INTERSIL HI1176

HI1176
S
IGN
ES
WD
Semiconductor
E
NOT
RN
D FO 9
E
D
EN
I117
OMM See H
C
E
R
8-Bit, 20 MSPS, Flash A/D Converter
October 1998
Features
Description
• Resolution ±0.5 LSB (DNL) . . . . . . . . . . . . . . . . . . . 8-Bit
The HI1176 is an 8-bit, CMOS analog-to-digital converter for
video use that features a sync clamp function. The adoption
of a 2-step parallel method realizes low power consumption
and a maximum conversion speed of 20 MSPS. For higher
sampling rates, refer to the pin-for-pin compatible HI1179
data sheet, AnswerFAX document number 3666.
•[ /Title
Maximum
Sampling Frequency . . . . . . . . . . . 20 MSPS
(HI1176)
(8-Bit,
20 MSPS,
A/D
Converter)
•/Subject
Low Power
Consumption
at Flash
20 MSPS
(Typ)
(Reference
/Author
() Current Excluded) . . . . . . . . . . . . . . .60mW
(Harris
•/Keywords
Built-In Sync
ClampSemiconductor,
Function
Video, Image Scanner,
PC
Video
capture,
Set
top
box,
Clamp,
Internal Ref• Built-In Monostable Multivibrator for Clamp
Pulse
Applications
erence)
Generation
• Video Digitizing
/Creator
• Built-In ()
Sync Pulse Polarity Selection Function
• Image Scanners
/DOCINFO pdfmark
• Clamp Pulse Direct Input Possible
• Low Cost High Speed Data Acquisition Systems
•[ /PageMode
Built-In Clamp
ON/OFF Function
/UseOutlines
• Multimedia
•/DOCVIEW
Built-In Reference
Voltage Self Bias Circuit
pdfmark
Ordering Information
• Input CMOS Compatible
PART
NUMBER
• Three-State TTL Compatible Output
TEMP. RANGE
(oC)
PACKAGE
PKG. NO.
32 Ld MQFP
Q32.7x7-S
• Single +5V Power Supply
• Low Input Capacitance (Typ) . . . . . . . . . . . . . . . . 11pF
• Reference Impedance (Typ) . . . . . . . . . . . . . . . . . 300Ω
HI1176JCQ
-40 to 85
HI1176-EV
25
Evaluation Board
• Direct Replacement for the Sony CXD1176
Pinout
VRBS
VREF
CCP
DVSS
CLE
OE
DVSS
NC
HI1176
(MQFP)
TOP VIEW
3
22
AVSS
D3
4
21
VIN
D4
5
20
AVDD
D5
6
19
AVDD
D6
7
18
VRT
(MSB) D7
8
17
9 10 11 12 13 14 15 16
VRB
VRTS
AVDD
PW
AVSS
D2
SYNC
23
SEL
2
CLK
D1
DVDD
32 31 30 29 28 27 26 25
24
NC
1
DVDD
(LSB) D0
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures.
Copyright
© Harris Corporation 1998
4-1
File Number
3582.5
HI1176
Functional Block Diagram
28
OE 30
25 VRBS
DVSS
REFERENCE SUPPLY
DVSS 31
D0 (LSB)
24 VRB
1
D1
2
D2
3
D3
4
D4
5
D5
6
D6
7
D7 (MSB)
8
23 AVSS
LOWER
ENCODER
(4-BIT)
LOWER
DATA
LATCHES
LOWER SAMPLING
COMPARATOR
(4-BIT)
22 AVSS
21 VIN
LOWER
ENCODER
(4-BIT)
LOWER SAMPLING
COMPARATOR
(4-BIT)
UPPER
ENCODER
(4-BIT)
UPPER SAMPLING
COMPARATOR
(4-BIT)
20 AVDD
19 AVDD
18 VRT
UPPER
DATA
LATCHES
17 VRTS
16 AVDD
DVDD 10
DVDD 11
CLOCK GENERATOR
CLK 12
NC
-
9
+
NC 32
15 PW
14 SYNC
M•M
29
27
13 SEL
26
CLE CCP VREF
Typical Application Schematic
WHEN CLAMP IS NOT USED (SELF BIAS USED)
+5V (DIGITAL)
HCO4
0.1µF
CLOCK IN
+5V (ANALOG)
VIDEO IN
0.01µF
75Ω
0.1µF
10pF
0.01µF
16 15 14 13 12 11 10 9
8
17
D7
18
7
D6
19
6
D5
20
5
D4
21
4
D3
22
3
D2
23
2
D1
1
24
25 26 27 28 29 30 31 32
D0
GND (ANALOG)
GND (DIGITAL)
+5V (DIGITAL)
4-2
HI1176
Absolute Maximum Ratings
Thermal Information
Supply Voltage, VDD. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7V
Reference Voltage, VRT , VRB . . . . . . . . . VDD + 0.5V to VSS - 0.5V
Analog Input Voltage, VIN . . . . . . . . . . . . . VDD + 0.5V to VSS - 0.5V
Digital Input Voltage, CLK. . . . . . . . . . . . . VDD + 0.5V to VSS - 0.5V
Digital Output Voltage, VOH , VOL . . . . . . . VDD + 0.5V to VSS - 0.5V
Thermal Resistance (Typical, Note 1)
θJA (oC/W)
MQFP Package . . . . . . . . . . . . . . . . . . . . . . . . . . . .
