
1.01E+01
1.45E+02
9.01E+01
8.20E+01
NA
1.16E+02
4.01E+00
1.27E+02
1.05E+02
8.20E+01
NA
1.14E+02
2.26E+00
1.20E+02
1.08E+02
8.20E+01
NA
1.25E+02
8.48E+00
1.49E+02
1.02E+02
8.20E+01
NA
1.16E+02
5.24E+00
1.30E+02
1.01E+02
8.20E+01
NA
1.19E+02
6.42E+00
1.36E+02
1.01E+02
8.20E+01
NA
1.13E+02
6.24E+00
1.30E+02
9.62E+01
8.20E+01
NA
40
1.09E+02
1.30E+02
1.29E+02
1.17E+02
1.14E+02
1.20E+02
1.13E+02
1.29E+02
1.32E+02
1.33E+02
1.26E+02
1.22E+02
An ISO 9001:2008 and DSCC Certified Company
77
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Channel Separation @+/-5V 1:3 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.36. Plot of Channel Separation @+/-5V 1:3 (dB) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
78
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.36. Raw data for Channel Separation @+/-5V 1:3 (dB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Channel Separation @+/-5V 1:3 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.08E+02
1.05E+02
1.38E+02
1.21E+02
1.24E+02
1.11E+02
1.31E+02
1.16E+02
1.17E+02
1.15E+02
1.09E+02
1.28E+02
24-hr
Anneal
60
1.06E+02
1.17E+02
1.16E+02
1.58E+02
1.20E+02
1.14E+02
1.21E+02
1.22E+02
1.23E+02
1.27E+02
1.05E+02
1.22E+02
168-hr
Anneal
70
1.33E+02
1.22E+02
1.17E+02
1.28E+02
1.09E+02
1.18E+02
1.19E+02
1.09E+02
1.24E+02
1.19E+02
1.13E+02
1.20E+02
0
1.23E+02
1.18E+02
1.11E+02
1.28E+02
1.17E+02
1.15E+02
1.16E+02
1.20E+02
1.08E+02
1.49E+02
1.24E+02
1.28E+02
10
1.18E+02
1.16E+02
1.16E+02
1.11E+02
1.24E+02
1.14E+02
1.28E+02
1.43E+02
1.12E+02
1.19E+02
1.20E+02
1.13E+02
Total Dose (krad(Si))
20
30
1.20E+02 1.09E+02
1.07E+02 1.20E+02
1.47E+02 1.16E+02
1.09E+02 1.31E+02
1.18E+02 1.12E+02
1.08E+02 1.21E+02
1.06E+02 1.16E+02
1.24E+02 1.22E+02
1.39E+02 1.55E+02
1.15E+02 1.15E+02
1.23E+02 1.13E+02
1.15E+02 1.28E+02
1.20E+02
6.65E+00
1.38E+02
1.01E+02
1.17E+02
4.38E+00
1.29E+02
1.05E+02
1.20E+02
1.61E+01
1.64E+02
7.60E+01
1.18E+02
8.62E+00
1.41E+02
9.41E+01
1.15E+02
3.36E+00
1.24E+02
1.06E+02
1.19E+02
1.35E+01
1.56E+02
8.22E+01
1.23E+02
2.01E+01
1.78E+02
6.81E+01
1.22E+02
9.45E+00
1.48E+02
9.58E+01
1.22E+02
1.60E+01
1.65E+02
7.77E+01
8.20E+01
PASS
1.23E+02
1.29E+01
1.58E+02
8.77E+01
8.20E+01
NA
1.18E+02
1.36E+01
1.56E+02
8.09E+01
8.20E+01
NA
1.26E+02
1.67E+01
1.71E+02
8.00E+01
8.20E+01
NA
1.16E+02
5.48E+00
1.31E+02
1.01E+02
8.20E+01
NA
1.18E+02
7.80E+00
1.39E+02
9.65E+01
8.20E+01
NA
1.21E+02
4.76E+00
1.34E+02
1.08E+02
8.20E+01
NA
1.18E+02
5.34E+00
1.32E+02
1.03E+02
8.20E+01
NA
40
1.17E+02
1.10E+02
1.12E+02
1.18E+02
1.17E+02
1.11E+02
1.23E+02
1.12E+02
1.14E+02
1.21E+02
1.27E+02
1.18E+02
An ISO 9001:2008 and DSCC Certified Company
79
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Channel Separation @+/-5V 1:4 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.37. Plot of Channel Separation @+/-5V 1:4 (dB) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
80
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.37. Raw data for Channel Separation @+/-5V 1:4 (dB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Channel Separation @+/-5V 1:4 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.35E+02
1.03E+02
1.16E+02
1.12E+02
1.05E+02
1.12E+02
1.19E+02
1.29E+02
1.07E+02
1.28E+02
1.04E+02
1.11E+02
24-hr
Anneal
60
1.08E+02
1.13E+02
1.05E+02
1.08E+02
1.14E+02
1.25E+02
1.24E+02
1.21E+02
1.08E+02
1.12E+02
1.29E+02
1.07E+02
168-hr
Anneal
70
1.14E+02
1.05E+02
1.08E+02
1.05E+02
1.17E+02
1.31E+02
1.08E+02
1.19E+02
1.14E+02
1.10E+02
1.03E+02
1.41E+02
0
1.39E+02
1.04E+02
1.07E+02
1.03E+02
1.24E+02
1.15E+02
1.04E+02
1.08E+02
1.08E+02
1.10E+02
1.27E+02
1.23E+02
10
1.04E+02
1.06E+02
1.06E+02
1.11E+02
1.04E+02
1.46E+02
1.07E+02
1.21E+02
1.11E+02
1.15E+02
1.12E+02
1.38E+02
Total Dose (krad(Si))
20
30
1.11E+02 1.05E+02
1.08E+02 1.01E+02
1.37E+02 1.17E+02
1.09E+02 1.08E+02
1.24E+02 1.37E+02
1.05E+02 1.02E+02
1.10E+02 1.16E+02
1.29E+02 1.08E+02
1.17E+02 1.20E+02
1.06E+02 1.08E+02
1.22E+02 1.07E+02
1.12E+02 1.06E+02
1.15E+02
1.56E+01
1.58E+02
7.26E+01
1.06E+02
2.82E+00
1.14E+02
9.83E+01
1.18E+02
1.24E+01
1.51E+02
8.37E+01
1.13E+02
1.43E+01
1.53E+02
7.42E+01
1.19E+02
2.20E+01
1.79E+02
5.81E+01
1.14E+02
1.27E+01
1.49E+02
7.94E+01
1.09E+02
3.62E+00
1.19E+02
9.94E+01
1.10E+02
5.33E+00
1.24E+02
9.50E+01
1.09E+02
3.74E+00
1.19E+02
9.86E+01
8.20E+01
PASS
1.20E+02
1.53E+01
1.62E+02
7.81E+01
8.20E+01
NA
1.13E+02
9.85E+00
1.40E+02
8.63E+01
8.20E+01
NA
1.11E+02
6.99E+00
1.30E+02
9.15E+01
8.20E+01
NA
1.08E+02
6.50E+00
1.26E+02
9.06E+01
8.20E+01
NA
1.19E+02
9.82E+00
1.46E+02
9.20E+01
8.20E+01
NA
1.18E+02
7.53E+00
1.38E+02
9.72E+01
8.20E+01
NA
1.16E+02
9.31E+00
1.42E+02
9.08E+01
8.20E+01
NA
40
1.14E+02
1.03E+02
1.10E+02
1.57E+02
1.08E+02
1.20E+02
1.03E+02
1.08E+02
1.06E+02
1.07E+02
1.11E+02
1.04E+02
An ISO 9001:2008 and DSCC Certified Company
81
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Channel Separation @+/-5V 2:1 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.38. Plot of Channel Separation @+/-5V 2:1 (dB) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
82
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.38. Raw data for Channel Separation @+/-5V 2:1 (dB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Channel Separation @+/-5V 2:1 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.13E+02
1.12E+02
1.11E+02
1.15E+02
1.28E+02
1.10E+02
1.27E+02
1.27E+02
1.24E+02
1.23E+02
1.17E+02
1.13E+02
24-hr
Anneal
60
1.20E+02
1.41E+02
1.13E+02
1.04E+02
1.18E+02
1.13E+02
1.19E+02
1.15E+02
1.14E+02
1.21E+02
1.18E+02
1.14E+02
168-hr
Anneal
70
1.17E+02
1.06E+02
1.49E+02
1.14E+02
1.13E+02
1.10E+02
1.06E+02
1.17E+02
1.08E+02
1.21E+02
1.24E+02
1.22E+02
0
1.37E+02
1.22E+02
1.22E+02
1.10E+02
1.23E+02
1.16E+02
1.11E+02
1.19E+02
1.39E+02
1.18E+02
1.10E+02
1.07E+02
10
1.08E+02
1.06E+02
1.17E+02
1.15E+02
1.15E+02
1.16E+02
1.14E+02
1.12E+02
1.08E+02
1.12E+02
1.21E+02
1.11E+02
Total Dose (krad(Si))
20
30
1.11E+02 1.30E+02
1.71E+02 1.14E+02
1.10E+02 1.08E+02
1.11E+02 1.15E+02
1.09E+02 1.05E+02
1.18E+02 1.23E+02
1.45E+02 1.12E+02
1.11E+02 1.15E+02
1.22E+02 1.12E+02
1.21E+02 1.30E+02
1.17E+02 1.25E+02
1.14E+02 1.56E+02
1.23E+02
9.66E+00
1.49E+02
9.63E+01
1.12E+02
4.79E+00
1.26E+02
9.93E+01
1.22E+02
2.74E+01
1.97E+02
4.71E+01
1.14E+02
9.56E+00
1.41E+02
8.82E+01
1.16E+02
4.04E+00
1.27E+02
1.05E+02
1.15E+02
7.11E+00
1.35E+02
9.60E+01
1.19E+02
1.35E+01
1.56E+02
8.21E+01
1.20E+02
1.69E+01
1.66E+02
7.33E+01
1.21E+02
1.09E+01
1.50E+02
9.08E+01
8.20E+01
PASS
1.12E+02
3.15E+00
1.21E+02
1.04E+02
8.20E+01
NA
1.23E+02
1.28E+01
1.58E+02
8.81E+01
8.20E+01
NA
1.18E+02
8.02E+00
1.40E+02
9.62E+01
8.20E+01
NA
1.26E+02
8.95E+00
1.50E+02
1.01E+02
8.20E+01
NA
1.22E+02
6.89E+00
1.41E+02
1.03E+02
8.20E+01
NA
1.16E+02
3.19E+00
1.25E+02
1.08E+02
8.20E+01
NA
1.12E+02
6.55E+00
1.30E+02
9.43E+01
8.20E+01
NA
40
1.11E+02
1.18E+02
1.13E+02
1.18E+02
1.21E+02
1.27E+02
1.29E+02
1.11E+02
1.29E+02
1.34E+02
1.07E+02
1.09E+02
An ISO 9001:2008 and DSCC Certified Company
83
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Channel Separation @+/-5V 2:3 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.39. Plot of Channel Separation @+/-5V 2:3 (dB) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
84
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.39. Raw data for Channel Separation @+/-5V 2:3 (dB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Channel Separation @+/-5V 2:3 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.03E+02
1.06E+02
1.12E+02
1.03E+02
1.12E+02
1.06E+02
1.09E+02
1.18E+02
1.18E+02
1.01E+02
1.18E+02
1.06E+02
24-hr
Anneal
60
1.00E+02
1.11E+02
9.95E+01
1.04E+02
1.08E+02
1.07E+02
1.12E+02
1.15E+02
1.28E+02
1.06E+02
1.15E+02
1.11E+02
168-hr
Anneal
70
1.06E+02
1.16E+02
1.04E+02
1.04E+02
1.10E+02
1.03E+02
1.07E+02
1.04E+02
1.16E+02
1.06E+02
1.09E+02
1.03E+02
0
1.04E+02
1.05E+02
1.12E+02
1.06E+02
1.03E+02
1.03E+02
1.11E+02
1.03E+02
1.04E+02
1.02E+02
1.23E+02
1.09E+02
10
1.02E+02
1.14E+02
1.47E+02
1.08E+02
1.05E+02
1.02E+02
1.14E+02
1.16E+02
1.34E+02
1.11E+02
1.12E+02
1.14E+02
Total Dose (krad(Si))
20
30
1.16E+02 1.10E+02
1.31E+02 1.12E+02
1.08E+02 1.21E+02
1.05E+02 1.09E+02
1.11E+02 1.06E+02
1.06E+02 1.07E+02
1.09E+02 1.07E+02
1.12E+02 1.03E+02
1.06E+02 1.12E+02
1.02E+02 1.04E+02
1.08E+02 1.07E+02
1.06E+02 1.07E+02
1.06E+02
3.38E+00
1.15E+02
9.66E+01
1.15E+02
1.81E+01
1.65E+02
6.58E+01
1.14E+02
1.02E+01
1.42E+02
8.61E+01
1.11E+02
5.50E+00
1.27E+02
9.64E+01
1.08E+02
3.51E+00
1.17E+02
9.79E+01
1.07E+02
4.64E+00
1.20E+02
9.45E+01
1.04E+02
4.83E+00
1.18E+02
9.12E+01
1.08E+02
4.95E+00
1.22E+02
9.44E+01
1.04E+02
3.50E+00
1.14E+02
9.49E+01
8.20E+01
PASS
1.15E+02
1.16E+01
1.47E+02
8.36E+01
8.20E+01
NA
1.07E+02
3.88E+00
1.18E+02
9.65E+01
8.20E+01
NA
1.06E+02
3.71E+00
1.17E+02
9.63E+01
8.20E+01
NA
1.14E+02
5.55E+00
1.30E+02
9.91E+01
8.20E+01
NA
1.10E+02
7.79E+00
1.32E+02
8.90E+01
8.20E+01
NA
1.14E+02
8.91E+00
1.38E+02
8.91E+01
8.20E+01
NA
1.07E+02
5.27E+00
1.22E+02
9.27E+01
8.20E+01
NA
40
1.05E+02
1.05E+02
1.12E+02
1.05E+02
1.11E+02
1.07E+02
1.13E+02
1.17E+02
1.13E+02
1.22E+02
1.10E+02
1.03E+02
An ISO 9001:2008 and DSCC Certified Company
85
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Channel Separation @+/-5V 2:4 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.40. Plot of Channel Separation @+/-5V 2:4 (dB) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
86
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.40. Raw data for Channel Separation @+/-5V 2:4 (dB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Channel Separation @+/-5V 2:4 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.10E+02
1.18E+02
1.15E+02
1.06E+02
1.47E+02
1.07E+02
1.29E+02
1.27E+02
1.20E+02
1.22E+02
1.26E+02
1.18E+02
24-hr
Anneal
60
1.37E+02
1.15E+02
1.18E+02
1.06E+02
1.15E+02
1.10E+02
1.37E+02
1.10E+02
1.22E+02
1.13E+02
1.04E+02
1.23E+02
168-hr
Anneal
70
1.25E+02
1.21E+02
1.13E+02
1.29E+02
1.22E+02
1.18E+02
1.19E+02
1.12E+02
1.08E+02
1.26E+02
1.13E+02
1.05E+02
0
1.22E+02
1.16E+02
1.17E+02
1.49E+02
1.16E+02
1.11E+02
1.19E+02
1.24E+02
1.20E+02
1.22E+02
1.20E+02
1.18E+02
10
1.13E+02
1.21E+02
1.33E+02
1.09E+02
1.09E+02
1.24E+02
1.08E+02
1.17E+02
1.24E+02
1.11E+02
1.09E+02
1.24E+02
Total Dose (krad(Si))
20
30
1.20E+02 1.13E+02
1.13E+02 1.26E+02
1.15E+02 1.08E+02
1.08E+02 1.20E+02
1.14E+02 1.27E+02
1.12E+02 1.10E+02
1.06E+02 1.10E+02
1.26E+02 1.11E+02
1.16E+02 1.24E+02
1.16E+02 1.30E+02
1.21E+02 1.10E+02
1.11E+02 1.09E+02
1.24E+02
1.42E+01
1.63E+02
8.51E+01
1.17E+02
1.03E+01
1.45E+02
8.88E+01
1.14E+02
4.53E+00
1.26E+02
1.02E+02
1.19E+02
8.36E+00
1.42E+02
9.59E+01
1.14E+02
3.81E+00
1.25E+02
1.04E+02
1.19E+02
1.61E+01
1.63E+02
7.49E+01
1.18E+02
1.12E+01
1.49E+02
8.74E+01
1.22E+02
6.11E+00
1.39E+02
1.05E+02
1.20E+02
4.89E+00
1.33E+02
1.06E+02
8.20E+01
PASS
1.17E+02
7.16E+00
1.36E+02
9.69E+01
8.20E+01
NA
1.15E+02
7.41E+00
1.35E+02
9.48E+01
8.20E+01
NA
1.17E+02
9.46E+00
1.43E+02
9.11E+01
8.20E+01
NA
1.15E+02
2.67E+00
1.22E+02
1.08E+02
8.20E+01
NA
1.21E+02
8.41E+00
1.44E+02
9.78E+01
8.20E+01
NA
1.19E+02
1.16E+01
1.50E+02
8.68E+01
8.20E+01
NA
1.17E+02
6.98E+00
1.36E+02
9.74E+01
8.20E+01
NA
40
1.20E+02
1.17E+02
1.12E+02
1.12E+02
1.11E+02
1.12E+02
1.16E+02
1.14E+02
1.15E+02
1.19E+02
1.14E+02
1.15E+02
An ISO 9001:2008 and DSCC Certified Company
87
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Channel Separation @+/-5V 3:1 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.41. Plot of Channel Separation @+/-5V 3:1 (dB) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
88
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.41. Raw data for Channel Separation @+/-5V 3:1 (dB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Channel Separation @+/-5V 3:1 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.06E+02
1.20E+02
1.31E+02
1.18E+02
1.15E+02
1.29E+02
1.30E+02
1.09E+02
1.12E+02
1.28E+02
1.24E+02
1.26E+02
24-hr
Anneal
60
1.10E+02
1.18E+02
1.09E+02
1.08E+02
1.13E+02
1.37E+02
1.24E+02
1.19E+02
1.15E+02
1.12E+02
1.38E+02
1.10E+02
168-hr
Anneal
70
1.35E+02
1.06E+02
1.10E+02
1.12E+02
1.40E+02
1.12E+02
1.05E+02
1.27E+02
1.25E+02
1.10E+02
1.03E+02
1.05E+02
0
1.19E+02
1.01E+02
1.20E+02
1.15E+02
1.05E+02
1.08E+02
1.36E+02
1.16E+02
1.32E+02
1.25E+02
1.15E+02
1.15E+02
10
1.22E+02
1.29E+02
1.20E+02
1.04E+02
1.10E+02
1.22E+02
1.10E+02
1.19E+02
1.17E+02
1.17E+02
1.36E+02
1.19E+02
Total Dose (krad(Si))
20
30
1.14E+02 1.23E+02
1.09E+02 1.17E+02
1.40E+02 1.09E+02
1.17E+02 1.11E+02
1.10E+02 1.17E+02
1.07E+02 1.05E+02
1.12E+02 1.21E+02
1.12E+02 1.05E+02
1.34E+02 1.19E+02
1.08E+02 1.23E+02
1.25E+02 1.14E+02
1.19E+02 1.18E+02
1.12E+02
8.46E+00
1.35E+02
8.90E+01
1.17E+02
9.74E+00
1.44E+02
9.04E+01
1.18E+02
1.26E+01
1.52E+02
8.35E+01
1.16E+02
5.50E+00
1.31E+02
1.00E+02
1.14E+02
7.39E+00
1.35E+02
9.40E+01
1.18E+02
8.80E+00
1.42E+02
9.41E+01
1.11E+02
4.16E+00
1.23E+02
1.00E+02
1.21E+02
1.58E+01
1.64E+02
7.74E+01
1.23E+02
1.11E+01
1.54E+02
9.30E+01
8.20E+01
PASS
1.17E+02
4.47E+00
1.29E+02
1.05E+02
8.20E+01
NA
1.15E+02
1.08E+01
1.44E+02
8.51E+01
8.20E+01
NA
1.14E+02
8.83E+00
1.39E+02
9.01E+01
8.20E+01
NA
1.15E+02
8.34E+00
1.38E+02
9.25E+01
8.20E+01
NA
1.21E+02
1.04E+01
1.50E+02
9.30E+01
8.20E+01
NA
1.21E+02
1.00E+01
1.49E+02
9.38E+01
8.20E+01
NA
1.16E+02
9.86E+00
1.43E+02
8.86E+01
8.20E+01
NA
40
1.17E+02
1.12E+02
1.26E+02
1.07E+02
1.09E+02
1.29E+02
1.10E+02
1.07E+02
1.15E+02
1.17E+02
1.17E+02
1.21E+02
An ISO 9001:2008 and DSCC Certified Company
89
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Channel Separation @+/-5V 3:2 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.42. Plot of Channel Separation @+/-5V 3:2 (dB) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
90
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.42. Raw data for Channel Separation @+/-5V 3:2 (dB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Channel Separation @+/-5V 3:2 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.14E+02
1.00E+02
1.13E+02
1.11E+02
1.15E+02
1.03E+02
1.04E+02
1.32E+02
1.06E+02
1.04E+02
1.11E+02
1.10E+02
24-hr
Anneal
60
1.04E+02
1.09E+02
1.18E+02
1.09E+02
1.01E+02
1.04E+02
1.11E+02
1.30E+02
1.18E+02
1.02E+02
1.14E+02
1.04E+02
168-hr
Anneal
70
1.09E+02
9.98E+01
1.08E+02
1.09E+02
1.08E+02
1.06E+02
1.05E+02
1.05E+02
1.08E+02
1.04E+02
1.03E+02
1.11E+02
0
1.12E+02
1.03E+02
1.12E+02
1.04E+02
1.04E+02
1.18E+02
1.21E+02
1.08E+02
1.20E+02
1.08E+02
1.27E+02
1.10E+02
10
1.05E+02
1.08E+02
1.03E+02
1.09E+02
1.11E+02
1.08E+02
1.07E+02
1.17E+02
1.08E+02
1.36E+02
1.05E+02
1.17E+02
Total Dose (krad(Si))
20
30
1.10E+02 1.02E+02
1.06E+02 1.10E+02
1.11E+02 1.11E+02
1.13E+02 1.04E+02
1.08E+02 1.41E+02
1.05E+02 1.08E+02
1.05E+02 1.14E+02
1.34E+02 1.03E+02
1.10E+02 1.09E+02
1.03E+02 1.04E+02
1.18E+02 1.11E+02
1.07E+02 1.16E+02
1.07E+02
4.57E+00
1.19E+02
9.44E+01
1.07E+02
3.08E+00
1.16E+02
9.89E+01
1.10E+02
2.81E+00
1.17E+02
1.02E+02
1.14E+02
1.58E+01
1.57E+02
7.04E+01
1.07E+02
3.03E+00
1.16E+02
9.91E+01
1.10E+02
5.83E+00
1.26E+02
9.45E+01
1.08E+02
6.57E+00
1.26E+02
9.03E+01
1.07E+02
3.82E+00
1.17E+02
9.61E+01
1.15E+02
6.29E+00
1.32E+02
9.76E+01
8.20E+01
PASS
1.15E+02
1.22E+01
1.49E+02
8.16E+01
8.20E+01
NA
1.11E+02
1.27E+01
1.46E+02
7.64E+01
8.20E+01
NA
1.07E+02
4.43E+00
1.20E+02
9.53E+01
8.20E+01
NA
1.09E+02
3.43E+00
1.18E+02
9.94E+01
8.20E+01
NA
1.10E+02
1.25E+01
1.44E+02
7.55E+01
8.20E+01
NA
1.13E+02
1.11E+01
1.43E+02
8.26E+01
8.20E+01
NA
1.05E+02
1.54E+00
1.10E+02
1.01E+02
8.20E+01
NA
40
1.07E+02
1.04E+02
1.09E+02
1.12E+02
1.06E+02
1.14E+02
1.09E+02
1.08E+02
1.04E+02
1.10E+02
1.13E+02
1.08E+02
An ISO 9001:2008 and DSCC Certified Company
91
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Channel Separation @+/-5V 3:4 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.43. Plot of Channel Separation @+/-5V 3:4 (dB) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
92
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.43. Raw data for Channel Separation @+/-5V 3:4 (dB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Channel Separation @+/-5V 3:4 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.12E+02
1.10E+02
1.16E+02
1.19E+02
1.15E+02
1.10E+02
1.09E+02
1.25E+02
1.05E+02
1.14E+02
1.48E+02
1.21E+02
24-hr
Anneal
60
1.11E+02
1.13E+02
1.07E+02
1.08E+02
1.21E+02
1.11E+02
1.17E+02
1.19E+02
1.09E+02
1.30E+02
1.18E+02
1.10E+02
168-hr
Anneal
70
1.14E+02
1.07E+02
1.17E+02
1.27E+02
1.18E+02
1.09E+02
1.49E+02
1.22E+02
1.16E+02
1.16E+02
1.13E+02
1.29E+02
0
1.22E+02
1.25E+02
1.08E+02
1.18E+02
1.22E+02
1.10E+02
1.29E+02
1.32E+02
1.19E+02
1.10E+02
1.05E+02
1.07E+02
10
1.24E+02
1.19E+02
1.14E+02
1.10E+02
1.14E+02
1.04E+02
1.10E+02
1.13E+02
1.29E+02
1.25E+02
1.09E+02
1.31E+02
Total Dose (krad(Si))
20
30
1.19E+02 1.09E+02
1.20E+02 1.17E+02
1.07E+02 1.26E+02
1.20E+02 1.20E+02
1.24E+02 1.23E+02
1.20E+02 1.14E+02
1.23E+02 1.05E+02
1.20E+02 1.15E+02
1.48E+02 1.27E+02
1.20E+02 1.46E+02
1.12E+02 1.27E+02
1.13E+02 1.12E+02
1.19E+02
6.67E+00
1.38E+02
1.01E+02
1.16E+02
5.35E+00
1.31E+02
1.02E+02
1.18E+02
6.59E+00
1.36E+02
9.97E+01
1.19E+02
6.40E+00
1.37E+02
1.01E+02
1.28E+02
1.71E+01
1.75E+02
8.12E+01
1.14E+02
3.63E+00
1.24E+02
1.04E+02
1.12E+02
5.73E+00
1.28E+02
9.62E+01
1.17E+02
7.27E+00
1.36E+02
9.66E+01
1.20E+02
1.03E+01
1.48E+02
9.18E+01
8.20E+01
PASS
1.16E+02
1.06E+01
1.45E+02
8.72E+01
8.20E+01
NA
1.26E+02
1.20E+01
1.59E+02
9.33E+01
8.20E+01
NA
1.21E+02
1.58E+01
1.65E+02
7.81E+01
8.20E+01
NA
1.23E+02
1.04E+01
1.51E+02
9.41E+01
8.20E+01
NA
1.13E+02
7.62E+00
1.34E+02
9.18E+01
8.20E+01
NA
1.17E+02
8.05E+00
1.39E+02
9.51E+01
8.20E+01
NA
1.22E+02
1.56E+01
1.65E+02
7.95E+01
8.20E+01
NA
40
1.13E+02
1.25E+02
1.57E+02
1.25E+02
1.19E+02
1.16E+02
1.11E+02
1.20E+02
1.36E+02
1.30E+02
1.11E+02
1.18E+02
An ISO 9001:2008 and DSCC Certified Company
93
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Channel Separation @+/-5V 4:1 (dB)
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.44. Plot of Channel Separation @+/-5V 4:1 (dB) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
94
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.44. Raw data for Channel Separation @+/-5V 4:1 (dB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Channel Separation @+/-5V 4:1 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.02E+02
1.21E+02
1.05E+02
1.11E+02
1.08E+02
1.14E+02
1.06E+02
1.02E+02
1.06E+02
1.03E+02
1.04E+02
1.07E+02
24-hr
Anneal
60
9.75E+01
1.03E+02
1.07E+02
1.02E+02
1.08E+02
1.08E+02
1.30E+02
1.01E+02
1.06E+02
1.02E+02
1.05E+02
1.12E+02
168-hr
Anneal
70
1.04E+02
1.10E+02
1.08E+02
1.05E+02
1.10E+02
1.05E+02
1.09E+02
1.08E+02
1.07E+02
1.02E+02
1.08E+02
1.05E+02
0
1.05E+02
1.07E+02
1.14E+02
1.10E+02
1.02E+02
1.03E+02
1.06E+02
1.01E+02
1.04E+02
1.02E+02
1.03E+02
1.05E+02
10
1.08E+02
1.12E+02
1.04E+02
1.06E+02
1.06E+02
1.17E+02
1.15E+02
1.04E+02
1.05E+02
1.03E+02
1.06E+02
1.05E+02
Total Dose (krad(Si))
20
30
1.09E+02 9.91E+01
1.10E+02 1.03E+02
1.06E+02 1.03E+02
1.05E+02 1.16E+02
1.04E+02 1.03E+02
1.08E+02 1.05E+02
1.11E+02 1.02E+02
1.15E+02 1.02E+02
1.02E+02 1.16E+02
1.03E+02 1.04E+02
1.08E+02 1.03E+02
1.02E+02 1.03E+02
1.08E+02
4.88E+00
1.21E+02
9.42E+01
1.07E+02
3.14E+00
1.16E+02
9.87E+01
1.07E+02
2.70E+00
1.14E+02
9.94E+01
1.05E+02
6.51E+00
1.23E+02
8.69E+01
1.05E+02
2.45E+00
1.11E+02
9.78E+01
1.09E+02
7.32E+00
1.29E+02
8.93E+01
1.03E+02
4.07E+00
1.14E+02
9.21E+01
1.07E+02
2.93E+00
1.15E+02
9.92E+01
1.03E+02
1.63E+00
1.08E+02
9.90E+01
8.20E+01
PASS
1.09E+02
6.80E+00
1.27E+02
9.01E+01
8.20E+01
NA
1.08E+02
5.45E+00
1.23E+02
9.28E+01
8.20E+01
NA
1.06E+02
6.05E+00
1.22E+02
8.93E+01
8.20E+01
NA
1.06E+02
5.20E+00
1.21E+02
9.21E+01
8.20E+01
NA
1.06E+02
4.57E+00
1.19E+02
9.36E+01
8.20E+01
NA
1.09E+02
1.18E+01
1.42E+02
7.70E+01
8.20E+01
NA
1.06E+02
2.91E+00
1.14E+02
9.83E+01
8.20E+01
NA
40
1.03E+02
1.08E+02
1.06E+02
1.02E+02
1.04E+02
1.00E+02
1.07E+02
1.02E+02
1.12E+02
1.11E+02
1.03E+02
1.05E+02
An ISO 9001:2008 and DSCC Certified Company
95
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Channel Separation @+/-5V 4:2 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.45. Plot of Channel Separation @+/-5V 4:2 (dB) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
96
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.45. Raw data for Channel Separation @+/-5V 4:2 (dB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Channel Separation @+/-5V 4:2 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.12E+02
1.12E+02
1.09E+02
1.28E+02
1.10E+02
1.09E+02
1.22E+02
1.08E+02
1.13E+02
1.32E+02
1.12E+02
1.16E+02
24-hr
Anneal
60
1.17E+02
1.21E+02
1.19E+02
1.47E+02
1.11E+02
1.19E+02
1.09E+02
1.20E+02
1.28E+02
1.32E+02
1.32E+02
1.16E+02
168-hr
Anneal
70
1.17E+02
1.11E+02
1.09E+02
1.36E+02
1.18E+02
1.12E+02
1.13E+02
1.23E+02
1.32E+02
1.04E+02
1.30E+02
1.17E+02
0
1.19E+02
1.20E+02
1.14E+02
1.21E+02
1.14E+02
1.11E+02
1.14E+02
1.21E+02
1.24E+02
1.20E+02
1.30E+02
1.12E+02
10
1.27E+02
1.16E+02
1.15E+02
1.12E+02
1.10E+02
1.36E+02
1.09E+02
1.13E+02
1.16E+02
1.13E+02
1.10E+02
1.25E+02
Total Dose (krad(Si))
20
30
1.34E+02 1.12E+02
1.23E+02 1.47E+02
1.17E+02 1.12E+02
1.08E+02 1.16E+02
1.18E+02 1.32E+02
1.17E+02 1.12E+02
1.16E+02 1.11E+02
1.16E+02 1.18E+02
1.13E+02 1.20E+02
1.17E+02 1.06E+02
1.11E+02 1.22E+02
1.17E+02 1.46E+02
1.17E+02
3.56E+00
1.27E+02
1.08E+02
1.16E+02
6.71E+00
1.34E+02
9.76E+01
1.20E+02
9.25E+00
1.45E+02
9.45E+01
1.24E+02
1.55E+01
1.66E+02
8.15E+01
1.14E+02
2.69E+00
1.22E+02
1.07E+02
1.14E+02
7.45E+00
1.35E+02
9.40E+01
1.23E+02
1.38E+01
1.61E+02
8.53E+01
1.18E+02
1.08E+01
1.48E+02
8.84E+01
1.18E+02
5.21E+00
1.32E+02
1.04E+02
8.20E+01
PASS
1.17E+02
1.08E+01
1.47E+02
8.77E+01
8.20E+01
NA
1.16E+02
1.64E+00
1.20E+02
1.11E+02
8.20E+01
NA
1.13E+02
5.66E+00
1.29E+02
9.79E+01
8.20E+01
NA
1.18E+02
5.38E+00
1.33E+02
1.03E+02
8.20E+01
NA
1.17E+02
9.86E+00
1.44E+02
8.97E+01
8.20E+01
NA
1.22E+02
9.02E+00
1.46E+02
9.70E+01
8.20E+01
NA
1.17E+02
1.09E+01
1.47E+02
8.69E+01
8.20E+01
NA
40
1.12E+02
1.17E+02
1.11E+02
1.15E+02
1.16E+02
1.16E+02
1.26E+02
1.17E+02
1.12E+02
1.20E+02
1.05E+02
1.14E+02
An ISO 9001:2008 and DSCC Certified Company
97
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Channel Separation @+/-5V 4:3 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.46. Plot of Channel Separation @+/-5V 4:3 (dB) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
98
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.46. Raw data for Channel Separation @+/-5V 4:3 (dB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Channel Separation @+/-5V 4:3 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.19E+02
1.21E+02
1.27E+02
1.09E+02
1.28E+02
1.09E+02
1.13E+02
1.32E+02
1.09E+02
1.23E+02
1.44E+02
1.04E+02
24-hr
Anneal
60
1.10E+02
1.24E+02
1.19E+02
1.14E+02
1.14E+02
1.15E+02
1.13E+02
1.02E+02
1.13E+02
1.28E+02
1.09E+02
1.11E+02
168-hr
Anneal
70
1.07E+02
1.06E+02
1.42E+02
1.06E+02
1.41E+02
1.06E+02
1.15E+02
1.10E+02
1.27E+02
1.20E+02
1.23E+02
1.11E+02
0
1.12E+02
1.10E+02
1.14E+02
1.14E+02
1.17E+02
1.17E+02
1.12E+02
1.31E+02
1.29E+02
1.07E+02
1.10E+02
1.27E+02
10
1.31E+02
1.15E+02
1.15E+02
1.30E+02
1.07E+02
1.29E+02
1.12E+02
1.35E+02
1.06E+02
1.13E+02
1.21E+02
1.32E+02
Total Dose (krad(Si))
20
30
1.07E+02 1.13E+02
1.14E+02 1.21E+02
1.30E+02 1.09E+02
1.06E+02 1.24E+02
1.18E+02 1.08E+02
1.41E+02 1.18E+02
1.17E+02 1.42E+02
1.10E+02 1.10E+02
1.07E+02 1.13E+02
1.19E+02 1.21E+02
1.18E+02 1.12E+02
1.18E+02 1.23E+02
1.14E+02
2.81E+00
1.21E+02
1.06E+02
1.20E+02
1.08E+01
1.49E+02
9.00E+01
1.15E+02
9.69E+00
1.41E+02
8.83E+01
1.15E+02
7.04E+00
1.34E+02
9.58E+01
1.16E+02
7.18E+00
1.36E+02
9.62E+01
1.21E+02
7.59E+00
1.41E+02
9.98E+01
1.16E+02
5.74E+00
1.32E+02
1.01E+02
1.20E+02
1.92E+01
1.73E+02
6.79E+01
1.19E+02
1.05E+01
1.48E+02
9.05E+01
8.20E+01
PASS
1.19E+02
1.25E+01
1.53E+02
8.46E+01
8.20E+01
NA
1.19E+02
1.32E+01
1.55E+02
8.24E+01
8.20E+01
NA
1.21E+02
1.26E+01
1.55E+02
8.61E+01
8.20E+01
NA
1.15E+02
4.58E+00
1.28E+02
1.03E+02
8.20E+01
NA
1.17E+02
1.03E+01
1.45E+02
8.91E+01
8.20E+01
NA
1.14E+02
9.14E+00
1.39E+02
8.89E+01
8.20E+01
NA
1.16E+02
8.29E+00
1.38E+02
9.29E+01
8.20E+01
NA
40
1.07E+02
1.17E+02
1.13E+02
1.15E+02
1.27E+02
1.21E+02
1.09E+02
1.18E+02
1.15E+02
1.14E+02
1.32E+02
1.14E+02
An ISO 9001:2008 and DSCC Certified Company
99
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High @+/-5V RL=500 #1 (V)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
4.05E+00
4.00E+00
3.95E+00
3.90E+00
3.85E+00
3.80E+00
3.75E+00
3.70E+00
3.65E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.47. Plot of Output Voltage Swing High @+/-5V RL=500 #1 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.47. Raw data for Output Voltage Swing High @+/-5V RL=500 #1 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing High @+/-5V RL=500 #1 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
60
4.00E+00
4.00E+00
4.01E+00
4.00E+00
4.00E+00
4.03E+00
4.02E+00
4.02E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
168-hr
Anneal
70
4.01E+00
4.01E+00
4.01E+00
4.01E+00
4.01E+00
4.03E+00
4.02E+00
4.02E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
0
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
10
4.02E+00
4.01E+00
4.02E+00
4.01E+00
4.01E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
Total Dose (krad(Si))
20
30
3.99E+00 3.99E+00
3.99E+00 4.00E+00
4.00E+00 4.00E+00
4.00E+00 4.00E+00
4.00E+00 4.00E+00
4.03E+00 4.03E+00
4.02E+00 4.02E+00
4.02E+00 4.02E+00
4.03E+00 4.03E+00
4.03E+00 4.03E+00
4.03E+00 4.03E+00
4.03E+00 4.03E+00
4.03E+00
1.14E-03
4.03E+00
4.02E+00
4.01E+00
3.44E-03
4.02E+00
4.00E+00
3.99E+00
3.65E-03
4.00E+00
3.98E+00
4.00E+00
4.39E-03
4.01E+00
3.99E+00
4.00E+00
4.87E-03
4.01E+00
3.99E+00
4.00E+00 4.00E+00 4.01E+00
3.27E-03 2.51E-03 1.79E-03
4.01E+00 4.01E+00 4.02E+00
3.99E+00 3.99E+00 4.01E+00
4.03E+00
2.05E-03
4.03E+00
4.02E+00
3.80E+00
PASS
4.03E+00
2.05E-03
4.03E+00
4.02E+00
3.80E+00
PASS
4.03E+00
1.92E-03
4.03E+00
4.02E+00
3.80E+00
PASS
4.03E+00
2.07E-03
4.03E+00
4.02E+00
3.77E+00
N/A
4.03E+00
1.92E-03
4.03E+00
4.02E+00
3.73E+00
N/A
4.02E+00
1.82E-03
4.03E+00
4.02E+00
3.70E+00
PASS
40
3.99E+00
4.00E+00
4.00E+00
4.00E+00
4.00E+00
4.03E+00
4.02E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
50
4.00E+00
4.00E+00
4.01E+00
4.00E+00
4.00E+00
4.03E+00
4.02E+00
4.02E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
An ISO 9001:2008 and DSCC Certified Company
101
4.03E+00
1.92E-03
4.03E+00
4.02E+00
3.70E+00
PASS
4.03E+00
1.67E-03
4.03E+00
4.02E+00
3.70E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High @+/-5V RL=500 #2 (V)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
4.05E+00
4.00E+00
3.95E+00
3.90E+00
3.85E+00
3.80E+00
3.75E+00
3.70E+00
3.65E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.48. Plot of Output Voltage Swing High @+/-5V RL=500 #2 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
102
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.48. Raw data for Output Voltage Swing High @+/-5V RL=500 #2 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing High @+/-5V RL=500 #2 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
60
4.00E+00
3.99E+00
4.00E+00
4.00E+00
4.01E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.03E+00
4.03E+00
168-hr
Anneal
70
4.01E+00
4.01E+00
4.01E+00
4.01E+00
4.01E+00
4.03E+00
4.02E+00
4.02E+00
4.03E+00
4.02E+00
4.03E+00
4.03E+00
0
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
10
4.01E+00
4.01E+00
4.02E+00
4.01E+00
4.01E+00
4.03E+00
4.02E+00
4.02E+00
4.03E+00
4.02E+00
4.03E+00
4.03E+00
Total Dose (krad(Si))
20
30
3.99E+00 3.99E+00
3.99E+00 3.99E+00
4.00E+00 4.00E+00
3.99E+00 4.00E+00
4.00E+00 4.01E+00
4.02E+00 4.02E+00
4.02E+00 4.02E+00
4.02E+00 4.02E+00
4.03E+00 4.02E+00
4.02E+00 4.02E+00
4.03E+00 4.03E+00
4.03E+00 4.03E+00
4.03E+00
1.14E-03
4.03E+00
4.02E+00
4.01E+00
3.58E-03
4.02E+00
4.00E+00
3.99E+00
6.19E-03
4.01E+00
3.98E+00
4.00E+00
6.62E-03
4.02E+00
3.98E+00
4.00E+00
7.01E-03
4.02E+00
3.98E+00
4.00E+00 4.00E+00 4.01E+00
5.43E-03 5.05E-03 2.49E-03
4.02E+00 4.01E+00 4.02E+00
3.99E+00 3.99E+00 4.00E+00
4.03E+00
1.52E-03
4.03E+00
4.02E+00
3.80E+00
PASS
4.02E+00
1.92E-03
4.03E+00
4.02E+00
3.80E+00
PASS
4.02E+00
1.58E-03
4.03E+00
4.02E+00
3.80E+00
PASS
4.02E+00
1.30E-03
4.03E+00
4.02E+00
3.77E+00
N/A
4.02E+00
1.58E-03
4.03E+00
4.02E+00
3.73E+00
N/A
4.02E+00
1.22E-03
4.03E+00
4.02E+00
3.70E+00
PASS
40
3.99E+00
3.99E+00
4.00E+00
4.00E+00
4.01E+00
4.03E+00
4.02E+00
4.02E+00
4.03E+00
4.02E+00
4.03E+00
4.03E+00
50
4.00E+00
4.00E+00
4.01E+00
4.00E+00
4.01E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.03E+00
4.03E+00
An ISO 9001:2008 and DSCC Certified Company
103
4.02E+00
1.30E-03
4.03E+00
4.02E+00
3.70E+00
PASS
4.02E+00
1.52E-03
4.03E+00
4.02E+00
3.70E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High @+/-5V RL=500 #3 (V)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
4.05E+00
4.00E+00
3.95E+00
3.90E+00
3.85E+00
3.80E+00
3.75E+00
3.70E+00
3.65E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.49. Plot of Output Voltage Swing High @+/-5V RL=500 #3 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
104
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.49. Raw data for Output Voltage Swing High @+/-5V RL=500 #3 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing High @+/-5V RL=500 #3 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
60
4.00E+00
4.00E+00
4.01E+00
4.00E+00
4.01E+00
4.03E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.03E+00
4.03E+00
168-hr
Anneal
70
4.01E+00
4.01E+00
4.01E+00
4.01E+00
4.01E+00
4.03E+00
4.02E+00
4.02E+00
4.03E+00
4.02E+00
4.03E+00
4.03E+00
0
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
10
4.02E+00
4.01E+00
4.02E+00
4.01E+00
4.02E+00
4.03E+00
4.02E+00
4.02E+00
4.03E+00
4.02E+00
4.03E+00
4.03E+00
Total Dose (krad(Si))
20
30
4.00E+00 4.00E+00
3.99E+00 3.99E+00
4.00E+00 4.00E+00
3.99E+00 4.00E+00
4.00E+00 4.01E+00
4.02E+00 4.03E+00
4.02E+00 4.02E+00
4.02E+00 4.02E+00
4.02E+00 4.03E+00
4.02E+00 4.02E+00
4.03E+00 4.03E+00
4.03E+00 4.03E+00
4.03E+00
1.14E-03
4.03E+00
4.02E+00
4.01E+00
4.51E-03
4.03E+00
4.00E+00
4.00E+00
5.94E-03
4.01E+00
3.98E+00
4.00E+00
5.41E-03
4.01E+00
3.98E+00
4.00E+00
5.59E-03
4.01E+00
3.98E+00
4.00E+00 4.00E+00 4.01E+00
4.72E-03 4.32E-03 3.83E-03
4.02E+00 4.01E+00 4.02E+00
3.99E+00 3.99E+00 4.00E+00
4.03E+00
1.10E-03
4.03E+00
4.02E+00
3.80E+00
PASS
4.03E+00
1.41E-03
4.03E+00
4.02E+00
3.80E+00
PASS
4.02E+00
8.37E-04
4.03E+00
4.02E+00
3.80E+00
PASS
4.02E+00
1.34E-03
4.03E+00
4.02E+00
3.77E+00
N/A
4.02E+00
1.30E-03
4.03E+00
4.02E+00
3.73E+00
N/A
4.02E+00
1.34E-03
4.03E+00
4.02E+00
3.70E+00
PASS
40
4.00E+00
3.99E+00
4.00E+00
4.00E+00
4.01E+00
4.03E+00
4.02E+00
4.02E+00
4.03E+00
4.02E+00
4.03E+00
4.03E+00
50
4.00E+00
4.00E+00
4.01E+00
4.00E+00
4.01E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.03E+00
4.03E+00
An ISO 9001:2008 and DSCC Certified Company
105
4.02E+00
1.30E-03
4.03E+00
4.02E+00
3.70E+00
PASS
4.02E+00
1.30E-03
4.03E+00
4.02E+00
3.70E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High @+/-5V RL=500 #4 (V)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
4.05E+00
4.00E+00
3.95E+00
3.90E+00
3.85E+00
3.80E+00
3.75E+00
3.70E+00
3.65E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.50. Plot of Output Voltage Swing High @+/-5V RL=500 #4 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
106
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.50. Raw data for Output Voltage Swing High @+/-5V RL=500 #4 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing High @+/-5V RL=500 #4 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
60
4.00E+00
4.00E+00
4.00E+00
4.00E+00
4.01E+00
4.03E+00
4.02E+00
4.02E+00
4.02E+00
4.03E+00
4.03E+00
4.03E+00
168-hr
Anneal
70
4.01E+00
4.01E+00
4.01E+00
4.01E+00
4.01E+00
4.03E+00
4.02E+00
4.02E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
0
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
10
4.02E+00
4.01E+00
4.02E+00
4.01E+00
4.01E+00
4.03E+00
4.02E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
Total Dose (krad(Si))
20
30
3.99E+00 3.99E+00
3.99E+00 3.99E+00
4.00E+00 4.00E+00
4.00E+00 4.00E+00
4.00E+00 4.01E+00
4.03E+00 4.03E+00
4.02E+00 4.02E+00
4.02E+00 4.02E+00
4.02E+00 4.02E+00
4.03E+00 4.03E+00
4.03E+00 4.03E+00
4.03E+00 4.03E+00
4.03E+00
1.30E-03
4.03E+00
4.02E+00
4.01E+00
3.19E-03
4.02E+00
4.00E+00
3.99E+00
4.72E-03
4.01E+00
3.98E+00
4.00E+00
5.07E-03
4.01E+00
3.99E+00
4.00E+00
5.59E-03
4.01E+00
3.98E+00
4.00E+00 4.00E+00 4.01E+00
4.72E-03 3.85E-03 2.07E-03
4.02E+00 4.01E+00 4.02E+00
3.99E+00 3.99E+00 4.01E+00
4.03E+00
1.82E-03
4.03E+00
4.02E+00
3.80E+00
PASS
4.03E+00
1.52E-03
4.03E+00
4.02E+00
3.80E+00
PASS
4.02E+00
1.92E-03
4.03E+00
4.02E+00
3.80E+00
PASS
4.02E+00
1.87E-03
4.03E+00
4.02E+00
3.77E+00
N/A
4.03E+00
1.92E-03
4.03E+00
4.02E+00
3.73E+00
N/A
4.02E+00
2.19E-03
4.03E+00
4.02E+00
3.70E+00
PASS
40
3.99E+00
3.99E+00
4.00E+00
4.00E+00
4.01E+00
4.03E+00
4.02E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
4.03E+00
50
4.00E+00
4.00E+00
4.01E+00
4.00E+00
4.01E+00
4.02E+00
4.02E+00
4.02E+00
4.02E+00
4.03E+00
4.03E+00
4.03E+00
An ISO 9001:2008 and DSCC Certified Company
107
4.02E+00
1.87E-03
4.03E+00
4.02E+00
3.70E+00
PASS
4.02E+00
1.67E-03
4.03E+00
4.02E+00
3.70E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High @+/-5V RL=100 #1 (V)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
3.70E+00
3.65E+00
3.60E+00
3.55E+00
3.50E+00
3.45E+00
3.40E+00
3.35E+00
3.30E+00
3.25E+00
3.20E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.51. Plot of Output Voltage Swing High @+/-5V RL=100 #1 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
108
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.51. Raw data for Output Voltage Swing High @+/-5V RL=100 #1 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing High @+/-5V RL=100 #1 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
60
3.62E+00
3.62E+00
3.63E+00
3.63E+00
3.62E+00
3.64E+00
3.63E+00
3.63E+00
3.64E+00
3.64E+00
3.64E+00
3.64E+00
168-hr
Anneal
70
3.63E+00
3.63E+00
3.63E+00
3.63E+00
3.63E+00
3.64E+00
3.63E+00
3.63E+00
3.64E+00
3.65E+00
3.64E+00
3.64E+00
0
3.64E+00
3.64E+00
3.64E+00
3.64E+00
3.64E+00
3.64E+00
3.64E+00
3.64E+00
3.64E+00
3.65E+00
3.64E+00
3.64E+00
10
3.63E+00
3.63E+00
3.63E+00
3.63E+00
3.63E+00
3.64E+00
3.64E+00
3.63E+00
3.64E+00
3.65E+00
3.64E+00
3.64E+00
Total Dose (krad(Si))
20
30
3.63E+00 3.62E+00
3.62E+00 3.62E+00
3.63E+00 3.63E+00
3.63E+00 3.63E+00
3.62E+00 3.62E+00
3.64E+00 3.64E+00
3.63E+00 3.63E+00
3.63E+00 3.63E+00
3.64E+00 3.64E+00
3.65E+00 3.64E+00
3.64E+00 3.64E+00
3.64E+00 3.64E+00
3.64E+00
2.68E-03
3.65E+00
3.63E+00
3.63E+00
2.88E-03
3.64E+00
3.62E+00
3.63E+00
2.45E-03
3.63E+00
3.62E+00
3.63E+00
2.00E-03
3.63E+00
3.62E+00
3.62E+00
2.41E-03
3.63E+00
3.62E+00
3.62E+00 3.62E+00 3.63E+00
2.74E-03 1.92E-03 2.07E-03
3.63E+00 3.63E+00 3.63E+00
3.62E+00 3.62E+00 3.62E+00
3.64E+00
4.72E-03
3.65E+00
3.63E+00
3.35E+00
PASS
3.64E+00
5.15E-03
3.65E+00
3.62E+00
3.35E+00
PASS
3.64E+00
4.72E-03
3.65E+00
3.62E+00
3.30E+00
PASS
3.64E+00
4.77E-03
3.65E+00
3.62E+00
3.28E+00
N/A
3.64E+00
4.60E-03
3.65E+00
3.62E+00
3.27E+00
N/A
3.64E+00
4.72E-03
3.65E+00
3.62E+00
3.25E+00
PASS
40
3.62E+00
3.62E+00
3.63E+00
3.63E+00
3.62E+00
3.64E+00
3.63E+00
3.63E+00
3.64E+00
3.64E+00
3.64E+00
3.64E+00
50
3.62E+00
3.62E+00
3.63E+00
3.63E+00
3.62E+00
3.64E+00
3.63E+00
3.63E+00
3.64E+00
3.64E+00
3.64E+00
3.64E+00
An ISO 9001:2008 and DSCC Certified Company
109
3.64E+00
4.55E-03
3.65E+00
3.62E+00
3.25E+00
PASS
3.64E+00
4.72E-03
3.65E+00
3.62E+00
3.25E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High @+/-5V RL=100 #2 (V)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
3.70E+00
3.65E+00
3.60E+00
3.55E+00
3.50E+00
3.45E+00
3.40E+00
3.35E+00
3.30E+00
3.25E+00
3.20E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.52. Plot of Output Voltage Swing High @+/-5V RL=100 #2 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
