TS2DDR2811 www.ti.com SCDS294 – DECEMBER 2009 1-GHz BANDWIDTH, 8-CHANNEL SPST SWITCH Check for Samples: TS2DDR2811 FEATURES 1 • • • • • • • • • Wide Bandwidth (BW = 1100 MHz Typ) Low Crosstalk (XTALK = –37 dB Typ) Low Bit-to-Bit Skew (tsk(o) = 100 ps Max) Low and Flat ON-State Resistance (rON = 4 Ω Typ, rON(flat) = 0.5 Ω Typ) Low Input/Output Capacitance (CON = 8 pF Typ) Rail-to-Rail Switching on Data I/O Ports (0 V to 5 V) VCC Operating Range From 3 V to 3.6 V Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II ESD Performance Tested Per JESD 22 – 2000-V Human-Body Model (A114-B, Class II) – 1000-V Charged-Device Model (C101) APPLICATIONS • • • • ZXY PACKAGE (BOTTOM VIEW) D C B A 1 2 3 4 5 TERMINAL ASSIGNMENTS D B6 B5 B3 SEL B0 C B7 B4 B2 B1 N.C. B GND A5 A3 A1 VCC A A7 A6 A4 A2 A0 1 2 3 4 5 DDR2 Signal Switching GbE LAN Signal Switching Hub and Router Signal Switching Audio/Video Switching DESCRIPTION/ORDERING INFORMATION The TS2DDR2811 is a 8-channel single-pole single-throw (SPST) signal switch capable of switching signals with bandwidth in excess of 1 GHz. The device includes a select pin (SEL) that is used to select any 1 of the 8 channel inputs. This select pin controls the data path of the SPST switch. The device provides a low and flat ON-state resistance (rON) and an excellent ON-state resistance match. Low input/output capacitance, high bandwidth, low skew, and low crosstalk among channels make this device suitable for various high-bandwidth applications, such as DDR2, 10/100/1000 Base-T, audio, and video. Table 1. ORDERING INFORMATION PACKAGE (1) TA –40°C to 85°C (1) (2) BGA – ZXY (2) Tape and reel ORDERABLE PART NUMBER TS2DDR2811ZXYR TOP-SIDE MARKING SJ811 Package drawings, thermal data, and symbolization are available at www.ti.com/packaging. For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI website at www.ti.com. 1 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 2009, Texas Instruments Incorporated TS2DDR2811 SCDS294 – DECEMBER 2009 www.ti.com FUNCTION TABLE INPUT SEL INPUT OUTPUT H An Bn An = Bn L - - An and Bn are Hi-Z FUNCTION LOGIC DIAGRAM A0 B0 A1 B1 A2 B2 A3 B3 A4 B4 A5 B5 A6 B6 A7 B7 Control Logic SEL TERMINAL FUNCTIONS BALL 2 DESCRIPTION NAME NO. A0, A1, A2, A3, A4, A5, A6, A7 A5, B4, A4 B3, A3, B2, A2, A1 Data I/Os B0, B1, B2,B3, B4, B5 , B6, B7 D5, C4, C3, D3, C2, D2, D1, C1 Data I/Os GND B1 Ground SEL D4 Select inputs VCC B5 Supply voltage Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Link(s): TS2DDR2811 TS2DDR2811 www.ti.com SCDS294 – DECEMBER 2009 ABSOLUTE MAXIMUM RATINGS (1) over operating free-air temperature range (unless otherwise noted) MIN MAX –0.5 4.6 UNIT V (3) –0.5 7 V (3) (4) –0.5 7 V VCC Supply voltage range VIN Control input voltage range (2) VI/O Switch I/O voltage range (2) IIK Control input clamp current VIN < 0 or VIN > VCC –50 mA II/OK I/O port clamp current VI/O < 0 or VI/O > VCC –50 mA II/O ON-state switch current (5) ±128 mA Continuous current through VDD or GND ±100 mA θJA Package thermal impedance (6) 31.8 °C/W Tstg Storage temperature range 150 °C (1) –65 Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. All voltages are with respect to ground, unless otherwise specified. The input and output voltage ratings may be exceeded if the input and output clamp-current ratings are observed. VI