Datasheet

AON7932
30V Dual Asymmetric N-Channel MOSFET
General Description
Product Summary
The AON7932 is designed to provide a high efficiency
synchronous buck power stage with optimal layout and
board space utilization. It includes two specialized
MOSFETs in a dual Power DFN3x3A package. The Q1
"High Side" MOSFET is designed to minimize switching
losses. The Q2 "Low Side" MOSFET use advance
trench technology with a monolithically integrated Schotty
to provide excellent RDS(ON) and low gate charge. The
AON7932 is well suited for use in compact DC/DC
converter applications.
Top View
Power DFN3x3A
S2
S2
RDS(ON) (at VGS=10V)
RDS(ON) (at VGS = 4.5V)
G1
G2
(S1/D2)
D1
D1
D1
D1
D1
D1
TC=25°C
Avalanche Current C
Power Dissipation A
TA=25°C
G1
D1
8
Q1
7
2
3
6
Q2
5
4
TC=25°C
<15mΩ
TA=25°C
D1 3
6
S2
S2
D1 2
7
S2
S2
G1 1
8
G2
D1
S1/D2
Max Q2
Units
V
±12
V
35
A
6.6
8.1
5.3
6.5
IAS, IAR
18
17
A
EAS, EAR
16
14
mJ
23
25
9
10
Thermal Characteristics
Parameter
Symbol
Steady-State
S2
22
TJ, TSTG
Steady-State
S2
30
5
110
Junction and Storage Temperature Range
t ≤ 10s
D1 4
70
PDSM
TA=70°C
<12mΩ
16
PD
TC=100°C
Rev.3.0: February 2015
<30mΩ
G2
26
IDSM
TA=70°C
Maximum Junction-to-Ambient A
Maximum Junction-to-Ambient A D
Maximum Junction-to-Case
35A
Bottom View
1
IDM
Avalanche Energy L=0.1mH C
Power Dissipation B
26A
<20mΩ
100% Rg Tested
ID
TC=100°C
Pulsed Drain Current C
Continuous Drain
Current
Q2
30V
100% UIS Tested
Absolute Maximum Ratings TA=25°C unless otherwise noted
Parameter
Symbol
Max Q1
VDS
Drain-Source Voltage
±20
VGS
Gate-Source Voltage
Continuous Drain
Current
Q1
30V
Top View
Bottom View
S2
VDS
ID (at VGS=10V)
RθJA
RθJC
1.4
1.4
0.9
0.9
-55 to 150
Typ Q1
40
70
4.5
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Max Q1
50
90
5.4
Typ Q2
40
70
4.2
A
W
W
°C
Max Q2
50
90
5
Units
°C/W
°C/W
°C/W
Page 1 of 1
AON7932
Q1 Electrical Characteristics (TJ=25°C unless otherwise noted)
Symbol
Parameter
STATIC PARAMETERS
BVDSS
Drain-Source Breakdown Voltage
IDSS
Zero Gate Voltage Drain Current
Conditions
Min
ID=250µA, VGS=0V
VDS=30V, VGS=0V
5
Gate-Body leakage current
VDS=0V, VGS= ±20V
VGS(th)
Gate Threshold Voltage
VDS=VGS ID=250µA
1.4
ID(ON)
On state drain current
VGS=10V, VDS=5V
70
RDS(ON)
Static Drain-Source On-Resistance
100
VGS=10V, ID=6.6A
TJ=125°C
VGS=4.5V, ID=5.3A
gFS
Forward Transconductance
Diode Forward Voltage
IS=1A,VGS=0V
Maximum Body-Diode Continuous Current
VDS=5V, ID=6.6A
DYNAMIC PARAMETERS
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
Rg
Gate resistance
SWITCHING PARAMETERS
Qg(10V) Total Gate Charge
Qg(4.5V) Total Gate Charge
Qgs
Gate Source Charge
Qgd
Gate Drain Charge
VGS=0V, VDS=15V, f=1MHz
VGS=0V, VDS=0V, f=1MHz
Units
V
1
TJ=55°C
VSD
Max
30
IGSS
IS
Typ
1.9
2.4
µA
nA
V
A
16
20
24
29
23
30
22
0.75
mΩ
mΩ
S
1
V
20
A
300
380
460
pF
110
160
210
pF
7
13
22
pF
0.7
1.5
2.3
Ω
5.4
6.5
nC
2.3
VGS=10V, VDS=15V, ID=6.6A
nC
1.3
nC
1
nC
tD(on)
Turn-On DelayTime
tr
Turn-On Rise Time
tD(off)
Turn-Off DelayTime
tf
Turn-Off Fall Time
trr
Body Diode Reverse Recovery Time
IF=6.6A, dI/dt=500A/µs
6.8
8.5
10.2
Qrr
Body Diode Reverse Recovery Charge IF=6.6A, dI/dt=500A/µs
12.8
16
19.2
VGS=10V, VDS=15V, RL=2.3Ω,
RGEN=3Ω
10
ns
3
ns
15
ns
5
ns
ns
nC
A. The value of RθJA is measured with the device mounted on 1in2 FR-4 board with 2oz. Copper, in a still air environment with TA =25°C. The
Power dissipation PDSM is based on RθJA and the maximum allowed junction temperature of 150°C. The value in any given application depends
on the user's specific board design.
