STMICROELECTRONICS STB30NS15

STB30NS15
N-CHANNEL 150V - 0.075 Ω - 30A D2PAK
LOW GATE CHARGE STripFET™ POWER MOSFET
■
■
■
■
■
TYPE
VDSS
RDS(on)
ID
STB30NS15
150 V
<0.1 Ω
30 A
TYPICAL RDS(on) = 0.075 Ω
EXCEPTIONAL dv/dt CAPABILITY
100% AVALANCHE TESTED
APPLICATION ORIENTED
CHARACTERIZATION
FOR THROUGH-HOLE VERSION CONTACT
SALES OFFICE
3
1
D2PAK
TO-263
(Suffix “T4”)
DESCRIPTION
This MOSFET series realized with STMicroelectronics
unique STripFET process has specifically been designed
to minimize input capacitance and gate charge. It is
therefore suitable as primary switch in advanced highefficiency, high-frequency isolated DC-DC converters for
Telecom and Computer applications. It is also intended
for any applications with low gate drive requirements.
INTERNAL SCHEMATIC DIAGRAM
APPLICATIONS
■ HIGH-EFFICIENCY DC-DC CONVERTERS
■ UPS AND MOTOR CONTROL
ABSOLUTE MAXIMUM RATINGS
Symbol
VDS
VDGR
VGS
ID
ID
IDM(•)
Ptot
Parameter
150
V
Drain-gate Voltage (RGS = 20 kΩ)
150
V
Gate- source Voltage
± 20
V
30
A
Drain Current (continuos) at TC = 100°C
21
A
Drain Current (pulsed)
120
A
Drain Current (continuos) at TC = 25°C
Total Dissipation at TC = 25°C
110
W
Derating Factor
0.73
W/°C
Peak Diode Recovery voltage slope
EAS (2)
Single Pulse Avalanche Energy
Tj
Storage Temperature
Max. Operating Junction Temperature
•) Pulse width limited by safe operating area.
October 2001
Unit
Drain-source Voltage (VGS = 0)
dv/dt (1)
Tstg
Value
2
V/ns
250
mJ
-55 to 175
°C
(1) ISD ≤ 30A, di/dt ≤ 100A/µs, VDD ≤ V (BR)DSS, Tj ≤ TJMAX.
(2) Starting T j = 25 oC, ID = 15A, VDD = 25V
1/9
STB30NS15
THERMAL DATA
Rthj-case
Rthj-amb
Tl
Thermal Resistance Junction-case
Thermal Resistance Junction-ambient
Maximum Lead Temperature For Soldering Purpose
Max
Max
1.36
62.5
300
°C/W
°C/W
°C
ELECTRICAL CHARACTERISTICS (Tcase = 25 °C unless otherwise specified)
OFF
Symbol
Parameter
Test Conditions
Drain-source
Breakdown Voltage
ID = 250 µA, VGS = 0
IDSS
Zero Gate Voltage
Drain Current (VGS = 0)
VDS = Max Rating
VDS = Max Rating TC = 125°C
IGSS
Gate-body Leakage
Current (VDS = 0)
VGS = ± 20V
V(BR)DSS
Min.
Typ.
Max.
150
Unit
V
1
10
µA
µA
±100
nA
ON (*)
Symbol
Parameter
Test Conditions
VGS(th)
Gate Threshold Voltage
VDS = VGS
ID = 250 µA
RDS(on)
Static Drain-source On
Resistance
VGS = 10 V
ID = 15 A
Min.
Typ.
Max.
Unit
2
3
4
V
0.075
0.1
Ω
Typ.
Max.
Unit
DYNAMIC
Symbol
2/9
Parameter
Test Conditions
gfs (*)
Forward Transconductance
VDS = 20 V
Ciss
Coss
Crss
Input Capacitance
Output Capacitance
Reverse Transfer
Capacitance
VDS = 25V f = 1 MHz VGS = 0
ID = 15 A
Min.
