STMICROELECTRONICS STD8NS25

STD8NS25
N-CHANNEL 250V - 0.38Ω - 8A DPAK
MESH OVERLAY™ MOSFET
PRELIMINARY DATA
■
■
■
TYPE
VDSS
RDS(on)
ID
STD8NS25
250 V
< 0.45 Ω
8A
TYPICAL RDS(on) = 0.38 Ω
EXTREMELY HIGH dv/dt CAPABILITY
100% AVALANCHE TESTED
3
1
DESCRIPTION
Using the latest high voltage MESH OVERLAY™
process, STMicroelectronics has designed an advanced family of power MOSFETs with outstanding
performance. The new patented STrip layout coupled with the Company’s proprietary edge termination structure, makes it suitable in coverters for
lighting applications.
DPAK
INTERNAL SCHEMATIC DIAGRAM
APPLICATIONS
■ HIGH CURRENT, HIGH SPEED SWITCHING
■ SWITH MODE POWER SUPPLIES (SMPS)
■ DC-DC CONVERTERS FOR TELECOM,
INDUSTRIAL, AND LIGHTING EQUIPMENT
ABSOLUTE MAXIMUM RATINGS
Symbol
VDS
VDGR
VGS
Parameter
Value
Unit
Drain-source Voltage (VGS = 0)
250
V
Drain-gate Voltage (RGS = 20 kΩ)
250
V
Gate- source Voltage
± 20
V
ID
Drain Current (continuos) at TC = 25°C
8
A
ID
Drain Current (continuos) at TC = 100°C
5
A
Drain Current (pulsed)
32
A
IDM (●)
PTOT
Total Dissipation at TC = 25°C
Derating Factor
dv/dt (1)
Peak Diode Recovery voltage slope
EAS (2)
Single Pulse Avalanche Energy
Tstg
Tj
Storage Temperature
Max. Operating Junction Temperature
(•)Pulse width limited by safe operating area
July 2001
80
W
0.64
W/°C
5
V/ns
209
mJ
–65 to 150
°C
150
°C
(1) ISD≤ 8A, di/dt≤300 A/µs, VDD≤ V(BR)DSS, Tj≤TjMAX
(2) Starting T j = 25°C, IAR = 50A, V DD=20 V
1/6
STD8NS25
THERMAL DATA
Rthj-case
Thermal Resistance Junction-case Max
1.56
°C/W
Rthj-amb
Thermal Resistance Junction-ambient Max
62.5
°C/W
Maximum Lead Temperature For Soldering Purpose
300
°C
Tl
AVALANCHE CHARACTERISTICS
Symbol
Parameter
IAR
Avalanche Current, Repetitive or Not-Repetitive
(pulse width limited by Tj max)
EAS
Single Pulse Avalanche Energy
(starting Tj = 25 °C, ID = IAR, VDD = 50 V)
Max Value
Unit
8
A
300
mJ
ELECTRICAL CHARACTERISTICS (TCASE = 25 °C UNLESS OTHERWISE SPECIFIED)
OFF
Symbol
Parameter
Test Conditions
Drain-source
Breakdown Voltage
ID = 250 µA, VGS = 0
IDSS
Zero Gate Voltage
Drain Current (VGS = 0)
VDS = Max Rating
IGSS
Gate-body Leakage
Current (VDS = 0)
VGS = ±20V
V(BR)DSS
Min.
Typ.
Max.
250
Unit
V
VDS = Max Rating, TC = 125 °C
1
µA
10
µA
±100
nA
ON (1)
Symbol
Parameter
Test Conditions
VGS(th)
Gate Threshold Voltage
VDS = VGS, ID = 250µA
RDS(on)
Static Drain-source On
Resistance
VGS = 10V, ID = 4 A
Min.
Typ.
Max.
Unit
2
3
4
V
0.38
0.45
Ω
Min.
Typ.
Max.
Unit
7
8
S
DYNAMIC
Symbol
gfs (1)
2/6
Parameter
Forward Transconductance
Test Conditions
VDS > ID(on) x RDS(on)max,
ID = 4A
VDS = 25V, f = 1 MHz, VGS = 0
Ciss
Input Capacitance
770
pF
Coss
Output Capacitance
118
pF
Crss
Reverse Transfer
Capacitance
48
pF
STD8NS25
ELECTRICAL CHARACTERISTICS (CONTINUED)
SWITCHING ON
Symbol
td(on)
tr
Parameter
Turn-on Delay Time
Rise Time
Qg
Total Gate Charge
Qgs
Gate-Source Charge
Qgd
Gate-Drain Charge
Test Conditions
Min.
VDD = 125 V, ID = 4 A
RG = 4.7Ω VGS = 10 V
(see test circuit, Figure 3)
VDD = 200V, ID = 8 A,
VGS = 10V
Typ.
Max.
Unit
13
ns
18
ns
37
50
nC
5.2
nC
14.8
nC
SWITCHING OFF
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
td(Voff)
tf
Turn-off- Delay Time
Fall Time
VDD = 125V, ID = 4 A,
RG = 4.7Ω, VGS = 10V
(see test circuit, Figure 3)
51
16
ns
ns
tr(Voff)
tf
tc
Off-voltage Rise Time
Fall Time
Cross-over Time
Vclamp = 200V, ID = 8 A,
RG = 4.7Ω, VGS = 10V
(see test circuit, Figure 5)
12.5
12.5
28
ns
ns
ns
SOURCE DRAIN DIODE
Symbol
ISD
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
Source-drain Current
8
A
ISDM (2)
Source-drain Current (pulsed)
32
A
VSD (1)
Forward On Voltage
ISD = 8 A, VGS = 0
1.7
V
trr
Reverse Recovery Time
Qrr
Reverse Recovery Charge
ISD = 8 A, di/dt = 100A/µs
VDD = 30V, Tj = 150°C
(see test circuit, Figure 5)
IRRM
Reverse Recovery Current
198
ns
1.1
µC
11.3
A
Note: 1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
2. Pulse width limited by safe operating area.
3/6
STD8NS25
Fig. 1: Unclamped Inductive Load Test Circuit
Fig. 2: Unclamped Inductive Waveform
Fig. 3: Switching Times Test Circuit For
Resistive Load
Fig. 4: Gate Charge test Circuit
Fig. 5: Test Circuit For Inductive Load Switching
And Diode Recovery Times
4/6
STD8NS25
TO-252 (DPAK) MECHANICAL DATA
mm
DIM.
MIN.
TYP.
inch
MAX.
MIN.
TYP.
MAX.
A
2.20
2.40
0.087
0.094
A1
0.90
1.10
0.035
0.043
A2
0.03
0.23
0.001
0.009
B
0.64
0.90
0.025
0.035
B2
5.20
5.40
0.204
0.213
C
0.45
0.60
0.018
0.024
C2
0.48
0.60
0.019
0.024
D
6.00
6.20
0.236
0.244
E
6.40
6.60
0.252
0.260
G
4.40
4.60
0.173
0.181
H
9.35
10.10
0.368
0.398
L2
0.8
0.031
L4
0.60
1.00
0.024
0.039
V2
0o
8o
0o
0o
P032P_B
5/6
STD8NS25
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is
granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specification mentioned in this publication are
subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products
are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
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© 2001 STMicroelectronics – Printed in Italy – All Rights Reserved
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