Test Report 018 Single Event Effects (SEE) Testing of the ISL72027SEH CAN Transceiver Introduction The intense proton and heavy ion environment encountered in space applications can cause a variety of Single Event Effects (SEE) in electronic circuitry, including Single Event Upset (SEU), Single Event Transient (SET), Single Event Functional Interrupt (SEFI), Single Event Gate Rupture (SEGR) and Single Event Burnout (SEB). SEE can lead to system-level performance issues including disruption, degradation and destruction. For predictable and reliable space system operation, individual electronic components should be characterized to determine their SEE response. This report discusses the results of SEE testing performed on the ISL72027SEH CAN transceiver. Product Description The ISL72026SEH, ISL72027SEH and ISL72028SEH are a family of radiation tolerant Controller Area Network (CAN) bus transceivers. These parts are designed to meet ISO11898-2 physical layer specifications. They are fabricated in Intersil's proprietary BCD SOI process with deep trench isolation. The ISL7202xSEH parts are bond options of the same silicon die. Further description and explanation of the differences between the parts can be found in the datasheets. Product Documentation • ISL72026SEH datasheet • ISL72027SEH datasheet • ISL72028SEH datasheet • Standard Microcircuit Drawing (SMD): 5962-15228 SEE Test Objectives The ISL72027SEH was tested to determine its susceptibility to destructive single event effects (collectively referred to as SEB) and to characterize its Single Event Transient (SET) behavior over various operating conditions. Since the family of parts utilizes the same silicon with only bond-out options, it was determined that testing the ISL72027SEH would serve to characterize all three parts. More description of the part differences follows in the next two paragraphs. Thereafter the report will refer only to the ISL72027SEH with the understanding that the results apply equally to the other two members of the family, the ISL72026SEH and ISL72028SEH. The ISL72026SEH and ISL72027SEH differ in that the Loopback (LBK) command input of the ISL72026SEH is not bonded out in the ISL72027SEH. Instead, VREF is bonded out in the ISL72027SEH. All other pins and functions are the same. Since the LBK has an internal pull-down, the LBK function is constantly deasserted in the ISL72027SEH, but the LBK circuitry is fully active and available to SEE events that June 1, 2016 TR018.1 1 could cause LBK to be momentarily asserted. On the other hand, the VREF circuitry is fully active in the ISL72026SEH, however, is simply not brought out to the outside world. Consequently, all that is lost in testing the ISL72027SEH rather than the ISL72026SEH is that the part is not tested while in the LBK mode. Since this is a diagnostic mode and is expected to be active only a very small fraction of the operational life, it does not seem to represent a statistically important mode for SEE events. The jeopardy is that an SET could momentarily take the part out of LBK, however, this would be an extremely unlikely event if LBK is not a dominant operational mode. The ISL72028SEH differs from the ISL72027SEH in that the RS pin when pulled to VCC can invoke a Low Power Shutdown (LPSD) mode rather than the Listen Mode (LM) of the ISL72027SEH. Both circuits are operational in both parts; it is just that a pin control is only effective according to the part type. So, if either the LM or LPSD can be activated by SEE, either circuit would be susceptible. What is lost in testing the ISL72027SEH is the event where an SET triggers the ISL72028SEH out of LPSD. Such an event would be of little interest to the operation of the system so it is not perceived as an important omission. SEE Test Facility Testing was performed at the Texas A&M University (TAMU) Radiation Effects Facility of the Cyclotron Institute heavy ion facility. This facility is coupled to a K500 superconducting cyclotron, which is capable of generating a wide range of particle beams with the various energy, flux and fluence levels needed for advanced radiation testing. The Devices Under Test (DUTs) were located in air at 40mm from the aramica window for the ion beam. The ion LET values are quoted at the DUT surface. Signals were communicated to and from the DUT test fixture through 20 foot cables connecting to the control room. Testing was carried out over four trips to TAMU, on November 7th