Neutron, TID and ELDRS Radiation Test Report

Neutron, TID and ELDRS Radiation Test Report
MSK 5826RH
(MSK5823RH, MSK5824RH, MSK5825RH)
Radiation Hardened
Ultra Low Dropout
Positive Adjustable Linear Regulator December 26, 2008 (TID - First Test)
June 18, 2009 (ELDRS Test)
September 03, 2009 (TID - Second Test)
November 06, 2009 (TID - Third Test)
May 14, 2010 (TID – Fourth Test)
August 24, 2010 (Neutron Fluence)
September 17, 2010 (TID – Fifth Test)
July 8, 2011 (TID – Sixth Test)
August 16, 2013 (TID – Seventh Test, IC Wafer Lot: WD0051441#9
Transistor Wafer Lot: CJ302831#21)
B. Horton
C. Salce
M.S. Kennedy Corporation
Liverpool, NY
Page 1 of 66
I.
Introduction:
The total dose radiation test plan for the MSK 5826RH series was developed to qualify the devices
as RAD Hard to 300 KRADS(Si). The testing was performed beyond 300 KRADS(Si) to show trends
in device performance as a function of total dose. The test does not classify maximum radiation
tolerance of the device, but simply offers designers insight to the critical parameter-shifts up to the
specified total dose level. The MSK5823RH, MSK5824RH, MSK5825RH and MSK5826RH all use the
same active components. The data in this report is from the direct measurement of the MSK5826RH
response to irradiation but it is indicative of the response of all four device types and is applicable to all
four types.
MIL-STD-883 Method 1019.7 and ASTM F1892-06 were used as guidelines in the development and
implementation of the total dose test plan for the MSK 5826RH.
II.
Radiation Source:
Total dose was performed at the University of Massachusetts, Lowell, using a cobalt 60 radiation
source. The dose rate was determined to be 91Rads(Si)/sec. The total dose schedule can be found in
Table I.
III. Test Setup:
All test samples were subjected to Group A Electrical Test at 25C in accordance with the device data
sheet. In addition, all devices received 320 hours of burn-in per MIL-STD-883 Method 1015. For test
platform verification, one control device was tested at 25C. Ten devices were then tested at 25°C, prior
to irradiation, and were found to be within acceptable test limits.
The devices were vertically aligned with the radiation source and enclosed in a lead/aluminum container
during irradiation. Five devices were kept under bias during irradiation. Maximum recommended
operating voltage of +6.5V was used for the bias condition. Five devices had all leads grounded during
irradiation for the unbiased condition.
After each irradiation the device leads were shorted together and transported to the MSK automatic
electrical test platform and tested IAW MSK device data sheet. Testing was performed on irradiated
devices, as well as the control device, at each total dose level. Electrical tests were completed within
one hour of irradiation. Devices were subjected to subsequent radiation doses within two hours of
removal from the radiation field.
IV. Data:
All performance curves are averaged from the test results of the biased and unbiased devices,
respectively. If required, full test data can be obtained by contacting M.S. Kennedy Corporation.
V. Summary:
Based on the test data recorded during radiation testing and statistical analysis, the MSK5826RH
qualified as a 300 Krad(Si) radiation hardened device. Load Regulation, Shutdown Threshold and
Output Current Limit exhibited the most significant shift due to irradiation, however all performance
curves stayed within specification up to 450 Krad(Si) TID.
Page 2 of 66
MSK 5826RH Biased/Unbiased Dose Rate
Schedule
Dosimetry Equipment
Bruker Biospin # 0162
Irradiation Date
8/16/13
Exposure
Length
(min:sec)
Incremental
Dose
rads(Si)
Cumulative
Dose rads(Si)
18:52
9:26
28:18
28:18
103,012
51,506
154,518
154,518
103,012
154,518
309,036
463,554
Biased S/N – 1551, 1552, 1553, 1554, 155
Unbiased S/N – 1556, 1557, 1558, 1559, 1560
Table 1
Dose Time, Incremental Dose and Total Cumulative Dose
Page 3 of 66
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Page 8 of 66
Neutron, TID and ELDRS Radiation Test Report
MSK 5826RH
(MSK5823RH, MSK5824RH, MSK5825RH)
Radiation Hardened
Ultra Low Dropout
Positive Adjustable Linear Regulator December 26, 2008 (TID - First Test)
June 18, 2009 (ELDRS Test)
September 03, 2009 (TID - Second Test)
November 06, 2009 (TID - Third Test)
May 14, 2010 (TID – Fourth Test)
August 24, 2010 (Neutron Fluence)
September 17, 2010 (TID – Fifth Test)
July 8, 2011 (TID – Sixth Test)
B. Horton
C. Salce
M.S. Kennedy Corporation
Liverpool, NY
Page 9 of 66
I.
Introduction:
The total dose radiation test plan for the MSK 5826RH series was developed to qualify the devices
as RAD Hard to 300 KRADS(Si). The testing was performed beyond 300 KRADS(Si) to show trends
in device performance as a function of total dose. The test does not classify maximum radiation
tolerance of the device, but simply offers designers insight to the critical parameter-shifts up to the
specified total dose level. The MSK5823RH, MSK5824RH, MSK5825RH and MSK5826RH all use the
same active components. The data in this report is from the direct measurement of the MSK5826RH
response to irradiation but it is indicative of the response of all four device types and is applicable to all
four types.
