5962-10213

REVISIONS
LTR
DESCRIPTION
DATE (YR-MO-DA)
APPROVED
A
Added case outline M. -sld
13-05-01
Charles F. Saffle
B
Table IA: Made corrections to the Dropout voltage and Ripple
rejection tests, for both the positive and negative regulators, and the
test Minimum input voltage for the negative regulator. Table II:
Corrected the subgroups throughout. Updated tables IIIA and IIIB.
Editorial changes throughout. -sld
14-05-01
Charles F. Saffle
REV
SHEET
REV
B
B
B
B
B
B
SHEET
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16
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18
19
20
REV STATUS
OF SHEETS
PMIC N/A
STANDARD MICROCIRCUIT
DRAWING
THIS DRAWING IS
AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
AMSC N/A
REV
B
B
B
B
B
B
B
B
B
B
B
B
B
B
SHEET
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PREPARED BY
Steve L. Duncan
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
http://www.landandmaritime.dla.mil/
CHECKED BY
Greg Cecil
APPROVED BY
Charles F. Saffle
DRAWING APPROVAL DATE
MICROCIRCUIT, HYBRID, DUAL VOLTAGE
REGULATOR, 3 AMP, POSITIVE AND
NEGATIVE, LOW DROPOUT, ADJUSTABLE
12-11-13
REVISION LEVEL
B
SIZE
A
SHEET
DSCC FORM 2233
APR 97
CAGE CODE
67268
1
OF
5962-10213
20
5962-E283-14
1. SCOPE
1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A
choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When
available, a choice of radiation hardness assurance levels are reflected in the PIN.
1.2 PIN. The PIN shall be as shown in the following example:
5962



Federal
stock class
designator
\
R



RHA
designator
(see 1.2.1)
\/
Drawing number
10213
/
01



Device
type
(see 1.2.2)
K



Device
class
designator
(see 1.2.3)
M



Case
outline
(see 1.2.4)
C



Lead
finish
(see 1.2.5)
1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA
levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
1.2.2 Device type(s). The device type(s) identify the circuit function as follows:
Device type
Generic number
01
8653, 8654
02
8687, 8688
Circuit function
Dual voltage regulator, 3 amp, positive and negative, low
dropout, adjustable
Dual voltage regulator, 3 amp, positive, low dropout
adjustable
1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level.
All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K,
and E) or QML Listing (Class G and D). The product assurance levels are as follows:
Device class
Device performance documentation
K
Highest reliability class available. This level is intended for use in space
applications.
H
Standard military quality class level. This level is intended for use in applications
where non-space high reliability devices are required.
G
Reduced testing version of the standard military quality class. This level uses the
Class H screening and In-Process Inspections with a possible limited temperature
range, manufacturer specified incoming flow, and the manufacturer guarantees (but
may not test) periodic and conformance inspections (Group A, B, C and D).
E
Designates devices which are based upon one of the other classes (K, H, or G)
with exception(s) taken to the requirements of that class. These exception(s) must
be specified in the device acquisition document; therefore the acquisition document
should be reviewed to ensure that the exception(s) taken will not adversely affect
system performance.
D
Manufacturer specified quality class. Quality level is defined by the manufacturers
internal, QML certified flow. This product may have a limited temperature range.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-10213
A
REVISION LEVEL
B
SHEET
2
1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:
Outline letter
M
U
Z
Descriptive designator
See figure 1
See figure 1
See figure 1
Terminals
Package style
8
8
8
Surface Mount with unformed leads
Thru-hole
Surface Mount
1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534.
1.3 Absolute maximum ratings. 1/
Input voltage:
Positive regulator....................................................................
Negative regulator ..................................................................
Input-Output differential voltage:
Positive regulator....................................................................
Negative regulator ..................................................................
Output voltage:
Positive regulator....................................................................
Negative regulator ..................................................................
