TS2PCIE412 www.ti.com SCDS269C – MARCH 2009 – REVISED APRIL 2010 4-CHANNEL 8:16 MULTIPLEXER/DEMULTIPLEXER PCI EXPRESS SWITCH Check for Samples: TS2PCIE412 FEATURES 1 • • • PCIe Bus Multiplexing and Expansion Routing PCI Express Data and/or Display Port Signals Notebook PCs Desktop PCs Servers/Storage Area Networks GND VDD GND 41 40 39 VDD 42 A0 2 37 1B1 A1 3 36 2B1 GND 4 35 3B1 VDD 5 34 0B2 A2 6 33 1B2 A3 7 32 2B2 VDD 8 SEL 9 Exposed Center Pad (GND) 31 3B2 30 VDD 29 4B1 A4 11 28 5B1 A5 12 27 6B1 VDD 13 26 7B1 GND 14 25 4B2 GND 10 A6 15 24 5B2 A7 16 23 6B2 GND 17 22 7B2 GND 21 • • 0B1 20 APPLICATIONS 38 GND 19 • 1 GND VDD • RUA PACKAGE (TOP VIEW) 18 • • • • Compatible With PCI Express (PCIe) Standard Wide Bandwidth of over 3 Gbps Low Crosstalk (XTALK = –32 dB Typ at 1.25 GHz) OIRR = –36.3 dB Typical at 1.25 GHz Low Bit-to-Bit Skew (tsk(O) = 0.06 ns Typical) VDD Operating Range: 1.5 V to 2 V Ioff Supports Partial Power-Down Mode Operation Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II ESD Performance Tested Per JESD 22 – 2000-V Human-Body Model (A114-B, Class II) – 1000-V Charged-Device Model (C101) VDD • • • 2 If the exposed center pad is used, it must be connected to ground. DESCRIPTION/ ORDERING INFORMATION The TS2PCIE412 is a 4-channel PCIe 2:1 multiplexer/demultiplexer switch that can be used to route one PCIe data lane between two possible destinations or two PCIe data lanes to one destination. Each channel consists of differential pairs of receive (RX) and transmit (TX) signals and operates at a signal-processing bandwidth speed, which supports the PCIe standard of 2.5 Gbps. The device is controlled with one select input (SEL) pin, where SEL controls the data path of the multiplexer/demultiplexer and can be connected to any GPIO in the system. The unselected channel is set in a high-impedance state. ORDERING INFORMATION PACKAGE (1) TA –40°C to 85°C (1) (2) QFN – RUA (2) Tape and reel ORDERABLE PART NUMBER TS2PCIE412RUAR TOP-SIDE MARKING SH412 Package drawings, thermal data, and symbolization are available at www.ti.com/packaging. For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI website at www.ti.com. 1 2 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. All trademarks are the property of their respective owners. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 2009–2010, Texas Instruments Incorporated TS2PCIE412 SCDS269C – MARCH 2009 – REVISED APRIL 2010 www.ti.com FUNCTION TABLE SEL FUNCTION L An to nB1 H An to nB2 FUNCTIONAL DIAGRAM A0 A1 A2 A3 2 38 3 37 6 36 7 35 34 33 32 31 A4 A5 A6 A7 11 29 12 28 15 27 16 26 25 24 23 22 9 0B1 1B1 2B1 3B1 0B2 1B2 2B2 3B2 4B1 5B1 6B1 7B1 4B2 5B2 6B2 7B2 Control Logic SEL TERMINAL FUNCTIONS TERMINAL 2 I/O DESCRIPTION NAME NO. An, 2, 3, 6, 7, 11, 12, 15, 16 I/O Data I/Os nBm 22–29, 31–38 I/O Data I/Os SEL 9 I Select input VDD 5, 8, 13, 18, 20, 30, 40, 42 – Power supply GND 1, 4, 10, 14, 17, 19, 21, 39, 41, Exposed center pad – Ground Submit Documentation Feedback Copyright © 2009–2010, Texas Instruments Incorporated Product Folder Link(s): TS2PCIE412 TS2PCIE412 www.ti.com SCDS269C – MARCH 2009 – REVISED APRIL 2010 ABSOLUTE MAXIMUM RATINGS (1) (2) over operating free-air temperature range (unless otherwise noted) MIN MAX –0.5 2.5 V (3) –0.5 2.5 V (3) (4) –0.5 2.5 V VIN < GND –50 mA VI/O < GND –50 mA 100 mA Continuous current through VDD 100 mA Continuous current through GND –100 mA 150 °C VDD Supply voltage range VIN Control input voltage range (2) VI/O