Sample & Buy Product Folder Support & Community Tools & Software Technical Documents Reference Design OPA172, OPA2172, OPA4172 SBOS618H – DECEMBER 2013 – REVISED SEPTEMBER 2015 OPAx172 36-V, Single-Supply, 10-MHz, Rail-to-Rail Output Operational Amplifiers 1 Features 3 Description • The OPA172, OPA2172 and OPA4172 (OPAx172) are a family of 36-V, single-supply, low-noise operational amplifiers capable of operating on supplies ranging from +4.5 V (±2.25 V) to +36 V (±18 V). This latest addition of high-voltage CMOS operational amplifiers, in conjunction with the OPAx171 and OPAx170, provide a family of bandwidth, noise, and power options to meet the needs of a wide variety of applications. The OPAx172 are available in micropackages, and offer low offset, drift, and quiescent current. These devices also offer wide bandwidth, fast slew rate, and high output current drive capability. The single, dual, and quad versions all have identical specifications for maximum design flexibility. 1 • • • • • • • • • • • • • Wide Supply Range: +4.5 V to +36 V, ±2.25 V to ±18 V Low Offset Voltage: ±0.2 mV Low Offset Drift: ±0.3 µV/°C Gain Bandwidth: 10 MHz Low Input Bias Current: ±8 pA Low Quiescent Current: 1.6 mA per Amplifier Low Noise: 7 nV/√Hz EMI and RFI Filtered Inputs Input Range Includes the Negative Supply Input Range Operates to Positive Supply Rail-to-Rail Output High Common-Mode Rejection: 120 dB Industry-Standard Packages: – SOIC-8, VSSOP-8, SOIC-14, TSSOP-14 microPackages: Single in SC70, SOT-23, Dual in WSON-8 2 Applications • • • • • • • • Tracking Amplifier in Power Modules Merchant Power Supplies Transducer Amplifiers Bridge Amplifiers Temperature Measurements Strain Gauge Amplifiers Precision Integrators Test Equipment Unlike most op amps, which are specified at only one supply voltage, the OPAx172 family is specified from +4.5 V to +36 V. Input signals beyond the supply rails do not cause phase reversal. The input can operate 100 mV below the negative rail and within 2 V of the top rail during normal operation. Note that these devices can operate with full rail-to-rail input 100 mV beyond the top rail, but with reduced performance within 2 V of the top rail. The OPAx172 series of op amps are specified from –40°C to +125°C. Device Information(1) PART NUMBER OPA172 OPA2172 OPA4172 PACKAGE BODY SIZE (NOM) SC70 (5) 2.00 mm × 1.25 mm SOT-23 (5) 2.90 mm × 1.60 mm SOIC (8) 4.90 mm × 3.91 mm SOIC (8) 4.90 mm × 3.91 mm VSSOP (8)(2) 3.00 mm × 3.00 mm WSON (8) 3.00 mm × 3.00 mm SOIC (14) 8.65 mm × 3.91 mm TSSOP (14) 4.40 mm × 5.00 mm (1) For all available packages, see the package option addendum at the end of the data sheet. (2) The VSSOP package is the same as the MSOP package. JFET-Input Low-Noise Amplifier Superior THD Performance V1 15 V VEE V2 15 V R1 3.9 k R2 3.9 k VEE OPA172 ++ LSK489 Q1 VCC VOUT R3 1.13 k Q2 VCC R6 27.4 k Q3 MMBT4401 Q4 MMBT4401 R4 11.5 Total Harmonic Distortion + Noise (%) VCC -80 G = +1 V/V, RL = 10 k G = +1 V/V, RL = 2 k G = +1 V/V, RL = 600 G = -1 V/V, RL = 10 k 0.001 -100 G = -1 V/V, RL = 2 k G = -1 V/V, RL = 600 0.0001 -120 VOUT = 3.5 VRMS BW = 80 kHz 0.00001 R5 300 -140 10 100 1k Frequency (Hz) VEE Total Harmonic Distortion + Noise (dB) 0.01 VCC 10k C007 1 An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. PRODUCTION DATA. OPA172, OPA2172, OPA4172 SBOS618H – DECEMBER 2013 – REVISED SEPTEMBER 2015 www.ti.com Table of Contents 1 2 3 4 5 6 7 Features .................................................................. Applications ........................................................... Description ............................................................. Revision History..................................................... Device Comparison ............................................... Pin Configuration and Functions ......................... Specifications......................................................... 7.1 7.2 7.3 7.4 7.5 7.6 7.7 7.8 7.9 8 1 1 1 2 4 5 7 Absolute Maximum Ratings ..................................... 7 ESD Ratings.............................................................. 7 Recommended Operating Conditions....................... 7 Thermal Information: OPA172 .................................. 7 Thermal Information: OPA2172 ................................ 8 Thermal Information: OPA4172 ................................ 8 Electrical Characteristics........................................... 8 Typical Characteristics: Table of Graphs ................ 10 Typical Characteristics ............................................ 11 Detailed Description ............................................ 18 8.1 Overview ................................................................. 18 8.2 Functional Block Diagram ....................................... 18 8.3 Feature Description................................................. 19 8.4 Device Functional Modes........................................ 21 9 Applications and Implementation ...................... 24 9.1 Application Information............................................ 24 9.2 Typical Applications ................................................ 24 10 Power-Supply Recommendations ..................... 27 11 Layout................................................................... 28 11.1 Layout Guidelines ................................................. 28 11.2 Layout Example .................................................... 28 12 Device and Documentation Support ................. 29 12.1 12.2 12.3 12.4 12.5 12.6 12.7 Device Support...................................................... Documentation Support ........................................ Related Links ........................................................ Community Resources.......................................... Trademarks ........................................................... Electrostatic Discharge Caution ............................ Glossary ................................................................ 29 29 29 29 30 30 30 13 Mechanical, Packaging, and Orderable Information ........................................................... 30 4 Revision History Changes from Revision G (June 2015) to Revision H Page • Added DRG package to OPA2172 device ............................................................................................................................ 1 • Added WSON to last Features bullet .................................................................................................................................... 1 • Added OPA2172 WSON row to Device Information table...................................................................................................... 1 • Added WSON-8 to OPA2172 row of Device Comparison table ............................................................................................ 4 • Added DRG pinout drawing ................................................................................................................................................... 5 • Added DRG column to OPA2172 and OPA4172 Pin Functions table .................................................................................. 6 • Added DRG column to OPA2172 Thermal Information table ................................................................................................ 8 Changes from Revision F (June 2015) to Revision G • Page Added input bias current (IB) values for DGK and PW packages. ......................................................................................... 8 Changes from Revision E (December 2014) to Revision F Page • Changed device status to Production Data from Mixed Status.............................................................................................. 1 • Changed OPA2172 DGK and OPA4172 PW packages to Production Data.......................................................................... 1 • Added OPA2172 VSSOP and OPA4172 TSSOP rows to Device Information table ............................................................. 1 • Deleted footnote from Device Comparison table.................................................................................................................... 