STMICROELECTRONICS STQ1NC45R

STD2NC45-1
STQ1NC45
N-CHANNEL 450V - 4.1Ω - 1.5 A IPAK / TO-92
SuperMESH™Power MOSFET
TYPE
STD2NC45-1
STQ1NC45
■
■
■
■
■
VDSS
RDS(on)
ID
Pw
450 V
450 V
< 4.5 Ω
< 4.5 Ω
1.5 A
0.5 A
30 W
3.1 W
TYPICAL RDS(on) = 4.1 Ω
EXTREMELY HIGH dv/dt CAPABILITY
100% AVALANCHE TESTED
GATE CHARGE MINIMIZED
NEW HIGH VOLTAGE BENCHMARK
DESCRIPTION
The SuperMESH™ series is obtained through an
extreme optimization of ST’s well established stripbased PowerMESH™ layout. In addition to pushing
on-resistance significantly down, special care is taken to ensure a very good dv/dt capability for the
most demanding applications. Such series complements ST full range of high voltage MOSFETs including revolutionary MDmesh™ products.
3
2
1
IPAK
TO-92
TO-92 (Ammopack)
INTERNAL SCHEMATIC DIAGRAM
APPLICATIONS
SWITCH MODE LOW POWER SUPPLIES
(SMPS)
■ LOW POWER, LOW COST CFL (COMPACT
FLUORESCENT LAMPS)
■ LOW POWER BATTERY CHARGERS
■
ORDERING INFORMATION
SALES TYPE
MARKING
PACKAGE
PACKAGING
STD2NC45-1
D2NC45
IPAK
TUBE
STQ1NC45
Q1NC45
TO-92
BULK
STQ1NC45-AP
Q1NC45
TO-92
AMMOPAK
June 2003
1/11
STD2NC45-1, STQ1NC45
ABSOLUTE MAXIMUM RATINGS
Symbol
Parameter
Value
STD2NC45-1
VDS
VDGR
VGS
Unit
STQ1NC45
Drain-source Voltage (VGS = 0)
450
V
Drain-gate Voltage (RGS = 20 kΩ)
450
V
Gate- source Voltage
± 30
V
ID
Drain Current (continuos) at TC = 25°C
1.5
0.5
ID
Drain Current (continuos) at TC = 100°C
IDM ()
PTOT
0.95
0.315
A
Drain Current (pulsed)
6
2
A
Total Dissipation at TC = 25°C
30
3.1
W
0.24
0.025
W/°C
Derating Factor
dv/dt (1)
Tj
Tstg
A
Peak Diode Recovery voltage slope
Operating Junction Temperature
Storage Temperature
3
V/ns
-65 to 150
-65 to 150
°C
°C
( ) Pulse width limited by safe operating area
(1) ISD ≤0.5A, di/dt ≤100A/µs, VDD ≤ V(BR)DSS, Tj ≤ TJMAX.
THERMAL DATA
IPAK
TO-92
Rthj-case
Thermal Resistance Junction-case Max
4.1
Rthj-amb
Thermal Resistance Junction-ambient Max
100
120
°C/W
Rthj-lead
Thermal Resistance Junction-lead Max
40
°C/W
275
260
°C
Tl
Maximum Lead Temperature For Soldering
Purpose
°C/W
AVALANCHE CHARACTERISTICS
Symbol
Parameter
Max Value
IPAK
2/11
Unit
TO-92
IAR
Avalanche Current, Repetitive or Not-Repetitive
(pulse width limited by Tj max)
1.5
A
EAS
Single Pulse Avalanche Energy
(starting Tj = 25 °C, ID = IAR, VDD = 50 V)
25
mJ
STD2NC45-1, STQ1NC45
ELECTRICAL CHARACTERISTICS (TCASE =25°C UNLESS OTHERWISE SPECIFIED)
ON/OFF
Symbol
Parameter
Test Conditions
Drain-source
Breakdown Voltage
ID = 250 µA, VGS = 0
IDSS
Zero Gate Voltage
Drain Current (VGS = 0)
VDS = Max Rating
VDS = Max Rating, TC = 125 °C
IGSS
Gate-body Leakage
Current (VDS = 0)
VGS = ± 30V
VGS(th)
Gate Threshold Voltage
VDS = VGS, ID = 250µA
RDS(on)
Static Drain-source On
Resistance
VGS = 10V, ID = 0.5 A
V(BR)DSS
Min.
Typ.
Max.
450
2.3
Unit
V
1
50
µA
µA
±100
nA
3
3.7
V
4.1
4.5
Ω
Typ.
Max.
Unit
DYNAMIC
Symbol
gfs (1)
Ciss
Coss
Crss
Parameter
Forward Transconductance
Input Capacitance
Output Capacitance
Reverse Transfer
Capacitance
Test Conditions
Min.