MIL-STD-883 Method 1019.7 and ASTM F1892-06 were used as guidelines in the development and
implementation of the total dose test plan for the MSK 5826RH.
II.
Radiation Source:
Total dose was performed at the University of Massachusetts, Lowell, using a cobalt 60 radiation
source. The dose rate was determined to be 122 Rads(Si)/sec. The total dose schedule can be found
in Table I.
III. Test Setup:
All test samples were subjected to Group A Electrical Test at 25C in accordance with the device data
sheet. In addition, all devices received 320 hours of burn-in per MIL-STD-883 Method 1015. For test
platform verification, one control device was tested at 25C. Ten devices were then tested at 25°C, prior
to irradiation, and were found to be within acceptable test limits.
The devices were vertically aligned with the radiation source and enclosed in a lead/aluminum container
during irradiation. Five devices were kept under bias during irradiation. Maximum recommended
operating voltage of +6.5V was used for the bias condition. Five devices had all leads grounded during
irradiation for the unbiased condition.
After each irradiation the device leads were shorted together and transported to the MSK automatic
electrical test platform and tested IAW MSK device data sheet. Testing was performed on irradiated
devices, as well as the control device, at each total dose level. Electrical tests were completed within
one hour of irradiation. Devices were subjected to subsequent radiation doses within two hours of
removal from the radiation field.
IV. Data:
All performance curves are averaged from the test results of the biased and unbiased devices,
respectively. If required, full test data can be obtained by contacting M.S. Kennedy Corporation.
V. Summary:
Based on the test data recorded during radiation testing and statistical analysis, the MSK5826RH
qualified as a 300 Krad(Si) radiation hardened device. Load Regulation, Shutdown Threshold and
Output Current Limit exhibited the most significant shift due to irradiation, however all performance
curves stayed within specification up to 450 Krad(Si) TID.
Page 10 of 66
MSK 5826RH Biased/Unbiased Dose Rate
Schedule
Dosimetry Equipment
Bruker Biospin # 0162
Irradiation Date
7/8/11
Exposure
Length
(min:sec)
Incremental
Dose
rads(Si)
Cumulative
Dose rads(Si)
14:05
7:02
21:06
21:06
103,090
51,484
154,452
154,452
103,090
154,574
309,012
463,478
Biased S/N – 1077, 1079, 1080,1081,1082
Unbiased S/N – 1083, 1084, 1085, 1086, 1088
Table 1
Dose Time, Incremental Dose and Total Cumulative Dose
Page 11 of 66
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Page 15 of 66
Neutron, TID and ELDRS Radiation Test Report
MSK 5826RH
(MSK5823RH, MSK5824RH, MSK5825RH)
Radiation Hardened
Ultra Low Dropout
Positive Adjustable Linear Regulator December 26, 2008 (TID - First Test)
June 18, 2009 (ELDRS Test)
September 03, 2009 (TID - Second Test)
November 06, 2009 (TID - Third Test)
May 14, 2010 (TID – Fourth Test)
August 24, 2010 (Neutron Fluence)
September 17, 2010 (TID – Fifth Test)
B. Horton
R. Wakeman
M.S. Kennedy Corporation
Liverpool, NY
Page 16 of 66
I.
Introduction:
The total dose radiation test plan for the MSK 5826RH series was developed to qualify the devices
as RAD Hard to 300 KRADS(Si). The testing was performed beyond 300 KRADS(Si) to show trends
in device performance as a function of total dose. The test does not classify maximum radiation
tolerance of the device, but simply offers designers insight to the critical parameter-shifts up to the
specified total dose level. The MSK5823RH, MSK5824RH, MSK5825RH and MSK5826RH all use the
same active components. The data in this report is from the direct measurement of the MSK5826RH
response to irradiation but it is indicative of the response of all four device types and is applicable to all
four types.
MIL-STD-883 Method 1019.7 and ASTM F1892-06 were used as guidelines in the development and
implementation of the total dose test plan for the MSK 5826RH.
II.
Radiation Source:
Total dose was performed at the University of Massachusetts, Lowell, using a cobalt 60 radiation
source. The dose rate was determined to be 132 Rads(Si)/sec. The total dose schedule can be found
in Table I.
III. Test Setup:
All test samples were subjected to Group A Electrical Test at 25C in accordance with the device data
sheet. In addition, all devices received 320 hours of burn-in per MIL-STD-883 Method 1015. For test
platform verification, one control device was tested at 25C. Ten devices were then tested at 25°C, prior
to irradiation, and were found to be within acceptable test limits.
The devices were vertically aligned with the radiation source and enclosed in a lead/aluminum container
during irradiation. Five devices were kept under bias during irradiation. Maximum recommended
operating voltage of +6.5V was used for the bias condition. Five devices had all leads grounded during
irradiation for the unbiased condition.
After each irradiation the device leads were shorted together and transported to the MSK automatic
electrical test platform and tested IAW MSK device data sheet. Testing was performed on irradiated
devices, as well as the control device, at each total dose level. Electrical tests were completed within
one hour of irradiation. Devices were subjected to subsequent radiation doses within two hours of
removal from the radiation field.
IV. Data:
All performance curves are averaged from the test results of the biased and unbiased devices,
respectively. If required, full test data can be obtained by contacting M.S. Kennedy Corporation.
V. Summary:
Based on the test data recorded during radiation testing and statistical analysis, the MSK5826RH
qualified as a 300 Krad(Si) radiation hardened device. Reference Voltage, Shutdown Threshold and
Output Current Limit exhibited the most significant shift due to irradiation, however all performance
curves stayed within specification up to 450 Krad(Si) TID.