B. The power dissipation PD is based on TJ(MAX)=150°C, using junction-to-case thermal resistance, and is more useful in setting the upper
dissipation limit for cases where additional heatsinking is used.
C. Repetitive rating, pulse width limited by junction temperature TJ(MAX)=150°C. Ratings are based on low frequency and duty cycles to keep
initial TJ =25°C.
D. The RθJA is the sum of the thermal impedence from junction to case RθJC and case to ambient.
E. The static characteristics in Figures 1 to 6 are obtained using <300µs pulses, duty cycle 0.5% max.
F. These curves are based on the junction-to-case thermal impedence which is measured with the device mounted to a large heatsink, assuming
a maximum junction temperature of TJ(MAX)=150°C. The SOA curve provides a single pulse rating.
G. The maximum current rating is limited by package.
H. These tests are performed with the device mounted on 1 in2 FR-4 board with 2oz. Copper, in a still air environment with TA=25°C.
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.
Rev.3.0: February 2015
www.aosmd.com
Page 1 of 1
AON7932
Q1-CHANNEL: TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
30
80
VDS=5V
10V
25
7V
20
4.5V
40
ID(A)
ID (A)
60
4V
125°C
10
3.5V
20
15
25°C
5
VGS=2.5V
0
0
0
1
2
3
4
5
0
0.5
VDS (Volts)
Fig 1: On-Region Characteristics (Note E)
1.5
2
2.5
3
3.5
4
4.5
5
VGS(Volts)
Figure 2: Transfer Characteristics (Note E)
2
Normalized On-Resistance
30
VGS=4.5V
25
RDS(ON) (mΩ)
1
20
15
VGS=10V
10
0
3
6
9
12
VGS=10V
ID=6.6A
1.8
1.6
17
VGS=4.5V
5
ID=5.3A
1.4
2
10
1.2
1
0.8
15
0
25
50
75
100
125
150
175
200
1.2
1.4
Temperature (°C) 0
18Temperature
Figure 4: On-Resistance vs. Junction
(Note E)
ID (A)
Figure 3: On-Resistance vs. Drain Current and Gate
Voltage (Note E)
40
ID=6.6A
1.0E+01
40
1.0E+00
30
125°C
1.0E-01
25
125°C
20
IS (A)
RDS(ON) (mΩ)
35
25°C
1.0E-02
1.0E-03
15
25°C
10
2
1.0E-04
1.0E-05
4
6
8
10
VGS (Volts)
Figure 5: On-Resistance vs. Gate-Source Voltage
(Note E)
Rev.3.0: February 2015
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0.0
0.2
0.4
0.6
0.8
1.0
VSD (Volts)
Figure 6: Body-Diode Characteristics (Note E)
Page 1 of 1
AON7932
Q1-CHANNEL: TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
600
10
VDS=15V
ID=6.6A
500
Ciss
Capacitance (pF)
VGS (Volts)
8
6
4
2
400
300
Coss
200
100
0
Crss
0
0
1
2
3
4
5
Qg (nC)
Figure 7: Gate-Charge Characteristics
6
0
5
10
15
20
25
VDS (Volts)
Figure 8: Capacitance Characteristics
30
200
RDS(ON)
limited
10.0
100us
1ms
1.0
DC
TJ(Max)=150°C
TC=25°C
0.1
0.1
1
VDS (Volts)
120
80
0
10
0.0001
Figure 9: Maximum Forward Biased
Safe Operating Area (Note F)
ZθJC Normalized Transient
Thermal Resistance
10
1
TJ(Max)=150°
C
40
0.0
0.01
160
10µs
Power (W)
ID (Amps)
100.0
D=Ton/T
TJ,PK=TC+PDM.ZθJC.RθJC
0.001
0.01
0.1
1
Pulse Width (s)
Figure 10: Single Pulse Power Rating Junction-toCase (Note F)
In descending order
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse
RθJC=5.4°C/W
PD
0.1
Ton
0.01