VDS > ID(on) x RDS(on)max,
ID = 0.5 A
1.1
VDS = 25V, f = 1 MHz, VGS = 0
S
pF
pF
pF
160
27.5
4.7
SWITCHING ON
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
td(on)
tr
Turn-on Delay Time
Rise Time
VDD = 225 V, ID = 0.5 A
RG = 4.7Ω VGS = 10 V
(Resistive Load see, Figure 3)
6.7
4
Qg
Qgs
Qgd
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
VDD = 360V, ID = 1.5 A,
VGS = 10V, RG = 4.7Ω
7
1.3
3.2
10
nC
nC
nC
Typ.
Max.
Unit
ns
ns
SWITCHING OFF
Symbol
tr(Voff)
tf
tc
Parameter
Off-voltage Rise Time
Fall Time
Cross-over Time
Test Conditions
Min.
VDD = 360V, ID = 1.5 A,
RG = 4.7Ω, VGS = 10V
(Inductive Load see, Figure 5)
8.5
12
18
ns
ns
ns
SOURCE DRAIN DIODE
Symbol
Parameter
Test Conditions
ISD
ISDM (2)
Source-drain Current
Source-drain Current (pulsed)
VSD (1)
Forward On Voltage
ISD = 1.5 A, VGS = 0
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
ISD = 1.5 A, di/dt = 100A/µs
VDD = 100V, Tj = 150°C
(see test circuit, Figure 5)
trr
Qrr
IRRM
Min.
Typ.
225
530
4.7
Max.
Unit
1.5
6.0
A
A
1.6
V
ns
µC
A
Note: 1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
2. Pulse width limited by safe operating area.
3/11
STD2NC45-1, STQ1NC45
Safe Operating Area For IPAK
Thermal Impedance For IPAK
Safe Operating Area For TO-92
Thermal Impedance For TO-92
Output Characteristics
Transfer Characteristics
4/11
STD2NC45-1, STQ1NC45
Transconductance
Static Drain-source On Resistance
Gate Charge vs Gate-source Voltage
Capacitance Variations
Normalized Gate Threshold Voltage vs Temp.
Normalized On Resistance vs Temperature
5/11
STD2NC45-1, STQ1NC45
Source-drain Diode Forward Characteristics
Normalized BVDSS vs Temperature
Max Id Current vs Tc
Maximum Avalanche Energy vs Temperature
6/11
STD2NC45-1, STQ1NC45
Fig. 1: Unclamped Inductive Load Test Circuit
Fig. 2: Unclamped Inductive Waveform
Fig. 3: Switching Times Test Circuit For
Resistive Load
Fig. 4: Gate Charge test Circuit
Fig. 5: Test Circuit For Inductive Load Switching
And Diode Recovery Times
7/11
STD2NC45-1, STQ1NC45
TO-251 (IPAK) MECHANICAL DATA
mm
DIM.
MIN.
inch
TYP.
MAX.
MIN.
TYP.
2.4
0.086
MAX.
0.094
0.043
A
2.2
A1
0.9
1.1
0.035
A3
0.7
1.3
0.027
0.051
B
0.64
0.9
0.025
0.031
B2
5.2
5.4
0.204
0.212
B3
0.85
B5
0.033
0.3
0.012
B6
0.95
0.037
C
0.45
0.6
0.017
0.023
C2
0.48
0.6
0.019
0.023
D
6
6.2
0.236
0.244
E
6.4
6.6
0.252
0.260
G
4.4
4.6
0.173
0.181
H
15.9
16.3
0.626
0.641
L
9
9.4
0.354
0.370
L1
0.8
1.2
0.031
L2
0.8
0.047
1
0.031
0.039
A1
C2
A3
A
C
H
B
B3
=
1
=
2
G
=
=
=
E
B2
=
3
B5
L
D
B6
L2
L1
0068771-E
8/11
STD2NC45-1, STQ1NC45
TO-92 MECHANICAL DATA
mm.
inch
DIM.
MIN.
TYP
MAX.
MIN.
TYP.
MAX.
A
4.32
4.95
0.170
0.194
b
0.36
0.51
0.014
0.020
D
4.45
4.95
0.175
0.194
E
3.30
3.94
0.130
0.155
e
2.41
2.67
0.094
0.105
e1
1.14
1.40
0.044
0.055
L
12.70
15.49
0.50
0.610
R
2.16
2.41
0.085
0.094
S1
0.92
1.52
0.036
0.060
W
0.41
0.56
0.016
0.022
V
5°
5°
9/11
STD2NC45-1, STQ1NC45
10/11
STD2NC45-1, STQ1NC45
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granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specification mentioned in this publication are
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11/11