IRF IR2151

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Data Sheet No. PD-6.034G
IR2151
SELF-OSCILLATING HALF-BRIDGE DRIVER
Features
Product Summary
n Floating channel designed for bootstrap operation
Fully operational to +600V
Tolerant to negative transient voltage
dV/dt immune
n Undervoltage lockout
n Programmable oscillator frequency
f =
1
1.4 × (R T + 75Ω) × CT
n Matched propagation delay for both channels
n Low side output in phase with RT
VOFFSET
600V max.
Duty Cycle
50%
IO+/-
100 mA / 210 mA
VOUT
10 - 20V
Deadtime (typ.)
1.2 µs
Packages
Description
The IR2151 is a high voltage, high speed, self-oscillating power MOSFET and IGBT driver with both high
and low side referenced output channels. Proprietary
HVIC and latch immune CMOS technologies enable
ruggedized monolithic construction. The front end features a programmable oscillator which is similar to the
555 timer. The output drivers feature a high pulse current buffer stage and an internal deadtime designed for
minimum driver cross-conduction. Propagation delays
for the two channels are matched to simplify use in
50% duty cycle applications. The floating channel can
be used to drive an N-channel power MOSFET or IGBT
in the high side configuration that operates off a high
voltage rail up to 600 volts.
Typical Connection
up to 600V
V CC
VB
RT
HO
CT
VS
COM
LO
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IR2151
Absolute Maximum Ratings
Absolute Maximum Ratings indicate sustained limits beyond which damage to the device may occur. All voltage parameters are absolute voltages referenced to COM. The Thermal Resistance and Power Dissipation ratings are measured
under board mounted and still air conditions.
Parameter
Definition
Symbol
Value
Min.
Max.
VB
High Side Floating Supply Voltage
-0.3
625
VS
High Side Floating Supply Offset Voltage
VB - 25
VB + 0.3
VHO
High Side Floating Output Voltage
VS - 0.3
VB + 0.3
VLO
Low Side Output Voltage
-0.3
VCC + 0.3
VRT
RT Voltage
-0.3
VCC + 0.3
VCT
CT Voltage
-0.3
VCC + 0.3
ICC
Supply Current (Note 1)
—
25
IRT
RT Output Current
-5
5
dVs/dt
Allowable Offset Supply Voltage Transient
PD
Package Power Dissipation @ TA ≤ +25°C
RθJA
Thermal Resistance, Junction to Ambient
—
50
(8 Lead DIP)
—
1.0
(8 Lead SOIC)
—
0.625
(8 Lead DIP)
—
125
(8 Lead SOIC)
—
200
TJ
Junction Temperature
—
150
TS
Storage Temperature
-55
150
TL
Lead Temperature (Soldering, 10 seconds)
—
300
Units
V
mA
V/ns
W
°C/W
°C
Recommended Operating Conditions
The Input/Output logic timing diagram is shown in Figure 1. For proper operation the device should be used within the
recommended conditions. The VS offset rating is tested with all supplies biased at 15V differential.
Symbol
Parameter
Definition
Value
Min.
Max.
Units
VB
High Side Floating Supply Absolute Voltage
VS + 10
VS + 20
VS
High Side Floating Supply Offset Voltage
—
600
VHO
High Side Floating Output Voltage
VS
VB
VLO
Low Side Output Voltage
0
VCC
ICC
Supply Current (Note 1)
—
5
mA
TA
Ambient Temperature
-40
125
°C
Note 1:
V
Because of the IR2151’s application specificity toward off-line supply systems, this IC contains a zener clamp
structure between the chip VCC and COM which has a nominal breakdown voltage of 15.6V. Therefore, the IC
supply voltage is normally derived by forcing current into the supply lead (typically by means of a high value
resistor connected between the chip VCC and the rectified line voltage and a local decoupling capacitor from
VCC to COM) and allowing the internal zener clamp circuit to determine the nominal supply voltage. Therefore, this circuit should not be driven by a DC, low impedance power source of greater than VCLAMP.
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IR2151
Dynamic Electrical Characteristics
VBIAS (VCC, VBS) = 12V, CL = 1000 pF and TA = 25°C unless otherwise specified.
Parameter
Definition
Symbol
Value
Min. Typ. Max. Units Test Conditions
tr
Turn-On Rise Time
—
80
120
tf
Turn-Off Fall Time
—
40
70
0.50
1.20
2.25
µs
48
50
52
%
DT
D
Deadtime
RT Duty Cycle
ns
Static Electrical Characteristics
VBIAS (VCC , VBS) = 12V, CL = 1000 pF, C T = 1 nF and TA = 25°C unless otherwise specified. The VIN, VTH and IIN
parameters are referenced to COM. The V O and IO parameters are referenced to COM and are applicable to the
respective output leads: HO or LO.