Page 17 of 66
MSK 5826RH Biased/Unbiased Dose Rate
Schedule
Dosimetry Equipment
Bruker Biospin # 0162
Irradiation Date
09/17/10
Exposure
Length
(min:sec)
Incremental
Dose
rads(Si)
Cumulative
Dose rads(Si)
13:00
6:30
19:31
19:31
102,960
51,480
154,572
154,572
102,960
154,440
309,012
463,584
Biased S/N – 0954, 0955, 0956, 0957, 0958
Unbiased S/N – 0959, 0960, 0961, 0962, 0963
Table 1
Dose Time, Incremental Dose and Total Cumulative Dose
Page 18 of 66
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Neutron, TID and ELDRS Radiation Test Report
MSK 5826RH
(MSK5823RH, MSK5824RH, MSK5825RH)
Radiation Hardened
Ultra Low Dropout
Positive Adjustable Linear Regulator
December 26, 2008 (TID - First Test)
June 18, 2009 (ELDRS Test)
September 03, 2009 (TID - Second Test)
November 06, 2009 (TID - Third Test)
May 14, 2010 (TID – Fourth Test)
August 24, 2010 (Neutron Fluence)
C. Salce
M. Bilecki
M.S. Kennedy Corporation
Liverpool, NY
Page 23 of 66
I. Introduction:
The neutron irradiation test for the MSK 5826RH was performed to determine the change in device
performance as a function of neutron fluence. The neutron irradiation test plan for the MSK
5826RH was developed to characterize neutron fluence sensitivity for devices incorporating active
components including the Linear Tech RH1573 die and a PNP pass transistor. These devices
include, but are not limited to, MSK5800RH, MSK5810RH, MSK5820RH, MSK5821RH,
MSK5822RH, MSK5823RH, MSK5824RH, MSK5825RH, MSK5826RH, MSK5951RH,
MSK1832RH and MSK1835RH. Neutron irradiation testing was performed to 1.08E+12 n/cm² total
neutron fluence.
The test does not classify maximum radiation tolerance of the device, but simply offers designers
insight to the critical parameter-shifts up to the specified neutron fluence level. The data in this
report is from direct measurement of the MSK 5826RH response to neutron irradiation.
MIL-STD-883 Method 1017.2 was used as a guideline in the development and implementation of
the neutron irradiation test plan for the MSK 5826RH.
II. Radiation Source:
Neutron irradiation was performed at the University of Massachusetts, Lowell, using the Reactor
Facility-FNI. Neutron flux was determined by the dosimetry system S/P-32, ASTM E-265 to be
5.03 x 10⁸ n/cm2-s, 1MeV equivalent for step 1. The flux was increased to 1.01 x 10⁹ n/cm2-s for
steps 2 and 3.
III. Test Setup:
All test samples were subjected to Group A Electrical Test in accordance with the device data
sheet. In addition, all devices received 320 hours of burn-in per MIL-STD-883 Method 1015 and
were fully screened IAW MIL-PRF-38534 Class K. For test platform verification, one control device
was tested at 25C. Ten devices were then tested at 25°C, prior to irradiation, and were found to
be within acceptable test limits.
During irradiation, devices leads were shorted together using antistatic foam and then devices
were placed into an anti-static bag. Devices were vertically aligned with the radiation source.
After each irradiation, the devices were transported to the MSK automatic electrical test platform.
Testing was performed in accordance with the MSK device data sheet. Testing was performed on
the irradiated devices, as well as the control device, at each fluence level. Electrical tests were
completed within two hours of irradiation.
IV. Data:
All performance curves are averaged from the test results of the irradiated devices. If required, full
test data can be obtained by contacting M.S. Kennedy Corporation.
V. Summary:
Based on the test data recorded during neutron irradiation testing and statistical analysis, the MSK5826RH
shows immunity to displacement damage. Dropout voltage and Output Current Limit exhibited the most
significant shift due to irradiation, however all performance curves stayed well within specification.
Page 24 of 66
MSK5826RH Neutron Irradiation
Reactor Facility – Fast Neutron Irradiation (FNI)
Dosimetry System: S/P-32 (ASTM E-265)
Exposure Date: 8/20/10
Irradiation
Reactor
Power
(kW)
Gamma
Dose
Rad(Si)
Flux
(n/cm²-s)
Tim
e
(s)
Fluence
(n/cm²)
Total
Fluence
(n/cm²)
Step 1
4.5
17
5.30E+08
330
1.75E+11
1.75E+11
Step 2
9.5
43
1.01E+09
398
4.02E+11
5.77E+11
Step 3
9.5
54
1.01E+09
498
5.03E+11
1.08E+12
Page 25 of 66
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Page 29 of 66
TID and ELDRS Radiation Test Report
MSK 5826RH
(MSK 5823RH, MSK 5824RH, MSK 5825RH)
Radiation Hardened
Ultra Low Dropout
Positive Adjustable Linear Regulator
December 26, 2008 (TID - First Test)
June 18, 2009 (ELDRS Test)
September 03, 2009 (TID - Second Test)
November 06, 2009 (TID - Third Test)
May 14, 2010 (TID – Fourth Test)
M. Bilecki
B. Erwin
M.S. Kennedy Corporation
Liverpool, NY
Page 30 of 66
I.
