NEC UPA2701TP

DATA SHEET
MOS FIELD EFFECT TRANSISTOR
µ PA2701TP
SWITCHING
N-CHANNEL POWER MOS FET
PACKAGE DRAWING (Unit: mm)
DESCRIPTION
8
5
1, 2, 3
; Source
4
; Gate
5, 6, 7, 8, 9 ; Drain
The µPA2701TP, which has a heat spreader, is N-Channel
MOS Field Effect Transistor designed for DC/DC converter and
1
4
5.2
+0.17
–0.2
0.05 ±0.05
+0.10
–0.05
4
0.12 M
1.1 ±0.2
0.40
1
2.9 MAX.
PACKAGE
Power HSOP8
0.10 S
1.27 TYP.
2.0 ±0.2
µPA2701TP
4.4 ±0.15
0.15
S
ORDERING INFORMATION
PART NUMBER
6.0 ±0.3
0.8 ±0.2
+0.10
–0.05
FEATURES
• Low on-state resistance
RDS(on)1 = 7.5 mΩ MAX. (VGS = 10 V, ID = 7.0 A)
RDS(on)2 = 11.6 mΩ MAX. (VGS = 4.5 V, ID = 7.0 A)
• Low Ciss: Ciss = 1200 pF TYP. (VDS = 10 V, VGS = 0 V)
• Small and surface mount package (Power HSOP8)
1.44 TYP.
1.49 ±0.21
power management applications of notebook computers.
9
4.1 MAX.
8
5
ABSOLUTE MAXIMUM RATINGS (TA = 25°C, Unless otherwise noted, All terminals are connected.)
Drain to Source Voltage (VGS = 0 V)
VDSS
30
V
Gate to Source Voltage (VDS = 0 V)
VGSS
±20
V
Drain Current (DC) (TC = 25°C)
ID(DC)1
±35
A
ID(DC)2
±16
A
ID(pulse)
±80
A
PT1
28
W
PT2
3
W
Tch
150
°C
Drain Current (DC) (TA = 25°C)
Drain Current (pulse)
Note1
Note2
Total Power Dissipation (TC = 25°C)
Total Power Dissipation (TA = 25°C)
Channel Temperature
Storage Temperature
Note1
Tstg
–55 to +150
°C
Single Avalanche Current
Note3
IAS
18
A
Single Avalanche Energy
Note3
EAS
32.4
mJ
EQUIVALENT CIRCUIT
Drain
Body
Diode
Gate
Gate
Protection
Diode
Source
Notes 1. Mounted on a glass epoxy board (1 inch x 1 inch x 0.8 mm), PW = 10 sec
2. PW ≤ 10 µs, Duty Cycle ≤ 1%
3. Starting Tch = 25°C, VDD = 15 V, RG = 25 Ω, L = 100 µH, VGS = 20 → 0 V
Remark The diode connected between the gate and source of the transistor serves as a protector against ESD. When
this device actually used, an additional protection circuit is extemally required if a voltage exceeding the rated
voltage may be applied to this device.
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all devices/types available in every country. Please check with local NEC representative for
availability and additional information.
Document No.
G15844EJ2V0DS00 (2nd edition)
Date Published May 2002 NS CP(K)
Printed in Japan
The mark ★ shows major revised points.
©
2002
µPA2701TP
ELECTRICAL CHARACTERISTICS (TA = 25°C, Unless otherwise noted, All terminals are connected.)
CHARACTERISTICS
★
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
Zero Gate Voltage Drain Current
IDSS
VDS = 30 V, VGS = 0 V
10
µA
Gate Leakage Current
IGSS
VGS = ±20 V, VDS = 0 V
±10
µA
2.5
V
Gate Cut-off Voltage
Forward Transfer Admittance
Drain to Source On-state Resistance
VGS(off)
VDS = 10 V, ID = 1 mA
1.5
2.0
| yfs |
VDS = 10 V, ID = 7.0 A
7
14
RDS(on)1
VGS = 10 V, ID = 7.0 A
6.2
7.5
mΩ
RDS(on)2
VGS = 4.5 V, ID = 7.0 A
8.7
11.6
mΩ
RDS(on)3
13.7
mΩ
S
VGS = 4.0 V, ID = 7.0 A
10.3
Input Capacitance
Ciss
VDS = 10 V
1200
pF
Output Capacitance
Coss
VGS = 0 V
500
pF
Reverse Transfer Capacitance
Crss
f = 1 MHz
160
pF
Turn-on Delay Time
td(on)
VDD = 15 V, ID = 7.0 A
10
ns
tr
VGS = 10 V
13
ns
td(off)
RG = 10 Ω
44
ns
11
ns
Rise Time
Turn-off Delay Time
Fall Time
tf
Total Gate Charge
QG
VDD = 15 V
12
nC
Gate to Source Charge
QGS
VGS = 5 V
4
nC
Gate to Drain Charge
QGD
ID = 14 A
6
nC
Body Diode Forward Voltage
VF(S-D)
IF = 14 A, VGS = 0 V
0.8
Reverse Recovery Time
trr
IF = 14 A, VGS = 0 V
32
ns
Reverse Recovery Charge
Qrr
di/dt = 100 A/ µs
27
nC
TEST CIRCUIT 1 AVALANCHE CAPABILITY
D.U.T.
