IRFPS40N50L, SiHFPS40N50L Datasheet

IRFPS40N50L, SiHFPS40N50L
Vishay Siliconix
Power MOSFET
FEATURES
PRODUCT SUMMARY
VDS (V)
• Superfast Body Diode Eliminates the Need for
External Diodes in ZVS Applications
500
RDS(on) ()
VGS = 10 V
0.087
Available
RoHS*
Qg (Max.) (nC)
380
Qgs (nC)
80
• Lower Gate Charge Results in Simpler Drive
Requirements
190
• Enhanced dV/dt Capabilities Offer Improved Ruggedness
Qgd (nC)
Configuration
Single
COMPLIANT
• Higher Gate Voltage Threshold Offers Improved Noise
Immunity
D
• Compliant to RoHS Directive 2002/95/EC
Super-247
APPLICATIONS
G
• Zero Voltage Switching SMPS
S
• Telecom and Server Power Supplies
D
G
• Uninterruptible Power Supplies
S
• Motor Control Applications
N-Channel MOSFET
ORDERING INFORMATION
Package
Super-247
IRFPS40N50LPbF
SiHFPS40N50L-E3
IRFPS40N50L
SiHFPS40N50L
Lead (Pb)-free
SnPb
ABSOLUTE MAXIMUM RATINGS (TC = 25 °C, unless otherwise noted)
PARAMETER
SYMBOL
LIMIT
Drain-Source Voltage
VDS
500
Gate-Source Voltage
VGS
± 30
Continuous Drain Current
VGS at 10 V
TC = 25 °C
TC = 100 °C
Pulsed Drain Currenta
ID
UNIT
V
46
29
A
IDM
180
4.3
W/°C
EAS
920
mJ
Currenta
IAR
46
A
Repetitive Avalanche Energya
EAR
54
mJ
Linear Derating Factor
Single Pulse Avalanche Energyb
Repetitive Avalanche
Maximum Power Dissipation
TC = 25 °C
Peak Diode Recovery dV/dtc
Operating Junction and Storage Temperature Range
Soldering Recommendations (Peak Temperature)
for 10 s
PD
540
W
dV/dt
34
V/ns
TJ, Tstg
- 55 to + 150
300d
°C
Notes
a. Repetitive rating; pulse width limited by maximum junction temperature (see fig. 11).
b. Starting TJ = 25 °C, L = 0.86 mH, Rg = 25 , IAS = 46 A (see fig. 12).
c. ISD  46 A, dI/dt  550 A/μs, VDD  VDS, TJ  150 °C.
d. 1.6 mm from case.
* Pb containing terminations are not RoHS compliant, exemptions may apply
Document Number: 91260
S11-0111-Rev. C, 07-Feb-11
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IRFPS40N50L, SiHFPS40N50L
Vishay Siliconix
THERMAL RESISTANCE RATINGS
PARAMETER
SYMBOL
TYP.
MAX.
Maximum Junction-to-Ambienta
RthJA
-
40
Case-to-Sink, Flat, Greased Surface
RthCS
0.24
-
Maximum Junction-to-Case (Drain)a
RthJC
-
0.23
UNIT
°C/W
Note
a. Rth is measured at TJ approximately 90 °C.
SPECIFICATIONS (TJ = 25 °C, unless otherwise noted)
PARAMETER
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
VDS
VGS = 0 V, ID = 250 μA
500
-
-
V
VDS/TJ
Reference to 25 °C, ID = 1 mA
-
0.60
-
VGS(th)
VDS = VGS, ID = 250 μA
3.0
-
5.0
V/°C
V
Static
Drain-Source Breakdown Voltage
VDS Temperature Coefficient
Gate-Source Threshold Voltage
Gate-Source Leakage
Zero Gate Voltage Drain Current
Drain-Source On-State Resistance
Forward Transconductance
VGS = ± 30 V
-
-
± 100
VDS = 500 V, VGS = 0 V
-
-
50
nA
μA
VDS = 400 V, VGS = 0 V, TJ = 125 °C
-
-
2.0
mA
-
0.087
0.100

S
IGSS
IDSS
RDS(on)
ID = 28 Ab
VGS = 10 V
gfs
VDS = 50 V, ID = 46 A
21
-
-
VGS = 0 V,
VDS = 25 V,
f = 1.0 MHz, see fig. 5
-
8110
-
-
960
-
-
130
-
VDS = 1.0 V , f = 1.0 MHz
-
11200
-
VDS = 400 V , f = 1.0 MHz
-
240
-
-
440
-
-
310
-
-
-
380
-
-
80
nC

Dynamic
Input Capacitance
Ciss
Output Capacitance
Coss
Reverse Transfer Capacitance
Crss
Output Capacitance
Coss
Effective Output Capacitance
Effective Output Capacitance
(Energy Related)
Total Gate Charge
Coss eff.