Introduction:
The total dose radiation test plan for the MSK 5826RH series was developed to qualify the devices
as RAD Hard to 300 KRADS(Si). The testing was performed beyond 300 KRADS(Si) to show trends
in device performance as a function of total dose. The test does not classify maximum radiation
tolerance of the device, but simply offers designers insight to the critical parameter-shifts up to the
specified total dose level. The MSK5823RH, MSK5824RH, MSK5825RH and MSK5826RH all use the
same active components. The data in this report is from the direct measurement of the MSK5826RH
response to irradiation but it is indicative of the response of all four device types and is applicable to all
four types.
MIL-STD-883 Method 1019.7 and ASTM F1892-06 were used as guidelines in the development and
implementation of the total dose test plan for the MSK 5826RH.
II.
Radiation Source:
Total dose was performed at the University of Massachusetts, Lowell, using a cobalt 60 radiation
source. The dose rate was determined to be 138 Rads(Si)/sec. The total dose schedule can be found
in Table I.
III. Test Setup:
All test samples were subjected to Group A Electrical Test at 25C in accordance with the device data
sheet. In addition, all devices received 320 hours of burn-in per MIL-STD-883 Method 1015. For test
platform verification, one control device was tested at 25C. Ten devices were then tested at 25°C, prior
to irradiation, and were found to be within acceptable test limits.
The devices were vertically aligned with the radiation source and enclosed in a lead/aluminum container
during irradiation. Five devices were kept under bias during irradiation. Maximum recommended
operating voltage of +6.5V was used for the bias condition. Five devices had all leads grounded during
irradiation for the unbiased condition.
After each irradiation the device leads were shorted together and transported to the MSK automatic
electrical test platform and tested IAW MSK device data sheet. Testing was performed on irradiated
devices, as well as the control device, at each total dose level. Electrical tests were completed within
one hour of irradiation. Devices were subjected to subsequent radiation doses within two hours of
removal from the radiation field.
IV. Data:
All performance curves are averaged from the test results of the biased and unbiased devices,
respectively. If required, full test data can be obtained by contacting M.S. Kennedy Corporation.
V. Summary:
Based on the test data recorded during radiation testing and statistical analysis, the MSK5826RH
qualified as a 300 Krad(Si) radiation hardened device. Reference Voltage, Shutdown Threshold and
Output Current Limit exhibited the most significant shift due to irradiation, however all performance
curves stayed within specification up to 450 Krad(Si) TID.
Page 31 of 66
MSK 5826RH Biased/Unbiased Dose Rate
Schedule
Dosimetry Equipment
Bruker Biospin # 0141
Irradiation Date
05/14/10
Exposure
Length
(min:sec)
Incremental
Dose
rads(Si)
Cumulative
Dose rads(Si)
12:27
6:14
18:40
18:40
106,086
51,612
154,560
154,560
106,086
154,698
309,258
463,818
Biased S/N – 0827, 0828, 0829, 0830, 0831
Unbiased S/N – 0832, 0833, 0834, 0835, 0836
Table 1
Dose Time, Incremental Dose and Total Cumulative Dose
Page 32 of 66
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Page 36 of 66
TID and ELDRS Radiation Test Report
MSK 5826RH
(MSK 5823RH, MSK 5824RH, MSK 5825RH)
Radiation Hardened
Ultra Low Dropout
Positive Adjustable Linear Regulator
December 26, 2008 (TID - First Test)
June 18, 2009 (ELDRS Test)
September 03, 2009 (TID - Second Test)
November 06, 2009 (TID - Third Test)
M. Bilecki
B. Erwin
M.S. Kennedy Corporation
Liverpool, NY
Page 37 of 66
I.
Introduction:
The total dose radiation test plan for the MSK 5826RH series was developed to qualify the devices
as RAD Hard to 300 KRADS(Si). The testing was performed beyond 300 KRADS(Si) to show trends
in device performance as a function of total dose. The test does not classify maximum radiation
tolerance of the device, but simply offers designers insight to the critical parameter-shifts up to the
specified total dose level. The MSK5823RH, MSK5824RH, MSK5825RH and MSK5826RH all use the
same active components. The data in this report is from the direct measurement of the MSK5826RH
response to irradiation but it is indicative of the response of all four device types and is applicable to all
four types.
MIL-STD-883 Method 1019.7 and ASTM F1892-06 were used as guidelines in the development and
implementation of the total dose test plan for the MSK 5826RH.
II.
Radiation Source:
Total dose was performed at the University of Massachusetts, Lowell, using a cobalt 60 radiation
source. The dose rate was determined to be 156 Rads(Si)/sec. The total dose schedule can be found
in Table I.
III. Test Setup:
All test samples were subjected to Group A Electrical Test at 25C in accordance with the device data
sheet. In addition, all devices received 320 hours of burn-in per MIL-STD-883 Method 1015. For test
platform verification, one control device was tested at 25C. Ten devices were then tested at 25°C, prior
to irradiation, and were found to be within acceptable test limits.
The devices were vertically aligned with the radiation source and enclosed in a lead/aluminum container
during irradiation. Five devices were kept under bias during irradiation. Maximum recommended
operating voltage of +6.5V was used for the bias condition. Five devices had all leads grounded during
irradiation for the unbiased condition.
After each irradiation the device leads were shorted together and transported to the MSK automatic
electrical test platform and tested IAW MSK device data sheet. Testing was performed on irradiated
devices, as well as the control device, at each total dose level. Electrical tests were completed within
one hour of irradiation. Devices were subjected to subsequent radiation doses within two hours of
removal from the radiation field.