Single Pulse
0.00001
Rev.3.0: February 2015
0.0001
0.001
T
0.01
0.1
Pulse Width (s)
Figure 11: Normalized Maximum Transient Thermal Impedance (Note F)
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1
Page 1 of 1
AON7932
Q1-CHANNEL: TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
30
TA=25°C
TA=100°C
Power Dissipation (W)
IAR (A) Peak Avalanche Current
100.0
10.0
TA=150°C
TA=125°C
25
20
15
10
5
0
1.0
0
1E-06
1E-05
0.0001
0.001
Time in avalanche, tA (s)
Figure 12: Single Pulse Avalanche capability
(Note C)
50
75
100
125
TCASE (°C)
Figure 13: Power De-rating (Note F)
150
10000
30
25
TA=25°C
1000
20
Power (W)
Current rating ID(A)
25
15
10
17
5
2
10
100
10
5
1
0
0
25
50
75
100
125
0.00001
150
ZθJA Normalized Transient
Thermal Resistance
TCASE (°C)
Figure 14: Current De-rating (Note F)
0.1
10
0 1000
Pulse Width (s)
18
Figure 15: Single Pulse Power Rating Junction-toAmbient (Note H)
D=Ton/T
TJ,PK=TA+PDM.ZθJA.RθJA
1
0.001
In descending order
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse
40
RθJA=90°C/W
0.1
PD
0.01
Ton
Single Pulse
T
0.001
0.00001
0.0001
0.001
0.01
0.1
1
10
100
Pulse Width (s)
Figure 16: Normalized Maximum Transient Thermal Impedance (Note H)
Rev.3.0: February 2015
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Page 1 of 1
AON7932
Q2 Electrical Characteristics (TJ=25°C unless otherwise noted)
Symbol
Parameter
STATIC PARAMETERS
BVDSS
Drain-Source Breakdown Voltage
IDSS
Zero Gate Voltage Drain Current
Conditions
Min
ID=10mA, VGS=0V
VDS=30V, VGS=0V
500
IGSS
Gate-Body leakage current
VDS=0V, VGS= ±12V
Gate Threshold Voltage
VDS=VGS ID=250µA
1.1
ID(ON)
On state drain current
VGS=10V, VDS=5V
110
RDS(ON)
Static Drain-Source On-Resistance
VGS=10V, ID=8.1A
TJ=125°C
VGS=4.5V, ID=6.5A
gFS
Forward Transconductance
IS=1A,VGS=0V
Diode Forward Voltage
Maximum Body-Diode Continuous Current
VDS=5V, ID=8.1A
DYNAMIC PARAMETERS
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
Rg
Gate resistance
SWITCHING PARAMETERS
Qg(10V) Total Gate Charge
Qg(4.5V) Total Gate Charge
Qgs
Gate Source Charge
Qgd
Gate Drain Charge
VGS=0V, VDS=15V, f=1MHz
VGS=0V, VDS=0V, f=1MHz
Units
V
0.5
TJ=55°C
VSD
Max
30
VGS(th)
IS
Typ
1.6
mA
100
nA
2.1
V
A
10
12
15
18
12
15
55
0.45
mΩ
mΩ
S
0.7
V
30
A
810
1020
1230
pF
77
111
150
pF
45
75
130
pF
0.5
1
1.5
Ω
19
23
nC
VGS=10V, VDS=15V, ID=8.1A
9
nC
4
nC
3
nC
tD(on)
Turn-On DelayTime
tr
Turn-On Rise Time
tD(off)
Turn-Off DelayTime
tf
Turn-Off Fall Time
trr
Body Diode Reverse Recovery Time
IF=8.1A, dI/dt=500A/µs
4
5.4
7
Qrr
Body Diode Reverse Recovery Charge IF=8.1A, dI/dt=500A/µs
4
5.3
7
VGS=10V, VDS=15V, RL=1.8Ω,
RGEN=3Ω
11
ns
5
ns
29
ns
6
ns
ns
nC
1in2
A. The value of RθJA is measured with the device mounted on
FR-4 board with 2oz. Copper, in a still air environment with TA =25°C. The
Power dissipation PDSM is based on R θJA and the maximum allowed junction temperature of 150°C. The value in any given application depends
on the user's specific board design.