4 • Deleted footnote from OPA2172 DGK and OPA4172 PW pin out drawings ........................................................................ 5 • Added OPA2172 DGK thermal information ........................................................................................................................... 8 2 Submit Documentation Feedback Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: OPA172 OPA2172 OPA4172 OPA172, OPA2172, OPA4172 www.ti.com SBOS618H – DECEMBER 2013 – REVISED SEPTEMBER 2015 Changes from Revision D (September 2014) to Revision E Page • Changed OPA2172 D package from product preview to production data ............................................................................. 1 • Changed Device Information table ......................................................................................................................................... 1 • Changed Device Comparison table note (1) to show preview packages............................................................................... 4 • Added note 2 to pin configurations to show preview packages and deleted previous note .................................................. 5 • Changed Handling Ratings table to ESD Ratings table ......................................................................................................... 7 Changes from Revision C (July 2014) to Revision D Page • Changed low-noise features bullet value from 6 nV/√Hz to 7 ................................................................................................ 1 • Changed MSOP to VSSOP in features bullet ........................................................................................................................ 1 • Added packages and new note 2 to Device Information table ............................................................................................... 1 • Changed OPAx172 voltage noise density from 6 nV/√Hz to 7 in Device Family Comparison table ..................................... 4 • Changed OPA4172 package from DGK to PW in Pin Functions table .................................................................................. 6 • Added OPA2172 Thermal Information table........................................................................................................................... 8 • Changed input voltage noise value in Electrical Characteristics from 1.2 µVPP to 2.5 µVPP .................................................. 8 • Changed input voltage noise density value at 100 Hz in Electrical Characteristics from 8.6 nV/√Hz to 12 .......................... 8 • Changed input voltage noise density value at 1 kHz in Electrical Characteristics from 6 nV/√Hz to 7.................................. 8 • Changed voltage output swing values in the Electrical Characteristics ................................................................................. 9 • Changed Figure 13 .............................................................................................................................................................. 12 • Changed Figure 14............................................................................................................................................................... 12 • Added new note to Applications and Implementation section ............................................................................................. 24 Changes from Revision B (May 2014) to Revision C Page • Changed OPA4172 D package (SOIC-14) from product preview to production data............................................................ 1 • Added OPA4172-D Thermal information ............................................................................................................................... 8 • Added Channel separation parameter to the Electrical Characteristics ................................................................................. 8 • Added Channel Separation vs Frequency plot .................................................................................................................... 16 Changes from Revision A (April 2014) to Revision B • Page Changed DCK (SC70) package from product preview to production data............................................................................. 1 Changes from Original (December 2013) to Revision A Page • Changed document format to meet latest data sheet standards; added Handling Ratings Recommended Operating Conditions, and Device and Documentation Support sections, and moved existing sections............................................... 1 • Changed DCK package pin names from IN+ and IN– to +IN and –IN, respectively ............................................................. 5 • Changed DBV package from product preview to production data ......................................................................................... 5 • Changed Figure 9................................................................................................................................................................. 11 • Added Functional Block Diagram section............................................................................................................................. 18 • Added Capacitive Load Drive Solution Using an Isolation Resistor section ........................................................................ 24 • Added Power-Supply Recommendations section ................................................................................................................ 27 • Changed Layout Guidelines section..................................................................................................................................... 28 Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: OPA172 OPA2172 OPA4172 Submit Documentation Feedback 3 OPA172, OPA2172, OPA4172 SBOS618H – DECEMBER 2013 – REVISED SEPTEMBER 2015 www.ti.com 5 Device Comparison Device Comparison DEVICE PACKAGE OPA172 (single) SC70-5, SOT-23-5, SOIC-8 OPA2172 (dual) SOIC-8, VSSOP-8, WSON-8 OPA4172 (quad) SOIC-14, TSSOP-14 Device Family Comparison 4 DEVICE QUIESCENT CURRENT (IQ) OPAx172 1600 µA 10 MHz 7 nV/√Hz OPAx171 475 µA 3.0 MHz 14 nV/√Hz OPAx170 110 µA 1.2 MHz 19 nV/√Hz Submit Documentation Feedback GAIN BANDWIDTH PRODUCT (GBP) VOLTAGE NOISE DENSITY (en) Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: OPA172 OPA2172 OPA4172 OPA172, OPA2172, OPA4172 www.ti.com SBOS618H – DECEMBER 2013 – REVISED SEPTEMBER 2015 6 Pin Configuration and Functions DCK Package: OPA172 SC70-5 Top View +IN 1 V- 2 -IN 3 D and DGK Packages: OPA2172 SOIC-8 and VSSOP-8 Top View V+ 5 OUT A 1 8 V+ -IN A 2 7 OUT B +IN A 3 6 -IN B V- 4 5 +IN B OUT 4 DBV Package: OPA172 SOT-23-5 Top View OUT 1 V- 2 +IN 3 5 V+ 4 -IN DRG Package: OPA2172 WSON-8 Top View +IN A 1 V+ 2 A V- 3 -IN A 7 OUT A 6 OUT B 5 -IN B B D Package: OPA172 SOIC-8 Top View (1) 8 +IN B 4 NC(1) 1 8 NC(1) -IN 2 7 V+ +IN 3 6 OUT V- 4 5 NC(1) D and PW Packages: OPA4172 SO-14 and TSSOP-14 Top View OUT A 1 14 OUT D -IN A 2 13 -IN D +IN A 3 12 +IN D V+ 4 11 V- +IN B 5 10 +IN C -IN B 6 9 -IN C OUT B 7 8 OUT C No internal connection. Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: OPA172 OPA2172 OPA4172 Submit Documentation Feedback 5 OPA172, OPA2172, OPA4172 SBOS618H – DECEMBER 2013 – REVISED SEPTEMBER 2015 www.ti.com Pin Functions: OPA172 PIN OPA172 NAME +IN D (SOIC) DBV (SOT) DCK (SC70) I/O 3 3 1 I Noninverting input DESCRIPTION Inverting input –IN 2 4 3 I NC 1, 5, 8 — — — No internal connection OUT 6 1 4 O Output V+ 7 5 5 — Positive (highest) power supply V– 4 2 2 — Negative (lowest) power supply Pin Functions: OPA2172 and OPA4172 PIN OPA2172 NAME +IN A OPA4172 D (SOIC), DGK (VSSOP) DRG (WSON) D (SOIC), PW (TSSOP) I/O 3 1 3 I Noninverting input, channel A DESCRIPTION +IN B 5 4 5 I Noninverting input, channel B +IN C — — 10 I Noninverting input, channel C +IN D — — 12 I Noninverting input, channel D –IN A 2 8 2 I Inverting input, channel A –IN B 6 5 6 I Inverting input, channel B –IN C — — 9 I Inverting input,,channel C –IN D — — 13 I Inverting input, channel D OUT A 1 7 1 O Output, channel A OUT B 7 6 7 O Output, channel B OUT C — — 8 O Output, channel C OUT D — — 14 O Output, channel D V+ 8 2 4 — Positive (highest) power supply V– 4 3 11 — Negative (lowest) power supply 6 Submit Documentation Feedback Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: OPA172 OPA2172 OPA4172 OPA172, OPA2172, OPA4172 www.ti.com SBOS618H – DECEMBER 2013 – REVISED SEPTEMBER 2015 7 Specifications 7.1 Absolute Maximum Ratings (1) over operating free-air temperature range (unless otherwise noted) MIN Supply voltage, VS Common-mode Voltage (2) Signal input pins MAX UNIT ±20 (+40, single supply) V (V–) – 0.5 (V+) + 0.5 Differential (3) Current Output short circuit ±10 (4) –55 (2) (3) (4) +150 Junction +150 Storage, Tstg (1) mA Continuous Operating Temperature V ±0.5 –65 °C +150 Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. Transient conditions that exceed these voltage ratings must be current limited to 10 mA or less. Refer to the Electrical Overstress section for more information. Short-circuit to ground, one amplifier per package. 7.2 ESD Ratings VALUE V(ESD) (1) (2) Electrostatic discharge Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001 (1) ±4000 Charged-device model (CDM), per JEDEC specification JESD22-C101 (2) ±1000 UNIT V JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. 7.3 Recommended Operating Conditions over operating free-air temperature range (unless otherwise noted) MIN Supply voltage (V+ – V–) NOM MAX UNIT 4.5 (±2.25) 36 (±18) V –40 125 °C Specified temperature 7.4 Thermal Information: OPA172 OPA172 THERMAL METRIC (1) D (SOIC) DBV (SOT-23) DCK (SC70) 8 PINS 5 PINS 5 PINS UNIT RθJA Junction-to-ambient thermal resistance 126.5 227.9 285.2 °C/W RθJC(top) Junction-to-case(top) thermal resistance 80.6 115.7 60.5 °C/W RθJB Junction-to-board thermal resistance 67.1 65.9 78.9 °C/W ψJT Junction-to-top characterization parameter 31.0 10.7 0.8 °C/W ψJB Junction-to-board characterization parameter 66.6 65.3 77.9 °C/W RθJC(bot) Junction-to-case(bottom) thermal resistance N/A N/A N/A °C/W (1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report, SPRA953. Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: OPA172 OPA2172 OPA4172 Submit Documentation Feedback 7 OPA172, OPA2172, OPA4172 SBOS618H – DECEMBER 2013 – REVISED SEPTEMBER 2015 www.ti.com 7.5 Thermal Information: OPA2172 OPA2172 THERMAL METRIC (1) D (SOIC) DGK (VSSOP) DRG (WSON) 8 PINS 8 PINS 8 PINS UNIT RθJA Junction-to-ambient thermal resistance 116.1 158 63.2 °C/W RθJC(top) Junction-to-case (top) thermal resistance 69.8 48.6 63.5 °C/W RθJB Junction-to-board thermal resistance 56.6 78.7 36.5 °C/W ψJT Junction-to-top characterization parameter 22.5 3.9 1.4 °C/W ψJB Junction-to-board characterization parameter 56.1 77.3 36.6 °C/W RθJC(bot) Junction-to-case (bottom) thermal resistance N/A N/A 6.3 °C/W (1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report, SPRA953. 7.6 Thermal Information: OPA4172 OPA4172 THERMAL METRIC (1) D (SOIC) PW (TSSOP) 14 PINS 14 PINS UNIT RθJA Junction-to-ambient thermal resistance 82.7 111.1 °C/W RθJC(top) Junction-to-case (top) thermal resistance 42.3 40.8 °C/W RθJB Junction-to-board thermal resistance 37.3 54.1 °C/W ψJT Junction-to-top characterization parameter 8.9 3.8 °C/W ψJB Junction-to-board characterization parameter 37 53.3 °C/W RθJC(bot) Junction-to-case (bottom) thermal resistance N/A N/A °C/W (1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report, SPRA953. 7.7 Electrical Characteristics At TA = +25°C, VS = ±2.25 V to ±18 V, VCM = VOUT = VS / 2, and RL = 10 kΩ connected to VS / 2, unless otherwise noted. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT OFFSET VOLTAGE ±0.2 VOS Input offset voltage dVOS/dT Drift TA = –40°C to +125°C PSRR vs power supply TA = –40°C to +125°C Channel separation, dc At dc TA = –40°C to +125°C ±1 ±1.15 OPA172, OPA4172 ±0.3 OPA2172 ±1.5 ±1.8 ±1 ±3 5 mV µV/°C µV/V µV/V INPUT BIAS CURRENT ±8 IB Input bias current TA = –40°C to +125°C TA = –40°C to +125°C Input offset current TA = –40°C to +125°C pA ±14 OPA2172IDGK ±18 OPA41721PW ±2 IOS ±15 ±15 OPA172, OPA4172 ±1 OPA2172 ±3 nA pA nA NOISE En Input voltage noise en Input voltage noise density in Input current noise density 8 f = 0.1 Hz to 10 Hz 2.5 f = 100 Hz 12 f = 1 kHz 7 f = 1 kHz 1.6 Submit Documentation Feedback µVPP nV/√Hz fA/√Hz Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: OPA172 OPA2172 OPA4172 OPA172, OPA2172, OPA4172 www.ti.com SBOS618H – DECEMBER 2013 – REVISED SEPTEMBER 2015 Electrical Characteristics (continued) At TA = +25°C, VS = ±2.25 V to ±18 V, VCM = VOUT = VS / 2, and RL = 10 kΩ connected to VS / 2, unless otherwise noted. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT INPUT VOLTAGE Common-mode voltage range (1) VCM CMRR Common-mode rejection ratio (V–) – 0.1 V VS = ±2.25 V, (V–) – 0.1 V < VCM < (V+) – 2 V, TA = –40°C to +125°C VS = ±18 V, (V–) – 0.1 V < VCM < (V+) – 2 V, TA = –40°C to +125°C (V+) – 2 V 90 104 110 120 V dB INPUT IMPEDANCE Differential 100 || 4 Common-mode MΩ || pF 1013Ω || pF 6 || 4 OPEN-LOOP GAIN AOL Open-loop voltage gain (V–) + 0.35 V < VO < (V+) – 0.35 V, OPA172, OPA4172 RL = 10 kΩ, TA = –40°C to +125°C OPA2172 (V–) + 0.5 V < VO < (V+) – 0.5 V, RL = 2 kΩ, TA = –40°C to +125°C 110 130 107 115 OPA172, OPA4172 116 OPA2172 107 dB FREQUENCY RESPONSE GBP Gain bandwidth product SR Slew rate tS Settling time THD+N G = +1 To 0.1%, VS = ±18 V, G = +1, 10-V step 10 MHz 10 V/µs 2 To 0.01% (12 bit), VS = ±18 V, G = +1, 10-V step 3.2 Overload recovery time VIN × Gain > VS 200 Total harmonic distortion + noise VS = +36 V, G = +1, f = 1 kHz, VO = 3.5 VRMS µs ns 0.00005% OUTPUT VS = +36 V VS = +36 V, TA = –40°C to +125°C VO Voltage output swing from rail VS = +4.5V VS = +4.5 V, TA = –40°C to +125°C ISC Short-circuit current CLOAD Capacitive load drive ZO Open-loop output impedance RL = 10 kΩ 70 90 RL = 2 kΩ 330 400 RL = 10 kΩ 95 120 RL = 2 kΩ 470 530 RL = 10 kΩ 10 20 RL = 2 kΩ 40 50 RL = 10 kΩ 10 25 RL = 2 kΩ 55 70 ±75 mA See Typical Characteristics f = 1 MHz, IO = 0 A mV pF Ω 60 POWER SUPPLY VS IQ Specified voltage range Quiescent current per amplifier +4.5 IO = 0 A +36 1.6 IO = 0 A, TA = –40°C to +125°C 1.8 2 V mA TEMPERATURE Specified range (1) –40 +125 °C The input range can be extended beyond (V+) – 2 V up to (V+) + 0.1 V. See the Typical Characteristics and Application Information sections for additional information. Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: OPA172 OPA2172 OPA4172 Submit Documentation Feedback 9 OPA172, OPA2172, OPA4172 SBOS618H – DECEMBER 2013 – REVISED SEPTEMBER 2015 www.ti.com 7.8 Typical Characteristics: Table of Graphs Table 1. List of Typical Characteristics DESCRIPTION FIGURE Offset Voltage Production Distribution Figure 1 Offset Voltage Drift Distribution Figure 2 Offset Voltage vs Temperature (VS = ±18 V) Figure 3 Offset Voltage vs Common-Mode Voltage (VS = ±18 V) Figure 4 Offset Voltage vs Common-Mode Voltage (Upper Stage) Figure 5 Offset Voltage vs Power Supply Figure 6 IB vs Common-Mode Voltage Figure 7 Input Bias Current vs Temperature Figure 8 Output Voltage Swing vs Output Current (Maximum Supply) Figure 9 CMRR and PSRR vs Frequency (Referred-to Input) Figure 10 CMRR vs Temperature Figure 11 PSRR vs Temperature Figure 12 0.1-Hz to 10-Hz Noise Figure 13 Input Voltage Noise Spectral Density vs Frequency Figure 14 THD+N Ratio vs Frequency Figure 15 THD+N vs Output Amplitude Figure 16 Quiescent Current vs Temperature Figure 17 Quiescent Current vs Supply Voltage Figure 18 Open-Loop Gain and Phase vs Frequency Figure 19 Closed-Loop Gain vs Frequency Figure 20 Open-Loop Gain vs Temperature Figure 21 Open-Loop Output Impedance vs Frequency Figure 22 Small-Signal Overshoot vs Capacitive Load (100-mV Output Step) Figure 23, Figure 24 10 Positive Overload Recovery Figure 25, Figure 26 Negative Overload Recovery Figure 27, Figure 28 Small-Signal Step Response (10 mV) Figure 29, Figure 30 Small-Signal Step Response (100 mV) Figure 31, Figure 32 Large-Signal Step Response (1 V) Figure 33, Figure 34 Large-Signal Settling Time (10-V Positive Step) Figure 35 Large-Signal Settling Time (10-V Negative Step) Figure 36 No Phase Reversal Figure 37 Short-Circuit Current vs Temperature Figure 38 Maximum Output Voltage vs Frequency Figure 39 EMIRR vs Frequency Figure 40 Channel Separation vs Frequency Figure 41 Submit Documentation Feedback Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: OPA172 OPA2172 OPA4172 OPA172, OPA2172, OPA4172 www.ti.com SBOS618H – DECEMBER 2013 – REVISED SEPTEMBER 2015 7.9 Typical Characteristics At VS = ±18 V, VCM = VS / 2, RLOAD = 10 kΩ connected to VS / 2, and CL = 100 pF, unless otherwise noted. 