Total Dose Radiation Test Report MSK5970KRH RAD Hard Positive

Total Dose Radiation Test Report
MSK5970KRH
RAD Hard Positive Voltage Regulator
May 14, 2009 (TID - First Test, WAFER LOT: 46233.3W#8)
Updated July 10, 2010
July 16, 2010 (TID – Second Test, WAFER LOT: 550635.2W#4)
June 14, 2013 (TID – Third Test, WAFER LOT: W10913024.1W#19)
B. Horton
C. Salce
P. Dinneen
M.S. Kennedy Corporation
Liverpool, NY
Page 1 of 21
I.
Introduction:
The total dose radiation test plan for the MSK5970KRH series was developed to qualify the devices
as RAD Hard to 100 KRADS(Si). The testing was performed beyond 100 KRADS(Si) to show trends
in device performance as a function of total dose. The test does not classify maximum radiation
tolerance of the device, but simply offers designers insight to the critical parameter-shifts up to the
specified total dose level.
MIL-STD-883 Method 1019.7 and ASTM F1892-06 were used as guidelines in the development and
implementation of the total dose test plan for the MSK5970KRH series.
II.
Radiation Source:
Total dose was performed at the University of Massachusetts, Lowell, using a cobalt 60 radiation
source. The dose rate was determined to be 93 Rads(Si)/sec. The total dose schedule can be found in
Table I.
III. Test Setup:
All test samples were subjected to Group A Electrical Test in accordance with the device data sheet. In
addition, all devices received 320 hours of burn-in per MIL-STD-883 Method 1015 and were fully
screened IAW MIL-PRF-38534 Class K. For test platform verification, one control device was tested at
25C. Ten devices were then tested at 25°C, prior to irradiation, and were found to be within acceptable
test limits.
The devices were vertically aligned with the radiation source and enclosed in a lead/aluminum container
during irradiation. Five devices were kept under bias during irradiation. Maximum recommended
operating voltage of +25 Volts was used for the bias condition. Five devices had all leads grounded
during irradiation for the unbiased condition.
After each irradiation, the device leads were shorted together and the devices were transported to the
MSK automatic electrical test platform. Testing was performed in accordance with the MSK device data
sheet. Testing was performed on irradiated devices, as well as the control device, at each total dose
level. Electrical tests were completed within one hour of irradiation. Devices were subjected to
subsequent radiation doses within two hours of removal from the radiation field.
IV. Data:
All performance curves are averaged from the test results of the biased and unbiased devices,
respectively. If required, full test data can be obtained by contacting M.S. Kennedy Corporation.
V. Summary:
The reference voltage decreased an average of -0.8% up to the maximum specified dose but remained
well with specification.
All other parameters exhibited slight shifts with irradiation and remained well within specification through
150Krad(Si) TID.
Page 2 of 21
MSK5970RH
Dose Rate Schedule
Dosimetry Equipment
Bruker Biospin # 0141
Irradiation Date
6/13/13
Exposure
Length
(min:sec)
Incremental
Dose
rads(Si)
Cumulative
Dose rads(Si)
9:14
9:14
9:14
51,522
51,522
51,522
51,522
103,044
154,566
Biased S/N – 1656, 1657, 1658, 1659, 1660
Unbiased S/N – 1661, 1662, 1663, 1664, 1665
Table 1
Dose Time, Incremental Dose and Total Cumulative Dose
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Total Dose Radiation Test Report
MSK5970KRH and MSK5970KRHL
RAD Hard Positive Voltage Regulator
May 14, 2009 (TID - First Test)
Updated July 10, 2010
July 16, 2010 (TID – Second Test)
M. Bilecki
B. Erwin
M.S. Kennedy Corporation
Liverpool, NY
Page 7 of 21
I.
Introduction:
The total dose radiation test plan for the MSK5970KRH series was developed to qualify the devices
as RAD Hard to 100 KRADS(Si). The testing was performed beyond 100 KRADS(Si) to show trends
in device performance as a function of total dose. The test does not classify maximum radiation
tolerance of the device, but simply offers designers insight to the critical parameter-shifts up to the
specified total dose level. The MSK5970KRH and the MSK5970KRHL use the same active component.
The data in this report is from direct measurement of both the MSK5970KRH and MSK5970KRHL and
indicates the similarity of the response of both device types.
