View detail for AT24C512 Reliability Qualification Report

AT24C512
(AT3552P/T)
2-Wire Bus Serial EEPROM
Product Qualification
• 2325 Orchard Parkway • San Jose CA 95131 •
The AT24C512 2-Wire Bus Serial EEPROM is fabricated on the AT35000 CMOS
process. With the exception of HBM ESD, all tests were performed at Atmel’s
Colorado Springs Facility.
This report summarizes the product level qualification data, ESD, Latchup, and Write
Endurance for the AT24C512 Serial EEPROM. The AT3552P version is a single metal
mask option repositioning the bond pads for the SOIC package. This version was
evaluated for ESD and Latch Up and had the same level of performance as the
AT3552T. This data, in conjunction with the AT35000 Process Qualification and
Reliability Report, qualifies the AT24C512.
Package specific qualification data is provided separately.
• 2325 Orchard Parkway • San Jose CA 95131 •
AT3552T Product Qualification
ESD Characterization
Device: AT24C512 (AT3552T)
Lot Number: 2h1712
Quantity Tested: 3/ lot per Voltage
ESD Stress Equipment:: ORYX Model 11000 ESD Test System; Human Body Mode
Pass/Fail via Final Production Test Program: EPRO Model 142AX Tester
Test per Mil Std 883, Method 3015: 3 Pulses Each Polarity per Specified Pin Combinations
Pin
Name
Vcc
Gnd
A0
A1
A2
WP
SCL
SDA
Function
Tested As
Power
Ground
Address
Address
Address
Write Protect
Serial Clock Input
Serial Data
Vcc
Gnd
Input
Input
Input
Input
Input
Input/Output
Functional Test Only
Failing Pin Not Identified
See Above
3 Positive & 3 Negative Pulses per The Specified Pin
Combinations
Max Passing
Voltage
Qty/Fail
Qty/Fail
Qty/Fail
Qty/Fail
Qty/Fail Voltage
2000V
500V
1000V
4000V
3/0
3/0
3/0
3/3
3/0
3000
3/0
3/0
3/0
3/3
3/0
3000
3/0
3/0
3/0
3/3
3/0
3000
3/0
3/0
3/0
3/3
3/0
3000
3/0
3/0
3/0
3/3
3/0
3000
3/0
3/0
3/0
3/3
3/0
3000
3/0
3/0
3/0
3/3
3/0
3000
3/0
3/0
3/0
3/3
3/0
3000
3/0
3/0
3/0
3/3
3/0
3000
Machine Model Testing – JEDEC Std 22A, Method 115A
Lot Number: 2h6886
1 Positive & 1 Negative Pulse per The Specified Pin Combinations
Max Passing
Voltage
Qty/Fail
Qty/Fail
Pin
Qty/Fail
Qty/Fail
Function
Tested As
Qty/Fail Voltage
50V
150V
Name
100V
200V
Vcc
Power
Vcc
3/0
3/0
3/1
3/0
3/0
200
Gnd
Ground
Gnd
3/0
3/0
3/1
3/0
3/0
200
A0
Address
Input
3/0
3/0
3/1
3/0
3/0
200
A1
Address
Input
3/0
3/0
3/1
3/0
3/0
200
A2
Address
Input
3/0
3/0
3/1
3/0
3/0
200
WP
Write Protect
Input
3/0
3/0
3/1
3/0
3/0
200
SCL
Serial Clock Input
Input
3/0
3/0
3/1
3/0
3/0
200
SDA
Serial Data
Input/Output
3/0
3/0
3/1
3/0
3/0
200
Functional Test Only
Failing Pin Not Identified
See Above
3/0
3/0
3/1
• 2325 Orchard Parkway • San Jose CA 95131 •
3/0
3/0
200
AT3552T Product Qualification
Latch-Up Characterization
Device: AT24C512 (AT3552T)
Lot Number: 2h1712
Quantity Tested: 5 per lot
Test Method: JEDEC 78
Test Temperature: 125C
Over Current Test Voltage Vcc = 5.0V
Maximum Applied Trigger Current = 200 mA
Maximum Applied Trigger Voltage = 7.0 V
Pin
Name
Function
Vcc
Gnd
A0
A1
A2
WP
SCL
SDA
SDA
Power
Ground
Address
Address
Address
Write Protect
Serial Clock Input
Serial Data
Serial Data
Max Trigger Current
Max Trigger Voltage
Complianc
Passing* Passing*
Passing* Passing* Compliance
e Setting
Tested As -I (mA)
+V (V) Setting (mA)
+I (mA)
-V (V)
(V)
Vcc
--------7.0
250
Gnd
------------Input
200
200
7.0
------Input
200
200
7.0
------Input
200
200
7.0
------Input
200
200
7.0
------Input
200
200
7.0
------Input
200
200
7.0
------Output
200
200
7.0
-------
* 0 Fails for Latchup or Post Stress Functional Tests.
Write Endurance Characterization
Device: AT24C512 (3552T)
Lot Number: 2h1712
Quantity Tested: 100
Test Temperature: 25C
Vcc: 5 Volts
Write Mode: Page
Highest Passing Cycles: 500,000
Cycles To First Failure: 600,000
Quantity Failed: 1
• 2325 Orchard Parkway • San Jose CA 95131 •