25 Distribution Taken From 47 Amplifiers Offset Voltage Drift (µV/C) Offset Voltage (mV) C013 C013 Figure 1. Offset Voltage Production Distribution Figure 2. Offset Voltage Drift Production Distribution 250 225 5 Typical Units Shown VS = ±18 V 200 100 VOS (V) 0 ±50 VCM =16V VCM = -18.1V 75 50 VOS (V) 5 Typical Units Shown VS = ±18 V 150 150 0 ±75 ±100 ±150 ±150 ±200 ±250 ±75 ±50 ±25 ±225 0 25 50 75 100 125 Temperature (C) 150 ±20 ±15 ±10 0 ±5 5 10 15 VCM (V) C001 Figure 3. Offset Voltage vs Temperature (VS = ±18 V) 20 C001 Figure 4. Offset Voltage vs Common-Mode Voltage (VS = ±18 V) 500 20 5 Typical Units Shown VS = ±18 V 10 400 Vs = ±2.25V 300 0 5 Typical Units Shown VS = ±2.25V to 18V 200 VOS (V) VOS (mV) 1.00 0.90 0.80 0.70 0.60 0.50 0.40 5 0 1.00 0.80 0.60 0.40 0.20 0.00 -0.20 -0.40 -0.60 0 -0.80 5 10 0.30 10 15 0.20 15 Temperature = -40C to 125C 20 0.10 20 0.00 Percentage of Amplifiers (%) Distribution Taken From 5185 Amplifiers -1.00 Percentage of Amplifiers (%) 25 -10 -20 100 0 ±100 ±200 -30 ±300 -40 ±400 ±500 -50 14 15 16 17 VCM (V) 18 0.0 2.0 4.0 Figure 5. Offset Voltage vs Common-Mode Voltage (Upper Stage) 6.0 8.0 10.0 12.0 14.0 16.0 18.0 VSUPPLY (V) C001 C001 Figure 6. Offset Voltage vs Power Supply Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: OPA172 OPA2172 OPA4172 Submit Documentation Feedback 11 OPA172, OPA2172, OPA4172 SBOS618H – DECEMBER 2013 – REVISED SEPTEMBER 2015 www.ti.com Typical Characteristics (continued) At VS = ±18 V, VCM = VS / 2, RLOAD = 10 kΩ connected to VS / 2, and CL = 100 pF, unless otherwise noted. 12 8000 8 6 IbN 4 2 0 ±2 6000 Input Bias Current (pA) Input Bias Current (pA) IB+ IB Ios IbP 10 4000 2000 0 Ios TA = 25°C ±4 ±18.0 ±13.5 ±2000 ±9.0 0.0 ±4.5 4.5 9.0 13.5 VCM (V) ±50 18.0 50 75 100 125 150 C001 Figure 8. Input Bias Current vs Temperature Common-Mode Rejection Ratio (dB), Power-Supply Rejection Ratio (dB) Output Voltage (V) 25 160.0 (V+) +1 (V+) (V+) -1 (V+) -2 (V+) -3 (V+) -4 (V+) -5 (V-) +5 (V-) +4 (V-) +3 (V-) +2 (V-) +1 (V-) (V-) -1 25C ±40C 125C 85C 85C 125C ±40C 25C 140.0 120.0 100.0 80.0 60.0 +PSRR 40.0 -PSRR 20.0 CMRR 0.0 0 10 20 30 40 50 60 70 80 90 Output Current (mA) 100 1 10 100 1k 10k 100k Frequency (Hz) C011 Figure 9. Output Voltage Swing vs Output Current (Maximum Supply) 1M C012 Figure 10. CMRR and PSRR vs Frequency (Referred-To-Input) 30 10 20 Power-Supply Rejection Ratio (µV/V) Common-Mode Rejection Ratio (µV/V) 0 Temperature (C) Figure 7. Input Bias Current vs Common-Mode Voltage VS = ±2.25V, -99CM 9 10 0 VS = 18 V, -99CM 9 ±10 8 6 4 2 0 ±2 ±75 ±50 ±25 0 25 50 75 100 Temperature (C) Figure 11. CMRR vs Temperature 12 ±25 C001 Submit Documentation Feedback 125 150 ±75 ±50 ±25 0 25 50 75 100 Temperature (C) C001 125 150 C001 Figure 12. PSRR vs Temperature Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: OPA172 OPA2172 OPA4172 OPA172, OPA2172, OPA4172 www.ti.com SBOS618H – DECEMBER 2013 – REVISED SEPTEMBER 2015 Typical Characteristics (continued) 500 nV/div Noise Spectral Density (nV/rtHz) At VS = ±18 V, VCM = VS / 2, RLOAD = 10 kΩ connected to VS / 2, and CL = 100 pF, unless otherwise noted. 100 10 1 Time (1 s/div) 1 10 100 Figure 13. 0.1-Hz to 10-Hz Noise G = -1 V/V, RL = 10 k -100 G = -1 V/V, RL = 2 k G = -1 V/V, RL = 600 0.0001 -120 VOUT = 3.5 VRMS BW = 80 kHz 0.00001 -140 1k 10k Frequency (Hz) 0.1 Total Harmonic Distortion + Noise (%) Total Harmonic Distortion + Noise (%) G = +1 V/V, RL = 600 100 100k C001 -60 G = +1 V/V, RL = 10 k G = +1 V/V, RL = 2 k G = +1 V/V, RL = 600 G = -1 V/V, RL = 10 k G = -1 V/V, RL = 2 k G = -1 V/V, RL = 600 0.01 -80 0.001 -100 0.0001 -120 f = 1 kHz BW = 80 kHz 0.00001 0.01 0.1 -140 1 10 Output Amplitude (VRMS) C007 Figure 15. THD+N Ratio vs Frequency Total Harmonic Distortion + Noise (dB) G = +1 V/V, RL = 2 k Total Harmonic Distortion + Noise (dB) -80 G = +1 V/V, RL = 10 k 10 10k Figure 14. Input Voltage Noise Spectral Density vs Frequency 0.01 0.001 1k Frequency (Hz) C002 C008 Figure 16. THD+N vs Output Amplitude 2.0 1.8 1.7 1.8 1.6 1.5 IQ (mA) IQ (mA) Vs = ±18V 1.6 Vs = ±2.25V 1.4 1.3 1.4 1.2 1.1 1.2 1.0 ±75 ±50 ±25 0 25 50 75 100 125 Temperature (C) Figure 17. Quiescent Current vs Temperature 150 0 4 8 12 16 20 24 28 32 Supply Voltage (V) C001 36 C001 Figure 18. Quiescent Current vs Supply Voltage Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: OPA172 OPA2172 OPA4172 Submit Documentation Feedback 13 OPA172, OPA2172, OPA4172 SBOS618H – DECEMBER 2013 – REVISED SEPTEMBER 2015 www.ti.com Typical Characteristics (continued) At VS = ±18 V, VCM = VS / 2, RLOAD = 10 kΩ connected to VS / 2, and CL = 100 pF, unless otherwise noted. 180 140 25.0 CLOAD = 15 pF 20.0 120 15.0 135 Open-Loop Gain Phase 60 90 40 Gain (dB) 10.0 80 Phase () Gain (dB) 100 5.0 0.0 ±5.0 20 45 ±10.0 0 G = +1 G = -10 G = -1 ±15.0 ±20 0 1 10 100 1k 10k 100k 1M ±20.0 1000 10M Frequency (Hz) 100k 1M 10M Frequency (Hz) Figure 19. Open-Loop Gain and Phase vs Frequency C003 Figure 20. Closed-Loop Gain vs Frequency 1000 2.0 1.5 AOL (µV/V) 10k C004 100 ZO () 1.0 Vs = 4.5 V 10 0.5 Vs = 36 V 1 0.0 RL = 10k ±0.5 ±75 ±50 0 ±25 0 25 50 75 100 125 Temperature (C) RI = 1 k + 10M 100M C016 G = +1 ROUT 40 CL ± 18 V 40 Overshoot (%) Overshoot (%) 1M 50 + ± 100k Figure 22. Open-Loop Output Impedance vs Frequency OPA172 VIN = 100mV 10k G = -1 + 18 V 50 1k Frequency (Hz) RF = 1 k ± 100 C001 Figure 21. Open-Loop Gain vs Temperature 60 10 150 30 20 20 + 18 V ROUT = 0 10 30 R 25 RO OUT==25 ROUT= 0 10 ± ROUT OPA172 R RO = 25 25 OUT= + VIN = 100mV + RL CL ± 18 V ± R 50 RO OUT==50 0 0p 100p 200p 300p Capacitive Load (F) 400p 500p Submit Documentation Feedback 0 0p 100p 200p 300p Capacitive Load (F) C013 Figure 23. Small-Signal Overshoot vs Capacitive Load (100-mV Output Step) 14 RO = 50 50 R OUT= 400p 500p C013 Figure 24. Small-Signal Overshoot vs Capacitive Load (100-mV Output Step) Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: OPA172 OPA2172 OPA4172 OPA172, OPA2172, OPA4172 www.ti.com SBOS618H – DECEMBER 2013 – REVISED SEPTEMBER 2015 Typical Characteristics (continued) At VS = ±18 V, VCM = VS / 2, RLOAD = 10 kΩ connected to VS / 2, and CL = 100 pF, unless otherwise noted. RI = 1 k RF = 10 k + 18 V ± + OPA172 VIN = 2V VOUT + ± VOUT ± 18 V 5 V/div 5 V/div RI = 1 k VOUT RF = 10 k + 18 V ± + OPA172 VIN = 2V VOUT + ± ± 18 V VIN VIN Time (1 s/div) Time (1 s/div) C009 Figure 25. Positive Overload Recovery C009 Figure 26. Positive Overload Recovery (Zoomed In) VIN RI = 1 k VIN RF = 10 k 5 V/div 5 V/div + 18 V VOUT RI = 1 k ± + OPA172 VIN = 2V VOUT + ± ± 18 V RF = 10 k + 18 V VOUT ± + OPA172 VIN = 2V VOUT + ± ± 18 V Time (1 s/div) Time (1 s/div) C010 Figure 27. Negative Overload Recovery C010 Figure 28. Negative Overload Recovery (Zoomed In) RL N CL = 10pF + 18 V CL = 10pF ± OPA172 + VIN = 10mV + CL ± 18 V 2 mV/div 2 mV/div ± RI = 1 k RF = 1 k + 18 V + VIN = 10mV ± OPA172 + ± RL CL ± 18 V Time (200 ns/div) Time (200 ns/div) C006 Figure 29. Small-Signal Step Response (10 mV, G = –1) C014 Figure 30. Small-Signal Step Response (10 mV, G = +1) Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: OPA172 OPA2172 OPA4172 Submit Documentation Feedback 15 OPA172, OPA2172, OPA4172 SBOS618H – DECEMBER 2013 – REVISED SEPTEMBER 2015 www.ti.com Typical Characteristics (continued) At VS = ±18 V, VCM = VS / 2, RLOAD = 10 kΩ connected to VS / 2, and CL = 100 pF, unless otherwise noted. + 18 V CL = 10pF RL N CL = 10pF ± OPA172 + + VIN = 100mV 20 mV/div 20 mV/div CL ± 18 V ± RI = 1 k RF = 1 k + 18 V ± + OPA172 VIN = 100mV + ± RL CL ± 18 V Time (200 ns/div) Time (200 ns/div) C006 Figure 31. Small-Signal Step Response (100 mV, G = –1) C014 Figure 32. Small-Signal Step Response (100 mV, G = +1) RL N CL = 10 pF + 18 V CL = 10pF ± OPA172 + + VIN = 10V 2 V/div 2 V/div CL ± 18 V ± RI = 1 k RF = 1 k + 18 V ± + OPA172 VIN = 10V + ± RL CL ± 18 V Time (500 ns/div) Time (500 ns/div) Figure 33. Large-Signal Step Response (10 V, G = –1) Figure 34. Large-Signal Step Response (10 V, G = +1) 20 20 G = +1 CL = 10 pF 15 10 5 0 -5 0.1% Settling = ±10 mV -10 -15 -20 G = +1 CL = 10 pF 15 10 5 0 -5 0.1% Settling = ±10 mV -10 -15 -20 0 0.5 1 1.5 2 2.5 Time (s) 3 3.5 4 4.5 5 Submit Documentation Feedback 0 0.5 1 1.5 2 2.5 Time (s) C034 Figure 35. Large-Signal Settling Time (10-V Positive Step) 16 C014 Output Delta from Final Value (mV) Output Delta from Final Value (mV) C005 3 3.5 4 4.5 5 C034 Figure 36. Large-Signal Settling Time (10-V Negative Step) Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: OPA172 OPA2172 OPA4172 OPA172, OPA2172, OPA4172 www.ti.com SBOS618H – DECEMBER 2013 – REVISED SEPTEMBER 2015 Typical Characteristics (continued) At VS = ±18 V, VCM = VS / 2, RLOAD = 10 kΩ connected to VS / 2, and CL = 100 pF, unless otherwise noted. 100 + 18 V ± + ± 37 VPP ± 18 V Sine Wave (±18.5V) VOUT VOUT OPA172 + 75 ISC (mA) 5 V/div ISC, Sink 18V 50 ISC, Source ±18V 25 VIN 0 Time (200 s/div) ±75 ±50 ±25 0 Figure 37. No Phase Reversal 50 75 100 125 150 C001 Figure 38. Short-Circuit Current vs Temperature 160.0 30 VS = ±15 V EMIRR IN+ (dB) 120.0 20 15 VS = ±5 V 10 100.0 80.0 60.0 40.0 VS = ±2.25 V 5 PRF = -10 dBm VSUPPLY = ±18 V VCM = 0 V 140.0 Maximum output voltage without slew-rate induced distortion. 25 Output Voltage (VPP) 25 Temperature (C) C011 20.0 0 0.0 10k 100k 1M 10M Frequency (Hz) 10M 100M 1G Frequency (Hz) C033 Figure 39. Maximum Output Voltage vs Frequency 10G C017 Figure 40. EMIRR vs Frequency Channel Separation (dB) 0 ±20 ±40 ±60 ±80 ±100 ±120 10 100 1k 10k 100k 1M Frequency (Hz) 10M C041 Figure 41. Channel Separation vs Frequency Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: OPA172 OPA2172 OPA4172 Submit Documentation Feedback 17 OPA172, OPA2172, OPA4172 SBOS618H – DECEMBER 2013 – REVISED SEPTEMBER 2015 www.ti.com 8 Detailed Description 8.1 Overview The OPAx172 family of operational amplifiers provide high overall performance, making them ideal for many general-purpose applications. The excellent offset drift of only 1.5 µV/°C (max) provides excellent stability over the entire temperature range. In addition, the device offers very good overall performance with high CMRR, PSRR, AOL, and superior THD. The Functional Block Diagram section shows the simplified diagram of the OPA172 design. The design topology is a highly-optimized, three-stage amplifier with an active-feedforward gain stage. 8.2 Functional Block Diagram OPA172 PCH FF Stage Ca Cb +IN PCH Input Stage Output Stage 2nd Stage OUT -IN NCH Input Stage 18 Submit Documentation Feedback Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: OPA172 OPA2172 OPA4172 OPA172, OPA2172, OPA4172 www.ti.com SBOS618H – DECEMBER 2013 – REVISED SEPTEMBER 2015 8.3 Feature Description 8.3.1 EMI Rejection The OPAx172 uses integrated electromagnetic interference (EMI) filtering to reduce the effects of EMI from sources such as wireless communications and densely-populated boards with a mix of analog signal chain and digital components. EMI immunity can be improved with circuit design techniques; the OPAx172 benefits from these design improvements. Texas Instruments has developed the ability to accurately measure and quantify the immunity of an operational amplifier over a broad frequency spectrum extending from 10 MHz to 6 GHz. Figure 42 shows the results of this testing on the OPAx172. Table 2 shows the EMIRR IN+ values for the OPAx172 at particular frequencies commonly encountered in real-world applications. Applications listed in Table 2 can be centered on or operated near the particular frequency shown. Detailed information can also be found in Application Report SBOA128, EMI Rejection Ratio of Operational Amplifiers, available for download from www.ti.com. 160.0 PRF = -10 dBm VSUPPLY = ±18 V VCM = 0 V 140.0 EMIRR IN+ (dB) 120.0 100.0 80.0 60.0 40.0 20.0 0.0 10M 100M 1G Frequency (Hz) 10G C017 Figure 42. EMIRR Testing Table 2. OPAx172 EMIRR IN+ for Frequencies of Interest FREQUENCY APPLICATION OR ALLOCATION EMIRR IN+ 400 MHz Mobile radio, mobile satellite, space operation, weather, radar, ultrahigh frequency (UHF) applications 47.6 dB 900 MHz Global system for mobile communications (GSM) applications, radio communication, navigation, GPS (to 1.6 GHz), GSM, aeronautical mobile, UHF applications 58.5 dB 1.8 GHz GSM applications, mobile personal communications, broadband, satellite, L-band (1 GHz to 2 GHz) 2.4 GHz 802.11b, 802.11g, 802.11n, Bluetooth®, mobile personal communications, industrial, scientific and medical (ISM) radio band, amateur radio and satellite, S-band (2 GHz to 4 GHz) 69.2 dB 3.6 GHz Radiolocation, aero communication and navigation, satellite, mobile, S-band 82.9 dB 5.0 GHz 802.11a, 802.11n, aero communication and navigation, mobile communication, space and satellite operation, C-band (4 GHz to 8 GHz) 114 dB Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: OPA172 OPA2172 OPA4172 68 dB Submit Documentation Feedback 19 OPA172, OPA2172, OPA4172 SBOS618H – DECEMBER 2013 – REVISED SEPTEMBER 2015 www.ti.com 8.3.2 Phase-Reversal Protection The OPAx172 family has internal phase-reversal protection. Many op amps exhibit a phase reversal when the input is driven beyond the linear common-mode range. This condition is most often encountered in noninverting circuits when the input is driven beyond the specified common-mode voltage range, causing the output to reverse into the opposite rail. The input of the OPAx172 prevents phase reversal with excessive common-mode voltage. Instead, the appropriate rail limits the output voltage. This performance is shown in Figure 43. + 18 V ± ± 37 VPP ± 18 V Sine Wave (±18.5V) 5 V/div + VOUT VOUT OPA172 + VIN Time (200 s/div) C011 Figure 43. No Phase Reversal 8.3.3 Capacitive Load and Stability The dynamic characteristics of the OPAx172 are optimized for commonly-used operating conditions. The combination of low closed-loop gain and high capacitive loads decreases the phase margin of the amplifier and may lead to gain peaking or oscillations. As a result, heavier capacitive loads must be isolated from the output. The simplest way to achieve this isolation is to add a small resistor (for example, ROUT = 50 Ω) in series with the output. Figure 44 and Figure 45 show graphs of small-signal overshoot versus capacitive load for several values of ROUT. Refer to Application Bulletin SBOA015 (AB-028), Feedback Plots Define Op Amp AC Performance, available for download from www.ti.com, for details of analysis techniques and application circuits. 