110
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.52. Raw data for Output Voltage Swing High @+/-5V RL=100 #2 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing High @+/-5V RL=100 #2 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
60
3.62E+00
3.62E+00
3.63E+00
3.62E+00
3.62E+00
3.64E+00
3.63E+00
3.63E+00
3.64E+00
3.63E+00
3.64E+00
3.64E+00
168-hr
Anneal
70
3.63E+00
3.63E+00
3.63E+00
3.63E+00
3.63E+00
3.64E+00
3.63E+00
3.63E+00
3.64E+00
3.63E+00
3.64E+00
3.64E+00
0
3.64E+00
3.64E+00
3.65E+00
3.64E+00
3.64E+00
3.64E+00
3.64E+00
3.63E+00
3.64E+00
3.64E+00
3.64E+00
3.64E+00
10
3.63E+00
3.63E+00
3.64E+00
3.63E+00
3.63E+00
3.64E+00
3.63E+00
3.63E+00
3.64E+00
3.63E+00
3.64E+00
3.64E+00
Total Dose (krad(Si))
20
30
3.62E+00 3.62E+00
3.62E+00 3.62E+00
3.63E+00 3.63E+00
3.62E+00 3.62E+00
3.62E+00 3.63E+00
3.64E+00 3.64E+00
3.63E+00 3.63E+00
3.63E+00 3.63E+00
3.64E+00 3.64E+00
3.63E+00 3.63E+00
3.64E+00 3.64E+00
3.64E+00 3.64E+00
3.64E+00
4.22E-03
3.65E+00
3.63E+00
3.63E+00
4.12E-03
3.64E+00
3.62E+00
3.62E+00
3.96E-03
3.64E+00
3.61E+00
3.62E+00
3.67E-03
3.63E+00
3.61E+00
3.62E+00
4.30E-03
3.64E+00
3.61E+00
3.62E+00 3.62E+00 3.63E+00
4.71E-03 4.21E-03 3.49E-03
3.64E+00 3.63E+00 3.64E+00
3.61E+00 3.61E+00 3.62E+00
3.64E+00
3.49E-03
3.65E+00
3.63E+00
3.35E+00
PASS
3.63E+00
3.49E-03
3.64E+00
3.63E+00
3.35E+00
PASS
3.63E+00
3.36E-03
3.64E+00
3.62E+00
3.30E+00
PASS
3.63E+00
2.83E-03
3.64E+00
3.63E+00
3.28E+00
N/A
3.63E+00
3.36E-03
3.64E+00
3.62E+00
3.27E+00
N/A
3.63E+00
3.05E-03
3.64E+00
3.62E+00
3.25E+00
PASS
40
3.62E+00
3.62E+00
3.63E+00
3.62E+00
3.63E+00
3.64E+00
3.63E+00
3.63E+00
3.64E+00
3.63E+00
3.64E+00
3.64E+00
50
3.62E+00
3.62E+00
3.63E+00
3.62E+00
3.62E+00
3.64E+00
3.63E+00
3.63E+00
3.64E+00
3.63E+00
3.64E+00
3.64E+00
An ISO 9001:2008 and DSCC Certified Company
111
3.63E+00
2.83E-03
3.64E+00
3.63E+00
3.25E+00
PASS
3.63E+00
3.39E-03
3.64E+00
3.62E+00
3.25E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High @+/-5V RL=100 #3 (V)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
3.70E+00
3.65E+00
3.60E+00
3.55E+00
3.50E+00
3.45E+00
3.40E+00
3.35E+00
3.30E+00
3.25E+00
3.20E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.53. Plot of Output Voltage Swing High @+/-5V RL=100 #3 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
112
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.53. Raw data for Output Voltage Swing High @+/-5V RL=100 #3 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing High @+/-5V RL=100 #3 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
60
3.63E+00
3.62E+00
3.63E+00
3.62E+00
3.63E+00
3.64E+00
3.63E+00
3.63E+00
3.64E+00
3.63E+00
3.64E+00
3.64E+00
168-hr
Anneal
70
3.63E+00
3.63E+00
3.64E+00
3.63E+00
3.63E+00
3.64E+00
3.64E+00
3.63E+00
3.64E+00
3.63E+00
3.64E+00
3.64E+00
0
3.64E+00
3.64E+00
3.65E+00
3.64E+00
3.64E+00
3.64E+00
3.64E+00
3.64E+00
3.64E+00
3.64E+00
3.64E+00
3.64E+00
10
3.63E+00
3.63E+00
3.64E+00
3.63E+00
3.63E+00
3.64E+00
3.64E+00
3.63E+00
3.64E+00
3.63E+00
3.64E+00
3.64E+00
Total Dose (krad(Si))
20
30
3.63E+00 3.62E+00
3.62E+00 3.62E+00
3.63E+00 3.63E+00
3.63E+00 3.62E+00
3.63E+00 3.63E+00
3.64E+00 3.64E+00
3.63E+00 3.63E+00
3.63E+00 3.63E+00
3.64E+00 3.64E+00
3.63E+00 3.63E+00
3.64E+00 3.64E+00
3.64E+00 3.64E+00
3.64E+00
4.76E-03
3.65E+00
3.63E+00
3.63E+00
4.72E-03
3.64E+00
3.62E+00
3.63E+00
4.04E-03
3.64E+00
3.62E+00
3.63E+00
3.90E-03
3.64E+00
3.62E+00
3.63E+00
4.47E-03
3.64E+00
3.61E+00
3.63E+00 3.63E+00 3.63E+00
4.51E-03 4.09E-03 3.97E-03
3.64E+00 3.64E+00 3.64E+00
3.61E+00 3.61E+00 3.62E+00
3.64E+00
3.11E-03
3.65E+00
3.63E+00
3.35E+00
PASS
3.64E+00
2.83E-03
3.64E+00
3.63E+00
3.35E+00
PASS
3.64E+00
2.83E-03
3.64E+00
3.63E+00
3.30E+00
PASS
3.63E+00
2.88E-03
3.64E+00
3.63E+00
3.28E+00
N/A
3.63E+00
2.95E-03
3.64E+00
3.63E+00
3.27E+00
N/A
3.63E+00
2.95E-03
3.64E+00
3.63E+00
3.25E+00
PASS
40
3.62E+00
3.62E+00
3.63E+00
3.63E+00
3.63E+00
3.64E+00
3.63E+00
3.63E+00
3.64E+00
3.63E+00
3.64E+00
3.64E+00
50
3.62E+00
3.62E+00
3.63E+00
3.62E+00
3.63E+00
3.64E+00
3.63E+00
3.63E+00
3.64E+00
3.63E+00
3.64E+00
3.64E+00
An ISO 9001:2008 and DSCC Certified Company
113
3.63E+00
3.36E-03
3.64E+00
3.63E+00
3.25E+00
PASS
3.64E+00
3.05E-03
3.64E+00
3.63E+00
3.25E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High @+/-5V RL=100 #4 (V)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
3.70E+00
3.65E+00
3.60E+00
3.55E+00
3.50E+00
3.45E+00
3.40E+00
3.35E+00
3.30E+00
3.25E+00
3.20E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.54. Plot of Output Voltage Swing High @+/-5V RL=100 #4 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
114
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.54. Raw data for Output Voltage Swing High @+/-5V RL=100 #4 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing High @+/-5V RL=100 #4 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
60
3.62E+00
3.62E+00
3.63E+00
3.63E+00
3.62E+00
3.64E+00
3.63E+00
3.63E+00
3.64E+00
3.64E+00
3.64E+00
3.64E+00
168-hr
Anneal
70
3.63E+00
3.63E+00
3.63E+00
3.63E+00
3.63E+00
3.64E+00
3.63E+00
3.64E+00
3.64E+00
3.64E+00
3.64E+00
3.64E+00
0
3.64E+00
3.64E+00
3.64E+00
3.64E+00
3.64E+00
3.64E+00
3.64E+00
3.64E+00
3.64E+00
3.65E+00
3.64E+00
3.64E+00
10
3.63E+00
3.63E+00
3.64E+00
3.63E+00
3.63E+00
3.64E+00
3.63E+00
3.64E+00
3.64E+00
3.65E+00
3.64E+00
3.64E+00
Total Dose (krad(Si))
20
30
3.63E+00 3.62E+00
3.62E+00 3.62E+00
3.63E+00 3.63E+00
3.63E+00 3.63E+00
3.62E+00 3.62E+00
3.64E+00 3.64E+00
3.63E+00 3.63E+00
3.63E+00 3.63E+00
3.64E+00 3.64E+00
3.64E+00 3.64E+00
3.64E+00 3.64E+00
3.64E+00 3.64E+00
3.64E+00
3.36E-03
3.65E+00
3.63E+00
3.63E+00
3.51E-03
3.64E+00
3.62E+00
3.63E+00
3.36E-03
3.63E+00
3.62E+00
3.63E+00
3.58E-03
3.64E+00
3.62E+00
3.63E+00
3.27E-03
3.63E+00
3.62E+00
3.62E+00 3.62E+00 3.63E+00
3.51E-03 3.36E-03 3.27E-03
3.63E+00 3.63E+00 3.64E+00
3.61E+00 3.62E+00 3.62E+00
3.64E+00
4.66E-03
3.65E+00
3.63E+00
3.35E+00
PASS
3.64E+00
4.67E-03
3.65E+00
3.63E+00
3.35E+00
PASS
3.64E+00
4.60E-03
3.65E+00
3.62E+00
3.30E+00
PASS
3.64E+00
4.16E-03
3.65E+00
3.62E+00
3.28E+00
N/A
3.64E+00
4.32E-03
3.65E+00
3.63E+00
3.27E+00
N/A
3.64E+00
4.04E-03
3.65E+00
3.62E+00
3.25E+00
PASS
40
3.62E+00
3.62E+00
3.63E+00
3.63E+00
3.62E+00
3.64E+00
3.63E+00
3.63E+00
3.64E+00
3.64E+00
3.64E+00
3.64E+00
50
3.62E+00
3.62E+00
3.63E+00
3.63E+00
3.62E+00
3.64E+00
3.63E+00
3.63E+00
3.64E+00
3.64E+00
3.64E+00
3.64E+00
An ISO 9001:2008 and DSCC Certified Company
115
3.64E+00
4.28E-03
3.65E+00
3.62E+00
3.25E+00
PASS
3.64E+00
4.28E-03
3.65E+00
3.63E+00
3.25E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low @+/-5V RL=500 #1 (V)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
-3.65E+00
-3.70E+00
-3.75E+00
-3.80E+00
-3.85E+00
-3.90E+00
-3.95E+00
-4.00E+00
-4.05E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.55. Plot of Output Voltage Swing Low @+/-5V RL=500 #1 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
116
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.55. Raw data for Output Voltage Swing Low @+/-5V RL=500 #1 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing Low @+/-5V RL=500 #1 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
10
-4.02E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
Total Dose (krad(Si))
20
30
-4.02E+00 -4.01E+00
-3.99E+00 -3.98E+00
-4.00E+00 -3.99E+00
-4.00E+00 -3.98E+00
-4.00E+00 -3.99E+00
-4.03E+00 -4.03E+00
-4.03E+00 -4.03E+00
-4.02E+00 -4.02E+00
-4.03E+00 -4.02E+00
-4.03E+00 -4.03E+00
-4.03E+00 -4.03E+00
-4.03E+00 -4.03E+00
40
-4.01E+00
-3.97E+00
-3.99E+00
-3.97E+00
-3.98E+00
-4.03E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.03E+00
-4.03E+00
-4.03E+00
50
-4.01E+00
-3.96E+00
-3.98E+00
-3.97E+00
-3.98E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.03E+00
-4.03E+00
-4.03E+00
24-hr
Anneal
60
-4.01E+00
-3.95E+00
-3.98E+00
-3.96E+00
-3.97E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.03E+00
-4.03E+00
-4.03E+00
168-hr
Anneal
70
-4.02E+00
-3.98E+00
-3.99E+00
-3.99E+00
-3.99E+00
-4.03E+00
-4.03E+00
-4.02E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00 -4.02E+00 -4.00E+00 -3.99E+00 -3.98E+00 -3.98E+00 -3.98E+00 -3.99E+00
1.30E-03 3.85E-03 1.02E-02 1.40E-02 1.77E-02 2.08E-02 2.18E-02 1.36E-02
-4.02E+00 -4.01E+00 -3.97E+00 -3.95E+00 -3.94E+00 -3.92E+00 -3.92E+00 -3.96E+00
-4.03E+00 -4.03E+00 -4.03E+00 -4.03E+00 -4.03E+00 -4.03E+00 -4.04E+00 -4.03E+00
-4.03E+00
2.35E-03
-4.02E+00
-4.04E+00
-3.80E+00
PASS
-4.03E+00
2.19E-03
-4.02E+00
-4.03E+00
-3.80E+00
PASS
-4.03E+00
2.28E-03
-4.02E+00
-4.03E+00
-3.80E+00
PASS
-4.03E+00
2.28E-03
-4.02E+00
-4.03E+00
-3.77E+00
N/A
-4.03E+00
2.35E-03
-4.02E+00
-4.03E+00
-3.73E+00
N/A
An ISO 9001:2008 and DSCC Certified Company
117
-4.02E+00
2.39E-03
-4.02E+00
-4.03E+00
-3.70E+00
PASS
-4.02E+00
2.70E-03
-4.02E+00
-4.03E+00
-3.70E+00
PASS
-4.03E+00
2.28E-03
-4.02E+00
-4.03E+00
-3.70E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low @+/-5V RL=500 #2 (V)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
-3.65E+00
-3.70E+00
-3.75E+00
-3.80E+00
-3.85E+00
-3.90E+00
-3.95E+00
-4.00E+00
-4.05E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.56. Plot of Output Voltage Swing Low @+/-5V RL=500 #2 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
118
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.56. Raw data for Output Voltage Swing Low @+/-5V RL=500 #2 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing Low @+/-5V RL=500 #2 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.02E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
10
-4.02E+00
-4.01E+00
-4.02E+00
-4.01E+00
-4.02E+00
-4.03E+00
-4.03E+00
-4.02E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
Total Dose (krad(Si))
20
30
-4.02E+00 -4.02E+00
-3.99E+00 -3.98E+00
-4.00E+00 -4.00E+00
-3.99E+00 -3.98E+00
-4.00E+00 -4.00E+00
-4.03E+00 -4.02E+00
-4.03E+00 -4.03E+00
-4.02E+00 -4.02E+00
-4.03E+00 -4.02E+00
-4.02E+00 -4.02E+00
-4.03E+00 -4.03E+00
-4.03E+00 -4.03E+00
40
-4.02E+00
-3.97E+00
-3.99E+00
-3.97E+00
-3.99E+00
-4.02E+00
-4.03E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.03E+00
-4.03E+00
50
-4.01E+00
-3.96E+00
-3.99E+00
-3.96E+00
-3.99E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.03E+00
-4.03E+00
24-hr
Anneal
60
-4.01E+00
-3.96E+00
-3.98E+00
-3.96E+00
-3.99E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.03E+00
-4.03E+00
168-hr
Anneal
70
-4.02E+00
-3.99E+00
-3.98E+00
-3.99E+00
-4.00E+00
-4.03E+00
-4.03E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.03E+00
-4.03E+00
-4.03E+00 -4.02E+00 -4.00E+00 -3.99E+00 -3.99E+00 -3.98E+00 -3.98E+00 -3.99E+00
1.64E-03 3.91E-03 1.04E-02 1.48E-02 1.86E-02 2.23E-02 2.36E-02 1.45E-02
-4.02E+00 -4.01E+00 -3.97E+00 -3.95E+00 -3.94E+00 -3.92E+00 -3.91E+00 -3.95E+00
-4.03E+00 -4.03E+00 -4.03E+00 -4.03E+00 -4.04E+00 -4.04E+00 -4.04E+00 -4.03E+00
-4.03E+00
2.55E-03
-4.02E+00
-4.03E+00
-3.80E+00
PASS
-4.03E+00
2.68E-03
-4.02E+00
-4.03E+00
-3.80E+00
PASS
-4.02E+00
2.65E-03
-4.02E+00
-4.03E+00
-3.80E+00
PASS
-4.02E+00
2.59E-03
-4.02E+00
-4.03E+00
-3.77E+00
N/A
-4.02E+00
2.51E-03
-4.02E+00
-4.03E+00
-3.73E+00
N/A
An ISO 9001:2008 and DSCC Certified Company
119
-4.02E+00
2.65E-03
-4.01E+00
-4.03E+00
-3.70E+00
PASS
-4.02E+00
2.39E-03
-4.01E+00
-4.03E+00
-3.70E+00
PASS
-4.02E+00
2.59E-03
-4.02E+00
-4.03E+00
-3.70E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low @+/-5V RL=500 #3 (V)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
-3.65E+00
-3.70E+00
-3.75E+00
-3.80E+00
-3.85E+00
-3.90E+00
-3.95E+00
-4.00E+00
-4.05E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.57. Plot of Output Voltage Swing Low @+/-5V RL=500 #3 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
120
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.57. Raw data for Output Voltage Swing Low @+/-5V RL=500 #3 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing Low @+/-5V RL=500 #3 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.02E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
10
-4.02E+00
-4.01E+00
-4.02E+00
-4.01E+00
-4.02E+00
-4.03E+00
-4.03E+00
-4.02E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
Total Dose (krad(Si))
20
30
-4.02E+00 -4.01E+00
-3.99E+00 -3.98E+00
-4.00E+00 -4.00E+00
-3.99E+00 -3.98E+00
-4.00E+00 -3.99E+00
-4.03E+00 -4.03E+00
-4.03E+00 -4.03E+00
-4.02E+00 -4.02E+00
-4.03E+00 -4.02E+00
-4.03E+00 -4.02E+00
-4.03E+00 -4.03E+00
-4.03E+00 -4.03E+00
40
-4.01E+00
-3.97E+00
-3.99E+00
-3.97E+00
-3.99E+00
-4.03E+00
-4.03E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.03E+00
-4.03E+00
50
-4.01E+00
-3.95E+00
-3.99E+00
-3.96E+00
-3.98E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.03E+00
-4.03E+00
24-hr
Anneal
60
-4.01E+00
-3.95E+00
-3.98E+00
-3.96E+00
-3.98E+00
-4.02E+00
-4.03E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.03E+00
-4.03E+00
168-hr
Anneal
70
-4.02E+00
-3.98E+00
-3.98E+00
-3.99E+00
-3.99E+00
-4.03E+00
-4.03E+00
-4.02E+00
-4.03E+00
-4.02E+00
-4.03E+00
-4.03E+00
-4.03E+00 -4.02E+00 -4.00E+00 -3.99E+00 -3.99E+00 -3.98E+00 -3.98E+00 -3.99E+00
1.52E-03 3.91E-03 1.08E-02 1.48E-02 1.87E-02 2.20E-02 2.30E-02 1.47E-02
-4.02E+00 -4.01E+00 -3.97E+00 -3.95E+00 -3.93E+00 -3.92E+00 -3.91E+00 -3.95E+00
-4.03E+00 -4.03E+00 -4.03E+00 -4.03E+00 -4.04E+00 -4.04E+00 -4.04E+00 -4.03E+00
-4.03E+00
2.70E-03
-4.02E+00
-4.04E+00
-3.80E+00
PASS
-4.03E+00
3.11E-03
-4.02E+00
-4.04E+00
-3.80E+00
PASS
-4.02E+00
3.36E-03
-4.02E+00
-4.03E+00
-3.80E+00
PASS
-4.02E+00
3.35E-03
-4.01E+00
-4.03E+00
-3.77E+00
N/A
-4.02E+00
3.36E-03
-4.01E+00
-4.03E+00
-3.73E+00
N/A
An ISO 9001:2008 and DSCC Certified Company
121
-4.02E+00
3.00E-03
-4.01E+00
-4.03E+00
-3.70E+00
PASS
-4.02E+00
3.51E-03
-4.01E+00
-4.03E+00
-3.70E+00
PASS
-4.02E+00
2.97E-03
-4.02E+00
-4.03E+00
-3.70E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low @+/-5V RL=500 #4 (V)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
-3.65E+00
-3.70E+00
-3.75E+00
-3.80E+00
-3.85E+00
-3.90E+00
-3.95E+00
-4.00E+00
-4.05E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.58. Plot of Output Voltage Swing Low @+/-5V RL=500 #4 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
122
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.58. Raw data for Output Voltage Swing Low @+/-5V RL=500 #4 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing Low @+/-5V RL=500 #4 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.02E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
10
-4.02E+00
-4.01E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
Total Dose (krad(Si))
20
30
-4.02E+00 -4.01E+00
-3.99E+00 -3.97E+00
-4.00E+00 -4.00E+00
-4.00E+00 -3.98E+00
-4.00E+00 -3.99E+00
-4.03E+00 -4.03E+00
-4.03E+00 -4.02E+00
-4.02E+00 -4.02E+00
-4.02E+00 -4.02E+00
-4.03E+00 -4.03E+00
-4.03E+00 -4.03E+00
-4.03E+00 -4.03E+00
40
-4.01E+00
-3.95E+00
-3.99E+00
-3.98E+00
-3.99E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.03E+00
-4.03E+00
-4.03E+00
50
-4.01E+00
-3.94E+00
-3.99E+00
-3.96E+00
-3.98E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.03E+00
-4.03E+00
-4.03E+00
24-hr
Anneal
60
-4.01E+00
-3.94E+00
-3.98E+00
-3.96E+00
-3.98E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.02E+00
-4.03E+00
-4.03E+00
-4.03E+00
168-hr
Anneal
70
-4.02E+00
-3.98E+00
-3.99E+00
-3.99E+00
-3.99E+00
-4.03E+00
-4.03E+00
-4.02E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00
-4.03E+00 -4.02E+00 -4.00E+00 -3.99E+00 -3.98E+00 -3.97E+00 -3.97E+00 -3.99E+00
1.10E-03 3.42E-03 1.13E-02 1.68E-02 2.23E-02 2.80E-02 2.83E-02 1.46E-02
-4.02E+00 -4.01E+00 -3.97E+00 -3.94E+00 -3.92E+00 -3.90E+00 -3.90E+00 -3.95E+00
-4.03E+00 -4.03E+00 -4.03E+00 -4.04E+00 -4.04E+00 -4.05E+00 -4.05E+00 -4.03E+00
-4.03E+00
2.07E-03
-4.02E+00
-4.04E+00
-3.80E+00
PASS
-4.03E+00
2.00E-03
-4.02E+00
-4.03E+00
-3.80E+00
PASS
-4.03E+00
2.49E-03
-4.02E+00
-4.03E+00
-3.80E+00
PASS
-4.02E+00
1.92E-03
-4.02E+00
-4.03E+00
-3.77E+00
N/A
-4.02E+00
1.95E-03
-4.02E+00
-4.03E+00
-3.73E+00
N/A
An ISO 9001:2008 and DSCC Certified Company
123
-4.02E+00
2.35E-03
-4.02E+00
-4.03E+00
-3.70E+00
PASS
-4.02E+00
2.35E-03
-4.02E+00
-4.03E+00
-3.70E+00
PASS
-4.03E+00
1.92E-03
-4.02E+00
-4.03E+00
-3.70E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low @+/-5V RL=100 #1 (V)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
-3.20E+00
-3.25E+00
-3.30E+00
-3.35E+00
-3.40E+00
-3.45E+00
-3.50E+00
-3.55E+00
-3.60E+00
-3.65E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.59. Plot of Output Voltage Swing Low @+/-5V RL=100 #1 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
124
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.59. Raw data for Output Voltage Swing Low @+/-5V RL=100 #1 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing Low @+/-5V RL=100 #1 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.60E+00
-3.59E+00
-3.59E+00
10
-3.58E+00
-3.57E+00
-3.57E+00
-3.57E+00
-3.57E+00
-3.59E+00
-3.58E+00
-3.59E+00
-3.59E+00
-3.60E+00
-3.59E+00
-3.59E+00
Total Dose (krad(Si))
20
30
-3.58E+00 -3.57E+00
-3.53E+00 -3.51E+00
-3.55E+00 -3.53E+00
-3.54E+00 -3.52E+00
-3.55E+00 -3.53E+00
-3.59E+00 -3.59E+00
-3.58E+00 -3.58E+00
-3.59E+00 -3.59E+00
-3.59E+00 -3.59E+00
-3.60E+00 -3.60E+00
-3.59E+00 -3.59E+00
-3.59E+00 -3.59E+00
40
-3.57E+00
-3.49E+00
-3.52E+00
-3.50E+00
-3.52E+00
-3.59E+00
-3.58E+00
-3.59E+00
-3.59E+00
-3.60E+00
-3.59E+00
-3.59E+00
50
-3.57E+00
-3.47E+00
-3.51E+00
-3.48E+00
-3.51E+00
-3.59E+00
-3.58E+00
-3.58E+00
-3.58E+00
-3.59E+00
-3.59E+00
-3.59E+00
24-hr
Anneal
60
-3.57E+00
-3.46E+00
-3.50E+00
-3.48E+00
-3.50E+00
-3.59E+00
-3.58E+00
-3.59E+00
-3.58E+00
-3.59E+00
-3.59E+00
-3.59E+00
168-hr
Anneal
70
-3.57E+00
-3.52E+00
-3.52E+00
-3.53E+00
-3.54E+00
-3.59E+00
-3.58E+00
-3.59E+00
-3.59E+00
-3.60E+00
-3.59E+00
-3.59E+00
-3.59E+00 -3.57E+00 -3.55E+00 -3.53E+00 -3.52E+00 -3.51E+00 -3.50E+00 -3.53E+00
1.30E-03 6.58E-03 1.62E-02 2.36E-02 3.05E-02 3.77E-02 3.88E-02 2.24E-02
-3.58E+00 -3.55E+00 -3.50E+00 -3.47E+00 -3.44E+00 -3.40E+00 -3.40E+00 -3.47E+00
-3.59E+00 -3.59E+00 -3.59E+00 -3.60E+00 -3.60E+00 -3.61E+00 -3.61E+00 -3.60E+00
-3.59E+00
5.50E-03
-3.58E+00
-3.61E+00
-3.35E+00
PASS
-3.59E+00
5.89E-03
-3.57E+00
-3.61E+00
-3.35E+00
PASS
-3.59E+00
5.45E-03
-3.57E+00
-3.60E+00
-3.30E+00
PASS
-3.59E+00
5.77E-03
-3.57E+00
-3.60E+00
-3.28E+00
N/A
-3.59E+00
5.77E-03
-3.57E+00
-3.60E+00
-3.27E+00
N/A
An ISO 9001:2008 and DSCC Certified Company
125
-3.58E+00
6.11E-03
-3.57E+00
-3.60E+00
-3.25E+00
PASS
-3.59E+00
6.11E-03
-3.57E+00
-3.60E+00
-3.25E+00
PASS
-3.59E+00
5.36E-03
-3.57E+00
-3.60E+00
-3.25E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low @+/-5V RL=100 #2 (V)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
-3.20E+00
-3.25E+00
-3.30E+00
-3.35E+00
-3.40E+00
-3.45E+00
-3.50E+00
-3.55E+00
-3.60E+00
-3.65E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.60. Plot of Output Voltage Swing Low @+/-5V RL=100 #2 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
126
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.60. Raw data for Output Voltage Swing Low @+/-5V RL=100 #2 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing Low @+/-5V RL=100 #2 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
10
-3.58E+00
-3.57E+00
-3.57E+00
-3.57E+00
-3.57E+00
-3.59E+00
-3.58E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
Total Dose (krad(Si))
20
30
-3.58E+00 -3.57E+00
-3.54E+00 -3.51E+00
-3.55E+00 -3.54E+00
-3.53E+00 -3.51E+00
-3.56E+00 -3.55E+00
-3.59E+00 -3.59E+00
-3.58E+00 -3.58E+00
-3.58E+00 -3.58E+00
-3.59E+00 -3.59E+00
-3.59E+00 -3.59E+00
-3.59E+00 -3.59E+00
-3.59E+00 -3.59E+00
40
-3.57E+00
-3.50E+00
-3.53E+00
-3.49E+00
-3.54E+00
-3.59E+00
-3.58E+00
-3.58E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
50
-3.57E+00
-3.47E+00
-3.52E+00
-3.47E+00
-3.53E+00
-3.58E+00
-3.58E+00
-3.58E+00
-3.58E+00
-3.58E+00
-3.59E+00
-3.59E+00
24-hr
Anneal
60
-3.57E+00
-3.47E+00
-3.51E+00
-3.46E+00
-3.53E+00
-3.58E+00
-3.58E+00
-3.58E+00
-3.59E+00
-3.58E+00
-3.59E+00
-3.59E+00
168-hr
Anneal
70
-3.57E+00
-3.53E+00
-3.51E+00
-3.53E+00
-3.55E+00
-3.59E+00
-3.58E+00
-3.58E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00 -3.57E+00 -3.55E+00 -3.54E+00 -3.52E+00 -3.51E+00 -3.51E+00 -3.54E+00
2.00E-03 5.93E-03 1.67E-02 2.49E-02 3.30E-02 4.13E-02 4.28E-02 2.41E-02
-3.58E+00 -3.55E+00 -3.50E+00 -3.47E+00 -3.43E+00 -3.40E+00 -3.39E+00 -3.47E+00
-3.59E+00 -3.59E+00 -3.59E+00 -3.60E+00 -3.61E+00 -3.62E+00 -3.63E+00 -3.60E+00
-3.59E+00
2.95E-03
-3.58E+00
-3.60E+00
-3.35E+00
PASS
-3.59E+00
2.74E-03
-3.58E+00
-3.59E+00
-3.35E+00
PASS
-3.59E+00
2.77E-03
-3.58E+00
-3.59E+00
-3.30E+00
PASS
-3.58E+00
2.55E-03
-3.58E+00
-3.59E+00
-3.28E+00
N/A
-3.58E+00
2.55E-03
-3.58E+00
-3.59E+00
-3.27E+00
N/A
An ISO 9001:2008 and DSCC Certified Company
127
-3.58E+00
2.61E-03
-3.58E+00
-3.59E+00
-3.25E+00
PASS
-3.58E+00
2.79E-03
-3.57E+00
-3.59E+00
-3.25E+00
PASS
-3.58E+00
2.95E-03
-3.58E+00
-3.59E+00
-3.25E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low @+/-5V RL=100 #3 (V)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
-3.20E+00
-3.25E+00
-3.30E+00
-3.35E+00
-3.40E+00
-3.45E+00
-3.50E+00
-3.55E+00
-3.60E+00
-3.65E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.61. Plot of Output Voltage Swing Low @+/-5V RL=100 #3 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
128
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.61. Raw data for Output Voltage Swing Low @+/-5V RL=100 #3 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing Low @+/-5V RL=100 #3 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
10
-3.58E+00
-3.57E+00
-3.57E+00
-3.57E+00
-3.57E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
Total Dose (krad(Si))
20
30
-3.57E+00 -3.57E+00
-3.53E+00 -3.51E+00
-3.55E+00 -3.54E+00
-3.54E+00 -3.52E+00
-3.55E+00 -3.54E+00
-3.59E+00 -3.59E+00
-3.59E+00 -3.59E+00
-3.58E+00 -3.58E+00
-3.59E+00 -3.59E+00
-3.59E+00 -3.59E+00
-3.59E+00 -3.59E+00
-3.59E+00 -3.59E+00
40
-3.57E+00
-3.49E+00
-3.53E+00
-3.50E+00
-3.52E+00
-3.59E+00
-3.59E+00
-3.58E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
50
-3.56E+00
-3.47E+00
-3.52E+00
-3.48E+00
-3.51E+00
-3.59E+00
-3.58E+00
-3.58E+00
-3.58E+00
-3.59E+00
-3.59E+00
-3.59E+00
24-hr
Anneal
60
-3.56E+00
-3.47E+00
-3.52E+00
-3.47E+00
-3.50E+00
-3.59E+00
-3.58E+00
-3.58E+00
-3.58E+00
-3.59E+00
-3.59E+00
-3.59E+00
168-hr
Anneal
70
-3.57E+00
-3.52E+00
-3.52E+00
-3.52E+00
-3.54E+00
-3.59E+00
-3.59E+00
-3.58E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00 -3.57E+00 -3.55E+00 -3.53E+00 -3.52E+00 -3.51E+00 -3.50E+00 -3.53E+00
1.95E-03 5.50E-03 1.55E-02 2.39E-02 3.15E-02 3.89E-02 4.02E-02 2.32E-02
-3.58E+00 -3.56E+00 -3.51E+00 -3.47E+00 -3.43E+00 -3.40E+00 -3.39E+00 -3.47E+00
-3.59E+00 -3.59E+00 -3.59E+00 -3.60E+00 -3.61E+00 -3.61E+00 -3.62E+00 -3.60E+00
-3.59E+00
2.49E-03
-3.58E+00
-3.60E+00
-3.35E+00
PASS
-3.59E+00
2.12E-03
-3.58E+00
-3.59E+00
-3.35E+00
PASS
-3.59E+00
2.17E-03
-3.58E+00
-3.59E+00
-3.30E+00
PASS
-3.59E+00
2.19E-03
-3.58E+00
-3.59E+00
-3.28E+00
N/A
-3.59E+00
2.17E-03
-3.58E+00
-3.59E+00
-3.27E+00
N/A
An ISO 9001:2008 and DSCC Certified Company
129
-3.58E+00
1.95E-03
-3.58E+00
-3.59E+00
-3.25E+00
PASS
-3.58E+00
1.82E-03
-3.58E+00
-3.59E+00
-3.25E+00
PASS
-3.59E+00
2.49E-03
-3.58E+00
-3.59E+00
-3.25E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low @+/-5V RL=100 #4 (V)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
-3.20E+00
-3.25E+00
-3.30E+00
-3.35E+00
-3.40E+00
-3.45E+00
-3.50E+00
-3.55E+00
-3.60E+00
-3.65E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.62. Plot of Output Voltage Swing Low @+/-5V RL=100 #4 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
130
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.62. Raw data for Output Voltage Swing Low @+/-5V RL=100 #4 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing Low @+/-5V RL=100 #4 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.58E+00
-3.59E+00
-3.59E+00
-3.60E+00
-3.59E+00
-3.59E+00
10
-3.58E+00
-3.57E+00
-3.57E+00
-3.57E+00
-3.57E+00
-3.59E+00
-3.58E+00
-3.59E+00
-3.59E+00
-3.60E+00
-3.59E+00
-3.59E+00
Total Dose (krad(Si))
20
30
-3.58E+00 -3.57E+00
-3.52E+00 -3.49E+00
-3.55E+00 -3.54E+00
-3.54E+00 -3.52E+00
-3.55E+00 -3.54E+00
-3.59E+00 -3.59E+00
-3.58E+00 -3.58E+00
-3.59E+00 -3.58E+00
-3.59E+00 -3.59E+00
-3.59E+00 -3.59E+00
-3.59E+00 -3.59E+00
-3.59E+00 -3.59E+00
40
-3.57E+00
-3.46E+00
-3.53E+00
-3.50E+00
-3.53E+00
-3.59E+00
-3.58E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
50
-3.57E+00
-3.43E+00
-3.52E+00
-3.48E+00
-3.51E+00
-3.59E+00
-3.58E+00
-3.58E+00
-3.58E+00
-3.59E+00
-3.59E+00
-3.59E+00
24-hr
Anneal
60
-3.57E+00
-3.43E+00
-3.52E+00
-3.48E+00
-3.51E+00
-3.59E+00
-3.58E+00
-3.58E+00
-3.58E+00
-3.59E+00
-3.59E+00
-3.59E+00
168-hr
Anneal
70
-3.57E+00
-3.51E+00
-3.53E+00
-3.53E+00
-3.54E+00
-3.59E+00
-3.58E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00
-3.59E+00 -3.57E+00 -3.55E+00 -3.53E+00 -3.52E+00 -3.50E+00 -3.50E+00 -3.54E+00
1.14E-03 6.31E-03 1.90E-02 3.02E-02 3.96E-02 5.09E-02 5.11E-02 2.50E-02
-3.59E+00 -3.55E+00 -3.50E+00 -3.45E+00 -3.41E+00 -3.36E+00 -3.36E+00 -3.47E+00
-3.59E+00 -3.59E+00 -3.60E+00 -3.61E+00 -3.63E+00 -3.64E+00 -3.64E+00 -3.60E+00
-3.59E+00
4.95E-03
-3.58E+00
-3.60E+00
-3.35E+00
PASS
-3.59E+00
4.97E-03
-3.58E+00
-3.60E+00
-3.35E+00
PASS
-3.59E+00
4.97E-03
-3.57E+00
-3.60E+00
-3.30E+00
PASS
-3.59E+00
5.32E-03
-3.57E+00
-3.60E+00
-3.28E+00
N/A
-3.59E+00
5.13E-03
-3.57E+00
-3.60E+00
-3.27E+00
N/A
An ISO 9001:2008 and DSCC Certified Company
131
-3.58E+00
5.45E-03
-3.57E+00
-3.60E+00
-3.25E+00
PASS
-3.58E+00
5.13E-03
-3.57E+00
-3.60E+00
-3.25E+00
PASS
-3.59E+00
4.67E-03
-3.57E+00
-3.60E+00
-3.25E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Maximum Output Source Current @+/-5V #1 (A)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.63. Plot of Maximum Output Source Current @+/-5V #1 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
132
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.63. Raw data for Maximum Output Source Current @+/-5V #1 (A) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Maximum Output Source Current @+/-5V #1 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
6.21E-02
6.19E-02
6.25E-02
6.22E-02
6.18E-02
6.33E-02
6.24E-02
6.24E-02
6.31E-02
6.45E-02
6.38E-02
6.31E-02
24-hr
Anneal
60
6.20E-02
6.18E-02
6.27E-02
6.23E-02
6.18E-02
6.32E-02
6.24E-02
6.23E-02
6.31E-02
6.45E-02
6.36E-02
6.32E-02
168-hr
Anneal
70
6.27E-02
6.25E-02
6.33E-02
6.28E-02
6.23E-02
6.35E-02
6.25E-02
6.25E-02
6.35E-02
6.49E-02
6.39E-02
6.34E-02
6.20E-02
3.36E-04
6.29E-02
6.10E-02
6.21E-02
2.80E-04
6.29E-02
6.13E-02
6.21E-02
3.69E-04
6.31E-02
6.11E-02
6.27E-02
3.55E-04
6.37E-02
6.18E-02
6.31E-02
9.08E-04
6.55E-02
6.06E-02
4.00E-02
NA
6.31E-02
8.44E-04
6.55E-02
6.08E-02
4.00E-02
NA
6.31E-02
8.78E-04
6.55E-02
6.07E-02
4.00E-02
NA
6.34E-02
9.55E-04
6.60E-02
6.08E-02
4.00E-02
NA
0
6.33E-02
6.31E-02
6.40E-02
6.35E-02
6.29E-02
6.37E-02
6.29E-02
6.28E-02
6.36E-02
6.51E-02
6.37E-02
6.33E-02
Total Dose (krad(Si))
10
20
30
40
6.27E-02 6.22E-02 6.22E-02 6.18E-02
6.25E-02 6.21E-02 6.20E-02 6.18E-02
6.34E-02 6.29E-02 6.28E-02 6.25E-02
6.29E-02 6.25E-02 6.24E-02 6.21E-02
6.23E-02 6.21E-02 6.18E-02 6.17E-02
6.34E-02 6.34E-02 6.33E-02 6.31E-02
6.27E-02 6.26E-02 6.24E-02 6.23E-02
6.25E-02 6.25E-02 6.24E-02 6.23E-02
6.34E-02 6.34E-02 6.33E-02 6.30E-02
6.48E-02 6.48E-02 6.47E-02 6.45E-02
6.36E-02 6.37E-02 6.36E-02 6.36E-02
6.31E-02 6.33E-02 6.31E-02 6.32E-02
6.34E-02
4.14E-04
6.45E-02
6.22E-02
6.28E-02
4.21E-04
6.39E-02
6.16E-02
6.23E-02
3.87E-04
6.34E-02
6.13E-02
6.22E-02
3.76E-04
6.33E-02
6.12E-02
6.36E-02
9.19E-04
6.61E-02
6.11E-02
4.00E-02
PASS
6.34E-02
9.11E-04
6.59E-02
6.09E-02
4.00E-02
NA
6.33E-02
9.32E-04
6.59E-02
6.08E-02
4.00E-02
NA
6.32E-02
9.29E-04
6.58E-02
6.07E-02
4.00E-02
NA
An ISO 9001:2008 and DSCC Certified Company
133
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Maximum Output Source Current @+/-5V #2 (A)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.64. Plot of Maximum Output Source Current @+/-5V #2 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
134
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.64. Raw data for Maximum Output Source Current @+/-5V #2 (A) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Maximum Output Source Current @+/-5V #2 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
6.20E-02
6.17E-02
6.34E-02
6.17E-02
6.22E-02
6.32E-02
6.22E-02
6.23E-02
6.31E-02
6.25E-02
6.28E-02
6.27E-02
24-hr
Anneal
60
6.19E-02
6.17E-02
6.35E-02
6.18E-02
6.22E-02
6.31E-02
6.22E-02
6.23E-02
6.31E-02
6.25E-02
6.28E-02
6.28E-02
168-hr
Anneal
70
6.26E-02
6.24E-02
6.41E-02
6.23E-02
6.27E-02
6.34E-02
6.24E-02
6.24E-02
6.34E-02
6.28E-02
6.29E-02
6.29E-02
6.21E-02
7.61E-04
6.41E-02
6.00E-02
6.22E-02
6.98E-04
6.41E-02
6.03E-02
6.22E-02
7.40E-04
6.42E-02
6.02E-02
6.28E-02
7.53E-04
6.49E-02
6.08E-02
6.26E-02
4.49E-04
6.38E-02
6.14E-02
4.00E-02
NA
6.27E-02
4.37E-04
6.39E-02
6.15E-02
4.00E-02
NA
6.27E-02
4.58E-04
6.39E-02
6.14E-02
4.00E-02
NA
6.29E-02
4.79E-04
6.42E-02
6.16E-02
4.00E-02
NA
0
6.32E-02
6.30E-02
6.47E-02
6.30E-02
6.33E-02
6.36E-02
6.26E-02
6.27E-02
6.36E-02
6.29E-02
6.29E-02
6.28E-02
Total Dose (krad(Si))
10
20
30
40
6.28E-02 6.22E-02 6.22E-02 6.18E-02
6.25E-02 6.20E-02 6.18E-02 6.16E-02
6.43E-02 6.39E-02 6.37E-02 6.34E-02
6.25E-02 6.21E-02 6.19E-02 6.16E-02
6.28E-02 6.24E-02 6.22E-02 6.20E-02
6.34E-02 6.34E-02 6.32E-02 6.31E-02
6.25E-02 6.25E-02 6.23E-02 6.22E-02
6.25E-02 6.25E-02 6.23E-02 6.22E-02
6.34E-02 6.34E-02 6.32E-02 6.30E-02
6.28E-02 6.28E-02 6.26E-02 6.25E-02
6.27E-02 6.29E-02 6.28E-02 6.27E-02
6.27E-02 6.28E-02 6.28E-02 6.28E-02
6.34E-02
7.35E-04
6.55E-02
6.14E-02
6.30E-02
7.64E-04
6.51E-02
6.09E-02
6.25E-02
7.87E-04
6.46E-02
6.03E-02
6.24E-02
7.41E-04
6.44E-02
6.03E-02
6.31E-02
4.90E-04
6.44E-02
6.17E-02
4.00E-02
PASS
6.29E-02
4.55E-04
6.42E-02
6.17E-02
4.00E-02
NA
6.29E-02
4.46E-04
6.41E-02
6.17E-02
4.00E-02
NA
6.27E-02
4.39E-04
6.39E-02
6.15E-02
4.00E-02
NA
An ISO 9001:2008 and DSCC Certified Company
135
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Maximum Output Source Current @+/-5V #3 (A)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.65. Plot of Maximum Output Source Current @+/-5V #3 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
136
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.65. Raw data for Maximum Output Source Current @+/-5V #3 (A) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Maximum Output Source Current @+/-5V #3 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
6.22E-02
6.15E-02
6.34E-02
6.20E-02
6.23E-02
6.33E-02
6.23E-02
6.23E-02
6.30E-02
6.22E-02
6.27E-02
6.28E-02
24-hr
Anneal
60
6.20E-02
6.13E-02
6.35E-02
6.21E-02
6.22E-02
6.31E-02
6.23E-02
6.23E-02
6.30E-02
6.23E-02
6.27E-02
6.28E-02
168-hr
Anneal
70
6.28E-02
6.19E-02
6.42E-02
6.25E-02
6.28E-02
6.34E-02
6.26E-02
6.25E-02
6.34E-02
6.26E-02
6.28E-02
6.29E-02
6.21E-02
7.69E-04
6.42E-02
6.00E-02
6.23E-02
7.08E-04
6.42E-02
6.03E-02
6.22E-02
8.04E-04
6.44E-02
6.00E-02
6.28E-02
8.37E-04
6.51E-02
6.06E-02
6.26E-02
4.08E-04
6.37E-02
6.15E-02
4.00E-02
NA
6.26E-02
4.79E-04
6.39E-02
6.13E-02
4.00E-02
NA
6.26E-02
4.29E-04
6.38E-02
6.14E-02
4.00E-02
NA
6.29E-02
4.71E-04
6.42E-02
6.16E-02
4.00E-02
NA
0
6.33E-02
6.26E-02
6.47E-02
6.34E-02
6.33E-02
6.36E-02
6.28E-02
6.27E-02
6.35E-02
6.27E-02
6.28E-02
6.29E-02
Total Dose (krad(Si))
10
20
30
40
6.29E-02 6.24E-02 6.23E-02 6.19E-02
6.20E-02 6.17E-02 6.16E-02 6.13E-02
6.44E-02 6.39E-02 6.38E-02 6.34E-02
6.29E-02 6.24E-02 6.22E-02 6.19E-02
6.28E-02 6.25E-02 6.23E-02 6.22E-02
6.35E-02 6.34E-02 6.33E-02 6.31E-02
6.27E-02 6.27E-02 6.24E-02 6.23E-02
6.25E-02 6.25E-02 6.24E-02 6.23E-02
6.33E-02 6.33E-02 6.31E-02 6.29E-02
6.25E-02 6.25E-02 6.24E-02 6.23E-02
6.26E-02 6.27E-02 6.27E-02 6.25E-02
6.28E-02 6.29E-02 6.28E-02 6.28E-02
6.34E-02
7.82E-04
6.56E-02
6.13E-02
6.30E-02
8.40E-04
6.53E-02
6.07E-02
6.26E-02
8.01E-04
6.48E-02
6.04E-02
6.24E-02
8.00E-04
6.46E-02
6.02E-02
6.30E-02
4.80E-04
6.44E-02
6.17E-02
4.00E-02
PASS
6.29E-02
4.54E-04
6.41E-02
6.17E-02
4.00E-02
NA
6.29E-02
4.29E-04
6.41E-02
6.17E-02
4.00E-02
NA
6.27E-02
4.33E-04
6.39E-02
6.15E-02
4.00E-02
NA
An ISO 9001:2008 and DSCC Certified Company
137
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Maximum Output Source Current @+/-5V #4 (A)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.66. Plot of Maximum Output Source Current @+/-5V #4 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
138
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.66. Raw data for Maximum Output Source Current @+/-5V #4 (A) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Maximum Output Source Current @+/-5V #4 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
6.21E-02
6.18E-02
6.27E-02
6.24E-02
6.18E-02
6.33E-02
6.21E-02
6.25E-02
6.29E-02
6.42E-02
6.35E-02
6.34E-02
24-hr
Anneal
60
6.20E-02
6.17E-02
6.28E-02
6.25E-02
6.17E-02
6.33E-02
6.20E-02
6.25E-02
6.29E-02
6.42E-02
6.35E-02
6.34E-02
168-hr
Anneal
70
6.26E-02
6.23E-02
6.34E-02
6.29E-02
6.22E-02
6.35E-02
6.23E-02
6.28E-02
6.33E-02
6.45E-02
6.36E-02
6.36E-02
6.20E-02
4.59E-04
6.33E-02
6.07E-02
6.21E-02
3.83E-04
6.32E-02
6.11E-02
6.21E-02
5.04E-04
6.35E-02
6.08E-02
6.27E-02
4.85E-04
6.40E-02
6.14E-02
6.29E-02
8.25E-04
6.52E-02
6.07E-02
4.00E-02
NA
6.30E-02
8.15E-04
6.52E-02
6.08E-02
4.00E-02
NA
6.30E-02
8.27E-04
6.53E-02
6.07E-02
4.00E-02
NA
6.33E-02
8.57E-04
6.56E-02
6.09E-02
4.00E-02
NA
0
6.32E-02
6.30E-02
6.40E-02
6.37E-02
6.28E-02
6.37E-02
6.25E-02
6.29E-02
6.34E-02
6.47E-02
6.36E-02
6.35E-02
Total Dose (krad(Si))
10
20
30
40
6.28E-02 6.23E-02 6.22E-02 6.18E-02
6.24E-02 6.20E-02 6.19E-02 6.16E-02
6.36E-02 6.31E-02 6.30E-02 6.27E-02
6.32E-02 6.28E-02 6.26E-02 6.23E-02
6.23E-02 6.20E-02 6.18E-02 6.16E-02
6.35E-02 6.35E-02 6.33E-02 6.32E-02
6.24E-02 6.24E-02 6.22E-02 6.20E-02
6.28E-02 6.28E-02 6.26E-02 6.24E-02
6.32E-02 6.32E-02 6.31E-02 6.29E-02
6.45E-02 6.45E-02 6.44E-02 6.42E-02
6.34E-02 6.35E-02 6.35E-02 6.34E-02
6.34E-02 6.35E-02 6.34E-02 6.34E-02
6.33E-02
4.94E-04
6.47E-02
6.20E-02
6.29E-02
5.37E-04
6.43E-02
6.14E-02
6.24E-02
5.19E-04
6.38E-02
6.10E-02
6.23E-02
4.87E-04
6.36E-02
6.10E-02
6.34E-02
8.42E-04
6.58E-02
6.11E-02
4.00E-02
PASS
6.33E-02
8.17E-04
6.55E-02
6.11E-02
4.00E-02
NA
6.33E-02
8.05E-04
6.55E-02
6.11E-02
4.00E-02
NA
6.31E-02
8.38E-04
6.54E-02
6.08E-02
4.00E-02
NA
An ISO 9001:2008 and DSCC Certified Company
139
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Maximum Output Sink Current @+/-5V #1 (A)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
0.00E+00
-1.00E-02
-2.00E-02
-3.00E-02
-4.00E-02
-5.00E-02
-6.00E-02
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.67. Plot of Maximum Output Sink Current @+/-5V #1 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
140
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.67. Raw data for Maximum Output Sink Current @+/-5V #1 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Maximum Output Sink Current @+/-5V #1 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
50
-5.51E-02
-5.00E-02
-5.23E-02
-5.10E-02
-5.16E-02
-5.68E-02
-5.45E-02
-5.63E-02
-5.64E-02
-5.82E-02
-5.68E-02
-5.65E-02
24-hr
Anneal
60
-5.50E-02
-5.00E-02
-5.22E-02
-5.09E-02
-5.14E-02
-5.68E-02
-5.45E-02
-5.63E-02
-5.64E-02
-5.82E-02
-5.68E-02
-5.65E-02
168-hr
Anneal
70
-5.58E-02
-5.25E-02
-5.36E-02
-5.33E-02
-5.33E-02
-5.70E-02
-5.48E-02
-5.64E-02
-5.68E-02
-5.85E-02
-5.69E-02
-5.66E-02
0
-5.66E-02
-5.65E-02
-5.73E-02
-5.69E-02
-5.65E-02
-5.73E-02
-5.51E-02
-5.67E-02
-5.70E-02
-5.88E-02
-5.68E-02
-5.65E-02
10
-5.62E-02
-5.51E-02
-5.59E-02
-5.56E-02
-5.53E-02
-5.70E-02
-5.50E-02
-5.65E-02
-5.68E-02
-5.86E-02
-5.68E-02
-5.65E-02
Total Dose (krad(Si))
20
30
-5.57E-02 -5.54E-02
-5.31E-02 -5.19E-02
-5.43E-02 -5.36E-02
-5.37E-02 -5.27E-02
-5.37E-02 -5.30E-02
