ONSEMI HN1B01FDW1T1G

HN1B01FDW1T1
Complementary Dual
General Purpose
Amplifier Transistor
PNP and NPN Surface Mount
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Features
•
•
•
•
•
(6)
High Voltage and High Current: VCEO = 50 V, IC = 200 mA
High hFE: hFE = 200400
Moisture Sensitivity Level: 1
ESD Rating
− Human Body Model: 3A
− Machine Model: C
Pb−Free Package is Available
Q2
(1)
Symbol
Value
Unit
Collector−Base Voltage
V(BR)CBO
60
Vdc
Collector−Emitter Voltage
V(BR)CEO
50
Vdc
Emitter−Base Voltage
V(BR)EBO
7.0
Vdc
IC
200
mAdc
Collector Current − Continuous
(4)
Q1
MAXIMUM RATINGS (TA = 25°C)
Rating
(5)
6
5
(2)
4
12
(3)
SC−74
CASE 318F
STYLE 3
3
MARKING DIAGRAM
Maximum ratings are those values beyond which device damage can occur.
Maximum ratings applied to the device are individual stress limit values (not
normal operating conditions) and are not valid simultaneously. If these limits are
exceeded, device functional operation is not implied, damage may occur and
reliability may be affected.
R9 M
THERMAL CHARACTERISTICS
Symbol
Max
Unit
Power Dissipation
Characteristic
PD
380
mW
Junction Temperature
TJ
150
°C
Storage Temperature
Tstg
−55 to +150
°C
R9 = Device Code
M = Date Code
ORDERING INFORMATION
Device
Package
Shipping†
HN1B01FDW1T1
SC−74
3000/Tape & Reel
HN1B01FDW1T1G
SC−74 3000/Tape & Reel
(Pb−Free)
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specifications
Brochure, BRD8011/D.
 Semiconductor Components Industries, LLC, 2005
March, 2005 − Rev. 2
Publication Order Number:
HN1B01FDW1T1/D
HN1B01FDW1T1
Q1: PNP
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)
Symbol
Min
Max
Unit
Collector−Emitter Breakdown Voltage
(IC = 2.0 mAdc, IB = 0)
V(BR)CEO
−50
−
Vdc
Collector−Base Breakdown Voltage
(IC = 10 Adc, IE = 0)
V(BR)CBO
−60
−
Vdc
Emitter−Base Breakdown Voltage
(IE = 10 Adc, IC = 0)
V(BR)EBO
−7.0
−
Vdc
Collector−Base Cutoff Current
(VCB = 45 Vdc, IE = 0)
ICBO
−
−0.1
Adc
Collector−Emitter Cutoff Current
(VCE = 10 Vdc, IB = 0)
(VCE = 30 Vdc, IB = 0)
(VCE = 30 Vdc, IB = 0, TA = 80°C)
ICEO
−
−
−
−0.1
−2.0
−1.0
Adc
Adc
mAdc
DC Current Gain (Note 1)
(VCE = 6.0 Vdc, IC = 2.0 mAdc)
hFE
−200
−400
−0.15
−0.3
Vdc
Symbol
Min
Max
Unit
Collector−Emitter Breakdown Voltage
(IC = 2.0 mAdc, IB = 0)
V(BR)CEO
50
−
Vdc
Collector−Base Breakdown Voltage
(IC = 10 Adc, IE = 0)
V(BR)CBO
60
−
Vdc
Emitter−Base Breakdown Voltage
(IE = 10 Adc, IC = 0)
V(BR)EBO
7.0
−
Vdc
Collector−Base Cutoff Current
(VCB = 45 Vdc, IE = 0)
ICBO
−
0.1
Adc
Collector−Emitter Cutoff Current
(VCE = 10 Vdc, IB = 0)
(VCE = 30 Vdc, IB = 0)
(VCE = 30 Vdc, IB = 0, TA = 80°C)
ICEO
−
−
−
0.1
2.0
1.0
Adc
Adc
mAdc
DC Current Gain (Note 1)
(VCE = 6.0 Vdc, IC = 2.0 mAdc)
hFE
200
400
−
VCE(sat)
0.15
0.25
Vdc
Characteristic
Collector−Emitter Saturation Voltage
(IC = 100 mAdc, IB = 10 mAdc)
VCE(sat)
−
Q2: NPN
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)
Characteristic
Collector−Emitter Saturation Voltage
(IC = 100 mAdc, IB = 10 mAdc)