Symbol
fOSC
VCLAMP
Parameter
Definition
Value
Min. Typ. Max. Units Test Conditions
Oscillator Frequency
19.4
20.0
20.6
94
100
106
VCC Zener Shunt Clamp Voltage
14.4
15.6
16.8
kHz
RT = 35.7 kΩ
RT = 7.04 kΩ
ICC = 5 mA
VCT+
2/3 VCC Threshold
7.8
8.0
8.2
VCT-
1/3 VCC Threshold
3.8
4.0
4.2
CT Undervoltage Lockout
—
20
50
2.5V<VCC <VCCUV+
VRT+
RT High Level Output Voltage, V CC - RT
—
0
100
I RT = -100 µA
—
200
300
IRT = -1 mA
VRT-
RT Low Level Output Voltage
—
20
50
IRT = 100 µA
—
200
300
RT Undervoltage Lockout, VCC - RT
—
0
100
2.5V<VCC <VCCUV+
VOH
High Level Output Voltage, VBIAS - VO
—
—
100
IO = 0A
VOL
Low Level Output Voltage, VO
—
—
100
IO = 0A
I LK
Offset Supply Leakage Current
—
—
50
VB = VS = 600V
I QBS
Quiescent VBS Supply Current
Quiescent VCC Supply Current
—
10
50
—
400
950
CT Input Current
—
0.001
1.0
VCCUV+
VCC Supply Undervoltage Positive Going
Threshold
7.7
8.4
9.2
VCCUV-
VCC Supply Undervoltage Negative Going
Threshold
7.4
8.1
8.9
VCCUVH
VCTUV
VRTUV
I QCC
ICT
VCC Supply Undervoltage Lockout Hysteresis
200
500
—
I O+
Output High Short Circuit Pulsed Current
100
125
—
I O-
Output Low Short Circuit Pulsed Current
210
250
—
To Order
V
mV
IRT = 1 mA
µA
V
mV
mA
VO = 0V
VO = 15V
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IR2151
Functional Block Diagram
VB
R
HV
LEVEL
SHIFT
RT
+
R
CT
R
Q
S
Q
DEAD
TIME
R
HO
S
PULSE
GEN
VS
VCC
15.6V
+
R
Q
PULSE
FILTER
DEAD
TIME
UV
DETECT
LO
DELAY
COM
Lead Definitions
Lead
Symbol Description
RT
CT
Oscillator timing resistor input,in phase with LO for normal IC operation
Oscillator timing capacitor input, the oscillator frequency according to the following equation:
f =
VB
HO
VS
VCC
LO
COM
1
1.4 × (R T + 75Ω) × CT
where 75Ω is the effective impedance of the RT output stage
High side floating supply
High side gate drive output
High side floating supply return
Low side and logic fixed supply
Low side gate drive output
Low side return
Lead Assignments
8 Lead DIP
SO-8
IR2151
IR2151S
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IR2151
Device Information
Process & Design Rule
Transistor Count
Die Size
Die Outline
Thickness of Gate Oxide
Connections
First
Layer
Second
Layer
Contact Hole Dimension
Insulation Layer
Passivation
Method of Saw
Method of Die Bond
Wire Bond
Leadframe
Package
HVDCMOS 4.0 µm
231
68 X 101 X 26 (mil)
Material
Width
Spacing
Thickness
Material
Width
Spacing
Thickness
Material
Thickness
Material
Thickness
Method
Material
Material
Die Area
Lead Plating
Types
Materials
800Å
Poly Silicon
5 µm
6 µm
5000Å
Al - Si - Cu (Si: 1.0%, Cu ±0.5%)
6 µm
9 µm
20,000Å
5 µm X 5 µm
PSG (SiO2)
1.7 µm
PSG (SiO2)
1.7 µm
Full Cut
Ablebond 84 - 1
Thermo Sonic
Au (1.0 mil / 1.3 mil)
Cu
Ag
Pb : Sn (37 : 63)
8 Lead PDIP / SO-8
EME6300 / MP150 / MP190
Remarks:
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IR2151
VCCUV +
VCLAMP
VCC
RT (HO)
RT
50%
50%
CT
RT (LO)
tf
tr
HO
90%
LO
HO
LO
Figure 1. Input/Output Timing Diagram
10%
10%
Figure 2. Switching Time Waveform Definitions
RT
50%
50%
90%
HO
10%
DT
LO
90%
90%
10%
Figure 3. Deadtime Waveform Definitions
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