Switch I/O voltage range (2) IIK Control input clamp current II/OK I/O port clamp current II/O ON-state switch current (5) IDD IGND Tstg Storage temperature range. (1) (2) (3) (4) (5) –65 UNIT Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. All voltages are with respect to GND unless otherwise specifed. The input voltage and output negative-voltage ratings may be exceeded if the input and output current ratings are observed. VI and VO are used to denote specific conditions for VI/O. II and IO are used to denote specific conditions for II/O. PACKAGE THERMAL IMPEDANCE over operating free-air temperature range (unless otherwise noted) UNIT qJA (1) Package thermal impedance (1) RUA package 51.2 °C/W The package thermal impedance is calculated in accordance with JESD 51-7. RECOMMENDED OPERATING CONDITIONS over operating free-air temperature range (unless otherwise noted) MIN TYP MAX 1.5 1.8 2 UNIT VDD Supply voltage VIH High-level control input voltage (SEL) VIL Low-level control input voltage (SEL) VIO Switch input/output voltage 0 VDD V TA Operating free air temperature 0 85 °C 0.65 × VDD V 0.35 × VDD Submit Documentation Feedback Copyright © 2009–2010, Texas Instruments Incorporated Product Folder Link(s): TS2PCIE412 V V 3 TS2PCIE412 SCDS269C – MARCH 2009 – REVISED APRIL 2010 www.ti.com ELECTRICAL CHARACTERISTICS FOR 1.8-V SUPPLY (1) VDD = 1.5 V to 2.0 V, TA = –40°C to 85°C (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP (2) MAX –0.7 –1.3 V UNIT VIK SEL VDD = 2.0 V, IIN = –18 mA IIH SEL VDD = 2.0 V, VIN = VDD ±1 mA IIL SEL VDD =2.0 V, VIN = GND ±1 mA Ioff VDD = 0, VO = 0 to 2 V, VI = 0 1 mA ICC VDD = 2.0 V, II/O = 0, Switch ON or OFF 400 mA CIN SEL f = 10 MHz, VIN = 0 V COFF B port 200 1 pF VI = 0 V, f = 10 MHz, Outputs open, Switch OFF 1.5 1.5 pF CON VI = 0 V, f = 10 MHz, Outputs open, Switch ON 4.5 4.5 pF rON VDD = 1.8 V, GND ≤ VI ≤ VDD, IO = –40 mA 12 18 Ω VDD = 1.8 V, VI = 1.65 to 1.8 V, IO = –40 mA 0.5 VDD = 1.8 V, GND ≤ VI ≤ VDD, IO = –40 mA 0.2 rON(flat) (3) ΔrON (4) Ω Ω 0.8 Dynamic RL = 100 Ω, f = 10 MHz XTALK RL = 100 Ω, f = 10 MHz OIRR –81 See Figure 9 RL = 100 Ω, f = 1.25 GHz –74 See Figure 10 RL = 100 Ω, f = 1.25 GHz dB –32 dB –36 BW RL = 50 Ω, See Figure 8 2.1 GHz Max data rate RL = 50 Ω, See Figure 8 4.2 Gbps (1) (2) (3) (4) VI, VO, II, and IO refer to I/O pins. VIN refers to the control inputs. All typical values are at VDD = 1.8 V (unless otherwise noted), TA = 25°C. rON(flat) is the difference of rON in a given channel at specific voltages. ΔrON is the difference of ron from center ports to any other port. SWITCHING CHARACTERISTICS over recommended operating free-air temperature range, VDD = 1.5 V to 2.0 V, RL = 200 Ω, CL = 10 pF (unless otherwise noted) PARAMETER tpd (2) (3) tPZH, tPZL tPHZ, tPLZ tsk(O) tsk(p) (1) (2) (3) (4) (5) (6) 4 (4) FROM (INPUT) An or nBn TO (OUTPUT) TYP (1) or An 0.28 SEL An or nBn 7.8 SEL An or nBn An or nBn nBn MIN nBn or An (5) (6) MAX UNIT ns 9 ns 2.5 4 ns 0.06 0.1 ns 0.06 0.1 ns All typical values are at VDD = 1.8 V (unless otherwise noted) TA = 25°C. The propagation delay is the calculated RC time constant of the typical ON-state resistance of the switch and the specified load capacitance when driven by an ideal voltage source (zero output impedance). See Figure 6 Output skew between center port to any other port Skew between opposite transitions of the same output in a given device tPHL – tPLH See Figure 7 Submit Documentation Feedback Copyright © 2009–2010, Texas