ETC STB60NF06T4

STB60NF06
N-CHANNEL 60V - 0.014Ω - 60A D2PAK
STripFET POWER MOSFET
TYPE
STB60NF06
■
■
■
■
■
VDSS
RDS(on)
ID
60V
< 0.016 Ω
60A
TYPICAL RDS(on) = 0.014Ω
EXCEPTIONAL dv/dt CAPABILITY
100% AVALANCHE TESTED
APPLICATION ORIENTED
CHARACTERIZATION
ADD SUFFIX “T4” FOR ORDERING IN TAPE &
REEL
DESCRIPTION
This Power Mosfet series realized with STMicroelectronics unique STripFET process has specifically been designed to minimize input capacitance and
gate charge. It is therefore suitable as primary
switch in advanced high-efficiency isolated DC-DC
converters for Telecom and Computer application. It
is also intended for any application with low gate
charge drive requirements.
3
1
D2PAK
INTERNAL SCHEMATIC DIAGRAM
APPLICATIONS
■ HIGH-EFFICIENCY DC-DC CONVERTERS
■ UPS AND MOTOR CONTROL
■ AUTOMOTIVE
ABSOLUTE MAXIMUM RATINGS
Symbol
VDS
VDGR
Parameter
Value
Unit
Drain-source Voltage (VGS = 0)
60
V
Drain-gate Voltage (RGS = 20 kΩ)
60
V
± 20
V
ID
Drain Current (continuos) at TC = 25°C
60
A
ID
Drain Current (continuos) at TC = 100°C
42
A
Drain Current (pulsed)
240
A
VGS
IDM (●)
PTOT
dv/dt (1)
Tstg
Tj
Gate- source Voltage
Total Dissipation at TC = 25°C
110
W
Derating Factor
0.73
W/°C
4
V/ns
–65 to 175
°C
175
°C
Peak Diode Recovery voltage slope
Storage Temperature
Max. Operating Junction Temperature
( ●) Pulse width limi ted by safe operating area
February 2001
(1) ISD≤ 60A, di/dt≤400 A/µs, VDD≤ 24V, Tj≤TjMAX
1/9
STB60NF06
THERMAL DATA
Rthj-case
Thermal Resistance Junction-case Max
1.36
°C/W
Rthj-amb
Thermal Resistance Junction-ambient Max
62.5
°C/W
Maximum Lead Temperature For Soldering Purpose
300
°C
Tl
AVALANCHE CHARACTERISTICS
Symbol
Max Value
Unit
IAR
Avalanche Current, Repetitive or Not-Repetitive
(pulse width limited by Tj max)
Parameter
30
A
EAS
Single Pulse Avalanche Energy
(starting Tj = 25 °C, ID = IAR, VDD = 30 V)
360
mJ
ELECTRICAL CHARACTERISTICS (TCASE = 25 °C UNLESS OTHERWISE SPECIFIED)
OFF
Symbol
Parameter
Test Conditions
Drain-source
Breakdown Voltage
ID = 250 µA, VGS = 0
IDSS
Zero Gate Voltage
Drain Current (V GS = 0)
VDS = Max Rating
IGSS
Gate-body Leakage
Current (VDS = 0)
VGS = ± 20V
V(BR)DSS
Min.
Typ.
Max.
60
Unit
V
1
VDS = Max Rating, TC = 125 °C
µA
10
µA
±100
nA
Max.
Unit
4
V
0.014
0.016
Ω
Typ.
Max.
Unit
ON (1)
Symbol
Parameter
Test Conditions
VGS(th)
Gate Threshold Voltage
VDS = VGS, ID = 250µA
R DS(on)
Static Drain-source On
Resistance
VGS = 10V, ID = 30 A
Min.
Typ.
2
DYNAMIC
Symbol
gfs (1)
2/9
Parameter
Test Conditions
Forward Transconductance
VDS =15V , ID = 30 A
C iss
Input Capacitance
VDS = 25V, f = 1 MHz, VGS = 0
Coss
Crss
Min.
20
S
1810
pF
Output Capacitance
360
pF
Reverse Transfer
Capacitance
125
pF
STB60NF06
ELECTRICAL CHARACTERISTICS (CONTINUED)
SWITCHING ON
Symbol
td(on)
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
16
ns
Rise Time
VDD = 30 V, I D = 30 A
RG = 4.7Ω VGS = 10V
(see test circuit, Figure 3)
108
ns
Qg
Total Gate Charge
VDD = 48V, ID =60A,V GS = 10V
49
Qgs
Gate-Source Charge
18
nC
Q gd
Gate-Drain Charge
14
nC
tr
Turn-on Delay Time
66
nC
SWITCHING OFF
Symbol
Parameter
Test Condit ions
Min.