122
Maximum Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . 150oC
Maximum Storage Temperature Range . . . . . . . . . -65oC to 150oC
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . . 300oC
(Lead Tips Only)
Operating Conditions (Note 1)
Temperature Range, TA . . . . . . . . . . . . . . . . . . . . . . . -40oC to 85oC
Supply Voltage
AVDD , AVSS , DVDD , DVSS . . . . . . . . . . . . . . . +4.75V to +5.25V
|DGND-AGND| . . . . . . . . . . . . . . . . . . . . . . . . . . . .0mV to 100mV
Reference Input Voltage
VRB . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0V and Above
VRT . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.8V and Below
Analog Input Voltage, VIN . . . . . . . . . VRB to VRT (1.8VP-P to AVDD)
Clock Pulse Width
tPW1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25ns (Min)
tPW0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25ns (Min)
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of
the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1. θJA is measured with the component mounted on an evaluation PC board in free air.
Electrical Specifications
fC = 20 MSPS, VDD = +5V, VRB = 0.5V, VRT = 2.5V, TA = 25oC (Note 1)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
EOT
-60
-40
-20
mV
EOB
+20
+40
+60
mV
SYSTEM PERFORMANCE
Offset Voltage
Integral Non-Linearity, INL
fC = 20 MSPS, VIN = 0.5V to 2.5V
-
±0.5
±1.3
LSB
Differential Non-Linearity, DNL
fC = 20 MSPS, VIN = 0.5V to 2.5V
-
±0.3
±0.5
LSB
DYNAMIC CHARACTERISTICS
Signal to Noise Ratio, SINAD
RMS Signal
---------------------------------------------------------------------------------------------------------------Signal-To -Noise + Distortion Ratio, SINAD
fS = 20MHz, fIN = 1MHz
-
46
-
dB
fS = 20MHz, fIN = 3.58MHz
-
46
-
dB
Maximum Conversion Speed, fC
VIN = 0.5V to 2.5V, fIN = 1kHz Ramp
20
35
-
MSPS
-
-
0.5
MSPS
-
1.0
-
%
Differential Phase Error, DP
-
0.5
-
Degree
Aperture Jitter, tAJ
-
30
-
ps
Sampling Delay, tDS
-
4
-
ns
-
18
-
MHz
-
11
-
pF
Minimum Conversion Speed
Differential Gain Error, DG
NTSC 40 IRE Mod Ramp, fC = 14.3 MSPS
ANALOG INPUTS
Analog Input Bandwidth (-1dB), BW
Analog Input Capacitance, CIN
VIN = 1.5V + 0.07VRMS
4-3
HI1176
Electrical Specifications
fC = 20 MSPS, VDD = +5V, VRB = 0.5V, VRT = 2.5V, TA = 25oC (Note 1) (Continued)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Reference Pin Current, IREF
4.5
6.6
8.7
mA
Reference Resistance (VRT to VRB), RREF
230
300
450
Ω
0.48
0.52
0.56
V
1.96
2.08