B. The power dissipation PD is based on TJ(MAX)=150°C, using junction-to-case thermal resistance, and is more useful in setting the upper
dissipation limit for cases where additional heatsinking is used.
C. Repetitive rating, pulse width limited by junction temperature TJ(MAX)=150°C. Ratings are based on low frequency and duty cycles to keep
initial TJ =25°C.
D. The RθJA is the sum of the thermal impedence from junction to case RθJC and case to ambient.
E. The static characteristics in Figures 1 to 6 are obtained using <300µs pulses, duty cycle 0.5% max.
F. These curves are based on the junction-to-case thermal impedence which is measured with the device mounted to a large heatsink, assuming
a maximum junction temperature of TJ(MAX)=150°C. The SOA curve provides a single pulse rating.
G. These tests are performed with the device mounted on 1 in2 FR-4 board with 2oz. Copper, in a still air environment with TA=25°C.
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.
Rev.3.0: February 2015
www.aosmd.com
Page 1 of 1
AON7932
Q2-CHANNEL: TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
80
80
3.5V
10V
VDS=5V
60
60
40
ID(A)
ID (A)
3V
40
Vgs=2.5V
20
125°C
25°C
20
0
0
0
1
2
3
4
5
0
VDS (Volts)
Fig 1: On-Region Characteristics (Note E)
2
3
4
5
VGS(Volts)
Figure 2: Transfer Characteristics (Note E)
20
Normalized On-Resistance
2
16
RDS(ON) (mΩ)
1
VGS=4.5V
12
8
VGS=10V
4
VGS=10V
ID=8.1A
1.8
1.6
17
1.4
VGS=4.5V 5
ID=6.5A 2
1.2
10
1
0.8
0
0
3
0
6
9
12
15
ID (A)
Figure 3: On-Resistance vs. Drain Current and Gate
Voltage (Note E)
25
50
75
100
125
150
175
200
Temperature (°C) 0
Figure 4: On-Resistance vs. Junction
18Temperature
(Note E)
40
ID=8.1A
35
40
30
25
1.0E+00
125°C
IS (A)
RDS(ON) (mΩ)
125°C
1.0E+01
20
25°C
1.0E-01
15
10
1.0E-02
25°C
5
1.0E-03
0
2
4
6
8
10
VGS (Volts)
Figure 5: On-Resistance vs. Gate-Source Voltage
(Note E)
Rev.3.0: February 2015
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0.0
0.2
0.4
0.6
0.8
1.0
VSD (Volts)
Figure 6: Body-Diode Characteristics (Note E)
Page 1 of 1
AON7932
Q2-CHANNEL: TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
1200
10
VDS=15V
ID=8.1A
1000
Ciss
Capacitance (pF)
VGS (Volts)
8
6
4
2
800
600
400
Crss
200
0
Coss
0
0
4
8
12
16
Qg (nC)
Figure 7: Gate-Charge Characteristics
20
0
5
10
15
20
25
VDS (Volts)
Figure 8: Capacitance Characteristics
200
10µs
RDS(ON)
10.0
1ms
DC
1.0
TJ(Max)=150°C
TC=25°C
0.1
120
80
40
0.0
0.01
0.1
1
VDS (Volts)
0
10
0.0001
Figure 9: Maximum Forward Biased
Safe Operating Area (Note F)
ZθJC Normalized Transient
Thermal Resistance
10
1
TJ(Max)=150°C
TC=25°C
160
100µs
Power (W)
ID (Amps)
100.0
30
0.001
0.01
0.1
1
Pulse Width (s)
Figure 10: Single Pulse Power Rating Junction-toCase (Note F)
D=Ton/T
TJ,PK=TC+PDM.ZθJC.RθJC
In descending order
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse
RθJC=5°C/W
40
PD
0.1
Single Pulse
Ton
T
0.01
0.00001
Rev.3.0: February 2015
0.0001
0.001
0.01
0.1
Pulse Width (s)
Figure 11: Normalized Maximum Transient Thermal Impedance (Note F)
