PD - 9.1409A IRFP048N HEXFET® Power MOSFET l l l l l Advanced Process Technology Dynamic dv/dt Rating 175°C Operating Temperature Fast Switching Fully Avalanche Rated D VDSS = 55V RDS(on) = 0.016Ω G Description ID = 64A S Fifth Generation HEXFETs from International Rectifier utilize advanced processing techniques to achieve extremely low on-resistance per silicon area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET Power MOSFETs are well known for, provides the designer with an extremely efficient and reliable device for use in a wide variety of applications. The TO-247 package is preferred for commercialindustrial applications where higher power levels preclude the use of TO-220 devices. The TO-247 is similar but superior to the earlier TO-218 package because of its isolated mounting hole. TO-247AC Absolute Maximum Ratings ID @ TC = 25°C ID @ TC = 100°C IDM PD @TC = 25°C VGS EAS IAR EAR dv/dt TJ TSTG Parameter Max. Continuous Drain Current, VGS @ 10V Continuous Drain Current, VGS @ 10V Pulsed Drain Current Power Dissipation Linear Derating Factor Gate-to-Source Voltage Single Pulse Avalanche Energy Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt Operating Junction and Storage Temperature Range Soldering Temperature, for 10 seconds Mounting torque, 6-32 or M3 srew 64 45 210 140 0.90 ± 20 270 32 14 5.0 -55 to + 175 Units A W W/°C V mJ A mJ V/ns °C 300 (1.6mm from case ) 10 lbf•in (1.1N•m) Thermal Resistance Parameter RθJC RθCS RθJA Junction-to-Case Case-to-Sink, Flat, Greased Surface Junction-to-Ambient Typ. Max. Units ––– 0.24 ––– 1.1 ––– 40 °C/W 8/25/97 IRFP048N Electrical Characteristics @ TJ = 25°C (unless otherwise specified) RDS(on) VGS(th) gfs Parameter Drain-to-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient Static Drain-to-Source On-Resistance Gate Threshold Voltage Forward Transconductance Qg Q gs Q gd t d(on) tr t d(off) tf Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Total Gate Charge Gate-to-Source Charge Gate-to-Drain ("Miller") Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Min. 55 ––– ––– 2.0 22 ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– Typ. ––– 0.052 ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– 11 78 32 48 IDSS Drain-to-Source Leakage Current LD Internal Drain Inductance ––– 5.0 LS Internal Source Inductance ––– 13 Ciss Coss Crss Input Capacitance Output Capacitance Reverse Transfer Capacitance ––– ––– ––– 1900 620 270 V(BR)DSS ∆V(BR)DSS/∆TJ I GSS Max. Units Conditions ––– V VGS = 0V, ID = 250µA ––– V/°C Reference to 25°C, I D = 1mA 0.016 Ω VGS = 10V, ID = 37A 4.0 V VDS = VGS , ID = 250µA ––– S VDS = 25V, I D = 32A 25 VDS = 55V, VGS = 0V µA 250 VDS = 44V, VGS = 0V, TJ = 150°C 100 V GS = 20V nA -100 VGS = -20V 89 ID = 32A 20 nC VDS = 44V 39 V GS = 10V, See Fig. 6 and 13 ––– VDD = 28V ––– I D = 32A ns ––– RG = 5.1Ω ––– RD = 0.85Ω, See Fig. 10 D Between lead, ––– 6mm (0.25in.) nH G from package ––– and center of die contact S ––– VGS = 0V ––– pF VDS = 25V ––– ƒ = 1.0MHz, See Fig. 5 Source-Drain Ratings and