REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Added case outline M. -sld 13-05-01 Charles F. Saffle B Table IA: Made corrections to the Dropout voltage and Ripple rejection tests, for both the positive and negative regulators, and the test Minimum input voltage for the negative regulator. Table II: Corrected the subgroups throughout. Updated tables IIIA and IIIB. Editorial changes throughout. -sld 14-05-01 Charles F. Saffle REV SHEET REV B B B B B B SHEET 15 16 17 18 19 20 REV STATUS OF SHEETS PMIC N/A STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A REV B B B B B B B B B B B B B B SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PREPARED BY Steve L. Duncan DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http://www.landandmaritime.dla.mil/ CHECKED BY Greg Cecil APPROVED BY Charles F. Saffle DRAWING APPROVAL DATE MICROCIRCUIT, HYBRID, DUAL VOLTAGE REGULATOR, 3 AMP, POSITIVE AND NEGATIVE, LOW DROPOUT, ADJUSTABLE 12-11-13 REVISION LEVEL B SIZE A SHEET DSCC FORM 2233 APR 97 CAGE CODE 67268 1 OF 5962-10213 20 5962-E283-14 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 Federal stock class designator \ R RHA designator (see 1.2.1) \/ Drawing number 10213 / 01 Device type (see 1.2.2) K Device class designator (see 1.2.3) M Case outline (see 1.2.4) C Lead finish (see 1.2.5) 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number 01 8653, 8654 02 8687, 8688 Circuit function Dual voltage regulator, 3 amp, positive and negative, low dropout, adjustable Dual voltage regulator, 3 amp, positive, low dropout adjustable 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-10213 A REVISION LEVEL B SHEET 2 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter M U Z Descriptive designator See figure 1 See figure 1 See figure 1 Terminals Package style 8 8 8 Surface Mount with unformed leads Thru-hole Surface Mount 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Input voltage: Positive regulator.................................................................... Negative regulator .................................................................. Input-Output differential voltage: Positive regulator.................................................................... Negative regulator .................................................................. Output voltage: Positive regulator.................................................................... Negative regulator .................................................................. Output current: Positive regulator.................................................................... Negative regulator .................................................................. Junction temperature (TJ) .......................................................... Power Dissipation (PD)............................................................... Thermal resistance, junction-to-case (θJC) each regulator ......... Lead temperature (soldering, 10 seconds) ................................ Storage temperature range ........................................................ +25 V -35 V 25 V 30 V +25 V -30 V 6A -4,5 A +150°C See table IB herein 5°C/W 300°C -65°C to +150°C 1.4 Recommended operating conditions. Output voltage range: Postive voltage regulator ....................................................... Negative voltage regulator...................................................... Input- Output differential range: Positive regulator.................................................................... Negative regulator .................................................................. Output current: Positive regulator.................................................................... Neagtive regulator .................................................................. Case operating temperature range (TC) ...................................... +1.25 V to +23 V dc -2.37 V to -25 V dc +1.8 V to +24 V -1.05 V to -29 V 3 A maximum 3 A maximum -55°C to +125°C 1.5 Radiation features. Maximum total dose available (dose rate = 50 - 300 rad(Si)/s) 100 krad(Si) 2/ 3/ 4/ ________ 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Bipolar device types may degrade from displacement damage from radiation which could affect RHA levels. These device types have not been characterized for displacement damage. 