PD - 9.1373A IRFI1010N HEXFET® Power MOSFET l l l l l Advanced Process Technology Isolated Package High Voltage Isolation = 2.5KVRMS Sink to Lead Creepage Dist. = 4.8mm Fully Avalanche Rated D VDSS = 55V RDS(on) = 0.012Ω G ID = 49A S Description Fifth Generation HEXFETs from International Rectifier utilize advanced processing techniques to achieve extremely low on-resistance per silicon area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET Power MOSFETs are well known for, provides the designer with an extremely efficient and reliable device for use in a wide variety of applications. The TO-220 Fullpak eliminates the need for additional insulating hardware in commercial-industrial applications. The moulding compound used provides a high isolation capability and a low thermal resistance between the tab and external heatsink. This isolation is equivalent to using a 100 micron mica barrier with standard TO-220 product. The Fullpak is mounted to a heatsink using a single clip or by a single screw fixing. TO-220 FULLPAK Absolute Maximum Ratings Parameter ID @ TC = 25°C ID @ TC = 100°C IDM PD @TC = 25°C VGS EAS IAR EAR dv/dt TJ TSTG Continuous Drain Current, VGS @ 10V Continuous Drain Current, VGS @ 10V Pulsed Drain Current Power Dissipation Linear Derating Factor Gate-to-Source Voltage Single Pulse Avalanche Energy Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt Operating Junction and Storage Temperature Range Soldering Temperature, for 10 seconds Mounting torque, 6-32 or M3 srew Max. Units 49 35 290 58 0.38 ± 20 360 43 5.8 5.0 -55 to + 175 A W W/°C V mJ A mJ V/ns °C 300 (1.6mm from case ) 10 lbf•in (1.1N•m) Thermal Resistance Parameter RθJC RθJA Junction-to-Case Junction-to-Ambient Typ. Max. Units ––– ––– 2.6 65 °C/W 8/25/97 IRFI1010N Electrical Characteristics @ TJ = 25°C (unless otherwise specified) RDS(on) VGS(th) gfs Parameter Drain-to-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient Static Drain-to-Source On-Resistance Gate Threshold Voltage Forward Transconductance Qg Q gs Q gd t d(on) tr t d(off) tf Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Total Gate Charge Gate-to-Source Charge Gate-to-Drain ("Miller") Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Min. 55 ––– ––– 2.0 30 ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– Typ. ––– 0.06 ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– 11 66 40 46 IDSS Drain-to-Source Leakage Current LD Internal Drain Inductance ––– 4.5 LS Internal Source Inductance ––– 7.5 Ciss Coss Crss C Input Capacitance Output Capacitance Reverse Transfer Capacitance Drain to Sink Capacitance ––– ––– ––– ––– 2900 880 330 12 V(BR)DSS ∆V(BR)DSS/∆TJ I GSS Max. Units Conditions ––– V VGS = 0V, ID = 250µA ––– V/°C Reference to 25°C, I D = 1mA 0.012 Ω VGS = 10V, ID = 26A 4.0 V VDS = VGS, I D = 250µA ––– S VDS = 25V, ID = 43A 25 VDS = 55V, VGS = 0V µA 250 VDS = 44V, VGS = 0V, TJ = 150°C 100 V GS = 20V nA -100 VGS = -20V 130 ID = 43A 23 nC VDS = 44V 53 VGS = 10V, See Fig. 6 and 13 ––– VDD = 28V ––– I D = 43A ns ––– RG = 3.6Ω ––– RD = 0.62Ω, See Fig. 10 Between lead, ––– 6mm (0.25in.) nH G from package ––– and center of die contact ––– VGS = 0V ––– V DS = 25V pF ––– ƒ = 1.0MHz, See Fig. 5 ––– ƒ = 1.0MHz