and VO are used to denote specific conditions for VI/O. II and IO are used to denote specific conditions for II/O. The package thermal impedance is calculated in accordance with JESD 51-7. (2) (3) (4) (5) (6) RECOMMENDED OPERATING CONDITIONS (1) VCC Supply voltage VIH High-level control input voltage VIL Low-level control input voltage VI Input voltage VI/O Input/output voltage TA Operating free-air temperature (1) MIN MAX 3 3.6 UNIT V SEL 2 5.5 V SEL 0 0.8 V SEL 0 5.5 V 0 VCC V –40 85 °C All unused control inputs of the device must be held at VDD or GND to ensure proper device operation. Refer to the TI application report, Implications of Slow or Floating CMOS Inputs, literature number SCBA004. ELECTRICAL CHARACTERISTICS for 1000 Base-T Ethernet switching over recommended operating free-air temperature range, VCC = 3.3 V ± 0.3 V (unless otherwise noted) TEST CONDITIONS (1) PARAMETER VIK SEL VCC = 3.6 V, IIN = –18 mA IIH SEL VCC = 3.6 V, VIN = VCC IIL SEL VCC = 3.6 V, VIN = GND VCC = 3.6 V, II/O = 0, ICC CIN SEL f = 1 M Hz, VIN = 0 COFF B port MIN TYP (2) MAX –0.7 Switch ON or OFF ±1 μA μA 2 2.5 pF 2.5 4 pF 8 TBD pF 6 Ω f = 1 MHz, Outputs open, Switch OFF VI = 0, f = 1 MHz, Outputs open, Switch ON rON VCC = 3 V, 1.5 V ≤ VI ≤ VCC, IO = –40 mA 4 VCC = 3 V, VI = 1.5 V and VCC, IO = –40 mA 0.5 VCC = 3 V, 1.5 V ≤ VI ≤ VCC, IO = –40 mA 0.4 ΔrON (1) (2) (3) (4) (4) μA 500 VI = 0, rON(flat) V ±1 250 CON (3) UNIT –1.2 Ω 1 Ω VI, VO, II, and IO refer to I/O pins. VIN refers to the control inputs. All typical values are at VCC = 3.3 V (unless otherwise noted), TA = 25°C. rON(flat) is the difference of rON in a given channel at specified voltages. ΔrON is the difference of rON from center (A4, A5) ports to any other port. Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Link(s): TS2DDR2811 3 TS2DDR2811 SCDS294 – DECEMBER 2009 www.ti.com ELECTRICAL CHARACTERISTICS for 10/100 Base-T Ethernet switching over recommended operating free-air temperature range, VCC = 3.3 V ± 0.3 V (unless otherwise noted) TEST CONDITIONS (1) PARAMETER VIK SEL VCC = 3.6 V, IIN = –18 mA IIH SEL VCC = 3.6 V, VIN = VCC IIL SEL VCC = 3.6 V, VIN = GND VCC = 3.6 V, II/O = 0, ICC MIN Switch ON or OFF TYP (2) MAX –0.7 –1.2 V ±1 μA ±1 μA 250 500 μA 2 2.5 pF 2.5 4 pF CIN SEL f = 1 MHz, VIN = 0 COFF B port VI = 0, f = 1 MHz, Outputs open, Switch OFF VI = 0, f = 1 MHz, Outputs open, Switch ON VCC = 3 V, 1.25 V ≤ VI ≤ VCC, IO = –10 mA to –30 mA 4 VCC = 3 V, VI = 1.25 V and VCC, IO = –10 mA to –30 mA 0.5 VCC = 3 V, 1.25 V ≤ VI ≤ VCC, IO = –10 mA to –30 mA 0.4 CON rON rON(flat) ΔrON (1) (2) (3) (4) (3) (4) UNIT 8 pF 6 Ω Ω 1 Ω VI, VO, II, and IO refer to I/O pins. VIN refers to the control inputs. All typical values are at VCC = 3.3 V (unless otherwise noted), TA = 25°C. rON(flat) is the difference of rON in a given channel at specified voltages. ΔrON is the difference of rON from center (A4, A5) ports to any other port. SWITCHING CHARACTERISTICS over recommended operating free-air temperature range, VCC = 3.3 V ± 0.3 V, RL = 200 Ω, CL = 10 pF (unless otherwise noted) (see Figure 5 and Figure 6) PARAMETER tpd FROM (INPUT) TO (OUTPUT) A or B B or A SEL A or B 0.5 SEL A or B 0.9 A or B B or A (2) tPZH, tPZL tPHZ, tPLZ (1) (2) (3) (4) tsk(o) (3) tsk(p) (4) MIN TYP (1) MAX 40 UNIT ps 15 ns 9 ns 50 100 ps 50 150 