IV. Data:
All performance curves are averaged from the test results of the biased and unbiased devices,
respectively. If required, full test data can be obtained by contacting M.S. Kennedy Corporation.
V. Summary:
Based on the test data recorded during radiation testing and statistical analysis, the MSK5826RH
qualified as a 300 Krad(Si) radiation hardened device. Reference Voltage, Shutdown Threshold and
Output Current Limit exhibited the most significant shift due to irradiation, however all performance
curves stayed within specification up to 450 Krad(Si) TID.
Page 38 of 66
MSK 5826RH Biased/Unbiased Dose Rate
Schedule
Dosimetry Equipment
Bruker Biospin # 0141
Irradiation Date
11/06/09
Exposure
Length
(min:sec)
Incremental
Dose
rads(Si)
Cumulative
Dose rads(Si)
8:16
8:16
8:16
8:16
16:35
77,376
77,376
77,376
77,376
154,752
77376
154,752
232,128
309,504
464,256
Biased S/N – 0541, 0542, 0543, 0544, 0545
Unbiased S/N – 0546, 0547, 0548, 0549, 0550
Table 1
Dose Time, Incremental Dose and Total Cumulative Dose
Page 39 of 66
MSK5826RH
Quiescent Current vs. Total Dose
Quiescent Current (mA)
12.0
11.0
Avg gnd
Avg bias
Control
10.0
9.0
8.0
7.0
0K
75K
150K
225K
300K
450K
Total dose (rad(SI))
MSK5826RH
Reference Voltage vs. Total Dose
1.320
Reference Voltage (V)
1.310
1.300
1.290
Avg gnd
1.280
Avg bias
1.270
Control
1.260
1.250
1.240
1.230
0K
75K
150K
225K
300K
450K
Total dose (rad(SI))
Page 40 of 66
MSK5826RH
Line Regulation vs. Total Dose
Output Voltage Delta (mV)
8.0
6.0
4.0
2.0
Avg gnd
0.0
Avg bias
-2.0
Control
-4.0
-6.0
-8.0
0K
75K
150K
225K
300K
450K
Total dose (rad(SI))
MSK5826RH
Load Regulation vs. Total Dose
Output Voltage Delta (mV)
10.0
8.0
6.0
Avg gnd
4.0
Avg bias
2.0
Control
0.0
-2.0
-4.0
0K
75K
150K
225K
300K
450K
Total dose (rad(SI))
Page 41 of 66
MSK5826RH
Dropout Voltage vs. Total Dose
Dropout Voltage (V)
0.40
0.36
Avg gnd
0.32
Avg bias
0.28
Control
0.24
0.20
0K
75K
150K
225K
300K
450K
Total dose (rad(SI))
MSK5826RH
Output Current Limit vs. Total Dose
Output Current Limit (A)
8.00
7.50
7.00
Avg gnd
6.50
Avg bias
6.00
Control
5.50
5.00
4.50
0K
75K
150K
225K
300K
Total dose (rad(SI))
450K
Page 42 of 66
MSK5826RH
Shutdown Threshold vs. Total Dose
Shutdown Threshold (V)
1.60
1.55
1.50
Avg gnd
1.45
Avg bias
1.40
Control
1.35
1.30
1.25
0K
75K
150K
225K
300K
450K
Total dose (rad(SI))
Vout at Shutdown (V)
MSK5826RH
Shutdown Voltage vs. Total Dose
0.1
0.08
0.06
0.04
0.02
0
-0.02
-0.04
-0.06
-0.08
-0.1
Avg gnd
Avg bias
Control
0K
75K
150K
225K
300K
450K
Total dose (rad(SI))
Page 43 of 66
TID and ELDRS Radiation Test Report
MSK 5826RH
Radiation Hardened
Ultra Low Dropout
Positive Adjustable Linear Regulator
December 26, 2008 (TID - First Test)
June 18, 2009 (ELDRS Test)
September 03, 2009 (TID - Second Test)
M. Bilecki
B. Erwin
M.S. Kennedy Corporation
Liverpool, NY
Page 44 of 66
I.
Introduction:
The total dose radiation test plan for the MSK 5826RH series was developed to qualify the devices
as RAD Hard to 300 KRADS(Si). The testing was performed beyond 300 KRADS(Si) to show trends
in device performance as a function of total dose. The test does not classify maximum radiation
tolerance of the device, but simply offers designers insight to the critical parameter-shifts up to the
specified total dose level. The MSK5823RH, MSK5824RH, MSK5825RH and MSK5826RH all use the
same active components. The data in this report is from the direct measurement of the MSK5826RH
response to irradiation but it is indicative of the response of all four device types and is applicable to all
four types.
MIL-STD-883 Method 1019.7 and ASTM F1892-06 were used as guidelines in the development and
implementation of the total dose test plan for the MSK 5826RH.
II.
Radiation Source:
Total dose was performed at the University of Massachusetts, Lowell, using a cobalt 60 radiation
source. The dose rate was determined to be 168 Rads(Si)/sec. The total dose schedule can be found
in Table I.
III. Test Setup:
All test samples were subjected to Group A Electrical Test at 25C in accordance with the device data
sheet. In addition, all devices received 320 hours of burn-in per MIL-STD-883 Method 1015. For test
platform verification, one control device was tested at 25C. Ten devices were then tested at 25°C, prior
to irradiation, and were found to be within acceptable test limits.