Output current:
Positive regulator....................................................................
Negative regulator ..................................................................
Junction temperature (TJ) ..........................................................
Power Dissipation (PD)...............................................................
Thermal resistance, junction-to-case (θJC) each regulator .........
Lead temperature (soldering, 10 seconds) ................................
Storage temperature range ........................................................
+25 V
-35 V
25 V
30 V
+25 V
-30 V
6A
-4,5 A
+150°C
See table IB herein
5°C/W
300°C
-65°C to +150°C
1.4 Recommended operating conditions.
Output voltage range:
Postive voltage regulator .......................................................
Negative voltage regulator......................................................
Input- Output differential range:
Positive regulator....................................................................
Negative regulator ..................................................................
Output current:
Positive regulator....................................................................
Neagtive regulator ..................................................................
Case operating temperature range (TC) ......................................
+1.25 V to +23 V dc
-2.37 V to -25 V dc
+1.8 V to +24 V
-1.05 V to -29 V
3 A maximum
3 A maximum
-55°C to +125°C
1.5 Radiation features.
Maximum total dose available (dose rate = 50 - 300 rad(Si)/s)
100 krad(Si) 2/ 3/ 4/
________
1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
2/ Bipolar device types may degrade from displacement damage from radiation which could affect RHA levels. These device
types have not been characterized for displacement damage.
3/ These parts may be dose rate sensitive in a space enviroment and may demonstrate enhanced low dose rate effects.
Radiation end-point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883,
method 1019, condition A. Dose rate shall be in accordance with MIL-STD-883, method 1019, condition A.
4/ The active elements that make up the device on this drawing have been tested for Total Ionizing Dose (TID) in accordance
with MIL-STD-883 test method 1019 condition A. RHA testing of the active elements covered on this SMD are tested in
alternate packages (TO3) and (TO39), not the packages as specified in paragraph 1.2.4.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-10213
A
REVISION LEVEL
B
SHEET
3
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATIONS
MIL-PRF-38534 - Hybrid Microcircuits, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 - Test Method Standard Microcircuits.
MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.
MIL-HDBK-103 - List of Standard Microcircuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Copies of these documents are available online at http://quicksearch.dla.mil or from the Standardization Document Order
Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in
accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as
designated in the device manufacturer's Quality Management (QM) plan or as designated for the applicable device class. The
manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as
defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not
affect the form, fit, or function of the device for the applicable device class.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38534 and herein.
3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2.
3.2.3 Block diagram. The block diagram shall be as specified on figure 3.
3.2.4 Radiation exposure circuits. The radiation exposure circuits shall be maintained by the manufacturer under document
revision level control and shall be made available to the preparing and acquiring activity upon request.
3.2.5 Maximum power dissipation verses case temperature table. The maximum power dissipation verses case temperature
is specified in table IB.
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are
as specified in table IA and shall apply over the full specified operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are defined in table IA.
3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with
the PIN listed in 1.2 herein. In addition, the manufacturer's vendor similar PIN may also be marked.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-10213
A
REVISION LEVEL
B
SHEET
4
3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described
herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample,
for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those
which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be
made available to the preparing activity (DLA Land and Maritime -VA) upon request.
3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this
drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime -VA shall affirm that the
manufacturer's product meets the performance requirements of MIL-PRF-38534 and herein.
3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of
microcircuits delivered to this drawing.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-10213
A
REVISION LEVEL
B
SHEET
5
TABLE IA. Electrical performance characteristics.
