SMD Type MOSFET

MOSFET
SMD Type
P-Channel Enhancement MOSFET
SI2337DS (KI2337DS)
SOT-23
Unit: mm
■ Features
+0.1
2.9 -0.1
+0.1
0.4 -0.1
● VDS (V) =-80V
● RDS(ON) < 270mΩ (VGS =-10V)
+0.1
1.3 -0.1
+0.1
2.4 -0.1
● ID =-2.2A (VGS =-10V)
0.4
3
1
0.55
S
● RDS(ON) < 303mΩ (VGS =-6V)
2
+0.1
0.95 -0.1
+0.1
1.9 -0.1
3
D
1.Gate
2.Source
2
0-0.1
S
+0.1
0.97 -0.1
G
1
+0.1
0.38 -0.1
G
+0.05
0.1 -0.01
3.Drain
D
■ Absolute Maximum Ratings Ta = 25℃
Parameter
Symbol
5 sec
Steady State
Drain-Source Voltage
VDS
-80
Gate-Source Voltage
VGS
±20
Continuous Drain Current
Ta = 25℃
Ta = 70℃
Pulsed Drain Current
Avalanche Current
Single-Pulse Avalanche Energy
Power Dissipation
Thermal Resistance.Junction- to-Ambient
Thermal Resistance.Junction- to-Foot
L=0.1mH
Ta = 25℃
Ta = 70℃
ID
-1.2
-1.75
-0.96
-7
IAS
11
6
EAS
PD
0.76
1.6
0.48
t≤10 sec
RthJA
166
steady State
RthJF
50
TJ
150
Storage Temperature Range
Tstg
-55 to 150
A
mJ
2.5
Junction Temperature
Soldering Recommendations (Peak Temperature)
V
-2.2
IDM
Unit
W
℃/W
℃
260
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MOSFET
SMD Type
P-Channel Enhancement MOSFET
SI2337DS (KI2337DS)
■ Electrical Characteristics Ta = 25℃
Parameter
Drain-Source Breakdown Voltage
VDSS
Zero Gate Voltage Drain Current
IDSS
Gate-Body leakage current
IGSS
Gate Threshold Voltage
Static Drain-Source On-Resistance *1
On state drain current *1
Forward Transconductance *1
VGS(th)
RDS(On)
Reverse Transfer Capacitance
Crss
Total Gate Charge
Qg
Gate Source Charge
Qgs
Gate Drain Charge
Qgd
Gate Resistance
Rg
td(on)
Turn-On Rise Time
tr
Turn-Off DelayTime
td(off)
td(on)
Turn-On Rise Time
tr
Turn-Off DelayTime
td(off)
Turn-Off Fall Time
tf
Body Diode Reverse Recovery Time
trr
Body Diode Reverse Recovery Charge
Qrr
Reverse Recovery Fall Time
ta
Reverse Recovery Rise Time
tb
Maximum Body-Diode Continuous Current
IS
Pulse Diode Forward Current *1
ISM
Diode Forward Voltage
VSD
*1Pulse test: PW ≤ 300us duty cycle ≤ 2%.
■ Marking
E7*
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Max
-80
-1
VDS=0V, VGS=±20V
VDS=VGS ID=-250μA
Unit
V
-10
-2
μA
±100
nA
-4
V
VGS=-10V, ID=-1.2A
216
270
VGS=-6V, ID=-1.1A
242
303
-7
mΩ
A
4.3
S
500
VGS=0V, VDS=-40V, f=1MHz
pF
40
25
VGS=-10V, VDS=-40V, ID=-1.2A
11
17
7
11
VGS=-6V, VDS=-40V, ID=-1.2A
2.1
f=1MHz
4.8
nC
3.2
VGS=-10V, VDS=-40V, RL=42Ω,RGEN=1Ω
ID=-0.96A
tf
Turn-On DelayTime
Typ
VDS=-80V, VGS=0V
VDS=-15V, ID=-1.2A
Ciss
Min
VDS=-80V, VGS=0V, TJ=55℃
VGS=-10V, VDS=-5V
Coss
Marking
ID=-250μA, VGS=0V
gFS
Output Capacitance
Turn-Off Fall Time
Test Conditions
ID(ON)
Input Capacitance
Turn-On DelayTime
2
Symbol
VGS=-6V, VDS=-40V, RL=42Ω,RGEN=1Ω
ID=-0.96A
IF = 0.63 A, di/dt = 100 A/μs, TJ = 25 °C
Ω
10
15
15
23
20
30
15
23
15
23
18
27
20
30
12
18
30
45
45
70
25
-2.1
-7
IS=-0.63A
-0.8
nC
ns
5
TC = 25 °C
ns
-1.2
A
V
MOSFET
SMD Type
P-Channel Enhancement MOSFET
SI2337DS (KI2337DS)
■ Typical Characterisitics
7
7
V GS = 10 thru 6 V
6
5
I D - Drain Current (A)
I D - Drain Current (A)
6
V GS = 5 V
4
3
5
4
3
T A = - 55 °C
2
2
1
1.00
2.00
3.00
T A = 125 °C
1
V GS = 4 V
0
0.00
T A = 25 °C
0
0.0
4.00
1.0
2.0
3.0
4.0
5.0