2.22
V
VIH
4.0
-
-
V
VIL
-
-
1.0
V
VIH = VDD
-
-
5
µA
VIL = 0V
-
-
5
µA
VOH = VDD -0.5V
-1.1
-
-
mA
VOL = 0.4V
3.7
-
-
mA
VOH = VDD
-
-
16
µA
VOL = 0V
-
-
16
µA
-
18
30
ns
fC = 20 MSPS, NTSC Ramp Wave Input
-
12
18
mA
VIN = DC, PWS = 3µs
VREF = 0.5V
0
+20
+40
mV
VREF = 2.5V
-50
-30
-10
mV
1.75
2.75
3.75
µs
-
25
-
ns
REFERENCE INPUT
INTERNAL VOLTAGE REFERENCES
Self Bias
VRB
Short VRB and VRBS , Short VRT and VRTS
VRT - VRB
DIGITAL INPUTS
Digital Input Voltage
Digital Input Current
IIH
VDD = Max
IIL
DIGITAL OUTPUTS
Digital Output Current
IOH
OE = VSS , VDD = Min
IOL
Digital Output Current
IOZH
OE = VDD , VDD = Max
IOZL
TIMING CHARACTERISTICS
Output Data Delay, tDL
POWER SUPPLY CHARACTERISTIC
Supply Current, IDD
CLAMP CHARACTERISTICS
Clamp Offset Voltage, EOC
Clamp Pulse Width (Sync Pin Input), tCPW
C = 100pF, R = 130kΩ on Pin 15
Clamp Pulse Delay, tCPD
NOTE:
1. Electrical specifications guaranteed only under the stated operating conditions.
4-4
HI1176
Timing Diagrams
tPW1
tPW0
CLOCK
ANALOG INPUT
DATA OUTPUT
: POINT FOR ANALOG SIGNAL SAMPLING
N
N+1
N-3
N+3
N-2
N-1
N-2
N+4
N
N+1
tD = 18ns
FIGURE 1.
VI (1)
VI (2)
VI (3)
VI (4)
ANALOG INPUT
EXTERNAL CLOCK
UPPER COMPARATOR BLOCK
S (1)
S (1)
DIGITAL OUTPUT
S (3)
C (3)
MD (2)
RV (1)
H (1)
H (0)
C (0)
C (1)
LD (-2)
MD (3)
RV (3)
S (3)
H (3)
H (2)
C (2)
LD (0)
OUT (-1)
FIGURE 2.
4-5
C (4)
C (3)
LD (1)
S (2)
OUT (-2)
S (4)
RV (2)
LD (-1)
LOWER DATA A
LOWER DATA B
C (2)
MD (1)
RV (0)
LOWER REFERENCE VOLTAGE
LOWER COMPARATOR BLOCK B
S (2)
MD (0)
UPPER DATA
LOWER COMPARATOR BLOCK A
C (1)
S (4)
H (4)
LD (2)
OUT (0)
OUT (1)
HI1176
Typical Performance Curves
20
100
20
IDD (mA)
IDD (mA)
15
15
10
10
50
5
4.5
4.0
5.0
5
5.5
0
5
10
POWER SUPPLY VOLTAGE (V)
FIGURE 3. SUPPLY CURRENT vs SUPPLY VOLTAGE
DIFFERENTIAL NON-LINEARITY (LSB)
1.4
15
20
25
1.0
0.6
0.2
0
2
4
6
8
10
INPUT FREQUENCY (MHz)
FIGURE 5. DIFFERENTIAL NON-LINEARITY vs INPUT FREQUENCY
Pin Descriptions
PIN
NUMBER
SYMBOL
1-8
D0 to D7
EQUIVALENT CIRCUIT
DESCRIPTION
D0 (LSB) to D7 (MSB) Output.
D1
10, 11
35
FIGURE 4. SUPPLY CURRENT AND POWER vs SAMPLING
RATE
TA = 25oC, VRT = 2.5V, VRB = 0.5V
VDD = 5.0V, fS = 20 MSPS
0
30
SAMPLING RATE (MSPS)
DVDD
Digital +5V.
4-6
POWER DISSIPATION (mW)
VPP = 5.0V, VRT = 2.5V, VRB = 0.5V
TA = 25oC, VIN = 2VP-P
HI1176
Pin Descriptions
(Continued)
PIN
NUMBER
SYMBOL
12
CLK
EQUIVALENT CIRCUIT
DESCRIPTION
Clock Input.
DVDD
12
DVSS
13
SEL
When SEL is low, the falling edge of Pin 14 (sync)
triggers the monostable.