RG = 25 Ω
PG.
VGS = −20 → 0 V
V
TEST CIRCUIT 2 SWITCHING TIME
D.U.T.
L
50 Ω
1.2
VGS
RL
Wave Form
RG
PG.
VDD
VGS
0
VGS
10%
90%
VDD
VDS
90%
BVDSS
IAS
VDS
VDS
ID
Starting Tch
τ
τ = 1 µs
Duty Cycle ≤ 1%
TEST CIRCUIT 3 GATE CHARGE
2
10%
0
10%
Wave Form
VDD
PG.
90%
VDS
VGS
0
D.U.T.
IG = 2 mA
RL
50 Ω
VDD
Data Sheet G15844EJ2V0DS
td(on)
tr
ton
td(off)
tf
toff
µPA2701TP
TYPICAL CHARACTERISTICS (TA = 25°C)
DERATING FACTOR OF FORWARD BIAS
SAFE OPERATING AREA
TOTAL POWER DISSIPATION vs.
CASE TEMPERATURE
PT - Total Power Dissipation - W
dT - Percentage of Rated Power - %
30
100
80
60
40
20
0
20
40
60
80
100
120 140
25
20
15
10
5
0
160
0
20
TC - Case Temperature - ˚C
40
60
80
100 120 140
160
TC - Case Temperature - ˚C
FORWARD BIAS SAFE OPERATING AREA
ID(pulse) = 80 A
100
PW
d
ite V)
ID(DC) = 35 A
im 10
)L
on S =
(
S G
RD t V
Power Dissipation Limited
(a
10
10
=
1
m
s
m
s
100 ms
1
TC = 25˚C
Single Pulse
0.1
0.01
0.1
1
10
100
VDS - Drain to Source Voltage - V
TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH
1000 Remark Rth(ch-A): Mounted on a glass epoxy board
rth(t) - Transient Thermal Resistance - ˚C/W
ID - Drain Current - A
1000
(1 inch x 1 inch x 0.8 mm), TA = 25˚C
Rth(ch-C): TC = 25˚C
Rth(ch-A) = 89.3˚C/W
100
10
Rth(ch-C) = 4.46˚C/W
1
0.1
0.0001
Single Pulse
0.001
0.01
0.1
1
10
100
1000
PW - Pulse Width - s
Data Sheet G15844EJ2V0DS
3
µPA2701TP
DRAIN CURRENT vs.
DRAIN TO SOURCE VOLTAGE
FORWARD TRANSFER CHARACTERISTICS
100
80
Pulsed
10
ID - Drain Current - A
ID - Drain Current - A
70
TA = −25˚C
25˚C
75˚C
150˚C
1
0.1
60
VGS = 10 V
4.5 V
50
40
4.0 V
30
20
10
0.01
1
2
VDS = 10 V
4
5
3
Pulsed
0
0
| yfs | - Forward Transfer Admittance - S
FORWARD TRANSFER ADMITTANCE vs.
DRAIN CURRENT
100
VDS = 10 V
Pulsed
10
TA = 150˚C
75˚C
25˚C
−25˚C
1
0.1
0.01
0.1
1
10
100
4
0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0
VDS - Drain to Source Voltage - V
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
GATE TO SOURCE VOLTAGE
20
Pulsed
18
16
14
12
10
8
ID = 7.0 A
6
4
2
0
0
2
4
6
8
10
12
14
16
18
20
VGS - Gate to Source Voltage - V
DRAIN TO SOURCE ON-STATE
RESISTANCE vs. DRAIN CURRENT
GATE CUT-OFF VOLTAGE vs.