-5.69E-02 -5.68E-02
-5.48E-02 -5.47E-02
-5.64E-02 -5.64E-02
-5.67E-02 -5.65E-02
-5.85E-02 -5.84E-02
-5.68E-02 -5.67E-02
-5.65E-02 -5.64E-02
-5.67E-02
3.28E-04
-5.58E-02
-5.76E-02
-5.56E-02
4.41E-04
-5.44E-02
-5.68E-02
-5.41E-02
9.82E-04
-5.14E-02
-5.68E-02
-5.33E-02
1.33E-03
-4.97E-02
-5.70E-02
-5.25E-02
1.57E-03
-4.82E-02
-5.68E-02
-5.20E-02
1.91E-03
-4.67E-02
-5.72E-02
-5.19E-02
1.91E-03
-4.67E-02
-5.71E-02
-5.37E-02
1.24E-03
-5.03E-02
-5.71E-02
-5.70E-02
1.33E-03
-5.33E-02
-6.06E-02
-4.00E-02
PASS
-5.68E-02
1.30E-03
-5.32E-02
-6.03E-02
-4.00E-02
NA
-5.67E-02
1.31E-03
-5.31E-02
-6.02E-02
-4.00E-02
NA
-5.66E-02
1.29E-03
-5.30E-02
-6.01E-02
-4.00E-02
NA
-5.65E-02
1.29E-03
-5.29E-02
-6.00E-02
-4.00E-02
NA
-5.64E-02
1.34E-03
-5.28E-02
-6.01E-02
-4.00E-02
NA
-5.64E-02
1.34E-03
-5.27E-02
-6.01E-02
-4.00E-02
NA
-5.67E-02
1.32E-03
-5.31E-02
-6.03E-02
-4.00E-02
NA
40
-5.51E-02
-5.10E-02
-5.28E-02
-5.17E-02
-5.22E-02
-5.68E-02
-5.46E-02
-5.63E-02
-5.64E-02
-5.82E-02
-5.67E-02
-5.65E-02
An ISO 9001:2008 and DSCC Certified Company
141
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Maximum Output Sink Current @+/-5V #2 (A)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
0.00E+00
-1.00E-02
-2.00E-02
-3.00E-02
-4.00E-02
-5.00E-02
-6.00E-02
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.68. Plot of Maximum Output Sink Current @+/-5V #2 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
142
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.68. Raw data for Maximum Output Sink Current @+/-5V #2 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Maximum Output Sink Current @+/-5V #2 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
50
-5.52E-02
-5.03E-02
-5.33E-02
-5.01E-02
-5.28E-02
-5.65E-02
-5.49E-02
-5.61E-02
-5.67E-02
-5.62E-02
-5.65E-02
-5.62E-02
24-hr
Anneal
60
-5.52E-02
-5.03E-02
-5.31E-02
-5.00E-02
-5.25E-02
-5.65E-02
-5.50E-02
-5.61E-02
-5.66E-02
-5.62E-02
-5.65E-02
-5.63E-02
168-hr
Anneal
70
-5.58E-02
-5.30E-02
-5.35E-02
-5.29E-02
-5.40E-02
-5.69E-02
-5.52E-02
-5.63E-02
-5.69E-02
-5.65E-02
-5.65E-02
-5.63E-02
0
-5.65E-02
-5.65E-02
-5.77E-02
-5.64E-02
-5.68E-02
-5.72E-02
-5.53E-02
-5.65E-02
-5.71E-02
-5.67E-02
-5.65E-02
-5.63E-02
10
-5.62E-02
-5.52E-02
-5.64E-02
-5.52E-02
-5.57E-02
-5.70E-02
-5.53E-02
-5.64E-02
-5.70E-02
-5.65E-02
-5.65E-02
-5.63E-02
Total Dose (krad(Si))
20
30
-5.57E-02 -5.55E-02
-5.33E-02 -5.22E-02
-5.50E-02 -5.44E-02
-5.34E-02 -5.21E-02
-5.44E-02 -5.39E-02
-5.69E-02 -5.68E-02
-5.52E-02 -5.51E-02
-5.64E-02 -5.63E-02
-5.69E-02 -5.68E-02
-5.64E-02 -5.64E-02
-5.65E-02 -5.65E-02
-5.63E-02 -5.63E-02
-5.68E-02
5.47E-04
-5.53E-02
-5.83E-02
-5.57E-02
5.57E-04
-5.42E-02
-5.73E-02
-5.44E-02
1.03E-03
-5.15E-02
-5.72E-02
-5.36E-02
1.46E-03
-4.96E-02
-5.76E-02
-5.28E-02
1.77E-03
-4.80E-02
-5.77E-02
-5.23E-02
2.13E-03
-4.65E-02
-5.82E-02
-5.22E-02
2.15E-03
-4.63E-02
-5.82E-02
-5.38E-02
1.18E-03
-5.06E-02
-5.71E-02
-5.66E-02
7.50E-04
-5.45E-02
-5.86E-02
-4.00E-02
PASS
-5.65E-02
6.96E-04
-5.46E-02
-5.84E-02
-4.00E-02
NA
-5.64E-02
6.88E-04
-5.45E-02
-5.82E-02
-4.00E-02
NA
-5.63E-02
6.89E-04
-5.44E-02
-5.82E-02
-4.00E-02
NA
-5.61E-02
6.56E-04
-5.43E-02
-5.79E-02
-4.00E-02
NA
-5.61E-02
6.82E-04
-5.42E-02
-5.79E-02
-4.00E-02
NA
-5.61E-02
6.71E-04
-5.43E-02
-5.79E-02
-4.00E-02
NA
-5.63E-02
6.94E-04
-5.44E-02
-5.82E-02
-4.00E-02
NA
40
-5.52E-02
-5.12E-02
-5.36E-02
-5.09E-02
-5.31E-02
-5.65E-02
-5.50E-02
-5.61E-02
-5.65E-02
-5.63E-02
-5.64E-02
-5.62E-02
An ISO 9001:2008 and DSCC Certified Company
143
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Maximum Output Sink Current @+/-5V #3 (A)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
0.00E+00
-1.00E-02
-2.00E-02
-3.00E-02
-4.00E-02
-5.00E-02
-6.00E-02
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.69. Plot of Maximum Output Sink Current @+/-5V #3 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
144
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.69. Raw data for Maximum Output Sink Current @+/-5V #3 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Maximum Output Sink Current @+/-5V #3 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
50
-5.49E-02
-5.01E-02
-5.36E-02
-5.06E-02
-5.17E-02
-5.68E-02
-5.54E-02
-5.59E-02
-5.63E-02
-5.63E-02
-5.65E-02
-5.65E-02
24-hr
Anneal
60
-5.48E-02
-5.00E-02
-5.35E-02
-5.05E-02
-5.16E-02
-5.68E-02
-5.54E-02
-5.59E-02
-5.63E-02
-5.63E-02
-5.65E-02
-5.65E-02
168-hr
Anneal
70
-5.57E-02
-5.25E-02
-5.41E-02
-5.30E-02
-5.34E-02
-5.70E-02
-5.57E-02
-5.60E-02
-5.67E-02
-5.65E-02
-5.66E-02
-5.66E-02
0
-5.65E-02
-5.66E-02
-5.80E-02
-5.68E-02
-5.67E-02
-5.73E-02
-5.60E-02
-5.63E-02
-5.69E-02
-5.68E-02
-5.67E-02
-5.65E-02
10
-5.62E-02
-5.52E-02
-5.68E-02
-5.56E-02
-5.56E-02
-5.71E-02
-5.59E-02
-5.62E-02
-5.68E-02
-5.67E-02
-5.66E-02
-5.65E-02
Total Dose (krad(Si))
20
30
-5.57E-02 -5.54E-02
-5.32E-02 -5.21E-02
-5.53E-02 -5.46E-02
-5.36E-02 -5.25E-02
-5.40E-02 -5.33E-02
-5.70E-02 -5.69E-02
-5.58E-02 -5.57E-02
-5.60E-02 -5.60E-02
-5.67E-02 -5.65E-02
-5.67E-02 -5.65E-02
-5.67E-02 -5.67E-02
-5.65E-02 -5.65E-02
-5.69E-02
6.15E-04
-5.52E-02
-5.86E-02
-5.59E-02
6.27E-04
-5.41E-02
-5.76E-02
-5.44E-02
1.08E-03
-5.14E-02
-5.73E-02
-5.36E-02
1.41E-03
-4.97E-02
-5.74E-02
-5.27E-02
1.70E-03
-4.81E-02
-5.74E-02
-5.22E-02
2.03E-03
-4.66E-02
-5.78E-02
-5.21E-02
2.06E-03
-4.64E-02
-5.77E-02
-5.37E-02
1.23E-03
-5.04E-02
-5.71E-02
-5.66E-02
5.16E-04
-5.52E-02
-5.80E-02
-4.00E-02
PASS
-5.65E-02
4.91E-04
-5.52E-02
-5.79E-02
-4.00E-02
NA
-5.64E-02
5.02E-04
-5.51E-02
-5.78E-02
-4.00E-02
NA
-5.63E-02
4.91E-04
-5.50E-02
-5.77E-02
-4.00E-02
NA
-5.62E-02
5.11E-04
-5.48E-02
-5.76E-02
-4.00E-02
NA
-5.61E-02
5.05E-04
-5.47E-02
-5.75E-02
-4.00E-02
NA
-5.61E-02
4.99E-04
-5.48E-02
-5.75E-02
-4.00E-02
NA
-5.64E-02
5.30E-04
-5.49E-02
-5.78E-02
-4.00E-02
NA
40
-5.50E-02
-5.10E-02
-5.40E-02
-5.14E-02
-5.24E-02
-5.68E-02
-5.54E-02
-5.59E-02
-5.63E-02
-5.64E-02
-5.65E-02
-5.65E-02
An ISO 9001:2008 and DSCC Certified Company
145
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Maximum Output Sink Current @+/-5V #4 (A)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
0.00E+00
-1.00E-02
-2.00E-02
-3.00E-02
-4.00E-02
-5.00E-02
-6.00E-02
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.70. Plot of Maximum Output Sink Current @+/-5V #4 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
146
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.70. Raw data for Maximum Output Sink Current @+/-5V #4 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Maximum Output Sink Current @+/-5V #4 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
50
-5.52E-02
-4.87E-02
-5.29E-02
-5.11E-02
-5.20E-02
-5.67E-02
-5.46E-02
-5.60E-02
-5.64E-02
-5.79E-02
-5.65E-02
-5.68E-02
24-hr
Anneal
60
-5.52E-02
-4.86E-02
-5.28E-02
-5.10E-02
-5.18E-02
-5.66E-02
-5.46E-02
-5.60E-02
-5.64E-02
-5.79E-02
-5.65E-02
-5.67E-02
168-hr
Anneal
70
-5.59E-02
-5.20E-02
-5.37E-02
-5.35E-02
-5.36E-02
-5.70E-02
-5.48E-02
-5.63E-02
-5.67E-02
-5.82E-02
-5.65E-02
-5.68E-02
0
-5.66E-02
-5.64E-02
-5.73E-02
-5.69E-02
-5.67E-02
-5.73E-02
-5.51E-02
-5.64E-02
-5.70E-02
-5.84E-02
-5.65E-02
-5.68E-02
10
-5.63E-02
-5.50E-02
-5.60E-02
-5.56E-02
-5.54E-02
-5.71E-02
-5.51E-02
-5.63E-02
-5.68E-02
-5.82E-02
-5.65E-02
-5.68E-02
Total Dose (krad(Si))
20
30
-5.58E-02 -5.56E-02
-5.27E-02 -5.12E-02
-5.46E-02 -5.40E-02
-5.39E-02 -5.28E-02
-5.41E-02 -5.33E-02
-5.70E-02 -5.68E-02
-5.49E-02 -5.47E-02
-5.63E-02 -5.62E-02
-5.67E-02 -5.67E-02
-5.81E-02 -5.80E-02
-5.65E-02 -5.65E-02
-5.68E-02 -5.68E-02
-5.68E-02
3.42E-04
-5.58E-02
-5.77E-02
-5.57E-02
5.21E-04
-5.42E-02
-5.71E-02
-5.42E-02
1.14E-03
-5.11E-02
-5.73E-02
-5.34E-02
1.60E-03
-4.90E-02
-5.78E-02
-5.25E-02
1.98E-03
-4.71E-02
-5.80E-02
-5.20E-02
2.41E-03
-4.54E-02
-5.86E-02
-5.19E-02
2.41E-03
-4.53E-02
-5.85E-02
-5.38E-02
1.39E-03
-4.99E-02
-5.76E-02
-5.68E-02
1.17E-03
-5.36E-02
-6.01E-02
-4.00E-02
PASS
-5.67E-02
1.15E-03
-5.36E-02
-5.99E-02
-4.00E-02
NA
-5.66E-02
1.17E-03
-5.34E-02
-5.98E-02
-4.00E-02
NA
-5.65E-02
1.19E-03
-5.32E-02
-5.97E-02
-4.00E-02
NA
-5.63E-02
1.18E-03
-5.31E-02
-5.95E-02
-4.00E-02
NA
-5.63E-02
1.19E-03
-5.30E-02
-5.96E-02
-4.00E-02
NA
-5.63E-02
1.18E-03
-5.31E-02
-5.95E-02
-4.00E-02
NA
-5.66E-02
1.21E-03
-5.33E-02
-5.99E-02
-4.00E-02
NA
40
-5.52E-02
-4.99E-02
-5.33E-02
-5.18E-02
-5.25E-02
-5.67E-02
-5.46E-02
-5.60E-02
-5.64E-02
-5.79E-02
-5.64E-02
-5.67E-02
An ISO 9001:2008 and DSCC Certified Company
147
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Short-Circuit Current @+/-5V #1 (A)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
9.00E-02
8.80E-02
8.60E-02
8.40E-02
8.20E-02
8.00E-02
7.80E-02
7.60E-02
7.40E-02
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.71. Plot of Positive Short-Circuit Current @+/-5V #1 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
148
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.71. Raw data for Positive Short-Circuit Current @+/-5V #1 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Positive Short-Circuit Current @+/-5V #1 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
8.76E-02
8.75E-02
8.77E-02
8.69E-02
8.63E-02
8.70E-02
8.78E-02
8.62E-02
8.67E-02
8.70E-02
8.62E-02
8.58E-02
24-hr
Anneal
60
8.76E-02
8.75E-02
8.80E-02
8.73E-02
8.67E-02
8.73E-02
8.80E-02
8.64E-02
8.69E-02
8.72E-02
8.63E-02
8.61E-02
168-hr
Anneal
70
8.64E-02
8.63E-02
8.69E-02
8.63E-02
8.57E-02
8.64E-02
8.73E-02
8.57E-02
8.62E-02
8.65E-02
8.59E-02
8.56E-02
8.72E-02
4.36E-04
8.84E-02
8.60E-02
8.72E-02
5.95E-04
8.89E-02
8.56E-02
8.74E-02
4.90E-04
8.88E-02
8.61E-02
8.63E-02
4.18E-04
8.75E-02
8.52E-02
8.71E-02
6.20E-04
8.88E-02
8.54E-02
7.50E-02
NA
8.69E-02
5.94E-04
8.86E-02
8.53E-02
7.50E-02
NA
8.71E-02
5.93E-04
8.88E-02
8.55E-02
7.50E-02
NA
8.64E-02
5.77E-04
8.80E-02
8.48E-02
7.50E-02
NA
0
8.59E-02
8.59E-02
8.64E-02
8.60E-02
8.54E-02
8.61E-02
8.70E-02
8.54E-02
8.59E-02
8.64E-02
8.58E-02
8.55E-02
Total Dose (krad(Si))
10
20
30
40
8.65E-02 8.68E-02 8.62E-02 8.74E-02
8.65E-02 8.68E-02 8.62E-02 8.73E-02
8.70E-02 8.73E-02 8.67E-02 8.77E-02
8.65E-02 8.67E-02 8.61E-02 8.71E-02
8.59E-02 8.62E-02 8.55E-02 8.65E-02
8.65E-02 8.67E-02 8.60E-02 8.71E-02
8.74E-02 8.76E-02 8.70E-02 8.80E-02
8.58E-02 8.59E-02 8.55E-02 8.63E-02
8.63E-02 8.64E-02 8.60E-02 8.68E-02
8.67E-02 8.67E-02 8.64E-02 8.71E-02
8.59E-02 8.60E-02 8.57E-02 8.63E-02
8.57E-02 8.58E-02 8.53E-02 8.60E-02
8.59E-02
3.40E-04
8.69E-02
8.50E-02
8.65E-02
3.88E-04
8.76E-02
8.54E-02
8.68E-02
3.95E-04
8.78E-02
8.57E-02
8.61E-02
4.02E-04
8.72E-02
8.50E-02
8.62E-02
5.81E-04
8.78E-02
8.46E-02
7.50E-02
PASS
8.65E-02
5.76E-04
8.81E-02
8.50E-02
7.50E-02
NA
8.67E-02
6.09E-04
8.83E-02
8.50E-02
7.50E-02
NA
8.62E-02
5.82E-04
8.78E-02
8.46E-02
7.50E-02
NA
An ISO 9001:2008 and DSCC Certified Company
149
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Short-Circuit Current @+/-5V #2 (A)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
9.00E-02
8.80E-02
8.60E-02
8.40E-02
8.20E-02
8.00E-02
7.80E-02
7.60E-02
7.40E-02
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.72. Plot of Positive Short-Circuit Current @+/-5V #2 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
150
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.72. Raw data for Positive Short-Circuit Current @+/-5V #2 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Positive Short-Circuit Current @+/-5V #2 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
8.75E-02
8.75E-02
8.80E-02
8.68E-02
8.65E-02
8.69E-02
8.78E-02
8.62E-02
8.68E-02
8.63E-02
8.59E-02
8.58E-02
24-hr
Anneal
60
8.75E-02
8.75E-02
8.82E-02
8.73E-02
8.69E-02
8.71E-02
8.80E-02
8.64E-02
8.70E-02
8.65E-02
8.60E-02
8.61E-02
168-hr
Anneal
70
8.63E-02
8.63E-02
8.73E-02
8.62E-02
8.59E-02
8.63E-02
8.73E-02
8.57E-02
8.63E-02
8.59E-02
8.57E-02
8.56E-02
8.73E-02
4.98E-04
8.86E-02
8.59E-02
8.73E-02
5.83E-04
8.89E-02
8.57E-02
8.75E-02
4.87E-04
8.88E-02
8.61E-02
8.64E-02
5.04E-04
8.78E-02
8.50E-02
8.69E-02
6.46E-04
8.87E-02
8.51E-02
7.50E-02
NA
8.68E-02
6.23E-04
8.85E-02
8.51E-02
7.50E-02
NA
8.70E-02
6.37E-04
8.88E-02
8.53E-02
7.50E-02
NA
8.63E-02
6.07E-04
8.79E-02
8.46E-02
7.50E-02
NA
0
8.58E-02
8.59E-02
8.68E-02
8.59E-02
8.57E-02
8.60E-02
8.69E-02
8.54E-02
8.61E-02
8.57E-02
8.54E-02
8.54E-02
Total Dose (krad(Si))
10
20
30
40
8.65E-02 8.68E-02 8.61E-02 8.73E-02
8.65E-02 8.68E-02 8.62E-02 8.73E-02
8.74E-02 8.76E-02 8.70E-02 8.81E-02
8.64E-02 8.66E-02 8.61E-02 8.70E-02
8.62E-02 8.64E-02 8.57E-02 8.68E-02
8.64E-02 8.67E-02 8.61E-02 8.70E-02
8.74E-02 8.75E-02 8.70E-02 8.79E-02
8.58E-02 8.59E-02 8.55E-02 8.63E-02
8.64E-02 8.65E-02 8.62E-02 8.69E-02
8.60E-02 8.60E-02 8.57E-02 8.64E-02
8.57E-02 8.58E-02 8.54E-02 8.61E-02
8.56E-02 8.57E-02 8.53E-02 8.61E-02
8.60E-02
4.33E-04
8.72E-02
8.48E-02
8.66E-02
4.59E-04
8.79E-02
8.54E-02
8.68E-02
4.64E-04
8.81E-02
8.56E-02
8.62E-02
4.60E-04
8.75E-02
8.50E-02
8.60E-02
5.57E-04
8.75E-02
8.45E-02
7.50E-02
PASS
8.64E-02
6.02E-04
8.80E-02
8.47E-02
7.50E-02
NA
8.65E-02
6.24E-04
8.82E-02
8.48E-02
7.50E-02
NA
8.61E-02
5.80E-04
8.77E-02
8.45E-02
7.50E-02
NA
An ISO 9001:2008 and DSCC Certified Company
151
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Short-Circuit Current @+/-5V #3 (A)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
8.80E-02
8.60E-02
8.40E-02
8.20E-02
8.00E-02
7.80E-02
7.60E-02
7.40E-02
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.73. Plot of Positive Short-Circuit Current @+/-5V #3 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
152
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.73. Raw data for Positive Short-Circuit Current @+/-5V #3 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Positive Short-Circuit Current @+/-5V #3 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
8.74E-02
8.73E-02
8.79E-02
8.67E-02
8.63E-02
8.68E-02
8.78E-02
8.60E-02
8.67E-02
8.62E-02
8.57E-02
8.57E-02
24-hr
Anneal
60
8.74E-02
8.73E-02
8.81E-02
8.71E-02
8.68E-02
8.70E-02
8.80E-02
8.62E-02
8.69E-02
8.64E-02
8.59E-02
8.59E-02
168-hr
Anneal
70
8.62E-02
8.62E-02
8.71E-02
8.60E-02
8.58E-02
8.62E-02
8.72E-02
8.54E-02
8.62E-02
8.57E-02
8.55E-02
8.56E-02
8.71E-02
5.25E-04
8.86E-02
8.57E-02
8.71E-02
6.15E-04
8.88E-02
8.54E-02
8.73E-02
4.94E-04
8.87E-02
8.60E-02
8.63E-02
5.09E-04
8.77E-02
8.49E-02
8.68E-02
7.06E-04
8.87E-02
8.49E-02
7.50E-02
NA
8.67E-02
6.99E-04
8.86E-02
8.48E-02
7.50E-02
NA
8.69E-02
6.97E-04
8.88E-02
8.50E-02
7.50E-02
NA
8.61E-02
6.76E-04
8.80E-02
8.43E-02
7.50E-02
NA
0
8.57E-02
8.57E-02
8.67E-02
8.58E-02
8.56E-02
8.59E-02
8.69E-02
8.52E-02
8.59E-02
8.56E-02
8.53E-02
8.54E-02
Total Dose (krad(Si))
10
20
30
40
8.64E-02 8.67E-02 8.61E-02 8.71E-02
8.63E-02 8.65E-02 8.59E-02 8.70E-02
8.73E-02 8.75E-02 8.69E-02 8.80E-02
8.63E-02 8.65E-02 8.59E-02 8.69E-02
8.61E-02 8.63E-02 8.56E-02 8.66E-02
8.64E-02 8.65E-02 8.59E-02 8.70E-02
8.73E-02 8.75E-02 8.69E-02 8.79E-02
8.56E-02 8.58E-02 8.53E-02 8.61E-02
8.63E-02 8.64E-02 8.61E-02 8.68E-02
8.58E-02 8.59E-02 8.56E-02 8.63E-02
8.55E-02 8.56E-02 8.52E-02 8.59E-02
8.56E-02 8.57E-02 8.53E-02 8.60E-02
8.59E-02
4.44E-04
8.71E-02
8.47E-02
8.65E-02
4.67E-04
8.77E-02
8.52E-02
8.67E-02
4.71E-04
8.80E-02
8.54E-02
8.61E-02
4.79E-04
8.74E-02
8.48E-02
8.59E-02
6.25E-04
8.76E-02
8.42E-02
7.50E-02
PASS
8.63E-02
6.54E-04
8.81E-02
8.45E-02
7.50E-02
NA
8.64E-02
6.70E-04
8.83E-02
8.46E-02
7.50E-02
NA
8.60E-02
6.13E-04
8.77E-02
8.43E-02
7.50E-02
NA
An ISO 9001:2008 and DSCC Certified Company
153
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Short-Circuit Current @+/-5V #4 (A)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
8.80E-02
8.60E-02
8.40E-02
8.20E-02
8.00E-02
7.80E-02
7.60E-02
7.40E-02
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.74. Plot of Positive Short-Circuit Current @+/-5V #4 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
154
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.74. Raw data for Positive Short-Circuit Current @+/-5V #4 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Positive Short-Circuit Current @+/-5V #4 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
8.75E-02
8.74E-02
8.77E-02
8.70E-02
8.62E-02
8.69E-02
8.78E-02
8.61E-02
8.67E-02
8.69E-02
8.59E-02
8.59E-02
24-hr
Anneal
60
8.75E-02
8.74E-02
8.80E-02
8.74E-02
8.67E-02
8.71E-02
8.79E-02
8.63E-02
8.69E-02
8.71E-02
8.62E-02
8.61E-02
168-hr
Anneal
70
8.63E-02
8.63E-02
8.69E-02
8.63E-02
8.57E-02
8.63E-02
8.72E-02
8.56E-02
8.62E-02
8.64E-02
8.57E-02
8.57E-02
8.72E-02
4.67E-04
8.84E-02
8.59E-02
8.72E-02
6.13E-04
8.88E-02
8.55E-02
8.74E-02
4.75E-04
8.87E-02
8.61E-02
8.63E-02
4.33E-04
8.75E-02
8.51E-02
8.70E-02
5.93E-04
8.86E-02
8.54E-02
7.50E-02
NA
8.69E-02
6.01E-04
8.85E-02
8.52E-02
7.50E-02
NA
8.71E-02
5.92E-04
8.87E-02
8.54E-02
7.50E-02
NA
8.63E-02
5.93E-04
8.80E-02
8.47E-02
7.50E-02
NA
0
8.58E-02
8.58E-02
8.65E-02
8.61E-02
8.54E-02
8.60E-02
8.69E-02
8.53E-02
8.60E-02
8.63E-02
8.56E-02
8.56E-02
Total Dose (krad(Si))
10
20
30
40
8.64E-02 8.68E-02 8.61E-02 8.73E-02
8.64E-02 8.67E-02 8.61E-02 8.72E-02
8.70E-02 8.74E-02 8.67E-02 8.77E-02
8.65E-02 8.68E-02 8.62E-02 8.71E-02
8.59E-02 8.61E-02 8.55E-02 8.64E-02
8.64E-02 8.67E-02 8.61E-02 8.71E-02
8.73E-02 8.75E-02 8.70E-02 8.79E-02
8.58E-02 8.59E-02 8.55E-02 8.62E-02
8.63E-02 8.64E-02 8.61E-02 8.68E-02
8.65E-02 8.66E-02 8.63E-02 8.70E-02
8.58E-02 8.58E-02 8.55E-02 8.61E-02
8.57E-02 8.58E-02 8.55E-02 8.61E-02
8.59E-02
4.04E-04
8.70E-02
8.48E-02
8.65E-02
4.14E-04
8.76E-02
8.53E-02
8.67E-02
4.60E-04
8.80E-02
8.55E-02
8.61E-02
4.25E-04
8.72E-02
8.49E-02
8.61E-02
5.72E-04
8.77E-02
8.45E-02
7.50E-02
PASS
8.65E-02
5.54E-04
8.80E-02
8.50E-02
7.50E-02
NA
8.66E-02
5.70E-04
8.82E-02
8.51E-02
7.50E-02
NA
8.62E-02
5.51E-04
8.77E-02
8.47E-02
7.50E-02
NA
An ISO 9001:2008 and DSCC Certified Company
155
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Short-Circuit Current @+/-5V #1 (A)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
-7.40E-02
-7.50E-02
-7.60E-02
-7.70E-02
-7.80E-02
-7.90E-02
-8.00E-02
-8.10E-02
-8.20E-02
-8.30E-02
-8.40E-02
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.75. Plot of Negative Short-Circuit Current @+/-5V #1 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
156
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.75. Raw data for Negative Short-Circuit Current @+/-5V #1 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Negative Short-Circuit Current @+/-5V #1 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
50
-8.32E-02
-8.30E-02
-8.32E-02
-8.24E-02
-8.18E-02
-8.24E-02
-8.33E-02
-8.18E-02
-8.22E-02
-8.26E-02
-8.18E-02
-8.14E-02
24-hr
Anneal
60
-8.31E-02
-8.30E-02
-8.35E-02
-8.27E-02
-8.22E-02
-8.27E-02
-8.36E-02
-8.20E-02
-8.24E-02
-8.29E-02
-8.20E-02
-8.16E-02
168-hr
Anneal
70
-8.19E-02
-8.17E-02
-8.25E-02
-8.17E-02
-8.13E-02
-8.18E-02
-8.28E-02
-8.13E-02
-8.17E-02
-8.22E-02
-8.15E-02
-8.11E-02
0
-8.15E-02
-8.15E-02
-8.21E-02
-8.16E-02
-8.11E-02
-8.16E-02
-8.27E-02
-8.11E-02
-8.15E-02
-8.21E-02
-8.14E-02
-8.11E-02
10
-8.20E-02
-8.20E-02
-8.26E-02
-8.20E-02
-8.15E-02
-8.20E-02
-8.30E-02
-8.15E-02
-8.18E-02
-8.24E-02
-8.15E-02
-8.12E-02
Total Dose (krad(Si))
20
30
-8.24E-02 -8.16E-02
-8.22E-02 -8.16E-02
-8.28E-02 -8.22E-02
-8.22E-02 -8.15E-02
-8.18E-02 -8.11E-02
-8.22E-02 -8.15E-02
-8.32E-02 -8.26E-02
-8.16E-02 -8.12E-02
-8.20E-02 -8.15E-02
-8.25E-02 -8.21E-02
-8.16E-02 -8.13E-02
-8.13E-02 -8.09E-02
-8.16E-02
3.56E-04
-8.06E-02
-8.25E-02
-8.20E-02
3.90E-04
-8.10E-02
-8.31E-02
-8.23E-02
3.89E-04
-8.12E-02
-8.34E-02
-8.16E-02
4.19E-04
-8.05E-02
-8.28E-02
-8.27E-02
4.37E-04
-8.15E-02
-8.39E-02
-8.27E-02
5.99E-04
-8.11E-02
-8.44E-02
-8.29E-02
4.65E-04
-8.16E-02
-8.42E-02
-8.18E-02
4.35E-04
-8.06E-02
-8.30E-02
-8.18E-02
5.94E-04
-8.02E-02
-8.34E-02
-7.50E-02
PASS
-8.21E-02
5.71E-04
-8.06E-02
-8.37E-02
-7.50E-02
NA
-8.23E-02
5.88E-04
-8.07E-02
-8.39E-02
-7.50E-02
NA
-8.18E-02
5.75E-04
-8.02E-02
-8.34E-02
-7.50E-02
NA
-8.26E-02
5.91E-04
-8.10E-02
-8.43E-02
-7.50E-02
NA
-8.25E-02
5.82E-04
-8.09E-02
-8.41E-02
-7.50E-02
NA
-8.27E-02
5.89E-04
-8.11E-02
-8.43E-02
-7.50E-02
NA
-8.20E-02
5.89E-04
-8.04E-02
-8.36E-02
-7.50E-02
NA
40
-8.28E-02
-8.27E-02
-8.33E-02
-8.26E-02
-8.21E-02
-8.26E-02
-8.35E-02
-8.20E-02
-8.22E-02
-8.28E-02
-8.19E-02
-8.16E-02
An ISO 9001:2008 and DSCC Certified Company
157
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Short-Circuit Current @+/-5V #2 (A)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
-7.40E-02
-7.50E-02
-7.60E-02
-7.70E-02
-7.80E-02
-7.90E-02
-8.00E-02
-8.10E-02
-8.20E-02
-8.30E-02
-8.40E-02
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.76. Plot of Negative Short-Circuit Current @+/-5V #2 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
158
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.76. Raw data for Negative Short-Circuit Current @+/-5V #2 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Negative Short-Circuit Current @+/-5V #2 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
50
-8.31E-02
-8.31E-02
-8.37E-02
-8.24E-02
-8.20E-02
-8.25E-02
-8.35E-02
-8.18E-02
-8.24E-02
-8.19E-02
-8.16E-02
-8.15E-02
24-hr
Anneal
60
-8.31E-02
-8.31E-02
-8.39E-02
-8.27E-02
-8.24E-02
-8.27E-02
-8.37E-02
-8.20E-02
-8.26E-02
-8.22E-02
-8.19E-02
-8.18E-02
168-hr
Anneal
70
-8.18E-02
-8.19E-02
-8.28E-02
-8.17E-02
-8.15E-02
-8.19E-02
-8.30E-02
-8.13E-02
-8.19E-02
-8.15E-02
-8.14E-02
-8.13E-02
0
-8.14E-02
-8.16E-02
-8.25E-02
-8.15E-02
-8.13E-02
-8.16E-02
-8.27E-02
-8.11E-02
-8.17E-02
-8.14E-02
-8.13E-02
-8.12E-02
10
-8.20E-02
-8.21E-02
-8.30E-02
-8.20E-02
-8.16E-02
-8.20E-02
-8.31E-02
-8.15E-02
-8.20E-02
-8.16E-02
-8.14E-02
-8.13E-02
Total Dose (krad(Si))
20
30
-8.22E-02 -8.16E-02
-8.24E-02 -8.18E-02
-8.32E-02 -8.26E-02
-8.22E-02 -8.15E-02
-8.19E-02 -8.13E-02
-8.22E-02 -8.16E-02
-8.32E-02 -8.27E-02
-8.16E-02 -8.12E-02
-8.22E-02 -8.18E-02
-8.17E-02 -8.14E-02
-8.15E-02 -8.12E-02
-8.14E-02 -8.10E-02
-8.16E-02
4.83E-04
-8.03E-02
-8.30E-02
-8.21E-02
4.98E-04
-8.08E-02
-8.35E-02
-8.24E-02
4.91E-04
-8.10E-02
-8.37E-02
-8.18E-02
5.05E-04
-8.04E-02
-8.31E-02
-8.28E-02
5.49E-04
-8.13E-02
-8.43E-02
-8.28E-02
6.71E-04
-8.10E-02
-8.47E-02
-8.30E-02
5.72E-04
-8.15E-02
-8.46E-02
-8.19E-02
5.01E-04
-8.06E-02
-8.33E-02
-8.17E-02
6.02E-04
-8.01E-02
-8.34E-02
-7.50E-02
PASS
-8.21E-02
6.25E-04
-8.03E-02
-8.38E-02
-7.50E-02
NA
-8.22E-02
6.25E-04
-8.05E-02
-8.39E-02
-7.50E-02
NA
-8.17E-02
6.03E-04
-8.01E-02
-8.34E-02
-7.50E-02
NA
-8.26E-02
6.43E-04
-8.08E-02
-8.43E-02
-7.50E-02
NA
-8.24E-02
6.51E-04
-8.06E-02
-8.42E-02
-7.50E-02
NA
-8.26E-02
6.47E-04
-8.09E-02
-8.44E-02
-7.50E-02
NA
-8.19E-02
6.41E-04
-8.02E-02
-8.37E-02
-7.50E-02
NA
40
-8.27E-02
-8.28E-02
-8.37E-02
-8.25E-02
-8.22E-02
-8.26E-02
-8.36E-02
-8.20E-02
-8.25E-02
-8.21E-02
-8.18E-02
-8.17E-02
An ISO 9001:2008 and DSCC Certified Company
159
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Short-Circuit Current @+/-5V #3 (A)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
-7.40E-02
-7.50E-02
-7.60E-02
-7.70E-02
-7.80E-02
-7.90E-02
-8.00E-02
-8.10E-02
-8.20E-02
-8.30E-02
-8.40E-02
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.77. Plot of Negative Short-Circuit Current @+/-5V #3 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
160
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.77. Raw data for Negative Short-Circuit Current @+/-5V #3 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Negative Short-Circuit Current @+/-5V #3 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
50
-8.30E-02
-8.30E-02
-8.35E-02
-8.22E-02
-8.19E-02
-8.23E-02
-8.33E-02
-8.16E-02
-8.22E-02
-8.18E-02
-8.15E-02
-8.14E-02
24-hr
Anneal
60
-8.30E-02
-8.30E-02
-8.37E-02
-8.26E-02
-8.23E-02
-8.26E-02
-8.36E-02
-8.19E-02
-8.25E-02
-8.21E-02
-8.18E-02
-8.16E-02
168-hr
Anneal
70
-8.18E-02
-8.18E-02
-8.26E-02
-8.15E-02
-8.14E-02
-8.18E-02
-8.28E-02
-8.11E-02
-8.17E-02
-8.14E-02
-8.13E-02
-8.12E-02
0
-8.14E-02
-8.15E-02
-8.22E-02
-8.14E-02
-8.12E-02
-8.15E-02
-8.26E-02
-8.10E-02
-8.16E-02
-8.13E-02
-8.11E-02
-8.11E-02
10
-8.19E-02
-8.20E-02
-8.28E-02
-8.18E-02
-8.16E-02
-8.19E-02
-8.30E-02
-8.13E-02
-8.19E-02
-8.15E-02
-8.13E-02
-8.13E-02
Total Dose (krad(Si))
20
30
-8.22E-02 -8.15E-02
-8.22E-02 -8.16E-02
-8.31E-02 -8.24E-02
-8.20E-02 -8.14E-02
-8.18E-02 -8.11E-02
-8.21E-02 -8.14E-02
-8.32E-02 -8.26E-02
-8.15E-02 -8.10E-02
-8.20E-02 -8.16E-02
-8.16E-02 -8.13E-02
-8.14E-02 -8.10E-02
-8.14E-02 -8.10E-02
-8.15E-02
4.11E-04
-8.04E-02
-8.27E-02
-8.20E-02
4.40E-04
-8.08E-02
-8.32E-02
-8.23E-02
4.86E-04
-8.09E-02
-8.36E-02
-8.16E-02
4.61E-04
-8.03E-02
-8.29E-02
-8.27E-02
4.95E-04
-8.13E-02
-8.40E-02
-8.27E-02
6.37E-04
-8.10E-02
-8.45E-02
-8.29E-02
5.19E-04
-8.15E-02
-8.43E-02
-8.18E-02
4.71E-04
-8.05E-02
-8.31E-02
-8.16E-02
6.03E-04
-7.99E-02
-8.33E-02
-7.50E-02
PASS
-8.19E-02
6.35E-04
-8.02E-02
-8.37E-02
-7.50E-02
NA
-8.21E-02
6.66E-04
-8.03E-02
-8.39E-02
-7.50E-02
NA
-8.16E-02
6.05E-04
-7.99E-02
-8.33E-02
-7.50E-02
NA
-8.24E-02
6.84E-04
-8.05E-02
-8.43E-02
-7.50E-02
NA
-8.23E-02
6.58E-04
-8.05E-02
-8.41E-02
-7.50E-02
NA
-8.25E-02
6.49E-04
-8.07E-02
-8.43E-02
-7.50E-02
NA
-8.18E-02
6.50E-04
-8.00E-02
-8.36E-02
-7.50E-02
NA
40
-8.27E-02
-8.27E-02
-8.34E-02
-8.24E-02
-8.22E-02
-8.25E-02
-8.35E-02
-8.17E-02
-8.24E-02
-8.20E-02
-8.16E-02
-8.17E-02
An ISO 9001:2008 and DSCC Certified Company
161
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Short-Circuit Current @+/-5V #4 (A)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
-7.40E-02
-7.50E-02
-7.60E-02
-7.70E-02
-7.80E-02
-7.90E-02
-8.00E-02
-8.10E-02
-8.20E-02
-8.30E-02
-8.40E-02
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.78. Plot of Negative Short-Circuit Current @+/-5V #4 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
162
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.78. Raw data for Negative Short-Circuit Current @+/-5V #4 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Negative Short-Circuit Current @+/-5V #4 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
50
-8.31E-02
-8.30E-02
-8.32E-02
-8.25E-02
-8.19E-02
-8.25E-02
-8.32E-02
-8.16E-02
-8.22E-02
-8.25E-02
-8.15E-02
-8.15E-02
24-hr
Anneal
60
-8.31E-02
-8.28E-02
-8.35E-02
-8.29E-02
-8.24E-02
-8.28E-02
-8.34E-02
-8.19E-02
-8.25E-02
-8.27E-02
-8.17E-02
-8.18E-02
168-hr
Anneal
70
-8.19E-02
-8.18E-02
-8.24E-02
-8.19E-02
-8.14E-02
-8.19E-02
-8.27E-02
-8.12E-02
-8.18E-02
-8.21E-02
-8.13E-02
-8.13E-02
0
-8.14E-02
-8.15E-02
-8.21E-02
-8.17E-02
-8.11E-02
-8.17E-02
-8.26E-02
-8.10E-02
-8.15E-02
-8.20E-02
-8.12E-02
-8.12E-02
10
-8.20E-02
-8.20E-02
-8.26E-02
-8.21E-02
-8.16E-02
-8.21E-02
-8.29E-02
-8.14E-02
-8.18E-02
-8.23E-02
-8.14E-02
-8.13E-02
Total Dose (krad(Si))
20
30
-8.23E-02 -8.16E-02
-8.22E-02 -8.15E-02
-8.28E-02 -8.22E-02
-8.24E-02 -8.17E-02
-8.18E-02 -8.12E-02
-8.23E-02 -8.16E-02
-8.31E-02 -8.25E-02
-8.15E-02 -8.10E-02
-8.20E-02 -8.15E-02
-8.22E-02 -8.19E-02
-8.14E-02 -8.10E-02
-8.14E-02 -8.10E-02
-8.16E-02
3.60E-04
-8.06E-02
-8.26E-02
-8.21E-02
3.73E-04
-8.10E-02
-8.31E-02
-8.23E-02
3.80E-04
-8.13E-02
-8.33E-02
-8.16E-02
3.74E-04
-8.06E-02
-8.27E-02
-8.27E-02
4.22E-04
-8.16E-02
-8.39E-02
-8.27E-02
5.45E-04
-8.12E-02
-8.42E-02
-8.29E-02
4.03E-04
-8.18E-02
-8.40E-02
-8.19E-02
3.74E-04
-8.08E-02
-8.29E-02
-8.18E-02
5.69E-04
-8.02E-02
-8.33E-02
-7.50E-02
PASS
-8.21E-02
5.44E-04
-8.06E-02
-8.36E-02
-7.50E-02
NA
-8.22E-02
5.74E-04
-8.06E-02
-8.38E-02
-7.50E-02
NA
-8.17E-02
5.41E-04
-8.02E-02
-8.32E-02
-7.50E-02
NA
-8.26E-02
5.89E-04
-8.10E-02
-8.42E-02
-7.50E-02
NA
-8.24E-02
5.63E-04
-8.09E-02
-8.40E-02
-7.50E-02
NA
-8.27E-02
5.43E-04
-8.12E-02
-8.42E-02
-7.50E-02
NA
-8.20E-02
5.40E-04
-8.05E-02
-8.34E-02
-7.50E-02
NA
40
-8.28E-02
-8.27E-02
-8.33E-02
-8.27E-02
-8.21E-02
-8.27E-02
-8.34E-02
-8.19E-02
-8.23E-02
-8.27E-02
-8.17E-02
-8.17E-02
An ISO 9001:2008 and DSCC Certified Company
163
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Positive Supply Current @5V (A)
1.80E-02
1.60E-02
1.40E-02
1.20E-02
1.00E-02
8.00E-03
6.00E-03
4.00E-03
2.00E-03
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.79. Plot of Positive Supply Current @5V (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
164
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.79. Raw data for Positive Supply Current @5V (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Positive Supply Current @5V (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
50
1.45E-02
1.43E-02
1.41E-02
1.43E-02
1.46E-02
1.42E-02
1.21E-02
1.46E-02
1.41E-02
1.40E-02
1.46E-02
1.47E-02
24-hr
Anneal
60
1.46E-02
1.43E-02
1.40E-02
1.42E-02
1.47E-02
1.42E-02
1.22E-02
1.46E-02
1.41E-02
1.40E-02
1.47E-02
1.47E-02
168-hr
Anneal
70
1.47E-02
1.47E-02
1.42E-02
1.45E-02
1.49E-02
1.45E-02
1.23E-02
1.47E-02
1.43E-02
1.42E-02
1.46E-02
1.46E-02
1.45E-02
2.50E-04
1.52E-02
1.38E-02
1.43E-02
2.17E-04
1.49E-02
1.38E-02
1.44E-02
2.70E-04
1.51E-02
1.36E-02
1.46E-02
2.65E-04
1.53E-02
1.39E-02
1.40E-02
9.45E-04
1.65E-02
1.14E-02
1.60E-02
N/A
1.38E-02
9.45E-04
1.64E-02
1.12E-02
1.60E-02
PASS
1.38E-02
9.45E-04
1.64E-02
1.12E-02
1.60E-02
PASS
1.40E-02
9.44E-04
1.66E-02
1.14E-02
1.60E-02
PASS
0
1.46E-02
1.46E-02
1.42E-02
1.44E-02
1.48E-02
1.45E-02
1.24E-02
1.47E-02
1.44E-02
1.43E-02
1.46E-02
1.46E-02
Total Dose (krad(Si))
10
20
30
40
1.47E-02 1.47E-02 1.46E-02 1.47E-02
1.46E-02 1.46E-02 1.45E-02 1.45E-02
1.42E-02 1.41E-02 1.41E-02 1.41E-02
1.45E-02 1.44E-02 1.44E-02 1.44E-02
1.49E-02 1.48E-02 1.48E-02 1.48E-02
1.45E-02 1.44E-02 1.44E-02 1.44E-02
1.24E-02 1.23E-02 1.23E-02 1.23E-02
1.47E-02 1.47E-02 1.47E-02 1.47E-02
1.44E-02 1.43E-02 1.42E-02 1.42E-02
1.43E-02 1.42E-02 1.42E-02 1.42E-02
1.47E-02 1.46E-02 1.46E-02 1.47E-02
1.47E-02 1.46E-02 1.47E-02 1.46E-02
1.45E-02
2.51E-04
1.52E-02
1.38E-02
1.46E-02
2.54E-04
1.53E-02
1.39E-02
1.45E-02
2.52E-04
1.52E-02
1.38E-02
1.45E-02
2.57E-04
1.52E-02
1.38E-02
1.41E-02
9.48E-04
1.67E-02
1.15E-02
1.60E-02
PASS
1.41E-02
9.47E-04
1.67E-02
1.15E-02
1.60E-02
PASS
1.40E-02
9.44E-04
1.66E-02
1.14E-02
1.60E-02
PASS
1.39E-02
9.36E-04
1.65E-02
1.14E-02
1.60E-02
N/A
An ISO 9001:2008 and DSCC Certified Company
165
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Negative Supply Current @5V (A)
0.00E+00
-2.00E-03
-4.00E-03
-6.00E-03
-8.00E-03
-1.00E-02
-1.20E-02
-1.40E-02
-1.60E-02
-1.80E-02
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.80. Plot of Negative Supply Current @5V (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
166
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.80. Raw data for Negative Supply Current @5V (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Negative Supply Current @5V (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
-1.44E-02
-1.42E-02
-1.40E-02
-1.42E-02
-1.46E-02
-1.41E-02
-1.21E-02
-1.45E-02
-1.40E-02
-1.40E-02
-1.46E-02
-1.46E-02
24-hr
Anneal
60
-1.45E-02
-1.43E-02
-1.39E-02
-1.42E-02
-1.46E-02
-1.42E-02
-1.21E-02
-1.45E-02
-1.40E-02
-1.40E-02
-1.46E-02
-1.46E-02
168-hr
Anneal
70
-1.46E-02
-1.46E-02
-1.41E-02
-1.45E-02
-1.48E-02
-1.44E-02
-1.23E-02
-1.46E-02
-1.42E-02
-1.41E-02
-1.45E-02
-1.45E-02
0
-1.46E-02
-1.45E-02
-1.41E-02
-1.43E-02
-1.47E-02
-1.44E-02
-1.23E-02
-1.47E-02
-1.43E-02
-1.42E-02
-1.45E-02
-1.45E-02
10
-1.47E-02
-1.46E-02
-1.42E-02
-1.44E-02
-1.48E-02
-1.45E-02
-1.23E-02
-1.47E-02
-1.43E-02
-1.42E-02
-1.46E-02
-1.46E-02
Total Dose (krad(Si))
20
30
-1.46E-02 -1.45E-02
-1.45E-02 -1.45E-02
-1.41E-02 -1.40E-02
-1.44E-02 -1.43E-02
-1.47E-02 -1.47E-02
-1.44E-02 -1.43E-02
-1.23E-02 -1.23E-02
-1.46E-02 -1.46E-02
-1.42E-02 -1.42E-02
-1.42E-02 -1.41E-02
-1.46E-02 -1.46E-02
-1.46E-02 -1.46E-02
-1.45E-02
2.45E-04
-1.38E-02
-1.51E-02
-1.45E-02
2.53E-04
-1.38E-02
-1.52E-02
-1.45E-02
2.48E-04
-1.38E-02
-1.51E-02
-1.44E-02
2.55E-04
-1.37E-02
-1.51E-02
-1.44E-02
2.47E-04
-1.38E-02
-1.51E-02
-1.43E-02
2.19E-04
-1.37E-02
-1.49E-02
-1.43E-02
2.67E-04
-1.36E-02
-1.50E-02
-1.45E-02
2.62E-04
-1.38E-02
-1.53E-02
-1.40E-02
9.41E-04
-1.14E-02
-1.66E-02
-1.60E-02
PASS
-1.40E-02
9.47E-04
-1.14E-02
-1.66E-02
-1.60E-02
PASS
-1.39E-02
9.39E-04
-1.13E-02
-1.65E-02
-1.60E-02
PASS
-1.39E-02
9.33E-04
-1.13E-02
-1.64E-02
-1.60E-02
N/A
-1.39E-02
9.41E-04
-1.13E-02
-1.65E-02
-1.60E-02
N/A
-1.37E-02
9.37E-04
-1.12E-02
-1.63E-02
-1.60E-02
PASS
-1.38E-02
9.40E-04
-1.12E-02
-1.63E-02
-1.60E-02
PASS
-1.39E-02
9.40E-04
-1.14E-02
-1.65E-02
-1.60E-02
PASS
40
-1.46E-02
-1.45E-02
-1.41E-02
-1.44E-02
-1.47E-02
-1.43E-02
-1.22E-02
-1.46E-02
-1.42E-02
-1.41E-02
-1.46E-02
-1.46E-02
An ISO 9001:2008 and DSCC Certified Company
167
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Voltage @5V #1 (V)
5.00E-03
4.00E-03
3.00E-03
2.00E-03
1.00E-03
0.00E+00
-1.00E-03
-2.00E-03
-3.00E-03
-4.00E-03
-5.00E-03
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.81. Plot of Input Offset Voltage @5V #1 (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
168
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.81. Raw data for Input Offset Voltage @5V #1 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Input Offset Voltage @5V #1 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
50
6.90E-05
-6.93E-04
-3.18E-04
3.21E-04
-3.36E-04
3.22E-04
1.55E-04
1.63E-04
-9.62E-04
3.15E-04
-4.80E-05
2.70E-05
24-hr
Anneal
60
7.00E-05
-6.95E-04
-3.21E-04
3.15E-04
-3.37E-04
3.22E-04
1.55E-04
1.60E-04
-9.68E-04
3.10E-04
-4.70E-05
2.50E-05
168-hr
Anneal
70
-7.40E-05
-8.15E-04
-4.44E-04
1.58E-04
-4.76E-04
1.31E-04
0.00E+00
5.00E-05
-1.12E-03
1.08E-04
-5.10E-05
1.00E-05
0
-6.00E-06
-7.31E-04
-3.80E-04
2.59E-04
-3.97E-04
2.00E-04
2.80E-05
9.60E-05
-1.12E-03
1.46E-04
-4.30E-05
4.30E-05
10
6.00E-06
-7.28E-04
-3.79E-04
2.65E-04
-3.99E-04
2.21E-04
4.60E-05
1.10E-04
-1.10E-03
1.71E-04
-4.30E-05
4.30E-05
Total Dose (krad(Si))
20
30
2.80E-05 4.30E-05
-7.04E-04 -6.82E-04
-3.60E-04 -3.46E-04
2.88E-04 3.04E-04
-3.84E-04 -3.63E-04
2.44E-04 2.70E-04
6.80E-05 1.02E-04
1.23E-04 1.37E-04
-1.07E-03 -1.03E-03
2.00E-04 2.39E-04
-4.70E-05 -4.70E-05
3.80E-05 2.40E-05
-2.51E-04
3.84E-04
8.01E-04
-1.30E-03
-2.47E-04
3.87E-04
8.13E-04
-1.31E-03
-2.26E-04
3.87E-04
8.36E-04
-1.29E-03
-2.09E-04
3.85E-04
8.47E-04
-1.26E-03
-1.94E-04
3.89E-04
8.73E-04
-1.26E-03
-1.91E-04
3.93E-04
8.87E-04
-1.27E-03
-1.94E-04
3.93E-04
8.83E-04
-1.27E-03
-3.30E-04
3.79E-04
7.08E-04
-1.37E-03
-1.29E-04
5.55E-04
1.39E-03
-1.65E-03
-2.00E-03
PASS
2.00E-03
PASS
-1.09E-04
5.55E-04
1.41E-03
-1.63E-03
-2.50E-03
PASS
2.50E-03
PASS
-8.62E-05
5.52E-04
1.43E-03
-1.60E-03
-2.50E-03
PASS
2.50E-03
PASS
-5.68E-05
5.50E-04
1.45E-03
-1.56E-03
-3.17E-03
N/A
3.17E-03
N/A
-2.88E-05
5.48E-04
1.47E-03
-1.53E-03
-3.83E-03
N/A
3.83E-03
N/A
-1.40E-06
5.43E-04
1.49E-03
-1.49E-03
-4.50E-03
PASS
4.50E-03
PASS
-4.20E-06
5.45E-04
1.49E-03
-1.50E-03
-4.50E-03
PASS
4.50E-03
PASS
-1.66E-04
5.36E-04
1.30E-03
-1.64E-03
-4.50E-03
PASS
4.50E-03
PASS
40
6.20E-05
-6.78E-04
-3.30E-04
3.20E-04
-3.46E-04
2.98E-04
1.30E-04
1.58E-04
-1.00E-03
2.71E-04
-4.50E-05
2.60E-05
An ISO 9001:2008 and DSCC Certified Company
169
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Voltage @5V #2 (V)
5.00E-03
4.00E-03
3.00E-03
2.00E-03
1.00E-03
0.00E+00
-1.00E-03
-2.00E-03
-3.00E-03
-4.00E-03
-5.00E-03
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.82. Plot of Input Offset Voltage @5V #2 (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
170
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.82. Raw data for Input Offset Voltage @5V #2 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Input Offset Voltage @5V #2 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
50
-7.20E-05
-8.74E-04
-1.51E-04
2.00E-04
-4.06E-04
3.09E-04
-1.97E-04
-2.55E-04
1.25E-04
-4.50E-04
-1.00E-04
2.59E-04
24-hr
Anneal
60
-7.10E-05
-8.77E-04
-1.55E-04
1.95E-04
-4.07E-04
3.07E-04
-1.97E-04
-2.55E-04
1.21E-04
-4.52E-04
-1.03E-04
2.58E-04
168-hr
Anneal
70
-2.53E-04
-9.62E-04
-3.12E-04
7.50E-05
-5.80E-04
1.25E-04
-3.49E-04
-3.67E-04
-8.00E-05
-6.22E-04
-1.04E-04
