TYSEMI DMN2075U

Product specification
DMN2075U
NEW PRODUCT
N-CHANNEL ENHANCEMENT MODE MOSFET
Features
Mechanical Data
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Low On-Resistance
Low Input Capacitance
Fast Switching Speed
Low Input/Output Leakage
Lead Free By Design/RoHS Compliant (Note 1)
"Green" Device (Note 2)
Qualified to AEC-Q101 Standards for High Reliability
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Case: SOT-23
Case Material: Molded Plastic, “Green” Molding Compound.
UL Flammability Classification Rating 94V-0
Moisture Sensitivity: Level 1 per J-STD-020
Terminals: Finish ⎯ Matte Tin annealed over Copper leadframe.
Solderable per MIL-STD-202, Method 208
Terminals Connections: See Diagram Below
Weight: 0.008 grams (approximate)
Drain
D
Gate
TOP VIEW
Maximum Ratings
S
G
Source
Internal Schematic
TOP VIEW
@TA = 25°C unless otherwise specified
Characteristic
Symbol
VDSS
VGSS
Drain-Source Voltage
Gate-Source Voltage
Continuous Drain Current (Note 3)
Steady
State
TA = 25°C
TA = 70°C
Pulsed Drain Current (Note 4)
Units
V
V
IDM
Value
20
±8
4.2
3.4
27
Symbol
PD
RθJA
TJ, TSTG
Value
0.8
156
-55 to +150
Unit
W
°C/W
°C
ID
A
A
Thermal Characteristics
Characteristic
Power Dissipation (Note 3)
Thermal Resistance, Junction to Ambient @TA = 25°C
Operating and Storage Temperature Range
Notes:
1. No purposefully added lead.
2. Device mounted on FR-4 PCB, with minimum recommended pad layout.
3. Repetitive rating, pulse width limited by junction temperature.
http://www.twtysemi.com
[email protected]
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Product specification
DMN2075U
NEW PRODUCT
Electrical Characteristics
@TA = 25°C unless otherwise specified
Characteristic
OFF CHARACTERISTICS (Note 5)
Drain-Source Breakdown Voltage
Zero Gate Voltage Drain Current TJ = 25°C
Gate-Source Leakage
ON CHARACTERISTICS (Note 5)
Gate Threshold Voltage
Static Drain-Source On-Resistance
Forward Transfer Admittance
Diode Forward Voltage
DYNAMIC CHARACTERISTICS (Note 6)
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Gate Resistance
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
Turn-On Delay Time
Turn-On Rise Time
Turn-Off Delay Time
Turn-Off Fall Time
Notes:
Symbol
Min
Typ
Max
Unit
Test Condition
BVDSS
IDSS
IGSS
20
-
-
1.0
±100
V
μA
nA
VGS = 0V, ID = 250μA
VDS = 20V, VGS = 0V
VGS = ±8V, VDS = 0V
VGS(th)
0.4
-
1.0
V
RDS (ON)
-
25
30
38
45
mΩ
|Yfs|
VSD
-
13
0.75
1.0
S
V
VDS = VGS, ID = 250μA
VGS = 4.5V, ID = 3.6A
VGS = 2.5V, ID = 3.1A
VDS = 5V, ID = 3.6A
VGS = 0V, IS = 1A
Ciss
Coss
Crss
Rg
Qg
Qgs
Qgd
tD(on)
tr
tD(off)
tf
-
594.3
64.5
57.7
1.5
7.0
0.9
1.4
7.4
9.8
28.1
6.7
-
pF
pF
pF
Ω
nC
nC
nC
ns
ns
ns
ns
VDS = 10V, VGS = 0V,
f = 1.0MHz
VDS = 0V, VGS = 0V, f = 1MHz
VGS = 4.5V, VDS = 10V,
ID = 3.6A
VDD = 10V, VGS = 4.5V,
RL = 2.78Ω, RG = 1.0Ω
4. Short duration pulse test used to minimize self-heating effect.
5. Guaranteed by design. Not subject to production testing.
http://www.twtysemi.com
[email protected]
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