ETC BW1221L

10BIT 80MSPS DUAL DAC
BW1221L
GENERAL DESCRIPTION
The BW1221L is a CMOS Dual 10Bit D/A
converter for general & video applications.
Its maximum conversion rate is 80MSPS
(typical 50MSPS) and supply voltage is
3.3V single. An external 1.0V voltage
reference(VREF) and a single resistor
(RSET) control the full_scale output current.
FUNCTIONAL BLOCK DIAGRAM
TYPICAL APPLICATIONS
SWITCH 2
IO1
IO2
COMP
CLK
CLKGEN
OPA
CM
VREF
Ver 1.1 (Dec. 1998)
No responsibility is assumed by SEC for its use nor for any
infringements of patents or other rights of third parties that may
result from its use. The content of this datasheet is subject to
change without any notice.
SAMSUNG ELECTRONICS Co. LTD
SWITCH 1
80MSPS 1CLK pipeline delay operation
+3.3V CMOS monolothic construction
±0.4LSB differential linearity error(Typ)
±1.5LSB integral linearity error(Typ)
External voltage reference
Dual Channel DAC
10-Bit voltage parallel input per channel
High impedance single current output
Bineary coding input
High impedance analog output current
source
Second Latch 2
D2[9:0]
-
Decoeder 2
First Latch2
FEATURES
Second Latch 1
D1[9:0]
Decoeder 1
High Definition Television(DTV,HDTV)
High Resolution Color Graphics
Hard Disk Driver(HDD)
CAE/CAD/CAM
Image Processing
Instrumentation
Conventional Digital to Analog Conversion
First Latch1
-
1 / 13
PD IREF
BW1221L
10BIT 80MSPS Dual DAC
CORE CONFIGURATION
I/O TYPE ABBR.
I/O
TYPE
I/O PAD
D1[9:0]
DI
picc_bb
1st Channel Digital input
D2[9:0]
DI
picc_bb
2nd Channel Digital input
IO1
AO
poa_bb
1st Channel Current Output
IO2
AO
poa_bb
2nd Channel Current Output
CLK
DI
picc_bb
Clock Input
VREF
AI
pia_bb
Reference voltage input
COMP
AI
pia_bb
External capacitance connection
NAME
PIN DESCRIPTION
PD
DI
picc_bb
Power-Down High Enable
IREF
AI
pia_bb
external resistor connection
VDDA
AP
vdda
Analog Power
VDDD
DP
vddd
Digital Power
VSSA
AG
vssa
Analog Ground
VSSD
DG
vssd
Digital Ground
VBB
AG
vbba
Bulk Bias
VDD
VSS
VDDA
VSSA
-
AI : Analog Input
DI : Digital Input
AO : Analog Output
DO : Analog Output
-
AP
DP
AG
DG
:
:
:
:
Analog Power
Digital Power
Analog Ground
Digital Ground
- AB : Analog Bidirection
- DB : Digital Bidirection
VBB
D1[9:0]
IO1
bw1221l
D2[9:0]
IO2
CLK
SEC ASIC
PD
COMP
IREF
2 / 13
VREF
ANALOG
BW1221L
10BIT 80MSPS Dual DAC
ABSOLUTE MAXIMUM RATINGS
CHARACTERISTICS
SYMBOL
VALUES
UNIT
Supply Voltage
VDDA
VDDD
5
V
Voltage on any Digital Voltage
Vin
VSSD-0.3 to VDDD+0.3
V
Storage Temperature Range
Tstg
-45 to 125
°C
NOTE:
* It is strongly recommended that to avoid power latch-up all the supply
Pins(VDDA,VDDD) be driven from the same source, and all ground Pins(
VSSA,VSSD,VBB) be driven from the same source.
* Absolute Maximum Rating values should be applied individually while all other
parameters are within specified operating conditions. Function operation
under any of these conditions is not implied.
* Applied voltage must be limited to specified range.
* Absolute Maximum Ratings are values beyond which the device may be
damaged permanently. Normal operation is not guaranteed.