and 8th of 2014, December 1st of 2014, March 18th of 2015 and June 2nd of 2015. SEE Test Set-Up SEE testing was carried out with the samples in an active configuration. The schematic of the ISL72027SEH SEE test fixture used in 2015 is shown in Figure 1. This schematic shows direct access to the CANH/CANL bus pins for monitoring and indirect access through 30Ω resistors for biasing. These resistor feeds were not there in the 2014 testing so that bus bias and monitor were done through the same lines. The cabling connected to the CANH/CANL pins present 700pF to GND due to the 20 foot cable connecting the DUT to the oscilloscopes in the control room for SET testing. Other supplies and signals indicated by arrows were also cabled to the control room. CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. 1-888-INTERSIL or 1-888-468-3774 | Copyright Intersil Americas LLC 2015, 2016. All Rights Reserved Intersil (and design) is a trademark owned by Intersil Corporation or one of its subsidiaries. All other trademarks mentioned are the property of their respective owners. Test Report 018 Two instantiations of the schematic on a single board allowed two ISL72027SEH to be simultaneously irradiated for SEE testing. The two parts were monitored separately. Parts were packaged in the flatpack and had their lids removed for the SEE testing. For SEB, the parts' key currents and VREF voltage were monitored before and after irradiation to determine if any change had been induced. For SET testing, the outputs of the CAN bus (CANH and CANL) and the received signal, R, were monitored. In static SET testing any change in R triggered an oscilloscope capture. In dynamic SET testing the bus and receiver were monitored for changes in the bit stream resulting from the provided input signal. For dynamic inputs, if the received bit stream, R, deviated from its nominal duty cycle (nominally 50%, triggered at either ±10% from there) an oscilloscope capture was triggered and the event was stored for later review. The parts tested in 2014 came from lot J66594.1 (part # B2330-X18). The parts tested were all modified in metal by Focused Ion Beam (FIB) techniques to correct two problems seen on these first parts: • Receiver transition glitches • Low CANH/CANL breakdowns These changes are metal fixes instituted in the final product so the FIB modified units accurately represent the final product. The parts tested in 2015 came from lot J66594.2 (part # B2330-X28) and had the metal changes incorporated in manufacture that were previously done by FIB. The latter parts are the production product. RS 30O CANH 50kO 330O 1 D D RS 8 30O 1nF 2 PGND 22µF 0.1µF VCC GND CANH 7 ISL72027SEH 3 VCC 30O 50pF CANL K1 6 330O 325O VR 4 15pF R VREF 5 47nF K2 30O CANL R SGND K2 CONTROL K1 CONTROL VCM Note: The VREF can be monitored at the external connection VCM when K2 is closed and K1 is open FIGURE 1. Schematic of the ISL72027SEH see test configuration used in 2015. Connection to CANH/CANL through resistors allows setting BUS voltage while direct connections allow monitoring bus voltage at the unit. Submit Document Feedback 2 TR018.1 June 1, 2016 Test Report 018 March 2015 SEB Testing of the ISL72027SEH CAN Transceiver with a similar set done with common-mode voltages of ±17V before moving on to the ±18V set reported here. The device case temperature was heated to +125°C ±10°C for the irradiations with a thin film heater mounted on the board. The heater setting was calibrated with a thermocouple on the case at the Intersil lab before traveling to TAMU. At TAMU the heater was set to the predetermined setting to yield the +125°C case temperature. At the end of the six irradiations outlined in Table 2 the monitor parameter measurements of Table 1 were repeated to check for changes. Four units of the ISL72027SEH were irradiated for the purposes of destructive SEE (SEB) testing. Four currents and the VREF output voltage were monitored as in Table 1 on page 4 to determine if permanent change was induced during irradiations. After initial measurements according to Table 1, a set of six irradiations was performed as listed in Table 2 on page 4. Each irradiation was done with 2.114GeV Pr (praseodymium) at 10° incidence for a surface LET = 60MeV•cm2/mg to a fluence of 5x106 ion/cm2 per irradiation at fluxes under 2.5x104 ion/(cm2*s). The ICC and ICM were measured before and after each irradiation to look for indications of damage in changes of those