When SEL is high, the rising edge of Pin 14 (sync)
triggers the monostable.
DVDD
13
DVSS
14
SYNC
Trigger pulse input to the monostable multivibrator.
Trigger polarity can be controlled by Pin 13 (SEL).
DVDD
14
DVSS
15
PW
When a clamp pulse is generated by the
monostable, the pulse width is determined by the
external R and C.
When the clamp pulse is directly input, it is input to
Pin 15 (PW).
DVDD
15
DVSS
16, 19, 20
AVDD
17
VRTS
Analog +5V.
When shorted with VRT , generates approx. +2.6V.
AVDD
17
18
VRT
24
VRB
Reference Voltage (Top).
AVDD
Reference Voltage (Bottom).
18
24
AVSS
4-7
HI1176
Pin Descriptions
(Continued)
PIN
NUMBER
SYMBOL
21
VIN
EQUIVALENT CIRCUIT
DESCRIPTION
Analog Input.
AVDD
21
AVSS
22, 23
AVSS
25
VRBS
Analog Ground.
AVSS
When shorted with VRB , generates approx. +0.5V.
25
26
VREF
Clamp Reference Voltage Input.
AVDD
26
AVSS
27
CCP
Integrates the voltage for clamp control.
AVDD
27
AVSS
28, 31
DVSS
29
CLE
Digital GND.
When CLE is low, clamp function is activated.
When CLE is high, clamp function is OFF and only
the usual A/D converter function is active.
By connecting CLE pin to DVDD via a several
hundred Ω resistance, the clamp pulse can be
tested.
DVDD
29
CLAMP PULSE
DVSS
30
OE
DVDD
30
DVSS
4-8
When OE is low, data is valid.
When OE is high, D0 to D7 pins are high
impedance.
HI1176
TABLE 1. A/D OUTPUT CODE
DIGITAL OUTPUT CODE
INPUT SIGNAL
VOLTAGE
STEP
MSB
VRT
255
1
•
•
•
•
•
•
•
•
VRB
LSB
1
1
1
•
•
•
1
1
1
1
•
•
•
128
1
0
0
0
0
0
0
0
127
0
1
1
1
1
1
1
1
0
0
0
•
•
•
0
•
•
•
0
0
0
0
0
Detailed Description
The HI1176 is a 2-step A/D converter featuring a 4-bit upper
comparator group and two lower comparator groups of 4 bits
each. The reference voltage can obtained from the onboard
bias generator or be supplied externally. This IC uses an offset canceling type comparator that operates synchronously
with an external clock. The operating modes of the part are
input sampling/autozero (S), hold (H), and compare (C).
The operation of the part is illustrated in Figure 2. A reference
voltage that is between VRT -VRB is constantly applied to the
upper 4-bit comparator group. VI(1) is sampled with the falling
edge of the first clock by the upper comparator block. The
lower block A also samples VI(1) on the same edge. The
upper comparator block finalizes comparison data MD(1) with
the rising edge of the first clock. Simultaneously the reference
supply generates a reference voltage RV(1) that corresponds
to the upper results and applies it to the lower comparator
block A. The lower comparator block finalizes comparison
data LD(1) with the rising edge of the second clock. MD(1)
and LD(1) are combined and output as OUT(1) with the rising
edge of the third clock. There is a 2.5 cycle clock delay from
the analog input sampling point to the corresponding digital
output data. Notice how the lower comparator blocks A and B
alternate generating the lower data in order to increase the
overall A/D sampling rate.
Power, Grounding, and Decoupling
To reduce noise effects, separate the analog and digital
grounds.
Bypass both the digital and analog VDD pins to their respective grounds with a ceramic 0.1µF capacitor close to the pin.
Analog Input
The input capacitance is small when compared with other
flash type A/D converters. However, it is necessary to drive
the input with an amplifier with sufficient bandwidth and drive
capability. In order to prevent parasitic oscillation, it may be
necessary to insert a resistor between the output of the
amplifier and the A/D input.
Reference Input
The range of the A/D is set by the voltage between VRT and
VRB . The internal bias generator will set VRTS to 2.5V and
VRBS to 0.5V. These can be used as the part reference by
shorting VRT and VRTS and VRB to VRBS . The analog input
range of the A/D will now be from 0.5V to 2.5V. If a VRB below
+0.5V is used the linearity of the part will be degraded.
