MICROSEMI APTC60DAM24CT1G

APTC60DAM24CT1G
Boost chopper
Super Junction MOSFET
Power Module
5
6
11
CR1
VDSS = 600V
RDSon = 24mΩ max @ Tj = 25°C
ID = 95A @ Tc = 25°C
Application
• AC and DC motor control
• Switched Mode Power Supplies
• Power Factor Correction
Features
•
3
4
Q2
-
NTC
9
10
•
1
2
-
12
•
•
•
Pins 1/2 ; 3/4 ; 5/6 must be shorted together
Ultra low RDSon
Low Miller capacitance
Ultra low gate charge
Avalanche energy rated
Very rugged
CR1 SiC Schottky Diode
Zero reverse recovery
Zero forward recovery
Temperature Independent switching behavior
Positive temperature coefficient on VF
Very low stray inductance
Internal thermistor for temperature monitoring
High level of integration
Benefits
• Outstanding performance at high frequency operation
• Direct mounting to heatsink (isolated package)
• Low junction to case thermal resistance
• Solderable terminals both for power and signal for
easy PCB mounting
• Low profile
• RoHS Compliant
Absolute maximum ratings
IDM
VGS
RDSon
PD
IAR
EAR
EAS
Tc = 25°C
Tc = 80°C
Continuous Drain Current
Pulsed Drain current
Gate - Source Voltage
Drain - Source ON Resistance
Maximum Power Dissipation
Avalanche current (repetitive and non repetitive)
Repetitive Avalanche Energy
Single Pulse Avalanche Energy
Tc = 25°C
Max ratings
600
95
70
260
±20
24
462
15
3
1900
Unit
V
A
January, 2008
ID
Parameter
Drain - Source Breakdown Voltage
V
mΩ
W
A
mJ
These Devices are sensitive to Electrostatic Discharge. Proper Handling Procedures Should Be Followed. See application note
APT0502 on www.microsemi.com
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1–7
APTC60DAM24CT1G – Rev 0
Symbol
VDSS
APTC60DAM24CT1G
All ratings @ Tj = 25°C unless otherwise specified
Electrical Characteristics
Symbol Characteristic
IDSS
RDS(on)
VGS(th)
IGSS
Zero Gate Voltage Drain Current
Drain – Source on Resistance
Gate Threshold Voltage
Gate – Source Leakage Current
Test Conditions
Min
Typ
Tj = 25°C
Tj = 125°C
VGS = 0V,VDS = 600V
VGS = 0V,VDS = 600V
VGS = 10V, ID = 47.5A
VGS = VDS, ID = 5mA
VGS = ±20 V, VDS = 0V
2.1
3
Min
Typ
14.4
17
Max
350
600
24
3.9
200
Unit
Max
Unit
µA
mΩ
V
nA
Dynamic Characteristics
Symbol Characteristic
Ciss
Input Capacitance
Coss
Output Capacitance
Qg
Total gate Charge
Qgs
Gate – Source Charge
Qgd
Gate – Drain Charge
Td(on)
Turn-on Delay Time
Tr
Td(off)
Tf
Rise Time
Turn-off Delay Time
Fall Time
Eon
Turn-on Switching Energy
Eoff
Turn-off Switching Energy
Eon
Turn-on Switching Energy
Eoff
Turn-off Switching Energy
Test Conditions
VGS = 0V ; VDS = 25V
f = 1MHz
nF
300
VGS = 10V
VBus = 300V
ID = 95A
nC
68
102
21
Inductive Switching (125°C)
VGS = 10V
VBus = 400V
ID = 95A
RG = 2.5Ω
30
ns
100
45
Inductive switching @ 25°C
VGS = 10V ; VBus = 400V
ID = 95A ; RG = 2.5Ω
Inductive switching @ 125°C
VGS = 10V ; VBus = 400V
ID = 95A ; RG = 2.5Ω
810
µJ
1040
1320
µJ
1270
CR1 SiC diode ratings and characteristics
Maximum Reverse Leakage Current
VR=600V
Min
600
Tj = 25°C
Tj = 175°C
Tc = 100°C
Tj = 25°C
Tj = 175°C
Typ
Max
200
400
40
1.6
2.0
800
4000
IF
DC Forward Current
VF
Diode Forward Voltage
IF = 40A
QC
Total Capacitive Charge
IF = 40A, VR = 300V
di/dt =1200A/µs
56
C
Total Capacitance
f = 1MHz, VR = 200V
260
f = 1MHz, VR = 400V
200
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Unit
V
µA
A
1.8
2.4
V
nC
January, 2008
IRM
Test Conditions
pF
2–7
APTC60DAM24CT1G – Rev 0
Symbol Characteristic
VRRM Maximum Peak Repetitive Reverse Voltage
APTC60DAM24CT1G
Thermal and package characteristics
Symbol Characteristic
RthJC
VISOL
TJ
TSTG
TC
Torque
Wt
Min
Junction to Case Thermal Resistance
RMS Isolation Voltage, any terminal to case t =1 min, I isol<1mA, 50/60Hz
Operating junction temperature range
Storage Temperature Range
Operating Case Temperature
Mounting torque
Package Weight
Typ
Transistor
SiC Diode
To heatsink
M4
2500
-40
-40
-40
2.5
Max
0.27
0.8
Unit
°C/W
V
150
125
100
4.7
80
°C
N.m
g
Temperature sensor NTC (see application note APT0406 on www.microsemi.com for more information).