RECOMMENDED OPERATING CONDITIONS
CHARACTERISTICS
SYMBOL
MIN
TYP
MAX
UNIT
Operating Supply Voltage
VDDA,VDDD
3.15
3.3
3.45
V
Digital input Voltage HIGH
LOW
VIH
VIL
0.7VDDD
-
3.3
0.0
0.3VDDD
V
Operating Temperature Range
Topr
0
25
70
°C
Output Load(effective)
RL
-
37.5
-
Ω
Data Input Setup Time
TS
-
2
-
ns
Data Input Hold Time
TH
-
2
-
ns
Clock Cycle Time
tCLK
12.6
20
-
ns
Clock Pulse Width High
tPWH
6
10
-
ns
Clock Pulse Width Low
tPWL
6
10
-
ns
IREF Current
IREF
1.5
1.77
2.0
mA
Zero_level Voltage
VOZ
-5.0
-1.2
5.0
mV
External Reference Voltage
VREF
-
1.0
-
V
NOTE:
• It is strongly recommended that all the supply pins(VDDA,VDDD) should be driven
from the same source to avoid power latch-up.
SEC ASIC
3 / 13
ANALOG
BW1221L
10BIT 80MSPS Dual DAC
DC ELECTRICAL CHARACTERISTICS
CHARACTERISTICS
SYMBOL
MIN
TYP
MAX
UNIT
Resolution
-
-
10
-
Bits
Differential Linearity Error
DLE
-
±0.4
±1.0
LSB
Integral Linearity Error
ILE
-
±1.5
±2.0
LSB
Full Scale Current per Channel
Ifs
23
25
28
mA
Monotonicity
-
-
Guaranteed
-
-
LSB Size
-
23
25
28
uA
Maximum Output Compliance
Voc
-0.5
0.0
0.2
V
Exteranl Refence Voltage
-
-
1.0
-
V
Power Supply Current
Is
50
54
60
mA
NOTES
* Converter Specifications (unless otherwise specified)
VDDA=3.3V VDDD=3.3V VSSA=VSSD=VBB=GND
Ta=25°C RL1=RL2=37.5Ω , VREF=1.0V, Rset = 564Ω
* TBD : To Be Determined
AC ELECTRICAL CHARACTERISTICS
CHARACTERISTICS
SYMBOL
MIN
TYP
MAX
UNIT
Conversion Speed
fMAX
-
50
80
MHz
Analog Output Delay
Td
-
11
20
ns
Analog Output Rising Time
Tr
-
15
25
ns
Analog Output Falling Time
Tf
-
19
30
ns
Analog Output Settling Time
Tset
-
100
150
ns
Glitch Impulse
GI
-
±120
±200
pVsec
Pipeline Delay
Top
-
1
-
Clock
Power Supply Rejection Ratio
(f=1KHz, COMP=0.1uF)
PSS
-
0.0
0.5
%
Feedthrough
fdth
-
-33
-28
dB
Power_Down On Time
Tpn
-
4
6
ms
Power_Down Off Time
Tpf
-
0.1
0.3
ms
NOTE:
• The above pararameters are not tested through the temperature range.
• Clock and data feedthrough is a function of the amount of overshoot and undershoot on the
digital inputs. Settling time does not include clock and data feedthrough. Glitch impulse include
clock and data feedthrough.
SEC ASIC
4 / 13
ANALOG
BW1221L
10BIT 80MSPS Dual DAC
FUNCTIONAL DESCRIPTION
This is dual 10bit 80MSPS digital to analog data
converter and uses segment architecture for 5bits of
MSB sides and binerary-weighted architecture for 5bits
of LSB side. It contains of 1st latch block, decoder
block, 2nd latch block, OPA block, CM(current
mirror)block and analog switch block. This core uses
reference current to decide the 1LSB current size by
dividing the reference current by 68times. So the
reference current must be constant and the reference
curretn of CM can be constant by using OPA block
with high DC gain. The most significant block of this
core is analog switch block and it must maintain the
uniformity at each switch, so layout designer must
care of the matching characteristic on analog switch
and CM block. And more than 80%
of supply
current is dissipated at analog switch block and OPA
block. And it uses samsung(SEC) standard cell as all
digital cell of latch,decoder and buffer. And to adjust
full current output, you must decide the "Rset"
resistor value(connected to IREF pin) and "Vbias"
voltage value(connected to VREF pin). Its voltage
output can be obtained by connecting RL1(connected to
IO1 pin) and RL2(connected to IO2 pin). Its maximum
output voltage limit is 1.2V. So you must decide the
RL1, RL2, Vbias and Rset carefully not Vout(p-p) to
exceed 1.2V. It contains PD pin for power-save but
regretfuly
it isn't complete. If you want more
complete power-save mode, call back us(SEC). We
can provide you more complete power-save mode
control scheme.