Instruments Incorporated Product Folder Link(s): TS2PCIE412 TS2PCIE412 www.ti.com SCDS269C – MARCH 2009 – REVISED APRIL 2010 TYPICAL PERFORMANCE 0 –1 –3 Gain at –3 dB: 2.1 GHz Magnitude (dB) –5 –7 –9 –11 –13 1 10 100 1000 10000 Frequency (MHz) Figure 1. Frequency Response (Insertion Loss) –20 –30 OIRR at 1.25 GHz: –36.3 dB –40 Magnitude (dB) –50 –60 –70 OIRR at 10 MHz: –73.7 dB –80 –90 –100 1 10 100 1000 10000 Frequency (MHz) Figure 2. OFF Isolation vs Frequency Submit Documentation Feedback Copyright © 2009–2010, Texas Instruments Incorporated Product Folder Link(s): TS2PCIE412 5 TS2PCIE412 SCDS269C – MARCH 2009 – REVISED APRIL 2010 www.ti.com TYPICAL PERFORMANCE (continued) -20 -30 XTALK at 1.25 GHz: –31.9 dB -40 Magnitude (dB) -50 -60 -70 -80 XTALK at 10 MHz: –80.4 dB -90 -100 1 10 100 1000 10000 Frequency (MHz) Figure 3. Crosstalk vs Frequency Eye Diagrams 10-inch trace board for real implementation, VDD = 1.8 V, f = 1.25 GHz, transitional signal and non-transitional signal eye from Tektronix TDS6154C and Tektronix RT-Eye= software Figure 4. Transitional Signal Eye for TS2PCIE412 Using a 10-inch Trace 6 Submit Documentation Feedback Copyright © 2009–2010, Texas Instruments Incorporated Product Folder Link(s): TS2PCIE412 TS2PCIE412 www.ti.com SCDS269C – MARCH 2009 – REVISED APRIL 2010 TYPICAL PERFORMANCE (continued) 10-inch trace board for real implementation, VDD = 1.8 V, f = 1.25 GHz, transitional signal and non-transitional signal eye from Tektronix TDS6154C and Tektronix RT-Eye= software Figure 5. Transitional Signal Eye (Left) and Non-Transitional Signal Eye (Right) for TS2PCIE412 Using a 10-inch Trace Submit Documentation Feedback Copyright © 2009–2010, Texas Instruments Incorporated Product Folder Link(s): TS2PCIE412 7 TS2PCIE412 SCDS269C – MARCH 2009 – REVISED APRIL 2010 www.ti.com PARAMETER MEASUREMENT INFORMATION (Enable and Disable Times) VDD Input Generator VSEL 50 Ω 50 Ω VG1 TEST CIRCUIT DUT Input Generator VI 50 Ω CL (see Note A) 50 Ω VDD S1 RL VI CL V∆ 1.5 V to 2 V 2 × VDD 200 Ω GND 10 pF 0.15 V tPHZ/tPZH 1.5 V to 2 V GND 200 Ω VDD 10 pF 0.15 V VO VDD Output Control (VIN) VDD/2 VDD/2 0V Output Waveform 1 S1 at 2 V CC (see Note B) tPZL tPLZ VOH VCC/2 tPZH VO Open RL tPLZ/tPZL VSEL 2 × VDD GND VG2 TEST S1 RL VO Output Waveform 2 S1 at GND (see Note B) VOL + 0.15 V VOL tPHZ VCC/2 VOH - 0.15 V VOH VOL VOLTAGE WAVEFORMS ENABLE AND DISABLE TIMES A. CL includes probe and jig capacitance. B. Waveform 1 is for an output with internal conditions such that the output is low, except when disabled by the output control. Waveform 2 is for an output with internal conditions such that the output is high, except when disabled by the output control. C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf ≤2.5 ns. D. The outputs are measured one at a time, with one transition per measurement. E. tPLZ and tPHZ are the same as tdis. F. tPZL and tPZH are the same as ten. Figure 6. Test Circuit and Voltage Waveforms 8 Submit Documentation Feedback Copyright © 2009–2010, Texas Instruments Incorporated Product Folder Link(s): TS2PCIE412 TS2PCIE412 www.ti.com SCDS269C – MARCH 2009 – REVISED APRIL 2010 PARAMETER MEASUREMENT INFORMATION (Skew) VDD Input Generator VSEL 50 Ω 50 Ω VG1 TEST CIRCUIT DUT 2 × VDD Input Generator 50 Ω tsk(o) VDD tsk(p) RL S1 RL VSEL CL 1.5 V to 2 V Open 200 Ω VDD or GND 10 pF 1.5 V to 2 V Open 200 Ω VDD or GND 10 pF VDD Data In at Ax or Ay VDD/2 0 tPLHx tPHLx VOH (VOH + V OL)/2 VOL Data Out at XB1 or XB2 