The devices were vertically aligned with the radiation source and enclosed in a lead/aluminum container
during irradiation. Five devices were kept under bias during irradiation. Maximum recommended
operating voltage of +6.5V was used for the bias condition. Five devices
had all leads grounded during irradiation for the unbiased condition.
After each irradiation the device leads were shorted together and transported to the MSK automatic
electrical test platform and tested IAW MSK device data sheet. Testing was performed on irradiated
devices, as well as the control device, at each total dose level. Electrical tests were completed within
one hour of irradiation. Devices were subjected to subsequent radiation doses within two hours of
removal from the radiation field.
IV. Data:
All performance curves are averaged from the test results of the biased and unbiased devices,
respectively. If required, full test data can be obtained by contacting M.S. Kennedy Corporation.
V. Summary:
Based on the test data recorded during radiation testing and statistical analysis, the MSK5826RH
qualified as a 300 Krad(Si) radiation hardened device. Reference Voltage, Shutdown Threshold and
Output Current Limit exhibited the most significant shift due to irradiation, however all performance
curves stayed within specification up to 450 Krad(Si) TID.
Page 45 of 66
MSK 5826RH Biased/Unbiased Dose Rate
Schedule
Dosimetry Equipment
Bruker Biospin # 0141
Irradiation Date
09/03/09
Exposure
Length
(min:sec)
Incremental
Dose
rads(Si)
Cumulative
Dose rads(Si)
5:07
5:07
5:07
5:07
10:13
15:20
51,576
51,576
51,576
51,576
102,984
154,560
51,576
103,152
154,728
206,304
309,288
463,848
Biased S/N – 0507, 0508, 0509, 0510, 0511
Unbiased S/N – 0512, 0513, 0514, 0515, 0516
Table 1
Dose Time, Incremental Dose and Total Cumulative Dose
Page 46 of 66
MSK5826RH
Reference Voltage vs. Total Dose
Reference Voltage (V)
1.31
1.3
1.29
1.28
Avg gnd
Avg bias
Control
1.27
1.26
1.25
1.24
1.23
0K
50K
100K
150K
200K
300K
450K
Total dose (rad(SI))
MSK5826RH
Line Regulation vs. Total Dose
Output Voltage Delta (mV)
8
6
4
2
Avg gnd
Avg bias
Control
0
-2
-4
-6
-8
0K
50K
100K
150K
200K
300K
450K
Total dose (rad(SI))
Page 47 of 66
MSK5826RH
Load Regulation vs. Total Dose
Output Voltage Delta (mV)
0
-4
-8
Avg gnd
Avg bias
Control
-12
-16
-20
0K
50K
100K
150K
200K
300K
450K
Total dose (rad(SI))
MSK5826RH
Output Current Limit vs. Total Dose
Output Current Limit (A)
8
7.5
7
Avg gnd
Avg bias
Control
6.5
6
5.5
5
4.5
0K
50K
100K 150K 200K
Total dose (rad(SI))
300K
450K
Page 48 of 66
MSK5826RH
Dropout Voltage vs. Total Dose
0.36
Dropout Voltage (V)
0.34
0.32
0.3
Avg gnd
Avg bias
Control
0.28
0.26
0.24
0.22
0.2
0K
50K
100K
150K
200K
300K
450K
Total dose (rad(SI))
MSK5826RH
Shutdown Threshold vs. Total Dose
Shutdown Threshold (V)
1.6
1.55
1.5
Avg gnd
Avg bias
Control
1.45
1.4
1.35
1.3
1.25
0K
50K
100K
150K
200K
300K
450K
Total dose (rad(SI))
Page 49 of 66
Vout at Shutdown (V)
MSK5826RH
Shutdown Voltage vs. Total Dose
0.1
0.08
0.06
0.04
0.02
0
-0.02
-0.04
-0.06
-0.08
-0.1
Avg gnd
Avg bias
Control
0K
50K
100K
150K
200K
300K
450K
Total dose (rad(SI))
Page 50 of 66
ELDRS Radiation Test Report
MSK 5826RH
Radiation Hardened
Ultra Low Dropout
Positive Adjustable Linear Regulator
December 26, 2008 (First Test)
June 18, 2009 (Second Test)
B. Erwin
M.S. Kennedy Corporation
Liverpool, NY
Page 51 of 66
I.
Introduction:
The ELDRS radiation test plan for the MSK 5826RH was developed to characterize ELDRS sensitivity
for devices incorporating active components including the Linear Tech RH1573 die and
a PNP pass transistor. These devices include, but are not limited to, MSK5800RH, MSK5810RH,
MSK5820RH, MSK5821RH, MSK5822RH, MSK5823RH, MSK5824RH, MSK5826RH, and
MSK5826RH. ELDRS testing was performed to 100Krad(Si) accumulated dose.
MIL-STD-883 Method 1019.7 Condition C and ASTM F1892-06 were used as guidelines in the
development and implementation of the ELDRS test plan for the MSK 5826RH.
II.
Radiation Source:
ELDRS test was performed at the University of Massachusetts, Lowell, using a cobalt 60 radiation
source. Dosimetry was performed prior to device irradiation and the dose rate was determined to be
0.01 rads(Si)/sec. The ELDRS dose schedule can be found in Table I.
III. Test Setup:
All test samples were subjected to Group A Electrical Test in accordance with the device data sheet. In
addition, all devices received 320 hours of burn-in per MIL-STD-883 Method 1015 and were electrically
tested prior to irradiation. For test platform verification, one control device was tested at 25C.