3/ These parts may be dose rate sensitive in a space enviroment and may demonstrate enhanced low dose rate effects. Radiation end-point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition A. Dose rate shall be in accordance with MIL-STD-883, method 1019, condition A. 4/ The active elements that make up the device on this drawing have been tested for Total Ionizing Dose (TID) in accordance with MIL-STD-883 test method 1019 condition A. RHA testing of the active elements covered on this SMD are tested in alternate packages (TO3) and (TO39), not the packages as specified in paragraph 1.2.4. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-10213 A REVISION LEVEL B SHEET 3 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http://quicksearch.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturer's Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Block diagram. The block diagram shall be as specified on figure 3. 3.2.4 Radiation exposure circuits. The radiation exposure circuits shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing and acquiring activity upon request. 3.2.5 Maximum power dissipation verses case temperature table. The maximum power dissipation verses case temperature is specified in table IB. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table IA and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table IA. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's vendor similar PIN may also be marked. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-10213 A REVISION LEVEL B SHEET 4 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DLA Land and Maritime -VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime -VA shall affirm that the manufacturer's product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-10213 A REVISION LEVEL B SHEET 5 TABLE IA. Electrical performance characteristics. Test Symbol Conditions 1/ -55°C ≤ TC ≤+125°C P ≤ PMAX unless otherwise specified Group A subgroups Device types 1.5 V ≤ (VIN - VOUT) ≤ 15 V, ILOAD = 10 mA 1,2,3 01,02 Limits Unit Min Max 1.210 1.275 V POSITIVE REGULATOR Reference voltage 2/ VREF Line regulation 2/ 3/ ΔVOUT ΔVIN 1.5 V ≤ (VIN - VOUT) ≤ 15 V, ILOAD = 10 mA 1,2,3 01,02 0.25 % Load regulation 2/ 3/ ΔVOUT ΔIOUT 10 mA ≤ IOUT ≤ 3.0 A, (VIN - VOUT) =3V 4,5,6 01,02 0.35 % 30 ms pulse, TC = +25°C 4 01,02 0.04 %/W Thermal regulation Dropout voltage VDROP ∆VREF = 1%, IOUT = 3.0 A 1,2,3 01,02 1.4 V Dropout voltage 2/ 4/ VDROP1 ∆VREF = 1%, IOUT = 5.0 A 1,2,3 01,02 1.8 V IOUT = 0.5 A, (VIN - VOUT) = 3 V, f = 120 Hz, CADJ = COUT = 25 µF 1,2,3 01,02 1,2,3 01,02 120 µA Ripple rejection 60 dB Adjustment pin current 2/ IADJ Adjustment pin current change 2/ ∆IADJ 10 mA ≤ IOUT ≤ 3.0 A, 1.5 V ≤ (VIN - VOUT) ≤ 15 V 1,2,3 01,02 5 µA Minimum load current 2/ 4/ IMIN (VIN - VOUT) = 25V 1,2,3 01,02 10 mA Current limit 2/ ICL (VIN - VOUT) = 5 V 4 01,02 5.25 Reference voltage 2/ VREF VIN - VOUT = -1.2 V to -28 V, 1 mA ≤ IOUT ≤ 3 A, VOUT = -5 V 1,2,3 01 -2.29 Dropout Voltage 2/ VDROP IOUT = 0.5 A, VOUT = -5 V 1,2,3 01 A NEGATIVE REGULATOR IOUT = 3 A, VOUT = -5 V Ripple rejection -2.45 V 0.425 V 1.05 IOUT = 0.5 A, (VIN - VOUT) = 3 V, f = 120 Hz, CADJ = COUT = 25 µF 1,2,3 01 60 dB See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-10213 A REVISION LEVEL B SHEET 6 TABLE IA. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ -55°C ≤ TC ≤+125°C P ≤ PMAX unless otherwise specified Group A subgroups Device types Limits Min Unit Max NEGATIVE REGULATOR - CONTINUED Line regulation 2/ 3/ ΔVOUT ΔVIN 1 V ≤ (VIN - VOUT) ≤ 20 V, VOUT = -5 V 1,2,3 01 0.02 %/V Load regulation 2/ 3/ ΔVOUT ΔIOUT 5 mA ≤ IOUT ≤ 3 A, (VIN - VOUT) = -1.5 V to -10 V, VOUT = -5 V 4,5,6 01 0.8 % 1,2,3 01 -4.5 V 4 01 3.3 4.55 A (VIN - VOUT) =-15 V, TC = +25°C 2.0 4.5 (VIN - VOUT) = -20 V, TC = +25° 1.0 3.1 2.7 3.7 0.9 1.6 Minimum input voltage 2/ VIN MIN IOUT = 3 A, VOUT = VREF Internal current limit 2/ IMAX -1.5 V ≤ (VIN - VOUT) ≤ -10 V, TC = +25°C External current limit 2/ ILIM 4,5,6 RLIM = 5 kΩ 01 RLIM = 15 kΩ A Quiescent supply current 2/ IQ IOUT = 5 mA, VOUT = VREF, (-4 V ≤ VIN ≤ -25 V) 1,2,3 01 3.5 mA Supply current change with load 2/ IQ∆ (VIN - VOUT) = .25 V +(.25Ω x IOUT) 1,2,3 01 35 mA/A 21 (VIN - VOUT) ≥ -2 V 1/ 2/ 3/ 4/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end-point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition A. The active elements that