MIL-STD-883 Method 1019.7 and ASTM F1892-06 were used as guidelines in the development and
implementation of the total dose test plan for the MSK5970KRH series.
II.
Radiation Source:
Total dose was performed at the University of Massachusetts, Lowell, using a cobalt 60 radiation
source. The dose rate was determined to be 135 Rads(Si)/sec. The total dose schedule can be found
in Table I.
III. Test Setup:
All test samples were subjected to Group A Electrical Test in accordance with the device data sheet. In
addition, all devices received 320 hours of burn-in per MIL-STD-883 Method 1015 and were fully
screened IAW MIL-PRF-38534 Class K. For test platform verification, one control device was tested at
25C. Ten devices were then tested at 25°C, prior to irradiation, and were found to be within acceptable
test limits.
The devices were vertically aligned with the radiation source and enclosed in a lead/aluminum container
during irradiation. Five devices of both device types were kept under bias during irradiation. Maximum
recommended operating voltage of +25 Volts was used for the bias condition. For the MSK5970KRH,
five devices had all leads grounded during irradiation for the unbiased condition. For the
MSK5970KRHL, four devices had leads grounded for the unbiased condition
After each irradiation, the device leads were shorted together and the devices were transported to the
MSK automatic electrical test platform. Testing was performed in accordance with the MSK device data
sheet. Testing was performed on irradiated devices, as well as the control device, at each total dose
level. Electrical tests were completed within one hour of irradiation. Devices were subjected to
subsequent radiation doses within two hours of removal from the radiation field.
IV. Data:
All performance curves are averaged from the test results of the biased and unbiased devices,
respectively. If required, full test data can be obtained by contacting M.S. Kennedy Corporation.
V. Summary:
Reference voltage exhibited the most significant shifts due to irradiation. The reference voltage
decreased with each successive dose. Reference voltage shift for both device types was typically less
than 1% at 100Krad(Si) and less than 2% at 200Krad(Si).
Dropout voltage showed a slight increase, but also stayed within pre-irradiation limits up to 200 Krad(Si).
Output Current Limit increased slightly throughout all test points up to 200Krad(Si) .
Page 8 of 21
MSK5970KRH Biased/Unbiased
Dose Rate Schedule
Dosimetry Equipment
Bruker Biospin # 0141
Irradiation Date
7/16/10
Exposure
Length
(min:sec)
Incremental
Dose
rads(Si)
Cumulative
Dose rads(Si)
6:22
6:22
6:22
51,570
51,570
51,570
51,570
103,140
154,710
6:22
51,570
206,280
Biased S/N – 0249, 0250, 0251, 0252, 0253
Unbiased S/N – 0254, 0255, 0256, 0258, 0259
MSK5970KRHL Biased/Unbiased
Dose Rate Schedule
Dosimetry Equipment
Bruker Biospin # 0141
Irradiation Date
7/16/10
Exposure
Length
(min:sec)
Incremental
Dose
rads(Si)
Cumulative
Dose rads(Si)
6:22
6:22
6:22
51,570
51,570
51,570
51,570
103,140
154,710
6:22
51,570
206,280
Biased S/N – 0194, 0195, 0196, 0197, 0198
Unbiased S/N – 0199, 0200, 0201, 0202
Table 1
Dose Time, Incremental Dose and Total Cumulative Dose
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MSK5970KRH
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MSK5970KRHL
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Total Dose Radiation Test Report
MSK 5970 RH Series
RAD Hard Positive Voltage Regulator
April 7, 2009
April 28, 2009 (Updated)
B. Erwin
R. Wakeman
M.S. Kennedy Corporation
Liverpool, NY
Page 16 of 21
I.
Introduction:
The total dose radiation test plan for the MSK 5970RH series was developed to qualify the devices
as RAD Hard to 100 KRADS(Si). The testing was performed beyond 100 KRADS(Si) to show trends
in device performance as a function of total dose. The test does not classify maximum radiation
tolerance of the device, but simply offers designers insight to the critical parameter-shifts up to the
specified total dose level.
MIL-STD-883 Method 1019.7 and ASTM F1892-06 were used as guidelines in the development and
implementation of the total dose test plan for the MSK 5970RH series.
II.