Bypass VRT and VRB to analog ground with a 0.1µF
capacitor.
Clamp Operation
The HI1176 provides a clamp option that allows the user to
clamp a portion of the analog input to a voltage set by the
VREF pin. The clamp function is enabled by bringing CLE
low. An internal monostable multivibrator is provided that can
be used to generate the clamp pulses. The monostable
pulse width is determined by the external R and C connected to the PW pin. The trigger to the monostable is
applied on the SYNC pin. The edge that triggers the
monostable is determined by the SEL pin. When SEL is low
the falling edge will trigger the monostable and when SEL is
high the rising edge will trigger the monostable. Figure 6
shows the HI1176 configured for this mode of operation. The
clamp pulse is latched by the ADC sampling clock. This is
not necessary to the operation of the clamp function but if
this is not done then a slight beat might be generated as vertical sag according to the relation between the sampling frequency and the clamp frequency.
The HI1176 can also be configured to operate with an external clamp pulse. In this case a negative going pulse is input
to the PW pin. VIN will now be clamped during the low period
of the clamp pulse to the voltage on the VREF pin. Figure 7
shows the HI1176 configured for this mode of operation.
Figure 1 illustrates the operation of HI1176 when the clamp
function is not used.
4-9
HI1176
Typical Application Circuits
+5V (DIGITAL)
HCO4
0.1µF
CLOCK IN
CK
SYNC IN
LATCH
Q
+5V (ANALOG)
VIDEO IN
10µF
0.01µF
75Ω
+
0.1µF
10pF
0.01µF
16 15 14 13 12 11 10 9
8
17
D7
18
7
D6
19
6
D5
20
5
D4
21
4
D3
22
3
D2
23
2
D1
1
24
25 26 27 28 29 30 31 32
D0
+5V (ANALOG)
VREF 20K
0.01µF
GND (ANALOG)
GND (DIGITAL)
FIGURE 6. PEDESTAL CLAMP IS EXECUTED BY SYNC PULSE (SELF BIAS USED)
+5V (DIGITAL)
HCO4
0.1µF
CLOCK IN
CK
CLAMP
PULSE IN
LATCH
Q
+5V (ANALOG)
VIDEO IN
10µF
0.01µF
75Ω
+
0.1µF
10pF
0.01µF
16 15 14 13 12 11 10 9
8
17
D7
18
7
D6
19
6
D5
20
5
D4
21
4
D3
22
3
D2
23
2
D1
1
24
25 26 27 28 29 30 31 32
D0
+5V (ANALOG)
VREF 20K
0.01µF
GND (ANALOG)
GND (DIGITAL)
FIGURE 7. CLAMP PULSE IS DIRECTLY INPUT (SELF BIAS USED)
4-10
HI1176
Test Circuits
+V
S2
-
S1 : ON IF A < B
S2 : ON IF A > B
S1
+
-V
A<B
A>B
COMPARATOR
VIN
8
DUT
HI1176
“0”
A8
B8
A1
A0
B1
B0
8
BUFFER
“1”
DVM
000 • • • 00
TO
111 • • • 10
8
CLK (20MHz)
CONTROLLER
FIGURE 8. INTEGRAL AND DIFFERENTIAL NON-LINEARITY ERROR AND OFFSET VOLTAGE TEST CIRCUIT
2.6V
ERROR RATE
fC -1kHz
SG
HPF
0.6V
1
100
IRE
0
-40
SG
(CW)
VIN
AMP
2
NTSC
SIGNAL
SOURCE
40 IRE
MODULATION
COUNTER
HI20201
DUT
HI1176
8
TTL
1
8
10-BIT
D/A
ECL
620
2
VECTOR
SCOPE
CLK
2.6V
BURST
DG
DP
-5.2V
620
0.6V
SYNC
-5.2V
TTL
fC
ECL
FIGURE 9. MAXIMUM OPERATIONAL SPEED AND DIFFERENTIAL GAIN AND PHASE ERROR TEST CIRCUIT
2.6V
VDD
VRT
2.6V
IOL
VIN
0.6V
VDD
VRT
IOH
VIN
VRB
0.6V
CLK
VRB
CLK
VOL
OE
GND
VOH
OE
+
GND
-
FIGURE 10. DIGITAL OUTPUT CURRENT TEST CIRCUIT
4-11
+
-