AT93C56A/66A (AT3552m/2k) SPI EEPROM Product Qualification • 2325 Orchard Parkway • San Jose CA 95131 • The AT93C56A/66A Serial EEPROM is fabricated on the AT35000 CMOS process. With the exception of HBM ESD, all tests were performed at Atmel’s Colorado Springs Facility. This report summarizes the product level qualification data, ESD, Latchup, and Write Endurance for the AT93C56A/66A Serial EEPROM. This data, in conjunction with the AT35000 Process Qualification and Reliability Report, qualifies the AT93C56A/66A. Package specific qualification data is provided separately. • 2325 Orchard Parkway • San Jose CA 95131 • AT3552m/2k Product Qualification ESD Characterization Device: AT93C56A/66A Lot Number: Lot#c3e5480/3e5480 Quantity Tested: 3/ lot per Voltage Test Temperature: 25C ESD Stress Equipment:: ORYX Model 11000 ESD Test System; Human Body Model Pass/Fail via Final Production Test Program: EPRO Model 142AX Tester @ -40C, 25C, 125C Test per Mil Std 883, Method 3015: 3 Pulses Each Polarity per Specified Pin Combinations AT93C56A 3 Positive & 3 Negative Pulses per The Specified Pin c3e5480 Combinations Max Passing HBM Voltage Qty/Fail Pin Qty/Fail Qty/Fail Qty/Fail Function Tested As Qty/Fail Voltage 2000V Name 500V 1000V 4000V Vcc Power Vcc 3/0 3/0 3/0 3/3 3/0 2000 Gnd Ground Gnd 3/0 3/0 3/0 3/3 3/0 2000 CS Chip Select Input 3/0 3/0 3/0 3/3 3/0 2000 Hold Suspend Input Input 3/0 3/0 3/0 3/3 3/0 2000 SI Serial Data IN Input 3/0 3/0 3/0 3/3 3/0 2000 WP Write Protect Input 3/0 3/0 3/0 3/3 3/0 2000 SCK Serial Clock Input 3/0 3/0 3/0 3/3 3/0 2000 SO Serial Data OUT Output 3/0 3/0 3/0 3/3 3/0 2000 Functional Test Only Failing Pin Not Identified See Above AT93C66A 3e5480 HBM Pin Name Vcc Gnd CS Hold SI WP SCK SO Function Tested As Power Ground Chip Select Suspend Input Serial Data IN Write Protect Serial Clock Serial Data OUT Vcc Gnd Input Input Input Input Input Output Functional Test Only Failing Pin Not Identified See Above 3/0 3/0 3/0 3/3 3/0 2000 3 Positive & 3 Negative Pulses per The Specified Pin Combinations Max Passing Voltage Qty/Fail Qty/Fail Qty/Fail Qty/Fail Qty/Fail Voltage 2000V 500V 1000V 4000V 3/0 3/0 3/0 3/3 3/0 2000 3/0 3/0 3/0 3/3 3/0 2000 3/0 3/0 3/0 3/3 3/0 2000 3/0 3/0 3/0 3/3 3/0 2000 3/0 3/0 3/0 3/3 3/0 2000 3/0 3/0 3/0 3/3 3/0 2000 3/0 3/0 3/0 3/3 3/0 2000 3/0 3/0 3/0 3/3 3/0 2000 3/0 3/0 • 2325 Orchard Parkway • San Jose CA 95131 • 3/0 3/3 3/0 2000 AT3552M/2K Product Qualification Latch-Up Characterization Device: AT93C56A/66A Lot Number: Lot#c3e5480/3e5480 Quantity Tested: 5 per lot Test Method: JEDEC 78 Final Production Test Program: EPRO Model 142AX Tester @ -40C, 25C, 125C Over Current Test Voltage Vcc = 5.0V Maximum Applied Trigger Current = 200 mA Maximum Applied Trigger Voltage = 7.0 V AT93C56A- c3e5480 AT93C66A- 3e5480 Pin Name Vcc Gnd CS Hold SI WP SCK SO Max Trigger Current Function Power Ground Chip Select Suspend Input Serial Data IN Write Protect Serial Clock Serial Data OUT Tested As Vcc Gnd Input Input Input Input Input Output Max Trigger Voltage Passing* Passing* Compliance Passing* Passing* Compliance +V (V) Setting (mA) -I (mA) +I (mA) Setting (V) -V (V) --------7.0 250 ------------200 200 7.0 ------200 200 7.0 ------200 200 7.0 ------200 200 7.0 ------200 200 7.0 ------200 200 7.0 ------- * 0 Fails for Latchup or Post Stress Functional Tests. Write Endurance Characterization Device: AT93C56A/66A Lot Number: Lot# 3g0848 Quantity Tested: 100 Test Temperature: 25C Vcc: 5 Volts Write Mode: Page Highest Passing Cycles: 1.000,000 Cycles To First Failure: NA • 2325 Orchard Parkway • San Jose CA 95131 •