2.56E-04
0
-1.28E-04
-9.21E-04
-2.17E-04
1.40E-04
-5.01E-04
1.35E-04
-3.07E-04
-3.04E-04
-2.80E-05
-5.77E-04
-1.00E-04
2.70E-04
10
-1.20E-04
-9.17E-04
-2.11E-04
1.47E-04
-4.94E-04
1.55E-04
-2.90E-04
-2.95E-04
-6.00E-06
-5.55E-04
-9.50E-05
2.70E-04
Total Dose (krad(Si))
20
30
-1.12E-04 -9.60E-05
-9.00E-04 -8.84E-04
-1.88E-04 -1.68E-04
1.64E-04 1.87E-04
-4.68E-04 -4.36E-04
1.90E-04 2.31E-04
-2.69E-04 -2.48E-04
-2.88E-04 -2.77E-04
1.80E-05 5.10E-05
-5.31E-04 -5.05E-04
-9.50E-05 -9.60E-05
2.69E-04 2.57E-04
-3.25E-04
4.04E-04
7.82E-04
-1.43E-03
-3.19E-04
4.05E-04
7.92E-04
-1.43E-03
-3.01E-04
4.04E-04
8.06E-04
-1.41E-03
-2.79E-04
4.04E-04
8.29E-04
-1.39E-03
-2.65E-04
4.05E-04
8.45E-04
-1.38E-03
-2.61E-04
4.05E-04
8.51E-04
-1.37E-03
-2.63E-04
4.05E-04
8.47E-04
-1.37E-03
-4.06E-04
3.88E-04
6.58E-04
-1.47E-03
-2.16E-04
2.76E-04
5.41E-04
-9.73E-04
-2.00E-03
PASS
2.00E-03
PASS
-1.98E-04
2.77E-04
5.61E-04
-9.58E-04
-2.50E-03
PASS
2.50E-03
PASS
-1.76E-04
2.82E-04
5.98E-04
-9.50E-04
-2.50E-03
PASS
2.50E-03
PASS
-1.50E-04
2.90E-04
6.47E-04
-9.46E-04
-3.17E-03
N/A
3.17E-03
N/A
-1.22E-04
2.98E-04
6.97E-04
-9.40E-04
-3.83E-03
N/A
3.83E-03
N/A
-9.36E-05
3.06E-04
7.44E-04
-9.32E-04
-4.50E-03
PASS
4.50E-03
PASS
-9.52E-05
3.05E-04
7.41E-04
-9.31E-04
-4.50E-03
PASS
4.50E-03
PASS
-2.59E-04
2.88E-04
5.30E-04
-1.05E-03
-4.50E-03
PASS
4.50E-03
PASS
40
-7.80E-05
-8.73E-04
-1.55E-04
1.99E-04
-4.19E-04
2.69E-04
-2.17E-04
-2.65E-04
8.70E-05
-4.83E-04
-9.90E-05
2.59E-04
An ISO 9001:2008 and DSCC Certified Company
171
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Voltage @5V #3 (V)
5.00E-03
4.00E-03
3.00E-03
2.00E-03
1.00E-03
0.00E+00
-1.00E-03
-2.00E-03
-3.00E-03
-4.00E-03
-5.00E-03
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.83. Plot of Input Offset Voltage @5V #3 (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
172
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.83. Raw data for Input Offset Voltage @5V #3 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Input Offset Voltage @5V #3 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
50
-8.15E-04
6.53E-04
1.72E-04
-4.64E-04
-5.51E-04
-6.15E-04
-2.18E-04
-3.25E-04
3.64E-04
-6.60E-05
-2.98E-04
3.26E-04
24-hr
Anneal
60
-8.13E-04
6.55E-04
1.64E-04
-4.68E-04
-5.51E-04
-6.18E-04
-2.23E-04
-3.25E-04
3.63E-04
-7.10E-05
-2.98E-04
3.25E-04
168-hr
Anneal
70
-1.01E-03
5.36E-04
3.20E-05
-6.27E-04
-7.26E-04
-7.93E-04
-4.06E-04
-4.78E-04
1.92E-04
-2.80E-04
-3.06E-04
3.21E-04
0
-8.82E-04
6.14E-04
1.00E-04
-5.03E-04
-6.39E-04
-7.67E-04
-3.19E-04
-3.91E-04
2.16E-04
-1.48E-04
-3.06E-04
3.34E-04
10
-8.70E-04
6.16E-04
1.12E-04
-5.14E-04
-6.28E-04
-7.40E-04
-3.03E-04
-3.80E-04
2.41E-04
-1.35E-04
-2.99E-04
3.33E-04
Total Dose (krad(Si))
20
30
-8.59E-04 -8.43E-04
6.31E-04 6.45E-04
1.30E-04 1.47E-04
-5.00E-04 -4.84E-04
-6.04E-04 -5.81E-04
-7.12E-04 -6.78E-04
-2.82E-04 -2.61E-04
-3.70E-04 -3.55E-04
2.66E-04 3.01E-04
-1.19E-04 -1.00E-04
-2.99E-04 -2.99E-04
3.30E-04 3.18E-04
-2.62E-04
6.09E-04
1.41E-03
-1.93E-03
-2.57E-04
6.08E-04
1.41E-03
-1.92E-03
-2.40E-04
6.08E-04
1.43E-03
-1.91E-03
-2.23E-04
6.06E-04
1.44E-03
-1.89E-03
-2.10E-04
6.03E-04
1.44E-03
-1.86E-03
-2.01E-04
5.99E-04
1.44E-03
-1.84E-03
-2.03E-04
5.99E-04
1.44E-03
-1.84E-03
-3.59E-04
6.30E-04
1.37E-03
-2.09E-03
-2.82E-04
3.59E-04
7.02E-04
-1.27E-03
-2.00E-03
PASS
2.00E-03
PASS
-2.63E-04
3.58E-04
7.19E-04
-1.25E-03
-2.50E-03
PASS
2.50E-03
PASS
-2.43E-04
3.58E-04
7.38E-04
-1.22E-03
-2.50E-03
PASS
2.50E-03
PASS
-2.19E-04
3.59E-04
7.66E-04
-1.20E-03
-3.17E-03
N/A
3.17E-03
N/A
-1.94E-04
3.64E-04
8.05E-04
-1.19E-03
-3.83E-03
N/A
3.83E-03
N/A
-1.72E-04
3.61E-04
8.17E-04
-1.16E-03
-4.50E-03
PASS
4.50E-03
PASS
-1.75E-04
3.61E-04
8.15E-04
-1.16E-03
-4.50E-03
PASS
4.50E-03
PASS
-3.53E-04
3.59E-04
6.30E-04
-1.34E-03
-4.50E-03
PASS
4.50E-03
PASS
40
-8.24E-04
6.53E-04
1.59E-04
-4.69E-04
-5.67E-04
-6.52E-04
-2.37E-04
-3.38E-04
3.41E-04
-8.30E-05
-2.97E-04
3.23E-04
An ISO 9001:2008 and DSCC Certified Company
173
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Voltage @5V #4 (V)
5.00E-03
4.00E-03
3.00E-03
2.00E-03
1.00E-03
0.00E+00
-1.00E-03
-2.00E-03
-3.00E-03
-4.00E-03
-5.00E-03
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.84. Plot of Input Offset Voltage @5V #4 (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
174
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.84. Raw data for Input Offset Voltage @5V #4 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Input Offset Voltage @5V #4 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
50
-1.00E-04
-4.16E-04
-1.24E-04
1.72E-04
-5.30E-05
-3.20E-05
2.79E-04
4.99E-04
3.28E-04
5.21E-04
-2.13E-04
4.30E-05
24-hr
Anneal
60
-9.90E-05
-4.19E-04
-1.33E-04
1.68E-04
-5.10E-05
-3.20E-05
2.77E-04
5.01E-04
3.25E-04
5.20E-04
-2.12E-04
4.40E-05
168-hr
Anneal
70
-2.24E-04
-5.57E-04
-2.70E-04
5.00E-05
-2.46E-04
-1.89E-04
9.00E-05
3.90E-04
1.30E-04
3.66E-04
-2.17E-04
4.30E-05
0
-1.72E-04
-4.57E-04
-1.71E-04
1.28E-04
-9.60E-05
-1.78E-04
9.90E-05
4.38E-04
1.85E-04
3.51E-04
-2.14E-04
5.80E-05
10
-1.60E-04
-4.62E-04
-1.58E-04
1.17E-04
-1.04E-04
-1.56E-04
1.25E-04
4.47E-04
2.05E-04
3.79E-04
-2.12E-04
5.40E-05
Total Dose (krad(Si))
20
30
-1.41E-04 -1.27E-04
-4.40E-04 -4.22E-04
-1.56E-04 -1.38E-04
1.39E-04 1.56E-04
-8.70E-05 -6.80E-05
-1.30E-04 -9.40E-05
1.60E-04 1.96E-04
4.59E-04 4.71E-04
2.29E-04 2.65E-04
4.10E-04 4.48E-04
-2.11E-04 -2.12E-04
5.80E-05 3.90E-05
-1.54E-04
2.09E-04
4.20E-04
-7.28E-04
-1.53E-04
2.07E-04
4.13E-04
-7.20E-04
-1.37E-04
2.07E-04
4.30E-04
-7.04E-04
-1.20E-04
2.06E-04
4.46E-04
-6.86E-04
-1.06E-04
2.11E-04
4.72E-04
-6.84E-04
-1.04E-04
2.10E-04
4.72E-04
-6.80E-04
-1.07E-04
2.10E-04
4.70E-04
-6.83E-04
-2.49E-04
2.15E-04
3.41E-04
-8.40E-04
1.79E-04
2.40E-04
8.37E-04
-4.79E-04
-2.00E-03
PASS
2.00E-03
PASS
2.00E-04
2.37E-04
8.51E-04
-4.51E-04
-2.50E-03
PASS
2.50E-03
PASS
2.26E-04
2.34E-04
8.68E-04
-4.16E-04
-2.50E-03
PASS
2.50E-03
PASS
2.57E-04
2.29E-04
8.84E-04
-3.70E-04
-3.17E-03
N/A
3.17E-03
N/A
2.89E-04
2.26E-04
9.08E-04
-3.31E-04
-3.83E-03
N/A
3.83E-03
N/A
3.19E-04
2.23E-04
9.29E-04
-2.91E-04
-4.50E-03
PASS
4.50E-03
PASS
3.18E-04
2.23E-04
9.29E-04
-2.93E-04
-4.50E-03
PASS
4.50E-03
PASS
1.57E-04
2.36E-04
8.05E-04
-4.90E-04
-4.50E-03
PASS
4.50E-03
PASS
40
-1.08E-04
-4.15E-04
-1.26E-04
1.76E-04
-5.70E-05
-6.30E-05
2.34E-04
4.91E-04
3.01E-04
4.80E-04
-2.10E-04
4.20E-05
An ISO 9001:2008 and DSCC Certified Company
175
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Current @5V #1 (A)
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.85. Plot of Input Offset Current @5V #1 (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
176
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.85. Raw data for Input Offset Current @5V #1 (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Input Offset Current @5V #1 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
50
1.00E-08
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
-2.00E-08
-5.00E-08
3.00E-08
2.00E-08
24-hr
Anneal
60
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
-2.00E-08
-5.00E-08
3.00E-08
2.00E-08
168-hr
Anneal
70
1.00E-08
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
-1.00E-08
-2.00E-08
3.00E-08
2.00E-08
0
1.27E-08
6.48E-09
-1.44E-09
-5.20E-10
-4.61E-09
-4.71E-09
4.77E-09
1.18E-08
-8.22E-09
4.97E-09
2.80E-08
2.04E-08
10
1.20E-08
6.21E-09
-2.40E-10
-6.40E-10
-3.14E-09
-4.36E-09
4.94E-09
1.23E-08
-1.01E-08
-5.38E-09
2.81E-08
2.00E-08
Total Dose (krad(Si))
20
30
1.00E-08 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
1.00E-08 1.00E-08
-1.00E-08 -2.00E-08
-2.00E-08 -3.00E-08
3.00E-08 3.00E-08
2.00E-08 2.00E-08
2.53E-09
6.99E-09
2.17E-08
-1.66E-08
2.84E-09
6.17E-09
1.98E-08
-1.41E-08
2.00E-09
4.47E-09
1.43E-08
-1.03E-08
0.00E+00
0.00E+00
0.00E+00
0.00E+00
2.00E-09
4.47E-09
1.43E-08
-1.03E-08
2.00E-09
4.47E-09
1.43E-08
-1.03E-08
0.00E+00
0.00E+00
0.00E+00
0.00E+00
2.00E-09
4.47E-09
1.43E-08
-1.03E-08
1.72E-09
8.09E-09
2.39E-08
-2.05E-08
-4.00E-07
PASS
4.00E-07
PASS
-5.16E-10
8.99E-09
2.41E-08
-2.52E-08
-5.00E-07
PASS
5.00E-07
PASS
-4.00E-09
1.14E-08
2.73E-08
-3.53E-08
-5.00E-07
PASS
5.00E-07
PASS
-8.00E-09
1.64E-08
3.71E-08
-5.31E-08
-5.83E-07
N/A
5.83E-07
N/A
-1.20E-08
1.79E-08
3.71E-08
-6.11E-08
-6.67E-07
N/A
6.67E-07
N/A
-1.40E-08
2.19E-08
4.61E-08
-7.41E-08
-7.50E-07
PASS
7.50E-07
PASS
-1.40E-08
2.19E-08
4.61E-08
-7.41E-08
-7.50E-07
PASS
7.50E-07
PASS
-6.00E-09
8.94E-09
1.85E-08
-3.05E-08
-7.50E-07
PASS
7.50E-07
PASS
40
1.00E-08
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
-2.00E-08
-4.00E-08
3.00E-08
2.00E-08
An ISO 9001:2008 and DSCC Certified Company
177
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Current @5V #2 (A)
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.86. Plot of Input Offset Current @5V #2 (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
178
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.86. Raw data for Input Offset Current @5V #2 (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Input Offset Current @5V #2 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
50
0.00E+00
2.00E-08
0.00E+00
-1.00E-08
0.00E+00
0.00E+00
1.00E-08
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
24-hr
Anneal
60
0.00E+00
3.00E-08
0.00E+00
-1.00E-08
0.00E+00
0.00E+00
1.00E-08
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
168-hr
Anneal
70
0.00E+00
2.00E-08
0.00E+00
-1.00E-08
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0
-6.60E-10
2.56E-08
7.20E-10
-1.06E-08
1.81E-09
-3.27E-09
7.86E-09
2.93E-09
3.98E-09
-4.01E-09
9.22E-09
1.10E-09
10
-5.40E-10
2.52E-08
1.21E-09
-1.10E-08
-2.00E-10
-4.38E-09
8.69E-09
1.58E-09
4.21E-09
-5.76E-09
9.72E-09
1.44E-09
Total Dose (krad(Si))
20
30
0.00E+00 0.00E+00
2.00E-08 3.00E-08
0.00E+00 0.00E+00
-1.00E-08 -1.00E-08
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
3.38E-09
1.34E-08
4.00E-08
-3.33E-08
2.92E-09
1.34E-08
3.96E-08
-3.37E-08
2.00E-09
1.10E-08
3.20E-08
-2.80E-08
4.00E-09
1.52E-08
4.56E-08
-3.76E-08
2.00E-09
1.10E-08
3.20E-08
-2.80E-08
2.00E-09
1.10E-08
3.20E-08
-2.80E-08
4.00E-09
1.52E-08
4.56E-08
-3.76E-08
2.00E-09
1.10E-08
3.20E-08
-2.80E-08
1.50E-09
5.04E-09
1.53E-08
-1.23E-08
-4.00E-07
PASS
4.00E-07
PASS
8.68E-10
6.01E-09
1.73E-08
-1.56E-08
-5.00E-07
PASS
5.00E-07
PASS
0.00E+00
0.00E+00
0.00E+00
0.00E+00
-5.00E-07
PASS
5.00E-07
PASS
0.00E+00
0.00E+00
0.00E+00
0.00E+00
-5.83E-07
N/A
5.83E-07
N/A
2.00E-09
4.47E-09
1.43E-08
-1.03E-08
-6.67E-07
N/A
6.67E-07
N/A
2.00E-09
4.47E-09
1.43E-08
-1.03E-08
-7.50E-07
PASS
7.50E-07
PASS
2.00E-09
4.47E-09
1.43E-08
-1.03E-08
-7.50E-07
PASS
7.50E-07
PASS
0.00E+00
0.00E+00
0.00E+00
0.00E+00
-7.50E-07
PASS
7.50E-07
PASS
40
0.00E+00
2.00E-08
0.00E+00
-1.00E-08
0.00E+00
0.00E+00
1.00E-08
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
An ISO 9001:2008 and DSCC Certified Company
179
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Current @5V #3 (A)
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.87. Plot of Input Offset Current @5V #3 (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
180
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.87. Raw data for Input Offset Current @5V #3 (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Input Offset Current @5V #3 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
50
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
1.00E-08
1.00E-08
0.00E+00
2.00E-08
1.00E-08
24-hr
Anneal
60
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
-1.00E-08
0.00E+00
1.00E-08
1.00E-08
0.00E+00
2.00E-08
1.00E-08
168-hr
Anneal
70
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
2.00E-08
1.00E-08
0
5.85E-09
1.85E-09
2.73E-09
-2.88E-09
2.85E-09
-4.39E-09
4.20E-10
7.63E-09
8.70E-10
-5.42E-09
1.59E-08
1.18E-08
10
6.13E-09
2.25E-09
3.80E-10
-3.26E-09
2.69E-09
-4.82E-09
5.90E-10
8.58E-09
1.31E-09
-5.02E-09
1.48E-08
1.12E-08
Total Dose (krad(Si))
20
30
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
1.00E-08 1.00E-08
0.00E+00 0.00E+00
0.00E+00 0.00E+00
2.00E-08 1.00E-08
1.00E-08 1.00E-08
2.08E-09
3.16E-09
1.07E-08
-6.58E-09
1.64E-09
3.44E-09
1.11E-08
-7.78E-09
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
-1.78E-10
5.19E-09
1.40E-08
-1.44E-08
-4.00E-07
PASS
4.00E-07
PASS
1.28E-10
5.57E-09
1.54E-08
-1.51E-08
-5.00E-07
PASS
5.00E-07
PASS
2.00E-09
4.47E-09
1.43E-08
-1.03E-08
-5.00E-07
PASS
5.00E-07
PASS
2.00E-09
4.47E-09
1.43E-08
-1.03E-08
-5.83E-07
N/A
5.83E-07
N/A
0.00E+00
7.07E-09
1.94E-08
-1.94E-08
-6.67E-07
N/A
6.67E-07
N/A
4.00E-09
5.48E-09
1.90E-08
-1.10E-08
-7.50E-07
PASS
7.50E-07
PASS
2.00E-09
8.37E-09
2.49E-08
-2.09E-08
-7.50E-07
PASS
7.50E-07
PASS
0.00E+00
0.00E+00
0.00E+00
0.00E+00
-7.50E-07
PASS
7.50E-07
PASS
40
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
-1.00E-08
0.00E+00
1.00E-08
0.00E+00
0.00E+00
2.00E-08
1.00E-08
An ISO 9001:2008 and DSCC Certified Company
181
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Current @5V #4 (A)
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.88. Plot of Input Offset Current @5V #4 (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
182
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.88. Raw data for Input Offset Current @5V #4 (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Input Offset Current @5V #4 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
50
0.00E+00
0.00E+00
2.00E-08
2.00E-08
0.00E+00
2.00E-08
1.00E-08
0.00E+00
2.00E-08
0.00E+00
2.00E-08
0.00E+00
24-hr
Anneal
60
0.00E+00
0.00E+00
2.00E-08
2.00E-08
-1.00E-08
2.00E-08
1.00E-08
0.00E+00
2.00E-08
0.00E+00
2.00E-08
0.00E+00
168-hr
Anneal
70
0.00E+00
0.00E+00
2.00E-08
2.00E-08
0.00E+00
3.00E-08
0.00E+00
0.00E+00
2.00E-08
0.00E+00
2.00E-08
0.00E+00
0
3.96E-09
-8.61E-09
1.82E-08
2.09E-08
-8.11E-09
2.69E-08
6.60E-09
9.28E-09
2.25E-08
-8.24E-09
1.59E-08
4.90E-09
10
1.55E-09
-8.28E-09
1.78E-08
2.15E-08
-6.31E-09
2.63E-08
6.72E-09
8.23E-09
2.16E-08
-7.32E-09
1.52E-08
5.27E-09
Total Dose (krad(Si))
20
30
0.00E+00 0.00E+00
-1.00E-08 0.00E+00
2.00E-08 2.00E-08
2.00E-08 2.00E-08
0.00E+00 0.00E+00
2.00E-08 2.00E-08
0.00E+00 0.00E+00
0.00E+00 0.00E+00
2.00E-08 2.00E-08
0.00E+00 0.00E+00
2.00E-08 1.00E-08
0.00E+00 0.00E+00
5.26E-09
1.40E-08
4.37E-08
-3.31E-08
5.24E-09
1.37E-08
4.28E-08
-3.23E-08
6.00E-09
1.34E-08
4.28E-08
-3.08E-08
8.00E-09
1.10E-08
3.80E-08
-2.20E-08
8.00E-09
1.10E-08
3.80E-08
-2.20E-08
8.00E-09
1.10E-08
3.80E-08
-2.20E-08
6.00E-09
1.34E-08
4.28E-08
-3.08E-08
8.00E-09
1.10E-08
3.80E-08
-2.20E-08
1.14E-08
1.39E-08
4.96E-08
-2.68E-08
-4.00E-07
PASS
4.00E-07
PASS
1.11E-08
1.33E-08
4.75E-08
-2.53E-08
-5.00E-07
PASS
5.00E-07
PASS
8.00E-09
1.10E-08
3.80E-08
-2.20E-08
-5.00E-07
PASS
5.00E-07
PASS
8.00E-09
1.10E-08
3.80E-08
-2.20E-08
-5.83E-07
N/A
5.83E-07
N/A
8.00E-09
1.10E-08
3.80E-08
-2.20E-08
-6.67E-07
N/A
6.67E-07
N/A
1.00E-08
1.00E-08
3.74E-08
-1.74E-08
-7.50E-07
PASS
7.50E-07
PASS
1.00E-08
1.00E-08
3.74E-08
-1.74E-08
-7.50E-07
PASS
7.50E-07
PASS
1.00E-08
1.41E-08
4.88E-08
-2.88E-08
-7.50E-07
PASS
7.50E-07
PASS
40
0.00E+00
0.00E+00
2.00E-08
2.00E-08
0.00E+00
2.00E-08
0.00E+00
0.00E+00
2.00E-08
0.00E+00
2.00E-08
0.00E+00
An ISO 9001:2008 and DSCC Certified Company
183
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Positive Input Bias Current @5V #1 (A)
1.00E-05
8.00E-06
6.00E-06
4.00E-06
2.00E-06
0.00E+00
-2.00E-06
-4.00E-06
-6.00E-06
-8.00E-06
-1.00E-05
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.89. Plot of Positive Input Bias Current @5V #1 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
184
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.89. Raw data for Positive Input Bias Current @5V #1 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Positive Input Bias Current @5V #1 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
40
2.90E-07
3.00E-07
2.80E-07
2.90E-07
3.00E-07
3.00E-07
2.80E-07
3.10E-07
2.70E-07
2.60E-07
2.90E-07
2.90E-07
50
2.90E-07
3.10E-07
2.80E-07
2.90E-07
3.00E-07
3.10E-07
3.00E-07
3.20E-07
2.80E-07
2.70E-07
2.90E-07
2.90E-07
24-hr
Anneal
60
2.90E-07
3.10E-07
2.80E-07
2.90E-07
3.00E-07
3.10E-07
3.00E-07
3.20E-07
2.80E-07
2.80E-07
2.90E-07
2.90E-07
2.84E-07
1.14E-08
3.15E-07
2.53E-07
2.92E-07
8.37E-09
3.15E-07
2.69E-07
2.94E-07
1.14E-08
3.25E-07
2.63E-07
2.94E-07
1.14E-08
3.25E-07
2.63E-07
2.62E-07
1.48E-08
3.03E-07
2.21E-07
2.74E-07
2.30E-08
3.37E-07
2.11E-07
-5.83E-06
N/A
5.83E-06
N/A
2.84E-07
2.07E-08
3.41E-07
2.27E-07
-6.67E-06
N/A
6.67E-06
N/A
2.96E-07
2.07E-08
3.53E-07
2.39E-07
-7.50E-06
PASS
7.50E-06
PASS
2.98E-07
1.79E-08
3.47E-07
2.49E-07
-7.50E-06
PASS
7.50E-06
PASS
2.70E-07
2.00E-08
3.25E-07
2.15E-07
-7.50E-06
PASS
7.50E-06
PASS
Total Dose (krad(Si))
20
30
2.80E-07 2.80E-07
3.00E-07 3.00E-07
2.70E-07 2.70E-07
2.80E-07 2.80E-07
2.90E-07 2.90E-07
2.70E-07 2.80E-07
2.60E-07 2.70E-07
2.90E-07 3.10E-07
2.40E-07 2.60E-07
2.40E-07 2.50E-07
2.80E-07 2.90E-07
2.90E-07 2.90E-07
0
2.60E-07
2.80E-07
2.50E-07
2.60E-07
2.70E-07
2.60E-07
2.40E-07
2.80E-07
2.30E-07
2.40E-07
2.90E-07
2.90E-07
10
2.70E-07
2.90E-07
2.60E-07
2.70E-07
2.80E-07
2.60E-07
2.40E-07
2.90E-07
2.30E-07
2.40E-07
2.90E-07
2.90E-07
2.64E-07
1.14E-08
2.95E-07
2.33E-07
2.74E-07
1.14E-08
3.05E-07
2.43E-07
2.84E-07
1.14E-08
3.15E-07
2.53E-07
2.50E-07
2.00E-08
3.05E-07
1.95E-07
-4.00E-06
PASS
4.00E-06
PASS
2.52E-07
2.39E-08
3.17E-07
1.87E-07
-5.00E-06
PASS
5.00E-06
PASS
2.60E-07
2.12E-08
3.18E-07
2.02E-07
-5.00E-06
PASS
5.00E-06
PASS
An ISO 9001:2008 and DSCC Certified Company
185
168-hr
Anneal
70
2.60E-07
2.80E-07
2.40E-07
2.60E-07
2.70E-07
2.80E-07
2.60E-07
3.00E-07
2.50E-07
2.60E-07
2.90E-07
2.90E-07
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Positive Input Bias Current @5V #2 (A)
1.00E-05
8.00E-06
6.00E-06
4.00E-06
2.00E-06
0.00E+00
-2.00E-06
-4.00E-06
-6.00E-06
-8.00E-06
-1.00E-05
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.90. Plot of Positive Input Bias Current @5V #2 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
186
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.90. Raw data for Positive Input Bias Current @5V #2 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Positive Input Bias Current @5V #2 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
40
2.80E-07
3.00E-07
2.50E-07
2.90E-07
2.90E-07
2.90E-07
2.70E-07
2.80E-07
2.90E-07
3.00E-07
2.80E-07
2.70E-07
50
2.90E-07
3.00E-07
2.60E-07
2.90E-07
2.90E-07
3.00E-07
2.80E-07
2.80E-07
3.00E-07
3.10E-07
2.80E-07
2.70E-07
24-hr
Anneal
60
2.90E-07
3.10E-07
2.60E-07
2.90E-07
2.90E-07
3.00E-07
2.80E-07
2.90E-07
3.00E-07
3.10E-07
2.80E-07
2.70E-07
2.76E-07
1.52E-08
3.18E-07
2.34E-07
2.82E-07
1.92E-08
3.35E-07
2.29E-07
2.86E-07
1.52E-08
3.28E-07
2.44E-07
2.88E-07
1.79E-08
3.37E-07
2.39E-07
2.54E-07
2.19E-08
3.14E-07
1.94E-07
2.74E-07
1.52E-08
3.16E-07
2.32E-07
-5.83E-06
N/A
5.83E-06
N/A
2.86E-07
1.14E-08
3.17E-07
2.55E-07
-6.67E-06
N/A
6.67E-06
N/A
2.94E-07
1.34E-08
3.31E-07
2.57E-07
-7.50E-06
PASS
7.50E-06
PASS
2.96E-07
1.14E-08
3.27E-07
2.65E-07
-7.50E-06
PASS
7.50E-06
PASS
2.66E-07
1.52E-08
3.08E-07
2.24E-07
-7.50E-06
PASS
7.50E-06
PASS
Total Dose (krad(Si))
20
30
2.70E-07 2.80E-07
2.90E-07 2.90E-07
2.40E-07 2.50E-07
2.80E-07 2.80E-07
2.70E-07 2.80E-07
2.70E-07 2.80E-07
2.40E-07 2.50E-07
2.60E-07 2.70E-07
2.60E-07 2.80E-07
2.80E-07 2.90E-07
2.80E-07 2.80E-07
2.70E-07 2.70E-07
0
2.60E-07
2.80E-07
2.30E-07
2.60E-07
2.60E-07
2.50E-07
2.20E-07
2.60E-07
2.50E-07
2.70E-07
2.80E-07
2.70E-07
10
2.70E-07
2.90E-07
2.40E-07
2.70E-07
2.60E-07
2.60E-07
2.30E-07
2.60E-07
2.50E-07
2.80E-07
2.80E-07
2.70E-07
2.58E-07
1.79E-08
3.07E-07
2.09E-07
2.66E-07
1.82E-08
3.16E-07
2.16E-07
2.70E-07
1.87E-08
3.21E-07
2.19E-07
2.50E-07
1.87E-08
3.01E-07
1.99E-07
-4.00E-06
PASS
4.00E-06
PASS
2.56E-07
1.82E-08
3.06E-07
2.06E-07
-5.00E-06
PASS
5.00E-06
PASS
2.62E-07
1.48E-08
3.03E-07
2.21E-07
-5.00E-06
PASS
5.00E-06
PASS
An ISO 9001:2008 and DSCC Certified Company
187
168-hr
Anneal
70
2.60E-07
2.80E-07
2.20E-07
2.60E-07
2.50E-07
2.70E-07
2.40E-07
2.70E-07
2.70E-07
2.80E-07
2.80E-07
2.70E-07
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Positive Input Bias Current @5V #3 (A)
1.00E-05
8.00E-06
6.00E-06
4.00E-06
2.00E-06
0.00E+00
-2.00E-06
-4.00E-06
-6.00E-06
-8.00E-06
-1.00E-05
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.91. Plot of Positive Input Bias Current @5V #3 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
188
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.91. Raw data for Positive Input Bias Current @5V #3 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Positive Input Bias Current @5V #3 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
40
2.80E-07
2.90E-07
2.40E-07
3.10E-07
3.20E-07
2.80E-07
2.60E-07
3.00E-07
2.80E-07
3.00E-07
2.80E-07
2.90E-07
50
2.90E-07
2.90E-07
2.50E-07
3.10E-07
3.20E-07
3.00E-07
2.70E-07
3.10E-07
2.90E-07
3.20E-07
2.80E-07
2.80E-07
24-hr
Anneal
60
2.90E-07
2.90E-07
2.40E-07
3.10E-07
3.20E-07
3.00E-07
2.70E-07
3.10E-07
2.90E-07
3.10E-07
2.80E-07
2.80E-07
2.82E-07
2.68E-08
3.56E-07
2.08E-07
2.88E-07
3.11E-08
3.73E-07
2.03E-07
2.92E-07
2.68E-08
3.66E-07
2.18E-07
2.90E-07
3.08E-08
3.75E-07
2.05E-07
2.62E-07
2.49E-08
3.30E-07
1.94E-07
2.78E-07
1.92E-08
3.31E-07
2.25E-07
-5.83E-06
N/A
5.83E-06
N/A
2.84E-07
1.67E-08
3.30E-07
2.38E-07
-6.67E-06
N/A
6.67E-06
N/A
2.98E-07
1.92E-08
3.51E-07
2.45E-07
-7.50E-06
PASS
7.50E-06
PASS
2.96E-07
1.67E-08
3.42E-07
2.50E-07
-7.50E-06
PASS
7.50E-06
PASS
2.72E-07
2.05E-08
3.28E-07
2.16E-07
-7.50E-06
PASS
7.50E-06
PASS
Total Dose (krad(Si))
20
30
2.80E-07 2.80E-07
2.80E-07 2.80E-07
2.30E-07 2.40E-07
3.00E-07 3.00E-07
3.00E-07 3.10E-07
2.70E-07 2.80E-07
2.40E-07 2.50E-07
2.80E-07 2.90E-07
2.60E-07 2.70E-07
2.80E-07 3.00E-07
2.80E-07 2.80E-07
2.80E-07 2.90E-07
0
2.60E-07
2.70E-07
2.20E-07
2.80E-07
2.80E-07
2.50E-07
2.30E-07
2.70E-07
2.50E-07
2.70E-07
2.80E-07
2.80E-07
10
2.70E-07
2.80E-07
2.30E-07
2.90E-07
2.90E-07
2.60E-07
2.30E-07
2.80E-07
2.60E-07
2.80E-07
2.80E-07
2.80E-07
2.62E-07
2.49E-08
3.30E-07
1.94E-07
2.72E-07
2.49E-08
3.40E-07
2.04E-07
2.78E-07
2.86E-08
3.57E-07
1.99E-07
2.54E-07
1.67E-08
3.00E-07
2.08E-07
-4.00E-06
PASS
4.00E-06
PASS
2.62E-07
2.05E-08
3.18E-07
2.06E-07
-5.00E-06
PASS
5.00E-06
PASS
2.66E-07
1.67E-08
3.12E-07
2.20E-07
-5.00E-06
PASS
5.00E-06
PASS
An ISO 9001:2008 and DSCC Certified Company
189
168-hr
Anneal
70
2.60E-07
2.70E-07
2.20E-07
2.80E-07
2.80E-07
2.70E-07
2.40E-07
2.90E-07
2.70E-07
2.90E-07
2.80E-07
2.80E-07
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Positive Input Bias Current @5V #4 (A)
1.00E-05
8.00E-06
6.00E-06
4.00E-06
2.00E-06
0.00E+00
-2.00E-06
-4.00E-06
-6.00E-06
-8.00E-06
-1.00E-05
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.92. Plot of Positive Input Bias Current @5V #4 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
190
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.92. Raw data for Positive Input Bias Current @5V #4 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Positive Input Bias Current @5V #4 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
40
2.90E-07
2.80E-07
3.00E-07
3.20E-07
2.90E-07
3.10E-07
2.80E-07
3.00E-07
2.80E-07
3.10E-07
2.70E-07
2.80E-07
50
2.90E-07
2.90E-07
3.00E-07
3.20E-07
2.90E-07
3.20E-07
2.90E-07
3.10E-07
2.90E-07
3.30E-07
2.70E-07
2.80E-07
24-hr
Anneal
60
2.90E-07
2.90E-07
3.00E-07
3.20E-07
2.90E-07
3.20E-07
2.90E-07
3.10E-07
2.90E-07
3.30E-07
2.70E-07
2.80E-07
2.88E-07
1.30E-08
3.24E-07
2.52E-07
2.96E-07
1.52E-08
3.38E-07
2.54E-07
2.98E-07
1.30E-08
3.34E-07
2.62E-07
2.98E-07
1.30E-08
3.34E-07
2.62E-07
2.70E-07
1.22E-08
3.04E-07
2.36E-07
2.82E-07
1.64E-08
3.27E-07
2.37E-07
-5.83E-06
N/A
5.83E-06
N/A
2.96E-07
1.52E-08
3.38E-07
2.54E-07
-6.67E-06
N/A
6.67E-06
N/A
3.08E-07
1.79E-08
3.57E-07
2.59E-07
-7.50E-06
PASS
7.50E-06
PASS
3.08E-07
1.79E-08
3.57E-07
2.59E-07
-7.50E-06
PASS
7.50E-06
PASS
2.76E-07
1.52E-08
3.18E-07
2.34E-07
-7.50E-06
PASS
7.50E-06
PASS
Total Dose (krad(Si))
20
30
2.80E-07 2.80E-07
2.70E-07 2.80E-07
2.90E-07 2.90E-07
3.10E-07 3.10E-07
2.80E-07 2.80E-07
2.80E-07 3.00E-07
2.50E-07 2.60E-07
2.80E-07 2.90E-07
2.60E-07 2.70E-07
2.70E-07 2.90E-07
2.60E-07 2.70E-07
2.80E-07 2.80E-07
0
2.70E-07
2.60E-07
2.70E-07
2.90E-07
2.60E-07
2.70E-07
2.30E-07
2.70E-07
2.40E-07
2.50E-07
2.70E-07
2.80E-07
10
2.70E-07
2.70E-07
2.80E-07
3.00E-07
2.70E-07
2.80E-07
2.40E-07
2.80E-07
2.50E-07
2.60E-07
2.70E-07
2.80E-07
2.70E-07
1.22E-08
3.04E-07
2.36E-07
2.78E-07
1.30E-08
3.14E-07
2.42E-07
2.86E-07
1.52E-08
3.28E-07
2.44E-07
2.52E-07
1.79E-08
3.01E-07
2.03E-07
-4.00E-06
PASS
4.00E-06
PASS
2.62E-07
1.79E-08
3.11E-07
2.13E-07
-5.00E-06
PASS
5.00E-06
PASS
2.68E-07
1.30E-08
3.04E-07
2.32E-07
-5.00E-06
PASS
5.00E-06
PASS
An ISO 9001:2008 and DSCC Certified Company
191
168-hr
Anneal
70
2.70E-07
2.60E-07
2.70E-07
2.90E-07
2.60E-07
2.90E-07
2.60E-07
2.90E-07
2.60E-07
2.80E-07
2.60E-07
2.80E-07
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Negative Input Bias Current @5V #1 (A)
1.00E-05
8.00E-06
6.00E-06
4.00E-06
2.00E-06
0.00E+00
-2.00E-06
-4.00E-06
-6.00E-06
-8.00E-06
-1.00E-05
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.93. Plot of Negative Input Bias Current @5V #1 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
192
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.93. Raw data for Negative Input Bias Current @5V #1 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Negative Input Bias Current @5V #1 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
40
2.80E-07
2.90E-07
2.70E-07
2.90E-07
3.00E-07
3.00E-07
2.70E-07
3.00E-07
2.90E-07
3.00E-07
2.60E-07
2.70E-07
50
2.80E-07
3.00E-07
2.80E-07
2.90E-07
3.10E-07
3.10E-07
2.90E-07
3.20E-07
3.00E-07
3.20E-07
2.60E-07
2.70E-07
24-hr
Anneal
60
2.80E-07
3.00E-07
2.80E-07
2.90E-07
3.10E-07
3.10E-07
2.90E-07
3.10E-07
3.00E-07
3.30E-07
2.60E-07
2.70E-07
2.82E-07
1.30E-08
3.18E-07
2.46E-07
2.86E-07
1.14E-08
3.17E-07
2.55E-07
2.92E-07
1.30E-08
3.28E-07
2.56E-07
2.92E-07
1.30E-08
3.28E-07
2.56E-07
2.60E-07
1.58E-08
3.03E-07
2.17E-07
2.80E-07
1.58E-08
3.23E-07
2.37E-07
-5.83E-06
N/A
5.83E-06
N/A
2.92E-07
1.30E-08
3.28E-07
2.56E-07
-6.67E-06
N/A
6.67E-06
N/A
3.08E-07
1.30E-08
3.44E-07
2.72E-07
-7.50E-06
PASS
7.50E-06
PASS
3.08E-07
1.48E-08
3.49E-07
2.67E-07
-7.50E-06
PASS
7.50E-06
PASS
2.74E-07
1.34E-08
3.11E-07
2.37E-07
-7.50E-06
PASS
7.50E-06
PASS
Total Dose (krad(Si))
20
30
2.70E-07 2.70E-07
2.90E-07 2.90E-07
2.70E-07 2.70E-07
2.80E-07 2.80E-07
2.90E-07 3.00E-07
2.70E-07 2.90E-07
2.50E-07 2.60E-07
2.80E-07 3.00E-07
2.50E-07 2.70E-07
2.60E-07 2.80E-07
2.60E-07 2.60E-07
2.70E-07 2.70E-07
0
2.50E-07
2.80E-07
2.50E-07
2.60E-07
2.80E-07
2.60E-07
2.30E-07
2.70E-07
2.30E-07
2.30E-07
2.60E-07
2.70E-07
10
2.60E-07
2.80E-07
2.60E-07
2.70E-07
2.80E-07
2.70E-07
2.40E-07
2.80E-07
2.40E-07
2.50E-07
2.60E-07
2.70E-07
2.64E-07
1.52E-08
3.06E-07
2.22E-07
2.70E-07
1.00E-08
2.97E-07
2.43E-07
2.80E-07
1.00E-08
3.07E-07
2.53E-07
2.44E-07
1.95E-08
2.97E-07
1.91E-07
-4.00E-06
PASS
4.00E-06
PASS
2.56E-07
1.82E-08
3.06E-07
2.06E-07
-5.00E-06
PASS
5.00E-06
PASS
2.62E-07
1.30E-08
2.98E-07
2.26E-07
-5.00E-06
PASS
5.00E-06
PASS
An ISO 9001:2008 and DSCC Certified Company
193
168-hr
Anneal
70
2.50E-07
2.70E-07
2.40E-07
2.60E-07
2.80E-07
2.80E-07
2.60E-07
2.90E-07
2.60E-07
2.80E-07
2.60E-07
2.70E-07
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Negative Input Bias Current @5V #2 (A)
1.00E-05
8.00E-06
6.00E-06
4.00E-06
2.00E-06
0.00E+00
-2.00E-06
-4.00E-06
-6.00E-06
-8.00E-06
-1.00E-05
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.94. Plot of Negative Input Bias Current @5V #2 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
194
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.94. Raw data for Negative Input Bias Current @5V #2 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Negative Input Bias Current @5V #2 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
40
2.80E-07
2.80E-07
2.50E-07
3.00E-07
2.90E-07
2.90E-07
2.60E-07
2.70E-07
2.90E-07
3.00E-07
2.70E-07
2.70E-07
50
2.90E-07
2.80E-07
2.50E-07
3.00E-07
3.00E-07
3.00E-07
2.70E-07
2.80E-07
3.00E-07
3.10E-07
2.70E-07
2.70E-07
24-hr
Anneal
60
2.90E-07
2.80E-07
2.50E-07
3.00E-07
3.00E-07
3.00E-07
2.70E-07
2.80E-07
3.00E-07
3.10E-07
2.70E-07
2.70E-07
2.74E-07
1.52E-08
3.16E-07
2.32E-07
2.80E-07
1.87E-08
3.31E-07
2.29E-07
2.84E-07
2.07E-08
3.41E-07
2.27E-07
2.84E-07
2.07E-08
3.41E-07
2.27E-07
2.60E-07
1.87E-08
3.11E-07
2.09E-07
2.74E-07
2.19E-08
3.34E-07
2.14E-07
-5.83E-06
N/A
5.83E-06
N/A
2.82E-07
1.64E-08
3.27E-07
2.37E-07
-6.67E-06
N/A
6.67E-06
N/A
2.92E-07
1.64E-08
3.37E-07
2.47E-07
-7.50E-06
PASS
7.50E-06
PASS
2.92E-07
1.64E-08
3.37E-07
2.47E-07
-7.50E-06
PASS
7.50E-06
PASS
2.66E-07
1.82E-08
3.16E-07
2.16E-07
-7.50E-06
PASS
7.50E-06
PASS
Total Dose (krad(Si))
20
30
2.70E-07 2.80E-07
2.70E-07 2.70E-07
2.40E-07 2.50E-07
2.90E-07 2.90E-07
2.70E-07 2.80E-07
2.70E-07 2.80E-07
2.30E-07 2.40E-07
2.60E-07 2.70E-07
2.60E-07 2.80E-07
2.80E-07 3.00E-07
2.70E-07 2.70E-07
2.70E-07 2.70E-07
0
2.60E-07
2.60E-07
2.30E-07
2.80E-07
2.50E-07
2.50E-07
2.10E-07
2.50E-07
2.40E-07
2.80E-07
2.70E-07
2.70E-07
10
2.70E-07
2.60E-07
2.40E-07
2.80E-07
2.60E-07
2.60E-07
2.20E-07
2.60E-07
2.50E-07
2.80E-07
2.70E-07
2.70E-07
2.56E-07
1.82E-08
3.06E-07
2.06E-07
2.62E-07
1.48E-08
3.03E-07
2.21E-07
2.68E-07
1.79E-08
3.17E-07
2.19E-07
2.46E-07
2.51E-08
3.15E-07
1.77E-07
-4.00E-06
PASS
4.00E-06
PASS
2.54E-07
2.19E-08
3.14E-07
1.94E-07
-5.00E-06
PASS
5.00E-06
PASS
2.60E-07
1.87E-08
3.11E-07
2.09E-07
-5.00E-06
PASS
5.00E-06
PASS
An ISO 9001:2008 and DSCC Certified Company
195
168-hr
Anneal
70
2.70E-07
2.60E-07
2.30E-07
2.80E-07
2.60E-07
2.70E-07
2.40E-07
2.70E-07
2.60E-07
2.90E-07
2.70E-07
2.70E-07
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Negative Input Bias Current @5V #3 (A)
1.00E-05
8.00E-06
6.00E-06
4.00E-06
2.00E-06
0.00E+00
-2.00E-06
-4.00E-06
-6.00E-06
-8.00E-06
-1.00E-05
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.95. Plot of Negative Input Bias Current @5V #3 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
196
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.95. Raw data for Negative Input Bias Current @5V #3 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Negative Input Bias Current @5V #3 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
40
2.80E-07
2.90E-07
2.50E-07
3.10E-07
3.10E-07
3.00E-07
2.60E-07
2.90E-07
2.70E-07
3.10E-07
2.70E-07
2.70E-07
50
2.80E-07
2.90E-07
2.50E-07
3.10E-07
3.20E-07
3.10E-07
2.70E-07
2.90E-07
2.80E-07
3.20E-07
2.60E-07
2.70E-07
24-hr
Anneal
60
2.80E-07
2.90E-07
2.50E-07
3.10E-07
3.10E-07
3.10E-07
2.70E-07
2.90E-07
2.80E-07
3.30E-07
2.70E-07
2.70E-07
2.78E-07
2.49E-08
3.46E-07
2.10E-07
2.88E-07
2.49E-08
3.56E-07
2.20E-07
2.90E-07
2.74E-08
3.65E-07
2.15E-07
2.88E-07
2.49E-08
3.56E-07
2.20E-07
2.62E-07
2.49E-08
3.30E-07
1.94E-07
2.76E-07
1.82E-08
3.26E-07
2.26E-07
-5.83E-06
N/A
5.83E-06
N/A
2.86E-07
2.07E-08
3.43E-07
2.29E-07
-6.67E-06
N/A
6.67E-06
N/A
2.94E-07
2.07E-08
3.51E-07
2.37E-07
-7.50E-06
PASS
7.50E-06
PASS
2.96E-07
2.41E-08
3.62E-07
2.30E-07
-7.50E-06
PASS
7.50E-06
PASS
2.70E-07
2.00E-08
3.25E-07
2.15E-07
-7.50E-06
PASS
7.50E-06
PASS
Total Dose (krad(Si))
20
30
2.70E-07 2.70E-07
2.80E-07 2.80E-07
2.40E-07 2.40E-07
3.00E-07 3.00E-07
2.90E-07 3.00E-07
2.70E-07 2.80E-07
2.40E-07 2.50E-07
2.70E-07 2.80E-07
2.60E-07 2.70E-07
2.90E-07 3.00E-07
2.60E-07 2.70E-07
2.70E-07 2.70E-07
0
2.60E-07
2.70E-07
2.20E-07
2.80E-07
2.80E-07
2.60E-07
2.30E-07
2.70E-07
2.50E-07
2.80E-07
2.70E-07
2.70E-07
10
2.60E-07
2.70E-07
2.30E-07
2.90E-07
2.80E-07
2.60E-07
2.30E-07
2.70E-07
2.60E-07
2.90E-07
2.70E-07
2.70E-07
2.62E-07
2.49E-08
3.30E-07
1.94E-07
2.66E-07
2.30E-08
3.29E-07
2.03E-07
2.76E-07
2.30E-08
3.39E-07
2.13E-07
2.58E-07
1.92E-08
3.11E-07
2.05E-07
-4.00E-06
PASS
4.00E-06
PASS
2.62E-07
2.17E-08
3.21E-07
2.03E-07
-5.00E-06
PASS
5.00E-06
PASS
2.66E-07
1.82E-08
3.16E-07
2.16E-07
-5.00E-06
PASS
5.00E-06
PASS
An ISO 9001:2008 and DSCC Certified Company
197
168-hr
Anneal
70
2.60E-07
2.70E-07
2.20E-07
2.80E-07
2.80E-07
2.80E-07
2.40E-07
2.80E-07
2.60E-07
2.90E-07
2.60E-07
2.70E-07
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Negative Input Bias Current @5V #4 (A)
1.00E-05
8.00E-06
6.00E-06
4.00E-06
2.00E-06
0.00E+00
-2.00E-06
-4.00E-06
-6.00E-06
-8.00E-06
-1.00E-05
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.96. Plot of Negative Input Bias Current @5V #4 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
198
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.96. Raw data for Negative Input Bias Current @5V #4 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Negative Input Bias Current @5V #4 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
40
2.90E-07
2.90E-07
2.80E-07
3.00E-07
3.00E-07
2.90E-07
2.70E-07
2.90E-07
2.60E-07
3.10E-07
2.50E-07
2.80E-07
50
2.90E-07
3.00E-07
2.80E-07
3.00E-07
3.00E-07
3.00E-07
2.80E-07
3.00E-07
2.70E-07
3.40E-07
2.50E-07
2.70E-07
24-hr
Anneal
60
2.90E-07
3.00E-07
2.80E-07
3.00E-07
3.00E-07
3.00E-07
2.80E-07
3.00E-07
2.70E-07
3.40E-07
2.50E-07
2.70E-07
2.84E-07
8.94E-09
3.09E-07
2.59E-07
2.92E-07
8.37E-09
3.15E-07
2.69E-07
2.94E-07
8.94E-09
3.19E-07
2.69E-07
2.94E-07
8.94E-09
3.19E-07
2.69E-07
2.68E-07
1.10E-08
2.98E-07
2.38E-07
2.70E-07
2.12E-08
3.28E-07
2.12E-07
-5.83E-06
N/A
5.83E-06
N/A
2.84E-07
1.95E-08
3.37E-07
2.31E-07
-6.67E-06
N/A
6.67E-06
N/A
2.98E-07
2.68E-08
3.72E-07
2.24E-07
-7.50E-06
PASS
7.50E-06
PASS
2.98E-07
2.68E-08
3.72E-07
2.24E-07
-7.50E-06
PASS
7.50E-06
PASS
2.64E-07
2.07E-08
3.21E-07
2.07E-07
-7.50E-06
PASS
7.50E-06
PASS
Total Dose (krad(Si))
20
30
2.80E-07 2.80E-07
2.80E-07 2.90E-07
2.70E-07 2.70E-07
2.90E-07 2.90E-07
2.90E-07 2.90E-07
2.60E-07 2.70E-07
2.40E-07 2.50E-07
2.70E-07 2.80E-07
2.40E-07 2.50E-07
2.80E-07 3.00E-07
2.50E-07 2.50E-07
2.80E-07 2.80E-07
0
2.70E-07
2.70E-07
2.50E-07
2.70E-07
2.70E-07
2.40E-07
2.20E-07
2.60E-07
2.20E-07
2.50E-07
2.50E-07
2.80E-07
10
2.70E-07
2.70E-07
2.60E-07
2.80E-07
2.80E-07
2.50E-07
2.30E-07
2.70E-07
2.30E-07
2.60E-07
2.50E-07
2.80E-07
2.66E-07
8.94E-09
2.91E-07
2.41E-07
2.72E-07
8.37E-09
2.95E-07
2.49E-07
2.82E-07
8.37E-09
3.05E-07
2.59E-07
2.38E-07
1.79E-08
2.87E-07
1.89E-07
-4.00E-06
PASS
4.00E-06
PASS
2.48E-07
1.79E-08
2.97E-07
1.99E-07
-5.00E-06
PASS
5.00E-06
PASS
2.58E-07
1.79E-08
3.07E-07
2.09E-07
-5.00E-06
PASS
5.00E-06
PASS
An ISO 9001:2008 and DSCC Certified Company
199
168-hr
Anneal
70
2.70E-07
2.70E-07
2.50E-07
2.80E-07
2.70E-07
2.60E-07
2.50E-07
2.80E-07
2.40E-07
2.90E-07
2.50E-07
2.70E-07
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Common Mode Rejection Ratio @5V #1 (dB)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.97. Plot of Common Mode Rejection Ratio @5V #1 (dB) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.97. Raw data for Common Mode Rejection Ratio @5V #1 (dB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Common Mode Rejection Ratio @5V #1 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
9.66E+01
7.75E+01
8.11E+01
8.73E+01
8.76E+01
9.51E+01
9.62E+01
9.57E+01
9.65E+01
9.62E+01
9.56E+01
9.80E+01
24-hr
Anneal
60
9.75E+01
7.80E+01
7.97E+01
8.54E+01
8.42E+01
9.51E+01
9.61E+01
9.58E+01
9.64E+01
9.62E+01
9.55E+01
9.81E+01
168-hr
Anneal
70
9.53E+01
7.63E+01
7.45E+01
8.04E+01
8.32E+01
9.55E+01
9.68E+01
9.59E+01
9.70E+01
9.67E+01
9.55E+01
9.81E+01
0
9.64E+01
9.58E+01
9.71E+01
9.77E+01
9.68E+01
9.58E+01
9.73E+01
9.62E+01
9.75E+01
9.72E+01
9.56E+01
9.80E+01
10
9.61E+01
8.66E+01
8.80E+01
9.03E+01
8.95E+01
9.58E+01
9.71E+01
9.62E+01
9.73E+01
9.71E+01
9.56E+01
9.80E+01
Total Dose (krad(Si))
20
30
9.41E+01 9.56E+01
7.83E+01 7.88E+01
8.83E+01 9.74E+01
8.90E+01 1.06E+02
9.00E+01 1.12E+02
9.57E+01 9.54E+01
9.68E+01 9.68E+01
9.60E+01 9.59E+01
9.71E+01 9.70E+01
9.69E+01 9.65E+01
9.55E+01 9.55E+01
9.80E+01 9.80E+01
9.67E+01
7.30E-01
9.87E+01
9.47E+01
9.01E+01
3.64E+00
1.00E+02