SEC ASIC
5 / 13
ANALOG
BW1221L
10BIT 80MSPS Dual DAC
TIMING DIAGRAM
data(1111111111)
0000000000
D[9:0]
Ts
Tpwh
Tclk
High
CLK
0000000000
Tpwl
Low
Td
Tset
Vout(p-p)
IO
1 Clocks Pipeline Delay
0V
tR
tF
CLK
D[9:0]
data[1]
data[2]
data[3]
Td
Ts
Th
IO
Vout[1]
Vout[2]
CLK
D[9:0]
data1(1111111111)
PD
Tpn
Vout(pp)
IO1,IO2
Tpf
0V
NOTES:
• The Behavioral Modeling is provided by Verilog HDL modeling file which includes the spec of
pipeline delay, setup_time, hold_time, rising time, falling time, and clock frequency, and so on.
• Output delay(Td) measured from the 50% point of the rising edge of CLK to the full scale trasition
• Settling time(Tset) measured from the 50% point of full scale transition to the output remaining
within ±1LSB.
Output
rising(Tr)/falling(Tf) time measured between the 10% and 90% points of full scale transition.
•
• Power_down doesn't need clock signal.
SEC ASIC
6 / 13
ANALOG
BW1221L
10BIT 80MSPS Dual DAC
CORE EVALUATION GUIDE
3.3V
L1
3.3V
L2
Cc
+
Ct
+
Cc
Ct
VDDD VSSD VDDA VSSA
D1[9]
D1[8]
D1[7]
D1[6]
D1[5]
D1[4]
D1[3]
D1[2]
D1[1]
D1[0]
10
HOST
DSP
CORE
VBB
IO2
bw1221l
IO1
D2[9]
D2[8]
D2[7]
D2[6]
D2[5]
D2[4]
D2[3]
D2[2]
D2[1]
D2[0]
10
CLK
CHANNEL
SELECT
RL1
RL2
PD
COMP
IREF
VREF
CCOMP
10
RSET
PATH
SELECT
1.0V
VDDA
TEST PATH
CLOCK input
LOCATION
DESCRIPTION
CCOMP,Cc
0.1µF CERAMIC CAPACITOR
Ct
10µFTANTALUM CAPACITOR
RSET
564Ω
RL1
37.5Ω
RL2
37.5Ω
VREF
1.0V DC Voltage Supply
SEC ASIC
7 / 13
ANALOG
BW1221L
10BIT 80MSPS Dual DAC
* How to change the resolution
If it is needed to change the resolution, you can use as many as more significant bits,
and the rest (less significant bits) can be grounded or supplied by VDDD power. That is,
if you need only 8bits, you have to use MSB 8bit digital input pin, and the LSB 2 digital
input pin have to be grounded or supplied by VDDD power.
* How to change the output range
You can change the output swing using the following equation:
Vout = { Vref / ( Rset*68) } * 1023 * RL
This equation implies that you can determine the output swing by changing the value of Vref,
Rset, and RL where the output swing is limited up to 1.2V.
1. ABOUT TESTABILITY
If you want to test it over full spec via all channel in main chip(that is, when it is used
as a block of main chip) you must add many pins(for 20pins of digital inputs, 2pins of
analog outputs, etc) at the main chip to test this DAC block. But usually it is nearly impossble
'cause the total number of pins at main chip is limited. So more efficient method for testing
this DAC block is needed. We offer two efficient ways of testing here as a reference.
But remember that this is not the best way. You can test it by your own testing method.
2. FIRST METHOD OF TESTABILITY
The first way is adding only extra 10PADs for 10bit parallel digital inputs and 2PADs for
channel selecting and path selecting. You can check two channels one by one, that is you
can test only one channel at one time. Therefore you can test all two channels by turn
but cannot check all channels at one time. And this method needs extra analog MUX and
switch blocks for testing. Furthermore we cna assure all channels by testing only one channel
because the two channels have same architecture and share the same analog reference
block(OPA, CM). This characteristic makes it simple to test this DAC block(when it is
embedded in main chip) by adding another 10PADs and selecting 2PADs for selecting one
channel analog switch block of DAC out of two chab\nnels.