Test
Symbol
Conditions 1/
-55°C ≤ TC ≤+125°C
P ≤ PMAX
unless otherwise specified
Group A
subgroups
Device
types
1.5 V ≤ (VIN - VOUT) ≤ 15 V,
ILOAD = 10 mA
1,2,3
01,02
Limits
Unit
Min
Max
1.210
1.275
V
POSITIVE REGULATOR
Reference voltage 2/
VREF
Line regulation 2/ 3/
ΔVOUT
ΔVIN
1.5 V ≤ (VIN - VOUT) ≤ 15 V,
ILOAD = 10 mA
1,2,3
01,02
0.25
%
Load regulation 2/ 3/
ΔVOUT
ΔIOUT
10 mA ≤ IOUT ≤ 3.0 A, (VIN - VOUT)
=3V
4,5,6
01,02
0.35
%
30 ms pulse, TC = +25°C
4
01,02
0.04
%/W
Thermal regulation
Dropout voltage
VDROP
∆VREF = 1%, IOUT = 3.0 A
1,2,3
01,02
1.4
V
Dropout voltage 2/ 4/
VDROP1
∆VREF = 1%, IOUT = 5.0 A
1,2,3
01,02
1.8
V
IOUT = 0.5 A, (VIN - VOUT) = 3 V,
f = 120 Hz, CADJ = COUT = 25 µF
1,2,3
01,02
1,2,3
01,02
120
µA
Ripple rejection
60
dB
Adjustment pin current 2/
IADJ
Adjustment pin current
change 2/
∆IADJ
10 mA ≤ IOUT ≤ 3.0 A,
1.5 V ≤ (VIN - VOUT) ≤ 15 V
1,2,3
01,02
5
µA
Minimum load current
2/ 4/
IMIN
(VIN - VOUT) = 25V
1,2,3
01,02
10
mA
Current limit 2/
ICL
(VIN - VOUT) = 5 V
4
01,02
5.25
Reference voltage 2/
VREF
VIN - VOUT = -1.2 V to -28 V,
1 mA ≤ IOUT ≤ 3 A, VOUT = -5 V
1,2,3
01
-2.29
Dropout Voltage 2/
VDROP
IOUT = 0.5 A, VOUT = -5 V
1,2,3
01
A
NEGATIVE REGULATOR
IOUT = 3 A, VOUT = -5 V
Ripple rejection
-2.45
V
0.425
V
1.05
IOUT = 0.5 A, (VIN - VOUT) = 3 V,
f = 120 Hz, CADJ = COUT = 25 µF
1,2,3
01
60
dB
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-10213
A
REVISION LEVEL
B
SHEET
6
TABLE IA. Electrical performance characteristics - Continued.
Test
Symbol
Conditions 1/
-55°C ≤ TC ≤+125°C
P ≤ PMAX
unless otherwise specified
Group A
subgroups
Device
types
Limits
Min
Unit
Max
NEGATIVE REGULATOR - CONTINUED
Line regulation 2/ 3/
ΔVOUT
ΔVIN
1 V ≤ (VIN - VOUT) ≤ 20 V,
VOUT = -5 V
1,2,3
01
0.02
%/V
Load regulation 2/ 3/
ΔVOUT
ΔIOUT
5 mA ≤ IOUT ≤ 3 A, (VIN - VOUT) =
-1.5 V to -10 V, VOUT = -5 V
4,5,6
01
0.8
%
1,2,3
01
-4.5
V
4
01
3.3
4.55
A
(VIN - VOUT) =-15 V,
TC = +25°C
2.0
4.5
(VIN - VOUT) = -20 V,
TC = +25°
1.0
3.1
2.7
3.7
0.9
1.6
Minimum input voltage 2/
VIN MIN
IOUT = 3 A, VOUT = VREF
Internal current limit 2/
IMAX
-1.5 V ≤ (VIN - VOUT) ≤ -10 V,
TC = +25°C
External current limit 2/
ILIM
4,5,6
RLIM = 5 kΩ
01
RLIM = 15 kΩ
A
Quiescent supply current
2/
IQ
IOUT = 5 mA, VOUT = VREF,
(-4 V ≤ VIN ≤ -25 V)
1,2,3
01
3.5
mA
Supply current change
with load 2/
IQ∆
(VIN - VOUT) = .25 V +(.25Ω x IOUT)
1,2,3
01
35
mA/A
21
(VIN - VOUT) ≥ -2 V
1/
2/
3/
4/
These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects.