Radiation Source:
Total dose was performed at the University of Massachusetts, Lowell, using a cobalt 60 radiation
source. The dose rate was determined to be 178 Rads(Si)/sec. The total dose schedule can be
found in Table I.
III. Test Setup:
All test samples were subjected to Group A Electrical Test in accordance with the device data sheet.
In addition, all devices received 320 hours of burn-in per MIL-STD-883 Method 1015 and were fully
screened IAW MIL-PRF-38534 Class K. For test platform verification, one control device was tested
at 25C. Ten devices were then tested at 25°C, prior to irradiation, and were found to be within
acceptable test limits.
The devices were vertically aligned with the radiation source and enclosed in a lead/aluminum
container during irradiation. Five devices were kept under bias during irradiation. Maximum
recommended operating voltage of +25 Volts was used for the bias condition. Five devices
had all leads grounded during irradiation for the unbiased condition.
After each irradiation, the device leads were shorted together and the devices were transported to the
MSK automatic electrical test platform. Testing was performed in accordance with the MSK device
data sheet. Testing was performed on irradiated devices, as well as the control device, at each total
dose level. Electrical tests were completed within one hour of irradiation. Devices were subjected to
subsequent radiation doses within two hours of removal from the radiation field.
IV. Data:
All performance curves are averaged from the test results of the biased and unbiased devices,
respectively. If required, full test data can be obtained by contacting M.S. Kennedy Corporation.
V. Summary:
Reference voltage exhibited the most significant shifts due to irradiation. The reference voltage
decreased with each successive dose. It is important to note however, that all devices maintained
post irradiation output tolerance levels up to 300 Krad(Si).
Line and load regulation shifts were very small and stayed within pre-irradiation limits throughout
testing.
Dropout voltage showed a slight increase with the majority of the shift occurring beyond 100 Krad(Si).
Current Limit also increased by approximately 10 percent at 100 Krad(Si).
Page 17 of 21
MSK 5970 RH Biased/Unbiased Dose Rate
Schedule
Dosimetry Equipment
Bruker Biospin # 0141
Irradiation Date
4/07/09
Exposure
Length
(min:sec)
Incremental
Dose
rads(Si)
Cumulative
Dose rads(Si)
4:49
4:49
4:49
4:49
9:20
14:00
51,442
51,442
51,442
51,442
103,040
154,560
51,442
102,884
154,326
205,768
308,830
463,512
Biased S/N – 0011, 0012, 0013, 0014, 0015
Unbiased S/N – 0017, 0018, 0019, 0020, 0021
Table 1
Dose Time, Incremental Dose and Total Cumulative Dose
Page 18 of 21
MSK5970RH
Reference Voltage vs. Total Dose
Reference Voltage (V)
1.26
1.26
1.25
1.25
Avg gnd
Avg bias
Control
1.24
1.24
1.23
1.23
1.22
0K
50K
100K
150K
200K
300K
Total dose (rad(Si))
Line Regulation (%)
MSK5970RH
Line Regulation vs. Total Dose
0.50
0.40
0.30
0.20
0.10
0.00
-0.10
-0.20
-0.30
-0.40
-0.50
Avg gnd
Avg bias
Control
0K
50K
100K
150K
200K
300K
Total dose (rad(Si))
Page 19 of 21
Load Regulation (%)
MSK5970RH
Load Regulation vs. Total Dose
1.00
0.80
0.60
0.40
0.20
0.00
-0.20
-0.40
-0.60
-0.80
-1.00
Avg gnd
Avg bias
Control
0K
50K
100K
150K
200K
300K
Total dose (rad(Si))
Dropout Voltage (V)
MSK5970RH
Dropout Voltage vs. Total Dose
1.50
1.45
1.40
1.35
1.30
1.25
1.20
1.15
1.10
1.05
1.00
Avg gnd
Avg bias
Control
0K
50K
100K
150K
200K
300K
Total dose (rad(Si))
Page 20 of 21
Output Current Limit (A)
MSK5970RH
Output Current Limit vs. Total Dose
3.0
2.9
2.8
2.7
2.6
2.5
2.4
2.3
2.2
2.1
2.0
Avg gnd
Avg bias
Control
0K
50K
100K
150K
200K
300K
Total dose (rad(Si))
Page 21 of 21