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1
Page 1 of 1
AON7932
Q2-CHANNEL: TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
IAR (A) Peak Avalanche Current
100
30
TA=25°C
10
Power Dissipation (W)
TA=100°C
TA=150°C
TA=125°C
25
20
15
10
5
0
1
1E-06
1E-05
0.0001
0
0.001
25
75
100
125
150
TCASE (°C)
Figure 13: Power De-rating (Note F)
Time in avalanche, tA (s)
Figure 12: Single Pulse Avalanche capability
(Note C)
50
10000
40
1000
Power (W)
Current rating ID(A)
50
30
20
TA=25°C
17
5
2
10
100
10
10
1
0
0.00001
ZθJA Normalized Transient
Thermal Resistance
0
25
50
75
100
125
TCASE (°C)
Figure 14: Current De-rating (Note F)
150
D=Ton/T
TJ,PK=TA+PDM.ZθJA.RθJA
1
0.001
0.1
10
0
Pulse Width (s)
18
Figure 15: Single Pulse Power Rating Junction-toAmbient (Note G)
In descending order
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse
40
RθJA=90°C/W
0.1
PD
0.01
Single Pulse
Ton
T
0.001
0.0001
0.001
0.01
0.1
1
10
100
Pulse Width (s)
Figure 16: Normalized Maximum Transient Thermal Impedance (Note G)
Rev.3.0: February 2015
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Page 1 of 1
AON7932
Q2-CHANNEL: TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
1.0E-01
0.9
20A
0.8
1.0E-02
0.6
IR (A)
VSD (V)
VDS=30V
1.0E-04
VDS=15V
0.5
0.4
0.3
IS=1A
0.2
1.0E-05
0.1
0
0
50
100
150
200
Temperature (°C)
Figure 17: Diode Reverse Leakage Current vs.
Junction Temperature
125ºC
25ºC
10
8
8
6
6
8
Qrr
4
4
125ºC
Irm
5
10
15
20
25
8
2
0
0
125ºC
2
125ºC
Irm
25ºC
200
10
15
20
0
25
30
4
3.5
3
trr
25ºC
6
4
1.5
125ºC
S
2
600
800
1000
di/dt (A/µs)
Figure 20: Diode Reverse Recovery Charge and Peak
Current vs. di/dt
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2.5
2
125ºC
400
Rev.3.0: February 2015
5
25ºC
0
0.5
25ºC
8
3
1
S
Is=20A
trr (ns)
6
Qrr
2
1.5
10
Irm (A)
25ºC
4
0
2.5
25ºC
IS (A)
Figure 19: Diode Reverse Recovery Time and
Softness Factor vs. Conduction Current
12
9
3
125ºC
0
30
15
125ºC
3.5
4
2
Is=20A
6
4
di/dt=800A/µs
trr
IS (A)
Figure 18: Diode Reverse Recovery Charge and Peak
Current vs. Conduction Current
0
100
150
200
Temperature (°C)
Figure 18: Diode Forward voltage vs. Junction
Temperature
25ºC
0
0
50
S
di/dt=800A/µs
12
10
trr (ns)
16
Irm (A)
0
S
1.0E-06
Qrr (nC)
5A
0.7
1.0E-03
Qrr (nC)
10A
1
0.5
0
0
200
400
600
800
1000
di/dt (A/µs)
Figure 21: Diode Reverse Recovery Time and
Softness Factor vs. di/dt
Page 1 of 1
AON7932
Gate Charge Test Circuit & Waveform
Vgs
+
VDC
-
Qg
10V
+ Vds
-
Qgs
VDC
DUT
Qgd
Vgs
Ig
RL
Vds
Vds
90%
+ Vdd
-
DUT
Vgs
Rg
Charge
Resistive Switching Test Circuit & Waveforms
VDC
Vgs
10%
Vgs
td(on)
tr
td(off)
ton
tf
toff
Unclamped Inductive Switching (UIS) Test Circuit & Waveforms
L
2
EAR= 1/2 LIAR
Vds
Vds
Id
Rg
BVDSS
+ Vdd
-
Vgs
Vgs
VDC
I AR
Id
DUT
Vgs
Vgs
Diode Recovery Test Circuit & Waveforms
Vds +
Vds -
Qrr = - Idt
DUT
Isd
Vgs
Ig
Rev.3.0: February 2015
Vgs
Isd
L
+ Vdd
-
VDC
Vds
www.aosmd.com
IF
t rr
dI/dt
I RM
Vdd
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