Radiation end-point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883,
method 1019, condition A.
The active elements that make up this device have been tested to RHA designator level "R" (100 krad(Si)) of Method
1019, condition A of MIL-STD-883 at +25°C for these parameters and limits. RHA testing of the active elements covered
on this SMD were done in alternate packages (TO3) and (TO39), not the packages as specified in paragraph 1.2.4.
Regulation is measured at a constant junction temperature, using pulse testing with a low duty cycle. Changes in
output voltage due to heating effects are covered under the specification for thermal regulation. Measurements taken at
the output lead must be adjusted for lead resistance.
Not production tested. Shall be guaranteed by design, characterization, or correlation to other tested parameters.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-10213
A
REVISION LEVEL
B
SHEET
7
Table IB. Maximum power dissipation verses case temperature table.
Case
Temperature
(°C)
0
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
105
110
115
120
125
130
135
140
145
150
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
Maximum power dissipation
(Watts)
One regulator
"ON"
30
29
28
27
26
25
24
23
22
21
20
19
18
17
16
15
14
13
12
11
10
9
8
7
6
5
4
3
2
1
0
Both regulators
"ON"
56
54
52
50
48
47
45
43
41
39
37
35
34
32
30
28
26
24
22
20
19
17
15
13
11
9
7
6
4
2
0
SIZE
5962-10213
A
REVISION LEVEL
B
SHEET
8
Case M
FIGURE 1. Case outline(s).
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-10213
A
REVISION LEVEL
B
SHEET
9
Case M - Continued.
Inches
Symbol
Min
A
Millimeters
Max
Min
.220
Max
5.59
∅b
.028
.032
0.71
0.81
∅b3
.085
.095
2.12
2.41
D
.750
.760
19.05
19.30
D1
.510
.520
12.95
13.21
e
.100 BSC
2.54 BSC
e1
.300 BSC
7.62 BSC
e2
.108 BSC
2.74 BSC
E
.410
.420
10.41
10.67
F
.035
.045
0.90
1.14
G1
.632 BSC
G2
.2025
L
.400
∅p
.140
.2125
16.05 BSC
5.144
5.408
10.16
.150
3.56
3.81
Q
.122 TYP
3.10 TYP
R
.065 TYP
1.65 TYP
S1
.028
0.71
NOTES:
1. The U.S. preferred system of measurement is the metric SI. This item was designed using inch-pound units of
measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound
units shall rule.
2. The package contains a BeO substrate.
3. The case is electrically isolated.
FIGURE 1. Case outline(s) - Continued.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-10213
A
REVISION LEVEL
B
SHEET
10
Case U
FIGURE 1. Case outline(s) - Continued.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-10213
A
REVISION LEVEL
B
SHEET
11
Case U - Continued.
Inches
Symbol
Min
A
Millimeters
Max
Min
.220
Max
5.59
∅b
.028
.032
0.71
0.81
∅b3
.085
.095
2.12
2.41
D
.750
.760
19.05
19.30
D1
.510
.520
12.95
13.21
e
.100 BSC
2.54 BSC
e1
.300 BSC
7.62 BSC
e2
.108 BSC
2.74 BSC
eA
.700
.740
17.78
18.80
E
.410
.420
10.41
10.67
F
.035
.045
0.90
1.14
G1
.632 BSC
G2
.2025
L1
.230
L2
.2125
16.05 BSC
5.144
5.84
.150 REF
.140
∅p
5.408
3.81 REF
.150
3.56
3.81
Q
.122 TYP
3.10 TYP
R
.065 TYP
1.65 TYP
S1
.028
0.71
NOTES:
1. The U.S. preferred system of measurement is the metric SI. This item was designed using inch-pound units of
measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound
units shall rule.
