Total Dose Radiation Test Report MSK 5978RH RAD Hard Positive Adjustable Voltage Regulator Sept 24, 2010 (TID, First Test) May 11, 2012 (TID, Second Test, LOT H0923840.4 WF#3) Jan 29, 2014 (TID, Third Test, LOT H0923840.4 WF#5) B. Horton P. Dinneen M.S. Kennedy Corporation Liverpool, NY 1 I. Introduction: The total dose radiation test plan for the MSK 5978RH was developed to qualify the devices as RAD Hard to 300 KRADS(Si). The testing was performed beyond 300 KRADS(Si) to show trends in device performance as a function of total dose. The test does not classify maximum radiation tolerance of the device, but simply offers designers insight to the critical parameter-shifts up to the specified total dose level. MIL-STD-883 Method 1019.7 and ASTM F1892-06 were used as guidelines in the development and implementation of the total dose test plan for the MSK 5978RH. II. Radiation Source: Total dose was performed at the University of Massachusetts, Lowell, using a cobalt 60 radiation source. The dose rate was determined to be 85 rads(Si)/sec. The total dose schedule can be found in Table I. III. Test Setup: All test samples were subjected to Group A Electrical Test in accordance with the device data sheet. In addition, all devices received 240 hours minimum of burn-in per MIL-STD-883 Method 1015 and were fully screened IAW MIL-PRF-38535 Class V. For test platform verification, one control device was tested at 25°C. Ten devices were then tested at 25°C, prior to irradiation, and were found to be within acceptable test limits. The devices were vertically aligned with the radiation source and enclosed in a lead/aluminum container during irradiation. Five devices were kept under bias during irradiation. An operating voltage of +26 Volts was used for the bias condition. Five devices had all leads grounded during irradiation for the unbiased condition. After each irradiation, the device leads were shorted together and the devices were transported to the MSK automatic electrical test platform. Testing was performed in accordance with the MSK device data sheet. Testing was performed on irradiated devices, as well as the control device, at each total dose level. Electrical tests were completed within one hour of irradiation. Devices were subjected to subsequent radiation doses within two hours of removal from the radiation field. IV. Data: All performance curves are averaged from the test results of the biased and unbiased devices respectively. If required, full test data can be obtained by contacting M.S. Kennedy Corporation. V. Summary: Based on the test data recorded during radiation testing and statistical analysis, the MSK5978RH qualified as a 300 Krad(Si) radiation hardened device. Set Control Pin Current and Load Regulation exhibited the most significant shift due to irradiation, however all performance curves stayed within specification up to 450 Krad(Si) TID. 2 MSK 5978 RH Biased/Unbiased Dose Rate Schedule Dosimetry Equipment Bruker Biospin # 0162 Irradiation Date 1/29/14 Exposure Length (min:sec) Incremental Dose rads(Si) 10:06 10:06 10:06 51,510 51,510 51,510 30:18 30:18 154,530 154,530 Cumulative Dose rads(Si) 51,510 103,020 154,530 309,060 463,590 Biased S/N – 1930, 1931, 1932, 1933, 1936 Unbiased S/N – 1937, 1938, 1939, 1943, 1944 Table 1 Dose Time, Incremental Dose and Total Cumulative Dose 3 4 5 6 7 8 Total Dose Radiation Test Report MSK 5978RH RAD Hard Positive Adjustable Voltage Regulator Sept 24, 2010 (TID, First Test) May 11, 2012 (TID, Second Test, H09238404.4 WF#3) B. Horton K. Conroy R. Wakeman M.S. Kennedy Corporation Liverpool, NY 9 I. Introduction: The total dose radiation test plan for the MSK 5978RH was developed to qualify the devices as RAD Hard to 300 KRADS(Si). The testing was performed beyond 300 KRADS(Si) to show trends in device performance as a function of total dose. The test does not classify maximum radiation tolerance of the device, but simply offers designers insight to the critical parameter-shifts up to the specified total dose level. MIL-STD-883 Method 1019.7 and ASTM F1892-06 were used as guidelines in the development and implementation of the total dose test plan for the MSK 5978RH. II. Radiation Source: Total dose was performed at the University of Massachusetts, Lowell, using a cobalt 60 radiation source. The dose rate was determined to be 109 Rads(Si)/sec. The total dose schedule can be found in Table I. III. Test Setup: All test samples were subjected to Group A Electrical Test in accordance with the device data sheet. In addition, all devices received 240 hours minimum of burn-in per MIL-STD-883 Method 1015 and were fully screened IAW MIL-PRF-38535 Class V. For test platform verification, one control device was tested at 25°C. Ten devices were then tested at 25°C, prior to irradiation, and were found to be within acceptable test limits. The devices were vertically aligned with the radiation source and enclosed in a lead/aluminum container during