8.01E+01
8.79E+01
5.85E+00
1.04E+02
7.19E+01
9.79E+01
1.26E+01
1.32E+02
6.35E+01
9.11E+01
9.04E+00
1.16E+02
6.63E+01
8.60E+01
7.31E+00
1.06E+02
6.60E+01
8.49E+01
7.66E+00
1.06E+02
6.39E+01
8.19E+01
8.21E+00
1.04E+02
5.94E+01
9.68E+01
7.51E-01
9.88E+01
9.47E+01
7.30E+01
PASS
9.67E+01
6.56E-01
9.85E+01
9.49E+01
7.10E+01
PASS
9.65E+01
6.26E-01
9.82E+01
9.48E+01
7.10E+01
PASS
9.63E+01
6.60E-01
9.81E+01
9.45E+01
6.73E+01
N/A
9.62E+01
5.67E-01
9.77E+01
9.46E+01
6.37E+01
N/A
9.59E+01
5.39E-01
9.74E+01
9.45E+01
6.00E+01
PASS
9.59E+01
5.18E-01
9.74E+01
9.45E+01
6.00E+01
PASS
9.64E+01
6.57E-01
9.82E+01
9.46E+01
6.00E+01
PASS
40
9.52E+01
7.75E+01
8.62E+01
9.83E+01
9.81E+01
9.54E+01
9.66E+01
9.58E+01
9.66E+01
9.65E+01
9.57E+01
9.79E+01
An ISO 9001:2008 and DSCC Certified Company
201
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Common Mode Rejection Ratio @5V #2 (dB)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.98. Plot of Common Mode Rejection Ratio @5V #2 (dB) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
202
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.98. Raw data for Common Mode Rejection Ratio @5V #2 (dB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Common Mode Rejection Ratio @5V #2 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
9.64E+01
8.21E+01
9.17E+01
9.09E+01
9.90E+01
9.69E+01
9.65E+01
9.61E+01
9.66E+01
9.56E+01
9.56E+01
9.70E+01
24-hr
Anneal
60
9.71E+01
8.09E+01
8.65E+01
8.79E+01
1.08E+02
9.70E+01
9.63E+01
9.61E+01
9.66E+01
9.56E+01
9.56E+01
9.71E+01
168-hr
Anneal
70
9.57E+01
7.95E+01
7.88E+01
7.87E+01
7.89E+01
9.75E+01
9.69E+01
9.64E+01
9.70E+01
9.58E+01
9.56E+01
9.71E+01
0
9.67E+01
9.45E+01
9.68E+01
9.81E+01
9.63E+01
9.79E+01
9.72E+01
9.66E+01
9.75E+01
9.61E+01
9.57E+01
9.70E+01
10
9.65E+01
8.71E+01
8.89E+01
8.92E+01
8.83E+01
9.79E+01
9.72E+01
9.66E+01
9.76E+01
9.60E+01
9.57E+01
9.72E+01
Total Dose (krad(Si))
20
30
9.43E+01 9.54E+01
8.61E+01 1.19E+02
8.42E+01 9.25E+01
8.54E+01 9.41E+01
8.38E+01 8.63E+01
9.78E+01 9.74E+01
9.69E+01 9.69E+01
9.65E+01 9.63E+01
9.72E+01 9.70E+01
9.59E+01 9.58E+01
9.57E+01 9.57E+01
9.71E+01 9.70E+01
9.65E+01
1.31E+00
1.00E+02
9.29E+01
9.00E+01
3.72E+00
1.00E+02
7.98E+01
8.67E+01
4.30E+00
9.85E+01
7.49E+01
9.74E+01
1.24E+01
1.31E+02
6.34E+01
1.06E+02
2.56E+01
1.76E+02
3.55E+01
9.20E+01
6.46E+00
1.10E+02
7.43E+01
9.20E+01
1.05E+01
1.21E+02
6.31E+01
8.23E+01
7.50E+00
1.03E+02
6.17E+01
9.71E+01
7.21E-01
9.91E+01
9.51E+01
7.30E+01
PASS
9.71E+01
7.44E-01
9.91E+01
9.50E+01
7.10E+01
PASS
9.69E+01
6.99E-01
9.88E+01
9.49E+01
7.10E+01
PASS
9.67E+01
6.45E-01
9.84E+01
9.49E+01
6.73E+01
N/A
9.65E+01
5.66E-01
9.80E+01
9.49E+01
6.37E+01
N/A
9.63E+01
4.97E-01
9.77E+01
9.49E+01
6.00E+01
PASS
9.63E+01
5.41E-01
9.78E+01
9.48E+01
6.00E+01
PASS
9.67E+01
6.11E-01
9.84E+01
9.50E+01
6.00E+01
PASS
40
9.45E+01
9.13E+01
1.50E+02
1.05E+02
8.74E+01
9.71E+01
9.66E+01
9.63E+01
9.68E+01
9.57E+01
9.56E+01
9.71E+01
An ISO 9001:2008 and DSCC Certified Company
203
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Common Mode Rejection Ratio @5V #3 (dB)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.99. Plot of Common Mode Rejection Ratio @5V #3 (dB) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
204
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.99. Raw data for Common Mode Rejection Ratio @5V #3 (dB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Common Mode Rejection Ratio @5V #3 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
9.58E+01
9.09E+01
7.62E+01
8.84E+01
8.60E+01
9.57E+01
9.72E+01
9.64E+01
9.71E+01
9.48E+01
9.59E+01
9.61E+01
24-hr
Anneal
60
9.65E+01
8.74E+01
7.51E+01
8.58E+01
8.30E+01
9.56E+01
9.71E+01
9.66E+01
9.74E+01
9.48E+01
9.59E+01
9.61E+01
168-hr
Anneal
70
9.60E+01
7.66E+01
7.93E+01
7.92E+01
8.37E+01
9.61E+01
9.78E+01
9.69E+01
9.79E+01
9.52E+01
9.61E+01
9.60E+01
0
9.70E+01
9.60E+01
9.85E+01
9.63E+01
9.71E+01
9.65E+01
9.82E+01
9.70E+01
9.81E+01
9.55E+01
9.60E+01
9.62E+01
10
9.67E+01
8.70E+01
8.99E+01
8.89E+01
9.01E+01
9.63E+01
9.80E+01
9.71E+01
9.81E+01
9.54E+01
9.60E+01
9.61E+01
Total Dose (krad(Si))
20
30
9.46E+01 9.58E+01
8.32E+01 8.90E+01
9.35E+01 8.62E+01
8.75E+01 9.81E+01
8.99E+01 9.96E+01
9.62E+01 9.60E+01
9.79E+01 9.77E+01
9.68E+01 9.69E+01
9.78E+01 9.77E+01
9.53E+01 9.52E+01
9.59E+01 9.60E+01
9.60E+01 9.61E+01
9.70E+01
9.86E-01
9.97E+01
9.43E+01
9.05E+01
3.66E+00
1.01E+02
8.05E+01
8.97E+01
4.63E+00
1.02E+02
7.71E+01
9.38E+01
5.86E+00
1.10E+02
7.77E+01
9.32E+01
7.64E+00
1.14E+02
7.23E+01
8.75E+01
7.28E+00
1.07E+02
6.75E+01
8.56E+01
7.73E+00
1.07E+02
6.44E+01
8.30E+01
7.74E+00
1.04E+02
6.17E+01
9.71E+01
1.16E+00
1.00E+02
9.39E+01
7.30E+01
PASS
9.70E+01
1.14E+00
1.00E+02
9.38E+01
7.10E+01
PASS
9.68E+01
1.11E+00
9.98E+01
9.37E+01
7.10E+01
PASS
9.67E+01
1.10E+00
9.97E+01
9.37E+01
6.73E+01
N/A
9.65E+01
1.02E+00
9.93E+01
9.37E+01
6.37E+01
N/A
9.63E+01
1.00E+00
9.90E+01
9.35E+01
6.00E+01
PASS
9.63E+01
1.09E+00
9.93E+01
9.33E+01
6.00E+01
PASS
9.68E+01
1.14E+00
9.99E+01
9.36E+01
6.00E+01
PASS
40
9.45E+01
9.35E+01
8.04E+01
9.96E+01
9.83E+01
9.59E+01
9.74E+01
9.65E+01
9.75E+01
9.51E+01
9.60E+01
9.61E+01
An ISO 9001:2008 and DSCC Certified Company
205
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Common Mode Rejection Ratio @5V #4 (dB)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.100. Plot of Common Mode Rejection Ratio @5V #4 (dB) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
206
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.100. Raw data for Common Mode Rejection Ratio @5V #4 (dB) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Common Mode Rejection Ratio @5V #4 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
9.38E+01
8.39E+01
9.29E+01
9.75E+01
8.69E+01
9.63E+01
9.79E+01
9.61E+01
9.71E+01
9.64E+01
9.63E+01
9.65E+01
24-hr
Anneal
60
9.46E+01
8.15E+01
8.81E+01
9.20E+01
8.94E+01
9.64E+01
9.78E+01
9.61E+01
9.69E+01
9.66E+01
9.63E+01
9.65E+01
168-hr
Anneal
70
9.38E+01
7.84E+01
7.52E+01
7.94E+01
7.69E+01
9.67E+01
9.83E+01
9.63E+01
9.75E+01
9.70E+01
9.61E+01
9.65E+01
0
9.48E+01
9.77E+01
9.64E+01
9.79E+01
9.56E+01
9.71E+01
9.89E+01
9.66E+01
9.80E+01
9.73E+01
9.62E+01
9.64E+01
10
9.45E+01
8.89E+01
8.74E+01
8.91E+01
8.76E+01
9.70E+01
9.86E+01
9.66E+01
9.78E+01
9.73E+01
9.62E+01
9.64E+01
Total Dose (krad(Si))
20
30
9.26E+01 9.31E+01
8.78E+01 1.16E+02
8.42E+01 9.04E+01
8.47E+01 8.88E+01
8.18E+01 8.34E+01
9.70E+01 9.69E+01
9.84E+01 9.82E+01
9.66E+01 9.64E+01
9.77E+01 9.75E+01
9.70E+01 9.67E+01
9.62E+01 9.63E+01
9.65E+01 9.64E+01
9.65E+01
1.35E+00
1.00E+02
9.28E+01
8.95E+01
2.88E+00
9.74E+01
8.16E+01
8.62E+01
4.16E+00
9.76E+01
7.48E+01
9.44E+01
1.27E+01
1.29E+02
5.95E+01
9.33E+01
6.85E+00
1.12E+02
7.46E+01
9.10E+01
5.51E+00
1.06E+02
7.59E+01
8.91E+01
4.93E+00
1.03E+02
7.56E+01
8.07E+01
7.46E+00
1.01E+02
6.03E+01
9.76E+01
8.77E-01
1.00E+02
9.52E+01
7.30E+01
PASS
9.75E+01
7.75E-01
9.96E+01
9.53E+01
7.10E+01
PASS
9.73E+01
7.37E-01
9.93E+01
9.53E+01
7.10E+01
PASS
9.71E+01
7.36E-01
9.92E+01
9.51E+01
6.73E+01
N/A
9.70E+01
7.15E-01
9.89E+01
9.50E+01
6.37E+01
N/A
9.68E+01
7.27E-01
9.88E+01
9.48E+01
6.00E+01
PASS
9.67E+01
6.38E-01
9.85E+01
9.50E+01
6.00E+01
PASS
9.71E+01
7.89E-01
9.93E+01
9.50E+01
6.00E+01
PASS
40
9.26E+01
9.32E+01
9.82E+01
1.00E+02
8.25E+01
9.66E+01
9.80E+01
9.62E+01
9.73E+01
9.67E+01
9.63E+01
9.65E+01
An ISO 9001:2008 and DSCC Certified Company
207
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Large Signal Voltage Gain @5V RL=500 #1 (V/mV)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
3.50E+00
3.00E+00
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.101. Plot of Large Signal Voltage Gain @5V RL=500 #1 (V/mV) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
208
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.101. Raw data for Large Signal Voltage Gain @5V RL=500 #1 (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Large Signal Voltage Gain @5V RL=500 #1 (V/mV)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.30E+00
1.20E+00
1.30E+00
1.20E+00
1.30E+00
2.70E+00
3.10E+00
2.70E+00
2.80E+00
2.70E+00
3.00E+00
3.00E+00
24-hr
Anneal
60
1.40E+00
1.20E+00
1.30E+00
1.30E+00
1.30E+00
2.70E+00
3.10E+00
2.70E+00
2.80E+00
2.70E+00
3.00E+00
3.00E+00
168-hr
Anneal
70
2.70E+00
2.30E+00
2.30E+00
2.30E+00
2.40E+00
2.80E+00
3.30E+00
2.80E+00
3.00E+00
2.90E+00
2.90E+00
3.00E+00
0
2.92E+00
3.04E+00
2.96E+00
2.99E+00
3.03E+00
2.97E+00
3.47E+00
2.95E+00
3.13E+00
3.05E+00
2.95E+00
2.96E+00
10
2.85E+00
2.83E+00
2.83E+00
2.81E+00
2.83E+00
2.94E+00
3.39E+00
2.92E+00
3.10E+00
3.00E+00
2.93E+00
2.95E+00
Total Dose (krad(Si))
20
30
2.00E+00 1.60E+00
1.80E+00 1.50E+00
2.00E+00 1.60E+00
1.90E+00 1.60E+00
1.90E+00 1.60E+00
2.90E+00 2.80E+00
3.30E+00 3.30E+00
2.90E+00 2.80E+00
3.00E+00 3.00E+00
2.90E+00 2.80E+00
2.90E+00 3.00E+00
3.00E+00 3.00E+00
2.99E+00
4.79E-02
3.12E+00
2.86E+00
2.83E+00
1.39E-02
2.87E+00
2.79E+00
1.92E+00
8.37E-02
2.15E+00
1.69E+00
1.58E+00
4.47E-02
1.70E+00
1.46E+00
1.34E+00
5.48E-02
1.49E+00
1.19E+00
1.26E+00
5.48E-02
1.41E+00
1.11E+00
1.30E+00
7.07E-02
1.49E+00
1.11E+00
2.40E+00
1.73E-01
2.87E+00
1.93E+00
3.11E+00
2.10E-01
3.69E+00
2.54E+00
1.00E+00
PASS
3.07E+00
1.94E-01
3.60E+00
2.54E+00
9.00E-01
PASS
3.00E+00
1.73E-01
3.47E+00
2.53E+00
8.00E-01
PASS
2.94E+00
2.19E-01
3.54E+00
2.34E+00
7.33E-01
N/A
2.90E+00
1.73E-01
3.37E+00
2.43E+00
6.67E-01
N/A
2.80E+00
1.73E-01
3.27E+00
2.33E+00
6.00E-01
PASS
2.80E+00
1.73E-01
3.27E+00
2.33E+00
6.00E-01
PASS
2.96E+00
2.07E-01
3.53E+00
2.39E+00
6.00E-01
PASS
40
1.30E+00
1.30E+00
1.40E+00
1.30E+00
1.40E+00
2.80E+00
3.20E+00
2.80E+00
2.90E+00
2.80E+00
2.90E+00
3.00E+00
An ISO 9001:2008 and DSCC Certified Company
209
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Large Signal Voltage Gain @5V RL=500 #2 (V/mV)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
3.50E+00
3.00E+00
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.102. Plot of Large Signal Voltage Gain @5V RL=500 #2 (V/mV) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
210
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.102. Raw data for Large Signal Voltage Gain @5V RL=500 #2 (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Large Signal Voltage Gain @5V RL=500 #2 (V/mV)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.30E+00
1.10E+00
1.40E+00
1.20E+00
1.50E+00
2.70E+00
3.00E+00
2.70E+00
2.70E+00
2.80E+00
2.90E+00
2.90E+00
24-hr
Anneal
60
1.40E+00
1.10E+00
1.40E+00
1.20E+00
1.50E+00
2.70E+00
3.00E+00
2.80E+00
2.70E+00
2.80E+00
2.90E+00
2.90E+00
168-hr
Anneal
70
2.70E+00
2.20E+00
2.20E+00
2.30E+00
2.60E+00
2.80E+00
3.20E+00
2.80E+00
2.80E+00
2.90E+00
2.90E+00
2.90E+00
0
2.95E+00
3.00E+00
2.97E+00
2.97E+00
3.07E+00
3.00E+00
3.31E+00
2.94E+00
2.98E+00
3.04E+00
2.86E+00
2.89E+00
10
2.87E+00
2.82E+00
2.84E+00
2.78E+00
2.92E+00
2.95E+00
3.28E+00
2.91E+00
2.93E+00
3.00E+00
2.85E+00
2.88E+00
Total Dose (krad(Si))
20
30
2.00E+00 1.60E+00
1.70E+00 1.40E+00
2.10E+00 1.70E+00
1.80E+00 1.50E+00
2.10E+00 1.80E+00
2.90E+00 2.80E+00
3.20E+00 3.10E+00
2.90E+00 2.80E+00
2.90E+00 2.80E+00
3.00E+00 2.90E+00
2.80E+00 2.90E+00
2.90E+00 2.90E+00
2.99E+00
4.99E-02
3.13E+00
2.85E+00
2.85E+00
5.11E-02
2.99E+00
2.71E+00
1.94E+00
1.82E-01
2.44E+00
1.44E+00
1.60E+00
1.58E-01
2.03E+00
1.17E+00
1.38E+00
1.64E-01
1.83E+00
9.29E-01
1.30E+00
1.58E-01
1.73E+00
8.66E-01
1.32E+00
1.64E-01
1.77E+00
8.69E-01
2.40E+00
2.35E-01
3.04E+00
1.76E+00
3.05E+00
1.50E-01
3.46E+00
2.64E+00
1.00E+00
PASS
3.01E+00
1.51E-01
3.43E+00
2.60E+00
9.00E-01
PASS
2.98E+00
1.30E-01
3.34E+00
2.62E+00
8.00E-01
PASS
2.88E+00
1.30E-01
3.24E+00
2.52E+00
7.33E-01
N/A
2.84E+00
1.52E-01
3.26E+00
2.42E+00
6.67E-01
N/A
2.78E+00
1.30E-01
3.14E+00
2.42E+00
6.00E-01
PASS
2.80E+00
1.22E-01
3.14E+00
2.46E+00
6.00E-01
PASS
2.90E+00
1.73E-01
3.37E+00
2.43E+00
6.00E-01
PASS
40
1.30E+00
1.20E+00
1.50E+00
1.30E+00
1.60E+00
2.80E+00
3.10E+00
2.80E+00
2.70E+00
2.80E+00
2.80E+00
2.90E+00
An ISO 9001:2008 and DSCC Certified Company
211
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Large Signal Voltage Gain @5V RL=500 #3 (V/mV)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
3.50E+00
3.00E+00
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.103. Plot of Large Signal Voltage Gain @5V RL=500 #3 (V/mV) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
212
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.103. Raw data for Large Signal Voltage Gain @5V RL=500 #3 (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Large Signal Voltage Gain @5V RL=500 #3 (V/mV)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.40E+00
1.10E+00
1.40E+00
1.20E+00
1.50E+00
2.90E+00
3.00E+00
2.70E+00
2.70E+00
2.80E+00
2.90E+00
2.90E+00
24-hr
Anneal
60
1.50E+00
1.20E+00
1.40E+00
1.20E+00
1.50E+00
2.90E+00
3.00E+00
2.80E+00
2.70E+00
2.80E+00
2.90E+00
2.90E+00
168-hr
Anneal
70
2.90E+00
2.10E+00
2.20E+00
2.30E+00
2.50E+00
3.00E+00
3.20E+00
2.80E+00
2.80E+00
2.90E+00
2.90E+00
2.90E+00
0
3.08E+00
2.91E+00
2.97E+00
3.06E+00
3.05E+00
3.15E+00
3.37E+00
2.95E+00
2.97E+00
3.06E+00
2.85E+00
2.87E+00
10
3.03E+00
2.70E+00
2.85E+00
2.88E+00
2.91E+00
3.10E+00
3.32E+00
2.93E+00
2.92E+00
3.01E+00
2.85E+00
2.86E+00
Total Dose (krad(Si))
20
30
2.20E+00 1.70E+00
1.70E+00 1.40E+00
2.10E+00 1.70E+00
1.80E+00 1.50E+00
2.10E+00 1.80E+00
3.00E+00 3.00E+00
3.30E+00 3.20E+00
2.90E+00 2.80E+00
2.90E+00 2.80E+00
3.00E+00 2.90E+00
2.90E+00 2.80E+00
2.90E+00 2.90E+00
3.01E+00
7.23E-02
3.21E+00
2.82E+00
2.87E+00
1.16E-01
3.19E+00
2.56E+00
1.98E+00
2.17E-01
2.57E+00
1.39E+00
1.62E+00
1.64E-01
2.07E+00
1.17E+00
1.40E+00
1.58E-01
1.83E+00
9.66E-01
1.32E+00
1.64E-01
1.77E+00
8.69E-01
1.36E+00
1.52E-01
1.78E+00
9.44E-01
2.40E+00
3.16E-01
3.27E+00
1.53E+00
3.10E+00
1.69E-01
3.56E+00
2.64E+00
1.00E+00
PASS
3.06E+00
1.66E-01
3.51E+00
2.60E+00
9.00E-01
PASS
3.02E+00
1.64E-01
3.47E+00
2.57E+00
8.00E-01
PASS
2.94E+00
1.67E-01
3.40E+00
2.48E+00
7.33E-01
N/A
2.88E+00
1.48E-01
3.29E+00
2.47E+00
6.67E-01
N/A
2.82E+00
1.30E-01
3.18E+00
2.46E+00
6.00E-01
PASS
2.84E+00
1.14E-01
3.15E+00
2.53E+00
6.00E-01
PASS
2.94E+00
1.67E-01
3.40E+00
2.48E+00
6.00E-01
PASS
40
1.40E+00
1.20E+00
1.50E+00
1.30E+00
1.60E+00
2.90E+00
3.10E+00
2.80E+00
2.70E+00
2.90E+00
2.90E+00
2.90E+00
An ISO 9001:2008 and DSCC Certified Company
213
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Large Signal Voltage Gain @5V RL=500 #4 (V/mV)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
3.50E+00
3.00E+00
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.104. Plot of Large Signal Voltage Gain @5V RL=500 #4 (V/mV) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
214
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.104. Raw data for Large Signal Voltage Gain @5V RL=500 #4 (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Large Signal Voltage Gain @5V RL=500 #4 (V/mV)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.30E+00
1.10E+00
1.30E+00
1.20E+00
1.40E+00
2.70E+00
3.00E+00
2.70E+00
2.70E+00
2.70E+00
3.00E+00
3.00E+00
24-hr
Anneal
60
1.40E+00
1.10E+00
1.40E+00
1.30E+00
1.40E+00
2.70E+00
3.10E+00
2.70E+00
2.70E+00
2.80E+00
3.00E+00
3.00E+00
168-hr
Anneal
70
2.70E+00
2.20E+00
2.20E+00
2.30E+00
2.40E+00
2.80E+00
3.20E+00
2.80E+00
2.80E+00
2.90E+00
3.00E+00
3.00E+00
0
2.91E+00
3.04E+00
2.91E+00
2.95E+00
3.00E+00
3.00E+00
3.40E+00
2.94E+00
2.99E+00
3.07E+00
2.99E+00
2.95E+00
10
2.85E+00
2.85E+00
2.76E+00
2.80E+00
2.82E+00
2.96E+00
3.35E+00
2.92E+00
2.93E+00
3.03E+00
2.98E+00
2.94E+00
Total Dose (krad(Si))
20
30
2.00E+00 1.60E+00
1.70E+00 1.40E+00
1.90E+00 1.60E+00
1.90E+00 1.60E+00
2.00E+00 1.70E+00
2.90E+00 2.80E+00
3.30E+00 3.20E+00
2.90E+00 2.80E+00
2.90E+00 2.80E+00
2.90E+00 2.90E+00
3.00E+00 3.00E+00
3.00E+00 2.90E+00
2.96E+00
5.96E-02
3.12E+00
2.80E+00
2.82E+00
3.65E-02
2.92E+00
2.72E+00
1.90E+00
1.22E-01
2.24E+00
1.56E+00
1.58E+00
1.10E-01
1.88E+00
1.28E+00
1.34E+00
1.14E-01
1.65E+00
1.03E+00
1.26E+00
1.14E-01
1.57E+00
9.47E-01
1.32E+00
1.30E-01
1.68E+00
9.62E-01
2.36E+00
2.07E-01
2.93E+00
1.79E+00
3.08E+00
1.84E-01
3.58E+00
2.57E+00
1.00E+00
PASS
3.04E+00
1.79E-01
3.53E+00
2.55E+00
9.00E-01
PASS
2.98E+00
1.79E-01
3.47E+00
2.49E+00
8.00E-01
PASS
2.90E+00
1.73E-01
3.37E+00
2.43E+00
7.33E-01
N/A
2.86E+00
1.34E-01
3.23E+00
2.49E+00
6.67E-01
N/A
2.76E+00
1.34E-01
3.13E+00
2.39E+00
6.00E-01
PASS
2.80E+00
1.73E-01
3.27E+00
2.33E+00
6.00E-01
PASS
2.90E+00
1.73E-01
3.37E+00
2.43E+00
6.00E-01
PASS
40
1.30E+00
1.20E+00
1.40E+00
1.30E+00
1.50E+00
2.80E+00
3.10E+00
2.80E+00
2.80E+00
2.80E+00
3.00E+00
2.90E+00
An ISO 9001:2008 and DSCC Certified Company
215
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Large Signal Voltage Gain @5V RL=100 #1 (V/mV)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
3.00E+00
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.105. Plot of Large Signal Voltage Gain @5V RL=100 #1 (V/mV) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
216
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.105. Raw data for Large Signal Voltage Gain @5V RL=100 #1 (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Large Signal Voltage Gain @5V RL=100 #1 (V/mV)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
40
7.00E-01
7.00E-01
8.00E-01
7.00E-01
8.00E-01
2.20E+00
2.50E+00
2.20E+00
2.30E+00
2.30E+00
2.40E+00
2.40E+00
50
7.00E-01
7.00E-01
7.00E-01
7.00E-01
7.00E-01
2.20E+00
2.50E+00
2.10E+00
2.30E+00
2.20E+00
2.40E+00
2.40E+00
24-hr
Anneal
60
7.00E-01
7.00E-01
7.00E-01
7.00E-01
7.00E-01
2.20E+00
2.50E+00
2.20E+00
2.30E+00
2.20E+00
2.40E+00
2.40E+00
8.40E-01
5.48E-02
9.90E-01
6.90E-01
7.40E-01
5.48E-02
8.90E-01
5.90E-01
7.00E-01
0.00E+00
7.00E-01
7.00E-01
7.00E-01
0.00E+00
7.00E-01
7.00E-01
1.50E+00
1.22E-01
1.84E+00
1.16E+00
2.36E+00
1.52E-01
2.78E+00
1.94E+00
5.17E-01
N/A
2.30E+00
1.22E-01
2.64E+00
1.96E+00
4.83E-01
N/A
2.26E+00
1.52E-01
2.68E+00
1.84E+00
4.50E-01
PASS
2.28E+00
1.30E-01
2.64E+00
1.92E+00
4.50E-01
PASS
2.44E+00
1.67E-01
2.90E+00
1.98E+00
4.50E-01
PASS
0
2.42E+00
2.53E+00
2.43E+00
2.46E+00
2.49E+00
2.47E+00
2.82E+00
2.44E+00
2.63E+00
2.50E+00
2.42E+00
2.43E+00
10
2.07E+00
1.88E+00
2.01E+00
1.90E+00
1.94E+00
2.43E+00
2.78E+00
2.39E+00
2.58E+00
2.46E+00
2.42E+00
2.43E+00
Total Dose (krad(Si))
20
30
1.00E+00 8.00E-01
9.00E-01 8.00E-01
1.00E+00 9.00E-01
9.00E-01 8.00E-01
1.00E+00 9.00E-01
2.30E+00 2.30E+00
2.70E+00 2.60E+00
2.30E+00 2.20E+00
2.50E+00 2.40E+00
2.40E+00 2.30E+00
2.40E+00 2.40E+00
2.40E+00 2.40E+00
2.47E+00
4.75E-02
2.60E+00
2.34E+00
1.96E+00
7.76E-02
2.17E+00
1.75E+00
9.60E-01
5.48E-02
1.11E+00
8.10E-01
2.57E+00
1.59E-01
3.01E+00
2.13E+00
7.00E-01
PASS
2.53E+00
1.59E-01
2.96E+00
2.09E+00
6.00E-01
PASS
2.44E+00
1.67E-01
2.90E+00
1.98E+00
5.50E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
217
168-hr
Anneal
70
1.70E+00
1.40E+00
1.40E+00
1.50E+00
1.50E+00
2.40E+00
2.70E+00
2.30E+00
2.50E+00
2.30E+00
2.40E+00
2.40E+00
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Large Signal Voltage Gain @5V RL=100 #2 (V/mV)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
3.00E+00
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.106. Plot of Large Signal Voltage Gain @5V RL=100 #2 (V/mV) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
218
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.106. Raw data for Large Signal Voltage Gain @5V RL=100 #2 (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Large Signal Voltage Gain @5V RL=100 #2 (V/mV)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
7.00E-01
6.00E-01
7.00E-01
7.00E-01
9.00E-01
2.20E+00
2.40E+00
2.20E+00
2.10E+00
2.20E+00
2.40E+00
2.40E+00
24-hr
Anneal
60
7.00E-01
6.00E-01
8.00E-01
7.00E-01
9.00E-01
2.20E+00
2.40E+00
2.20E+00
2.20E+00
2.30E+00
2.40E+00
2.40E+00
168-hr
Anneal
70
1.70E+00
1.40E+00
1.40E+00
1.40E+00
1.70E+00
2.30E+00
2.60E+00
2.30E+00
2.30E+00
2.40E+00
2.40E+00
2.40E+00
0
2.42E+00
2.50E+00
2.43E+00
2.43E+00
2.53E+00
2.47E+00
2.71E+00
2.42E+00
2.46E+00
2.53E+00
2.35E+00
2.37E+00
10
2.10E+00
1.93E+00
2.08E+00
1.86E+00
2.07E+00
2.44E+00
2.67E+00
2.39E+00
2.42E+00
2.50E+00
2.35E+00
2.38E+00
Total Dose (krad(Si))
20
30
1.00E+00 8.00E-01
9.00E-01 7.00E-01
1.10E+00 9.00E-01
9.00E-01 8.00E-01
1.10E+00 1.00E+00
2.40E+00 2.30E+00
2.60E+00 2.50E+00
2.30E+00 2.30E+00
2.30E+00 2.30E+00
2.40E+00 2.30E+00
2.30E+00 2.30E+00
2.40E+00 2.40E+00
2.46E+00
5.00E-02
2.60E+00
2.32E+00
2.01E+00
1.05E-01
2.30E+00
1.72E+00
1.00E+00
1.00E-01
1.27E+00
7.26E-01
8.40E-01
1.14E-01
1.15E+00
5.27E-01
7.40E-01
1.14E-01
1.05E+00
4.27E-01
7.20E-01
1.10E-01
1.02E+00
4.20E-01
7.40E-01
1.14E-01
1.05E+00
4.27E-01
1.52E+00
1.64E-01
1.97E+00
1.07E+00
2.52E+00
1.15E-01
2.84E+00
2.20E+00
7.00E-01
PASS
2.48E+00
1.13E-01
2.79E+00
2.17E+00
6.00E-01
PASS
2.40E+00
1.22E-01
2.74E+00
2.06E+00
5.50E-01
PASS
2.34E+00
8.94E-02
2.59E+00
2.09E+00
5.17E-01
N/A
2.28E+00
1.30E-01
2.64E+00
1.92E+00
4.83E-01
N/A
2.22E+00
1.10E-01
2.52E+00
1.92E+00
4.50E-01
PASS
2.26E+00
8.94E-02
2.51E+00
2.01E+00
4.50E-01
PASS
2.38E+00
1.30E-01
2.74E+00
2.02E+00
4.50E-01
PASS
40
7.00E-01
6.00E-01
8.00E-01
7.00E-01
9.00E-01
2.20E+00
2.50E+00
2.20E+00
2.20E+00
2.30E+00
2.30E+00
2.40E+00
An ISO 9001:2008 and DSCC Certified Company
219
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Large Signal Voltage Gain @5V RL=100 #3 (V/mV)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
3.00E+00
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.107. Plot of Large Signal Voltage Gain @5V RL=100 #3 (V/mV) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
220
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.107. Raw data for Large Signal Voltage Gain @5V RL=100 #3 (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Large Signal Voltage Gain @5V RL=100 #3 (V/mV)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
7.00E-01
6.00E-01
8.00E-01
7.00E-01
8.00E-01
2.30E+00
2.40E+00
2.20E+00
2.10E+00
2.20E+00
2.40E+00
2.40E+00
24-hr
Anneal
60
8.00E-01
7.00E-01
8.00E-01
7.00E-01
8.00E-01
2.30E+00
2.50E+00
2.20E+00
2.20E+00
2.30E+00
2.40E+00
2.40E+00
168-hr
Anneal
70
1.80E+00
1.30E+00
1.50E+00
1.40E+00
1.70E+00
2.50E+00
2.60E+00
2.30E+00
2.30E+00
2.40E+00
2.40E+00
2.40E+00
0
2.57E+00
2.39E+00
2.44E+00
2.54E+00
2.50E+00
2.64E+00
2.75E+00
2.43E+00
2.46E+00
2.55E+00
2.36E+00
2.36E+00
10
2.31E+00
1.83E+00
2.11E+00
1.97E+00
2.08E+00
2.59E+00
2.71E+00
2.40E+00
2.42E+00
2.51E+00
2.35E+00
2.35E+00
Total Dose (krad(Si))
20
30
1.10E+00 8.00E-01
9.00E-01 8.00E-01
1.10E+00 9.00E-01
9.00E-01 8.00E-01
1.10E+00 1.00E+00
2.50E+00 2.40E+00
2.60E+00 2.60E+00
2.30E+00 2.30E+00
2.30E+00 2.30E+00
2.40E+00 2.30E+00
2.40E+00 2.40E+00
2.40E+00 2.40E+00
2.49E+00
7.34E-02
2.69E+00
2.28E+00
2.06E+00
1.78E-01
2.55E+00
1.57E+00
1.02E+00
1.10E-01
1.32E+00
7.20E-01
8.60E-01
8.94E-02
1.11E+00
6.15E-01
7.60E-01
8.94E-02
1.01E+00
5.15E-01
7.20E-01
8.37E-02
9.49E-01
4.91E-01
7.60E-01
5.48E-02
9.10E-01
6.10E-01
1.54E+00
2.07E-01
2.11E+00
9.71E-01
2.56E+00
1.32E-01
2.93E+00
2.20E+00
7.00E-01
PASS
2.53E+00
1.27E-01
2.87E+00
2.18E+00
6.00E-01
PASS
2.42E+00
1.30E-01
2.78E+00
2.06E+00
5.50E-01
PASS
2.38E+00
1.30E-01
2.74E+00
2.02E+00
5.17E-01
N/A
2.32E+00
1.30E-01
2.68E+00
1.96E+00
4.83E-01
N/A
2.24E+00
1.14E-01
2.55E+00
1.93E+00
4.50E-01
PASS
2.30E+00
1.22E-01
2.64E+00
1.96E+00
4.50E-01
PASS
2.42E+00
1.30E-01
2.78E+00
2.06E+00
4.50E-01
PASS
40
7.00E-01
7.00E-01
8.00E-01
7.00E-01
9.00E-01
2.40E+00
2.50E+00
2.20E+00
2.20E+00
2.30E+00
2.40E+00
2.40E+00
An ISO 9001:2008 and DSCC Certified Company
221
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Large Signal Voltage Gain @5V RL=100 #4 (V/mV)
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
3.00E+00
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.108. Plot of Large Signal Voltage Gain @5V RL=100 #4 (V/mV) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
222
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.108. Raw data for Large Signal Voltage Gain @5V RL=100 #4 (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Large Signal Voltage Gain @5V RL=100 #4 (V/mV)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
7.00E-01
6.00E-01
7.00E-01
7.00E-01
8.00E-01
2.20E+00
2.40E+00
2.20E+00
2.20E+00
2.20E+00
2.50E+00
2.40E+00
24-hr
Anneal
60
7.00E-01
6.00E-01
8.00E-01
7.00E-01
8.00E-01
2.20E+00
2.40E+00
2.20E+00
2.20E+00
2.20E+00
2.50E+00
2.40E+00
168-hr
Anneal
70
1.80E+00
1.40E+00
1.40E+00
1.50E+00
1.60E+00
2.40E+00
2.60E+00
2.30E+00
2.30E+00
2.40E+00
2.50E+00
2.40E+00
0
2.41E+00
2.54E+00
2.38E+00
2.44E+00
2.47E+00
2.49E+00
2.78E+00
2.43E+00
2.47E+00
2.51E+00
2.45E+00
2.43E+00
10
2.10E+00
1.91E+00
1.98E+00
1.93E+00
1.94E+00
2.45E+00
2.73E+00
2.39E+00
2.43E+00
2.46E+00
2.45E+00
2.43E+00
Total Dose (krad(Si))
20
30
1.00E+00 8.00E-01
9.00E-01 7.00E-01
1.00E+00 9.00E-01
1.00E+00 8.00E-01
1.10E+00 1.00E+00
2.40E+00 2.30E+00
2.60E+00 2.60E+00
2.30E+00 2.20E+00
2.30E+00 2.30E+00
2.40E+00 2.30E+00
2.40E+00 2.50E+00
2.40E+00 2.40E+00
2.45E+00
6.33E-02
2.62E+00
2.27E+00
1.97E+00
7.47E-02
2.18E+00
1.77E+00
1.00E+00
7.07E-02
1.19E+00
8.06E-01
8.40E-01
1.14E-01
1.15E+00
5.27E-01
7.40E-01
1.14E-01
1.05E+00
4.27E-01
7.00E-01
7.07E-02
8.94E-01
5.06E-01
7.20E-01
8.37E-02
9.49E-01
4.91E-01
1.54E+00
1.67E-01
2.00E+00
1.08E+00
2.53E+00
1.38E-01
2.91E+00
2.16E+00
7.00E-01
PASS
2.49E+00
1.35E-01
2.86E+00
2.12E+00
6.00E-01
PASS
2.40E+00
1.22E-01
2.74E+00
2.06E+00
5.50E-01
PASS
2.34E+00
1.52E-01
2.76E+00
1.92E+00
5.17E-01
N/A
2.28E+00
1.30E-01
2.64E+00
1.92E+00
4.83E-01
N/A
2.24E+00
8.94E-02
2.49E+00
1.99E+00
4.50E-01
PASS
2.24E+00
8.94E-02
2.49E+00
1.99E+00
4.50E-01
PASS
2.40E+00
1.22E-01
2.74E+00
2.06E+00
4.50E-01
PASS
40
7.00E-01
6.00E-01
8.00E-01
7.00E-01
9.00E-01
2.20E+00
2.50E+00
2.20E+00
2.20E+00
2.30E+00
2.50E+00
2.40E+00
An ISO 9001:2008 and DSCC Certified Company
223
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Channel Separation @5V 1:2 (dB)
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.109. Plot of Channel Separation @5V 1:2 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
224
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.109. Raw data for Channel Separation @5V 1:2 (dB) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Channel Separation @5V 1:2 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.03E+02
1.04E+02
1.33E+02
1.07E+02
1.17E+02
1.03E+02
9.85E+01
1.12E+02
1.11E+02
1.07E+02
1.01E+02
1.14E+02
24-hr
Anneal
60
1.05E+02
9.86E+01
1.06E+02
1.02E+02
1.10E+02
1.11E+02
1.01E+02
1.06E+02
1.05E+02
1.02E+02
1.08E+02
1.05E+02
168-hr
Anneal
70
1.00E+02
9.81E+01
1.04E+02
1.01E+02
1.11E+02
9.87E+01
1.12E+02
1.02E+02
1.05E+02
1.24E+02
9.94E+01
1.11E+02
0
1.01E+02
1.10E+02
1.04E+02
1.09E+02
9.92E+01
1.06E+02
1.10E+02
1.07E+02
1.16E+02
1.13E+02
1.02E+02
1.03E+02
10
1.14E+02
1.03E+02
9.95E+01
1.11E+02
9.58E+01
9.55E+01
1.11E+02
1.04E+02
1.04E+02
1.09E+02
1.09E+02
9.84E+01
Total Dose (krad(Si))
20
30
9.97E+01 1.09E+02
1.00E+02 1.04E+02
1.06E+02 1.18E+02
1.09E+02 1.12E+02
1.13E+02 1.03E+02
1.04E+02 1.06E+02
1.19E+02 1.01E+02
1.18E+02 1.00E+02
1.01E+02 1.01E+02
1.14E+02 9.92E+01
1.14E+02 1.30E+02
9.80E+01 1.03E+02
1.05E+02
4.90E+00
1.18E+02
9.12E+01
1.05E+02
7.87E+00
1.26E+02
8.32E+01
1.06E+02
5.77E+00
1.21E+02
8.98E+01
1.09E+02
6.17E+00
1.26E+02
9.24E+01
1.10E+02
5.30E+00
1.25E+02
9.55E+01
1.12E+02
1.28E+01
1.47E+02
7.74E+01
1.04E+02
4.11E+00
1.15E+02
9.28E+01
1.03E+02
4.99E+00
1.17E+02
8.92E+01
1.11E+02
4.20E+00
1.22E+02
9.91E+01
8.10E+01
PASS
1.05E+02
6.04E+00
1.21E+02
8.82E+01
8.10E+01
NA
1.11E+02
7.93E+00
1.33E+02
8.94E+01
8.10E+01
NA
1.02E+02
2.62E+00
1.09E+02
9.44E+01
8.10E+01
NA
1.11E+02
3.67E+00
1.21E+02
1.01E+02
8.10E+01
NA
1.06E+02
5.65E+00
1.22E+02
9.07E+01
8.10E+01
NA
1.05E+02
4.03E+00
1.16E+02
9.39E+01
8.10E+01
NA
1.08E+02
1.02E+01
1.36E+02
8.02E+01
8.10E+01
NA
40
1.19E+02
1.10E+02
1.06E+02
1.09E+02
1.06E+02
1.12E+02
1.07E+02
1.14E+02
1.06E+02
1.14E+02
1.13E+02
1.14E+02
An ISO 9001:2008 and DSCC Certified Company
225
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Channel Separation @5V 1:3 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.110. Plot of Channel Separation @5V 1:3 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
226
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.110. Raw data for Channel Separation @5V 1:3 (dB) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Channel Separation @5V 1:3 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.20E+02
1.00E+02
1.06E+02
1.14E+02
1.26E+02
1.17E+02
1.18E+02
1.00E+02
1.08E+02
1.00E+02
1.38E+02
1.06E+02
24-hr
Anneal
60
1.07E+02
1.06E+02
1.24E+02
9.97E+01
1.18E+02
1.07E+02
9.88E+01
1.03E+02
9.64E+01
9.86E+01
1.15E+02
1.13E+02
168-hr
Anneal
70
1.08E+02
1.01E+02
1.06E+02
1.02E+02
1.10E+02
1.31E+02
1.10E+02
1.08E+02
1.07E+02
1.13E+02
1.00E+02
9.95E+01
0
1.08E+02
1.14E+02
1.06E+02
1.26E+02
9.90E+01
1.09E+02
1.13E+02
1.02E+02
9.92E+01
1.24E+02
1.01E+02
1.01E+02
10
1.01E+02
1.18E+02
1.09E+02
1.05E+02
1.24E+02
1.15E+02
1.02E+02
1.14E+02
1.00E+02
1.02E+02
1.07E+02
1.17E+02
Total Dose (krad(Si))
20
30
1.24E+02 1.02E+02
1.17E+02 1.12E+02
1.20E+02 1.06E+02
1.06E+02 1.06E+02
1.18E+02 1.02E+02
1.15E+02 1.07E+02
1.02E+02 1.03E+02
1.02E+02 1.05E+02
1.06E+02 1.10E+02
1.10E+02 1.12E+02
1.01E+02 1.10E+02
1.20E+02 1.14E+02
1.11E+02
1.03E+01
1.39E+02
8.24E+01
1.12E+02
9.61E+00
1.38E+02
8.52E+01
1.17E+02
6.68E+00
1.35E+02
9.86E+01
1.06E+02
4.19E+00
1.17E+02
9.41E+01
1.08E+02
4.61E+00
1.20E+02
9.50E+01
1.13E+02
1.04E+01
1.42E+02
8.46E+01
1.11E+02
9.99E+00
1.38E+02
8.34E+01
1.05E+02
3.82E+00
1.16E+02
9.48E+01
1.09E+02
9.63E+00
1.36E+02
8.30E+01
8.10E+01
PASS
1.07E+02
7.25E+00
1.27E+02
8.67E+01
8.10E+01
NA
1.07E+02
5.86E+00
1.23E+02
9.10E+01
8.10E+01
NA
1.07E+02
3.43E+00
1.17E+02
9.80E+01
8.10E+01
NA
1.07E+02
5.74E+00
1.23E+02
9.14E+01
8.10E+01
NA
1.09E+02
8.65E+00
1.32E+02
8.48E+01
8.10E+01
NA
1.01E+02
4.15E+00
1.12E+02
8.93E+01
8.10E+01
NA
1.14E+02
9.85E+00
1.41E+02
8.68E+01
8.10E+01
NA
40
1.10E+02
1.02E+02
1.11E+02
1.03E+02
1.12E+02
1.13E+02
9.90E+01
1.06E+02
1.12E+02
1.06E+02
1.03E+02
1.00E+02
An ISO 9001:2008 and DSCC Certified Company
227
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Channel Separation @5V 1:4 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.111. Plot of Channel Separation @5V 1:4 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
228
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.111. Raw data for Channel Separation @5V 1:4 (dB) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Channel Separation @5V 1:4 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.25E+02
1.09E+02
9.69E+01
1.11E+02
9.93E+01
1.07E+02
1.05E+02
1.21E+02
1.05E+02
1.07E+02
1.13E+02
1.22E+02
24-hr
Anneal
60
1.03E+02
1.08E+02
1.29E+02
9.75E+01
1.38E+02
1.09E+02
1.20E+02
9.97E+01
1.00E+02
9.94E+01
9.90E+01
9.91E+01
168-hr
Anneal
70
1.02E+02
9.80E+01
1.05E+02
1.31E+02
1.11E+02
9.69E+01
1.10E+02
1.05E+02
1.02E+02
1.05E+02
1.03E+02
1.02E+02
0
9.72E+01
1.05E+02
1.25E+02
1.07E+02
1.01E+02
9.93E+01
1.10E+02
9.70E+01
1.04E+02
1.01E+02
9.46E+01
1.03E+02
10
9.47E+01
9.97E+01
9.80E+01
1.13E+02
1.18E+02
1.07E+02
1.02E+02
1.01E+02
1.04E+02
1.12E+02
9.88E+01
1.13E+02
Total Dose (krad(Si))
20
30
1.11E+02 1.07E+02
1.02E+02 9.35E+01
1.07E+02 1.43E+02
1.04E+02 1.24E+02
1.02E+02 1.19E+02
1.05E+02 1.03E+02
1.12E+02 1.04E+02
9.74E+01 1.12E+02
1.28E+02 1.04E+02
1.10E+02 1.07E+02
1.04E+02 9.47E+01
1.04E+02 1.11E+02
1.07E+02
1.09E+01
1.37E+02
7.75E+01
1.05E+02
1.01E+01
1.32E+02
7.69E+01
1.05E+02
3.80E+00
1.16E+02
9.48E+01
1.17E+02
1.87E+01
1.69E+02
6.60E+01
1.06E+02
3.15E+00
1.15E+02
9.77E+01
1.08E+02
1.11E+01
1.39E+02
7.77E+01
1.15E+02
1.75E+01
1.63E+02
6.69E+01
1.10E+02
1.30E+01
1.45E+02
7.40E+01
1.02E+02
4.91E+00
1.16E+02
8.87E+01
8.10E+01
PASS
1.05E+02
4.38E+00
1.17E+02
9.31E+01
8.10E+01
NA
1.11E+02
1.13E+01
1.42E+02
7.97E+01
8.10E+01
NA
1.06E+02
3.64E+00
1.16E+02
9.59E+01
8.10E+01
NA
1.06E+02
6.91E+00
1.25E+02
8.71E+01
8.10E+01
NA
1.09E+02
6.87E+00
1.28E+02
8.99E+01
8.10E+01
NA
1.06E+02
9.07E+00
1.31E+02
8.08E+01
8.10E+01
NA
1.04E+02
4.67E+00
1.17E+02
9.11E+01
8.10E+01
NA
40
1.05E+02
1.07E+02
1.12E+02
1.06E+02
1.03E+02
9.80E+01
1.08E+02
9.98E+01
1.14E+02
1.10E+02
1.06E+02
9.66E+01
An ISO 9001:2008 and DSCC Certified Company
229
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Channel Separation @5V 2:1 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.112. Plot of Channel Separation @5V 2:1 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
230
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.112. Raw data for Channel Separation @5V 2:1 (dB) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Channel Separation @5V 2:1 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.10E+02
1.04E+02
1.14E+02
1.04E+02
1.16E+02
9.82E+01
1.00E+02
9.85E+01
1.02E+02
1.03E+02
9.95E+01
1.23E+02
24-hr
Anneal
60
1.01E+02
1.00E+02
1.01E+02
1.33E+02
1.05E+02
1.07E+02
1.08E+02
1.07E+02
1.11E+02
1.15E+02
1.17E+02
1.35E+02
168-hr
Anneal
70
9.95E+01
1.03E+02
1.08E+02
1.25E+02
1.04E+02
1.07E+02
1.12E+02
1.06E+02
1.01E+02
1.09E+02
1.19E+02
1.15E+02
0
1.11E+02
1.19E+02
1.07E+02
1.05E+02
1.03E+02
1.13E+02
1.09E+02
1.00E+02
1.04E+02
1.00E+02
1.07E+02
1.01E+02
10
1.10E+02
1.22E+02
1.05E+02
1.07E+02
1.22E+02
1.57E+02
1.63E+02
1.14E+02
1.20E+02
1.13E+02
1.42E+02
1.03E+02
Total Dose (krad(Si))
20
30
9.72E+01 1.37E+02
1.05E+02 1.05E+02
1.01E+02 1.11E+02
1.21E+02 9.61E+01
9.67E+01 1.17E+02
1.03E+02 1.24E+02
1.14E+02 1.08E+02
1.07E+02 1.10E+02
1.21E+02 1.05E+02
1.18E+02 1.13E+02
1.02E+02 1.01E+02
1.07E+02 1.06E+02
1.09E+02
6.59E+00
1.27E+02
9.09E+01
1.13E+02
8.32E+00
1.36E+02
9.04E+01
1.04E+02
1.00E+01
1.32E+02
7.68E+01
1.13E+02
1.55E+01
1.56E+02
7.08E+01
1.05E+02
6.88E+00
1.24E+02
8.62E+01
1.10E+02
5.30E+00
1.24E+02
9.50E+01
1.08E+02
1.39E+01
1.46E+02
6.98E+01
1.08E+02
9.73E+00
1.35E+02
8.13E+01
1.05E+02
5.75E+00
1.21E+02
8.94E+01
8.10E+01
PASS
1.33E+02
2.44E+01
2.00E+02
6.61E+01
8.10E+01
NA
1.12E+02
7.45E+00
1.33E+02
9.19E+01
8.10E+01
NA
1.12E+02
7.40E+00
1.32E+02
9.18E+01
8.10E+01
NA
1.12E+02
5.80E+00
1.28E+02
9.57E+01
8.10E+01
NA
1.00E+02
2.14E+00
1.06E+02
9.45E+01
8.10E+01
NA
1.09E+02
3.69E+00
1.20E+02
9.93E+01
8.10E+01
NA
1.07E+02
4.07E+00
1.18E+02
9.57E+01
8.10E+01
NA
40
1.01E+02
9.79E+01
1.14E+02
1.10E+02
1.02E+02
1.08E+02
1.13E+02
1.21E+02
1.08E+02
1.09E+02
9.91E+01
1.02E+02
An ISO 9001:2008 and DSCC Certified Company
231
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Channel Separation @5V 2:3 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.113. Plot of Channel Separation @5V 2:3 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
232
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.113. Raw data for Channel Separation @5V 2:3 (dB) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Channel Separation @5V 2:3 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
9.91E+01
1.20E+02
1.03E+02
1.01E+02
1.21E+02
1.30E+02
1.09E+02
1.16E+02
1.04E+02
1.14E+02
1.05E+02
9.96E+01
24-hr
Anneal
60
1.01E+02
9.77E+01
1.06E+02
1.02E+02
1.01E+02
1.14E+02
9.80E+01
1.20E+02
1.27E+02
1.05E+02
1.17E+02
1.29E+02
168-hr
Anneal
70
1.10E+02
9.64E+01
1.04E+02
1.01E+02
9.87E+01
9.50E+01
1.31E+02
1.00E+02
1.02E+02
1.02E+02
1.19E+02
9.43E+01
0
1.27E+02
1.09E+02
1.19E+02
1.15E+02
9.77E+01
9.73E+01
9.82E+01
1.01E+02
1.15E+02
1.02E+02
1.04E+02
1.00E+02
10
1.11E+02
1.01E+02
1.04E+02
9.83E+01
1.09E+02
1.13E+02
1.28E+02
9.63E+01
9.46E+01
9.99E+01
1.06E+02
1.16E+02
Total Dose (krad(Si))
20
30
1.02E+02 1.15E+02
1.01E+02 1.11E+02
9.58E+01 9.37E+01
1.14E+02 1.13E+02
1.08E+02 9.86E+01
1.26E+02 1.05E+02
9.90E+01 1.04E+02
1.12E+02 1.15E+02
9.99E+01 1.33E+02
1.08E+02 1.03E+02
1.11E+02 1.02E+02
9.67E+01 1.06E+02
1.13E+02
1.10E+01
1.43E+02
8.33E+01
1.05E+02
5.26E+00
1.19E+02
9.04E+01
1.04E+02
6.98E+00
1.23E+02
8.51E+01
1.06E+02
9.46E+00
1.32E+02
8.02E+01
1.04E+02
3.69E+00
1.14E+02
9.38E+01
1.09E+02
1.09E+01
1.39E+02
7.89E+01
1.01E+02
2.79E+00
1.09E+02
9.37E+01