2. The package contains a BeO substrate.
3. The case is electrically isolated.
FIGURE 1. Case outline(s) - Continued.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-10213
A
REVISION LEVEL
B
SHEET
12
Case Z
FIGURE 1. Case outlines(s) - Continued.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-10213
A
REVISION LEVEL
B
SHEET
13
Case Z - Continued.
Inches
Symbol
Min
A
Millimeters
Max
Min
.220
Max
5.59
A1
.015
.025
0.38
0.64
∅b
.028
.032
0.71
0.81
∅b3
.085
.095
2.12
2.41
D
.750
.760
19.05
19.30
D1
.510
.520
12.95
13.21
e
.100 BSC
2.54 BSC
e1
.300 BSC
7.62 BSC
e2
.108 BSC
2.74 BSC
E
.410
.420
10.41
10.67
F
.035
.045
0.90
1.14
G1
.632 BSC
16.05 BSC
G2
.2025
.2125
5.144
5.408
H
.866
.906
22.00
23.01
L1
.055
.065
1.40
1.65
L2
.150 REF
.140
∅p
3.81 REF
.150
3.56
3.81
Q
.122 TYP
3.10 TYP
R
.065 TYP
1.65 TYP
S1
.028
0.71
NOTES:
1. The U.S. preferred system of measurement is the metric SI. This item was designed using inch-pound units of
measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound
units shall rule.
2. The package contains a BeO substrate.
3. The case is electrically isolated.
FIGURE 1. Case outline(s) - Continued.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-10213
A
REVISION LEVEL
B
SHEET
14
Device types
Case outlines
Terminal number
01
02
M, U and Z
Terminal symbol
Terminal symbol
POS_ ADJ_1
NEG_REF_2
NEG_VOUT_2
NEG_VIN_2
NEG_GND_2
NEG_FB_2
POS_VOUT_1
POS_VIN_1
1
2
3
4
5
6
7
8
ADJ_1
VOUT_1
SENSE_1
VIN_2
ADJ_2
VOUT_2
SENSE_2
VIN_1
FIGURE 2. Terminal connections.
FIGURE 3. Block diagram.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-10213
A
REVISION LEVEL
B
SHEET
15
FIGURE 3. Block diagram - Continued.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-10213
A
REVISION LEVEL
B
SHEET
16
TABLE II. Electrical test requirements.
MIL-PRF-38534 test requirements
Subgroups
(in accordance with
MIL-PRF-38534, group A
test table)
Interim electrical parameters
1,2,3,4,5,6
Final electrical parameters
1*,2,3,4,5,6
Group A test requirements
1,2,3,4,5,6
Group C end-point electrical
parameters
1,2,3,4,5,6
End-point electrical parameters
for Radiation Hardness Assurance
(RHA) devices
1
* PDA applies to subgroup 1.
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as
modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form,
fit, or function as described herein.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply:
a.
b.
Burn-in test, method 1015 of MIL-STD-883.
(1)
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to either DLA Land and Maritime -VA or the acquiring activity upon request.
Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance
with the intent specified in method 1015 of MIL-STD-883.
(2)
TA as specified in accordance with table I of method 1015 of MIL-STD-883.
Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter
tests prior to burn-in are optional at the discretion of the manufacturer.
4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance
with MIL-PRF-38534 and as specified herein.
4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF-38534 and as follows:
a.
Tests shall be as specified in table II herein.
b.
Subgroups 7, 8A, 8B, 9, 10, and 11 shall be omitted.
4.3.2 Group B inspection (PI). Group B inspection shall be in accordance with MIL-PRF-38534.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-10213
A
REVISION LEVEL
B
SHEET
17
4.3.3 Group C inspection (PI). Group C inspection shall be in accordance with MIL-PRF-38534 and as follows:
a.
End-point electrical parameters shall be as specified in table II herein.
b.