irradiation. Five devices were kept under bias during irradiation. An operating voltage of +26 Volts was used for the bias condition. Five devices had all leads grounded during irradiation for the unbiased condition. After each irradiation, the device leads were shorted together and the devices were transported to the MSK automatic electrical test platform. Testing was performed in accordance with the MSK device data sheet. Testing was performed on irradiated devices, as well as the control device, at each total dose level. Electrical tests were completed within one hour of irradiation. Devices were subjected to subsequent radiation doses within two hours of removal from the radiation field. IV. Data: All performance curves are averaged from the test results of the biased and unbiased devices, respectively. If required, full test data can be obtained by contacting M.S. Kennedy Corporation. V. Summary: Based on the test data recorded during radiation testing and statistical analysis, the MSK5978RH qualified as a 300 Krad(Si) radiation hardened device. Set Control Pin Current and Load Regulation exhibited the most significant shift due to irradiation, however all performance curves stayed within specification up to 450 Krad(Si) TID. 10 MSK 5978 RH Biased/Unbiased Dose Rate Schedule Dosimetry Equipment Bruker Biospin # 0162 Irradiation Date 5/11/12 Exposure Length (min:sec) Incremental Dose rads(Si) Cumulative Dose rads(Si) 08:00 08:00 08:00 23:50 23:50 51,840 51,840 51,840 154,440 154,440 51,840 51,480 103,680 155,520 309,960 464,400 51,480 08:00 Biased S/N – 0487, 0488, 0489, 0490, 0491 Unbiased S/N – 0492, 0493, 0494, 0495, 0496 Table 1 Dose Time, Incremental Dose and Total Cumulative Dose 11 12 13 14 15 16 Total Dose Radiation Test Report MSK 5978RH RAD Hard Positive Adjustable Voltage Regulator Sept 24, 2010 C. Salce F. Freytag M.S. Kennedy Corporation Liverpool, NY 17 I. Introduction: The total dose radiation test plan for the MSK 5978RH was developed to qualify the devices as RAD Hard to 300 KRADS(Si). The testing was performed beyond 300 KRADS(Si) to show trends in device performance as a function of total dose. The test does not classify maximum radiation tolerance of the device, but simply offers designers insight to the critical parameter-shifts up to the specified total dose level. MIL-STD-883 Method 1019.7 and ASTM F1892-06 were used as guidelines in the development and implementation of the total dose test plan for the MSK 5978RH. II. Radiation Source: Total dose was performed at the University of Massachusetts, Lowell, using a cobalt 60 radiation source. The dose rate was determined to be 132 Rads(Si)/sec. The total dose schedule can be found in Table I. III. Test Setup: All test samples were subjected to Group A Electrical Test in accordance with the device data sheet. In addition, all devices received 320 hours of burn-in per MIL-STD-883 Method 1015 and were fully screened IAW MIL-PRF-38534 Class K. For test platform verification, one control device was tested at 25°C. Ten devices were then tested at 25°C, prior to irradiation, and were found to be within acceptable test limits. The devices were vertically aligned with the radiation source and enclosed in a lead/aluminum container during irradiation. Five devices were kept under bias during irradiation. An operating voltage of +26 Volts was used for the bias condition. Five devices had all leads grounded during irradiation for the unbiased condition. After each irradiation, the device leads were shorted together and the devices were transported to the MSK automatic electrical test platform. Testing was performed in accordance with the MSK device data sheet. Testing was performed on irradiated devices, as well as the control device, at each total dose level. Electrical tests were completed within one hour of irradiation. Devices were subjected to subsequent radiation doses within two hours of removal from the radiation field. IV. Data: All performance curves are averaged from the test results of the biased and unbiased devices, respectively. If required, full test data can be obtained by contacting M.S. Kennedy Corporation. V. Summary: Based on the test data recorded during radiation testing and statistical analysis, the MSK5978RH qualified as a 300 Krad(Si) radiation hardened device. Set Pin Current and Line Regulation exhibited the most significant shift due to irradiation, however all performance curves stayed within specification up to 450 Krad(Si) TID. 18 MSK 5978 RH Biased/Unbiased Dose Rate Schedule Dosimetry Equipment Bruker Biospin # 0162 Irradiation Date 9/24/10 Exposure Length (min:sec) Incremental Dose rads(Si) Cumulative Dose rads(Si) 6:30 6:30 6:30 6:30 13:00 19:31 51,480 51,480 51,480 51,480 102,960 154,572 51,480 102,960 154,440 205,920 308,880 463,452 Biased S/N – 0037, 0038, 0039, 0042, 0046 Unbiased S/N – 0049, 0053, 0055, 0059, 0060 Table 1 Dose Time, Incremental Dose and Total Cumulative Dose 19 20 21 22 23 24