parameters. At the end of the set of six irradiations the parameters in Table 1 were again measured to look for any changes. Table 3 presents the log of the ICC and ICM measurements made for each irradiation run at the conditions described in Table 2. The same data is presented in Table 4 on page 5 as the percentage change in the measured currents. Changes of less than 5% were considered to be within measurement error and not interpreted as indicative of damage. Table 5 on page 5 presents the measurements of monitor parameters in Table 1 made both before and after the groupings of six irradiations. Table 6 on page 5 presents the monitor data of Table 5 as percentage change. Again changes of 5% or less are viewed as within measurement error. On the basis of these tests the part is found to be free of damaging SEE up to LET = 60MeV•cm2/mg (Pr at 10º incidence) and the conditions listed in Table 2. The 50kHz data signal allowed for the common-mode voltage to dominate the bus pins during the recessive periods but still exercised switching conditions. Figures 2 and 3 offer examples of the timing requiring the 50kHz input signal. The 47nF capacitor on VREF and the resistors in the VCM path were what set the time constant of the common-mode voltage. The complement of six irradiations accounted for 58krad of total dose when combined R 2V/DIV CANH 5V/DIV CANL 5V/DIV CANH - CANL 5V/DIV 5µs/DIV FIGURE 2. Example of CANH/CANL switching at 50kHz, VCC = 3.6V and a common-mode of -7V. Time allows recessive state to stabilize at -7V for the CANH/CANL lines. Time scale is 5µs/div, and the vertical axis is 2V/div for the upper plot and 5V/div for the lower three plots. R 2V/DIV CANH 5V/DIV CANL 5V/DIV CANH - CANL 5V/DIV 5µs/DIV FIGURE 3. Example of CANH/CANL switching at 50kHz, VCC = 3.6V, and a common-mode of +12V. Time allows recessive state to stabilize at +12V for the CANH/CANL lines. Time scale is 5µs/div, and the vertical axis is 2V/div for the upper plot and 5V/div for the lower three plots. Submit Document Feedback 3 TR018.1 June 1, 2016 Test Report 018 TABLE 1. MONITOR MEASUREMENTS AND CONDITIONS FOR SEB DETECTION ELECTRICAL CONDITONS FOR MEASUREMENT MEASUREMENTS MADE RS (V) D VCC (V) VR (V) K1 K2 VCM (V) CANH CANL R ICM (µA) at VCM = -7V 0 4.5 3.6 OP CL OP -7 CH2 CH3 OP ICM (µA) at VCM = +12V 0 4.5 3.6 OP CL OP +12 CH2 CH3 OP VREF at VCM (V) 0 4.5 3.6 OP OP CL Meas. VREF CH2 CH3 OP ICC (mA) Dynamic Unloaded 0 0V to 4.5V 250kHz 3.6 OP OP OP OP CH2 CH3 OP ICC (mA) Dynamic Loaded Slow OP 0V to 4.5V 250kHz 3.6 1.7V CL CL OP CH2 CH3 OP Scope Capture Loaded Slow, 2µs/div OP 0V to 4.5V 250kHz, CH1 3.6 1.7V CL CL OP CH2 CH3 CH4 NOTE: OP = Open and CL = Closed. Measurements of these parameters were made at the start and end of the six SEB tests listed in Table 2. Oscilloscope channels are indicate by “CH”. TABLE 2. SEB TESTS RUN ON ISL72027 DURING THE MARCH 2015 TESTING RS (V) D VCC (V) K1 K2 VCM (V) Cold Spare -18VCM 0 0V to 4.5V 50kHz 0 CL CL -18 Cold Spare +18VCM 0 0V to 4.5V 50kHz 0 CL CL +18 Fast Op -18VCM 0 0V to 4.5V 50kHz 4.5 CL OP -18 Fast Op +18VCM 0 0V to 4.5V 50kHz 4.5 CL OP +18 Slow Op -18VCM OP 0V to 4.5V 50kHz 4.5 CL CL -18 Slow Op +18VCM OP 0V to 4.5V 50kHz 4.5 CL CL +18 TABLE 3. SUPPLY CURRENT MONITORS ICC AND ICM FOR EACH IRRADIATION WITH Pr AT 10°FOR LET of 60MeV•cm2/mg TO 5x106 ion/cm2 FOR EACH IRRADIATION. DUT1 IRRADIATION CONDITION VCC = 4.5V Cold Spare VCM = -18V Cold Spare VCM = +18V Fast Op VCM = +18VN Fast Op VCM = -18V Slow Op VCM = -18V Slow Op VCM= +18V ICC (mA) DUT2 ICM (mA) ICC (mA) DUT3 ICM (mA) ICC (mA) DUT4 ICM (mA) ICC (mA) ICM (mA) Pre 0.0076 0.0075 0.0075 0.0075 Post 0.0075 0.0073 0.0075 0.0075 Pre 0.0075 0.0077 0.0075 0.0075 Post 0.0075 0.0076 0.0074 0.0075 Pre 3.24 7.85 3.67 8.39 3.26 8.16 3.7 7.48 Post 3.25 7.83 3.65 8.40 3.246 8.22 3.69 7.49 Pre 13.01 9.26 14.53 10.37 14.17 10.43 13.26 9.10 Post 13.16 9.31 14.53 10.39 14.14 10.39 13.27 9.11 Pre 8.08 4.88 8.61 5.00 8.39 5.21 8.72 5.05 Post 8.08 4.89 8.61 5.01 8.4 5.22 8.72 5.05 Pre 3.36 51.07 3.71 52.35 3.48 52.60 3.76 54.00 Post 3.33 51.80 3.72 52.5 3.38 52.09 3.74 53.53 Submit Document Feedback 4 TR018.1 June 1, 2016 Test Report 018 TABLE 4. SUPPLY CURRENT MONITOR DELTAS (ICC AND ICM) FOR EACH IRRADIATION WITH Pr AT 10° FOR LET OF 60MeV•cm2/mg TO 5x106ion/cm2 FOR EACH IRRADIATION. DUT1 IRRADIATION CONDITION VCC = 4.5V ICC DELTA% DUT2 ICM DELTA% ICC DELTA% DUT3 ICM DELTA% ICC DELTA% DUT4 ICM DELTA% ICC DELTA% ICM