Symbol
R25
∆R25/R25
B25/85
∆B/B
Characteristic
Resistance @ 25°C
Min
T25 = 298.15 K
TC=100°C
RT =
R25
Typ
50
5
3952
4
Max
Unit
kΩ
%
K
%
T: Thermistor temperature
⎡
⎛ 1
1 ⎞⎤ RT: Thermistor value at T
exp ⎢ B25 / 85 ⎜⎜
− ⎟⎟⎥
T
T
⎝ 25
⎠⎦
⎣
See application note 1904 - Mounting Instructions for SP1 Power Modules on www.microsemi.com
www.microsemi.com
3–7
APTC60DAM24CT1G – Rev 0
January, 2008
SP1 Package outline (dimensions in mm)
APTC60DAM24CT1G
Typical CoolMOS Performance Curve
Maximum Effective Transient Thermal Impedance, Junction to Case vs Pulse Duration
Thermal Impedance (°C/W)
0.3
0.9
0.25
0.7
0.2
0.5
0.15
0.3
0.1
0.1
0.05
Single Pulse
0.05
0
0.00001
0.0001
0.001
0.01
0.1
1
10
rectangular Pulse Duration (Seconds)
Transfert Characteristics
Low Voltage Output Characteristics
280
720
VGS=15&10V
6.5V
560
ID, Drain Current (A)
6V
480
400
5.5V
320
240
5V
160
4.5V
80
4V
0
VDS > ID(on)xRDS(on)MAX
250µs pulse test @ < 0.5 duty cycle
240
200
160
120
80
TJ=125°C
40
TJ=25°C
0
0
5
10
15
20
25
0
Normalized to
VGS=10V @ 95A
1.25
1.2
VGS=10V
1.15
1.1
1
2
3
4
5
6
VGS, Gate to Source Voltage (V)
7
DC Drain Current vs Case Temperature
100
RDS(on) vs Drain Current
1.3
VGS=20V
1.05
1
0.95
ID, DC Drain Current (A)
0.9
80
60
40
20
0
0
40
80
120 160 200 240 280
ID, Drain Current (A)
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25
50
75
100
125
TC, Case Temperature (°C)
January, 2008
RDS(on) Drain to Source ON Resistance
VDS, Drain to Source Voltage (V)
150
4–7
APTC60DAM24CT1G – Rev 0
ID, Drain Current (A)
640
1.1
1.0
0.9
0.8
25
50
75
100
125
150
ON resistance vs Temperature
3.0
2.0
1.5
1.0
0.5
0.0
25
TJ, Junction Temperature (°C)
1000
1.0
ID, Drain Current (A)
0.9
0.8
0.7
limited by RDSon
100
100 µs
0.6
1 ms
Single pulse
TJ=150°C
TC=25°C
10
10 ms
1
25
50
75
100
125
150
1
Coss
Ciss
10000
1000
Crss
10
0
1000
Gate Charge vs Gate to Source Voltage
VGS, Gate to Source Voltage (V)
Capacitance vs Drain to Source Voltage
1000000
100
100
VDS, Drain to Source Voltage (V)
TC, Case Temperature (°C)
100000
10
10
20
30
40
50
VDS, Drain to Source Voltage (V)
www.microsemi.com
12
ID=95A
TJ=25°C
10
VDS=120V
VDS=300V
8
VDS=480V
6
4
2
0
0
40
80 120 160 200 240 280 320
Gate Charge (nC)
January, 2008
VGS(TH), Threshold Voltage
(Normalized)
50
75
100
125
150
TJ, Junction Temperature (°C)
Maximum Safe Operating Area
Threshold Voltage vs Temperature
1.1
C, Capacitance (pF)
VGS=10V
ID= 95A
2.5
5–7
APTC60DAM24CT1G – Rev 0
BVDSS, Drain to Source Breakdown
Voltage (Normalized)
Breakdown Voltage vs Temperature
1.2
RDS(on), Drain to Source ON resistance
(Normalized)