make up this device have been tested to RHA designator level "R" (100 krad(Si)) of Method 1019, condition A of MIL-STD-883 at +25°C for these parameters and limits. RHA testing of the active elements covered on this SMD were done in alternate packages (TO3) and (TO39), not the packages as specified in paragraph 1.2.4. Regulation is measured at a constant junction temperature, using pulse testing with a low duty cycle. Changes in output voltage due to heating effects are covered under the specification for thermal regulation. Measurements taken at the output lead must be adjusted for lead resistance. Not production tested. Shall be guaranteed by design, characterization, or correlation to other tested parameters. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-10213 A REVISION LEVEL B SHEET 7 Table IB. Maximum power dissipation verses case temperature table. Case Temperature (°C) 0 5 10 15 20 25 30 35 40 45 50 55 60 65 70 75 80 85 90 95 100 105 110 115 120 125 130 135 140 145 150 STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 Maximum power dissipation (Watts) One regulator "ON" 30 29 28 27 26 25 24 23 22 21 20 19 18 17 16 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0 Both regulators "ON" 56 54 52 50 48 47 45 43 41 39 37 35 34 32 30 28 26 24 22 20 19 17 15 13 11 9 7 6 4 2 0 SIZE 5962-10213 A REVISION LEVEL B SHEET 8 Case M FIGURE 1. Case outline(s). STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-10213 A REVISION LEVEL B SHEET 9 Case M - Continued. Inches Symbol Min A Millimeters Max Min .220 Max 5.59 ∅b .028 .032 0.71 0.81 ∅b3 .085 .095 2.12 2.41 D .750 .760 19.05 19.30 D1 .510 .520 12.95 13.21 e .100 BSC 2.54 BSC e1 .300 BSC 7.62 BSC e2 .108 BSC 2.74 BSC E .410 .420 10.41 10.67 F .035 .045 0.90 1.14 G1 .632 BSC G2 .2025 L .400 ∅p .140 .2125 16.05 BSC 5.144 5.408 10.16 .150 3.56 3.81 Q .122 TYP 3.10 TYP R .065 TYP 1.65 TYP S1 .028 0.71 NOTES: 1. The U.S. preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shall rule. 2. The package contains a BeO substrate. 3. The case is electrically isolated. FIGURE 1. Case outline(s) - Continued. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-10213 A REVISION LEVEL B SHEET 10 Case U FIGURE 1. Case outline(s) - Continued. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-10213 A REVISION LEVEL B SHEET 11 Case U - Continued. Inches Symbol Min A Millimeters Max Min .220 Max 5.59 ∅b .028 .032 0.71 0.81 ∅b3 .085 .095 2.12 2.41 D .750 .760 19.05 19.30 D1 .510 .520 12.95 13.21 e .100 BSC 2.54 BSC e1 .300 BSC 7.62 BSC e2 .108 BSC 2.74 BSC eA .700 .740 17.78 18.80 E .410 .420 10.41 10.67 F .035 .045 0.90 1.14 G1 .632 BSC G2 .2025 L1 .230 L2 .2125 16.05 BSC 5.144 5.84 .150 REF .140 ∅p 5.408 3.81 REF .150 3.56 3.81 Q .122 TYP 3.10 TYP R .065 TYP 1.65 TYP S1 .028 0.71 NOTES: 1. The U.S. preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shall rule. 2. The package contains a BeO substrate. 3. The case is electrically isolated. FIGURE 1. Case outline(s) - Continued. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-10213 A REVISION LEVEL B SHEET 12 Case Z FIGURE 1. Case outlines(s) - Continued. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-10213 A REVISION LEVEL B SHEET 13 Case Z - Continued. Inches Symbol Min A Millimeters Max Min .220 Max 5.59 A1 .015 .025 0.38 0.64 ∅b .028 .032 0.71 0.81 ∅b3 .085 .095 2.12 2.41 D .750 .760 19.05 19.30 D1 .510 .520 12.95 13.21 e .100 BSC 2.54 BSC e1 .300 BSC 7.62 BSC e2 .108 BSC 2.74 BSC E .410 .420 10.41 10.67 F .035 .045 0.90 1.14 G1 .632 BSC 16.05 BSC G2 .2025 .2125 5.144 5.408 H .866 .906 22.00 23.01 L1 .055 .065 1.40 1.65 L2 .150 REF .140 ∅p 3.81 REF .150 3.56 3.81 Q .122 TYP 3.10 TYP R .065 TYP 1.65 TYP S1 .028 0.71 NOTES: 1. The U.S. preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shall rule. 2. The package contains a BeO substrate. 3. The case is electrically isolated. FIGURE 1. Case outline(s) - Continued. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-10213 A REVISION LEVEL B SHEET 14 Device types Case outlines Terminal number 01 02 M, U and Z Terminal symbol Terminal symbol POS_ ADJ_1 NEG_REF_2 NEG_VOUT_2 NEG_VIN_2 NEG_GND_2 NEG_FB_2 POS_VOUT_1 POS_VIN_1 1 2 3 4 5 6 7 8 ADJ_1 VOUT_1 SENSE_1 VIN_2 ADJ_2 VOUT_2 SENSE_2 VIN_1 FIGURE 2. Terminal connections. FIGURE 3. Block diagram. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-10213 A REVISION LEVEL B SHEET 15 FIGURE 3. Block diagram - Continued. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-10213 A REVISION LEVEL B SHEET 16 TABLE II. Electrical test requirements. MIL-PRF-38534 test requirements Subgroups (in accordance with MIL-PRF-38534, group A test table) Interim electrical parameters 1,2,3,4,5,6 Final electrical parameters 1*,2,3,4,5,6 Group A test requirements 1,2,3,4,5,6 Group C end-point electrical parameters 1,2,3,4,5,6 End-point electrical parameters for Radiation Hardness Assurance (RHA) devices 1 * PDA applies to subgroup 1. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. b. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime -VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA as specified in accordance with table I of method 1015 of MIL-STD-883. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance with MIL-PRF-38534 and as specified herein. 4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF-38534 and as follows: a. Tests shall be as specified in table II herein. b. Subgroups 7, 8A, 8B, 9, 10, and 11 shall be omitted. 4.3.2 Group B inspection (PI). Group B inspection shall be in accordance with MIL-PRF-38534. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-10213 A REVISION LEVEL B SHEET 17 4.3.3 Group C inspection (PI). Group C inspection shall be in accordance with MIL-PRF-38534 and as follows: a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime -VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA as specified in accordance with table I of method 1005 of MIL-STD-883. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 4.3.4 Group D inspection (PI). Group D inspection shall be in accordance with MIL-PRF-38534. 4.3.5. Radiation hardness assurance (RHA). RHA qualification is required only for those devices with the RHA designator as specified herein. See table IIIA and table IIIB. Table IIIA. Radiation Hardness Assurance Method Table. RHA method Employed Total Dose Testing Worst Case Analysis Performed RHA level "R" (100 krad) Element Hybrid Includes Combines Combines End-of-life level device level temperature temperature and total dose effects radiation effects and displacement effects Tested at (100 krad) Tested at (100 krad) See 4.3.5.1.1.2 No No No No End point electricals after total dose Element level Hybrid device level TC = +25°C TC = +25°C Table IIIB. Hybrid level and element level test table. Low Dose Rate (LDR) Hybrid Element Bipolar, linear or mixed signal > 90 nm Total Dose High Dose Rate (HDR) Not tested Tested at (100 krad) See 4.3.5.1.1.2 Not tested Not tested Not tested Not tested Not tested Not tested Not tested Not tested Tested at (100 krad) Not tested Not tested Not tested Not tested Not tested Not tested Not tested STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 ELDRS Radiation Test Heavy Ion Proton Neutron SEU SEL Low High SEE Displacement (upset) (latch-up) Energy Energy (upset) Damage (DD) SIZE 5962-10213 A REVISION LEVEL B SHEET 18 4.3.5.1 Radiation Hardness Assurance (RHA) inspection. RHA qualification is required for those devices with the RHA designator as specified herein. End-point electrical parameters for radiation hardness assurance (RHA) devices shall be specified in table II. Radiation testing will be in accordance with the qualifying activity (DLA Land and Maritime -VQ) approved plan and with MIL-PRF-38534, Appendix G. a. The hybrid device manufacturer shall establish procedures controlling component radiation testing, and shall establish radiation test plans used to implement component lot qualification during procurement. Test plans and test reports shall be filed and controlled in accordance with the manufacturer's configuration management system. b. The hybrid device manufacturer shall designate a RHA program manager to oversee component lot qualification, and to monitor design changes for continued compliance to RHA requirements. 4.3.5.1.1 Hybrid level qualification. 4.3.5.1.1.2 Total ionizing dose irradiation testing. Hybrid level and element level testing are the same for the devices on this SMD since the active elements are independent of each other and accessible to the device leads for test. The qualification was performed on the active elements, independent of the hybrid. 4.3.5.1.2 Element level qualification. 