3. SECOND METHOD OF TESTABILITY
If above extra 12PADs are burden on you, then you can test it by this second method to
reduce the extra PADs for testing. What is different from above method is that this way needs
only 2 extra PADs(one for 1bit input and the other for clock signal), but you must insert extra
serial to parallel converter block for converting 1bit 10times speedy digital input to 10bit
parallel digital inputs. And this block needs considerable area. Further this method also needs
extra 2PADs for channel selecting and path selecting.
4 ANALYSIS
The voltage applied to VREF is measured at IREF node . And the voltage value
is proportioned to the reference current value of resistor which is connected to
IREF node. So you can estimate the full scale current value by measuring the
voltage, and check the DC characteristics of the OPA. For reference, as
VREF applied to VREF node is given at IREF node, the current flowing through
RSET is given as VREF/RSET.
If the voltage applied to VREF node is not same with IREF node, you can say
"This DAC chip does not work properly", because the internal OPAMP block
makes the two node voltage(IFEF pin, VREF pin) equal.And you have to
check the COMP node to see the desired voltage on it. If the desired
voltage is not measured, you can check the DAC output by appling a
voltage to the node directly.
SEC ASIC
8 / 13
ANALOG
BW1221L
10BIT 80MSPS Dual DAC
CORE LAYOUT GUIDE
Layout DAC core replacement
• It is recommended that you use thick analog power metal. When connecting to PAD, the path should
be kept as short as possible, and use branch metal to connect to the center of analog switch block.
• It is recommended that you use thick analog output metal(at least more than 50um) when connecting to PAD,
and also the path length should be kept as short as possible. If the metal width is less than 50um, you
should use double or triple PADs.
• Digital power and analog power are separately used.
• When it is connected to other blocks, it must be double shielded using N-well and P+ active to
remove the substrate and coupling noise. In that case, the power metal should be connected to PAD directly.
• Bulk power is used to reduce the influence of substrate noise.
• You must use more than two pins for VDDA because it requires much current dissipation.
SEC ASIC
9 / 13
ANALOG
BW1221L
10BIT 80MSPS Dual DAC
PACKAGE CONFIGURATION
0.1µF
10µF
+3.3V
VDDA
1
48
VSSA
VDDA
2
47
VSSA
VBB
3
46
NC
IO2
4
45
COMP
IO2
5
44
IO1
IREF
6
43
IO1
VREF
7
42
NC
VDDD
8
41
NC
VDDD
9
40
VDDR
0.1µF
R=37.5Ω
0.1µF
R=1KΩ
R=37.5Ω
b
VREF=1.0V
0.1µF
w
+3.3V
10µF
+3.3V
10uF
0.1uF
VSSR
38
PD
37
NC
36
NC
35
D1[0]
D1[0] INPUT
34
D1[1]
D1[1] INPUT
33
D1[2]
D1[2] INPUT
17
32
D1[3]
D1[3] INPUT
D2[4]
18
31
D1[4]
D1[4] INPUT
D2[5] INPUT
D2[5]
19
30
D1[5]
D1[5] INPUT
D2[6] INPUT
D2[6]
20
29
D1[6]
D1[6] INPUT
D2[7] INPUT
D2[7]
21
28
D1[7]
D1[7] INPUT
D2[8] INPUT
D2[8]
22
27
D1[8]
D1[8] INPUT
D2[9] INPUT
D2[9]
23
26
D1[9]
D1[9] INPUT
24
25
NC
10
VSSD
11
VBB
12
CLK
13
D2[0] INPUT
D2[0]
14
D2[1] INPUT
D2[1]
15
D2[2] INPUT
D2[2]
16
D2[3] INPUT
D2[3]
D2[4] INPUT
CLOCK
NC
1 2 2 1 l
39
VSSD
NOTE
*Analog and digital supplies should be separated and decoupled.