APTC60DAM24CT1G
APTC60DAM24CT1G
Delay Times vs Current
140
Rise and Fall times vs Current
70
VDS=400V
RG=2.5Ω
TJ=125°C
L=100µH
60
100
td(off)
tr and tf (ns)
VDS=400V
RG=2.5Ω
TJ=125°C
L=100µH
80
60
40
td(on)
20
50
40
30
tr
20
10
0
0
0
20 40 60 80 100 120 140 160
0
20
40
ID, Drain Current (A)
Switching Energy vs Gate Resistance
Eoff
Switching Energy (mJ)
Eon
1.5
1
0.5
0
VDS=400V
ID=95A
TJ=125°C
L=100µH
4
3
Eoff
Eon
2
1
0
0
20
40 60 80 100 120 140 160
ID, Drain Current (A)
0
Operating Frequency vs Drain Current
VDS=400V
D=50%
RG=2.5Ω
TJ=125°C
TC=75°C
ZCS
250
ZVS
200
150
100
IDR, Reverse Drain Current (A)
300
hard
switching
50
0
10
20
30
40
50
60
70
80
5
10
15
20
25
Gate Resistance (Ohms)
90
ID, Drain Current (A)
Source to Drain Diode Forward Voltage
1000
TJ=150°C
100
TJ=25°C
10
1
0.3
0.5
0.7
0.9
1.1
1.3
1.5
January, 2008
Switching Energy (mJ)
2
80 100 120 140 160
5
VDS=400V
RG=2.5Ω
TJ=125°C
L=100µH
2.5
60
ID, Drain Current (A)
Switching Energy vs Current
3
Frequency (kHz)
tf
VSD, Source to Drain Voltage (V)
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6–7
APTC60DAM24CT1G – Rev 0
td(on) and td(off) (ns)
120
APTC60DAM24CT1G
Typical CR1 SiC Diode Performance Curve
Maximum Effective Transient Thermal Impedance, Junction to Case vs Pulse Duration
Thermal Impedance (°C/W)
0.9
0.8
0.9
0.7
0.7
0.6
0.5
0.5
0.4
0.3
0.3
0.2
0.1
0.1
Single Pulse
0.05
0
0.00001
0.0001
0.001
0.01
0.1
1
10
Rectangular Pulse Duration (Seconds)
800
TJ=25°C
60
TJ=75°C
IR Reverse Current (µA)
IF Forward Current (A)
Reverse Characteristics
Forward Characteristics
80
TJ=175°C
40
TJ=125°C
20
0
0
0.5
1
1.5
2
2.5
3
3.5
700
TJ=175°C
600
500
TJ=125°C
TJ=75°C
400
300
200
TJ=25°C
100
0
200
300
400
500
600
700
800
VR Reverse Voltage (V)
VF Forward Voltage (V)
Capacitance vs.Reverse Voltage
1600
C, Capacitance (pF)
1400
1200
1000
800
600
400
200
10
100
VR Reverse Voltage
1000
“COOLMOS™ comprise a new family of transistors developed by Infineon Technologies AG. “COOLMOS” is a trademark of Infineon
Technologies AG”.
Microsemi reserves the right to change, without notice, the specifications and information contained herein
Microsemi's products are covered by one or more of U.S patents 4,895,810 5,045,903 5,089,434 5,182,234 5,019,522 5,262,336 6,503,786 5,256,583 4,748,103
5,283,202 5,231,474 5,434,095 5,528,058 6,939,743 7,352,045 5,283,201 5,801,417 5,648,283 7,196,634 6,664,594 7,157,886 6,939,743 7,342,262
and foreign patents. U.S and Foreign patents pending. All Rights Reserved.
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7–7
APTC60DAM24CT1G – Rev 0
1
January, 2008
0