DELTA% Cold Spare -18VCM -1 -3 0 0 Cold Spare +18VCM 0 -1 -1 0 Fast Op +18VCM 0 0 -1 0 0 1 0 0 Fast Op -18VCM 1 1 0 0 0 0 0 0 Slow Op -18VCM 0 0 0 0 0 0 0 0 Slow Op +18VCM -1 1 0 0 -3 -1 -1 -1 TABLE 5. PARAMETRIC MONITORS FOR EACH SET OF IRRADIATIONS DUT1 DUT2 DUT3 DUT4 ICM (µA) AT VCM = -7V ICM (µA) AT VCM = +12V VREF AT VCM (V) ICC (mA) UNLOADED FAST ICC (mA) LOADED SLOW Pre 608 652 1.773 4.11 24.10 Post 604 649 1.772 4.10 24.05 Pre 604 652 1.769 4.51 24.38 Post 600 649 1.768 4.51 24.45 Pre 598 645 1.773 4.11 24.90 Post 600 644 1.775 4.12 25.14 Pre 609 657 1.772 4.55 25.05 Post 611 656 1.774 4.54 25.11 NOTE: Refer to Table 2 on page 4. Irradiation was with Pr at 10° incidence for effective let of 60MeV•cm2/mg and each set of irradiations having a total of 3x107ion/cm2. TABLE 6. DELTAS OF PARAMETRIC MONITORS FOR EACH SET OF IRRADIATIONS ICM (µA) AT VCM = -7V (%) ICM (µA) AT VCM = +12V (%) VREF AT VCM (V%) ICC (mA) UNLOADED FAST (%) ICC (mA) LOADED SLOW (%) DUT1 -1 0 0 0 0 DUT2 -1 0 0 0 0 DUT3 0 0 0 0 1 DUT4 0 0 0 0 0 NOTE: Refer to Table 2 on page 4. Irradiation was with Pr at 10°incidence for effective let of 60MeV•cm2/mg and each set of irradiations having 3x107ion/cm2. Tables 5 and 6 present the collected data for the parameters of Table 1 across the irradiation sets. Again no change was noted that indicated permanent damage to the parts. It was deduced from the above testing that the ISL72027SEH was found to be free from destructive SEE effects from ions with effective LET of 60MeV•cm2/mg while biased at VCC = 4.5V and VCM = ±18V. Submit Document Feedback 5 TR018.1 June 1, 2016 Test Report 018 SET Testing of the ISL72027SEH CAN Transceiver at Ag (LET = 43MeV•cm2/mg) Testing for Single Event Transients (SET) was carried out using silver (Ag) at 1.634GeV for a surface LET = 43MeV•cm2/mg. Beam time constraints on the trip limited the testing to only two units. A summary of the conditions tested and the SET counts resulting appear in Table 7. Examples of the SET captured in the irradiation runs appear in Figures 4 through 7. There were stand-alone errant recessive bits of approximately 2µs duration at 43MeV•cm2/mg as well as spike recessive events seen in Figure 4. These occurred for the bus VOD biased externally at the receiver dominant threshold of 0.9V. The events in Figure 5 are errant dominant spikes occurring on the R output, either with or without concomitant disruption on the VOD signal. In these cases, the bus VOD was externally biased to 0.5V, the receiver recessive threshold. When disturbances on VOD were noted, the erroneous dominant spikes generally came in pairs as on the left side to Figure 5, following the ringing on VOD. The dynamic testing was done by providing a square wave input to the D pin (0V to 3V) and monitoring the response of the receiver R pin signal. When the transceiver was set to the slow slew rating of the transmitter, a frequency of 250kHz was used. When the transceiver was set for fast slewing of the transmitter a 500kHz signal was used, except in the two inadvertent cases of lines eleven and twelve of Table 7. Figures 6 and 7 present examples of the worst dynamic SET that were captured using silver. The two events represented in the top of Figure 6 have clear disturbances on VOD associated with the disruption of the bit stream on R. As with the static tests, these appear to be transmitter SET that are simply reflected in the receiver output. The bottom event in Figure 6 is not clearly associated with a VOD disturbance, however, it certainly occurs during a VOD transition and at the received bit edge. Again a transmitter SET seems to be indicated. For the high speed events in Figure 7, each SET on R is accompanied by what appears to be a precipitating SET on the VOD signal. Thus, these are all consistent with transmitter events and not receiver SET. TABLE 7. STATIC CAPTURES AND DYNAMIC SET CAPTURES DUT1 EVENTS DUT2 EVENTS DUT2 TOTAL EVENTS NET CROSS SECTION (cm2) VOD Dominant V THR 0.9V 18 14 32 8.0x10-6 VOD Recessive V THF 0.5V 42 51 93 2.3x10-5 Listen only, VOD Dominant V THR 1.05V 0 0 0 -- Listen only, VOD Recessive VTHF 0.65V 0 0 0 -- Transmit Slow 250kHz Open CM and VREF 9 14 23 5.8x10-6 Transmit Slow 250kHz Open CM 13 15 28 7.0x10-6 Transmit Slow 250kHz -7VCM and VREF 21 16 37 9.3x10-6 Transmit Slow 250kHz -7VCM 17 15 32 8.0x10-6 Transmit Slow 250kHz +12VCM and VREF 10 6 16 4.0x10-6 Transmit Slow 250kHz +12VCM 5 4 9 2.3x10-6 Transmit Slow 500kHz