1.02E+02
5.22E+00
1.16E+02
8.76E+01
1.03E+02
7.01E+00
1.22E+02
8.35E+01
8.10E+01
PASS
1.06E+02
1.41E+01
1.45E+02
6.78E+01
8.10E+01
NA
1.09E+02
1.11E+01
1.39E+02
7.86E+01
8.10E+01
NA
1.12E+02
1.28E+01
1.47E+02
7.70E+01
8.10E+01
NA
1.08E+02
8.10E+00
1.30E+02
8.58E+01
8.10E+01
NA
1.15E+02
9.95E+00
1.42E+02
8.73E+01
8.10E+01
NA
1.12E+02
1.15E+01
1.44E+02
8.10E+01
8.10E+01
NA
1.06E+02
1.44E+01
1.46E+02
6.64E+01
8.10E+01
NA
40
9.94E+01
1.01E+02
1.09E+02
1.05E+02
1.05E+02
9.80E+01
1.14E+02
1.18E+02
1.07E+02
1.03E+02
1.51E+02
9.95E+01
An ISO 9001:2008 and DSCC Certified Company
233
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Channel Separation @5V 2:4 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.114. Plot of Channel Separation @5V 2:4 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
234
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.114. Raw data for Channel Separation @5V 2:4 (dB) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Channel Separation @5V 2:4 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.04E+02
1.07E+02
1.08E+02
1.06E+02
1.16E+02
1.01E+02
1.02E+02
1.08E+02
1.05E+02
9.99E+01
1.37E+02
1.07E+02
24-hr
Anneal
60
1.08E+02
1.07E+02
1.26E+02
1.07E+02
1.10E+02
1.03E+02
1.60E+02
1.06E+02
1.15E+02
1.05E+02
9.85E+01
9.71E+01
168-hr
Anneal
70
1.13E+02
1.05E+02
1.41E+02
1.50E+02
1.01E+02
1.18E+02
1.22E+02
1.09E+02
1.13E+02
9.79E+01
1.04E+02
1.08E+02
0
1.09E+02
1.07E+02
1.23E+02
1.04E+02
1.00E+02
1.04E+02
1.16E+02
1.12E+02
1.16E+02
1.00E+02
1.19E+02
1.12E+02
10
9.94E+01
1.13E+02
9.74E+01
9.73E+01
1.11E+02
1.02E+02
1.04E+02
1.06E+02
9.58E+01
1.03E+02
1.45E+02
1.02E+02
Total Dose (krad(Si))
20
30
1.01E+02 1.04E+02
9.96E+01 1.11E+02
1.29E+02 9.41E+01
9.80E+01 1.06E+02
1.09E+02 1.07E+02
1.12E+02 1.10E+02
1.10E+02 1.07E+02
1.02E+02 1.02E+02
1.08E+02 1.13E+02
1.04E+02 9.58E+01
1.02E+02 9.73E+01
1.09E+02 1.14E+02
1.09E+02
8.87E+00
1.33E+02
8.42E+01
1.04E+02
7.69E+00
1.25E+02
8.25E+01
1.07E+02
1.28E+01
1.42E+02
7.22E+01
1.05E+02
6.44E+00
1.22E+02
8.68E+01
1.07E+02
5.04E+00
1.20E+02
9.27E+01
1.08E+02
4.42E+00
1.20E+02
9.60E+01
1.11E+02
8.02E+00
1.33E+02
8.94E+01
1.22E+02
2.21E+01
1.83E+02
6.14E+01
1.10E+02
7.16E+00
1.29E+02
9.00E+01
8.10E+01
PASS
1.02E+02
3.85E+00
1.13E+02
9.15E+01
8.10E+01
NA
1.07E+02
4.48E+00
1.19E+02
9.48E+01
8.10E+01
NA
1.06E+02
6.92E+00
1.25E+02
8.66E+01
8.10E+01
NA
1.04E+02
4.00E+00
1.15E+02
9.28E+01
8.10E+01
NA
1.03E+02
3.25E+00
1.12E+02
9.41E+01
8.10E+01
NA
1.18E+02
2.39E+01
1.83E+02
5.25E+01
8.10E+01
NA
1.12E+02
9.32E+00
1.38E+02
8.65E+01
8.10E+01
NA
40
1.15E+02
1.04E+02
1.07E+02
1.03E+02
1.04E+02
1.08E+02
1.03E+02
1.06E+02
9.73E+01
1.05E+02
1.01E+02
1.30E+02
An ISO 9001:2008 and DSCC Certified Company
235
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Channel Separation @5V 3:1 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.115. Plot of Channel Separation @5V 3:1 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
236
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.115. Raw data for Channel Separation @5V 3:1 (dB) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Channel Separation @5V 3:1 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.02E+02
1.06E+02
1.06E+02
1.24E+02
1.04E+02
1.07E+02
1.20E+02
1.20E+02
1.07E+02
1.71E+02
1.09E+02
1.19E+02
24-hr
Anneal
60
1.10E+02
1.02E+02
1.09E+02
1.01E+02
9.93E+01
9.98E+01
1.08E+02
1.11E+02
1.03E+02
1.47E+02
1.04E+02
1.08E+02
168-hr
Anneal
70
1.01E+02
1.03E+02
1.08E+02
9.90E+01
1.06E+02
1.15E+02
1.07E+02
1.03E+02
1.11E+02
1.06E+02
1.03E+02
1.03E+02
0
1.01E+02
1.07E+02
1.11E+02
1.12E+02
1.15E+02
1.42E+02
1.05E+02
1.02E+02
9.85E+01
1.12E+02
1.15E+02
1.07E+02
10
1.08E+02
9.76E+01
9.48E+01
1.22E+02
1.14E+02
1.10E+02
1.12E+02
1.12E+02
9.73E+01
1.04E+02
1.06E+02
1.06E+02
Total Dose (krad(Si))
20
30
1.09E+02 1.06E+02
1.07E+02 1.12E+02
1.12E+02 1.02E+02
1.01E+02 1.28E+02
1.00E+02 9.98E+01
9.68E+01 1.08E+02
1.06E+02 1.03E+02
1.07E+02 1.08E+02
1.20E+02 1.05E+02
1.17E+02 9.69E+01
1.15E+02 1.19E+02
1.11E+02 9.84E+01
1.09E+02
5.33E+00
1.24E+02
9.47E+01
1.07E+02
1.11E+01
1.38E+02
7.66E+01
1.06E+02
5.42E+00
1.21E+02
9.10E+01
1.10E+02
1.11E+01
1.40E+02
7.91E+01
1.15E+02
7.31E+00
1.35E+02
9.48E+01
1.08E+02
9.06E+00
1.33E+02
8.35E+01
1.04E+02
4.76E+00
1.17E+02
9.09E+01
1.03E+02
3.68E+00
1.14E+02
9.34E+01
1.12E+02
1.76E+01
1.60E+02
6.40E+01
8.10E+01
PASS
1.07E+02
6.40E+00
1.25E+02
8.94E+01
8.10E+01
NA
1.09E+02
9.17E+00
1.34E+02
8.41E+01
8.10E+01
NA
1.04E+02
4.67E+00
1.17E+02
9.14E+01
8.10E+01
NA
1.03E+02
7.05E+00
1.22E+02
8.35E+01
8.10E+01
NA
1.25E+02
2.63E+01
1.97E+02
5.27E+01
8.10E+01
NA
1.14E+02
1.90E+01
1.66E+02
6.17E+01
8.10E+01
NA
1.08E+02
4.53E+00
1.21E+02
9.58E+01
8.10E+01
NA
40
1.09E+02
1.09E+02
1.25E+02
1.11E+02
1.21E+02
9.64E+01
1.01E+02
9.94E+01
1.15E+02
1.03E+02
9.94E+01
1.03E+02
An ISO 9001:2008 and DSCC Certified Company
237
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Channel Separation @5V 3:2 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.116. Plot of Channel Separation @5V 3:2 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
238
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.116. Raw data for Channel Separation @5V 3:2 (dB) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Channel Separation @5V 3:2 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.10E+02
1.04E+02
1.09E+02
1.04E+02
9.81E+01
9.88E+01
1.46E+02
1.14E+02
1.03E+02
9.95E+01
1.09E+02
9.85E+01
24-hr
Anneal
60
1.01E+02
1.04E+02
1.08E+02
1.36E+02
1.28E+02
1.00E+02
1.01E+02
9.78E+01
9.70E+01
1.10E+02
1.32E+02
1.22E+02
168-hr
Anneal
70
9.63E+01
1.19E+02
1.02E+02
9.16E+01
1.02E+02
1.01E+02
9.42E+01
9.96E+01
1.22E+02
1.11E+02
1.00E+02
1.23E+02
0
9.45E+01
1.07E+02
1.01E+02
1.12E+02
1.10E+02
1.55E+02
9.92E+01
1.10E+02
9.72E+01
1.13E+02
1.01E+02
9.67E+01
10
1.02E+02
1.11E+02
1.07E+02
1.03E+02
1.09E+02
9.76E+01
1.02E+02
1.04E+02
1.13E+02
1.07E+02
1.07E+02
1.09E+02
Total Dose (krad(Si))
20
30
1.04E+02 1.06E+02
1.10E+02 1.03E+02
1.02E+02 1.08E+02
1.13E+02 1.24E+02
1.08E+02 1.05E+02
1.14E+02 1.12E+02
9.43E+01 1.04E+02
9.70E+01 1.07E+02
1.07E+02 1.22E+02
1.17E+02 1.02E+02
9.85E+01 1.08E+02
1.04E+02 1.08E+02
1.05E+02
7.10E+00
1.24E+02
8.55E+01
1.06E+02
3.70E+00
1.16E+02
9.60E+01
1.08E+02
4.51E+00
1.20E+02
9.51E+01
1.09E+02
8.26E+00
1.32E+02
8.65E+01
1.09E+02
1.93E+01
1.62E+02
5.65E+01
1.05E+02
4.93E+00
1.19E+02
9.17E+01
1.15E+02
1.55E+01
1.58E+02
7.29E+01
1.02E+02
1.02E+01
1.30E+02
7.42E+01
1.15E+02
2.36E+01
1.80E+02
5.02E+01
8.10E+01
PASS
1.05E+02
5.64E+00
1.20E+02
8.93E+01
8.10E+01
NA
1.06E+02
9.90E+00
1.33E+02
7.87E+01
8.10E+01
NA
1.09E+02
8.13E+00
1.32E+02
8.70E+01
8.10E+01
NA
1.16E+02
1.68E+01
1.62E+02
6.99E+01
8.10E+01
NA
1.12E+02
1.96E+01
1.66E+02
5.85E+01
8.10E+01
NA
1.01E+02
5.11E+00
1.15E+02
8.72E+01
8.10E+01
NA
1.06E+02
1.10E+01
1.36E+02
7.55E+01
8.10E+01
NA
40
9.49E+01
9.72E+01
1.03E+02
1.10E+02
1.42E+02
1.33E+02
1.34E+02
9.96E+01
1.01E+02
1.13E+02
1.01E+02
1.20E+02
An ISO 9001:2008 and DSCC Certified Company
239
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Channel Separation @5V 3:4 (dB)
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.117. Plot of Channel Separation @5V 3:4 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
240
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.117. Raw data for Channel Separation @5V 3:4 (dB) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Channel Separation @5V 3:4 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.17E+02
1.08E+02
1.05E+02
1.07E+02
1.09E+02
1.06E+02
1.14E+02
1.02E+02
1.17E+02
1.09E+02
1.28E+02
9.68E+01
24-hr
Anneal
60
1.05E+02
1.23E+02
1.06E+02
1.04E+02
1.24E+02
1.10E+02
1.17E+02
1.08E+02
1.09E+02
1.11E+02
1.03E+02
1.01E+02
168-hr
Anneal
70
1.14E+02
1.29E+02
9.60E+01
1.04E+02
1.06E+02
1.05E+02
1.33E+02
1.04E+02
1.03E+02
1.00E+02
1.06E+02
1.03E+02
0
1.02E+02
1.09E+02
1.26E+02
1.07E+02
1.18E+02
1.00E+02
1.22E+02
1.11E+02
1.02E+02
1.06E+02
1.02E+02
1.13E+02
10
1.01E+02
1.06E+02
1.22E+02
1.13E+02
1.08E+02
1.24E+02
1.09E+02
9.72E+01
1.03E+02
1.07E+02
1.01E+02
1.04E+02
Total Dose (krad(Si))
20
30
1.09E+02 1.08E+02
1.14E+02 1.17E+02
1.12E+02 9.60E+01
1.05E+02 1.01E+02
1.04E+02 1.31E+02
1.06E+02 1.19E+02
1.02E+02 1.02E+02
1.01E+02 1.04E+02
1.11E+02 1.07E+02
1.01E+02 1.05E+02
1.08E+02 1.03E+02
9.82E+01 1.01E+02
1.12E+02
9.67E+00
1.39E+02
8.58E+01
1.10E+02
7.97E+00
1.32E+02
8.81E+01
1.09E+02
4.33E+00
1.21E+02
9.70E+01
1.11E+02
1.37E+01
1.48E+02
7.31E+01
1.14E+02
5.29E+00
1.28E+02
9.91E+01
1.09E+02
4.64E+00
1.22E+02
9.63E+01
1.13E+02
1.03E+01
1.41E+02
8.42E+01
1.10E+02
1.24E+01
1.44E+02
7.56E+01
1.08E+02
8.58E+00
1.32E+02
8.46E+01
8.10E+01
PASS
1.08E+02
9.93E+00
1.35E+02
8.09E+01
8.10E+01
NA
1.04E+02
4.51E+00
1.17E+02
9.18E+01
8.10E+01
NA
1.07E+02
6.74E+00
1.26E+02
8.89E+01
8.10E+01
NA
1.06E+02
7.12E+00
1.26E+02
8.67E+01
8.10E+01
NA
1.10E+02
6.01E+00
1.26E+02
9.33E+01
8.10E+01
NA
1.11E+02
3.47E+00
1.20E+02
1.01E+02
8.10E+01
NA
1.09E+02
1.36E+01
1.46E+02
7.18E+01
8.10E+01
NA
40
1.13E+02
1.06E+02
1.21E+02
1.15E+02
1.13E+02
1.08E+02
1.17E+02
9.75E+01
1.05E+02
1.03E+02
1.05E+02
9.89E+01
An ISO 9001:2008 and DSCC Certified Company
241
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Channel Separation @5V 4:1 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.118. Plot of Channel Separation @5V 4:1 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
242
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.118. Raw data for Channel Separation @5V 4:1 (dB) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Channel Separation @5V 4:1 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.10E+02
1.08E+02
1.18E+02
1.08E+02
9.37E+01
1.02E+02
1.09E+02
1.04E+02
1.12E+02
9.20E+01
1.08E+02
1.02E+02
24-hr
Anneal
60
1.12E+02
1.05E+02
1.02E+02
1.05E+02
1.24E+02
9.94E+01
1.06E+02
1.14E+02
1.08E+02
1.25E+02
9.34E+01
9.58E+01
168-hr
Anneal
70
1.09E+02
1.09E+02
1.04E+02
1.07E+02
1.09E+02
1.08E+02
1.07E+02
1.21E+02
9.95E+01
1.12E+02
1.06E+02
1.04E+02
0
1.02E+02
1.10E+02
1.04E+02
1.28E+02
1.04E+02
1.08E+02
1.27E+02
1.19E+02
1.33E+02
1.04E+02
1.03E+02
1.13E+02
10
9.76E+01
1.11E+02
9.92E+01
1.00E+02
1.18E+02
9.41E+01
1.21E+02
1.23E+02
1.03E+02
1.06E+02
1.06E+02
9.88E+01
Total Dose (krad(Si))
20
30
1.09E+02 1.27E+02
1.00E+02 9.57E+01
1.33E+02 1.01E+02
1.04E+02 1.00E+02
1.04E+02 1.09E+02
1.05E+02 1.02E+02
9.61E+01 9.81E+01
1.07E+02 1.03E+02
1.02E+02 1.16E+02
1.10E+02 1.12E+02
1.14E+02 1.12E+02
1.12E+02 9.84E+01
1.09E+02
1.10E+01
1.40E+02
7.92E+01
1.05E+02
8.85E+00
1.29E+02
8.08E+01
1.10E+02
1.30E+01
1.46E+02
7.42E+01
1.07E+02
1.22E+01
1.40E+02
7.33E+01
1.13E+02
1.10E+01
1.43E+02
8.26E+01
1.08E+02
8.74E+00
1.31E+02
8.36E+01
1.10E+02
8.78E+00
1.34E+02
8.55E+01
1.07E+02
2.31E+00
1.14E+02
1.01E+02
1.18E+02
1.24E+01
1.52E+02
8.42E+01
8.10E+01
PASS
1.09E+02
1.23E+01
1.43E+02
7.56E+01
8.10E+01
NA
1.04E+02
5.19E+00
1.18E+02
8.96E+01
8.10E+01
NA
1.06E+02
7.59E+00
1.27E+02
8.55E+01
8.10E+01
NA
1.10E+02
7.45E+00
1.30E+02
8.91E+01
8.10E+01
NA
1.04E+02
7.66E+00
1.25E+02
8.28E+01
8.10E+01
NA
1.10E+02
9.55E+00
1.36E+02
8.41E+01
8.10E+01
NA
1.09E+02
7.89E+00
1.31E+02
8.78E+01
8.10E+01
NA
40
1.05E+02
1.15E+02
1.31E+02
1.03E+02
1.09E+02
1.03E+02
1.17E+02
1.01E+02
1.17E+02
1.09E+02
9.96E+01
1.03E+02
An ISO 9001:2008 and DSCC Certified Company
243
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Channel Separation @5V 4:2 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.119. Plot of Channel Separation @5V 4:2 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
244
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.119. Raw data for Channel Separation @5V 4:2 (dB) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Channel Separation @5V 4:2 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
9.95E+01
1.23E+02
1.14E+02
1.04E+02
1.11E+02
1.05E+02
1.15E+02
1.05E+02
9.91E+01
1.02E+02
1.08E+02
1.13E+02
24-hr
Anneal
60
1.02E+02
1.01E+02
1.02E+02
1.57E+02
9.62E+01
9.58E+01
1.08E+02
9.92E+01
1.01E+02
1.21E+02
1.04E+02
1.30E+02
168-hr
Anneal
70
1.17E+02
1.08E+02
1.11E+02
9.91E+01
1.06E+02
1.02E+02
1.15E+02
1.04E+02
1.15E+02
9.91E+01
1.05E+02
1.32E+02
0
1.03E+02
1.01E+02
1.04E+02
1.00E+02
9.49E+01
1.09E+02
1.05E+02
1.04E+02
1.06E+02
1.12E+02
1.18E+02
1.13E+02
10
1.06E+02
1.18E+02
1.07E+02
1.02E+02
1.13E+02
1.22E+02
1.11E+02
1.01E+02
1.10E+02
1.03E+02
1.04E+02
1.26E+02
Total Dose (krad(Si))
20
30
1.06E+02 1.24E+02
1.13E+02 1.03E+02
1.02E+02 1.10E+02
1.14E+02 1.11E+02
1.06E+02 1.17E+02
1.35E+02 1.01E+02
1.25E+02 1.09E+02
1.27E+02 1.02E+02
1.30E+02 1.05E+02
1.21E+02 1.08E+02
1.10E+02 1.30E+02
1.02E+02 1.02E+02
1.00E+02
3.45E+00
1.10E+02
9.10E+01
1.09E+02
6.32E+00
1.26E+02
9.17E+01
1.08E+02
5.24E+00
1.22E+02
9.37E+01
1.13E+02
7.97E+00
1.35E+02
9.10E+01
1.10E+02
6.92E+00
1.29E+02
9.09E+01
1.10E+02
9.17E+00
1.35E+02
8.51E+01
1.12E+02
2.53E+01
1.81E+02
4.22E+01
1.08E+02
6.69E+00
1.27E+02
9.00E+01
1.07E+02
3.51E+00
1.17E+02
9.76E+01
8.10E+01
PASS
1.09E+02
8.18E+00
1.32E+02
8.69E+01
8.10E+01
NA
1.27E+02
5.34E+00
1.42E+02
1.13E+02
8.10E+01
NA
1.05E+02
3.60E+00
1.15E+02
9.53E+01
8.10E+01
NA
1.16E+02
1.60E+01
1.59E+02
7.16E+01
8.10E+01
NA
1.05E+02
5.90E+00
1.21E+02
8.90E+01
8.10E+01
NA
1.05E+02
9.85E+00
1.32E+02
7.77E+01
8.10E+01
NA
1.07E+02
7.29E+00
1.27E+02
8.70E+01
8.10E+01
NA
40
1.18E+02
1.05E+02
1.02E+02
1.16E+02
1.08E+02
1.04E+02
1.43E+02
1.09E+02
1.16E+02
1.05E+02
1.16E+02
1.13E+02
An ISO 9001:2008 and DSCC Certified Company
245
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Channel Separation @5V 4:3 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.120. Plot of Channel Separation @5V 4:3 (dB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
246
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.120. Raw data for Channel Separation @5V 4:3 (dB) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Channel Separation @5V 4:3 (dB)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.02E+02
1.10E+02
1.01E+02
1.18E+02
1.10E+02
1.06E+02
1.04E+02
1.51E+02
1.08E+02
1.11E+02
1.10E+02
1.04E+02
24-hr
Anneal
60
1.35E+02
1.20E+02
1.10E+02
1.13E+02
1.08E+02
1.14E+02
1.08E+02
1.10E+02
1.37E+02
9.92E+01
1.21E+02
9.93E+01
168-hr
Anneal
70
1.09E+02
1.27E+02
1.05E+02
1.10E+02
1.07E+02
1.05E+02
1.05E+02
1.09E+02
1.05E+02
1.01E+02
1.04E+02
1.05E+02
0
1.08E+02
9.93E+01
1.12E+02
1.09E+02
1.06E+02
1.47E+02
1.09E+02
1.18E+02
1.19E+02
1.23E+02
1.04E+02
9.76E+01
10
1.11E+02
9.76E+01
1.06E+02
1.01E+02
1.03E+02
9.55E+01
1.08E+02
9.87E+01
1.16E+02
1.07E+02
1.09E+02
1.01E+02
Total Dose (krad(Si))
20
30
1.08E+02 9.97E+01
1.12E+02 1.45E+02
1.13E+02 1.06E+02
1.09E+02 1.09E+02
1.25E+02 1.09E+02
1.11E+02 1.16E+02
1.00E+02 1.10E+02
1.08E+02 9.73E+01
1.06E+02 1.38E+02
1.02E+02 1.08E+02
1.14E+02 1.12E+02
1.05E+02 1.04E+02
1.07E+02
4.64E+00
1.20E+02
9.41E+01
1.04E+02
4.97E+00
1.17E+02
9.00E+01
1.13E+02
6.98E+00
1.33E+02
9.42E+01
1.14E+02
1.78E+01
1.62E+02
6.48E+01
1.05E+02
7.42E+00
1.25E+02
8.47E+01
1.08E+02
6.63E+00
1.26E+02
9.01E+01
1.17E+02
1.09E+01
1.47E+02
8.73E+01
1.12E+02
8.91E+00
1.36E+02
8.72E+01
1.23E+02
1.43E+01
1.63E+02
8.39E+01
8.10E+01
PASS
1.05E+02
8.03E+00
1.27E+02
8.29E+01
8.10E+01
NA
1.05E+02
4.37E+00
1.17E+02
9.33E+01
8.10E+01
NA
1.14E+02
1.52E+01
1.56E+02
7.23E+01
8.10E+01
NA
1.14E+02
6.87E+00
1.32E+02
9.47E+01
8.10E+01
NA
1.16E+02
1.96E+01
1.70E+02
6.19E+01
8.10E+01
NA
1.14E+02
1.42E+01
1.53E+02
7.49E+01
8.10E+01
NA
1.05E+02
2.85E+00
1.13E+02
9.71E+01
8.10E+01
NA
40
1.11E+02
9.80E+01
1.15E+02
1.04E+02
9.84E+01
1.22E+02
1.17E+02
1.17E+02
1.07E+02
1.06E+02
1.09E+02
1.06E+02
An ISO 9001:2008 and DSCC Certified Company
247
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output Voltage Swing High @5V RL=500 #1 (V)
4.15E+00
4.10E+00
4.05E+00
4.00E+00
3.95E+00
3.90E+00
3.85E+00
3.80E+00
3.75E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.121. Plot of Output Voltage Swing High @5V RL=500 #1 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
248
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.121. Raw data for Output Voltage Swing High @5V RL=500 #1 (V) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing High @5V RL=500 #1 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
60
4.07E+00
4.08E+00
4.08E+00
4.07E+00
4.08E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
4.12E+00
4.12E+00
168-hr
Anneal
70
4.08E+00
4.09E+00
4.09E+00
4.09E+00
4.08E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
0
4.11E+00
4.11E+00
4.12E+00
4.11E+00
4.11E+00
4.12E+00
4.12E+00
4.11E+00
4.12E+00
4.12E+00
4.11E+00
4.11E+00
10
4.09E+00
4.09E+00
4.09E+00
4.09E+00
4.09E+00
4.11E+00
4.12E+00
4.11E+00
4.11E+00
4.12E+00
4.12E+00
4.11E+00
Total Dose (krad(Si))
20
30
4.07E+00 4.07E+00
4.07E+00 4.07E+00
4.08E+00 4.08E+00
4.07E+00 4.08E+00
4.07E+00 4.08E+00
4.11E+00 4.11E+00
4.11E+00 4.11E+00
4.10E+00 4.10E+00
4.11E+00 4.11E+00
4.11E+00 4.11E+00
4.11E+00 4.12E+00
4.11E+00 4.11E+00
4.11E+00
1.64E-03
4.12E+00
4.11E+00
4.09E+00
2.79E-03
4.10E+00
4.08E+00
4.07E+00
4.30E-03
4.08E+00
4.06E+00
4.07E+00
5.26E-03
4.09E+00
4.06E+00
4.07E+00
5.05E-03
4.09E+00
4.06E+00
4.08E+00 4.08E+00 4.09E+00
3.90E-03 4.04E-03 1.58E-03
4.09E+00 4.09E+00 4.09E+00
4.07E+00 4.06E+00 4.08E+00
4.12E+00
2.95E-03
4.13E+00
4.11E+00
3.90E+00
PASS
4.11E+00
3.65E-03
4.12E+00
4.10E+00
3.90E+00
PASS
4.11E+00
3.65E-03
4.12E+00
4.10E+00
3.90E+00
PASS
4.11E+00
3.16E-03
4.12E+00
4.10E+00
3.87E+00
N/A
4.11E+00
3.13E-03
4.12E+00
4.10E+00
3.83E+00
N/A
4.11E+00
2.51E-03
4.11E+00
4.10E+00
3.80E+00
PASS
40
4.07E+00
4.08E+00
4.08E+00
4.07E+00
4.08E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.12E+00
4.11E+00
50
4.07E+00
4.08E+00
4.08E+00
4.08E+00
4.08E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
4.12E+00
4.11E+00
An ISO 9001:2008 and DSCC Certified Company
249
4.11E+00
2.39E-03
4.11E+00
4.10E+00
3.80E+00
PASS
4.11E+00
3.27E-03
4.12E+00
4.10E+00
3.80E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output Voltage Swing High @5V RL=500 #2 (V)
4.15E+00
4.10E+00
4.05E+00
4.00E+00
3.95E+00
3.90E+00
3.85E+00
3.80E+00
3.75E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.122. Plot of Output Voltage Swing High @5V RL=500 #2 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
250
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.122. Raw data for Output Voltage Swing High @5V RL=500 #2 (V) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing High @5V RL=500 #2 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
60
4.07E+00
4.07E+00
4.08E+00
4.07E+00
4.08E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
168-hr
Anneal
70
4.09E+00
4.08E+00
4.09E+00
4.08E+00
4.09E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
0
4.11E+00
4.11E+00
4.12E+00
4.11E+00
4.11E+00
4.12E+00
4.12E+00
4.11E+00
4.12E+00
4.12E+00
4.11E+00
4.11E+00
10
4.09E+00
4.09E+00
4.10E+00
4.09E+00
4.09E+00
4.11E+00
4.12E+00
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
Total Dose (krad(Si))
20
30
4.06E+00 4.06E+00
4.07E+00 4.07E+00
4.08E+00 4.08E+00
4.07E+00 4.07E+00
4.08E+00 4.08E+00
4.11E+00 4.11E+00
4.11E+00 4.11E+00
4.10E+00 4.10E+00
4.11E+00 4.11E+00
4.11E+00 4.11E+00
4.11E+00 4.11E+00
4.11E+00 4.11E+00
4.11E+00
1.95E-03
4.12E+00
4.11E+00
4.09E+00
4.44E-03
4.10E+00
4.08E+00
4.07E+00
6.23E-03
4.09E+00
4.05E+00
4.07E+00
7.01E-03
4.09E+00
4.05E+00
4.07E+00
6.80E-03
4.09E+00
4.05E+00
4.08E+00 4.07E+00 4.08E+00
5.83E-03 5.07E-03 3.21E-03
4.09E+00 4.09E+00 4.09E+00
4.06E+00 4.06E+00 4.08E+00
4.12E+00
3.65E-03
4.13E+00
4.11E+00
3.90E+00
PASS
4.11E+00
4.04E-03
4.12E+00
4.10E+00
3.90E+00
PASS
4.11E+00
3.61E-03
4.12E+00
4.10E+00
3.90E+00
PASS
4.11E+00
3.65E-03
4.12E+00
4.10E+00
3.87E+00
N/A
4.11E+00
3.65E-03
4.12E+00
4.10E+00
3.83E+00
N/A
4.11E+00
3.54E-03
4.11E+00
4.10E+00
3.80E+00
PASS
40
4.06E+00
4.07E+00
4.08E+00
4.07E+00
4.08E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
50
4.07E+00
4.07E+00
4.08E+00
4.08E+00
4.08E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
An ISO 9001:2008 and DSCC Certified Company
251
4.11E+00
3.21E-03
4.11E+00
4.10E+00
3.80E+00
PASS
4.11E+00
3.97E-03
4.12E+00
4.10E+00
3.80E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output Voltage Swing High @5V RL=500 #3 (V)
4.15E+00
4.10E+00
4.05E+00
4.00E+00
3.95E+00
3.90E+00
3.85E+00
3.80E+00
3.75E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.123. Plot of Output Voltage Swing High @5V RL=500 #3 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
252
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.123. Raw data for Output Voltage Swing High @5V RL=500 #3 (V) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing High @5V RL=500 #3 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
60
4.08E+00
4.07E+00
4.08E+00
4.07E+00
4.08E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
168-hr
Anneal
70
4.09E+00
4.08E+00
4.09E+00
4.08E+00
4.09E+00
4.11E+00
4.12E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
0
4.12E+00
4.11E+00
4.12E+00
4.11E+00
4.11E+00
4.12E+00
4.12E+00
4.11E+00
4.12E+00
4.11E+00
4.11E+00
4.11E+00
10
4.10E+00
4.08E+00
4.10E+00
4.09E+00
4.09E+00
4.11E+00
4.12E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
Total Dose (krad(Si))
20
30
4.07E+00 4.07E+00
4.07E+00 4.07E+00
4.08E+00 4.08E+00
4.07E+00 4.07E+00
4.08E+00 4.08E+00
4.11E+00 4.11E+00
4.11E+00 4.11E+00
4.10E+00 4.10E+00
4.11E+00 4.11E+00
4.11E+00 4.11E+00
4.11E+00 4.11E+00
4.11E+00 4.11E+00
4.11E+00
2.70E-03
4.12E+00
4.11E+00
4.09E+00
5.45E-03
4.11E+00
4.08E+00
4.07E+00
5.20E-03
4.09E+00
4.06E+00
4.07E+00
5.96E-03
4.09E+00
4.06E+00
4.07E+00
5.45E-03
4.09E+00
4.06E+00
4.08E+00 4.08E+00 4.09E+00
5.54E-03 5.10E-03 4.22E-03
4.09E+00 4.09E+00 4.10E+00
4.06E+00 4.06E+00 4.07E+00
4.12E+00
3.67E-03
4.13E+00
4.11E+00
3.90E+00
PASS
4.11E+00
4.74E-03
4.12E+00
4.10E+00
3.90E+00
PASS
4.11E+00
4.28E-03
4.12E+00
4.10E+00
3.90E+00
PASS
4.11E+00
4.28E-03
4.12E+00
4.10E+00
3.87E+00
N/A
4.11E+00
3.85E-03
4.12E+00
4.10E+00
3.83E+00
N/A
4.11E+00
3.90E-03
4.12E+00
4.10E+00
3.80E+00
PASS
40
4.07E+00
4.07E+00
4.08E+00
4.07E+00
4.08E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
50
4.08E+00
4.07E+00
4.08E+00
4.08E+00
4.08E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
An ISO 9001:2008 and DSCC Certified Company
253
4.11E+00
4.00E-03
4.12E+00
4.10E+00
3.80E+00
PASS
4.11E+00
3.97E-03
4.12E+00
4.10E+00
3.80E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output Voltage Swing High @5V RL=500 #4 (V)
4.15E+00
4.10E+00
4.05E+00
4.00E+00
3.95E+00
3.90E+00
3.85E+00
3.80E+00
3.75E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.124. Plot of Output Voltage Swing High @5V RL=500 #4 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
254
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.124. Raw data for Output Voltage Swing High @5V RL=500 #4 (V) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing High @5V RL=500 #4 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
60
4.07E+00
4.07E+00
4.08E+00
4.08E+00
4.08E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
4.12E+00
4.12E+00
168-hr
Anneal
70
4.09E+00
4.08E+00
4.09E+00
4.09E+00
4.09E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.12E+00
4.11E+00
0
4.11E+00
4.11E+00
4.12E+00
4.11E+00
4.11E+00
4.12E+00
4.12E+00
4.11E+00
4.12E+00
4.12E+00
4.12E+00
4.11E+00
10
4.09E+00
4.09E+00
4.09E+00
4.09E+00
4.09E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.11E+00
4.12E+00
4.11E+00
Total Dose (krad(Si))
20
30
4.07E+00 4.07E+00
4.06E+00 4.07E+00
4.08E+00 4.08E+00
4.07E+00 4.07E+00
4.07E+00 4.08E+00
4.11E+00 4.11E+00
4.11E+00 4.11E+00
4.10E+00 4.10E+00
4.11E+00 4.11E+00
4.11E+00 4.11E+00
4.12E+00 4.12E+00
4.11E+00 4.12E+00
4.11E+00
1.52E-03
4.12E+00
4.11E+00
4.09E+00
2.59E-03
4.10E+00
4.08E+00
4.07E+00
4.93E-03
4.08E+00
4.06E+00
4.07E+00
5.83E-03
4.09E+00
4.06E+00
4.07E+00
6.06E-03
4.09E+00
4.06E+00
4.08E+00 4.08E+00 4.09E+00
5.07E-03 4.49E-03 2.35E-03
4.09E+00 4.09E+00 4.09E+00
4.06E+00 4.06E+00 4.08E+00
4.12E+00
2.45E-03
4.12E+00
4.11E+00
3.90E+00
PASS
4.11E+00
3.13E-03
4.12E+00
4.10E+00
3.90E+00
PASS
4.11E+00
2.86E-03
4.12E+00
4.10E+00
3.90E+00
PASS
4.11E+00
2.68E-03
4.12E+00
4.10E+00
3.87E+00
N/A
4.11E+00
2.70E-03
4.12E+00
4.10E+00
3.83E+00
N/A
4.11E+00
2.30E-03
4.11E+00
4.10E+00
3.80E+00
PASS
40
4.07E+00
4.07E+00
4.08E+00
4.08E+00
4.08E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
4.12E+00
4.12E+00
50
4.07E+00
4.07E+00
4.08E+00
4.08E+00
4.08E+00
4.11E+00
4.11E+00
4.10E+00
4.11E+00
4.11E+00
4.12E+00
4.12E+00
An ISO 9001:2008 and DSCC Certified Company
255
4.11E+00
2.28E-03
4.11E+00
4.10E+00
3.80E+00
PASS
4.11E+00
2.55E-03
4.12E+00
4.10E+00
3.80E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output Voltage Swing High @5V RL=100 #1 (V)
4.00E+00
3.95E+00
3.90E+00
3.85E+00
3.80E+00
3.75E+00
3.70E+00
3.65E+00
3.60E+00
3.55E+00
3.50E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.125. Plot of Output Voltage Swing High @5V RL=100 #1 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
256
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.125. Raw data for Output Voltage Swing High @5V RL=100 #1 (V) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing High @5V RL=100 #1 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
60
3.92E+00
3.92E+00
3.93E+00
3.92E+00
3.92E+00
3.94E+00
3.93E+00
3.93E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
168-hr
Anneal
70
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.94E+00
3.94E+00
3.93E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
0
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
10
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
Total Dose (krad(Si))
20
30
3.92E+00 3.92E+00
3.92E+00 3.92E+00
3.93E+00 3.93E+00
3.92E+00 3.92E+00
3.92E+00 3.92E+00
3.94E+00 3.94E+00
3.93E+00 3.93E+00
3.93E+00 3.93E+00
3.94E+00 3.94E+00
3.94E+00 3.94E+00
3.94E+00 3.94E+00
3.94E+00 3.94E+00
3.94E+00
8.94E-04
3.94E+00
3.93E+00
3.93E+00
1.64E-03
3.94E+00
3.93E+00
3.92E+00
2.86E-03
3.93E+00
3.91E+00
3.92E+00
3.42E-03
3.93E+00
3.91E+00
3.92E+00
2.88E-03
3.93E+00
3.91E+00
3.92E+00 3.92E+00 3.93E+00
2.55E-03 2.17E-03 8.37E-04
3.93E+00 3.93E+00 3.93E+00
3.92E+00 3.92E+00 3.93E+00
3.94E+00
2.05E-03
3.94E+00
3.93E+00
3.70E+00
PASS
3.94E+00
1.67E-03
3.94E+00
3.93E+00
3.70E+00
PASS
3.94E+00
2.05E-03
3.94E+00
3.93E+00
3.65E+00
PASS
3.94E+00
1.92E-03
3.94E+00
3.93E+00
3.62E+00
N/A
3.94E+00
1.92E-03
3.94E+00
3.93E+00
3.58E+00
N/A
3.93E+00
2.05E-03
3.94E+00
3.93E+00
3.55E+00
PASS
40
3.92E+00
3.92E+00
3.93E+00
3.92E+00
3.92E+00
3.94E+00
3.93E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
50
3.92E+00
3.92E+00
3.93E+00
3.92E+00
3.92E+00
3.94E+00
3.93E+00
3.93E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
An ISO 9001:2008 and DSCC Certified Company
257
3.93E+00
1.79E-03
3.94E+00
3.93E+00
3.55E+00
PASS
3.94E+00
1.58E-03
3.94E+00
3.93E+00
3.55E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output Voltage Swing High @5V RL=100 #2 (V)
4.00E+00
3.95E+00
3.90E+00
3.85E+00
3.80E+00
3.75E+00
3.70E+00
3.65E+00
3.60E+00
3.55E+00
3.50E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.126. Plot of Output Voltage Swing High @5V RL=100 #2 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
258
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.126. Raw data for Output Voltage Swing High @5V RL=100 #2 (V) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing High @5V RL=100 #2 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
60
3.92E+00
3.92E+00
3.92E+00
3.92E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.94E+00
3.93E+00
3.94E+00
3.94E+00
168-hr
Anneal
70
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.94E+00
3.93E+00
3.93E+00
3.94E+00
3.93E+00
3.94E+00
3.94E+00
0
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
10
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.94E+00
3.93E+00
3.93E+00
3.94E+00
3.93E+00
3.94E+00
3.94E+00
Total Dose (krad(Si))
20
30
3.92E+00 3.92E+00
3.92E+00 3.92E+00
3.93E+00 3.93E+00
3.92E+00 3.92E+00
3.93E+00 3.93E+00
3.94E+00 3.94E+00
3.93E+00 3.93E+00
3.93E+00 3.93E+00
3.94E+00 3.94E+00
3.93E+00 3.93E+00
3.94E+00 3.94E+00
3.94E+00 3.94E+00
3.94E+00
1.67E-03
3.94E+00
3.93E+00
3.93E+00
1.87E-03
3.94E+00
3.93E+00
3.92E+00
4.28E-03
3.93E+00
3.91E+00
3.92E+00
4.95E-03
3.93E+00
3.91E+00
3.92E+00
4.66E-03
3.93E+00
3.91E+00
3.92E+00 3.92E+00 3.93E+00
3.32E-03 2.70E-03 2.07E-03
3.93E+00 3.93E+00 3.93E+00
3.91E+00 3.91E+00 3.92E+00
3.94E+00
1.52E-03
3.94E+00
3.93E+00
3.70E+00
PASS
3.93E+00
1.64E-03
3.94E+00
3.93E+00
3.70E+00
PASS
3.93E+00
1.58E-03
3.94E+00
3.93E+00
3.65E+00
PASS
3.93E+00
1.34E-03
3.94E+00
3.93E+00
3.62E+00
N/A
3.93E+00
1.52E-03
3.94E+00
3.93E+00
3.58E+00
N/A
3.93E+00
1.58E-03
3.94E+00
3.93E+00
3.55E+00
PASS
40
3.92E+00
3.92E+00
3.93E+00
3.92E+00
3.93E+00
3.94E+00
3.93E+00
3.93E+00
3.94E+00
3.93E+00
3.94E+00
3.94E+00
50
3.92E+00
3.92E+00
3.93E+00
3.92E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.94E+00
3.93E+00
3.94E+00
3.94E+00
An ISO 9001:2008 and DSCC Certified Company
259
3.93E+00
1.30E-03
3.94E+00
3.93E+00
3.55E+00
PASS
3.93E+00
1.87E-03
3.94E+00
3.93E+00
3.55E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output Voltage Swing High @5V RL=100 #3 (V)
4.00E+00
3.95E+00
3.90E+00
3.85E+00
3.80E+00
3.75E+00
3.70E+00
3.65E+00
3.60E+00
3.55E+00
3.50E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.127. Plot of Output Voltage Swing High @5V RL=100 #3 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
260
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.127. Raw data for Output Voltage Swing High @5V RL=100 #3 (V) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing High @5V RL=100 #3 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
60
3.92E+00
3.92E+00
3.93E+00
3.92E+00
3.93E+00
3.94E+00
3.93E+00
3.93E+00
3.94E+00
3.93E+00
3.94E+00
3.94E+00
168-hr
Anneal
70
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.94E+00
3.93E+00
3.93E+00
3.94E+00
3.93E+00
3.94E+00
3.94E+00
0
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
10
3.93E+00
3.93E+00
3.94E+00
3.93E+00
3.93E+00
3.94E+00
3.94E+00
3.93E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
Total Dose (krad(Si))
20
30
3.92E+00 3.92E+00
3.92E+00 3.92E+00
3.93E+00 3.93E+00
3.92E+00 3.92E+00
3.93E+00 3.93E+00
3.94E+00 3.94E+00
3.93E+00 3.93E+00
3.93E+00 3.93E+00
3.94E+00 3.94E+00
3.93E+00 3.93E+00
3.94E+00 3.94E+00
3.94E+00 3.94E+00
3.94E+00
1.48E-03
3.94E+00
3.93E+00
3.93E+00
2.59E-03
3.94E+00
3.92E+00
3.92E+00
3.67E-03
3.93E+00
3.91E+00
3.92E+00
4.21E-03
3.93E+00
3.91E+00
3.92E+00
3.94E-03
3.93E+00
3.91E+00
3.92E+00 3.92E+00 3.93E+00
3.58E-03 3.08E-03 2.65E-03
3.93E+00 3.93E+00 3.94E+00
3.91E+00 3.91E+00 3.92E+00
3.94E+00
1.79E-03
3.94E+00
3.93E+00
3.70E+00
PASS
3.94E+00
1.34E-03
3.94E+00
3.93E+00
3.70E+00
PASS
3.93E+00
1.34E-03
3.94E+00
3.93E+00
3.65E+00
PASS
3.93E+00
1.34E-03
3.94E+00
3.93E+00
3.62E+00
N/A
3.94E+00
1.41E-03
3.94E+00
3.93E+00
3.58E+00
N/A
3.93E+00
1.34E-03
3.94E+00
3.93E+00
3.55E+00
PASS
40
3.92E+00
3.92E+00
3.93E+00
3.92E+00
3.93E+00
3.94E+00
3.93E+00
3.93E+00
3.94E+00
3.93E+00
3.94E+00
3.94E+00
50
3.92E+00
3.92E+00
3.93E+00
3.92E+00
3.93E+00
3.94E+00
3.93E+00
3.93E+00
3.94E+00
3.93E+00
3.94E+00
3.94E+00
An ISO 9001:2008 and DSCC Certified Company
261
3.93E+00
1.64E-03
3.94E+00
3.93E+00
3.55E+00
PASS
3.94E+00
1.41E-03
3.94E+00
3.93E+00
3.55E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output Voltage Swing High @5V RL=100 #4 (V)
4.00E+00
3.95E+00
3.90E+00
3.85E+00
3.80E+00
3.75E+00
3.70E+00
3.65E+00
3.60E+00
3.55E+00
3.50E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.128. Plot of Output Voltage Swing High @5V RL=100 #4 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
262
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.128. Raw data for Output Voltage Swing High @5V RL=100 #4 (V) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing High @5V RL=100 #4 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
60
3.92E+00
3.92E+00
3.93E+00
3.92E+00
3.92E+00
3.94E+00
3.93E+00
3.93E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
168-hr
Anneal
70
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.94E+00
3.93E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
0
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
10
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.94E+00
3.93E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
Total Dose (krad(Si))
20
30
3.92E+00 3.92E+00
3.92E+00 3.92E+00
3.92E+00 3.93E+00
3.92E+00 3.92E+00
3.92E+00 3.93E+00
3.94E+00 3.94E+00
3.93E+00 3.93E+00
3.93E+00 3.93E+00
3.94E+00 3.94E+00
3.94E+00 3.94E+00
3.94E+00 3.94E+00
3.94E+00 3.94E+00
3.94E+00
1.34E-03
3.94E+00
3.93E+00
3.93E+00
1.79E-03
3.94E+00
3.93E+00
3.92E+00
3.05E-03
3.93E+00
3.91E+00
3.92E+00
3.78E-03
3.93E+00
3.91E+00
3.92E+00
4.09E-03
3.93E+00
3.91E+00
3.92E+00 3.92E+00 3.93E+00
2.86E-03 2.74E-03 1.52E-03
3.93E+00 3.93E+00 3.93E+00
3.91E+00 3.91E+00 3.92E+00
3.94E+00
1.82E-03
3.94E+00
3.93E+00
3.70E+00
PASS
3.94E+00
1.64E-03
3.94E+00
3.93E+00
3.70E+00
PASS
3.94E+00
1.92E-03
3.94E+00
3.93E+00
3.65E+00
PASS
3.93E+00
1.92E-03
3.94E+00
3.93E+00
3.62E+00
N/A
3.94E+00
2.00E-03
3.94E+00
3.93E+00
3.58E+00
N/A
3.93E+00
1.58E-03
3.94E+00
3.93E+00
3.55E+00
PASS
40
3.92E+00
3.92E+00
3.93E+00
3.92E+00
3.93E+00
3.94E+00
3.93E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
3.94E+00
50
3.92E+00
3.92E+00
3.93E+00
3.92E+00
3.93E+00
3.94E+00
3.93E+00
3.93E+00
3.93E+00
3.94E+00
3.94E+00
3.94E+00
An ISO 9001:2008 and DSCC Certified Company
263
3.93E+00
1.52E-03
3.94E+00
3.93E+00
3.55E+00
PASS
3.94E+00
1.14E-03
3.94E+00
3.93E+00
3.55E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Output Voltage Swing Low @5V RL=500 #1 (V)
1.40E+00
1.20E+00
1.00E+00
8.00E-01
6.00E-01
4.00E-01
2.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.129. Plot of Output Voltage Swing Low @5V RL=500 #1 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
264
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.129. Raw data for Output Voltage Swing Low @5V RL=500 #1 (V) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing Low @5V RL=500 #1 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
40
9.03E-01
9.29E-01
9.16E-01
9.23E-01
9.20E-01
8.93E-01
8.88E-01
8.95E-01
8.93E-01
8.88E-01
8.89E-01
8.91E-01
50
9.06E-01
9.40E-01
9.21E-01
9.32E-01
9.26E-01
8.95E-01
8.91E-01
8.97E-01
8.96E-01
8.90E-01
8.90E-01
8.91E-01
24-hr
Anneal
60
9.05E-01
9.40E-01
9.23E-01
9.33E-01
9.27E-01
8.95E-01
8.91E-01
8.97E-01
8.95E-01
8.90E-01
8.90E-01
8.91E-01
9.13E-01
7.33E-03
9.34E-01
8.93E-01
9.18E-01
9.73E-03
9.45E-01
8.92E-01
9.25E-01
1.28E-02
9.60E-01
8.90E-01
9.26E-01
1.32E-02
9.62E-01
8.89E-01
9.10E-01
6.11E-03
9.27E-01
8.94E-01
8.92E-01
3.36E-03
9.01E-01
8.82E-01
1.12E+00
N/A
8.91E-01
3.21E-03
9.00E-01
8.83E-01
1.13E+00
N/A
8.94E-01
3.11E-03
9.02E-01
8.85E-01
1.15E+00
PASS
8.94E-01
2.97E-03
9.02E-01
8.85E-01
1.15E+00
PASS
8.91E-01
2.95E-03
8.99E-01
8.83E-01
1.15E+00
PASS
Total Dose (krad(Si))
20
30
8.98E-01 9.02E-01
9.13E-01 9.22E-01
9.06E-01 9.12E-01
9.09E-01 9.16E-01
9.11E-01 9.15E-01
8.92E-01 8.93E-01
8.88E-01 8.88E-01
8.94E-01 8.95E-01
8.93E-01 8.94E-01
8.87E-01 8.88E-01
8.90E-01 8.90E-01
8.91E-01 8.91E-01
0
8.92E-01
8.94E-01
8.91E-01
8.90E-01
8.94E-01
8.88E-01
8.84E-01
8.90E-01
8.89E-01
8.85E-01
8.91E-01
8.92E-01
10
8.95E-01
9.02E-01
8.97E-01
8.98E-01
9.01E-01
8.90E-01
8.85E-01
8.91E-01
8.91E-01
8.85E-01
8.90E-01
8.91E-01
8.92E-01
1.79E-03
8.97E-01
8.87E-01
8.99E-01
2.88E-03
9.06E-01
8.91E-01
9.07E-01
5.86E-03
9.23E-01
8.91E-01
8.87E-01
2.59E-03
8.94E-01
8.80E-01
1.10E+00
PASS
8.88E-01
3.13E-03
8.97E-01
8.80E-01
1.10E+00
PASS
8.91E-01
3.11E-03
8.99E-01
8.82E-01
1.10E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
265
168-hr
Anneal
70
9.00E-01
9.16E-01
9.13E-01
9.11E-01
9.12E-01
8.93E-01
8.88E-01
8.94E-01
8.93E-01
8.88E-01
8.91E-01
8.92E-01
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Output Voltage Swing Low @5V RL=500 #2 (V)