60 RI = 1 k 50 RF = 1 k 50 ± + ROUT OPA172 VIN = 100mV 40 + ± CL ± 18 V 40 Overshoot (%) Overshoot (%) G = +1 G = -1 + 18 V 30 20 20 + 18 V ROUT = 0 10 30 R 25 RO OUT==25 ROUT= 0 10 ± ROUT OPA172 R RO = 25 25 OUT= + VIN = 100mV + RL CL ± 18 V ± R 50 RO OUT==50 0 0p 100p 200p 300p Capacitive Load (F) 400p 500p Submit Documentation Feedback 0 0p 100p 200p 300p Capacitive Load (F) C013 Figure 44. Small-Signal Overshoot vs Capacitive Load (100-mV Output Step) 20 RO = 50 50 R OUT= 400p 500p C013 Figure 45. Small-Signal Overshoot vs Capacitive Load (100-mV Output Step) Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: OPA172 OPA2172 OPA4172 OPA172, OPA2172, OPA4172 www.ti.com SBOS618H – DECEMBER 2013 – REVISED SEPTEMBER 2015 8.4 Device Functional Modes 8.4.1 Common-Mode Voltage Range The input common-mode voltage range of the OPAx172 series extends 100 mV below the negative rail and within 2 V of the top rail for normal operation. This device can operate with full rail-to-rail input 100 mV beyond the top rail, but with reduced performance within 2 V of the top rail. The typical performance in this range is summarized in Table 3. Table 3. Typical Performance Range (VS = ±18 V) PARAMETER MIN Input Common-Mode Voltage TYP (V+) – 2 Offset voltage MAX (V+) + 0.1 UNIT V 5 mV Offset voltage vs temperature (TA = –40°C to +125°C) 10 µV/°C Common-mode rejection 70 dB Open-loop gain 60 dB 4 MHz Gain bandwidth product (GBP) Slew rate Noise at f = 1 kHz 4 V/µs 22 nV/√Hz 8.4.2 Electrical Overstress Designers often ask questions about the capability of an operational amplifier to withstand electrical overstress. These questions tend to focus on the device inputs, but may involve the supply voltage terminals or even the output terminal. Each of these different terminal functions have electrical stress limits determined by the voltage breakdown characteristics of the particular semiconductor fabrication process and specific circuits connected to the terminal. Additionally, internal electrostatic discharge (ESD) protection is built into these circuits to protect them from accidental ESD events both before and during product assembly. A good understanding of this basic ESD circuitry and its relevance to an electrical overstress event is helpful. Figure 46 illustrates the ESD circuits contained in the OPAx172 (indicated by the dashed line area). The ESD protection circuitry involves several current-steering diodes connected from the input and output terminals and routed back to the internal power-supply lines, where the diodes meet at an absorption device internal to the operational amplifier. This protection circuitry is intended to remain inactive during normal circuit operation. Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: OPA172 OPA2172 OPA4172 Submit Documentation Feedback 21 OPA172, OPA2172, OPA4172 SBOS618H – DECEMBER 2013 – REVISED SEPTEMBER 2015 www.ti.com TVS + ± RF +VS OPA172 R1 IN± 250 RS IN+ 250 + Power-Supply ESD Cell ID VIN RL + ± + ± ±VS TVS Figure 46. Equivalent Internal ESD Circuitry Relative to a Typical Circuit Application An ESD event produces a short-duration, high-voltage pulse that is transformed into a short-duration, highcurrent pulse while discharging through a semiconductor device. The ESD protection circuits are designed to provide a current path around the operational amplifier core to prevent damage. The energy absorbed by the protection circuitry is then dissipated as heat. When an ESD voltage develops across two or more amplifier device terminals, current flows through one or more steering diodes. Depending on the path that the current takes, the absorption device may activate. The absorption device has a trigger, or threshold voltage, that is above the normal operating voltage of the OPAx172 but below the device breakdown voltage level. When this threshold is exceeded, the absorption device quickly activates and clamps the voltage across the supply rails to a safe level. When the operational amplifier connects into a circuit (as shown in Figure 46), the ESD protection components are intended to remain inactive and do not become involved in the application circuit operation. However, circumstances may arise where an applied voltage exceeds the operating voltage range of a given terminal. If this condition occurs, there is a risk that some internal ESD protection circuits can turn on and conduct current. Any such current flow occurs through steering-diode paths and rarely involves the absorption device. Figure 46 shows a specific example where the input voltage (VIN) exceeds the positive supply voltage (+VS) by 500 mV or more. Much of what happens in the circuit depends on the supply characteristics. If +VS can sink the current, one of the upper input steering diodes conducts and directs current to +VS. Excessively high current levels can flow with increasingly higher VIN. As a result, the data sheet specifications recommend that applications limit the input current to 10 mA. If the supply is not capable of sinking the current, VIN can begin sourcing current to the operational amplifier, and then take over as the source of positive supply voltage. The danger in this case is that the voltage can rise to levels that exceed the operational amplifier absolute maximum ratings. 22 Submit Documentation Feedback Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: OPA172 OPA2172 OPA4172 OPA172, OPA2172, OPA4172 www.ti.com SBOS618H – DECEMBER 2013 – REVISED SEPTEMBER 2015 Another common question involves what happens to the amplifier if an input signal is applied to the input while the power supplies +VS or –VS are at 0 V. Again, this question depends on the supply characteristic while at 0 V, or at a level below the input-signal amplitude. If the supplies appear as high impedance, then the input source supplies the operational amplifier current through the current-steering diodes. This state is not a normal bias condition; most likely, the amplifier will not operate normally. If the supplies are low impedance, then the current through the steering diodes can become quite high. The current level depends on the ability of the input source to deliver current, and any resistance in the input path. If there is any uncertainty about the ability of the supply to absorb this current, add external zener diodes to the supply terminals; see Figure 46. Select the zener voltage so that the diode does not turn on during normal operation. However, the zener voltage must be low enough so that the zener diode conducts if the supply terminal begins to rise above the safe-operating, supply-voltage level. The OPAx172 input terminals are protected from excessive differential voltage with back-to-back diodes; see Figure 46. In most circuit applications, the input protection circuitry has no effect. However, in low-gain or G = 1 circuits, fast-ramping input signals can forward-bias these diodes because the output of the amplifier cannot respond rapidly enough to the input ramp. If the input signal is fast enough to create this forward-bias condition, limit the input signal current to 10 mA or less. If the input signal current is not inherently limited, an input series resistor can be used to limit the input signal current. This input series resistor degrades the low-noise performance of the OPAx172. Figure 46 illustrates an example configuration that implements a current-limiting feedback resistor. 8.4.3 Overload Recovery Overload recovery is defined as the time it takes for the op amp output to recover from the saturated state to the linear state. The output devices of the op amp enter the saturation region when the output voltage exceeds the rated operating voltage, either due to the high input voltage or the high gain. After the device enters the saturation region, the charge carriers in the output devices need time to return back to the normal state. After the charge carriers return back to the equilibrium state, the device begins to slew at the normal slew rate. Thus, the propagation delay in case of an overload condition is the sum of the overload recovery time and the slew time. The overload recovery time for the OPAx172 is approximately 200 ns. Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: OPA172 OPA2172 OPA4172 Submit Documentation Feedback 23 OPA172, OPA2172, OPA4172 SBOS618H – DECEMBER 2013 – REVISED SEPTEMBER 2015 www.ti.com 9 Applications and Implementation NOTE Information in the following applications sections is not part of the TI component specification, and TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining suitability of components for their purposes. Customers should validate and test their design implementation to confirm system functionality. 9.1 Application Information The OPAx172 family of amplifiers is specified for operation from 4.5 V to 36 V (±2.25 V to ±18 V). Many of the specifications apply from –40°C to +125°C. Parameters that can exhibit significant variance with regard to operating voltage or temperature are presented in the Typical Characteristics. 