Typ.
Max.
Unit
td(off)
tf
Turn-off-Delay Time
Fall Time
VDD = 30 V, ID = 30 A,
R G = 4.7Ω, VGS = 10V
(see test circuit, Figure 3)
43
20
ns
ns
td(off)
tf
tc
Off-voltage Rise Time
Fall Time
Cross-over Time
Vclamp =48V, I D = 60 A
R G = 4.7Ω, VGS = 10V
(see test circuit, Figure 3)
40
12
21
ns
ns
ns
SOURCE DRAIN DIODE
Symbol
ISD
ISDM (1)
VSD (2)
trr
Qrr
IRRM
Parameter
Test Conditions
Min.
Typ.
Source-drain Current
Source-drain Current (pulsed)
Forward On Voltage
ISD = 60 A, V GS = 0
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
ISD = 60 A, di/dt = 100A/µs,
VDD = 25V, Tj = 150°C
(see test circuit, Figure 5)
Max.
Unit
60
A
240
A
1.3
73
182
5
V
ns
nC
A
Note: 1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
2. Pulse width limited by safe operating area.
Safe Operating Area
Thermal Impedence
3/9
STB60NF06
Output Characteristics
Transfer Characteristics
Transconductance
Static Drain-source On Resistance
Gate Charge vs Gate-source Voltage
Capacitance Variations
4/9
STB60NF06
Normalized Gate Threshold Voltage vs
Temperature
Normalized On Resistance vs Temperature
Source-drain Diode Forward Characteristics
5/9
STB60NF06
Fig. 1: Unclamped Inductive Load Test Circuit
Fig. 2: Unclamped Inductive Waveform
Fig. 3: Switching Times Test Circuit For
Resistive Load
Fig. 4: Gate Charge test Circuit
Fig. 5: Test Circuit For Inductive Load Switching
And Diode Recovery Times
6/9
STB60NF06
D2PAK MECHANICAL DATA
mm.
inch
DIM.
MIN.
TYP
MAX.
MIN.
TYP.
MAX.
A
4.4
4.6
0.173
0.181
A1
2.49
2.69
0.098
0.106
A2
0.03
0.23
0.001
0.009
B
0.7
0.93
0.027
0.036
B2
1.14
1.7
0.044
0.067
C
0.45
0.6
0.017
0.023
C2
1.23
1.36
0.048
0.053
D
8.95
9.35
0.352
0.368
D1
E
8
0.315
10
E1
10.4
0.393
8.5
0.334
G
4.88
5.28
0.192
0.208
L
15
15.85
0.590
0.625
L2
1.27
1.4
0.050
0.055
L3
1.4
1.75
0.055
0.068
M
2.4
3.2
0.094
0.126
R
0.015
0º
8º
3
V2
0.4
7/9
1
STB60NF06
D2PAK FOOTPRINT
TUBE SHIPMENT (no suffix)*
TAPE AND REEL SHIPMENT (suffix ”T4”)*
REEL MECHANICAL DATA
DIM.
mm
MIN.
A
B
C
TAPE MECHANICAL DATA
mm
MIN. MAX.
inch
MIN. MAX.
A0
10.5
10.7
0.413 0.421
B0
15.7
15.9
0.618 0.626
D
D1
1.5
1.59
1.6
1.61
0.059 0.063
0.062 0.063
E
F
1.65
11.4
1.85
11.6
0.065 0.073
0.449 0.456
K0
4.8
5.0
0.189 0.197
P0
3.9
4.1
0.153 0.161
P1
P2
11.9
1.9
12.1
2.1
0.468 0.476
0.075 0.082
R
T
50
0.25
1.574
0.35 0.0098 0.0137
W
23.7
24.3
DIM.
* on sales type
8/9
0.933 0.956
1.5
12.8
D
20.2
G
24.4
N
T
100
MAX.
330
inch
MIN.
MAX.
12.992
13.2
0.059
0.504 0.520
26.4
0.960 1.039
0795
3.937
30.4
1.197
BASE QTY
BULK QTY
1000
1000
STB60NF06
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is
granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specification mentioned in this publication are
subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products
are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
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