4.3.5.1.2.1 Total Ionizing dose irradiation testing. A minimum of ten samples of each element is tested at initial qualification and after any design or process changes which may affect the RHA response of the device type. Five biased and five unbiased are tested at High Dose Rate (HDR) in accordance with condition A of method 1019 of MIL-STD-883 to 100 krad(Si). 0.9000/90% statistics are applied to the device parameters as specified in table IA herein. 4.3.5.2 RHA Lot Acceptance. Each lot of active elements shall be evaluated for acceptance in accordance with MIL-PRF38534 and herein. 4.3.5.2.1 Total Ionizing Dose. Samples from every wafer lot will be assembled into packages (TO3) or (TO39) and tested for wafer lot acceptance Radiation Lot Acceptance Testing (RLAT). Five biased and five unbiased devices are tested in accordance with condition A, of method 1019 of MIL-STD-883 to 100 krad(Si). 0.9000/90% statistics are applied to the device parameters as specifed in table IA herein. 4.3.5.2.2 Technologies not tested. All active components in these devices are RHA tested. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38534. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractorprepared specification or drawing. 6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated as specified in MIL-PRF38534. 6.4 Record of users. Military and industrial users shall inform DLA Land and Maritime -VA when a system application requires configuration control and the applicable SMD. DLA Land and Maritime -VA will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic devices (FSC 5962) should contact DLA Land and Maritime -VA, telephone (614) 692-8108. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-10213 A REVISION LEVEL B SHEET 19 6.5 Comments. Comments on this drawing should be directed to DLA Land and Maritime -VA, Columbus, Ohio 43218-3990, or telephone (614) 692-1081. 6.6 Sources of supply. Sources of supply are listed in MIL-HDBK-103 and QML-38534. The vendors listed in MIL-HDBK-103 and QML-38534 have submitted a certificate of compliance (see 3.7 herein) to DLA Land and Maritime -VA and have agreed to this drawing. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-10213 A REVISION LEVEL B SHEET 20 STANDARD MICROCIRCUIT DRAWING BULLETIN DATE: 14-05-01 Approved sources of supply for SMD 5962-10213 are listed below for immediate acquisition information only and shall be added to MIL-HDBK-103 and QML-38534 during the next revisions. MIL-HDBK-103 and QML-38534 will be revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate of compliance has been submitted to and accepted by DLA Land and Maritime -VA. This information bulletin is superseded by the next dated revisions of MIL-HDBK-103 and QML-38534. DLA Land and Maritime maintains an online database of all current sources of supply at http://www.landandmaritime.dla.mil/Programs/Smcr/. Standard microcircuit drawing PIN 1/ Vendor CAGE number Vendor similar PIN 2/ 5962-1021301KUA 5962R1021301KUA 5962-1021301KUC 5962R1021301KUC 5962-1021301KZA 5962R1021301KZA 5962-1021301KZC 5962R1021301KZC 5962-1021301KMC 5962R1021301KMC 88379 88379 88379 88379 88379 88379 88379 88379 88379 88379 VRG8653-201-2S VRG8653-901-2S VRG8653-201-1S VRG8653-901-1S VRG8654-201-2S VRG8654-901-2S VRG8654-201-1S VRG8654-901-1S VRG8654-202-1S VRG8654-902-1S 5962-1021302KUA 5962R1021302KUA 5962-1021302KUC 5962R1021302KUC 5962-1021302KZA 5962R1021302KZA 5962-1021302KZC 5962R1021302KZC 5962-1021302KMC 5962R1021302KMC 88379 88379 88379 88379 88379 88379 88379 88379 88379 88379 VRG8687-201-2S VRG8687-901-2S VRG8687-201-1S VRG8687-901-1S VRG8688-201-2S VRG8688-901-2S VRG8688-201-1S VRG8688-901-1S VRG8688-202-1S VRG8688-902-1S 1/ The lead finish shown for each PIN representing a hermetic package is the most readily available from the manufacturer listed for that part. If the desired lead finish is not listed contact the Vendor to determine its availability. 2/ Caution. Do not use this number for item acquisition. Items acquired to this number may not satisfy the performance requirements of this drawing. Vendor CAGE number 88379 Vendor name and address Aeroflex Plainview Incorporated (Aeroflex Microelectronic Solutions) 35 South Service Road Plainview, NY 11803 The information contained herein is disseminated for convenience only and the Government assumes no liability whatsoever for any inaccuracies in the information bulletin.