9.2 Typical Applications The following application examples highlight only a few of the circuits where the OPAx172 can be used. 9.2.1 Capacitive Load Drive Solution Using an Isolation Resistor The OPA172 can be used capacitive loads such as cable shields, reference buffers, MOSFET gates, and diodes. The circuit uses an isolation resistor (RISO) to stabilize the output of an op amp. RISO modifies the open-loop gain of the system to ensure the circuit has sufficient phase margin. +VS VOUT RISO + VIN + ± CLOAD -VS Figure 47. Unity-Gain Buffer with RISO Stability Compensation 9.2.1.1 Design Requirements The design requirements are: • • • 24 Supply voltage: 30 V (±15 V) Capacitive loads: 100 pF, 1000 pF, 0.01 μF, 0.1 μF, and 1 μF Phase margin: 45° and 60° Submit Documentation Feedback Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: OPA172 OPA2172 OPA4172 OPA172, OPA2172, OPA4172 www.ti.com SBOS618H – DECEMBER 2013 – REVISED SEPTEMBER 2015 Typical Applications (continued) 9.2.1.2 Detailed Design Procedure Figure 47 depicts a unity-gain buffer driving a capacitive load. Equation 1 shows the transfer function for the circuit in Figure 47. Not depicted in Figure 47 is the open-loop output resistance of the op amp, Ro. 1 + CLOAD × RISO × s T(s) = 1 + Ro + RISO × CLOAD × s (1) The transfer function in Equation 1 has a pole and a zero. The frequency of the pole (fp) is determined by (Ro + RISO) and CLOAD. Components RISO and CLOAD determine the frequency of the zero (fz). A stable system is obtained by selecting RISO such that the rate of closure (ROC) between the open-loop gain (AOL) and 1 / β is 20 dB per decade. Figure 48 shows the concept. Note that the 1 / β curve for a unity-gain buffer is 0 dB. 120 AOL 100 1 fp 2 u u RISO R o Gain (dB) 80 60 uC LOAD 40 dB fz 40 1 2 u u RISO u CLOAD 1 dec 1/ 20 ROC 20 dB dec 0 10 100 1k 10k 100k 1M 10M 100M Frequency (Hz) Figure 48. Unity-Gain Amplifier with RISO Compensation ROC stability analysis is typically simulated. The validity of the analysis depends on multiple factors, especially the accurate modeling of Ro. In addition to simulating the ROC, a robust stability analysis includes a measurement of overshoot percentage and ac gain peaking of the circuit using a function generator, oscilloscope, and gain and phase analyzer. Phase margin is then calculated from these measurements. Table 4 shows the overshoot percentage and ac gain peaking that correspond to phase margins of 45° and 60°. For more details on this design and other alternative devices that can be used in place of the OPA172, refer to the precision design, Capacitive Load Drive Solution using an Isolation Resistor (TIPD128). Table 4. Phase Margin versus Overshoot and AC Gain Peaking PHASE MARGIN OVERSHOOT AC GAIN PEAKING 45° 23.3% 2.35 dB 60° 8.8% 0.28 dB Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: OPA172 OPA2172 OPA4172 Submit Documentation Feedback 25 OPA172, OPA2172, OPA4172 SBOS618H – DECEMBER 2013 – REVISED SEPTEMBER 2015 www.ti.com 9.2.1.3 Application Curve The OPA172 meets the supply voltage requirements of 30 V. The OPA172 is tested for various capacitive loads and RISO is adjusted to get an overshoot corresponding to Table 4. The results of the these tests are summarized in Figure 49. 1000 60° Phase Margin 45° Phase Margin RISO () 100 10 1 0.01 0.1 1 10 100 1000 CLOAD (nF) C041 Figure 49. RISO vs CLOAD 9.2.2 Bidirectional Current Source The improved Howland current-pump topology shown in Figure 50 provides excellent performance because of the extremely tight tolerances of the on-chip resistors of the INA132. By buffering the output using an OPA172, the output current the circuit is able to deliver is greatly extended. The circuit dc transfer function is shown in Equation 2: IOUT = VIN / R1 (2) The OPA172 can also be used as the feedback amplifier because the low bias current minimizes error voltages produced across R1. However, for improved performance, select a FET-input device with extremely low offset, such as the OPA192, OPA140, or OPA188 as the feedback amplifier. INA132 ±IN 40 N 40 N SENSE VCC OUTPUT VIN + + +IN 40 N 40 N + + OPA172 REF VEE VCC OPA172 R1 + + VEE IOUT Figure 50. Bidirectional Current Source 26 Submit Documentation Feedback Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: OPA172 OPA2172 OPA4172 OPA172, OPA2172, OPA4172 www.ti.com SBOS618H – DECEMBER 2013 – REVISED SEPTEMBER 2015 9.2.3 JFET-Input Low-Noise Amplifier Figure 51 shows a low-noise composite amplifier built by adding a low noise JFET pair (Q1 and Q2) as an input preamplifier for the OPA172. Transistors Q3 and Q4 form a 2-mA current sink that biases each JFET with 1 mA of drain current. Using 3.9-kΩ drain resistors produces a gain of approximately 10 in the input amplifier, making the extremely-low, broadband-noise spectral density of the JFET pair, Q1 and Q2, the dominant noise source of the amplifier. The output impedance of the input differential amplifier is large enough that a FET-input amplifier such as the OPA172 provides superior noise performance over bipolar-input amplifiers. The gain of the composite amplifier is given by Equation 3: AV = (1 + R3 / R4) (3) The resistances shown are standard 1% resistor values that produce a gain of approximately 100 (99.26) with 68° of phase margin. Gains less than 10 may require additional compensation methods to provide stability. Select low resistor values to minimize the resistor thermal noise contribution to the total output noise. VCC VCC V1 15 V VEE V2 15 V R1 3.9 k R2 3.9 k VEE OPA172 VOUT ++ LSK489 Q1 R3 1.13 k VCC Q2 VCC R6 27.4 k Q3 R4 11.5 MMBT4401 Q4 MMBT4401 R5 300 VEE Figure 51. JFET-Input Low-Noise Amplifier 10 Power-Supply Recommendations The OPA172 is specified for operation from 4.5 V to 36 V (±2.25 V to ±18 V); many specifications apply from –40°C to +125°C. Parameters that can exhibit significant variance with regard to operating voltage or temperature are presented in the Typical Characteristics. CAUTION Supply voltages larger than 40 V can permanently damage the device; see the Absolute Maximum Ratings. Place 0.1-μF bypass capacitors close to the power-supply terminals to reduce errors coupling in from noisy or high-impedance power supplies. For more detailed information on bypass capacitor placement, see the Layout section. Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: OPA172 OPA2172 OPA4172 Submit Documentation Feedback 27 OPA172, OPA2172, OPA4172 SBOS618H – DECEMBER 2013 – REVISED SEPTEMBER 2015 www.ti.com 11 Layout 11.1 Layout Guidelines For best operational performance of the device, use good printed circuit board (PCB) layout practices, including: • Noise can propagate into analog circuitry through the power pins of the circuit as a whole and op amp itself. Bypass capacitors are used to reduce the coupled noise by providing low-impedance power sources local to the analog circuitry. – Connect low-ESR, 0.1-µF ceramic bypass capacitors between each supply pin and ground, placed as close to the device as possible. A single bypass capacitor from V+ to ground is applicable for singlesupply applications. • Separate grounding for analog and digital portions of circuitry is one of the simplest and most-effective methods of noise suppression. One or more layers on multilayer PCBs are usually devoted to ground planes. A ground plane helps distribute heat and reduces EMI noise pickup. Make sure to physically separate digital and analog grounds paying attention to the flow of the ground current. For more detailed information refer to SLOA089, Circuit Board Layout Techniques. • In order to reduce parasitic coupling, run the input traces as far away from the supply or output traces as possible. If these traces cannot be kept separate, crossing the sensitive trace perpendicular as opposed to in parallel with the noisy trace is preferable. • Place the external components as close to the device as possible. As shown in Figure 52, keeping RF and RG close to the inverting input minimizes parasitic capacitance. • Keep the length of input traces as short as possible. Always remember that the input traces are the most sensitive part of the circuit. • Consider a driven, low-impedance guard ring around the critical traces. A guard ring can significantly reduce leakage currents from nearby traces that are at different potentials. 