1.40E+00
1.20E+00
1.00E+00
8.00E-01
6.00E-01
4.00E-01
2.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.130. Plot of Output Voltage Swing Low @5V RL=500 #2 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
266
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.130. Raw data for Output Voltage Swing Low @5V RL=500 #2 (V) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing Low @5V RL=500 #2 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
40
9.01E-01
9.26E-01
9.12E-01
9.27E-01
9.16E-01
8.95E-01
8.88E-01
9.00E-01
8.95E-01
8.96E-01
8.92E-01
8.91E-01
50
9.04E-01
9.35E-01
9.16E-01
9.36E-01
9.21E-01
8.96E-01
8.90E-01
9.02E-01
8.97E-01
8.98E-01
8.92E-01
8.91E-01
24-hr
Anneal
60
9.03E-01
9.35E-01
9.17E-01
9.38E-01
9.21E-01
8.96E-01
8.90E-01
9.02E-01
8.97E-01
8.98E-01
8.92E-01
8.90E-01
9.12E-01
7.55E-03
9.33E-01
8.91E-01
9.16E-01
1.07E-02
9.46E-01
8.87E-01
9.22E-01
1.35E-02
9.59E-01
8.85E-01
9.23E-01
1.42E-02
9.62E-01
8.84E-01
9.10E-01
6.99E-03
9.29E-01
8.90E-01
8.95E-01
4.44E-03
9.07E-01
8.83E-01
1.12E+00
N/A
8.95E-01
4.32E-03
9.07E-01
8.83E-01
1.13E+00
N/A
8.97E-01
4.34E-03
9.08E-01
8.85E-01
1.15E+00
PASS
8.97E-01
4.34E-03
9.08E-01
8.85E-01
1.15E+00
PASS
8.93E-01
4.83E-03
9.07E-01
8.80E-01
1.15E+00
PASS
Total Dose (krad(Si))
20
30
8.97E-01 9.01E-01
9.11E-01 9.19E-01
9.05E-01 9.09E-01
9.10E-01 9.19E-01
9.08E-01 9.12E-01
8.93E-01 8.94E-01
8.86E-01 8.88E-01
8.99E-01 9.00E-01
8.94E-01 8.95E-01
8.95E-01 8.97E-01
8.92E-01 8.92E-01
8.91E-01 8.91E-01
0
8.92E-01
8.94E-01
8.89E-01
8.91E-01
8.95E-01
8.89E-01
8.84E-01
8.95E-01
8.89E-01
8.91E-01
8.93E-01
8.92E-01
10
8.94E-01
9.00E-01
8.96E-01
8.99E-01
9.01E-01
8.90E-01
8.85E-01
8.96E-01
8.91E-01
8.93E-01
8.92E-01
8.91E-01
8.92E-01
2.39E-03
8.99E-01
8.86E-01
8.98E-01
2.92E-03
9.06E-01
8.90E-01
9.06E-01
5.63E-03
9.22E-01
8.91E-01
8.90E-01
3.97E-03
9.00E-01
8.79E-01
1.10E+00
PASS
8.91E-01
4.06E-03
9.02E-01
8.80E-01
1.10E+00
PASS
8.93E-01
4.72E-03
9.06E-01
8.80E-01
1.10E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
267
168-hr
Anneal
70
8.98E-01
9.15E-01
9.15E-01
9.11E-01
9.09E-01
8.93E-01
8.86E-01
8.99E-01
8.93E-01
8.96E-01
8.93E-01
8.92E-01
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Output Voltage Swing Low @5V RL=500 #3 (V)
1.40E+00
1.20E+00
1.00E+00
8.00E-01
6.00E-01
4.00E-01
2.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.131. Plot of Output Voltage Swing Low @5V RL=500 #3 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
268
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.131. Raw data for Output Voltage Swing Low @5V RL=500 #3 (V) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing Low @5V RL=500 #3 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
40
9.03E-01
9.30E-01
9.11E-01
9.26E-01
9.18E-01
8.93E-01
8.86E-01
9.00E-01
8.93E-01
8.93E-01
8.91E-01
8.92E-01
50
9.07E-01
9.40E-01
9.15E-01
9.35E-01
9.25E-01
8.95E-01
8.89E-01
9.03E-01
8.96E-01
8.95E-01
8.92E-01
8.92E-01
24-hr
Anneal
60
9.05E-01
9.40E-01
9.16E-01
9.37E-01
9.25E-01
8.94E-01
8.88E-01
9.02E-01
8.96E-01
8.95E-01
8.92E-01
8.92E-01
9.13E-01
8.12E-03
9.35E-01
8.91E-01
9.18E-01
1.10E-02
9.48E-01
8.88E-01
9.24E-01
1.37E-02
9.62E-01
8.87E-01
9.25E-01
1.46E-02
9.65E-01
8.85E-01
9.11E-01
6.10E-03
9.28E-01
8.94E-01
8.93E-01
4.97E-03
9.07E-01
8.80E-01
1.12E+00
N/A
8.93E-01
4.95E-03
9.07E-01
8.79E-01
1.13E+00
N/A
8.96E-01
4.98E-03
9.09E-01
8.82E-01
1.15E+00
PASS
8.95E-01
5.00E-03
9.09E-01
8.81E-01
1.15E+00
PASS
8.93E-01
4.66E-03
9.06E-01
8.80E-01
1.15E+00
PASS
Total Dose (krad(Si))
20
30
8.98E-01 9.02E-01
9.12E-01 9.22E-01
9.03E-01 9.08E-01
9.10E-01 9.19E-01
9.10E-01 9.14E-01
8.92E-01 8.93E-01
8.85E-01 8.86E-01
8.98E-01 9.00E-01
8.93E-01 8.94E-01
8.93E-01 8.93E-01
8.92E-01 8.92E-01
8.92E-01 8.92E-01
0
8.92E-01
8.91E-01
8.89E-01
8.92E-01
8.94E-01
8.88E-01
8.82E-01
8.95E-01
8.89E-01
8.90E-01
8.93E-01
8.93E-01
10
8.94E-01
8.99E-01
8.96E-01
8.99E-01
9.01E-01
8.89E-01
8.84E-01
8.97E-01
8.91E-01
8.91E-01
8.92E-01
8.92E-01
8.92E-01
1.82E-03
8.97E-01
8.87E-01
8.98E-01
2.77E-03
9.05E-01
8.90E-01
9.07E-01
5.90E-03
9.23E-01
8.90E-01
8.89E-01
4.66E-03
9.02E-01
8.76E-01
1.10E+00
PASS
8.90E-01
4.67E-03
9.03E-01
8.78E-01
1.10E+00
PASS
8.92E-01
4.66E-03
9.05E-01
8.79E-01
1.10E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
269
168-hr
Anneal
70
9.01E-01
9.17E-01
9.13E-01
9.14E-01
9.11E-01
8.92E-01
8.86E-01
8.99E-01
8.93E-01
8.94E-01
8.93E-01
8.93E-01
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Output Voltage Swing Low @5V RL=500 #4 (V)
1.40E+00
1.20E+00
1.00E+00
8.00E-01
6.00E-01
4.00E-01
2.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.132. Plot of Output Voltage Swing Low @5V RL=500 #4 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
270
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.132. Raw data for Output Voltage Swing Low @5V RL=500 #4 (V) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing Low @5V RL=500 #4 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
40
9.03E-01
9.40E-01
9.15E-01
9.23E-01
9.20E-01
8.94E-01
8.89E-01
8.94E-01
8.93E-01
8.88E-01
8.90E-01
8.90E-01
50
9.06E-01
9.54E-01
9.18E-01
9.31E-01
9.25E-01
8.96E-01
8.92E-01
8.97E-01
8.96E-01
8.90E-01
8.90E-01
8.91E-01
24-hr
Anneal
60
9.06E-01
9.54E-01
9.20E-01
9.33E-01
9.26E-01
8.95E-01
8.92E-01
8.96E-01
8.96E-01
8.90E-01
8.90E-01
8.90E-01
9.15E-01
9.39E-03
9.41E-01
8.89E-01
9.20E-01
1.34E-02
9.57E-01
8.83E-01
9.27E-01
1.78E-02
9.76E-01
8.78E-01
9.28E-01
1.77E-02
9.76E-01
8.79E-01
9.11E-01
7.14E-03
9.31E-01
8.91E-01
8.92E-01
2.59E-03
8.99E-01
8.85E-01
1.12E+00
N/A
8.92E-01
2.88E-03
8.99E-01
8.84E-01
1.13E+00
N/A
8.94E-01
3.03E-03
9.03E-01
8.86E-01
1.15E+00
PASS
8.94E-01
2.68E-03
9.01E-01
8.86E-01
1.15E+00
PASS
8.91E-01
2.83E-03
8.99E-01
8.83E-01
1.15E+00
PASS
Total Dose (krad(Si))
20
30
8.99E-01 9.03E-01
9.14E-01 9.29E-01
9.08E-01 9.12E-01
9.10E-01 9.17E-01
9.12E-01 9.15E-01
8.92E-01 8.93E-01
8.89E-01 8.90E-01
8.93E-01 8.94E-01
8.93E-01 8.95E-01
8.87E-01 8.89E-01
8.91E-01 8.91E-01
8.91E-01 8.91E-01
0
8.93E-01
8.92E-01
8.93E-01
8.92E-01
8.95E-01
8.89E-01
8.84E-01
8.90E-01
8.89E-01
8.85E-01
8.91E-01
8.91E-01
10
8.95E-01
9.00E-01
8.99E-01
9.00E-01
9.02E-01
8.90E-01
8.86E-01
8.91E-01
8.91E-01
8.85E-01
8.90E-01
8.91E-01
8.93E-01
1.22E-03
8.96E-01
8.90E-01
8.99E-01
2.59E-03
9.06E-01
8.92E-01
9.09E-01
5.81E-03
9.25E-01
8.93E-01
8.87E-01
2.70E-03
8.95E-01
8.80E-01
1.10E+00
PASS
8.89E-01
2.88E-03
8.96E-01
8.81E-01
1.10E+00
PASS
8.91E-01
2.68E-03
8.98E-01
8.83E-01
1.10E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
271
168-hr
Anneal
70
9.00E-01
9.20E-01
9.12E-01
9.11E-01
9.12E-01
8.92E-01
8.88E-01
8.94E-01
8.93E-01
8.88E-01
8.91E-01
8.91E-01
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Output Voltage Swing Low @5V RL=100 #1 (V)
1.60E+00
1.40E+00
1.20E+00
1.00E+00
8.00E-01
6.00E-01
4.00E-01
2.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.133. Plot of Output Voltage Swing Low @5V RL=100 #1 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
272
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.133. Raw data for Output Voltage Swing Low @5V RL=100 #1 (V) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing Low @5V RL=100 #1 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
50
1.08E+00
1.12E+00
1.10E+00
1.11E+00
1.11E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
24-hr
Anneal
60
1.08E+00
1.12E+00
1.10E+00
1.11E+00
1.11E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
168-hr
Anneal
70
1.08E+00
1.10E+00
1.10E+00
1.10E+00
1.10E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
0
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
10
1.07E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
Total Dose (krad(Si))
20
30
1.08E+00 1.08E+00
1.10E+00 1.10E+00
1.09E+00 1.09E+00
1.09E+00 1.10E+00
1.09E+00 1.10E+00
1.07E+00 1.07E+00
1.07E+00 1.07E+00
1.07E+00 1.07E+00
1.07E+00 1.07E+00
1.07E+00 1.07E+00
1.07E+00 1.07E+00
1.07E+00 1.07E+00
1.07E+00
5.48E-04
1.07E+00
1.07E+00
1.08E+00
3.21E-03
1.09E+00
1.07E+00
1.09E+00
6.88E-03
1.11E+00
1.07E+00
1.09E+00
9.11E-03
1.12E+00
1.07E+00
1.10E+00
1.10E-02
1.13E+00
1.07E+00
1.10E+00
1.28E-02
1.14E+00
1.07E+00
1.10E+00
1.34E-02
1.14E+00
1.07E+00
1.09E+00
8.17E-03
1.12E+00
1.07E+00
1.07E+00
1.92E-03
1.07E+00
1.06E+00
1.30E+00
PASS
1.07E+00
2.30E-03
1.07E+00
1.06E+00
1.30E+00
PASS
1.07E+00
2.39E-03
1.08E+00
1.06E+00
1.35E+00
PASS
1.07E+00
2.19E-03
1.08E+00
1.06E+00
1.37E+00
N/A
1.07E+00
2.07E-03
1.08E+00
1.06E+00
1.38E+00
N/A
1.07E+00
2.51E-03
1.08E+00
1.07E+00
1.40E+00
PASS
1.07E+00
2.17E-03
1.08E+00
1.07E+00
1.40E+00
PASS
1.07E+00
1.92E-03
1.08E+00
1.06E+00
1.40E+00
PASS
40
1.08E+00
1.11E+00
1.10E+00
1.10E+00
1.10E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
An ISO 9001:2008 and DSCC Certified Company
273
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Output Voltage Swing Low @5V RL=100 #2 (V)
1.60E+00
1.40E+00
1.20E+00
1.00E+00
8.00E-01
6.00E-01
4.00E-01
2.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.134. Plot of Output Voltage Swing Low @5V RL=100 #2 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
274
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.134. Raw data for Output Voltage Swing Low @5V RL=100 #2 (V) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing Low @5V RL=100 #2 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
50
1.08E+00
1.11E+00
1.10E+00
1.12E+00
1.10E+00
1.07E+00
1.07E+00
1.08E+00
1.07E+00
1.08E+00
1.07E+00
1.07E+00
24-hr
Anneal
60
1.08E+00
1.11E+00
1.10E+00
1.12E+00
1.10E+00
1.07E+00
1.07E+00
1.08E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
168-hr
Anneal
70
1.08E+00
1.10E+00
1.10E+00
1.10E+00
1.09E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
0
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
10
1.07E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
Total Dose (krad(Si))
20
30
1.08E+00 1.08E+00
1.09E+00 1.10E+00
1.09E+00 1.09E+00
1.09E+00 1.10E+00
1.09E+00 1.09E+00
1.07E+00 1.07E+00
1.07E+00 1.07E+00
1.07E+00 1.08E+00
1.07E+00 1.07E+00
1.07E+00 1.07E+00
1.07E+00 1.07E+00
1.07E+00 1.07E+00
1.07E+00
1.10E-03
1.07E+00
1.07E+00
1.08E+00
2.68E-03
1.09E+00
1.07E+00
1.09E+00
6.77E-03
1.11E+00
1.07E+00
1.09E+00
9.23E-03
1.12E+00
1.07E+00
1.10E+00
1.18E-02
1.13E+00
1.06E+00
1.10E+00
1.40E-02
1.14E+00
1.06E+00
1.10E+00
1.45E-02
1.14E+00
1.06E+00
1.09E+00
8.28E-03
1.11E+00
1.07E+00
1.07E+00
1.34E-03
1.07E+00
1.07E+00
1.30E+00
PASS
1.07E+00
1.30E-03
1.07E+00
1.07E+00
1.30E+00
PASS
1.07E+00
1.52E-03
1.08E+00
1.07E+00
1.35E+00
PASS
1.07E+00
1.52E-03
1.08E+00
1.07E+00
1.37E+00
N/A
1.07E+00
1.67E-03
1.08E+00
1.07E+00
1.38E+00
N/A
1.07E+00
1.67E-03
1.08E+00
1.07E+00
1.40E+00
PASS
1.07E+00
1.52E-03
1.08E+00
1.07E+00
1.40E+00
PASS
1.07E+00
1.52E-03
1.08E+00
1.07E+00
1.40E+00
PASS
40
1.08E+00
1.11E+00
1.09E+00
1.11E+00
1.09E+00
1.07E+00
1.07E+00
1.08E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
An ISO 9001:2008 and DSCC Certified Company
275
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Output Voltage Swing Low @5V RL=100 #3 (V)
1.60E+00
1.40E+00
1.20E+00
1.00E+00
8.00E-01
6.00E-01
4.00E-01
2.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.135. Plot of Output Voltage Swing Low @5V RL=100 #3 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
276
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.135. Raw data for Output Voltage Swing Low @5V RL=100 #3 (V) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing Low @5V RL=100 #3 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
50
1.08E+00
1.12E+00
1.10E+00
1.11E+00
1.10E+00
1.07E+00
1.07E+00
1.08E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
24-hr
Anneal
60
1.08E+00
1.12E+00
1.10E+00
1.11E+00
1.10E+00
1.07E+00
1.07E+00
1.08E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
168-hr
Anneal
70
1.08E+00
1.10E+00
1.10E+00
1.10E+00
1.09E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
0
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
10
1.07E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
Total Dose (krad(Si))
20
30
1.08E+00 1.08E+00
1.09E+00 1.10E+00
1.09E+00 1.09E+00
1.09E+00 1.10E+00
1.09E+00 1.09E+00
1.07E+00 1.07E+00
1.07E+00 1.07E+00
1.07E+00 1.08E+00
1.07E+00 1.07E+00
1.07E+00 1.07E+00
1.07E+00 1.07E+00
1.07E+00 1.07E+00
1.07E+00
8.37E-04
1.07E+00
1.07E+00
1.08E+00
2.77E-03
1.09E+00
1.07E+00
1.09E+00
6.83E-03
1.11E+00
1.07E+00
1.09E+00
9.14E-03
1.12E+00
1.07E+00
1.10E+00
1.13E-02
1.13E+00
1.07E+00
1.10E+00
1.36E-02
1.14E+00
1.06E+00
1.10E+00
1.39E-02
1.14E+00
1.06E+00
1.09E+00
8.87E-03
1.12E+00
1.07E+00
1.07E+00
1.87E-03
1.07E+00
1.06E+00
1.30E+00
PASS
1.07E+00
2.07E-03
1.08E+00
1.06E+00
1.30E+00
PASS
1.07E+00
1.92E-03
1.08E+00
1.07E+00
1.35E+00
PASS
1.07E+00
2.30E-03
1.08E+00
1.07E+00
1.37E+00
N/A
1.07E+00
2.70E-03
1.08E+00
1.06E+00
1.38E+00
N/A
1.07E+00
2.55E-03
1.08E+00
1.07E+00
1.40E+00
PASS
1.07E+00
2.55E-03
1.08E+00
1.07E+00
1.40E+00
PASS
1.07E+00
2.05E-03
1.08E+00
1.07E+00
1.40E+00
PASS
40
1.08E+00
1.11E+00
1.09E+00
1.11E+00
1.10E+00
1.07E+00
1.07E+00
1.08E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
An ISO 9001:2008 and DSCC Certified Company
277
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Output Voltage Swing Low @5V RL=100 #4 (V)
1.60E+00
1.40E+00
1.20E+00
1.00E+00
8.00E-01
6.00E-01
4.00E-01
2.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.136. Plot of Output Voltage Swing Low @5V RL=100 #4 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
278
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.136. Raw data for Output Voltage Swing Low @5V RL=100 #4 (V) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Output Voltage Swing Low @5V RL=100 #4 (V)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
50
1.08E+00
1.13E+00
1.10E+00
1.11E+00
1.10E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
24-hr
Anneal
60
1.08E+00
1.13E+00
1.10E+00
1.11E+00
1.10E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
168-hr
Anneal
70
1.08E+00
1.10E+00
1.10E+00
1.09E+00
1.09E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
0
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
10
1.07E+00
1.08E+00
1.08E+00
1.08E+00
1.08E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
Total Dose (krad(Si))
20
30
1.08E+00 1.08E+00
1.10E+00 1.11E+00
1.09E+00 1.09E+00
1.09E+00 1.10E+00
1.09E+00 1.09E+00
1.07E+00 1.07E+00
1.07E+00 1.07E+00
1.07E+00 1.07E+00
1.07E+00 1.07E+00
1.07E+00 1.07E+00
1.07E+00 1.07E+00
1.07E+00 1.07E+00
1.07E+00
8.37E-04
1.07E+00
1.07E+00
1.08E+00
3.21E-03
1.09E+00
1.07E+00
1.09E+00
7.70E-03
1.11E+00
1.07E+00
1.09E+00
1.08E-02
1.12E+00
1.06E+00
1.10E+00
1.35E-02
1.14E+00
1.06E+00
1.10E+00
1.69E-02
1.15E+00
1.06E+00
1.10E+00
1.73E-02
1.15E+00
1.06E+00
1.09E+00
9.09E-03
1.12E+00
1.07E+00
1.07E+00
2.07E-03
1.07E+00
1.06E+00
1.30E+00
PASS
1.07E+00
2.24E-03
1.08E+00
1.06E+00
1.30E+00
PASS
1.07E+00
1.95E-03
1.08E+00
1.07E+00
1.35E+00
PASS
1.07E+00
2.00E-03
1.08E+00
1.07E+00
1.37E+00
N/A
1.07E+00
2.30E-03
1.08E+00
1.06E+00
1.38E+00
N/A
1.07E+00
2.19E-03
1.08E+00
1.07E+00
1.40E+00
PASS
1.07E+00
1.92E-03
1.08E+00
1.07E+00
1.40E+00
PASS
1.07E+00
1.95E-03
1.08E+00
1.07E+00
1.40E+00
PASS
40
1.08E+00
1.12E+00
1.09E+00
1.10E+00
1.10E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
1.07E+00
An ISO 9001:2008 and DSCC Certified Company
279
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Maximum Output Source Current @5V #1 (A)
4.50E-02
4.00E-02
3.50E-02
3.00E-02
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.137. Plot of Maximum Output Source Current @5V #1 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
280
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.137. Raw data for Maximum Output Source Current @5V #1 (A) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Maximum Output Source Current @5V #1 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
3.98E-02
3.96E-02
4.03E-02
4.00E-02
3.95E-02
4.09E-02
4.03E-02
4.03E-02
4.08E-02
4.17E-02
4.12E-02
4.08E-02
24-hr
Anneal
60
3.99E-02
3.97E-02
4.04E-02
4.00E-02
3.96E-02
4.10E-02
4.03E-02
4.04E-02
4.10E-02
4.18E-02
4.13E-02
4.10E-02
168-hr
Anneal
70
4.03E-02
4.00E-02
4.07E-02
4.04E-02
4.00E-02
4.12E-02
4.06E-02
4.05E-02
4.10E-02
4.19E-02
4.13E-02
4.09E-02
3.99E-02
3.14E-04
4.07E-02
3.90E-02
3.98E-02
3.44E-04
4.08E-02
3.89E-02
3.99E-02
3.05E-04
4.07E-02
3.91E-02
4.03E-02
3.00E-04
4.11E-02
3.94E-02
4.09E-02
6.01E-04
4.25E-02
3.92E-02
2.50E-02
NA
4.08E-02
5.71E-04
4.23E-02
3.92E-02
2.50E-02
NA
4.09E-02
5.88E-04
4.25E-02
3.93E-02
2.50E-02
NA
4.10E-02
5.84E-04
4.26E-02
3.94E-02
2.50E-02
NA
0
4.09E-02
4.07E-02
4.14E-02
4.10E-02
4.06E-02
4.13E-02
4.07E-02
4.07E-02
4.13E-02
4.22E-02
4.12E-02
4.09E-02
Total Dose (krad(Si))
10
20
30
40
4.02E-02 4.00E-02 3.96E-02 3.97E-02
3.99E-02 3.98E-02 3.94E-02 3.96E-02
4.07E-02 4.06E-02 4.02E-02 4.03E-02
4.02E-02 4.01E-02 3.99E-02 4.00E-02
3.98E-02 3.97E-02 3.95E-02 3.96E-02
4.10E-02 4.10E-02 4.07E-02 4.10E-02
4.05E-02 4.05E-02 4.02E-02 4.03E-02
4.05E-02 4.04E-02 4.02E-02 4.03E-02
4.10E-02 4.10E-02 4.07E-02 4.10E-02
4.19E-02 4.19E-02 4.16E-02 4.18E-02
4.12E-02 4.12E-02 4.10E-02 4.12E-02
4.08E-02 4.10E-02 4.05E-02 4.08E-02
4.09E-02
3.28E-04
4.18E-02
4.00E-02
4.02E-02
3.44E-04
4.11E-02
3.92E-02
4.01E-02
3.19E-04
4.09E-02
3.92E-02
3.97E-02
3.36E-04
4.06E-02
3.88E-02
4.12E-02
6.08E-04
4.29E-02
3.96E-02
2.50E-02
PASS
4.10E-02
5.92E-04
4.26E-02
3.93E-02
2.50E-02
NA
4.10E-02
6.19E-04
4.26E-02
3.93E-02
2.50E-02
NA
4.07E-02
5.61E-04
4.22E-02
3.91E-02
2.50E-02
NA
An ISO 9001:2008 and DSCC Certified Company
281
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Maximum Output Source Current @5V #2 (A)
4.50E-02
4.00E-02
3.50E-02
3.00E-02
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.138. Plot of Maximum Output Source Current @5V #2 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
282
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.138. Raw data for Maximum Output Source Current @5V #2 (A) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Maximum Output Source Current @5V #2 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
3.98E-02
3.95E-02
4.08E-02
3.97E-02
3.97E-02
4.08E-02
4.03E-02
4.00E-02
4.08E-02
4.03E-02
4.06E-02
4.06E-02
24-hr
Anneal
60
3.98E-02
3.96E-02
4.08E-02
3.97E-02
3.99E-02
4.10E-02
4.04E-02
4.01E-02
4.09E-02
4.04E-02
4.07E-02
4.07E-02
168-hr
Anneal
70
4.02E-02
4.00E-02
4.12E-02
4.01E-02
4.01E-02
4.11E-02
4.05E-02
4.02E-02
4.11E-02
4.05E-02
4.07E-02
4.07E-02
4.00E-02
5.08E-04
4.14E-02
3.86E-02
3.99E-02
5.36E-04
4.14E-02
3.84E-02
4.00E-02
4.90E-04
4.13E-02
3.86E-02
4.03E-02
4.96E-04
4.17E-02
3.90E-02
4.05E-02
3.88E-04
4.16E-02
3.95E-02
2.50E-02
NA
4.05E-02
3.65E-04
4.15E-02
3.95E-02
2.50E-02
NA
4.06E-02
3.70E-04
4.16E-02
3.96E-02
2.50E-02
NA
4.07E-02
3.97E-04
4.18E-02
3.96E-02
2.50E-02
NA
0
4.08E-02
4.06E-02
4.19E-02
4.07E-02
4.07E-02
4.13E-02
4.07E-02
4.04E-02
4.12E-02
4.07E-02
4.06E-02
4.06E-02
Total Dose (krad(Si))
10
20
30
40
4.03E-02 4.00E-02 3.96E-02 3.97E-02
4.00E-02 3.99E-02 3.95E-02 3.96E-02
4.13E-02 4.11E-02 4.07E-02 4.09E-02
4.01E-02 4.00E-02 3.96E-02 3.97E-02
4.01E-02 4.00E-02 3.97E-02 3.99E-02
4.11E-02 4.12E-02 4.08E-02 4.10E-02
4.05E-02 4.06E-02 4.02E-02 4.03E-02
4.02E-02 4.03E-02 4.00E-02 4.01E-02
4.11E-02 4.11E-02 4.08E-02 4.10E-02
4.05E-02 4.06E-02 4.02E-02 4.03E-02
4.06E-02 4.08E-02 4.05E-02 4.07E-02
4.06E-02 4.08E-02 4.05E-02 4.06E-02
4.10E-02
5.47E-04
4.24E-02
3.95E-02
4.04E-02
5.56E-04
4.19E-02
3.89E-02
4.02E-02
5.00E-04
4.16E-02
3.88E-02
3.98E-02
4.94E-04
4.12E-02
3.85E-02
4.09E-02
3.95E-04
4.19E-02
3.98E-02
2.50E-02
PASS
4.07E-02
3.85E-04
4.17E-02
3.96E-02
2.50E-02
NA
4.07E-02
3.83E-04
4.18E-02
3.97E-02
2.50E-02
NA
4.04E-02
3.69E-04
4.14E-02
3.94E-02
2.50E-02
NA
An ISO 9001:2008 and DSCC Certified Company
283
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Maximum Output Source Current @5V #3 (A)
4.50E-02
4.00E-02
3.50E-02
3.00E-02
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.139. Plot of Maximum Output Source Current @5V #3 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
284
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.139. Raw data for Maximum Output Source Current @5V #3 (A) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Maximum Output Source Current @5V #3 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
3.98E-02
3.95E-02
4.10E-02
3.99E-02
3.99E-02
4.09E-02
4.05E-02
4.01E-02
4.08E-02
4.04E-02
4.06E-02
4.07E-02
24-hr
Anneal
60
3.99E-02
3.96E-02
4.10E-02
3.99E-02
4.00E-02
4.10E-02
4.06E-02
4.02E-02
4.10E-02
4.05E-02
4.07E-02
4.08E-02
168-hr
Anneal
70
4.03E-02
3.99E-02
4.14E-02
4.03E-02
4.02E-02
4.12E-02
4.07E-02
4.03E-02
4.11E-02
4.06E-02
4.07E-02
4.08E-02
4.01E-02
5.56E-04
4.16E-02
3.86E-02
4.00E-02
5.57E-04
4.15E-02
3.85E-02
4.01E-02
5.31E-04
4.15E-02
3.86E-02
4.05E-02
5.73E-04
4.20E-02
3.89E-02
4.07E-02
3.79E-04
4.17E-02
3.96E-02
2.50E-02
NA
4.05E-02
3.20E-04
4.14E-02
3.97E-02
2.50E-02
NA
4.06E-02
3.33E-04
4.16E-02
3.97E-02
2.50E-02
NA
4.08E-02
3.66E-04
4.18E-02
3.98E-02
2.50E-02
NA
0
4.10E-02
4.06E-02
4.22E-02
4.09E-02
4.08E-02
4.13E-02
4.08E-02
4.05E-02
4.13E-02
4.07E-02
4.07E-02
4.07E-02
Total Dose (krad(Si))
10
20
30
40
4.05E-02 4.02E-02 3.98E-02 3.99E-02
4.00E-02 3.99E-02 3.95E-02 3.96E-02
4.15E-02 4.13E-02 4.10E-02 4.11E-02
4.04E-02 4.02E-02 3.99E-02 4.00E-02
4.02E-02 4.02E-02 3.99E-02 4.00E-02
4.12E-02 4.12E-02 4.09E-02 4.11E-02
4.07E-02 4.07E-02 4.04E-02 4.05E-02
4.04E-02 4.05E-02 4.01E-02 4.02E-02
4.11E-02 4.12E-02 4.08E-02 4.10E-02
4.05E-02 4.06E-02 4.03E-02 4.05E-02
4.07E-02 4.08E-02 4.05E-02 4.07E-02
4.07E-02 4.09E-02 4.06E-02 4.08E-02
4.11E-02
6.15E-04
4.28E-02
3.94E-02
4.05E-02
6.01E-04
4.22E-02
3.89E-02
4.04E-02
5.58E-04
4.19E-02
3.88E-02
4.00E-02
5.57E-04
4.15E-02
3.85E-02
4.09E-02
3.58E-04
4.19E-02
4.00E-02
2.50E-02
PASS
4.08E-02
3.75E-04
4.18E-02
3.97E-02
2.50E-02
NA
4.08E-02
3.43E-04
4.18E-02
3.99E-02
2.50E-02
NA
4.05E-02
3.41E-04
4.14E-02
3.96E-02
2.50E-02
NA
An ISO 9001:2008 and DSCC Certified Company
285
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Maximum Output Source Current @5V #4 (A)
4.50E-02
4.00E-02
3.50E-02
3.00E-02
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.140. Plot of Maximum Output Source Current @5V #4 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with
all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
286
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.140. Raw data for Maximum Output Source Current @5V #4 (A) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Maximum Output Source Current @5V #4 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
3.99E-02
3.96E-02
4.06E-02
4.02E-02
3.96E-02
4.10E-02
4.02E-02
4.05E-02
4.08E-02
4.16E-02
4.11E-02
4.11E-02
24-hr
Anneal
60
4.00E-02
3.96E-02
4.06E-02
4.02E-02
3.97E-02
4.11E-02
4.03E-02
4.06E-02
4.10E-02
4.17E-02
4.12E-02
4.12E-02
168-hr
Anneal
70
4.04E-02
4.00E-02
4.09E-02
4.06E-02
4.00E-02
4.13E-02
4.05E-02
4.07E-02
4.11E-02
4.18E-02
4.12E-02
4.12E-02
4.00E-02
3.90E-04
4.11E-02
3.90E-02
4.00E-02
4.07E-04
4.11E-02
3.89E-02
4.00E-02
3.91E-04
4.11E-02
3.90E-02
4.04E-02
3.76E-04
4.14E-02
3.93E-02
4.10E-02
5.28E-04
4.24E-02
3.95E-02
2.50E-02
NA
4.08E-02
5.13E-04
4.22E-02
3.94E-02
2.50E-02
NA
4.10E-02
5.20E-04
4.24E-02
3.95E-02
2.50E-02
NA
4.11E-02
5.23E-04
4.25E-02
3.97E-02
2.50E-02
NA
0
4.09E-02
4.07E-02
4.16E-02
4.12E-02
4.06E-02
4.14E-02
4.07E-02
4.08E-02
4.13E-02
4.20E-02
4.12E-02
4.11E-02
Total Dose (krad(Si))
10
20
30
40
4.05E-02 4.02E-02 3.99E-02 4.00E-02
4.01E-02 3.99E-02 3.96E-02 3.96E-02
4.10E-02 4.08E-02 4.05E-02 4.06E-02
4.06E-02 4.05E-02 4.01E-02 4.02E-02
4.00E-02 3.99E-02 3.96E-02 3.97E-02
4.13E-02 4.13E-02 4.10E-02 4.11E-02
4.05E-02 4.05E-02 4.02E-02 4.03E-02
4.07E-02 4.07E-02 4.04E-02 4.06E-02
4.11E-02 4.12E-02 4.08E-02 4.10E-02
4.19E-02 4.19E-02 4.16E-02 4.17E-02
4.12E-02 4.13E-02 4.11E-02 4.12E-02
4.11E-02 4.13E-02 4.10E-02 4.11E-02
4.10E-02
4.05E-04
4.21E-02
3.99E-02
4.04E-02
3.89E-04
4.15E-02
3.94E-02
4.02E-02
4.17E-04
4.14E-02
3.91E-02
3.99E-02
3.65E-04
4.09E-02
3.89E-02
4.13E-02
5.35E-04
4.27E-02
3.98E-02
2.50E-02
PASS
4.11E-02
5.54E-04
4.26E-02
3.96E-02
2.50E-02
NA
4.11E-02
5.51E-04
4.26E-02
3.96E-02
2.50E-02
NA
4.08E-02
5.20E-04
4.22E-02
3.94E-02
2.50E-02
NA
An ISO 9001:2008 and DSCC Certified Company
287
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Maximum Output Sink Current @5V #1 (A)
0.00E+00
-5.00E-03
-1.00E-02
-1.50E-02
-2.00E-02
-2.50E-02
-3.00E-02
-3.50E-02
-4.00E-02
-4.50E-02
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.141. Plot of Maximum Output Sink Current @5V #1 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
288
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.141. Raw data for Maximum Output Sink Current @5V #1 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Maximum Output Sink Current @5V #1 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
50
-3.70E-02
-3.36E-02
-3.52E-02
-3.43E-02
-3.50E-02
-3.82E-02
-3.76E-02
-3.81E-02
-3.81E-02
-3.88E-02
-3.83E-02
-3.82E-02
24-hr
Anneal
60
-3.71E-02
-3.35E-02
-3.51E-02
-3.42E-02
-3.48E-02
-3.82E-02
-3.76E-02
-3.81E-02
-3.81E-02
-3.88E-02
-3.83E-02
-3.82E-02
168-hr
Anneal
70
-3.75E-02
-3.53E-02
-3.58E-02
-3.57E-02
-3.59E-02
-3.84E-02
-3.79E-02
-3.82E-02
-3.82E-02
-3.89E-02
-3.83E-02
-3.82E-02
0
-3.83E-02
-3.83E-02
-3.86E-02
-3.85E-02
-3.83E-02
-3.88E-02
-3.82E-02
-3.86E-02
-3.86E-02
-3.93E-02
-3.85E-02
-3.82E-02
10
-3.79E-02
-3.71E-02
-3.74E-02
-3.72E-02
-3.71E-02
-3.85E-02
-3.80E-02
-3.83E-02
-3.83E-02
-3.90E-02
-3.83E-02
-3.81E-02
Total Dose (krad(Si))
20
30
-3.75E-02 -3.74E-02
-3.58E-02 -3.50E-02
-3.64E-02 -3.60E-02
-3.61E-02 -3.54E-02
-3.63E-02 -3.59E-02
-3.83E-02 -3.84E-02
-3.77E-02 -3.79E-02
-3.81E-02 -3.82E-02
-3.81E-02 -3.82E-02
-3.88E-02 -3.90E-02
-3.82E-02 -3.84E-02
-3.81E-02 -3.81E-02
-3.84E-02
1.09E-04
-3.81E-02
-3.87E-02
-3.73E-02
3.01E-04
-3.65E-02
-3.82E-02
-3.64E-02
6.42E-04
-3.47E-02
-3.82E-02
-3.59E-02
9.09E-04
-3.34E-02
-3.84E-02
-3.54E-02
1.08E-03
-3.24E-02
-3.84E-02
-3.50E-02
1.28E-03
-3.15E-02
-3.85E-02
-3.49E-02
1.36E-03
-3.12E-02
-3.87E-02
-3.60E-02
8.39E-04
-3.37E-02
-3.83E-02
-3.87E-02
3.93E-04
-3.76E-02
-3.98E-02
-2.50E-02
PASS
-3.84E-02
3.69E-04
-3.74E-02
-3.94E-02
-2.50E-02
NA
-3.82E-02
3.98E-04
-3.71E-02
-3.93E-02
-2.50E-02
NA
-3.83E-02
4.01E-04
-3.72E-02
-3.94E-02
-2.50E-02
NA
-3.82E-02
3.99E-04
-3.71E-02
-3.93E-02
-2.50E-02
NA
-3.82E-02
4.33E-04
-3.70E-02
-3.94E-02
-2.50E-02
NA
-3.82E-02
4.33E-04
-3.70E-02
-3.94E-02
-2.50E-02
NA
-3.83E-02
3.88E-04
-3.73E-02
-3.94E-02
-2.50E-02
NA
40
-3.71E-02
-3.42E-02
-3.55E-02
-3.48E-02
-3.53E-02
-3.82E-02
-3.77E-02
-3.81E-02
-3.81E-02
-3.88E-02
-3.83E-02
-3.81E-02
An ISO 9001:2008 and DSCC Certified Company
289
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Maximum Output Sink Current @5V #2 (A)
0.00E+00
-5.00E-03
-1.00E-02
-1.50E-02
-2.00E-02
-2.50E-02
-3.00E-02
-3.50E-02
-4.00E-02
-4.50E-02
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.142. Plot of Maximum Output Sink Current @5V #2 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
290
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.142. Raw data for Maximum Output Sink Current @5V #2 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Maximum Output Sink Current @5V #2 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
50
-3.71E-02
-3.41E-02
-3.58E-02
-3.39E-02
-3.57E-02
-3.81E-02
-3.77E-02
-3.79E-02
-3.82E-02
-3.81E-02
-3.83E-02
-3.82E-02
24-hr
Anneal
60
-3.72E-02
-3.41E-02
-3.56E-02
-3.37E-02
-3.56E-02
-3.82E-02
-3.79E-02
-3.80E-02
-3.82E-02
-3.81E-02
-3.83E-02
-3.82E-02
168-hr
Anneal
70
-3.75E-02
-3.57E-02
-3.57E-02
-3.57E-02
-3.64E-02
-3.84E-02
-3.80E-02
-3.80E-02
-3.83E-02
-3.82E-02
-3.83E-02
-3.82E-02
0
-3.83E-02
-3.84E-02
-3.87E-02
-3.83E-02
-3.85E-02
-3.87E-02
-3.83E-02
-3.83E-02
-3.87E-02
-3.85E-02
-3.84E-02
-3.82E-02
10
-3.79E-02
-3.74E-02
-3.76E-02
-3.72E-02
-3.75E-02
-3.85E-02
-3.81E-02
-3.81E-02
-3.85E-02
-3.82E-02
-3.83E-02
-3.82E-02
Total Dose (krad(Si))
20
30
-3.76E-02 -3.75E-02
-3.60E-02 -3.54E-02
-3.67E-02 -3.64E-02
-3.59E-02 -3.52E-02
-3.68E-02 -3.65E-02
-3.83E-02 -3.84E-02
-3.80E-02 -3.80E-02
-3.80E-02 -3.81E-02
-3.83E-02 -3.84E-02
-3.82E-02 -3.82E-02
-3.83E-02 -3.84E-02
-3.82E-02 -3.83E-02
-3.84E-02
1.60E-04
-3.80E-02
-3.89E-02
-3.75E-02
2.42E-04
-3.69E-02
-3.82E-02
-3.66E-02
6.69E-04
-3.48E-02
-3.84E-02
-3.62E-02
9.11E-04
-3.37E-02
-3.87E-02
-3.57E-02
1.14E-03
-3.26E-02
-3.88E-02
-3.53E-02
1.35E-03
-3.16E-02
-3.90E-02
-3.53E-02
1.42E-03
-3.14E-02
-3.92E-02
-3.62E-02
8.06E-04
-3.40E-02
-3.84E-02
-3.85E-02
2.03E-04
-3.79E-02
-3.91E-02
-2.50E-02
PASS
-3.83E-02
2.01E-04
-3.77E-02
-3.88E-02
-2.50E-02
NA
-3.82E-02
1.73E-04
-3.77E-02
-3.86E-02
-2.50E-02
NA
-3.82E-02
1.73E-04
-3.77E-02
-3.87E-02
-2.50E-02
NA
-3.81E-02
1.58E-04
-3.76E-02
-3.85E-02
-2.50E-02
NA
-3.80E-02
1.80E-04
-3.75E-02
-3.85E-02
-2.50E-02
NA
-3.81E-02
1.57E-04
-3.76E-02
-3.85E-02
-2.50E-02
NA
-3.82E-02
1.91E-04
-3.76E-02
-3.87E-02
-2.50E-02
NA
40
-3.73E-02
-3.47E-02
-3.59E-02
-3.44E-02
-3.60E-02
-3.82E-02
-3.79E-02
-3.80E-02
-3.82E-02
-3.81E-02
-3.83E-02
-3.82E-02
An ISO 9001:2008 and DSCC Certified Company
291
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Maximum Output Sink Current @5V #3 (A)
0.00E+00
-5.00E-03
-1.00E-02
-1.50E-02
-2.00E-02
-2.50E-02
-3.00E-02
-3.50E-02
-4.00E-02
-4.50E-02
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.143. Plot of Maximum Output Sink Current @5V #3 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
292
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.143. Raw data for Maximum Output Sink Current @5V #3 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Maximum Output Sink Current @5V #3 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
50
-3.70E-02
-3.37E-02
-3.59E-02
-3.42E-02
-3.51E-02
-3.83E-02
-3.81E-02
-3.78E-02
-3.81E-02
-3.81E-02
-3.85E-02
-3.84E-02
24-hr
Anneal
60
-3.70E-02
-3.37E-02
-3.58E-02
-3.40E-02
-3.49E-02
-3.83E-02
-3.81E-02
-3.79E-02
-3.81E-02
-3.81E-02
-3.85E-02
-3.83E-02
168-hr
Anneal
70
-3.75E-02
-3.54E-02
-3.60E-02
-3.57E-02
-3.60E-02
-3.85E-02
-3.82E-02
-3.79E-02
-3.82E-02
-3.82E-02
-3.83E-02
-3.83E-02
0
-3.83E-02
-3.85E-02
-3.88E-02
-3.86E-02
-3.85E-02
-3.88E-02
-3.86E-02
-3.82E-02
-3.86E-02
-3.86E-02
-3.85E-02
-3.85E-02
10
-3.80E-02
-3.73E-02
-3.79E-02
-3.75E-02
-3.75E-02
-3.86E-02
-3.84E-02
-3.81E-02
-3.84E-02
-3.83E-02
-3.84E-02
-3.83E-02
Total Dose (krad(Si))
20
30
-3.76E-02 -3.74E-02
-3.59E-02 -3.52E-02
-3.69E-02 -3.67E-02
-3.62E-02 -3.56E-02
-3.65E-02 -3.61E-02
-3.85E-02 -3.85E-02
-3.83E-02 -3.83E-02
-3.80E-02 -3.80E-02
-3.83E-02 -3.84E-02
-3.82E-02 -3.83E-02
-3.84E-02 -3.85E-02
-3.83E-02 -3.85E-02
-3.85E-02
1.80E-04
-3.80E-02
-3.90E-02
-3.76E-02
2.84E-04
-3.68E-02
-3.84E-02
-3.66E-02
6.49E-04
-3.48E-02
-3.84E-02
-3.62E-02
8.69E-04
-3.38E-02
-3.86E-02
-3.56E-02
1.07E-03
-3.27E-02
-3.86E-02
-3.52E-02
1.32E-03
-3.16E-02
-3.88E-02
-3.51E-02
1.33E-03
-3.14E-02
-3.88E-02
-3.61E-02
8.04E-04
-3.39E-02
-3.83E-02
-3.86E-02
2.18E-04
-3.80E-02
-3.92E-02
-2.50E-02
PASS
-3.84E-02
1.83E-04
-3.79E-02
-3.89E-02
-2.50E-02
NA
-3.83E-02
1.82E-04
-3.78E-02
-3.88E-02
-2.50E-02
NA
-3.83E-02
2.03E-04
-3.78E-02
-3.89E-02
-2.50E-02
NA
-3.81E-02
1.80E-04
-3.76E-02
-3.86E-02
-2.50E-02
NA
-3.81E-02
1.74E-04
-3.76E-02
-3.86E-02
-2.50E-02
NA
-3.81E-02
1.73E-04
-3.76E-02
-3.86E-02
-2.50E-02
NA
-3.82E-02
2.12E-04
-3.76E-02
-3.88E-02
-2.50E-02
NA
40
-3.71E-02
-3.45E-02
-3.62E-02
-3.48E-02
-3.56E-02
-3.83E-02
-3.81E-02
-3.79E-02
-3.82E-02
-3.82E-02
-3.84E-02
-3.83E-02
An ISO 9001:2008 and DSCC Certified Company
293
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Maximum Output Sink Current @5V #4 (A)
0.00E+00
-5.00E-03
-1.00E-02
-1.50E-02
-2.00E-02
-2.50E-02
-3.00E-02
-3.50E-02
-4.00E-02
-4.50E-02
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.144. Plot of Maximum Output Sink Current @5V #4 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
294
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.144. Raw data for Maximum Output Sink Current @5V #4 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Maximum Output Sink Current @5V #4 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
50
-3.72E-02
-3.25E-02
-3.57E-02
-3.45E-02
-3.52E-02
-3.83E-02
-3.76E-02
-3.81E-02
-3.81E-02
-3.86E-02
-3.82E-02
-3.85E-02
24-hr
Anneal
60
-3.73E-02
-3.25E-02
-3.56E-02
-3.43E-02
-3.51E-02
-3.83E-02
-3.76E-02
-3.81E-02
-3.82E-02
-3.86E-02
-3.82E-02
-3.85E-02
168-hr
Anneal
70
-3.76E-02
-3.50E-02
-3.59E-02
-3.60E-02
-3.61E-02
-3.86E-02
-3.79E-02
-3.82E-02
-3.83E-02
-3.87E-02
-3.82E-02
-3.84E-02
0
-3.84E-02
-3.83E-02
-3.86E-02
-3.86E-02
-3.83E-02
-3.89E-02
-3.82E-02
-3.85E-02
-3.87E-02
-3.91E-02
-3.83E-02
-3.85E-02
10
-3.80E-02
-3.71E-02
-3.75E-02
-3.75E-02
-3.74E-02
-3.87E-02
-3.80E-02
-3.84E-02
-3.85E-02
-3.89E-02
-3.82E-02
-3.84E-02
Total Dose (krad(Si))
20
30
-3.76E-02 -3.75E-02
-3.56E-02 -3.46E-02
-3.66E-02 -3.64E-02
-3.63E-02 -3.57E-02
-3.64E-02 -3.61E-02
-3.86E-02 -3.86E-02
-3.79E-02 -3.79E-02
-3.82E-02 -3.82E-02
-3.84E-02 -3.83E-02
-3.88E-02 -3.88E-02
-3.82E-02 -3.84E-02
-3.84E-02 -3.86E-02
-3.84E-02
1.21E-04
-3.81E-02
-3.88E-02
-3.75E-02
3.10E-04
-3.67E-02
-3.84E-02
-3.65E-02
7.21E-04
-3.45E-02
-3.85E-02
-3.61E-02
1.06E-03
-3.32E-02
-3.90E-02
-3.54E-02
1.39E-03
-3.16E-02
-3.92E-02
-3.50E-02
1.72E-03
-3.03E-02
-3.97E-02
-3.49E-02
1.75E-03
-3.01E-02
-3.97E-02
-3.61E-02
9.33E-04
-3.36E-02
-3.87E-02
-3.87E-02
3.35E-04
-3.78E-02
-3.96E-02
-2.50E-02
PASS
-3.85E-02
3.53E-04
-3.75E-02
-3.95E-02
-2.50E-02
NA
-3.84E-02
3.57E-04
-3.74E-02
-3.93E-02
-2.50E-02
NA
-3.84E-02
3.67E-04
-3.74E-02
-3.94E-02
-2.50E-02
NA
-3.82E-02
3.38E-04
-3.73E-02
-3.91E-02
-2.50E-02
NA
-3.81E-02
3.57E-04
-3.72E-02
-3.91E-02
-2.50E-02
NA
-3.82E-02
3.66E-04
-3.72E-02
-3.92E-02
-2.50E-02
NA
-3.83E-02
3.32E-04
-3.74E-02
-3.92E-02
-2.50E-02
NA
40
-3.73E-02
-3.35E-02
-3.59E-02
-3.50E-02
-3.56E-02
-3.84E-02
-3.77E-02
-3.81E-02
-3.82E-02
-3.86E-02
-3.82E-02
-3.83E-02
An ISO 9001:2008 and DSCC Certified Company
295
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Positive Short-Circuit Current @5V #1 (A)
9.00E-02
8.00E-02
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.145. Plot of Positive Short-Circuit Current @5V #1 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
296
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.145. Raw data for Positive Short-Circuit Current @5V #1 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Positive Short-Circuit Current @5V #1 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
8.34E-02
8.33E-02
8.41E-02
8.37E-02
8.28E-02
8.41E-02
8.41E-02
8.30E-02
8.41E-02
8.60E-02
8.44E-02
8.36E-02
24-hr
Anneal
60
8.33E-02
8.33E-02
8.42E-02
8.37E-02
8.28E-02
8.41E-02
8.41E-02
8.29E-02
8.41E-02
8.60E-02
8.44E-02
8.36E-02
168-hr
Anneal
70
8.35E-02
8.34E-02
8.44E-02
8.38E-02
8.29E-02
8.42E-02
8.42E-02
8.31E-02
8.43E-02
8.62E-02
8.45E-02
8.37E-02
8.34E-02
5.11E-04
8.48E-02
8.20E-02
8.35E-02
4.78E-04
8.48E-02
8.22E-02
8.35E-02
5.45E-04
8.50E-02
8.20E-02
8.36E-02
5.36E-04
8.50E-02
8.21E-02
8.42E-02
1.08E-03
8.72E-02
8.12E-02
5.50E-02
NA
8.43E-02
1.08E-03
8.73E-02
8.13E-02
5.50E-02
NA
8.42E-02
1.09E-03
8.72E-02
8.13E-02
5.50E-02
NA
8.44E-02
1.11E-03
8.74E-02
8.14E-02
5.50E-02
NA
0
8.37E-02
8.38E-02
8.46E-02
8.42E-02
8.32E-02
8.45E-02
8.45E-02
8.33E-02
8.45E-02
8.63E-02
8.45E-02
8.37E-02
Total Dose (krad(Si))
10
20
30
40
8.34E-02 8.34E-02 8.34E-02 8.33E-02
8.35E-02 8.34E-02 8.33E-02 8.33E-02
8.44E-02 8.43E-02 8.42E-02 8.41E-02
8.40E-02 8.39E-02 8.38E-02 8.36E-02
8.29E-02 8.29E-02 8.28E-02 8.27E-02
8.42E-02 8.42E-02 8.41E-02 8.40E-02
8.44E-02 8.43E-02 8.41E-02 8.41E-02
8.32E-02 8.31E-02 8.30E-02 8.29E-02
8.44E-02 8.43E-02 8.42E-02 8.41E-02
8.62E-02 8.61E-02 8.61E-02 8.59E-02
8.44E-02 8.43E-02 8.44E-02 8.44E-02
8.36E-02 8.36E-02 8.35E-02 8.36E-02