Qg
Qgs
Gate-Drain Charge
Internal Gate Resistance
Qgd
RG
Turn-On Delay Time
td(on)
Turn-Off Delay Time
Fall Time
VDS = 0 V to 400 Vc
Coss eff. (ER)
Gate-Source Charge
Rise Time
VGS = 0 V
tr
td(off)
VGS = 10 V
ID = 46 A, VDS = 400 V,
see fig. 7 and 15b
f = 1 MHz, open drain
VDD = 250 V, ID = 46 A,
RG = 0.85 , VGS = 10 V,
see fig. 14a and 14bb
tf
-
-
-
0.90
190
-
-
27
-
-
170
-
-
50
-
-
69
-
-
-
46
-
-
180
pF
ns
Drain-Source Body Diode Characteristics
Continuous Source-Drain Diode Current
IS
Pulsed Diode Forward Currenta
ISM
Body Diode Voltage
VSD
Body Diode Reverse Recovery Time
trr
Body Diode Reverse Recovery Charge
Qrr
Reverse Recovery Current
IRRM
MOSFET symbol
showing the
integral reverse
p - n junction diode
D
A
G
S
TJ = 25 °C, IS = 46 A, VGS = 0 Vb
-
-
1.5
TJ = 25 °C, IF = 46 A
-
170
250
TJ = 125 °C, dI/dt = 100 A/μsb
-
220
330
TJ = 25 °C, IS = 46 A, VGS = 0 Vb
-
705
1060
TJ = 125 °C, dI/dt = 100 A/μsb
-
1.3
2.0
TJ = 25 °C
-
9.0
-
V
ns
nC
A
Forward Turn-On Time
ton
Intrinsic turn-on time is negligible (turn-on is dominated by LS and LD)
Notes
a. Repetitive rating; pulse width limited by maximum junction temperature (see fig. 11).
b. Pulse width  400 μs; duty cycle  2 %.
c. Coss eff. is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 % to 80 % VDS.
Coss eff. (ER) is a fixed capacitance that stores the same energy as Coss while VDS is rising from 0 % to 80 % VDS.