The devices were vertically aligned with the radiation source in the University of Massachusetts ELDRS
facility, chamber #2. Five devices were kept under bias during irradiation. Maximum recommended
operating voltages of + 6.5Volts was used for bias. Five devices had all leads grounded during
irradiation for the unbiased condition.
After each irradiation, the device leads were shorted together then the devices were packaged with dry
ice for shipment, and shipped overnight to the MSK facility. Electrical testing to the MSK device data
sheet was performed within 72 hours from the removal of the radiation source. Testing was performed
on irradiated devices, as well as the control device, at each total dose level. Devices were then
repackaged with dry ice for shipment and returned to the UMass facility overnight for subsequent dose
level. Devices were returned to the irradiation field within 120 hours of removal from the radiation
source per MIL-STD-883 Method 1019.7 Condition C. To prove that the device temperature did not
exceed the irradiation chamber temperature it was verified that dry ice remained in the shipping
container at each point during the shipping process
IV. Data:
All performance curves are averaged from the test results of the biased and unbiased devices
respectively.
V. Summary:
The devices stayed within the pre irradiation test limits for all specifications.
A change was noted in reference voltage. An increase of approximately 0.8 % occurred between 0
Krad(Si) and 100 Krad(si). However the devices still remained within pre irradiation limits.
Line regulation, load regulation, and dropout voltage remained virtually unchanged throughout
irradiation.
Shutdown threshold did exhibit a 6% increase, but still stayed within all test limits.
The output current limit of the devices decreased by approximately 7 %. The final current limit after
irradiation remained nearly double the production limit minimum of 3 Amps however.
Page 52 of 66
MSK 5826RH
Biased/Unbiased Dose Rate Schedule
Dosimetry Equipment
Bruker Biospin # 0141
Irradiation Date
1/21/2009 – 6/10/2009
Exposure
Length
(hr:min:sec)
Incremental
Dose
rads(Si)
Cumulative
Dose
rads(Si)
142:28:00
260:42:00
431:44:00
617:35:00
4.96E3
9.05E3
1.49E4
2.12E4
4,960
14,000
28,900
50,100
758:48:00
2.57E4
75,800
815:07:07
2.73E4
103,000
Biased S/N – 0001, 0002, 0003, 0004, 0005
Unbiased S/N – 0006, 0007, 0008, 0009, 0010
Table 1
Dose Time, Incremental Dose and Total Cumulative Dose
Page 53 of 66
MSK5826RH
Reference Voltage vs. Total Dose
Reference Voltage (V)
1.31
1.3
1.29
1.28
Avg gnd
Avg bias
Control
1.27
1.26
1.25
1.24
1.23
0K
5K
15K
30K
50K
75K
100K
Total dose @ 0.01 rad(Si)/sec.
Output Voltage Delta (%/V)
MSK5826RH
Line Regulation vs. Total Dose
0.25
0.2
0.15
0.1
0.05
0
-0.05
-0.1
-0.15
-0.2
-0.25
Avg gnd
Avg bias
Control
0K
5K
15K
30K
50K
75K
100K
Total dose @ 0.01 rad(Si)/sec.
Page 54 of 66
MSK5826RH
Load Regulation vs. Total Dose
Output Voltage Delts (%/A)
2.5
2
1.5
1
0.5
Avg gnd
Avg bias
Control
0
-0.5
-1
-1.5
-2
-2.5
0K
5K
15K
30K
50K
75K
100K
Total dose @ 0.01 rad(Si)/sec.
Dropout Voltage (V)
MSK5826RH
Dropout Voltage vs. Total Dose
0.5
0.45
0.4
0.35
0.3
0.25
0.2
0.15
0.1
0.05
0
Avg gnd
Avg bias
Control
0K
5K
15K
30K
50K
75K
100K
Total dose @ 0.01 rad(Si)/sec.
Page 55 of 66
MSK5826RH
Shutdown Threshold vs. Total Dose
Shutdown Threshold (V)
1.6
1.5
1.4
Avg gnd
Avg bias
Control
1.3
1.2
1.1
1
0K
5K
15K
30K
50K
75K
100K
Total dose @ 0.01 rad(Si)/sec.
Output Current Limit (A)
MSK5826RH
Output Current Limit vs. Total Dose
7.7
7.2
6.7
6.2
5.7
5.2
4.7
4.2
3.7
3.2
Avg gnd
Avg bias
Control
0K
5K
15K
30K
50K
75K
100K
Total dose @ 0.01 rad(Si)/sec.
Page 56 of 66
Vout at Shutdown (V)
MSK5826RH
Shutdown Voltage vs. Total Dose
0.1
0.08
0.06
0.04
0.02
0
-0.02
-0.04
-0.06
-0.08
-0.1
Avg gnd
Avg bias
Control
0K
5K
15K
30K
50K
75K
100K
Total dose @ 0.01 rad(Si)/sec.
Page 57 of 66
Total Dose Radiation Test Report
MSK 5826RH
(MSK5823RH, MSK5824RH, MSK5825RH)
RAD Hard Ultra Low Dropout
Adjustable Positive Linear Regulator
December 26, 2008
J. Douglas
B. Erwin
M.S. Kennedy Corporation
Liverpool, NY
Page 58 of 66
I.