8.39E-02
5.47E-04
8.54E-02
8.24E-02
8.36E-02
5.69E-04
8.52E-02
8.21E-02
8.36E-02
5.49E-04
8.51E-02
8.21E-02
8.35E-02
5.53E-04
8.50E-02
8.20E-02
8.46E-02
1.07E-03
8.75E-02
8.17E-02
5.50E-02
PASS
8.45E-02
1.08E-03
8.74E-02
8.15E-02
5.50E-02
NA
8.44E-02
1.05E-03
8.73E-02
8.15E-02
5.50E-02
NA
8.43E-02
1.09E-03
8.73E-02
8.13E-02
5.50E-02
NA
An ISO 9001:2008 and DSCC Certified Company
297
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Positive Short-Circuit Current @5V #2 (A)
9.00E-02
8.00E-02
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.146. Plot of Positive Short-Circuit Current @5V #2 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
298
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.146. Raw data for Positive Short-Circuit Current @5V #2 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Positive Short-Circuit Current @5V #2 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
8.34E-02
8.33E-02
8.56E-02
8.32E-02
8.34E-02
8.42E-02
8.40E-02
8.25E-02
8.41E-02
8.33E-02
8.32E-02
8.32E-02
24-hr
Anneal
60
8.34E-02
8.33E-02
8.57E-02
8.33E-02
8.34E-02
8.41E-02
8.40E-02
8.25E-02
8.41E-02
8.33E-02
8.32E-02
8.32E-02
168-hr
Anneal
70
8.35E-02
8.34E-02
8.58E-02
8.34E-02
8.35E-02
8.43E-02
8.41E-02
8.27E-02
8.43E-02
8.35E-02
8.33E-02
8.34E-02
8.37E-02
1.05E-03
8.66E-02
8.09E-02
8.38E-02
9.92E-04
8.65E-02
8.11E-02
8.38E-02
1.06E-03
8.67E-02
8.09E-02
8.39E-02
1.06E-03
8.68E-02
8.10E-02
8.36E-02
6.92E-04
8.55E-02
8.17E-02
5.50E-02
NA
8.36E-02
7.17E-04
8.56E-02
8.17E-02
5.50E-02
NA
8.36E-02
6.91E-04
8.55E-02
8.17E-02
5.50E-02
NA
8.38E-02
7.13E-04
8.57E-02
8.18E-02
5.50E-02
NA
0
8.37E-02
8.36E-02
8.61E-02
8.37E-02
8.38E-02
8.46E-02
8.44E-02
8.29E-02
8.45E-02
8.36E-02
8.33E-02
8.34E-02
Total Dose (krad(Si))
10
20
30
40
8.36E-02 8.35E-02 8.35E-02 8.34E-02
8.35E-02 8.34E-02 8.34E-02 8.33E-02
8.60E-02 8.59E-02 8.58E-02 8.56E-02
8.35E-02 8.35E-02 8.33E-02 8.31E-02
8.36E-02 8.36E-02 8.34E-02 8.33E-02
8.44E-02 8.44E-02 8.42E-02 8.41E-02
8.42E-02 8.42E-02 8.41E-02 8.39E-02
8.28E-02 8.27E-02 8.26E-02 8.25E-02
8.44E-02 8.44E-02 8.42E-02 8.40E-02
8.35E-02 8.35E-02 8.34E-02 8.33E-02
8.32E-02 8.33E-02 8.32E-02 8.31E-02
8.33E-02 8.33E-02 8.33E-02 8.33E-02
8.42E-02
1.07E-03
8.71E-02
8.13E-02
8.40E-02
1.08E-03
8.70E-02
8.11E-02
8.40E-02
1.08E-03
8.70E-02
8.10E-02
8.39E-02
1.06E-03
8.68E-02
8.10E-02
8.40E-02
7.24E-04
8.60E-02
8.20E-02
5.50E-02
PASS
8.39E-02
7.04E-04
8.58E-02
8.19E-02
5.50E-02
NA
8.38E-02
7.14E-04
8.58E-02
8.19E-02
5.50E-02
NA
8.37E-02
6.92E-04
8.56E-02
8.18E-02
5.50E-02
NA
An ISO 9001:2008 and DSCC Certified Company
299
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Positive Short-Circuit Current @5V #3 (A)
9.00E-02
8.00E-02
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.147. Plot of Positive Short-Circuit Current @5V #3 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
300
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.147. Raw data for Positive Short-Circuit Current @5V #3 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Positive Short-Circuit Current @5V #3 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
8.36E-02
8.27E-02
8.55E-02
8.35E-02
8.34E-02
8.43E-02
8.42E-02
8.24E-02
8.39E-02
8.29E-02
8.29E-02
8.31E-02
24-hr
Anneal
60
8.35E-02
8.27E-02
8.56E-02
8.36E-02
8.33E-02
8.42E-02
8.41E-02
8.24E-02
8.39E-02
8.29E-02
8.28E-02
8.31E-02
168-hr
Anneal
70
8.37E-02
8.28E-02
8.58E-02
8.36E-02
8.34E-02
8.43E-02
8.43E-02
8.26E-02
8.41E-02
8.31E-02
8.29E-02
8.33E-02
8.37E-02
1.10E-03
8.67E-02
8.07E-02
8.38E-02
1.05E-03
8.67E-02
8.09E-02
8.37E-02
1.11E-03
8.67E-02
8.07E-02
8.39E-02
1.15E-03
8.70E-02
8.07E-02
8.35E-02
8.03E-04
8.57E-02
8.13E-02
5.50E-02
NA
8.35E-02
8.17E-04
8.58E-02
8.13E-02
5.50E-02
NA
8.35E-02
8.05E-04
8.57E-02
8.13E-02
5.50E-02
NA
8.37E-02
7.94E-04
8.59E-02
8.15E-02
5.50E-02
NA
0
8.39E-02
8.30E-02
8.61E-02
8.40E-02
8.37E-02
8.46E-02
8.45E-02
8.28E-02
8.43E-02
8.33E-02
8.29E-02
8.33E-02
Total Dose (krad(Si))
10
20
30
40
8.38E-02 8.37E-02 8.37E-02 8.36E-02
8.29E-02 8.28E-02 8.28E-02 8.27E-02
8.59E-02 8.58E-02 8.57E-02 8.56E-02
8.39E-02 8.37E-02 8.36E-02 8.35E-02
8.35E-02 8.35E-02 8.33E-02 8.33E-02
8.45E-02 8.45E-02 8.43E-02 8.42E-02
8.45E-02 8.44E-02 8.43E-02 8.41E-02
8.27E-02 8.27E-02 8.25E-02 8.24E-02
8.41E-02 8.41E-02 8.40E-02 8.39E-02
8.32E-02 8.31E-02 8.30E-02 8.29E-02
8.29E-02 8.29E-02 8.29E-02 8.28E-02
8.31E-02 8.32E-02 8.32E-02 8.31E-02
8.42E-02
1.13E-03
8.73E-02
8.10E-02
8.40E-02
1.14E-03
8.71E-02
8.09E-02
8.39E-02
1.13E-03
8.70E-02
8.08E-02
8.38E-02
1.10E-03
8.69E-02
8.08E-02
8.39E-02
8.07E-04
8.61E-02
8.17E-02
5.50E-02
PASS
8.38E-02
8.11E-04
8.60E-02
8.16E-02
5.50E-02
NA
8.37E-02
8.04E-04
8.60E-02
8.15E-02
5.50E-02
NA
8.36E-02
7.93E-04
8.58E-02
8.15E-02
5.50E-02
NA
An ISO 9001:2008 and DSCC Certified Company
301
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Positive Short-Circuit Current @5V #4 (A)
9.00E-02
8.00E-02
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.148. Plot of Positive Short-Circuit Current @5V #4 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
302
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.148. Raw data for Positive Short-Circuit Current @5V #4 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Positive Short-Circuit Current @5V #4 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
8.34E-02
8.34E-02
8.42E-02
8.39E-02
8.27E-02
8.43E-02
8.39E-02
8.31E-02
8.40E-02
8.56E-02
8.41E-02
8.40E-02
24-hr
Anneal
60
8.34E-02
8.33E-02
8.43E-02
8.40E-02
8.25E-02
8.42E-02
8.39E-02
8.31E-02
8.40E-02
8.56E-02
8.40E-02
8.40E-02
168-hr
Anneal
70
8.35E-02
8.34E-02
8.44E-02
8.40E-02
8.26E-02
8.44E-02
8.40E-02
8.33E-02
8.42E-02
8.58E-02
8.42E-02
8.42E-02
8.34E-02
6.47E-04
8.52E-02
8.17E-02
8.35E-02
5.78E-04
8.51E-02
8.19E-02
8.35E-02
6.79E-04
8.53E-02
8.16E-02
8.36E-02
6.67E-04
8.54E-02
8.18E-02
8.41E-02
9.07E-04
8.66E-02
8.17E-02
5.50E-02
NA
8.42E-02
9.02E-04
8.67E-02
8.17E-02
5.50E-02
NA
8.42E-02
9.04E-04
8.66E-02
8.17E-02
5.50E-02
NA
8.43E-02
9.30E-04
8.69E-02
8.18E-02
5.50E-02
NA
0
8.37E-02
8.37E-02
8.47E-02
8.44E-02
8.29E-02
8.46E-02
8.43E-02
8.35E-02
8.44E-02
8.60E-02
8.42E-02
8.41E-02
Total Dose (krad(Si))
10
20
30
40
8.35E-02 8.35E-02 8.35E-02 8.33E-02
8.35E-02 8.35E-02 8.34E-02 8.33E-02
8.45E-02 8.45E-02 8.44E-02 8.42E-02
8.43E-02 8.41E-02 8.40E-02 8.39E-02
8.28E-02 8.28E-02 8.25E-02 8.25E-02
8.45E-02 8.45E-02 8.43E-02 8.42E-02
8.42E-02 8.41E-02 8.40E-02 8.39E-02
8.34E-02 8.34E-02 8.33E-02 8.31E-02
8.42E-02 8.42E-02 8.41E-02 8.39E-02
8.59E-02 8.58E-02 8.57E-02 8.56E-02
8.41E-02 8.42E-02 8.41E-02 8.40E-02
8.41E-02 8.41E-02 8.41E-02 8.41E-02
8.39E-02
6.84E-04
8.57E-02
8.20E-02
8.37E-02
6.89E-04
8.56E-02
8.18E-02
8.37E-02
6.60E-04
8.55E-02
8.18E-02
8.36E-02
6.89E-04
8.54E-02
8.17E-02
8.46E-02
9.19E-04
8.71E-02
8.20E-02
5.50E-02
PASS
8.45E-02
9.20E-04
8.70E-02
8.19E-02
5.50E-02
NA
8.44E-02
8.83E-04
8.68E-02
8.20E-02
5.50E-02
NA
8.43E-02
9.07E-04
8.68E-02
8.18E-02
5.50E-02
NA
An ISO 9001:2008 and DSCC Certified Company
303
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Negative Short-Circuit Current @5V #1 (A)
0.00E+00
-1.00E-02
-2.00E-02
-3.00E-02
-4.00E-02
-5.00E-02
-6.00E-02
-7.00E-02
-8.00E-02
-9.00E-02
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.149. Plot of Negative Short-Circuit Current @5V #1 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
304
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.149. Raw data for Negative Short-Circuit Current @5V #1 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Negative Short-Circuit Current @5V #1 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
50
-7.73E-02
-7.67E-02
-7.75E-02
-7.72E-02
-7.67E-02
-7.81E-02
-7.81E-02
-7.75E-02
-7.80E-02
-8.03E-02
-7.84E-02
-7.77E-02
24-hr
Anneal
60
-7.73E-02
-7.66E-02
-7.76E-02
-7.72E-02
-7.67E-02
-7.80E-02
-7.81E-02
-7.75E-02
-7.80E-02
-8.03E-02
-7.84E-02
-7.77E-02
168-hr
Anneal
70
-7.75E-02
-7.71E-02
-7.80E-02
-7.76E-02
-7.70E-02
-7.82E-02
-7.83E-02
-7.76E-02
-7.82E-02
-8.04E-02
-7.85E-02
-7.79E-02
0
-7.77E-02
-7.77E-02
-7.87E-02
-7.84E-02
-7.76E-02
-7.86E-02
-7.87E-02
-7.80E-02
-7.85E-02
-8.08E-02
-7.85E-02
-7.79E-02
10
-7.75E-02
-7.74E-02
-7.84E-02
-7.80E-02
-7.73E-02
-7.82E-02
-7.85E-02
-7.78E-02
-7.82E-02
-8.05E-02
-7.84E-02
-7.77E-02
Total Dose (krad(Si))
20
30
-7.74E-02 -7.74E-02
-7.71E-02 -7.69E-02
-7.81E-02 -7.79E-02
-7.76E-02 -7.75E-02
-7.71E-02 -7.69E-02
-7.82E-02 -7.81E-02
-7.83E-02 -7.82E-02
-7.77E-02 -7.76E-02
-7.81E-02 -7.81E-02
-8.04E-02 -8.04E-02
-7.84E-02 -7.84E-02
-7.77E-02 -7.77E-02
-7.80E-02
4.78E-04
-7.67E-02
-7.93E-02
-7.77E-02
4.55E-04
-7.65E-02
-7.90E-02
-7.74E-02
4.07E-04
-7.63E-02
-7.86E-02
-7.73E-02
4.19E-04
-7.62E-02
-7.85E-02
-7.71E-02
4.07E-04
-7.59E-02
-7.82E-02
-7.71E-02
3.84E-04
-7.60E-02
-7.81E-02
-7.71E-02
4.42E-04
-7.58E-02
-7.83E-02
-7.74E-02
3.96E-04
-7.64E-02
-7.85E-02
-7.89E-02
1.07E-03
-7.60E-02
-8.18E-02
-5.50E-02
PASS
-7.86E-02
1.08E-03
-7.57E-02
-8.16E-02
-5.50E-02
NA
-7.85E-02
1.07E-03
-7.56E-02
-8.15E-02
-5.50E-02
NA
-7.85E-02
1.09E-03
-7.55E-02
-8.15E-02
-5.50E-02
NA
-7.83E-02
1.08E-03
-7.54E-02
-8.13E-02
-5.50E-02
NA
-7.84E-02
1.07E-03
-7.55E-02
-8.13E-02
-5.50E-02
NA
-7.84E-02
1.09E-03
-7.54E-02
-8.14E-02
-5.50E-02
NA
-7.85E-02
1.08E-03
-7.56E-02
-8.15E-02
-5.50E-02
NA
40
-7.72E-02
-7.67E-02
-7.76E-02
-7.71E-02
-7.67E-02
-7.80E-02
-7.81E-02
-7.75E-02
-7.79E-02
-8.02E-02
-7.82E-02
-7.77E-02
An ISO 9001:2008 and DSCC Certified Company
305
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Negative Short-Circuit Current @5V #2 (A)
0.00E+00
-1.00E-02
-2.00E-02
-3.00E-02
-4.00E-02
-5.00E-02
-6.00E-02
-7.00E-02
-8.00E-02
-9.00E-02
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.150. Plot of Negative Short-Circuit Current @5V #2 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
306
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.150. Raw data for Negative Short-Circuit Current @5V #2 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Negative Short-Circuit Current @5V #2 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
50
-7.74E-02
-7.70E-02
-7.89E-02
-7.69E-02
-7.72E-02
-7.82E-02
-7.82E-02
-7.71E-02
-7.82E-02
-7.75E-02
-7.77E-02
-7.75E-02
24-hr
Anneal
60
-7.74E-02
-7.69E-02
-7.89E-02
-7.69E-02
-7.71E-02
-7.81E-02
-7.82E-02
-7.71E-02
-7.82E-02
-7.75E-02
-7.76E-02
-7.75E-02
168-hr
Anneal
70
-7.76E-02
-7.74E-02
-7.92E-02
-7.74E-02
-7.75E-02
-7.84E-02
-7.83E-02
-7.72E-02
-7.85E-02
-7.77E-02
-7.78E-02
-7.76E-02
0
-7.78E-02
-7.80E-02
-7.99E-02
-7.81E-02
-7.81E-02
-7.87E-02
-7.86E-02
-7.75E-02
-7.87E-02
-7.79E-02
-7.79E-02
-7.76E-02
10
-7.76E-02
-7.78E-02
-7.96E-02
-7.78E-02
-7.78E-02
-7.85E-02
-7.85E-02
-7.73E-02
-7.85E-02
-7.78E-02
-7.76E-02
-7.75E-02
Total Dose (krad(Si))
20
30
-7.75E-02 -7.75E-02
-7.74E-02 -7.73E-02
-7.93E-02 -7.92E-02
-7.75E-02 -7.73E-02
-7.76E-02 -7.74E-02
-7.85E-02 -7.83E-02
-7.84E-02 -7.84E-02
-7.73E-02 -7.73E-02
-7.85E-02 -7.84E-02
-7.77E-02 -7.76E-02
-7.77E-02 -7.77E-02
-7.75E-02 -7.75E-02
-7.84E-02
8.43E-04
-7.61E-02
-8.07E-02
-7.81E-02
8.25E-04
-7.58E-02
-8.04E-02
-7.79E-02
8.20E-04
-7.56E-02
-8.01E-02
-7.77E-02
8.31E-04
-7.54E-02
-8.00E-02
-7.74E-02
8.12E-04
-7.52E-02
-7.97E-02
-7.74E-02
8.11E-04
-7.52E-02
-7.97E-02
-7.75E-02
8.56E-04
-7.51E-02
-7.98E-02
-7.78E-02
7.81E-04
-7.57E-02
-8.00E-02
-7.83E-02
5.54E-04
-7.68E-02
-7.98E-02
-5.50E-02
PASS
-7.81E-02
5.52E-04
-7.66E-02
-7.96E-02
-5.50E-02
NA
-7.81E-02
5.44E-04
-7.66E-02
-7.96E-02
-5.50E-02
NA
-7.80E-02
5.23E-04
-7.66E-02
-7.94E-02
-5.50E-02
NA
-7.78E-02
5.20E-04
-7.64E-02
-7.92E-02
-5.50E-02
NA
-7.79E-02
5.24E-04
-7.64E-02
-7.93E-02
-5.50E-02
NA
-7.78E-02
5.07E-04
-7.65E-02
-7.92E-02
-5.50E-02
NA
-7.80E-02
5.57E-04
-7.65E-02
-7.95E-02
-5.50E-02
NA
40
-7.73E-02
-7.70E-02
-7.89E-02
-7.69E-02
-7.71E-02
-7.81E-02
-7.82E-02
-7.70E-02
-7.82E-02
-7.75E-02
-7.76E-02
-7.75E-02
An ISO 9001:2008 and DSCC Certified Company
307
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Negative Short-Circuit Current @5V #3 (A)
0.00E+00
-1.00E-02
-2.00E-02
-3.00E-02
-4.00E-02
-5.00E-02
-6.00E-02
-7.00E-02
-8.00E-02
-9.00E-02
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.151. Plot of Negative Short-Circuit Current @5V #3 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
308
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.151. Raw data for Negative Short-Circuit Current @5V #3 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Negative Short-Circuit Current @5V #3 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
50
-7.75E-02
-7.67E-02
-7.89E-02
-7.70E-02
-7.72E-02
-7.82E-02
-7.85E-02
-7.69E-02
-7.79E-02
-7.75E-02
-7.76E-02
-7.75E-02
24-hr
Anneal
60
-7.74E-02
-7.66E-02
-7.90E-02
-7.70E-02
-7.70E-02
-7.82E-02
-7.85E-02
-7.69E-02
-7.79E-02
-7.75E-02
-7.76E-02
-7.75E-02
168-hr
Anneal
70
-7.78E-02
-7.71E-02
-7.93E-02
-7.75E-02
-7.75E-02
-7.84E-02
-7.86E-02
-7.71E-02
-7.81E-02
-7.76E-02
-7.77E-02
-7.76E-02
0
-7.80E-02
-7.78E-02
-7.99E-02
-7.82E-02
-7.81E-02
-7.87E-02
-7.89E-02
-7.73E-02
-7.84E-02
-7.79E-02
-7.77E-02
-7.76E-02
10
-7.78E-02
-7.75E-02
-7.96E-02
-7.79E-02
-7.79E-02
-7.85E-02
-7.87E-02
-7.72E-02
-7.82E-02
-7.78E-02
-7.76E-02
-7.75E-02
Total Dose (krad(Si))
20
30
-7.76E-02 -7.76E-02
-7.71E-02 -7.70E-02
-7.93E-02 -7.92E-02
-7.76E-02 -7.74E-02
-7.76E-02 -7.74E-02
-7.85E-02 -7.84E-02
-7.87E-02 -7.86E-02
-7.71E-02 -7.71E-02
-7.82E-02 -7.81E-02
-7.77E-02 -7.76E-02
-7.76E-02 -7.76E-02
-7.75E-02 -7.76E-02
-7.84E-02
8.69E-04
-7.60E-02
-8.08E-02
-7.81E-02
8.40E-04
-7.58E-02
-8.04E-02
-7.79E-02
8.37E-04
-7.56E-02
-8.02E-02
-7.77E-02
8.57E-04
-7.54E-02
-8.01E-02
-7.74E-02
8.79E-04
-7.50E-02
-7.99E-02
-7.74E-02
8.47E-04
-7.51E-02
-7.98E-02
-7.74E-02
9.03E-04
-7.49E-02
-7.99E-02
-7.78E-02
8.40E-04
-7.55E-02
-8.01E-02
-7.82E-02
6.49E-04
-7.64E-02
-8.00E-02
-5.50E-02
PASS
-7.81E-02
6.23E-04
-7.64E-02
-7.98E-02
-5.50E-02
NA
-7.80E-02
6.23E-04
-7.63E-02
-7.97E-02
-5.50E-02
NA
-7.80E-02
6.18E-04
-7.63E-02
-7.97E-02
-5.50E-02
NA
-7.78E-02
5.76E-04
-7.62E-02
-7.93E-02
-5.50E-02
NA
-7.78E-02
6.23E-04
-7.61E-02
-7.95E-02
-5.50E-02
NA
-7.78E-02
6.21E-04
-7.61E-02
-7.95E-02
-5.50E-02
NA
-7.80E-02
6.16E-04
-7.63E-02
-7.96E-02
-5.50E-02
NA
40
-7.74E-02
-7.67E-02
-7.90E-02
-7.70E-02
-7.71E-02
-7.81E-02
-7.84E-02
-7.69E-02
-7.79E-02
-7.75E-02
-7.75E-02
-7.75E-02
An ISO 9001:2008 and DSCC Certified Company
309
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Negative Short-Circuit Current @5V #4 (A)
0.00E+00
-1.00E-02
-2.00E-02
-3.00E-02
-4.00E-02
-5.00E-02
-6.00E-02
-7.00E-02
-8.00E-02
-9.00E-02
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.152. Plot of Negative Short-Circuit Current @5V #4 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
310
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
Table 5.152. Raw data for Negative Short-Circuit Current @5V #4 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Negative Short-Circuit Current @5V #4 (A)
Device
295
296
297
298
300
301
302
304
305
306
307
308
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
50
-7.74E-02
-7.67E-02
-7.75E-02
-7.73E-02
-7.68E-02
-7.84E-02
-7.80E-02
-7.76E-02
-7.80E-02
-7.98E-02
-7.81E-02
-7.82E-02
24-hr
Anneal
60
-7.74E-02
-7.66E-02
-7.76E-02
-7.74E-02
-7.67E-02
-7.84E-02
-7.80E-02
-7.76E-02
-7.80E-02
-7.98E-02
-7.81E-02
-7.82E-02
168-hr
Anneal
70
-7.76E-02
-7.71E-02
-7.80E-02
-7.78E-02
-7.70E-02
-7.86E-02
-7.82E-02
-7.78E-02
-7.82E-02
-8.00E-02
-7.82E-02
-7.83E-02
0
-7.79E-02
-7.79E-02
-7.86E-02
-7.85E-02
-7.76E-02
-7.88E-02
-7.86E-02
-7.80E-02
-7.85E-02
-8.03E-02
-7.82E-02
-7.84E-02
10
-7.76E-02
-7.76E-02
-7.83E-02
-7.82E-02
-7.74E-02
-7.87E-02
-7.84E-02
-7.79E-02
-7.84E-02
-8.01E-02
-7.81E-02
-7.82E-02
Total Dose (krad(Si))
20
30
-7.75E-02 -7.76E-02
-7.72E-02 -7.70E-02
-7.80E-02 -7.79E-02
-7.79E-02 -7.77E-02
-7.71E-02 -7.69E-02
-7.86E-02 -7.85E-02
-7.83E-02 -7.82E-02
-7.78E-02 -7.78E-02
-7.83E-02 -7.82E-02
-8.01E-02 -8.00E-02
-7.81E-02 -7.81E-02
-7.82E-02 -7.82E-02
-7.81E-02
4.21E-04
-7.69E-02
-7.92E-02
-7.78E-02
4.23E-04
-7.67E-02
-7.90E-02
-7.76E-02
3.91E-04
-7.65E-02
-7.86E-02
-7.74E-02
4.12E-04
-7.63E-02
-7.85E-02
-7.71E-02
4.36E-04
-7.59E-02
-7.83E-02
-7.71E-02
3.97E-04
-7.60E-02
-7.82E-02
-7.71E-02
4.60E-04
-7.59E-02
-7.84E-02
-7.75E-02
4.11E-04
-7.64E-02
-7.86E-02
-7.88E-02
8.67E-04
-7.65E-02
-8.12E-02
-5.50E-02
PASS
-7.87E-02
8.57E-04
-7.63E-02
-8.10E-02
-5.50E-02
NA
-7.86E-02
8.53E-04
-7.63E-02
-8.10E-02
-5.50E-02
NA
-7.85E-02
8.57E-04
-7.62E-02
-8.09E-02
-5.50E-02
NA
-7.83E-02
8.64E-04
-7.60E-02
-8.07E-02
-5.50E-02
NA
-7.84E-02
8.50E-04
-7.61E-02
-8.07E-02
-5.50E-02
NA
-7.84E-02
8.48E-04
-7.60E-02
-8.07E-02
-5.50E-02
NA
-7.86E-02
8.78E-04
-7.61E-02
-8.10E-02
-5.50E-02
NA
40
-7.73E-02
-7.67E-02
-7.76E-02
-7.74E-02
-7.67E-02
-7.84E-02
-7.80E-02
-7.76E-02
-7.80E-02
-7.98E-02
-7.80E-02
-7.82E-02
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6.0. Summary / Conclusions
The low dose rate testing described in this final report was performed using the facilities at Radiation
Assured Devices' Longmire Laboratories in Colorado Springs, CO. The low dose rate source is a GB150 irradiator modified to provide a panoramic exposure. The Co-60 rods are held in the base of the
irradiator heavily shielded by lead. During the irradiation exposures the rod is raised by an electronic
timer/controller and the exposure is performed in air. The dose rate for this irradiator in this
configuration ranges from approximately 1mrad(Si)/s to a maximum of approximately 50rad(Si)/s,
determined by the distance from the source.
The parametric data was obtained as "read and record" and all the raw data plus an attributes summary
are contained in this report as well as in a separate Excel file. The attributes data contains the average,
standard deviation and the average with the KTL values applied. The KTL value used in this work is
2.742 per MIL-HDBK-814 using one sided tolerance limits of 90/90 and a 5-piece sample size. The
90/90 KTL values were selected to match the statistical levels specified in the MIL-PRF-38535
sampling plan for the qualification of a radiation hardness assured (RHA) component. Note that the
following criteria must be met for a device to pass the low dose rate test: following the radiation
exposure each of the 5 pieces irradiated under electrical bias shall pass the specification value. The units
irradiated without electrical bias and the KTL statistics are included in this report for reference only. If
any of the 5 pieces irradiated under electrical bias exceed the datasheet specifications, then the lot could
be logged as a failure.
Based on this criterion the RH1814MW Quad Operational Amplifier (from the lot date code identified
on the first page of this test report) PASSED the enhanced low dose rate sensitivity test to the maximum
tested dose level of 50krad(Si) with all parameters remaining within their datasheet specifications.
Further, the data in this report can be analyzed along with the high dose rate report titled "Total Ionizing
Dose (TID) Radiation Testing of the RH1814MW Quad Op Amp for Linear Technology" to
demonstrate that these parts do not exhibit ELDRS as defined in the current test method.
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Appendix A: Photograph of device-under-test to show part markings
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Appendix B: TID Bias Connections
(Extracted from LINEAR TECHNOLOGY CORPORATION RH1814M Datasheet)
Biased Samples:
Pin
Function
Connection / Bias
1
OUT A
To Pin 2 via 10k
2
-IN A
To Pin 1 via 10k
3
+IN A
To 2.5V via 10k Resistor
4
V+
To +5V using 0.1F Decoupling
5
+IN B
To 2.5V via 10k Resistor
6
-IN B
To Pin 7 via 10k
7
OUT B
To Pin 6 via 10k
8
OUT C
To Pin 9 via 10k
9
-IN C
To Pin 8 via 10k
10
+IN C
To 2.5V via 10k Resistor
11
V-
To -5V using 0.1F Decoupling
12
+IN D
To 2.5V via 10k Resistor
13
-IN D
To Pin 14 via 10k
14
OUT D
To Pin 13 via 10k
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Unbiased Samples:
Pin
Function
Connection / Bias
1
OUT A
GND
2
-IN A
GND
3
+IN A
GND
4
V+
GND
5
+IN B
GND
6
-IN B
GND
7
OUT B
GND
8
OUT C
GND
9
-IN C
GND
10
+IN C
GND
11
V-
GND
12
+IN D
GND
13
-IN D
GND
14
OUT D
GND
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Figure B.1. Irradiation bias drawing for the units to be irradiated under electrical bias. This figure was extracted
from LINEAR TECHNOLOGY CORPORATION, RH1814M Datasheet.
Figure B.2. W package drawing (for reference only). This figure was extracted from LINEAR TECHNOLOGY
CORPORATION RH1814M Datasheet.
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Appendix C: Electrical Test Parameters and Conditions
All electrical tests for this device are performed on one of Radiation Assured Device’s LTS2020 Test
Systems. The LTS2020 Test System is a programmable parametric tester that provides parameter
measurements for a variety of digital, analog and mixed signal products including voltage regulators,
voltage comparators, D to A and A to D converters. The LTS2020 Test System achieves accuracy and
sensitivity through the use of software self-calibration and an internal relay matrix with separate family
boards and custom personality adapter boards. The tester uses this relay matrix to connect the required
test circuits, select the appropriate voltage / current sources and establish the needed measurement loops
for all the tests performed. The tests will be conducted using the LTS-2101 Linear Family Board, LTS0600 Socket Assembly and the RH1814W BGSS-080826 DUT board. The measured parameters and
test conditions are shown in Tables C.1 and C.2.
A listing of the measurement precision/resolution for each parameter is shown in Tables C.3 and C.4.
The precision/resolution values were obtained either from test data or from the DAC resolution of the
LTS-2020. To generate the precision/resolution shown in Table C.2, one of the units-under-test was
tested repetitively (a total of 10-times with re-insertion between tests) to obtain the average test value
and standard deviation. Using this test data MIL-HDBK-814 90/90 KTL statistics were applied to the
measured standard deviation to generate the final measurement range. This value encompasses the
precision/resolution of all aspects of the test system, including the LTS2020 mainframe, family board,
socket assembly and DUT board as well as insertion error. In some cases, the measurement resolution is
limited by the internal DACs, which results in a measured standard deviation of zero. In these instances
the precision/resolution will be reported back as the LSB of the DAC.
Note that the testing and statistics used in this document are based on an “analysis of variables”
technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p.
91 for a discussion of statistical treatments). Not all measured parameters are well suited to this
approach due to inherent large variations. One such parameter is pre-irradiation Large Signal Voltage
Gain, where the device exhibits extreme sensitivity to input conditions, resulting in a very large standard
deviation. If necessary, larger samples sizes could be used to qualify these parameters using an
“attributes” approach.
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Table C.1. Measured parameters and test conditions for VS=±5V.
TEST DESCRIPTION
Positive Supply Current
Negative Supply Current
Input Offset Voltage (Op Amp 1-4)
Input Offset Current (Op Amp 1-4)
+ Input Bias Current (Op Amp 1-4)
- Input Bias Current (Op Amp 1-4)
CMRR (Op Amp 1-4)
PSRR (Op Amp 1-4)
Large Signal Voltage Gain RL=500 (Op Amp 1-4)
Large Signal Voltage Gain RL=100 (Op Amp 1-4)
Channel Separation (Op Amp 1-4, all permutations)
Output Voltage Swing High RL=500 (Op Amp 1-4)
Output Voltage Swing High RL=100 (Op Amp 1-4)
Output Voltage Swing Low RL=500 (Op Amp 1-4)
Output Voltage Swing Low RL=100 (Op Amp 1-4)
Maximum Output Source Current (Op Amp 1-4)
Maximum Output Sink Current (Op Amp 1-4)
Positive Short-Circuit Current (Op Amp 1-4)
Negative Short-Circuit Current (Op Amp 1-4)
TEST CONDITIONS
VS=±5V
VS=±5V
VS=±5V
VS=±5V
VS=±5V
VS=±5V
VS=±5V, VCM=±3.5V
VS=±2V to ±5.5V
RL=500, VO=±3V
RL=100, VO=±3V
RL=100, VO=±3V
RL=500, VOD=30mV, VS=±5V
RL=100, VOD=30mV, VS=±5V
RL=500, VOD=30mV, VS=±5V
RL=100, VOD=30mV, VS=±5V
VO=3V, VOD=30mV, VS=±5V
VO=-3V, VOD=30mV, VS=±5V
VOD=1V, VS=±5V
VOD=1V, VS=±5V
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Table C.2. Measured parameters and test conditions for VS=5V.
TEST DESCRIPTION
Positive Supply Current
Negative Supply Current
Input Offset Voltage (Op Amp 1-4)
Input Offset Current (Op Amp 1-4)
+ Input Bias Current (Op Amp 1-4)
- Input Bias Current (Op Amp 1-4)
CMRR (Op Amp 1-4)
Large Signal Voltage Gain RL=500 (Op Amp 1-4)
Large Signal Voltage Gain RL=100 (Op Amp 1-4)
Channel Separation (Op Amp 1-4, all permutations)
Output Voltage Swing High RL=500 (Op Amp 1-4)
Output Voltage Swing High RL=100 (Op Amp 1-4)
Output Voltage Swing Low RL=500 (Op Amp 1-4)
Output Voltage Swing Low RL=100 (Op Amp 1-4)
Maximum Output Source Current (Op Amp 1-4)
Maximum Output Sink Current (Op Amp 1-4)
Positive Short-Circuit Current (Op Amp 1-4)
Negative Short-Circuit Current (Op Amp 1-4)
TEST CONDITIONS
VS=5V
VS=5V
VS=5V
VS=5V
VS=5V
VS=5V
VS=5V, VCM=1.5V to 3.5V
RL=500, VO=1.5 to 3.5V
RL=100, VO=1.5 to 3.5V
RL=100, VO=1.5 to 3.5V
RL=500, VOD=30mV, VS=5V
RL=100, VOD=30mV, VS=5V
RL=500, VOD=30mV, VS=5V
RL=100, VOD=30mV, VS=5V
VO=3.5V, VOD=30mV, VS=5V
VO=1.5V, VOD=30mV, VS=5V
VOD=1V, VS=5V
VOD=1V, VS=5V
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Table C.3. Measured parameters, pre-irradiation specifications, and measurement resolutions
for VS=±5V.
Pre-Irradiation
Measurement
Specification
Resolution/Precision
Positive Supply Current
14.4mA
± 2.95E-04A
Negative Supply Current
-14.4mA
± 2.93E-04A
Input Offset Voltage (Op Amp 1-4)
±1.5mV
± 2.55E-05V
Input Offset Current (Op Amp 1-4)
±400nA
± 1.52E-09A
+ Input Bias Current (Op Amp 1-4)
±4µA
± 6.53E-09A
- Input Bias Current (Op Amp 1-4)
±4µA
± 8.71E-09A
CMRR (Op Amp 1-4)
75dB
± 8.19E-02dB
PSRR (Op Amp 1-4)
78dB
± 4.54E+00dB
Large Signal Voltage Gain RL=500 (Op Amp 1-4)
1.5V/mV
± 1.46E-02V/mV
Large Signal Voltage Gain RL=100 (Op Amp 1-4)
1V/mV
± 1.38E-02V/mV
Channel Separation (Op Amp 1-4, all permutations)
82dB
± 3.03E+01dB
Output Voltage Swing High RL=500 (Op Amp 1-4)
3.8V
± 4.65E-03V
Output Voltage Swing High RL=100 (Op Amp 1-4)
3.35V
± 2.61E-03V
Output Voltage Swing Low RL=500 (Op Amp 1-4)
-3.8V
± 4.24E-03V
Output Voltage Swing Low RL=100 (Op Amp 1-4)
-3.35V
± 2.95E-03V
Maximum Output Source Current (Op Amp 1-4)
40mA
± 4.92E-04A
Maximum Output Sink Current (Op Amp 1-4)
-40mA
± 1.69E-04A
Positive Short-Circuit Current (Op Amp 1-4)
75mA
± 3.77E-04V
Negative Short-Circuit Current (Op Amp 1-4)
-75mA
± 4.05E-04A
Measured Parameter
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Table C.4. Measured parameters, pre-irradiation specifications, and measurement resolutions
for VS=5V.
Pre-Irradiation
Measurement
Specification
Resolution/Precision
Positive Supply Current
16mA
± 2.27E-04A
Negative Supply Current
-16mA
± 2.23E-04A
Input Offset Voltage (Op Amp 1-4)
±2mV
± 1.56E-05V
Input Offset Current (Op Amp 1-4)
±400nA
± 1.63E-09A
+ Input Bias Current (Op Amp 1-4)
±4µA
± 9.97E-09A
- Input Bias Current (Op Amp 1-4)
±4µA
± 1.09E-08A
CMRR (Op Amp 1-4)
73dB
± 1.43E-01dB
Large Signal Voltage Gain RL=500 (Op Amp 1-4)
1.0V/mV
± 1.63E-02V/mV
Large Signal Voltage Gain RL=100 (Op Amp 1-4)
0.7V/mV
± 9.53E-03V/mV
Channel Separation (Op Amp 1-4, all permutations)
81dB
± 2.42E+01dB
Output Voltage Swing High RL=500 (Op Amp 1-4)
3.9V
± 3.05E-03V
Output Voltage Swing High RL=100 (Op Amp 1-4)
3.7V
± 2.66E-03V
Output Voltage Swing Low RL=500 (Op Amp 1-4)
1.1V
± 2.75E-03V
Output Voltage Swing Low RL=100 (Op Amp 1-4)
1.3V
± 2.76E-03V
Maximum Output Source Current (Op Amp 1-4)
25mA
± 1.21E-04A
Maximum Output Sink Current (Op Amp 1-4)
-25mA
± 1.66E-04A
Positive Short-Circuit Current (Op Amp 1-4)
55mA
± 3.08E-04A
Negative Short-Circuit Current (Op Amp 1-4)
-55mA
± 2.50E-04A
Measured Parameter
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Appendix D: List of Figures Used in the Results Section (Section 5)
5.1.
5.2.
5.3.
5.4.
5.5.
5.6.
5.7.
5.8.
5.9.
5.10.
5.11.
5.12.
5.13.
5.14.
5.15.
5.16.
5.17.
5.18.
5.19.
5.20.
5.21.
5.22.
5.23.
5.24.
5.25.
5.26.
5.27.
5.28.
5.29.
5.30.
5.31.
5.32.
5.33.
5.34.
5.35.
5.36.
5.37.
Positive Supply Current @+/-5V (A)
Negative Supply Current @+/-5V (A)
Input Offset Voltage @+/-5V #1 (V)
Input Offset Voltage @+/-5V #2 (V)
Input Offset Voltage @+/-5V #3 (V)
Input Offset Voltage @+/-5V #4 (V)
Input Offset Current @+/-5V #1 (A)
Input Offset Current @+/-5V #2 (A)
Input Offset Current @+/-5V #3 (A)
Input Offset Current @+/-5V #4 (A)
Positive Input Bias Current @+/-5V #1 (A)
Positive Input Bias Current @+/-5V #2 (A)
Positive Input Bias Current @+/-5V #3 (A)
Positive Input Bias Current @+/-5V #4 (A)
Negative Input Bias Current @+/-5V #1 (A)
Negative Input Bias Current @+/-5V #2 (A)
Negative Input Bias Current @+/-5V #3 (A)
Negative Input Bias Current @+/-5V #4 (A)
Common Mode Rejection Ratio @+/-5V #1 (dB)
Common Mode Rejection Ratio @+/-5V #2 (dB)
Common Mode Rejection Ratio @+/-5V #3 (dB)
Common Mode Rejection Ratio @+/-5V #4 (dB)
Power Supply Rejection Ratio #1 (dB)
Power Supply Rejection Ratio #2 (dB)
Power Supply Rejection Ratio #3 (dB)
Power Supply Rejection Ratio #4 (dB)
Large Signal Voltage Gain @+/-5V RL=500 #1 (V/mV)
Large Signal Voltage Gain @+/-5V RL=500 #2 (V/mV)
Large Signal Voltage Gain @+/-5V RL=500 #3 (V/mV)
Large Signal Voltage Gain @+/-5V RL=500 #4 (V/mV)
Large Signal Voltage Gain @+/-5V RL=100 #1 (V/mV)
Large Signal Voltage Gain @+/-5V RL=100 #2 (V/mV)
Large Signal Voltage Gain @+/-5V RL=100 #3 (V/mV)
Large Signal Voltage Gain @+/-5V RL=100 #4 (V/mV)
Channel Separation @+/-5V 1:2 (dB)
Channel Separation @+/-5V 1:3 (dB)
Channel Separation @+/-5V 1:4 (dB)
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5.38.
5.39.
5.40.
5.41.
5.42.
5.43.
5.44.
5.45.
5.46.
5.47.
5.48.
5.49.
5.50.
5.51.
5.52.
5.53.
5.54.
5.55.
5.56.
5.57.
5.58.
5.59.
5.60.
5.61.
5.62.
5.63.
5.64.
5.65.
5.66.
5.67.
5.68.
5.69.
5.70.
5.71.
5.72.
5.73.
5.74.
5.75.
5.76.
5.77.
5.78.
5.79.
Channel Separation @+/-5V 2:1 (dB)
Channel Separation @+/-5V 2:3 (dB)
Channel Separation @+/-5V 2:4 (dB)
Channel Separation @+/-5V 3:1 (dB)
Channel Separation @+/-5V 3:2 (dB)
Channel Separation @+/-5V 3:4 (dB)
Channel Separation @+/-5V 4:1 (dB)
Channel Separation @+/-5V 4:2 (dB)
Channel Separation @+/-5V 4:3 (dB)
Output Voltage Swing High @+/-5V RL=500 #1 (V)
Output Voltage Swing High @+/-5V RL=500 #2 (V)
Output Voltage Swing High @+/-5V RL=500 #3 (V)
Output Voltage Swing High @+/-5V RL=500 #4 (V)
Output Voltage Swing High @+/-5V RL=100 #1 (V)
Output Voltage Swing High @+/-5V RL=100 #2 (V)
Output Voltage Swing High @+/-5V RL=100 #3 (V)
Output Voltage Swing High @+/-5V RL=100 #4 (V)
Output Voltage Swing Low @+/-5V RL=500 #1 (V)
Output Voltage Swing Low @+/-5V RL=500 #2 (V)
Output Voltage Swing Low @+/-5V RL=500 #3 (V)
Output Voltage Swing Low @+/-5V RL=500 #4 (V)
Output Voltage Swing Low @+/-5V RL=100 #1 (V)
Output Voltage Swing Low @+/-5V RL=100 #2 (V)
Output Voltage Swing Low @+/-5V RL=100 #3 (V)
Output Voltage Swing Low @+/-5V RL=100 #4 (V)
Maximum Output Source Current @+/-5V #1 (A)
Maximum Output Source Current @+/-5V #2 (A)
Maximum Output Source Current @+/-5V #3 (A)
Maximum Output Source Current @+/-5V #4 (A)
Maximum Output Sink Current @+/-5V #1 (A)
Maximum Output Sink Current @+/-5V #2 (A)
Maximum Output Sink Current @+/-5V #3 (A)
Maximum Output Sink Current @+/-5V #4 (A)
Positive Short-Circuit Current @+/-5V #1 (A)
Positive Short-Circuit Current @+/-5V #2 (A)
Positive Short-Circuit Current @+/-5V #3 (A)
Positive Short-Circuit Current @+/-5V #4 (A)
Negative Short-Circuit Current @+/-5V #1 (A)
Negative Short-Circuit Current @+/-5V #2 (A)
Negative Short-Circuit Current @+/-5V #3 (A)
Negative Short-Circuit Current @+/-5V #4 (A)
Positive Supply Current @5V (A)
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5.80.
5.81.
5.82.
5.83.
5.84.
5.85.
5.86.
5.87.
5.88.
5.89.
5.90.
5.91.
5.92.
5.93.
5.94.
5.95.
5.96.
5.97.
5.98.
5.99.
5.100.
5.101.
5.102.
5.103.
5.104.
5.105.
5.106.
5.107.
5.108.
5.109.
5.110.
5.111.
5.112.
5.113.
5.114.
5.115.
5.116.
5.117.
5.118.
5.119.
5.120.
5.121.
Negative Supply Current @5V (A)
Input Offset Voltage @5V #1 (V)
Input Offset Voltage @5V #2 (V)
Input Offset Voltage @5V #3 (V)
Input Offset Voltage @5V #4 (V)
Input Offset Current @5V #1 (A)
Input Offset Current @5V #2 (A)
Input Offset Current @5V #3 (A)
Input Offset Current @5V #4 (A)
Positive Input Bias Current @5V #1 (A)
Positive Input Bias Current @5V #2 (A)
Positive Input Bias Current @5V #3 (A)
Positive Input Bias Current @5V #4 (A)
Negative Input Bias Current @5V #1 (A)
Negative Input Bias Current @5V #2 (A)
Negative Input Bias Current @5V #3 (A)
Negative Input Bias Current @5V #4 (A)
Common Mode Rejection Ratio @5V #1 (dB)
Common Mode Rejection Ratio @5V #2 (dB)
Common Mode Rejection Ratio @5V #3 (dB)
Common Mode Rejection Ratio @5V #4 (dB)
Large Signal Voltage Gain @5V RL=500 #1 (V/mV)
Large Signal Voltage Gain @5V RL=500 #2 (V/mV)
Large Signal Voltage Gain @5V RL=500 #3 (V/mV)
Large Signal Voltage Gain @5V RL=500 #4 (V/mV)
Large Signal Voltage Gain @5V RL=100 #1 (V/mV)
Large Signal Voltage Gain @5V RL=100 #2 (V/mV)
Large Signal Voltage Gain @5V RL=100 #3 (V/mV)
Large Signal Voltage Gain @5V RL=100 #4 (V/mV)
Channel Separation @5V 1:2 (dB)
Channel Separation @5V 1:3 (dB)
Channel Separation @5V 1:4 (dB)
Channel Separation @5V 2:1 (dB)
Channel Separation @5V 2:3 (dB)
Channel Separation @5V 2:4 (dB)
Channel Separation @5V 3:1 (dB)
Channel Separation @5V 3:2 (dB)
Channel Separation @5V 3:4 (dB)
Channel Separation @5V 4:1 (dB)
Channel Separation @5V 4:2 (dB)
Channel Separation @5V 4:3 (dB)
Output Voltage Swing High @5V RL=500 #1 (V)
An ISO 9001:2008 and DSCC Certified Company
324
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-417 110310 R1.1
5.122.
5.123.
5.124.
5.125.
5.126.
5.127.
5.128.
5.129.
5.130.
5.131.
5.132.
5.133.
5.134.
5.135.
5.136.
5.137.
5.138.
5.139.
5.140.
5.141.
5.142.
5.143.
5.144.
5.145.
5.146.
5.147.
5.148.
5.149.
5.150.
5.151.
5.152.
Output Voltage Swing High @5V RL=500 #2 (V)
Output Voltage Swing High @5V RL=500 #3 (V)
Output Voltage Swing High @5V RL=500 #4 (V)
Output Voltage Swing High @5V RL=100 #1 (V)
Output Voltage Swing High @5V RL=100 #2 (V)
Output Voltage Swing High @5V RL=100 #3 (V)
Output Voltage Swing High @5V RL=100 #4 (V)
Output Voltage Swing Low @5V RL=500 #1 (V)
Output Voltage Swing Low @5V RL=500 #2 (V)
Output Voltage Swing Low @5V RL=500 #3 (V)
Output Voltage Swing Low @5V RL=500 #4 (V)
Output Voltage Swing Low @5V RL=100 #1 (V)
Output Voltage Swing Low @5V RL=100 #2 (V)
Output Voltage Swing Low @5V RL=100 #3 (V)
Output Voltage Swing Low @5V RL=100 #4 (V)
Maximum Output Source Current @5V #1 (A)
Maximum Output Source Current @5V #2 (A)
Maximum Output Source Current @5V #3 (A)
Maximum Output Source Current @5V #4 (A)
Maximum Output Sink Current @5V #1 (A)
Maximum Output Sink Current @5V #2 (A)
Maximum Output Sink Current @5V #3 (A)
Maximum Output Sink Current @5V #4 (A)
Positive Short-Circuit Current @5V #1 (A)
Positive Short-Circuit Current @5V #2 (A)
Positive Short-Circuit Current @5V #3 (A)
Positive Short-Circuit Current @5V #4 (A)
Negative Short-Circuit Current @5V #1 (A)
Negative Short-Circuit Current @5V #2 (A)
Negative Short-Circuit Current @5V #3 (A)
Negative Short-Circuit Current @5V #4 (A)
An ISO 9001:2008 and DSCC Certified Company
325
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
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