D S Source-Drain Ratings and Characteristics IS ISM VSD t rr Q rr Parameter Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Diode Forward Voltage Reverse Recovery Time Reverse RecoveryCharge Min. Typ. Max. Units ––– ––– 49 ––– ––– 290 ––– ––– ––– ––– 81 240 1.3 120 370 A V ns nC Conditions MOSFET symbol showing the G integral reverse p-n junction diode. TJ = 25°C, IS = 26A, VGS = 0V TJ = 25°C, IF = 43A di/dt = 100A/µs Notes: Repetitive rating; pulse width limited by Pulse width ≤ 300µs; duty cycle ≤ 2%. max. junction temperature. ( See fig. 11 ) VDD = 25V, starting TJ = 25°C, L = 390µH t=60s, ƒ=60Hz RG = 25Ω, IAS = 43A. (See Figure 12) ISD ≤ 43A, di/dt ≤ 260A/µs, VDD ≤ V(BR)DSS, TJ ≤ 175°C Uses IRF1010N data and test conditions D S IRFI1010N 1000 1000 VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V BOTT OM 4.5V VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V BOTT OM 4.5V TOP I , D ra in -to -S o u rce C u rre n t (A ) D I , D ra in -to -S o u rce C u rre n t (A ) D TOP 100 4.5 V 2 0µ s PU LSE W ID TH TC = 2 5°C 10 0.1 1 10 A 100 4 .5V 10 100 0.1 V D S , D rain-to-S ource V oltage (V ) R D S (o n ) , D ra in -to -S o u rc e O n R e sis ta n c e (N o rm a liz e d ) I D , D r ain- to-S ourc e C urre nt (A ) 3.0 TJ = 2 5 ° C TJ = 1 7 5 ° C 10 V DS = 2 5 V 2 0 µ s P U L SE W ID TH 4 5 6 7 8 9 V G S , Ga te-to-S o urce V oltage (V ) Fig 3. Typical Transfer Characteristics 10 A 100 Fig 2. Typical Output Characteristics 1000 1 1 V D S , Drain-to-Source V oltage (V) Fig 1. Typical Output Characteristics 100 20 µs P UL SE W IDTH TC = 17 5°C 10 A I D = 72 A 2.5 2.0 1.5 1.0 0.5 V G S = 10 V 0.0 -60 -40 -20 0 20 40 60 80 A 100 120 140 160 180 T J , Junction T emperature (°C) Fig 4. Normalized On-Resistance Vs. Temperature IRFI1010N 4000 V GS C is s C rs s C is s C o ss 3000 C os s 20 = 0 V, f = 1M H z = C gs + C gd , Cds SH O RTE D = C gd = C ds + C g d V G S , G a te -to -S o u rc e V o lta g e (V ) C , C a p a c ita n c e (p F ) 5000 I D = 4 3A V DS = 4 4V V DS = 2 8V 16 12 2000 C rs s 1000 0 10 4 FO R TES T C IR CU IT SEE FIG U R E 13 0 A 1 8 100 0 V D S , Drain-to-Source V oltage (V) 40 60 80 100 120 A 140 Q G , Total Gate Charge (nC ) Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage 1000 1000 OPE R ATIO N IN TH IS A RE A LIMITE D BY R D S(o n) 100 I D , D ra in C u rre n t (A ) I S D , R e ve rs e D ra in C u rre n t (A ) 20 TJ = 17 5°C T J = 25°C 10µ s 100 100µ s 1m s 10 10m s V G S = 0V 10 0.4 0.8 1.2 1.6 2.0 2.4 V S D , S ource-to-Drain Voltage (V ) Fig 7. Typical Source-Drain Diode Forward Voltage A 2.8 T C = 25 °C T J = 17 5°C S ing le Pulse 1 1 A 10 100 V D S , Drain-to-Source Voltage (V) Fig 8. Maximum Safe Operating Area IRFI1010N VGS D.U.T. RG 40 I D , Drain Current (A) RD VDS 50 + - VDD 10V 30 Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 % 20 Fig 10a. Switching Time Test Circuit VDS 90% 10 0 25 50 75 100 125 T C , Case Temperature 150 175 10% VGS ( ° C) td(on) Fig 9. Maximum Drain Current Vs. Case Temperature tr t d(off) tf Fig 10b. Switching Time Waveforms Thermal Response (Z thJC ) 10 D = 0.50 1 0.20 0.10 0.05 0.1 PDM t1 0.02 0.01 t2 SINGLE PULSE (THERMAL RESPONSE) 0.01 0.00001 0.0001 Notes: 1. Duty factor D = t1 / t 2 