TYSEMI FDV302P

SMD Type
Product specification
FDV302P
Digital FET, P-Channel
General Description
Features
This P-Channel logic level enhancement mode field effect
transistor is produced using Fairchild's proprietary, high cell
density, DMOS technology. This very high density process is
especially tailored to minimize on-state resistance. This
device has been designed especially for low voltage
applications as a replacement for digital transistors. Since
bias resistors are not required, this one P-channel FET can
replace several digital transistors with different bias resistors
such as the DTCx and DCDx series.
-25 V, -0.12 A continuous, -0.5 A Peak.
RDS(ON) = 13 Ω @ VGS= -2.7 V
RDS(ON) = 10 Ω @ VGS = -4.5 V.
Very low level gate drive requirements allowing direct
operation in 3V circuits. VGS(th) < 1.5V.
Gate-Source Zener for ESD ruggedness.
>6kV Human Body Model
Compact industry standard SOT-23 surface mount
package.
Replace many PNP digital transistors (DTCx and DCDx)
with one DMOS FET.
SOT-23
SuperSOTTM-8
SuperSOTTM-6
SO-8
SOIC-16
SOT-223
Mark:302
D
S
G
Absolute Maximum Ratings
TA = 25oC unless otherwise noted
Symbol
Parameter
VDSS
Drain-Source Voltage
VGSS
Gate-Source Voltage
ID
Drain Current
PD
Maximum Power Dissipation
TJ,TSTG
Operating and Storage Temperature Range
ESD
Electrostatic Discharge Rating MIL-STD-883D
Human Body Model (100pf / 1500 Ohm)
- Continuous
- Pulsed
FDV302P
Units
-25
V
-8
V
-0.12
A
-0.5
0.35
W
-55 to 150
°C
6.0
kV
357
°C/W
THERMAL CHARACTERISTICS
RθJA
Thermal Resistance, Junction-to-Ambient
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[email protected]
4008-318-123
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SMD Type
Product specification
FDV302P
Electrical Characteristics (TA = 25 OC unless otherwise noted )
Symbol
Parameter
Conditions
Min
-25
Typ
Max
Units
OFF CHARACTERISTICS
BVDSS
Drain-Source Breakdown Voltage
VGS = 0 V, ID = -250 µA
∆BVDSS/∆TJ
Breakdown Voltage Temp. Coefficient
ID = -250 µA, Referenced to 25 o C
IDSS
Zero Gate Voltage Drain Current
VDS = -20 V, VGS = 0 V
IGSS
Gate - Body Leakage Current
VGS = -8 V, VDS= 0 V
V
TJ = 55°C
ON CHARACTERISTICS
mV / oC
-20
-1
µA
-10
µA
-100
nA
(Note)
∆VGS(th)/∆TJ
Gate Threshold Voltage Temp. Coefficient
ID = -250 µA, Referenced to 25 oC
VGS(th)
Gate Threshold Voltage
VDS = VGS, ID = -250 µA
RDS(ON)
Static Drain-Source On-Resistance
mV / oC
1.9
-0.65
-1
-1.5
V
Ω
VGS = -2.7 V, ID = -0.05 A
10.6
13
VGS = -4.5 V, ID = -0.2 A
7.9
10
12
18
TJ =125°C
ID(ON)
On-State Drain Current
VGS = -2.7 V, VDS = -5 V
gFS
Forward Transconductance
VDS = -5 V, ID= -0.2 A
-0.05
A
0.135
S
11
pF
7
pF
1.4
pF
DYNAMIC CHARACTERISTICS
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
SWITCHING CHARACTERISTICS
tD(on)
Turn - On Delay Time
tr
Turn - On Rise Time
tD(off)
Turn - Off Delay Time
tf
Turn - Off Fall Time
Qg
Total Gate Charge
Qgs
Gate-Source Charge
Qgd
Gate-Drain Charge
VDS = -10 V, VGS = 0 V,
f = 1.0 MHz
(Note)
VDD = -6 V, ID = -0.2 A,
VGS = -4.5 V, RGEN = 50 Ω
VDS = -5 V, ID = -0.2 A,
VGS = -4.5 V
5
12
ns
8
16
ns
9
18
ns
5
10
ns
0.22
0.31
nC
0.11
nC
0.04
nC
DRAIN-SOURCE DIODE CHARACTERISTICS AND MAXIMUM RATINGS
IS
Maximum Continuous Drain-Source Diode Forward Current
VSD
Drain-Source Diode Forward Voltage
VGS = 0 V, IS = -0.2 A
(Note)
-1
-0.2
A
-1.5
V
Note:
Pulse Test: Pulse Width < 300µs, Duty Cycle < 2.0%.
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[email protected]
4008-318-123
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