ROITHNER ERYF_STAR

UV-index sensor based on SiC
EryF*
Features
•
Special UV-index sensor, precision up to +/- 0.5 UVI
•
Optimally suited for accurate sun-UV dosimetry
•
Also suited for sun tanning bank dosimetry
•
Silicon Carbide based chip for radiation hardness
•
Intrinsic visible blindness due to wide-bandgap semiconductor material
•
TO-18 metal package with integrated filter glass
•
0,054 mm2 active chip area
•
The chip is manufactured by Cree Research Inc., U.S.A.
Eigenschaften
•
Spezieller UV-Index Sensor mit einer Genauigkeit bis zu +/- 0.5 UVI
•
Optimale Eignung für präzise Messung des Sonnen-UV
•
Auch geeignet zur Überwachung von Solarien
•
Siliziumkarbid-Chip garantiert hohe Strahlungsfestigkeit
•
Inhärente Unempfindlichkeit gegenüber dem sichtbaren Licht durch das
Halbleitermaterial mit hoher Bandlücke
•
TO-18 Metallgehäuse mit integriertem Filterglas
•
0,054 mm2 aktive Chipfläche
•
Chiphersteller: Cree Research Inc., U.S.A.
Rev. 1.4
Page 1 [4]
UV-index sensor based on SiC
EryF*
Maximum Ratings
Parameter
Symbol
Value
Unit
Topt
-25 ... +70
°C
VRmax
20
V
Symbol
Value
Unit
Active area
A
0.054
mm
Dark current at
1 V reverse bias
Id
1
fA
Capacitance
C
21
pF
Short circuit current
at bright sun
I0
ca. 7
nA
Symbol
Value
Unit
Max. spectral sensitivity
Smax
0.11
AW
Wavelength of max. spectral sensitivity
λSmax
295
nm
-
235 - 325
nm
Operating temperature range
Reverse voltage
General Characteristics
(Ta = 25 °C)
Parameter
2
Spectral Characteristics
(Ta = 25 °C)
Parameter
Range of spectral sensitivity
(S=0.1*Smax)
Rev. 1.4
-1
Page 2 [4]
UV-index sensor based on SiC
EryF*
Linear Spectral Response
Logarithmic Spectral Response
Rev. 1.4
Page 3 [4]
UV-index sensor based on SiC
EryF*
Application Example
Pin Layout
Grounded pin:
Isolated pin:
Rev. 1.4
Anode
Cathode
Page 4 [4]