2. Peak T J = P DM x Z thJC + T C 0.001 0.01 0.1 1 t1, Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case 10 IRFI1010N 15 V L VDS D R IV E R D .U .T RG + V - DD IA S 20V 0 .0 1 Ω tp Fig 12a. Unclamped Inductive Test Circuit V (BR )D SS tp A E A S , S in g le P u lse A va la n c h e E n e rg y (m J ) 1000 TO P BO TTOM 800 ID 1 8A 31A 43 A 600 400 200 0 V D D = 2 5V 25 50 A 75 100 125 150 175 Starting TJ , Junction T emperature (°C) Fig 12c. Maximum Avalanche Energy Vs. Drain Current I AS Fig 12b. Unclamped Inductive Waveforms Current Regulator Same Type as D.U.T. 50KΩ 12V .2µF QG .3µF 10 V QGS D.U.T. QGD VGS VG 3mA IG Charge Fig 13a. Basic Gate Charge Waveform ID Current Sampling Resistors Fig 13b. Gate Charge Test Circuit + V - DS IRFI1010N Peak Diode Recovery dv/dt Test Circuit + D.U.T Circuit Layout Considerations • Low Stray Inductance • Ground Plane • Low Leakage Inductance Current Transformer + - - + • • • • RG Driver Gate Drive P.W. + dv/dt controlled by RG Driver same type as D.U.T. ISD controlled by Duty Factor "D" D.U.T. - Device Under Test Period D= - VDD P.W. Period VGS=10V D.U.T. ISD Waveform Reverse Recovery Current Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt Re-Applied Voltage Body Diode VDD Forward Drop Inductor Curent Ripple ≤ 5% * VGS = 5V for Logic Level Devices Fig 14. For N-Channel HEXFETS ISD * IRFI1010N Package Outline TO-220 Fullpak Outline Dimensions are shown in millimeters (inches) 10.60 (.417 ) 10.40 (.409 ) ø 3 .40 (.1 33) 3 .10 (.1 23) 4.80 (.189 ) 4.60 (.181 ) -A3.7 0 (.145) 3.2 0 (.126) 16 .0 0 (.630) 15 .8 0 (.622) 2.80 (.110) 2.60 (.102) L EA D AS SIGN M EN T S 1 - GA T E 2 - D R AIN 3 - SO U R C E 7.10 (.280 ) 6.70 (.263 ) 1.15 (.045) M IN . NO T ES : 1 D IM E N SION IN G & T O LER AN C IN G PE R A N SI Y1 4.5M , 1982 1 2 3 2 C O N T R OLL IN G D IM EN SION : IN C H . 3.30 (.130) 3.10 (.122) -B - 13 .7 0 (.540) 13 .5 0 (.530) C A 1.40 (.05 5) 3X 1.05 (.04 2) 0.90 (.035 ) 3X 0.70 (.028 ) 0.25 (.010) 2 .5 4 (.100) 2X 3X M A M B 0.48 (.019 ) 0.44 (.017 ) 2.85 (.1 12) 2.65 (.1 04) D B M IN IM U M C R E EP AG E D IST A N C E B ET W E EN A -B -C -D = 4.80 (.189 ) Part Marking Information TO-220 Fullpak E X AM PL E PLE : TH I S AISN AIR 010 E XAM : IST HIS N F1IRF I840G W ITW H ITH A S SAS E MB SELY MBLY E401 L OTLOT CO DCODE E 9 B1M A I NT E RN A TIO N AL INT ER NAT IONA L R E C TIF IE R IRF 10 RE CTIF IER IRF10 I840G LOG O 9246 LOGO 9BE 401 19 M 24 5 A SS MB LY ASESE MBLY LOT EE LOT C OD COD P AR T NU M BE R A PA RT NU MBE R D A TE C OD E (YDYW ATEW )CODE W )A R Y(YYW Y = YE ARK WYY W == YE W EE W W = W E EK WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331 EUROPEAN HEADQUARTERS: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020 IR CANADA: 7321 Victoria Park Ave., Suite 201, Markham, Ontario L3R 2Z8, Tel: (905) 475 1897 IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590 IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111 IR FAR EAST: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo Japan 171 Tel: 81 3 3983 0086 IR SOUTHEAST ASIA: 315 Outram Road, #10-02 Tan Boon Liat Building, Singapore 0316 Tel: 65 221 8371 http://www.irf.com/ Data and specifications subject to change without notice. 8/97