PD - 95519A IRFU3709PbF SMPS MOSFET Applications l l l High Frequency Isolated DC-DC Converters with Synchronous Rectification for Telecom and Industrial Use High Frequency Buck Converters for Computer Processor Power Lead-Free HEXFET® Power MOSFET VDSS RDS(on) max ID 30V 9.0mΩ 90A Benefits l l l Ultra-Low Gate Impedance Very Low RDS(on) at 4.5V VGS Fully Characterized Avalanche Voltage and Current I-Pak IRFU3709 Absolute Maximum Ratings Symbol VDS VGS ID @ TC = 25°C ID @ TC = 100°C IDM PD @TC = 25°C PD @TC = 100°C TJ , TSTG Parameter Drain-Source Voltage Gate-to-Source Voltage Continuous Drain Current, VGS @ 10V Continuous Drain Current, VGS @ 10V Pulsed Drain Current Maximum Power Dissipation Maximum Power Dissipation Linear Derating Factor Junction and Storage Temperature Range Max. Units 30 ±20 90 57 360 120 48 0.96 -55 to + 150 V V A W W mW/°C °C Thermal Resistance Parameter RθJC RθJA Junction-to-Case Junction-to-Ambient www.kersemi.com Typ. Max. Units ––– ––– 1.04 110 °C/W 1 12/06/04 IRFU3709PbF Static @ TJ = 25°C (unless otherwise specified) Parameter Drain-to-Source Breakdown Voltage ∆V(BR)DSS/∆TJ Breakdown Voltage Temp. Coefficient V(BR)DSS RDS(on) VGS(th) IDSS IGSS Min. 30 ––– ––– Static Drain-to-Source On-Resistance ––– Gate Threshold Voltage 1.0 ––– Drain-to-Source Leakage Current ––– Gate-to-Source Forward Leakage ––– Gate-to-Source Reverse Leakage ––– Typ. ––– 0.029 6.9 7.9 ––– ––– ––– ––– ––– Max. Units Conditions ––– V VGS = 0V, ID = 250µA ––– V/°C Reference to 25°C, ID = 1mA 9.0 VGS = 10V, ID = 15A mΩ 10.5 VGS = 4.5V, ID = 12A 3.0 V VDS = VGS, ID = 250µA 20 VDS = 24V, VGS = 0V µA 100 VDS = 24V, VGS = 0V, TJ = 125°C 200 VGS = 16V nA -200 VGS = -16V Dynamic @ TJ = 25°C (unless otherwise specified) Symbol gfs Qg Qgs Qgd Qoss td(on) tr td(off) tf Ciss Coss Crss Parameter Forward Transconductance Total Gate Charge Gate-to-Source Charge Gate-to-Drain ("Miller") Charge Output Gate Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Input Capacitance Output Capacitance Reverse Transfer Capacitance Min. 53 ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– Typ. ––– 27 6.7 9.7 22 11 171 21 9.2 2672 1064 109 Max. Units Conditions ––– S VDS = 15V, ID = 30A 41 ID = 15A ––– nC VDS = 15V ––– VGS = 4.5V ––– VGS = 0V, VDS = 10V ––– VDD = 15V ––– ID = 30A ns ––– RG = 1.8Ω ––– VGS = 4.5V ––– VGS = 0V ––– pF VDS = 16V ––– ƒ = 1.0MHz Avalanche Characteristics Symbol EAS IAR Parameter Single Pulse Avalanche Energy Avalanche Current Typ. Max. Units ––– ––– 382 30 mJ A Diode Characteristics Symbol IS ISM VSD trr Qrr trr Qrr 2 Parameter Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Diode Forward Voltage Reverse Reverse Reverse Reverse Recovery Recovery Recovery Recovery Time Charge Time Charge Min. Typ. Max. Units ––– ––– 90 ––– ––– 360 ––– ––– ––– ––– ––– ––– 0.88 0.82 48 46 48 52 1.3 ––– 72 69 72 78 A V ns nC ns nC Conditions D MOSFET symbol showing the G integral reverse S p-n junction diode. TJ = 25°C, IS = 30A, VGS = 0V TJ = 125°C, IS = 30A, VGS = 0V TJ = 25°C, I F = 30A, VR=15V di/dt = 100A/µs TJ = 125°C, IF = 30A, VR=15V di/dt = 100A/µs www.kersemi.com IRFU3709PbF 1000 VGS 15V 10V 7.0V 5.5V 4.5V 4.0V 3.5V BOTTOM 2.7V TOP I D , Drain-to-Source Current (A) I D , Drain-to-Source Current (A) 1000 VGS 15V 10V 7.0V 5.5V 4.5V 4.0V 3.5V BOTTOM 2.7V TOP 100 100 2.7V 10 20µs PULSE WIDTH TJ = 25 °C 1 0.1 1 10 2.7V 10 20µs PULSE WIDTH TJ = 150 °C 1 0.1 100 1 10 100 VDS , Drain-to-Source Voltage (V) VDS , Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics Fig 2. Typical Output Characteristics RDS(on) , Drain-to-Source On Resistance (Normalized) I D , Drain-to-Source Current (A) 1000 TJ = 25 ° C TJ = 150 ° C 100 10 2.0 V DS= 15V 20µs PULSE WIDTH 3.0 4.0 5.0 6.0 VGS , Gate-to-Source Voltage (V) Fig 3. Typical Transfer Characteristics www.kersemi.com 7.0 2.0 ID = 90A 1.5 1.0 