Steady-state life test, method 1005 of MIL-STD-883.
(1)
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to either DLA Land and Maritime -VA or the acquiring activity upon request.
Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance
with the intent specified in method 1005 of MIL-STD-883.
(2)
TA as specified in accordance with table I of method 1005 of MIL-STD-883.
(3)
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
4.3.4 Group D inspection (PI). Group D inspection shall be in accordance with MIL-PRF-38534.
4.3.5. Radiation hardness assurance (RHA). RHA qualification is required only for those devices with the RHA designator as
specified herein. See table IIIA and table IIIB.
Table IIIA. Radiation Hardness Assurance Method Table.
RHA
method
Employed
Total Dose Testing
Worst Case Analysis Performed
RHA level "R"
(100 krad)
Element
Hybrid
Includes
Combines
Combines End-of-life
level
device level temperature temperature and total dose
effects
radiation effects
and
displacement
effects
Tested at
(100 krad)
Tested at
(100 krad)
See
4.3.5.1.1.2
No
No
No
No
End point electricals after
total dose
Element level
Hybrid device
level
TC = +25°C
TC = +25°C
Table IIIB. Hybrid level and element level test table.
Low Dose
Rate
(LDR)
Hybrid
Element
Bipolar, linear or
mixed signal > 90
nm
Total Dose
High Dose Rate
(HDR)
Not
tested
Tested at
(100 krad)
See 4.3.5.1.1.2
Not
tested
Not
tested
Not
tested
Not
tested
Not
tested
Not
tested
Not
tested
Not
tested
Tested at
(100 krad)
Not
tested
Not
tested
Not
tested
Not
tested
Not
tested
Not
tested
Not
tested
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
ELDRS
Radiation Test
Heavy Ion
Proton
Neutron
SEU
SEL
Low
High
SEE Displacement
(upset) (latch-up) Energy Energy (upset) Damage (DD)
SIZE
5962-10213
A
REVISION LEVEL
B
SHEET
18
4.3.5.1 Radiation Hardness Assurance (RHA) inspection. RHA qualification is required for those devices with the RHA
designator as specified herein. End-point electrical parameters for radiation hardness assurance (RHA) devices shall be
specified in table II. Radiation testing will be in accordance with the qualifying activity (DLA Land and Maritime -VQ) approved
plan and with MIL-PRF-38534, Appendix G.
a.
The hybrid device manufacturer shall establish procedures controlling component radiation testing, and shall establish
radiation test plans used to implement component lot qualification during procurement. Test plans and test reports
shall be filed and controlled in accordance with the manufacturer's configuration management system.
b.
The hybrid device manufacturer shall designate a RHA program manager to oversee component lot qualification, and
to monitor design changes for continued compliance to RHA requirements.
4.3.5.1.1 Hybrid level qualification.
4.3.5.1.1.2 Total ionizing dose irradiation testing. Hybrid level and element level testing are the same for the devices on
this SMD since the active elements are independent of each other and accessible to the device leads for test. The qualification
was performed on the active elements, independent of the hybrid.
4.3.5.1.2 Element level qualification.
4.3.5.1.2.1 Total Ionizing dose irradiation testing. A minimum of ten samples of each element is tested at initial qualification
and after any design or process changes which may affect the RHA response of the device type. Five biased and five
unbiased are tested at High Dose Rate (HDR) in accordance with condition A of method 1019 of MIL-STD-883 to 100 krad(Si).
0.9000/90% statistics are applied to the device parameters as specified in table IA herein.
4.3.5.2 RHA Lot Acceptance. Each lot of active elements shall be evaluated for acceptance in accordance with MIL-PRF38534 and herein.
4.3.5.2.1 Total Ionizing Dose. Samples from every wafer lot will be assembled into packages (TO3) or (TO39) and tested for
wafer lot acceptance Radiation Lot Acceptance Testing (RLAT). Five biased and five unbiased devices are tested in
accordance with condition A, of method 1019 of MIL-STD-883 to 100 krad(Si). 0.9000/90% statistics are applied to the device
parameters as specifed in table IA herein.