Open CM and VREF 83 87 170 4.3x10-5 Transmit Slow 500kHz Open CM 95 76 171 4.3x10-5 Transmit Fast 500kHz -7VCM and VREF 12 4 16 4.0x10-6 Transmit Fast 500kHz -7VCM 2 7 9 2.3x10-6 Transmit Fast 500kHz +12VCM and VREF 2 2 4 1.0x10-6 Transmit Fast 500kHz +12VCM 1 4 5 1.3x10-6 TEST CONDITIONS NOTE: Static captures were for any change of R state, while dynamic captures were taken for R duty cycle outside of 40% to 60%. The irradiations were with Ag at normal incidence for an LET = 43MeV•cm2/mg and the device at ambient temperature (~25ºC). A fluence of 2x106ions/cm2 was done for each irradiation. Submit Document Feedback 6 TR018.1 June 1, 2016 3.5 3.5 3.0 3.0 2.5 2.5 2.0 2.0 SIGNALS (V) SIGNALS (V) Test Report 018 1.5 1.0 1.5 1.0 0.5 0.5 0 0 -0.5 -0.5 -1 0 1 2 3 4 -1 0 1 2 3 4 TIME (µs) TIME (µs) FIGURE 4A. FIGURE 4B. 3.5 3.5 3.0 3.0 2.5 2.5 2.0 2.0 SIGNALS (V) SIGNALS (V) FIGURE 4. The left hand SET (Figure 4A) goes from dominant to recessive with no apparent SET on VOD (5/32 in 4x106 fluence). The case on the right (Figure 4B) shows recessive spikes along with a disturbance on VOD and accounted for 27/32 events captured in 4x106 fluence. 1.5 1.0 1.5 1.0 0.5 0.5 0 0 -0.5 -0.5 -1 0 1 2 TIME (µs) FIGURE 5A. 3 4 -1 0 1 2 3 4 TIME (µs) FIGURE 5B. FIGURE 5. The left hand SET (Figure 5A) shows dominant spikes in R along with an SET on VOD (17/93). In the right hand (Figure 5B) case a single dominant spike is unaccompanied by and discernable VOD SET (76/93). The fluence is 4x106. Submit Document Feedback 7 TR018.1 June 1, 2016 4 4 3 3 SIGNALS (V) SIGNALS (V) Test Report 018 2 1 0 -1 2 1 0 -20 -10 0 10 -1 20 -20 -10 TIME (µs) FIGURE 6A. TRANSMIT SLOW OPEN CM 0 TIME (µs) 10 20 FIGURE 6B. TRANSMIT SLOW OPEN CM AND VREF 4 SIGNALS (V) 3 2 1 0 -1 -20 -10 0 10 20 TIME (µs) FIGURE 6C. TRANSMIT SLOW -7VCM AND VREF FIGURE 6. The longest recessive event is in the upper left (Transmit Slow Open CM) and the longest dominant event is the upper right (transmit slow open CM and VREF). The bottom capture shows a glitch at the leading edge of a recessive bit (transmit slow -7VCM and VREF). Submit Document Feedback 8 TR018.1 June 1, 2016 4 4 3 3 SIGNALS (V) SIGNALS (V) Test Report 018 2 1 1 0 0 -1 2 -1 -5 0 TIME (µs) -5 5 0 TIME (µs) 5 FIGURE 7B. TRANSMIT FAST OPEN CM FIGURE 7A. TRANSMIT FAST -7VCM AND VREF 4 SIGNALS (V) 3 2 1 0 -1 -5 0 TIME (µs) 5 FIGURE 7C. TRANSMIT FAST -7VCM AND VREF FIGURE 7. The upper left (Figure 7A) shows the longest recessive time (Transmit Fast -7VCM and VREF), the upper right (Figure 7B) the longest dominant time (transmit fast open CM). The lower capture (Figure 7C) shows a dominant spike during a recessive bit (transmit fast -7VCM and VREF). The plot at upper right (Figure 7B) indicates that the transition speed was not actually set to the high speed setting. Submit Document Feedback 9 TR018.1 June 1, 2016 Test Report 018 SET Testing of the ISL72027SEH CAN Transceiver at Cu (LET = 20MeV•cm2/mg) Since SET occurred for LET = 43MeV•cm2/mg tests were run at the lower LET = 20MeV•cm2/mg using copper. The biasing conditions run were restricted to exclude common-mode biasing cases since in the higher LET testing the common-mode conditions did not substantially influence the SET observations. The tests run and the event counts appear in Table 8 while examples of the worst SET observed follow in Figures 8 through 10. In the case of Figure 8, the SETs on R are all associated with preceding disturbances on VOD that indicate an SET to the transmitter that impacts the VOD. In these cases, the SET on R is a response to a transmitter SET and not a receiver SET. The ringing on VOD is certainly the result of the cabling used to monitor the VOD voltage. In total, the cross section of these events on four parts is approximately 3.22x10-6cm2 Figure 9 looks at dominant SET occurring when the bus is biased at the recessive threshold of 0.5V. In this case, two distinct types of SET seem to occur. The first is a double spike with a preceding disturbance on the bus (VOD). This would appear to be a transmitter SET that is simply reflected in the receiver output. The second case is a single dominant spike that does not appear to be associated with any real disturbance on the bus (VOD). This would appear to be a genuine receiver SET. Both types of events disappear when the bus is left open rather than being biased to the recessive threshold value. Figure 10 looks at the worst SET occurring with a dynamic bit stream