0.5 0.0 -60 -40 -20 VGS = 10V 0 20 40 60 80 100 120 140 160 TJ , Junction Temperature ( ° C) Fig 4. Normalized On-Resistance Vs. Temperature 3 IRFU3709PbF VGS = 0V, f = 1MHz Ciss = Cgs + Cgd , Cds SHORTED Crss = Cgd Coss = Cds + Cgd C, Capacitance (pF) 3000 Ciss 2000 Coss 1000 0 6 VGS , Gate-to-Source Voltage (V) 4000 ID = 30A 5 4 3 2 1 Crss 1 10 0 100 0 5 VDS , Drain-to-Source Voltage (V) 15 20 25 30 Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage 1000 ISD , Reverse Drain Current (A) 10 QG , Total Gate Charge (nC) Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage 10000 OPERATION IN THIS AREA LIMITED BY RDS(on) 100 T = 150 ° C J ID , Drain Current (A) 1000 10us 100 10 TJ = 25 ° C 100us 1ms 10 1 0.1 0.2 V GS = 0 V 0.8 1.4 2.0 VSD ,Source-to-Drain Voltage (V) Fig 7. Typical Source-Drain Diode Forward Voltage 4 V DS= 24V V DS= 15V V DS= 6V 1 2.6 10ms TC = 25 °C TJ = 150 °C Single Pulse 1 10 100 VDS , Drain-to-Source Voltage (V) Fig 8. Maximum Safe Operating Area www.kersemi.com IRFU3709PbF 100 LIMITED BY PACKAGE VGS 80 ID , Drain Current (A) RD V DS RG 60 D.U.T. + -VDD VGS Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 % 40 Fig 10a. Switching Time Test Circuit 20 VDS 90% 0 25 50 75 100 125 150 TC , Case Temperature ( °C) 10% VGS Fig 9. Maximum Drain Current Vs. Case Temperature td(on) tr t d(off) tf Fig 10b. Switching Time Waveforms Thermal Response(Z thJC ) 10 1 D = 0.50 0.20 PDM 0.10 0.1 t1 0.05 0.02 0.01 0.01 0.00001 t2 SINGLE PULSE (THERMAL RESPONSE) 0.0001 Notes: 1. Duty factor D = t1 / t 2 2. Peak TJ = P DM x Z thJC + TC 0.001 0.01 0.1 1 t1 , Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case www.kersemi.com 5 EAS , Single Pulse Avalanche Energy (mJ) IRFU3709PbF 1200 15V TOP 1000 L VDS DRIVER D.U.T RG + V - DD IAS 20V 0.01Ω tp Fig 12a. Unclamped Inductive Test Circuit V(BR)DSS tp A BOTTOM ID 13A 19A 30A 800 600 400 200 0 25 50 75 100 125 150 Starting TJ , Junction Temperature( ° C) Fig 12c. Maximum Avalanche Energy Vs. Drain Current I AS Fig 12b. Unclamped Inductive Waveforms Current Regulator Same Type as D.U.T. 50KΩ QG 12V .2µF .3µF VGS QGS D.U.T. QGD + V - DS VGS VG 3mA IG Charge Fig 13a. Basic Gate Charge Waveform 6 ID Current Sampling Resistors Fig 13b. Gate Charge Test Circuit www.kersemi.com IRFU3709PbF Peak Diode Recovery dv/dt Test Circuit Circuit Layout Considerations • Low Stray Inductance • Ground Plane • Low Leakage Inductance Current Transformer + D.U.T + - - + RG • • • • dv/dt controlled by RG Driver same type as D.U.T. ISD controlled by Duty Factor "D" D.U.T. - Device Under Test Driver Gate Drive P.W. Period D= + - VDD P.W. Period VGS=10V * D.U.T. ISD Waveform Reverse Recovery Current Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt Re-Applied Voltage Body Diode VDD Forward Drop Inductor Curent Ripple ≤ 5% ISD * VGS = 5V for Logic Level Devices Fig 14. For N-Channel HEXFET® Power MOSFETs www.kersemi.com 7 IRFU3709PbF I-Pak (TO-251AA) Package Outline Dimensions are shown in millimeters (inches) 8 www.kersemi.com IRFU3709PbF I-Pak (TO-251AA) Part Marking Information EXAMPLE: THIS IS AN IRFU120 WITH AS S EMBLY LOT CODE 5678 AS SEMBLED ON WW 19, 1999 IN T HE AS S EMBLY LINE "A" INTERNATIONAL RECTIF IER LOGO PART NUMBER IRF U120 919A 56 78 ≤ AS SEMBLY LOT CODE Note: "P" in as s embly line pos ition indicates "Lead-Free" DAT E CODE YEAR 9 = 1999 WEEK 19 LINE A OR INT ERNATIONAL RECT IF IER LOGO PART NUMBER IRF U120 56 ASS EMBLY LOT CODE 78 DAT E CODE P = DESIGNAT ES LEAD-F REE PRODUCT (OPT IONAL) YEAR 9 = 1999 WEEK 19 A = ASS EMBLY SITE CODE Notes: Repetitive rating; pulse width limited by max. junction temperature. Starting TJ = 25°C, L = 0.85mH R G = 25Ω, IAS = 30A. www.kersemi.com Pulse width 400µs; duty cycle ≤ 2%. Calculated continuous current based on maximum allowable junction temperature. Package limitation current is 30A. 9