*Supplies are not connected internally
*All ground pins must be connected. One ground plane is preferred although it depends on the application
SEC ASIC
10 / 13
ANALOG
BW1221L
10BIT 80MSPS Dual DAC
PACKAGE PIN DESCRIPTION
PIN NAME
NO
I/O TYPE
DESCRIPTION
VDDA
1,2
AP
Analog Power
VBB
3,12
AG
Bulk Bias
VSSA
47,48
AG
Analog Ground
VSSR
39
PG
PAD Cell Ground
VDDR
40
PP
PAD Cell Power
D2[9:0]
14~23
DI
2nd Channel Digital Input(10bit parallel)
D1[9:0]
26~35
DI
1st Channel Digital Input(10bit parallel)
PD
38
DI
Power-Down Control (High Enable)
VDDD
8,9
DP
Digital Power
VSSD
10,11
DG
Digital Ground
CLK
13
DI
Clock Input (Input Data is latched
at the rising edge of CLK)
IO1
43,44
AO
1st Analog Current Output
(needs termination resistor:37.5Ω)
IO2
4,5
AO
2nd Analog Current Output
(needs termination resistor:37.5Ω)
VREF
7
AI
External Reference DC Voltage Input(1.0V)
IREF
6
AI
RSET resistor(564Ω) connection
to adjust full scale current output with VREF
AI
Compensation Capacitor.
This pin should be connected to VDDA through
bypass capacitor. The COMP capacitor must be as
close to the device as possible to keep lead length to
an absolute minimun.
COMP
45
NOTES
1.I/O TYPE PP and PG denote PAD Power and PAD Ground respectively.
SEC ASIC
11 / 13
ANALOG
BW1221L
10BIT 80MSPS Dual DAC
FEEDBACK REQUEST
We appreciate your interest in our products. If you have further questions, please specify in
the attached form.
Thank you very much.
DC / AC ELECTRICAL CHARACTERISTIC
Characteristics
Min
Typ
Max
Unit
Supply Voltage
V
Power dissipation
mW
Resolution
Bits
Analog Output Voltage
V
Operating Temperature
°C
Output Load Capacitor
µF
Output Load Resistor
Ω
Integral Non-Linearity Error
LSB
Differential Non-Linearity Error
LSB
Maximum Conversion Rate
MHz
Remarks
VOLTAGE OUTPUT DAC
Reference Voltage TOP
V
BOTTOM
Analog Output Voltage Range
Digital Input Format
V
Binary Code or 2's Complement Code
CURRENT OUTPUT DAC
-
Analog Output Maximum Current
mA
Analog Output Maximum Signal Frequency
MHz
Reference Voltage
V
External Resistor for Current Setting(RSET)
Ω
Pipeline Delay
sec
Do you want to Power down mode?
Do you want to Interal Reference Voltage(BGR)?
Which do you want to Serial Input TYPE or parallel Input TYPE?
Do you need 3.3v and 5v power supply in your system?
How many channels do you need(BW1221L is dual channel DAC)?
SEC ASIC
12 / 13
ANALOG
BW1221L
10BIT 80MSPS Dual DAC
PC BOARD LAYOUT CONSIDERATIONS
♦ PC Board Considerations
To minimize noise on the power lines and the ground lines, the digital inputs
need to be shielded and decoupled. This trace length between groups of vdd
(vdda,vddd) pins short as possible so as to minimize inductive ringing.
♦ Supply Decoupling and Planes
For the decoupling capacitor between the power line and the ground line,
0.1µF ceramic capacitor is used in parallel with a 10µF tantalum capacitor.
The digital power plane(VDDD) and analog power plane(VDDA) are
connected through a ferrite bead, and also the digital ground plane(VSSD)
and the analog ground plane(VSSA). This ferrite bead should be located
within 3inches of the BW1221L. The analog power plane supplies power to
the BW1221L of the analog output pin and related devices.
♦Analog Signal Interconnect
To minimized noise pickup and reflections due to impedance mismatch, the BW1221L
should be located as close as possible to the output connector.
The line between DAC output and monitor input should also be regarded as a
transmission line. Due to the fact, it can cause problems in transmission line
mismatch. As a solution to these problems, the double-termination methods used.
By using this, both ends of the termination lines are matched, providing an ideal,
non-reflective system.
SEC ASIC
13 / 13
ANALOG