Introduction:
The total dose radiation test plan for the MSK 5826RH series was developed to qualify the devices
as RAD Hard to 300 KRADS(Si). The testing was performed beyond 300 KRADS(Si) to show trends
in device performance as a function of total dose. The test does not classify maximum radiation
tolerance of the device, but simply offers designers insight to the critical parameter-shifts up to the
specified total dose level. The MSK5823RH, MSK5824RH, MSK5825RH and MSK5826RH all use the
same active components. The data in this report is from the direct measurement of the MSK5826RH
response to irradiation but it is indicative of the response of all four device types and is applicable to all
four types.
MIL-STD-883 Method 1019.7 and ASTM F1892-06 were used as guidelines in the development and
implementation of the total dose test plan for the MSK 5826RH.
II.
Radiation Source:
Total dose was performed at the University of Massachusetts, Lowell, using a cobalt 60 radiation
source. The dose rate was determined to be 185 Rads(Si)/sec. The total dose schedule can be found
in Table I.
III. Test Setup:
All test samples were subjected to Group A Electrical Test at 25C in accordance with the device data
sheet. In addition, all devices received 320 hours of burn-in per MIL-STD-883 Method 1015. For test
platform verification, one control device was tested at 25C. Ten devices were then tested at 25°C, prior
to irradiation, and were found to be within acceptable test limits.
The devices were vertically aligned with the radiation source and enclosed in a lead/aluminum container
during irradiation. Five devices were kept under bias during irradiation. Maximum recommended
operating voltage of +6.5V was used for the bias condition. Five devices
had all leads grounded during irradiation for the unbiased condition.
After each irradiation the device leads were shorted together and transported to the MSK automatic
electrical test platform and tested IAW MSK device data sheet. Testing was performed on irradiated
devices, as well as the control device, at each total dose level. Electrical tests were completed within
one hour of irradiation. Devices were subjected to subsequent radiation doses within two hours of
removal from the radiation field.
IV. Data:
All performance curves are averaged from the test results of the biased and unbiased devices,
respectively. If required, full test data can be obtained by contacting M.S. Kennedy Corporation.
V. Summary:
Based on the test data recorded during radiation testing and statistical analysis, the MSK5826RH
qualified as a 300 Krad(Si) radiation hardened device. Reference Voltage, Shutdown Threshold and
Output Current Limit exhibited the most significant shift due to irradiation, however all performance
curves stayed within specification up to 450 Krad(Si) TID.
Page 59 of 66
MSK 5826RH Biased/Unbiased Dose Rate
Schedule
Dosimetry Equipment
Bruker Biospin # 0141
Irradiation Date
12/16/08
Exposure
Length
(min:sec)
Incremental
Dose
rads(Si)
Cumulative
Dose rads(Si)
4:38
4:38
4:38
4:38
9:17
13:55
51,430
51,430
51,430
51,430
103,045
154,475
51,430
102,860
154,290
205,720
308,765
463,240
Biased S/N – 0021, 0022, 0023, 0024, 0025
Unbiased S/N – 0026, 0027, 0028, 0029, 0030
Table 1
Dose Time, Incremental Dose and Total Cumulative Dose
Page 60 of 66
MSK5826RH
Reference Voltage vs. Total Dose
1.31
Reference Voltage (V)
1.3
1.29
1.28
Avg gnd
Avg bias
Control
1.27
1.26
1.25
1.24
1.23
0K
50K
100K
150K
200K
300K
450K
Total dose (rad(Si))
Page 61 of 66
MSK5826RH
Line Regulation vs. Total Dose
4.5V<Vin<5.5V, Vout=3.3V, Iout =50mA
Output Voltage Delta (mV)
8
6
4
2
Avg gnd
Avg bias
Control
0
-2
-4
-6
-8
0K
50K
100K
150K
200K
300K
450K
Total dose (rad(Si))
Page 62 of 66
Output Voltage Delta (mV)
MSK5826RH
Load Regulation vs. Total Dose
Vin=5.0V, Vout=3.3V, 50mA<Iout<3.0A
16
14
12
10
8
6
4
2
0
-2
-4
Avg gnd
Avg bias
Control
0K
50K
100K
150K
200K
300K
450K
Total dose (rad(Si))
MSK5826RH
Dropout Voltage vs. Total Dose
Iout = 3A
Dropout Voltage (V)
0.35
0.33
0.31
Avg gnd
Avg bias
Control
0.29
0.27
0.25
0.23
0K
50K
100K
150K
200K
300K
450K
Total dose (rad(Si))
Page 63 of 66
MSK5826RH
Shutdown Threshold vs. Total Dose
Shutdown Threshold (V)
1.5
1.45
1.4
Avg gnd
Avg bias
Control
1.35
1.3
1.25
0K
50K
100K
150K
200K
300K
450K
Total dose (rad(Si))
Page 64 of 66
MSK5826RH
Output Current Limit vs. Total Dose
Vin = 5V, Vout = 3.3V
Output Current Limit (A)
8
7.5
7
Avg gnd
Avg bias
Control
6.5
6
5.5
5
4.5
0K
50K
100K
150K
200K
Total dose (rad(Si))
300K
450K
Page 65 of 66
MSK5826RH
Output Voltage at Shutdown vs. Total Dose
0.1
Vout at Shutdown (V)
0.08
0.06
0.04
0.02
Avg gnd
Avg bias
Control
0
-0.02
-0.04
-0.06
-0.08
-0.1
0K
50K
100K
150K
200K
300K
450K
Total dose (rad(Si))
Page 66 of 66