1. Pulse Test: Pulse Width ≤ 300 s, D.C. ≤ 2%.
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2
HN1B01FDW1T1
Typical Electrical Characteristics: PNP Transistor
1000
−1.5 mA
−2.0 mA
−160
hFE, DC CURRENT GAIN
IC, COLLECTOR CURRENT (mA)
−200
−1.0 mA
−120
−0.5 mA
−80
IB = −0.2 mA
−40
TA = 100°C
25°C
TA = 25°C
0
VCE = −1.0 V
10
0
−1
−2
−3
−4
−5
−6
−1
VCE, COLLECTOR−EMITTER VOLTAGE (V)
−25°C
100
VCE = −6.0 V
−100
−1000
VCE(sat), MAXIMUM COLLECTOR VOLTAGE (V)
hFE, DC CURRENT GAIN
TA = 100°C
−10
IC/IB = 10
TA = 100°C
25°C
−25°C
−0.1
−0.01
−1
−10
−100
−1000
IC, COLLECTOR CURRENT (mA)
Figure 3. DC Current Gain
Figure 4. VCE(sat) versus IC
−10
−10,000
COMMON EMITTER
VCE = 6 V
−1
TA = 25°C
IC/IB = 10
IB, BASE CURRENT (A)
BASE−EMITTER SATURATION
VOLTAGE (V)
−1000
−1
IC, COLLECTOR CURRENT (mA)
−0.1
−1
−100
Figure 2. DC Current Gain
1000
10
−1
−10
IC, COLLECTOR CURRENT (mA)
Figure 1. Collector Saturation Region
25°C
−25°C
100
−1000
25°C
TA = 100°C
−25°C
−100
−10
−1
−0.1
−10
−100
0 −0.1 −0.2 −0.3 −0.4 −0.5 −0.6 −0.7 −0.8 −0.9
−1000
IC, COLLECTOR CURRENT (mA)
VBE, BASE−EMITTER VOLTAGE (V)
Figure 5. VBE(sat) versus IC
Figure 6. Base−Emitter Voltage
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3
−1
HN1B01FDW1T1
Typical Electrical Characteristics: NPN Transistor
1000
6.0 mA
5.0 mA
240
2.0 mA
3.0 mA
hFE, DC CURRENT GAIN
IC, COLLECTOR CURRENT (mA)
280
200
1.0 mA
160
120
0.5 mA
80
IB = 0.2 mA
TA = 100°C
25°C
−25°C
100
40
TA = 25°C
0
0
1
2
3
VCE = 1.0 V
10
4
5
6
1
10
VCE, COLLECTOR−EMITTER VOLTAGE (V)
hFE, DC CURRENT GAIN
TA = 100°C
25°C
−25°C
100
VCE = 6.0 V
VCE(sat), MAXIMUM COLLECTOR VOLTAGE
(V)
Figure 8. DC Current Gain
1000
1
1
IC/IB = 10
TA = 100°C
25°C
0.1
−25°C
0.01
10
100
1000
1
10
IC, COLLECTOR CURRENT (mA)
100
1000
IC, COLLECTOR CURRENT (mA)
Figure 9. DC Current Gain
Figure 10. VCE(sat) versus IC
10
10,000
COMMON EMITTER
VCE = 6 V
IB, BASE CURRENT (A)
BASE−EMITTER SATURATION
VOLTAGE (V)
1000
IC, COLLECTOR CURRENT (mA)
Figure 7. Collector Saturation Voltage
10
100
1
TA = 25°C
IC/IB = 10
0.1
TA = 100°C
25°C
1000
−25°C
100
10
1
0.1
1
10
100
1000
0
IC, COLLECTOR CURRENT (mA)
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
VBE, BASE−EMITTER VOLTAGE (V)
Figure 11. VBE(sat) versus IC
Figure 12. Base−Emitter Voltage
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4
0.9
1
HN1B01FDW1T1
PACKAGE DIMENSIONS
SC−74
CASE 318F−05
ISSUE K
NOTES:
1. DIMENSIONING AND TOLERANCING
PER ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. MAXIMUM LEAD THICKNESS INCLUDES
LEAD FINISH THICKNESS. MINIMUM
LEAD THICKNESS IS THE MINIMUM
THICKNESS OF BASE MATERIAL.
4. 318F−01, −02, −03 OBSOLETE. NEW
STANDARD 318F−04.
A
L
6
5
4
2
3
B
S
1
D
DIM
A
B
C
D
G
H
J
K
L
M
S
G
M
J
C
0.05 (0.002)
K
H
INCHES
MIN
MAX
0.1142 0.1220
0.0512 0.0669
0.0354 0.0433
0.0098 0.0197
0.0335 0.0413
0.0005 0.0040
0.0040 0.0102
0.0079 0.0236
0.0493 0.0649
0
10 0.0985 0.1181
MILLIMETERS
MIN
MAX
2.90
3.10
1.30
1.70
0.90
1.10
0.25
0.50
0.85
1.05
0.013
0.100
0.10
0.26
0.20
0.60
1.25
1.65
0
10 2.50
3.00
STYLE 3:
PIN 1. EMITTER 1
2. BASE 1
3. COLLECTOR 2
4. EMITTER 2
5. BASE 2
6. COLLECTOR 1
SOLDERING FOOTPRINT*
2.4
0.094
0.95
0.037
1.9
0.074
0.95
0.037
0.7
0.028
1.0
0.039
SCALE 10:1
mm inches
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
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5
HN1B01FDW1T1
ON Semiconductor and
are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice
to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
“Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All
operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights
nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications
intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should
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and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death
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For additional information, please contact your
local Sales Representative.
HN1B01FDW1T1/D