being transmitted with no common-mode. The first two plots are for a 250kHz input signal (500kbit/s alternating 1's and 0's) with slow bus transitions while the third plot is for 500kHz with fast transitions selected. The only events recorded on R were dominant glitches associated with the edges of the bits when the bus (VOD) was in a transition. The SET were all associated with distortions on the VOD waveform and so are believed to originate in the transmitter. TABLE 8. SET TESTING AT LET = 20MeV•cm2/mg AND FLUENCE OF 1x107ion/cm2 FOR EACH RUN DUT1 EVENTS DUT2 EVENTS DUT3 EVENTS DUT4 EVENTS CROSS SECTION (cm2) VOD Dominant at 1V 20 32 38 39 3.2x10-6 VOD Dominant V THR 0.9V 38 45 VOD Recessive V THF 0.5V 65 47 Transmit Dominant Open CM 0 0 -- Transmit Recessive Open CM 0 0 -- Transmit Slow (250kHz) Open CM 13 10 3 9 8.8x10-7 Transmit Fast (500kHz) Open CM 362* 85* 3 4 3.5x10-7 TEST CONDITIONS 4.2x10-6 71 78 6.5x10-6 NOTE: The runs marked with an asterisk (*) were accidentally run at slow transition speeds but at higher data rate; this accounts for the higher event counts. Submit Document Feedback 10 TR018.1 June 1, 2016 3.5 3.5 3.0 3.0 2.5 2.5 2.0 2.0 SIGNALS (V) SIGNALS (V) Test Report 018 1.5 1.0 1.5 1.0 0.5 0.5 0 0 -0.5 -1 -0.5 0 TIME (µs) 0.5 -0.5 -1 1 -0.5 0 TIME (µs) 0.5 1 FIGURE 8B. FIGURE 8A. 3.5 3.5 3.0 3.0 2.5 2.5 2.0 2.0 SIGNALS (V) SIGNALS (V) FIGURE 8. Examples of dominant to recessive SET for a dominant threshold (0.9V) on the bus. For DUT1 the double spikes on the left plot (Figure 8A) represented 21/38 events; the single spikes on the right (Figure 8B) represented the other 17/38 events. The total fluence at LET = 20MeV•cm2/mg was 1x107ion/cm2. For all events the SET on VOD preceded the SET on R. 1.5 1.0 1.5 1.0 0.5 0.5 0 0 -0.5 -1 -0.5 -0.5 0 TIME (µs) FIGURE 9A. 0.5 1 -1 -0.5 0 TIME (µs) 0.5 1 FIGURE 9B. FIGURE 9. Examples of recessive to dominant SET from DUT1 for recessive threshold (0.5V) on the bus. The double spikes on the left plot (Figure 9A) represented 21/65 events; the single spikes on the right (Figure 9B) represented the other 44/65 events. The total fluence per run at LET = 20MeV•cm2/mg was 1x107cm2. Only the double spikes on the left showed clear VOD SET preceding the R SET. The single spikes appear not to have an associated VOD event. Submit Document Feedback 11 TR018.1 June 1, 2016 3.5 3.5 3.0 3.0 2.5 2.5 2.0 2.0 SIGNALS (V) SIGNALS (V) Test Report 018 1.5 1.0 1.5 1.0 0.5 0.5 0 0 -0.5 -0.5 -5 0 TIME (µs) 5 -5 0 TIME (µs) FIGURE 10A. 5 FIGURE 10B. 3.5 3.0 SIGNALS (V) 2.5 2.0 1.5 1.0 0.5 0 -0.5 -5 0 TIME (µs) 5 FIGURE 10C. FIGURE 10. Examples of SET during data transmission. The top events (Figures 10A and 10B) are for slow transmission (DUT1 and DUT2) and the bottom (Figure 10C) is fast transmission (DUT3). The SET exhibit VOD transients during transition that result in false dominant SET on the R output. The total fluence per run at LET = 20MeV•cm2/mg was 1x107cm2. The top plots (Figures 10A and 10B) indicate that SET can occur on either transition of the VOD. Unlike results at LET = 43MeV•cm2/mg there were no missing bits of either state. Submit Document Feedback 12 TR018.1 June 1, 2016 Test Report 018 SET Testing of the ISL72027SEH CAN Transceiver at LET = 8.5 and 2.7MeV•cm2/mg SET testing was again done on the ISL72027SEH with Ar (LET = 8.5MeV•cm2/mg) and Ne (LET = 2.7MeV•cm2/mg). With argon, events were only recorded for the case of the bus operating at the dominant threshold of 0.9 V and for dynamic operation as represented in Table 9. With neon, (2.7MeV•cm2/mg) no SET at all were observed. Again beam time constraints limited only two units being tested. dominant state would not cause a transient sufficient to result in bus ringing to invoke a recessive state on the receiver. The dynamic SET were almost non-existant with only four being recorded for the fast slew setting. All four look quite similar and are represented in the top two plots of Figure 12. In the first plot Figure 12A no apparent disturbance can be discerned in the VOD trance, while in the second plot Figure 12B a clear glitch in the VOD trace is evident. In both cases the R transition from dominat to recessive is interruped by a spike back to dominant. The spikes occur during the transition and are on the order of 100ns in duration. The third SET (bottom of Figure 12C) shows a clear VOD glitch on the slower slew rate transition of the VOD signal. For the static SET observed with VOD = 0.9V (dominant threshold), there were observed recessive spikes, either single or double spikes, as depicted in Figure 11. Twenty five of the fifty-eight SET observed were of the double spike variety. All the observed SET began with what appears to be an attempt of the transmitter to assert a dominant state on the CAN bus (rise in VOD) followed by some ringing on the bus that was interpreted by the receiver as being a recessive state. This is consistent with no SET being observed for an applied VOD of 1.5V, where the errant TABLE 9. RESULTS FOR SET TESTING WITH LET = 8.5MeV•cm2/mg (Ar) TO 1x107ion/cm2 PER RUN DUT1 EVENTS DUT2 EVENTS TOTAL EVENTS CROSS SECTION (cm2) Recessive Xmit Open Bus, High Slew 0 0 0 -- Recessive Xmit Open Bus, Medium Slew 0 0 0 -- Dominant Xmit Open Bus, High Slew 0 0 0 -- Dominant Xmit Open Bus, Medium Slew 0 0 0 -- VCANH = 1.9V, VCANL = 1.0V, High Slew 29 29 58 2.9x10-6 VCANH = 1.9V, VCANL = 1.0V, Medium Slew 31 31 62 3.1x10-6 VCANH = 2.5V, VCANL = 1.0V, High Slew 0 0 0 -- VCANH = 2.5V, VCANL = 1.0V, Medium Slew 0 0 0 -- Transmit 500kHz, Fast, No CM or VREF 4 0 4 2x10-7 Transmit 500kHz, Medium, No CM or VREF 1 0 1 5x10-8 4 4 3 3 SIGNALS (V) SIGNALS (V) TEST CONDITIONS 2 1 0 2 1 0 -1 -1 -1 0 1 2 TIME (µs) FIGURE 11A. 3 4 -1 0 1 2 3 4 TIME (µs) FIGURE 11B. FIGURE 11. Example SET for LET = 8.5MeV•cm2/mg with VCANH = 1.9V AND VCANL = 1V (VOD = 1.5V). Submit Document Feedback 13 TR018.1 June 1, 2016 4 4 3 3 SIGNALS (V) SIGNALS (V) Test Report 018 2 1 2 1 0 -1 0 -1 0 1 2 3 -1 4 -1 0 1 TIME (µs) 2 3 4 TIME (µs) FIGURE 12B. FIGURE 12A. 4 SIGNALS (V) 3 2 1 0 -1 -1 0 1 2 3 4 TIME (µs) FIGURE 12C. FIGURE 12. Examples of dynamic SET at LET = 8.5MeV•cm2/mg for fast slew (Figures 12A and 12B) and for medium slew (Figure 12C). Submit Document Feedback 14 TR018.1 June 1, 2016 Test Report 018 Discussion and Conclusions Damaging SEE Testing of the ISL72027SEH at case temperatures of +125ºC ±10ºC and 60MeV•cm2/mg did not yield damaging SEE effects with a supply of VCC = 4.5V and the CAN bus common-mode (CANH, CANL) at ±18V. The tests were run on four parts to 5x106 ions/cm2 on each of six irradiation runs per part including both polarities of common-mode for cold sparing, and for fast and slow transmitter slewing. Consequently it is concluded that the part is immune to damaging SEE effects at 60MeV•cm2/mg while operating at or below the voltages of VCC = 4.5V and bus common-mode voltages of ±18V. Single Event Transients With the bus externally biased to the recessive threshold of 0.5V, SET consisting of receiver dominant spikes as in Figure 5 were noted. Most of these SET correlated to VOD disturbances indicating a transmitter SET as the initiating event, though some of the shortest events where not accompanied by a VOD disturbance. At an LET of 20MeV•cm2/mg these events had a cross-section of 6.5x10-6cm2. Dynamic testing of the part for SET resulted in missing bits at the receiver as in Figures 6 and 7 for 43MeV•cm2/mg. At LET of 20MeV•cm2/mg and below dynamic testing only resulted in glitches on the transitions of the bits as in Figures 10 and 12. At LET of 8.5MeV•cm2/mg the cross-section for these SET was 2.0x10-7cm2. At LET of 2.7MeV•cm2/mg there were no SET recorded to a nominal 5x10-8cm2. The ISL72027SEH exhibited SET susceptibility at LET = 43, 20 and 8.5MeV•cm2/mg. SET was defined as any transition in the receiver output for static biasing conditions and any received bit outside of 40% to 60% duty-cycle for a 50% transmitted bit stream. No SET of either type were recorded at an LET = 2.7MeV•cm2/mg. At the higher LET level (43MeV•cm2/mg), SET represented by Figure 4A were noted. The receiver dominant signal was interrupted for nearly 2µs by an errant recessive received signal while the bus was being externally biased to 0.9V. This type of SET represented a cross-section at 43MeV•cm2/mg of approximately 1.3x10-6cm2. This type of event disappeared at LET = 20MeV•cm2/mg and below. The form of SET depicted in Figure 4B, a recessive receiver spike or double spike during a dominant bus voltage of 0.9V, occurred for LET down to 8.5MeV•cm2/mg with a cross-section down to 3.0x10-6cm2 at that LET. These events disappeared at LET = 2.7MeV•cm2/mg to yield a cross-section limit of 5x10-8 cm2. Submit Document Feedback 15 TR018.1 June 1, 2016 Test Report 018 TABLE 10. SEB TESTS RUN ON ISL72027 DURING THE SEPTEMBER 2015 TESTING RS (V) D VCC (V) K1 K2 VCM (V) Cold Spare -20VCM 0 0V to 5.5V 