11.2 Layout Example RIN + VIN VOUT RG RF (Schematic Representation) Run the input traces as far away from the supply lines as possible Place components close to device and to each other to reduce parasitic errors VS+ RF NC NC ±IN V+ +IN OUT V± NC RG GND VIN GND RIN Only needed for dual-supply operation GND VS± (or GND for single supply) Use low-ESR, ceramic bypass capacitor VOUT Ground (GND) plane on another layer Figure 52. Operational Amplifier Board Layout for Noninverting Configuration 28 Submit Documentation Feedback Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: OPA172 OPA2172 OPA4172 OPA172, OPA2172, OPA4172 www.ti.com SBOS618H – DECEMBER 2013 – REVISED SEPTEMBER 2015 12 Device and Documentation Support 12.1 Device Support 12.1.1 Development Support 12.1.1.1 TINA-TI™ (Free Software Download) TINA™ is a simple, powerful, and easy-to-use circuit simulation program based on a SPICE engine. TINA-TI is a free, fully-functional version of the TINA software, preloaded with a library of macro models in addition to a range of both passive and active models. TINA-TI provides all the conventional dc, transient, and frequency domain analysis of SPICE, as well as additional design capabilities. Available as a free download from the Analog eLab Design Center, TINA-TI offers extensive post-processing capability that allows users to format results in a variety of ways. Virtual instruments offer the ability to select input waveforms and probe circuit nodes, voltages, and waveforms, creating a dynamic quick-start tool. NOTE These files require that either the TINA software (from DesignSoft™) or TINA-TI software be installed. Download the free TINA-TI software from the TINA-TI folder. 12.2 Documentation Support 12.2.1 Related Documentation SBOA015 (AB-028) — Feedback Plots Define Op Amp AC Performance. SLOA089 — Circuit Board Layout Techniques. SLOD006 — Op Amps for Everyone. SBOA128 — EMI Rejection Ratio of Operational Amplifiers. TIPD128 — Capacitive Load Drive Solution using an Isolation Resistor. 12.3 Related Links Table 5 lists quick access links. Categories include technical documents, support and community resources, tools and software, and quick access to sample or buy. Table 5. Related Links PARTS PRODUCT FOLDER SAMPLE & BUY TECHNICAL DOCUMENTS TOOLS & SOFTWARE SUPPORT & COMMUNITY OPA172 Click here Click here Click here Click here Click here OPA2172 Click here Click here Click here Click here Click here OPA4172 Click here Click here Click here Click here Click here 12.4 Community Resources The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use. TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help solve problems with fellow engineers. Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and contact information for technical support. Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: OPA172 OPA2172 OPA4172 Submit Documentation Feedback 29 OPA172, OPA2172, OPA4172 SBOS618H – DECEMBER 2013 – REVISED SEPTEMBER 2015 www.ti.com 12.5 Trademarks E2E is a trademark of Texas Instruments. TINA-TI is a trademark of Texas Instruments, Inc and DesignSoft, Inc. Bluetooth is a registered trademark of Bluetooth SIG, Inc. TINA, DesignSoft are trademarks of DesignSoft, Inc. All other trademarks are the property of their respective owners. 12.6 Electrostatic Discharge Caution This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. 12.7 Glossary SLYZ022 — TI Glossary. This glossary lists and explains terms, acronyms, and definitions. 13 Mechanical, Packaging, and Orderable Information The following pages include mechanical packaging and orderable information. This information is the most current data available for the designated devices. This data is subject to change without notice and revision of this document. For browser-based versions of this data sheet, refer to the left-hand navigation. 30 Submit Documentation Feedback Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: OPA172 OPA2172 OPA4172 PACKAGE OPTION ADDENDUM www.ti.com 18-Sep-2015 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Drawing Qty Eco Plan Lead/Ball Finish MSL Peak Temp (2) (6) (3) Op Temp (°C) Device Marking (4/5) OPA172ID ACTIVE SOIC D 8 75 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 125 OPA172 OPA172IDBVR ACTIVE SOT-23 DBV 5 3000 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 125 OUWQ OPA172IDBVT ACTIVE SOT-23 DBV 5 250 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 125 OUWQ OPA172IDCKR ACTIVE SC70 DCK 5 3000 Green (RoHS & no Sb/Br) CU NIPDAU Level-1-260C-UNLIM -40 to 125 SIU OPA172IDCKT ACTIVE SC70 DCK 5 250 Green (RoHS & no Sb/Br) CU NIPDAU Level-1-260C-UNLIM -40 to 125 SIU OPA172IDR ACTIVE SOIC D 8 2500 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 125 OPA172 OPA2172ID ACTIVE SOIC D 8 75 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 125 O2172A OPA2172IDGK ACTIVE VSSOP DGK 8 80 Green (RoHS & no Sb/Br) CU NIPDAUAG Level-2-260C-1 YEAR -40 to 125 OVJQ OPA2172IDGKR ACTIVE VSSOP DGK 8 2500 Green (RoHS & no Sb/Br) CU NIPDAUAG Level-2-260C-1 YEAR -40 to 125 OVJQ OPA2172IDR ACTIVE SOIC D 8 2500 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 125 O2172A OPA2172IDRGR PREVIEW SON DRG 8 3000 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 125 OP2172 OPA2172IDRGT PREVIEW SON DRG 8 250 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 125 OP2172 OPA4172ID ACTIVE SOIC D 14 50 Green (RoHS & no Sb/Br) CU NIPDAU Level-3-260C-168 HR -40 to 125 OPA4172 OPA4172IDR ACTIVE SOIC D 14 2500 Green (RoHS & no Sb/Br) CU NIPDAU Level-3-260C-168 HR -40 to 125 OPA4172 OPA4172IPW ACTIVE TSSOP PW 14 90 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 125 OPA4172 OPA4172IPWR ACTIVE TSSOP PW 14 2000 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 125 OPA4172 (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. Addendum-Page 1 Samples PACKAGE OPTION ADDENDUM www.ti.com 18-Sep-2015 LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above. Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material) (3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. (4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device. (5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation of the previous line and the two combined represent the entire Device Marking for that device. (6) Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish value exceeds the maximum column width. Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release. In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis. Addendum-Page 2 PACKAGE MATERIALS INFORMATION www.ti.com 15-Sep-2015 TAPE AND REEL INFORMATION *All dimensions are nominal Device Package Package Pins Type Drawing SPQ OPA172IDBVR SOT-23 3000 180.0 8.4 DBV 5 Reel Reel A0 Diameter Width (mm) (mm) W1 (mm) B0 (mm) K0 (mm) P1 (mm) W Pin1 (mm) Quadrant 3.23 3.17 1.37 4.0 8.0 Q3 OPA172IDBVT SOT-23 DBV 5 250 180.0 8.4 3.23 3.17 1.37 4.0 8.0 Q3 OPA172IDCKR SC70 DCK 5 3000 178.0 9.0 2.4 2.5 1.2 4.0 8.0 Q3 OPA172IDCKT SC70 DCK 5 250 178.0 9.0 2.4 2.5 1.2 4.0 8.0 Q3 OPA172IDR SOIC D 8 2500 330.0 12.4 6.4 5.2 2.1 8.0 12.0 Q1 OPA2172IDGKR VSSOP DGK 8 2500 330.0 12.4 5.3 3.4 1.4 8.0 12.0 Q1 OPA2172IDR SOIC D 8 2500 330.0 12.4 6.4 5.2 2.1 8.0 12.0 Q1 OPA4172IDR SOIC D 14 2500 330.0 16.4 6.5 9.0 2.1 8.0 16.0 Q1 OPA4172IPWR TSSOP PW 14 2000 330.0 12.4 6.9 5.6 1.6 8.0 12.0 Q1 Pack Materials-Page 1 PACKAGE MATERIALS INFORMATION www.ti.com 15-Sep-2015 *All dimensions are nominal Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm) OPA172IDBVR SOT-23 DBV 5 3000 223.0 270.0 35.0 OPA172IDBVT SOT-23 DBV 5 250 223.0 270.0 35.0 OPA172IDCKR SC70 DCK 5 3000 180.0 180.0 18.0 OPA172IDCKT SC70 DCK 5 250 180.0 180.0 18.0 OPA172IDR SOIC D 8 2500 367.0 367.0 35.0 OPA2172IDGKR VSSOP DGK 8 2500 366.0 364.0 50.0 OPA2172IDR SOIC D 8 2500 367.0 367.0 35.0 OPA4172IDR SOIC D 14 2500 367.0 367.0 38.0 OPA4172IPWR TSSOP PW 14 2000 367.0 367.0 35.0 Pack Materials-Page 2 IMPORTANT NOTICE Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, enhancements, improvements and other changes to its semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest issue. 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