CHANNEL TEMPERATURE
30
3
Pulsed
VGS(off) - Gate Cut-off Voltage - V
RDS(on) - Drain to Source On-state Resistance - mΩ
ID - Drain Current - A
RDS(on) - Drain to Source On-state Resistance - mΩ
VGS - Gate to Source Voltage - V
20
VGS = 4.0 V
10
4.5 V
10 V
0
0.01
0.1
1
10
100
VDS = 10 V
ID = 1 mA
2
1
0
−50 −25
ID - Drain Current - A
0
25
50
75
100 125 150
Tch - Channel Temperature - ˚C
Data Sheet G15844EJ2V0DS
µPA2701TP
SOURCE TO DRAIN DIODE
FORWARD VOLTAGE
20
100
ISD - Diode Forward Current - A
Pulsed
15
VGS = 4 V
4.5 V
10
10 V
5
0
−50 −25
Pulsed
VGS = 0 V
10
1
0.1
0.01
0
25
50
75
0
100 125 150 175
0.2
CAPACITANCE vs.
DRAIN TO SOURCE VOLTAGE
1.0
0.8
1.2
SWITCHING CHARACTERISTICS
td(on), tr, td(off), tf - Switching Time - ns
Ciss, Coss, Crss - Capacitance - pF
0.6
100
10000
Ciss
1000
Coss
Crss
100
VGS = 0 V
f = 1 MHz
10
0.1
1
10
td(off)
tf
tr
10
td(on)
VDD = 15 V
VGS = 10 V
RG = 10 Ω
1
0.1
100
1
VDS - Drain to Source Voltage - V
di/dt = 100 A/ µ s
VGS = 0 V
100
10
1
0.1
1
10
100
DYNAMIC INPUT/OUTPUT CHARACTERISTICS
100
VDS - Drain to Source Voltage - V
1000
10
ID - Drain Current - A
REVERSE RECOVERY TIME vs.
DRAIN CURRENT
trr - Reverse Recovery Time - ns
0.4
VSD - Source to Drain Voltage - V
Tch - Channel Temperature - ˚C
40
8
35
7
VDD = 24 V
15 V
6V
30
25
6
5
VGS
20
4
15
3
10
2
5
1
VDS
VGS - Gate to Source Voltage - V
RDS(on) - Drain to Source On-state Resistance - mΩ
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
CHANNEL TEMPERATURE
ID = 14 A
0
0
IF - Drain Current - A
2
4
6
8
10
12
14
16
18
0
20
QG - Gate Charge - nC
Data Sheet G15844EJ2V0DS
5
µPA2701TP
[MEMO]
6
Data Sheet G15844EJ2V0DS
µPA2701TP
[MEMO]
Data Sheet G15844EJ2V0DS
7
µPA2701TP
• The information in this document is current as of May, 2002. The information is subject to change
without notice. For actual design-in, refer to the latest publications of NEC's data sheets or data
books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all products
and/or types are available in every country. Please check with an NEC sales representative for
availability and additional information.
• No part of this document may be copied or reproduced in any form or by any means without prior
written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document.
• NEC does not assume any liability for infringement of patents, copyrights or other intellectual property rights of
third parties by or arising from the use of NEC semiconductor products listed in this document or any other
liability arising from the use of such products. No license, express, implied or otherwise, is granted under any
patents, copyrights or other intellectual property rights of NEC or others.
• Descriptions of circuits, software and other related information in this document are provided for illustrative
purposes in semiconductor product operation and application examples. The incorporation of these
circuits, software and information in the design of customer's equipment shall be done under the full
responsibility of customer. NEC assumes no responsibility for any losses incurred by customers or third
parties arising from the use of these circuits, software and information.
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agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize
risks of damage to property or injury (including death) to persons arising from defects in NEC
semiconductor products, customers must incorporate sufficient safety measures in their design, such as
redundancy, fire-containment, and anti-failure features.
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"Standard", "Special" and "Specific". The "Specific" quality grade applies only to semiconductor products
developed based on a customer-designated "quality assurance program" for a specific application. The
recommended applications of a semiconductor product depend on its quality grade, as indicated below.
Customers must check the quality grade of each semiconductor product before using it in a particular
application.
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and industrial robots
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systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
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"Specific": Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems and medical equipment for life support, etc.
The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's
data sheets or data books, etc. If customers wish to use NEC semiconductor products in applications not
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(Note)
(1) "NEC" as used in this statement means NEC Corporation and also includes its majority-owned subsidiaries.
(2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for
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M8E 00. 4