8
S
990
175
110
pF
pF
pF
STB30NS15
ELECTRICAL CHARACTERISTICS (continued)
SWITCHING ON (*)
Symbol
td(on)
tr
Qg
Qgs
Qgd
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
Turn-on Time
Rise Time
ID =15 A
VDD = 75 V
VGS = 10 V
RG = 4.7 Ω
(Resistive Load, Figure 3)
12
28
ns
ns
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
VDD=120V ID=30A VGS=10V
64
8
27
nC
nC
nC
SWITCHING OFF(*)
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
td(off)
tf
Turn-off Delay Time
Fall Time
ID = 15 A
VDD = 75 V
VGS = 10 V
RG = 4.7Ω,
(Resistive Load, Figure 3)
50
12
ns
ns
tr(Voff)
tf
tc
Off-voltage Rise Time
Fall Time
Cross-over Time
Vclamp = 120 V
ID = 30 A
VGS = 10 V
RG = 4.7Ω,
(Inductive Load, Figure 5)
50
17
11
ns
ns
ns
SOURCE DRAIN DIODE(*)
Symbol
Parameter
ISD
ISDM (•)
Source-drain Current
Source-drain Current (pulsed)
VSD (*)
Forward On Voltage
ISD = 30 A
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
di/dt = 100A/µs
ISD = 30 A
Tj = 150°C
VDD = 50 V
(see test circuit, Figure 5)
trr
Qrr
IRRM
Test Conditions
Min.
Typ.
VGS = 0
190
1.25
13
Max.
Unit
30
120
A
A
1.3
V
ns
µC
A
(*)Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
(•)Pulse width limited by Tjmax
Safe Operating Area
Thermal Impedance
3/9
STB30NS15
Output Characteristics
Transfer Characteristics
Transconductance
Static Drain-source On Resistance
Gate Charge vs Gate-source Voltage
Capacitance Variations
4/9
STB30NS15
Normalized Gate Threshold Voltage vs Temperature
Normalized on Resistance vs Temperature
Source-drain Diode Forward Characteristics
Normalized Breakdown Voltage vs Temperature.
.
.
.
.
5/9
STB30NS15
Fig. 1: Unclamped Inductive Load Test Circuit
Fig. 2: Unclamped Inductive Waveform
Fig. 3: Switching Times Test Circuits For Resistive
Load
Fig. 4: Gate Charge test Circuit
Fig. 5: Test Circuit For Inductive Load Switching
And Diode Recovery Times
6/9
STB30NS15
D2PAK MECHANICAL DATA
DIM.
mm.
MIN.
TYP.
inch.
MAX.
MIN.
TYP.
TYP.
A
4.4
4.6
0.173
0.181
A1
2.49
2.69
0.098
0.106
A2
0.03
0.23
0.001
0.009
B
0.7
0.93
0.028
0.037
B2
1.14
1.7
0.045
0.067
C
0.45
0.6
0.018
0.024
C2
1.21
1.36
0.048
0.054
D
8.95
9.35
0.352
0.368
10.4
0.394
D1
8
0.315
E
10
E1
8.5
G
4.88
5.28
0.409
0.334
0.192
0.208
L
15
15.85
0.591
0.624
L2
1.27
1.4
0.050
0.055
L3
1.4
1.75
0.055
0.069
M
2.4
3.2
0.094
0.126
8°
0°
R
V2
0.4
0°
0.016
8°
7/9
STB30NS15
D2PAK FOOTPRINT
TUBE SHIPMENT (no suffix)*
TAPE AND REEL SHIPMENT (suffix ”T4”)*
REEL MECHANICAL DATA
DIM.
mm
MIN.
A
DIM.
mm
MAX.
MIN.
MAX.
A0
10.5
10.7
0.413
0.421
B0
15.7
15.9
0.618
0.626
D
1.5
1.6
0.059
0.063
D1
1.59
1.61
0.062
0.063
E
1.65
1.85
0.065
0.073
F
11.4
11.6
0.449
0.456
K0
4.8
5.0
0.189
0.197
P0
3.9
4.1
0.153
0.161
P1
11.9
12.1
0.468
0.476
P2
1.9
2.1
0075
0.082
R
50
1.574
T
0.25
0.35
.0.0098
0.0137
W
23.7
24.3
0.933
0.956
* on sales type
8/9
inch
MIN.
MIN.
330
B
1.5
C
12.8
D
20.2
G
24.4
N
100
T
TAPE MECHANICAL DATA
inch
MAX.
MAX.
12.992
0.059
13.2
0.504
0.520
0.795
26.4
0.960
1.039
3.937
30.4
1.197
BASE QTY
BULK QTY
1000
1000
STB30NS15
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted
by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not
authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
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 2001 STMicroelectronics - All Rights Reserved
All other names are the property of their respective owners.
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