50kHz 0 CL CL -20 Cold Spare +20VCM 0 0V to 5.5V 50kHz 0 CL CL +20 Slow Op -20VCM OP 0V to 5.5V 50kHz 5.5 CL CL -20 Slow Op +20VCM OP 0V to 5.5V 50kHz 5.5 CL CL +20 September 2015 Addendum Subsequent to the previous report, further testing for damaging SEE (referred to as SEB but to include SEL and SEGR) was done on the ISL72027SEH parts on September 26th of 2015. Two major changes were introduced into the testing. First the testing was done at +25ºC ambient rather than +125ºC case temperature. Second, the voltages used for testing were increased to ±20V for the common-mode voltage to the bus pins and +5.5V on the supply pin VCC when powered. The ion species used was again Praseodymium (Pr) with the in-air path lengthened to yield a surface LET of 60MeV•cm2/mg at a 0º angle of incidence. Each irradiation was taken to a fluence of 1x107ion/cm2. Four tests were run on each of four units as described in Table 10. As done previously, the supply current (ICC) and the bus common- mode current (ICM) were monitored before and after each irradiation and are reported in Table 11. The deltas for ICC and ICM are presented in Table 12. The changes in ICC and ICM do not provide any indication of damage due to the irradiations. Before and after each grouping of the four tests indicated in Table 10, the monitor parameters as described in Table 1 on page 4 were measured. The raw data for these measurements is provided in Table 13. The data reduced to deltas in the parameters across the grouping of four irradiaitons is presented in Table 14. Again the data gives no indication of any damage due to the irradiations. TABLE 11. SUPPLY AND COMMON MODE CURRENT MONITOR VALUES FOR SEB IRRADIATIONS AT VCC = 5.5V AND VCM = ±20V DUT1 IRRADIATION CONDITION VCC = 0 VCM = -20V VCC = 0 VCM = +20V VCC = 5.5V VCM = -20V Slow 50kHz VCC = 5.5V VCM = +20V Slow 50kHz ICC (mA) DUT2 ICM (mA) ICC (mA) DUT3 ICM (mA) ICC (mA) DUT4 ICM (mA) ICC (mA) ICM (mA) Pre 0.0087 0.0087 0.0087 0.0086 Post 0.0087 0.0087 0.0086 0.0086 Pre 0.0085 0.0085 0.0085 0.0085 Post 0.0085 0.0085 0.0085 0.0085 Pre 7.356 67.062 6.846 66.671 6.966 66.610 7.365 67.150 Post 7.075 66.497 6.633 66.260 6.863 66.340 7.222 66.879 Pre 92.701 87.912 92.730 88.115 91.950 87.360 92.781 88.070 Post 94.350 89.120 93.872 88.952 92.620 87.823 93.370 88.493 September 2015 Addendum Conclusions From this additional testing it is concluded that the ISL72027SEH did not suffer any damage when operated with VCC = 5.5V and VCM = ±20V and irradiated with ions having LET of 60MeV•cm2/mg. The irradiations were carried out with the part at ambient of approximately +25ºC and each irradiation was taken to 1x107ion/cm2. Submit Document Feedback 16 TR018.1 June 1, 2016 Test Report 018 TABLE 12. SUPPLY AND COMMON MODE CURRENT DELTAS FOR SEB IRRADIATIONS AT VCC = 5.5V AND VCM = ±20V DUT1 IRRADIATION CONDITION VCC = 5.5V ICC DELTA (%) DUT2 ICM DELTA (%) ICC DELTA (%) DUT3 ICM DELTA (%) ICC DELTA (%) DUT4 ICM DELTA (%) ICC DELTA (%) ICM DELTA (%) VCC = 0 VCM = -20V 0.0 0.0 -1.1 0.0 VCC = 0 VCM = +20V 0.0 0.0 0.0 0.0 VCC = 5.5V VCM = -20V Slow 50kHz -3.8 -0.8 -3.1 -0.6 -1.5 -0.4 -1.9 -0.4 VCC = 5.5V VCM = +20V Slow 50kHz 1.8 1.4 1.2 0.9 0.7 0.5 0.6 0.5 TABLE 13. PARAMETRIC MONITORS FOR EACH SET OF IRRADIATIONS DUT1 DUT2 DUT3 DUT4 ICM (µA) AT VCM = -7V ICM (µA) AT VCM = +12V VREF AT VCM (V) ICC (mA) UNLOADED FAST ICC (mA) LOADED SLOW Pre 682 736 1.775 4.315 23.820 Post 675 731 1.774 4.293 23.793 Pre 683 735 1.775 4.292 22.870 Post 677 729 1.773 4.276 22.734 Pre 683 736 1.775 4.314 23.400 Post 671 726 1.773 4.297 23.398 Pre 684 737 1.775 4.332 23.535 Post 674 728 1.774 4.312 23.521 NOTE: Refer to Table 10 on page 16. Irradiation was with Pr at 0° incidence for effective LET of 60MeV•cm2/mg and each SET of irradiations having a total of 4x107ion/cm2. TABLE 14. DELTAS OF PARAMETRIC MONITORS FOR EACH SET OF IRRADIATIONS ICM (µA) AT VCM = -7V (%) ICM (µA) AT VCM = +12V (%) VREF AT VCM (V) (%) ICC (mA) UNLOADED FAST (%) ICC (mA) Loaded Slow (%) DUT1 -1 -1 0 -1 0 DUT2 -1 -1 0 0 -1 DUT3 -2 -1 0 0 0 DUT4 -1 -1 0 0 0 NOTE: Refer to Table 10 on page 16. irradiation was with Pr at 0°incidence for effective LET of 60MeV•cm2/mg and each SET of irradiations having 4x107ion/cm2. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that the document is current before proceeding. For information regarding Intersil Corporation and its products, see www.intersil.com Submit Document Feedback 17 TR018.1 June 1, 2016