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Document Number: 91260
S11-0111-Rev. C, 07-Feb-11
IRFPS40N50L, SiHFPS40N50L
Vishay Siliconix
TYPICAL CHARACTERISTICS (25 °C, unless otherwise noted)
1000
1000
VGS
15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM 4.5V
100
I D , Drain-to-Source Current (A)
I D , Drain-to-Source Current (A)
TOP
100
10
1
4.5V
0.1
20μs PULSE WIDTH
TJ = 25 °C
0.01
0.1
1
10
10
TJ = 25 ° C
1
0.1
100
VDS , Drain-to-Source Voltage (V)
RDS(on) , Drain-to-Source On Resistance
(Normalized)
VGS
15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM4.5V
I D , Drain-to-Source Current (A)
10
4.5V
1
0.1
0.1
20µs PULSE WIDTH
TJ = 150 °C
1
10
4
5
6
7
8
9
10
11
Fig. 3 - Typical Transfer Characteristics
TOP
100
V DS= 50V
20µs PULSE WIDTH
VGS , Gate-to-Source Voltage (V)
Fig. 1 - Typical Output Characteristics
1000
TJ = 150° C
100
3.0
ID = 47A
2.5
2.0
1.5
1.0
0.5
0.0
-60 -40 -20
VGS = 10V
0
20 40 60
80 100 120 140 160
VDS , Drain-to-Source Voltage (V)
TJ , Junction Temperature ( ° C)
Fig. 2 - Typical Output Characteristics
Fig. 4 - Normalized On-Resistance vs. Temperature
Document Number: 91260
S11-0111-Rev. C, 07-Feb-11
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IRFPS40N50L, SiHFPS40N50L
Vishay Siliconix
VGS = 0V, f = 1 MHZ
Ciss = Cgs + Cgd, Cds SHORTED
Crss = Cgd
C, Capacitance(pF)
100000
Coss = Cds + Cgd
10000
Ciss
1000
Coss
100
Crss
VGS , Gate-to-Source Voltage (V)
20
1000000
ID = 47A
V DS= 400V
V DS= 250V
V DS= 100V
15
10
5
10
1
10
100
0
1000
0
VDS, Drain-to-Source Voltage (V)
Fig. 5 - Typical Capacitance vs. Drain-to-Source Voltage
40
200
300
400
Fig. 7 - Typical Gate Charge vs. Gate-to-Source Voltage
1000
ISD , Reverse Drain Current (A)
35
30
Energy (µJ)
100
QG , Total Gate Charge (nC)
100
25
20
15
10
5
TJ = 150° C
10
TJ = 25 ° C
1
0
0
100
200
300
400
500
600
0.1
0.2
V GS = 0 V
0.7
1.2
1.7
2.2
VDS, Drain-to-Source Voltage (V)
VSD ,Source-to-Drain Voltage (V)
Fig. 6 - Typical Output Capacitance Stored Energy vs. VDS
Fig. 8 - Typical Source Drain Diode Forward Voltage
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Document Number: 91260
S11-0111-Rev. C, 07-Feb-11
IRFPS40N50L, SiHFPS40N50L
Vishay Siliconix
RD
VDS
50
VGS
40
ID , Drain Current (A)
D.U.T.
RG
+
- VDD
10 V
Pulse width ≤ 1 µs
Duty factor ≤ 0.1 %
30
Fig. 10a - Switching Time Test Circuit
20
VDS
90 %
10
0
25
50
75
100
125
150
10 %
VGS
TC , Case Temperature ( °C)
td(on)
Fig. 9 - Maximum Drain Current vs. Case Temperature
td(off) tf
tr
Fig. 10b - Switching Time Waveforms
Thermal Response(Z thJC )
1
0.1
D = 0.50
0.01
0.20
0.10
0.05
0.02
0.01
0.001
0.00001
PDM
t1
SINGLE PULSE
(THERMAL RESPONSE)
t2
Notes:
1. Duty factor D = t 1 / t 2
2. Peak TJ = P DM x Z thJC + TC
0.0001
0.001
0.01
0.1
1
t1 , Rectangular Pulse Duration (sec)
Fig. 11 - Maximum Effective Transient Thermal Impedance, Junction-to-Case
Document Number: 91260
S11-0111-Rev. C, 07-Feb-11
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IRFPS40N50L, SiHFPS40N50L
Vishay Siliconix
EAS , Single Pulse Avalanche Energy (mJ)
2000
15 V
TOP
BOTTOM
ID
21A
30A
46A
1500
Driver
L
VDS
D.U.T.
RG
IAS
20 V
tp
1000
+
A
- VDD
0.01 Ω
Fig. 12a - Unclamped Inductive Test Circuit
VDS
500
0
25
50
75
100
125
150
Starting TJ , Junction Temperature( °C)
tp
Fig. 12d - Maximum Safe Operating Area
Current regulator
Same type as D.U.T.
IAS
50 kΩ
12 V
Fig. 12b - Unclamped Inductive Waveforms
0.2 µF
0.3 µF
+
D.U.T.