VGS - Gate-to-Source Voltage (V)
VDS - Drain-to-Source Voltage (V)
Output Characteristics
Transfer Characteristics
700
0.30
V GS = 6 V
0.25
C - Capacitance (pF)
rDS(on) - On-Resistance (Ω)
600
0.20
V GS = 10 V
0.15
C iss
500
400
300
200
C rss
100
C oss
0
0.10
0
1
2
3
4
5
6
0
7
10
20
40
50
60
70
80
VDS - Drain-to-Source Voltage (V)
ID - Drain Current (A)
On-Resistance vs. Drain Current and Gate Voltage
Capacitance
10
2.0
I D =1.2 A
1.8
8
rDS(on) - On-Resistance (Ω)
(Normalized)
V GS - Gate-to-Source Voltage (V)
30
V DS = 40 V
6
V DS = 64 V
4
2
I D = 1.2 A
V GS = 10 V
1.6
1.4
V GS = 6 V
1.2
1.0
0.8
0.6
0
0
2
4
6
8
Qg - Total Gate Charge (nC)
Gate Charge
10
12
0.4
- 50
- 25
0
25
50
75
100
125
150
TJ - Junction Temperature (°C)
On-Resistance vs. Junction Temperature
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MOSFET
SMD Type
P-Channel Enhancement MOSFET
SI2337DS (KI2337DS)
■ Typical Characterisitics
0.6
rDS(on) - Drain-to-Source On-Resistance (Ω)
20.0
I S - Source Current (A)
10.0
T J = 150 °C
T J = 25 °C
1.0
0.1
0.00
I D = 1.2 A
0.5
0.3
0.1
0.2
0.4
0.6
0.8
1.0
3
1.2
16
3.4
14
I D = 250 µA
6
7
12
Power (W)
3.0
2.8
2.6
10
8
6
2.4
4
2.2
2
0
0.01
.
- 25
0
25
50
75
100
125
150
0.1
TJ - Temperature (°C)
10
ID - D ra in C u rre n t (A )
10
100
Single Pulse Power, Junction-to-Ambient
100
*Limited by DS(on)
r
1 ms
1
10 ms
100 ms
0.1
1 s
10 s
T A = 25 °C
Single Pulse
0.01
dc
0.001
0 .1
1
10
100
1000
VDS - Drain-to-Source Voltage (V)
*VGS > minimum VGS at which rDS(on) is specified
Safe Operating Area, Junction-to-Ambient
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Time (sec)
Threshold Voltage
4
5
On-Resistance vs. Gate-to-Source Voltage
3.6
3.2
4
VGS - Gate-to-Source Voltage (V)
VSD - Source-to-Drain Voltage (V)
VGS(th) (V)
T A = 25 °C
0.2
Source-Drain Diode Forward Voltage
2.0
- 50
T A = 125 °C
0.4
1000
MOSFET
SMD Type
P-Channel Enhancement MOSFET
SI2337DS (KI2337DS)
■ Typical Characterisitics
2.5
2.8
2.4
2.0
1.5
1.6
Power
ID - Drain Current (A)
2.0
1.2
1.0
0.8
0.5
0.4
0.0
0
25
50
75
100
125
150
0.0
25
50
75
100
125
150
TC - Case Temperature (°C)
TC - Case Temperature (°C)
Power Derating
Current Derating*
IC - Peak Avalanche Current (A)
10
TA
1
1.0E-6
L
IA
BV - V DD
10.0E-6
100.0E-6
1.0E-3
10.0E-3
TA - Time In Avalanche (sec)
Single Pulse Avalanche Capability
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MOSFET
SMD Type
P-Channel Enhancement MOSFET
SI2337DS (KI2337DS)
■ Typical Characterisitics
2
1
Normalized Effective Transient
Thermal Impedance
Duty Cycle = 0.5
0.2
Notes:
0.1
0.1
P DM
0.05
t1
t2
1. Duty Cycle, D =
0.02
t1
t2
2. Per Unit Base = RthJA = 166 °C/W
3. TJM - T A = PDMZthJA(t)
Single Pulse
4. Surface Mounted
0.01
10 -4
10 -3
10 -2
10 -1
1
10
100
600
Square Wave Pulse Duration (sec)
Normalized Thermal Transient Impedance, Junction-to-Ambient
2
Normalized Effective Transient
Thermal Impedance
1
Duty Cycle = 0.5
0.2
0.1
0.1
0.05
0.02
Single Pulse
0.01
10 -4
10 -3
10 -2
Square Wave Pulse Duration (sec)
10 -1
Normalized Thermal Transient Impedance, Junction-to-Case
6
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