4.3.5.2.2 Technologies not tested. All active components in these devices are RHA tested.
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38534.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
(original equipment), design applications, and logistics purposes.
6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractorprepared specification or drawing.
6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated as specified in MIL-PRF38534.
6.4 Record of users. Military and industrial users shall inform DLA Land and Maritime -VA when a system application
requires configuration control and the applicable SMD. DLA Land and Maritime -VA will maintain a record of users and this list
will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic devices
(FSC 5962) should contact DLA Land and Maritime -VA, telephone (614) 692-8108.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-10213
A
REVISION LEVEL
B
SHEET
19
6.5 Comments. Comments on this drawing should be directed to DLA Land and Maritime -VA, Columbus, Ohio 43218-3990,
or telephone (614) 692-1081.
6.6 Sources of supply. Sources of supply are listed in MIL-HDBK-103 and QML-38534. The vendors listed in MIL-HDBK-103
and QML-38534 have submitted a certificate of compliance (see 3.7 herein) to DLA Land and Maritime -VA and have agreed to
this drawing.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-10213
A
REVISION LEVEL
B
SHEET
20
STANDARD MICROCIRCUIT DRAWING BULLETIN
DATE: 14-05-01
Approved sources of supply for SMD 5962-10213 are listed below for immediate acquisition information only and
shall be added to MIL-HDBK-103 and QML-38534 during the next revisions. MIL-HDBK-103 and QML-38534 will be
revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a
certificate of compliance has been submitted to and accepted by DLA Land and Maritime -VA. This information
bulletin is superseded by the next dated revisions of MIL-HDBK-103 and QML-38534. DLA Land and Maritime
maintains an online database of all current sources of supply at http://www.landandmaritime.dla.mil/Programs/Smcr/.
Standard
microcircuit drawing
PIN 1/
Vendor
CAGE
number
Vendor
similar
PIN 2/
5962-1021301KUA
5962R1021301KUA
5962-1021301KUC
5962R1021301KUC
5962-1021301KZA
5962R1021301KZA
5962-1021301KZC
5962R1021301KZC
5962-1021301KMC
5962R1021301KMC
88379
88379
88379
88379
88379
88379
88379
88379
88379
88379
VRG8653-201-2S
VRG8653-901-2S
VRG8653-201-1S
VRG8653-901-1S
VRG8654-201-2S
VRG8654-901-2S
VRG8654-201-1S
VRG8654-901-1S
VRG8654-202-1S
VRG8654-902-1S
5962-1021302KUA
5962R1021302KUA
5962-1021302KUC
5962R1021302KUC
5962-1021302KZA
5962R1021302KZA
5962-1021302KZC
5962R1021302KZC
5962-1021302KMC
5962R1021302KMC
88379
88379
88379
88379
88379
88379
88379
88379
88379
88379
VRG8687-201-2S
VRG8687-901-2S
VRG8687-201-1S
VRG8687-901-1S
VRG8688-201-2S
VRG8688-901-2S
VRG8688-201-1S
VRG8688-901-1S
VRG8688-202-1S
VRG8688-902-1S
1/ The lead finish shown for each PIN representing
a hermetic package is the most readily available
from the manufacturer listed for that part. If the
desired lead finish is not listed contact the Vendor
to determine its availability.
2/ Caution. Do not use this number for item
acquisition. Items acquired to this number may not
satisfy the performance requirements of this drawing.
Vendor CAGE
number
88379
Vendor name
and address
Aeroflex Plainview Incorporated
(Aeroflex Microelectronic Solutions)
35 South Service Road
Plainview, NY 11803
The information contained herein is disseminated for convenience only and the
Government assumes no liability whatsoever for any inaccuracies in the
information bulletin.