1000
OPERATION IN THIS AREA LIMITED
BY RDS(on)
-
VDS
VGS
ID , Drain Current (A)
3 mA
100
10us
IG
ID
Current sampling resistors
100us
10
1
Fig. 13a - Gate Charge Test Circuit
1ms
TC = 25 °C
TJ = 150 °C
Single Pulse
10
10ms
QG
VGS
100
100
QGS
VDS , Drain-to-Source Voltage (V)
Fig. 12c - Maximum Avalanche Energy vs. Drain Current
QGD
VG
Charge
Fig. 13b - Basic Gate Charge Waveform
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Document Number: 91260
S11-0111-Rev. C, 07-Feb-11
IRFPS40N50L, SiHFPS40N50L
Vishay Siliconix
Peak Diode Recovery dV/dt Test Circuit
+
D.U.T.
Circuit layout considerations
• Low stray inductance
• Ground plane
• Low leakage inductance
current transformer
+
-
-
Rg
•
•
•
•
+
dV/dt controlled by Rg
Driver same type as D.U.T.
ISD controlled by duty factor “D”
D.U.T. - device under test
+
-
VDD
Driver gate drive
P.W.
Period
D=
P.W.
Period
VGS = 10 Va
D.U.T. lSD waveform
Reverse
recovery
current
Body diode forward
current
dI/dt
D.U.T. VDS waveform
Diode recovery
dV/dt
Re-applied
voltage
Inductor current
VDD
Body diode forward drop
Ripple ≤ 5 %
ISD
Note
a. VGS = 5 V for logic level devices
Fig. 14 - For N-Channel
Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon
Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and
reliability data, see www.vishay.com/ppg?91260.
Document Number: 91260
S11-0111-Rev. C, 07-Feb-11
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Package Information
Vishay Siliconix
TO-274AA (HIGH VOLTAGE)
B
A
E
E4
A
D2
E1
A1
R
D1
D
L1
L
Detail “A”
C
b
e
A2
0.10 (0.25) M B A M
10°
b4
b2
Lead Tip
5°
Detail “A”
Scale: 2:1
MILLIMETERS
DIM.
MIN.
MAX.
INCHES
MIN.
MAX.
MILLIMETERS
DIM.
MIN.
MAX.
INCHES
MIN.
MAX.
A
4.70
5.30
0.185
0.209
D1
15.50
16.10
0.610
0.634
A1
1.50
2.50
0.059
0.098
D2
0.70
1.30
0.028
0.051
A2
2.25
2.65
0.089
0.104
E
15.10
16.10
0.594
0.634
b
1.30
1.60
0.051
0.063
E1
13.30
13.90
0.524
0.547
b2
1.80
2.20
0.071
0.087
e
b4
3.00
3.25
0.118
0.128
L
13.70
14.70
0.539
0.579
c
0.80
1.20
0.031
0.047
L1
1.00
1.60
0.039
0.063
D
19.80
20.80
0.780
0.819
R
2.00
3.00
0.079
0.118
5.45 BSC
0.215 BSC
ECN: S-82247-Rev. A, 06-Oct-08
DWG: 5975
Notes
1. Dimensioning and tolerancing per ASME Y14.5M-1994.
2. Dimension D and E do not include mold flash. Mold flash shall not exceed 0.127 mm (0.005") per side. These dimensions are measured at the
outer extremes of the plastic body.
3. Outline conforms to JEDEC outline to TO-274AA.
Document Number: 91365
Revision: 06-Oct-08
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Vishay Intertechnology, Inc. hereby certifies that all its products that are identified as RoHS-Compliant fulfill the
definitions and restrictions defined under Directive 2011/65/EU of The European Parliament and of the Council
of June 8, 2011 on the restriction of the use of certain hazardous substances in electrical and electronic equipment
(EEE) - recast, unless otherwise specified as non-compliant.
Please note that some Vishay documentation may still make reference to RoHS Directive 2002/95/EC. We confirm that
all the products identified as being compliant to Directive 2002/95/EC conform to Directive 2011/65/EU.
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requirements as per JEDEC JS709A standards. Please note that some Vishay documentation may still make reference
to the IEC 61249-2-21 definition. We confirm that all the products identified as being compliant to IEC 61249-2-21
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Revision: 02-Oct-12
1
Document Number: 91000