ps All typical values are at VCC = 3.3 V (unless otherwise noted), TA = 25°C. The propagation delay is the calculated RC time constant of the typical ON-state resistance of the switch and the specified load capacitance when driven by an ideal voltage source (zero output impedance). Output skew between center port (A4 to A5) to any other port Skew between opposite transitions of the same output in a given device |tPHL – tPLH| DYNAMIC CHARACTERISTICS over recommended operating free-air temperature range, VCC = 3.3 V ± 0.3 V (unless otherwise noted) PARAMETER (1) 4 TYP (1) TEST CONDITIONS UNIT XTALK RL = 100 Ω, f = 250 MHz, See Figure 8 –37 dB OIRR RL = 100 Ω, f = 250 MHz, See Figure 9 –37 dB BW RL = 50 Ω, See Figure 7 1100 MHz All typical values are at VCC = 3.3 V (unless otherwise noted), TA = 25°C. Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Link(s): TS2DDR2811 TS2DDR2811 www.ti.com SCDS294 – DECEMBER 2009 OPERATING CHARACTERISTICS 0 0 −2 Attenuation (dB) −20 Gain (dB) −4 −6 −8 −40 −60 −80 −10 −12 0.1 1 10 100 1000 10,000 −100 0.1 1 Frequency (MHz) Figure 1. Gain vs Frequency Figure 2. OFF Isolation vs Frequency 6 0 5 −20 4 ron (W) Attenuation (dB) 10,000 1000 10 100 Frequency (MHz) −40 −60 2 −80 −100 0.1 3 1 0 1 10 100 Frequency (MHz) 1000 10,000 0 1 2 3 4 5 6 VCOM (V) Figure 3. Crosstalk vs Frequency Figure 4. rON (Ω) vs Vcom (V) Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Link(s): TS2DDR2811 5 TS2DDR2811 SCDS294 – DECEMBER 2009 www.ti.com PARAMETER MEASUREMENT INFORMATION (Enable and Disable Times) VCC Input Generator VSEL 50 Ω 50 Ω VG1 TEST CIRCUIT DUT 2 × V CC Input Generator VI S1 RL VO 50 Ω CL (see Note A) 50 Ω VG2 RL TEST VCC S1 RL VI CL V∆ t PLZ/t PZL 3.3 V ± 0.3 V 2 × V CC 200 Ω GND 10 pF 0.3 V t PHZ/t PZH 3.3 V ± 0.3 V GND 200 Ω VCC 10 pF 0.3 V VSEL VO 3.3 V Output Control (VSEL) Output Waveform 1 S1 at 2 × V CC (see Note B) 1.65 V Output Waveform 2 S1 at GND (see Note B) 1.65 V 0V t PZL t PLZ VOH VCC/2 t PZH VO Open GND VOL + 0.3 V VOL t PHZ VCC/2 VOH - 0.3 V VOH VOL VOLTAGE WAVEFORMS ENABLE AND DISABLE TIMES A. CL includes probe and jig capacitance. B. Waveform 1 is for an output with internal conditions such that the output is low, except when disabled by the output control. Waveform 2is for an output with internal conditions such that the output is high, except when disabled by the output control. C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf ≤ 2.5 ns. D. The outputs are measured one at a time, with one transition per measurement. E. tPLZ and tPHZ are the same as tdis. F. tPZL and tPZH are the same as ten. Figure 5. Test Circuit and Voltage Waveforms 6 Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Link(s): TS2DDR2811 TS2DDR2811 www.ti.com SCDS294 – DECEMBER 2009 PARAMETER MEASUREMENT INFORMATION (Skew) VCC Input Generator VSEL 50 Ω 50 Ω VG1 TEST CIRCUIT DUT 2 × V CC Input Generator 50 Ω Open RL TEST VCC S1 RL Vin CL t sk(o) 3.3 V ± 0.3 V Open 200 Ω VCC or GND 10 pF t sk(p) 3.3 V ± 0.3 V Open 200 Ω VCC or GND 10 pF 3.5 V 2.5 V 1.5 V Data In at Ax or A y t PHLx VOH (VOH + VOL)/2 VOL Data Out at XB 1 or XB 2 t sk(o) VO CL (see Note A) 50 Ω t PLHx VO S1 GND VG2 VI RL VO VI 3.5 V 2.5 V 1.5 V Input t sk(o) VOH (VOH + VOL)/2 VOL Data Out at YB 1 or YB 2 t PLHy t PHLy t PLH VOH (VOH + VOL)/2 VOL Output t sk(p) = t PHL - t PLH t sk(o) = t PLHy - t PLHx or t PHLy - t PHLx VOLTAGE WAVEFORMS OUTPUT SKEW (t sk(o)) t PHL VOLTAGE WAVEFORMS PULSE SKEW [t sk(p)] A. CL includes probe and jig capacitance. B. Waveform 1 is for an output with internal conditions such that the output is low, except when disabled by the output control. Waveform 2is for an output with internal conditions such that the output is high, except when disabled by the output control. C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf ≤ 2.5 ns. D. The outputs are measured one at a time, with one transition per measurement. Figure 6. Test Circuit and Voltage Waveforms Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Link(s): TS2DDR2811 7 TS2DDR2811 SCDS294 – DECEMBER 2009 www.ti.com PARAMETER MEASUREMENT INFORMATION EXT TRIGGER BIAS VBIAS Network Analyzer (HP8753ES) P1 P2 VCC BX Ax SEL DUT CL = 10 pF (see Note A) VSEL A. CL includes probe and jig capacitance. Figure 7. Test Circuit for Frequency Response (BW) Frequency response is measured at the output of the ON channel. For example, when VSEL = 0 and A0 is the input, the output is measured at B0. All unused analog I/O ports are left open. HP8753ES Setup Average = 4 RBW = 3 kHz VBIAS = 0.35 V ST = 2 s P1 = 0 dBM 8 Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Link(s): TS2DDR2811 TS2DDR2811 www.ti.com SCDS294 – DECEMBER 2009 PARAMETER MEASUREMENT INFORMATION (continued) EXT TRIGGER BIAS VBIAS Network Analyzer (HP8753ES) P1 P2 VCC A0 B0 RL = 100 W A1 B1 DUT A2 B2 RL = 100 W A3 B3 SEL VSEL Figure 8. Test Circuit for Crosstalk (XTALK) Crosstalk is measured at the output of the nonadjacent ON channel. For example, when VSELn = 0 and A0 is the input, the output is measured at B0. All unused analog input (A) ports are connected to GND, and output (B) ports are connected to GND through 50-Ω pulldown resistors. HP8753ES Setup Average = 4 RBW = 3 kHz VBIAS = 0.35 V ST = 2 s P1 = 0 dBM Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Link(s): TS2DDR2811 9 TS2DDR2811 SCDS294 – DECEMBER 2009 www.ti.com PARAMETER MEASUREMENT INFORMATION (continued) EXT TRIGGER BIAS VBIAS Network Analyzer (HP8753ES) P1 P2 VCC A0 0B 1 RL = 100 Ω A1 1B 1 DUT 0B 2 1B 2 SEL VSEL A. CL includes probe and jig capacitance. B. A 50-Ω termination resistor is needed to match the loading of the network analyzer. Figure 9. Test Circuit for Off Isolation (OIRR) OFF isolation is measured at the output of the OFF channel. For example, when VSELn = VCC and A0 is the input, the output is measured at B0. All unused analog input (A) ports are left open, and output (B) ports are connected to GND through 50-Ω pulldown resistors. HP8753ES Setup Average = 4 RBW = 3 kHz VBIAS = 0.35 V ST = 2 s P1 = 0 dBM 10 Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Link(s): TS2DDR2811 PACKAGE OPTION ADDENDUM www.ti.com 18-Dec-2009 PACKAGING INFORMATION Orderable Device Status (1) TS2DDR2811ZXYR ACTIVE Package Type BGA MI CROSTA R JUNI OR Package Drawing ZXY Pins Package Eco Plan (2) Qty 20 2500 Green (RoHS & no Sb/Br) Lead/Ball Finish SNAGCU MSL Peak Temp (3) Level-1-260C-UNLIM (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above. Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material) (3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. 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