tsk(o) VO CL (see Note A) 50 Ω TEST VO Open GND VG2 VI RL VO VI S1 VDD VDD/2 Input tsk(o) VOH (VOH + V OL)/2 VOL Data Out at YB1 or YB 2 tPLHy tPHLy tPLH VOH (VOH + V OL)/2 VOL Output tsk(p) = tPHL - t PLH tsk(o) = tPLHy - t PLHx or tPHLy - t PHLx VOLTAGE WAVEFORMS OUTPUT SKEW (tsk(o)) tPHL VOLTAGE WAVEFORMS PULSE SKEW [tsk(p)] A. CL includes probe and jig capacitance. B. Waveform 1 is for an output with internal conditions such that the output is low, except when disabled by the output control. Waveform 2 is for an output with internal conditions such that the output is high, except when disabled by the output control. C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf ≤2.5 ns. D. The outputs are measured one at a time, with one transition per measurement. Figure 7. Test Circuit and Voltage Waveforms Submit Documentation Feedback Copyright © 2009–2010, Texas Instruments Incorporated Product Folder Link(s): TS2PCIE412 9 TS2PCIE412 SCDS269C – MARCH 2009 – REVISED APRIL 2010 www.ti.com PARAMETER MEASUREMENT INFORMATION EXT TRIGGER BIAS VBIAS Network Analyzer (HP8753ES) P1 P2 VCC 0B1 A0 SEL DUT VSEL Figure 8. Test Circuit for Frequency Response (BW) Frequency response is measured at the output of the ON channel. For example, when VSEL = 0 V and A0 is the input, the output is measured at 0B1. All unused analog I/O ports are left open. HP8753ES Setup Average = 4 RBW = 3 kHz VBIAS = 0.35 V ST = 2 s P1 = 0 dBM 10 Submit Documentation Feedback Copyright © 2009–2010, Texas Instruments Incorporated Product Folder Link(s): TS2PCIE412 TS2PCIE412 www.ti.com SCDS269C – MARCH 2009 – REVISED APRIL 2010 PARAMETER MEASUREMENT INFORMATION (continued) EXT TRIGGER BIAS VBIAS Network Analyzer (HP8753ES) P1 P2 VCC A0 0B1 RL = 50 Ω A1 1B1 0B2 DUT A2 1B2 2B1 RL = 50 Ω A3 3B1 2B2 3B2 SEL VSEL Figure 9. Test Circuit for Crosstalk (XTALK) Crosstalk is measured at the input of the nonadjacent ON channel. For example, when VSEL = 0 V and A1 is the input, the output is measured at A3. All unused analog input (A) ports are connected to GND, and output (B) ports are connected to GND through 50-Ω pulldown resistors. HP8753ES Setup Average = 4 RBW = 3 kHz VBIAS = 0.35 V ST = 2 s P1 = 0 dBM Submit Documentation Feedback Copyright © 2009–2010, Texas Instruments Incorporated Product Folder Link(s): TS2PCIE412 11 TS2PCIE412 SCDS269C – MARCH 2009 – REVISED APRIL 2010 www.ti.com PARAMETER MEASUREMENT INFORMATION (continued) EXT TRIGGER BIAS VBIAS Network Analyzer (HP8753ES) P1 P2 VCC A0 0B1 RL = 50 Ω A1 1B1 DUT 0B2 1B2 SEL VSEL Figure 10. Test Circuit for Off Isolation (OIRR) OFF isolation is measured at the output of the OFF channel. For example, when VSEL = 0 V and A1 is the input, the output is measured at 1B2. All unused analog input (A) ports are left open, and output (B) ports are connected to GND through 50-Ω pulldown resistors. HP8753ES Setup Average = 4 RBW = 3 kHz VBIAS = 0.35 V ST = 2 s P1 = 0 dBM 12 Submit Documentation Feedback Copyright © 2009–2010, Texas Instruments Incorporated Product Folder Link(s): TS2PCIE412 PACKAGE OPTION ADDENDUM www.ti.com 17-Jul-2010 PACKAGING INFORMATION Orderable Device TS2PCIE412RUAR Status (1) ACTIVE Package Type Package Drawing WQFN RUA Pins Package Qty 42 3000 Eco Plan TBD (2) Lead/ Ball Finish Call TI MSL Peak Temp (3) Samples (Requires Login) Call TI Request Free Samples (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between the die and leadframe. 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