Characteristics IS ISM VSD t rr Q rr Parameter Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Diode Forward Voltage Reverse Recovery Time Reverse RecoveryCharge Min. Typ. Max. Units ––– ––– 45 ––– ––– 210 ––– ––– ––– ––– 94 360 1.3 140 540 A V ns nC Conditions MOSFET symbol showing the G integral reverse p-n junction diode. TJ = 25°C, IS = 37A, VGS = 0V TJ = 25°C, IF = 32A di/dt = 100A/µs Notes: Repetitive rating; pulse width limited by max. junction temperature. ( See fig. 11 ) VDD = 25V, starting TJ = 25°C, L = 530µH RG = 25Ω, IAS = 32A. (See Figure 12) ISD ≤ 32A, di/dt ≤ 250A/µs, VDD ≤ V(BR)DSS, TJ ≤ 175°C Pulse width ≤ 300µs; duty cycle ≤ 2%. Uses IRFZ48N data and test conditions D S IRFP048N 1000 1000 VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V BOTT OM 4.5V 100 10 1 4 .5V 2 0µ s PU LSE W ID TH TC = 2 5°C 0.1 0.1 1 10 A 100 10 4.5 V 1 0.1 2.5 R D S (o n ) , D ra in -to -S o u rc e O n R e si sta n ce (N o rm a li ze d ) I D , D r ain- to-S ourc e C urre nt (A ) 100 TJ = 1 7 5 ° C 10 TJ = 2 5 ° C 1 V DS = 2 5 V 2 0 µ s P U L SE W ID TH 6 7 8 9 V G S , Ga te-to-S o urce V oltage (V ) Fig 3. Typical Transfer Characteristics 10 A 100 Fig 2. Typical Output Characteristics 1000 5 1 V D S , Drain-to-Source V oltage (V) Fig 1. Typical Output Characteristics 0.1 20 µs P UL SE W IDTH TC = 17 5°C 0.1 100 V D S , D rain-to-S ource V oltage (V ) 4 VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V BOTT OM 4.5V TOP I , D ra in -to -S o u rc e C u rre n t (A ) D I , D ra in -to -S o u rce C u rre n t (A ) D TOP 10 A I D = 53 A 2.0 1.5 1.0 0.5 V G S = 10 V 0.0 -60 -40 -20 0 20 40 60 80 A 100 120 140 160 180 T J , Junction T emperature (°C) Fig 4. Normalized On-Resistance Vs. Temperature IRFP048N V GS C is s C rs s C o ss 20 = 0 V, f = 1M H z = C gs + C gd , Cds SH O RTE D = C gd = C ds + C g d V G S , G a te -to -S o u rc e V o lta g e (V ) C , C a p a c ita n c e (p F ) 4000 I D = 3 2A V DS= 4 4V V DS= 2 8V 16 3000 C is s 12 C os s 2000 C rs s 1000 0 10 4 FO R TES T C IR CU IT SEE FIG U R E 13 0 A 1 8 100 0 V D S , Drain-to-Source V oltage (V) 40 60 80 A 100 Q G , Total Gate Charge (nC ) Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage 1000 1000 O PER ATIO N IN T HIS AR EA LIMITE D BY R DS (on) 100 I D , D ra in C u rre n t (A ) I S D , R e v e rse D ra in C u rre n t (A ) 20 TJ = 1 75 °C TJ = 2 5°C 10 10µ s 100 1 00µs 10 1 ms 1 10m s VG S = 0 V 0.1 0.2 0.6 1.0 1.4 1.8 2.2 V S D , S ource-to-Drain Voltage (V ) Fig 7. Typical Source-Drain Diode Forward Voltage A 2.6 T C = 25 °C T J = 17 5°C S in gle Pu lse 1 1 A 10 100 V D S , D rain-to-S ource Voltage (V) Fig 8. Maximum Safe Operating Area IRFP048N 70 RD VDS I D , Drain Current (A) 60 VGS D.U.T. RG 50 + - VDD 40 10V Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 % 30 Fig 10a. Switching Time Test Circuit 20 VDS 10 90% 0 25 50 75 100 125 TC , Case Temperature 150 175 ( ° C) 10% VGS Fig 9. Maximum Drain Current Vs. Case Temperature td(on) tr t d(off) tf Fig 10b. Switching Time Waveforms Thermal Response (Z thJC ) 10 1 D = 0.50 0.20 PDM 0.10 0.1 0.05 0.02 0.01 0.01 0.00001 t1 t2 SINGLE PULSE (THERMAL RESPONSE) 0.0001 Notes: 1. Duty factor D = t 1 / t 2 2. Peak T J = P DM x Z thJC + TC 0.001 0.01 0.1 t1, Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case 1 IRFP048N 15 V L VDS D .U .T RG IA S 20V D R IV E R + V - DD 0 .0 1 Ω tp Fig 12a. Unclamped Inductive Test Circuit A E A S , S in g le P u ls e A va la n c h e E n e rg y (m J) 700 TO P 600 B OTTO M ID 13 A 2 2A 32 A 500 400 300 200 100 VD D = 2 5V 0 25 50 V (BR )D SS A 75 100 125 150 175 Starting T J , Junction Temperature (°C) tp Fig 12c. Maximum Avalanche Energy Vs. Drain Current I AS Fig 12b. Unclamped Inductive Waveforms Current Regulator Same Type as D.U.T. 50KΩ QG 12V .2µF .3µF 10 V QGS D.U.T. QGD + V - DS VGS VG 3mA Charge Fig 13a. Basic Gate Charge Waveform IG ID Current Sampling Resistors Fig 13b. Gate Charge Test Circuit IRFP048N Peak Diode Recovery dv/dt Test Circuit + D.U.T Circuit Layout Considerations • Low Stray Inductance • Ground Plane • Low Leakage Inductance Current Transformer + - - + • • • • RG Driver Gate Drive P.W. + dv/dt controlled by RG Driver same type as D.U.T. ISD controlled by Duty Factor "D" D.U.T. - Device Under Test Period D= - VDD P.W. Period VGS=10V D.U.T. ISD Waveform Reverse Recovery Current Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt Re-Applied Voltage Body Diode VDD Forward Drop Inductor Curent Ripple ≤ 5% ISD * VGS = 5V for Logic Level Devices Fig 14. For N-Channel HEXFETS * IRFP048N Package Outline TO-247AC Outline Dimensions are shown in millimeters (inches) -D - 3 .6 5 (.1 4 3 ) 3 .5 5 (.1 4 0 ) 1 5 .90 (.6 2 6) 1 5 .30 (.6 0 2) -B - 0 .25 (.0 1 0) M D B M -A 5 .5 0 (.2 1 7 ) 2 0 .3 0 (.80 0 ) 1 9 .7 0 (.77 5 ) 2X 1 2 5 .3 0 (.2 0 9 ) 4 .7 0 (.1 8 5 ) 2 .5 0 (.0 8 9) 1 .5 0 (.0 5 9) 4 NOT ES : 5. 50 (.2 17 ) 4. 50 (.1 77 ) 1 DIME NSIO NING & TO LERAN CING PE R AN SI Y 14.5M, 1982. 2 CO NTRO LLING DIMENS IO N : IN CH . 3 CO NF ORM S T O JEDE C O UTLINE T O-247-A C. 3 -C - 1 4.8 0 (.5 8 3 ) 1 4.2 0 (.5 5 9 ) 2 .4 0 (.09 4 ) 2 .0 0 (.07 9 ) 2X 5 .45 (.2 1 5) 2X 4 .3 0 (.1 7 0 ) 3 .7 0 (.1 4 5 ) 0 .8 0 (. 03 1 ) 3 X 0 .4 0 (. 01 6 ) 1 .4 0 (.0 56 ) 3 X 1 .0 0 (.0 39 ) 0 .25 (.0 10 ) M 3 .4 0 (.1 3 3 ) 3 .0 0 (.1 1 8 ) C A S 2.6 0 (.10 2 ) 2.2 0 (.08 7 ) LEAD AS SIGN MENT S 1 2 3 4 - G ATE DRAIN SO URCE DRAIN Part Marking Information TO-247AC E X AM PLE : T HI S IS A N IRF 1010 E XAM P LW E IT : HT HAISS SISE MB AN LY IR F PE 30 IT H AS SE M BL Y LO T WCO DE 9B 1M LOT C ODE 3A 1Q A IN TE R NA T ION A L IN TE R N A TIO N A L R EC T IF IER R E C T IF IE R LO L O GGO O IRIR FPFE3 0 1010 9246 3A 19B Q 9 31M 02 A SMSBL EMY B LY A SSE L O TLO TC O DCO E DE A P AR M BM ERBE R P ATRTN UNU D A TE C OD E D A TE C O D E (Y YW W ) (YYW W ) Y Y = YE A R YY = YE AR = W WW W WW EE K E EK WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331 EUROPEAN HEADQUARTERS: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020 IR CANADA: 7321 Victoria Park Ave., Suite 201, Markham, Ontario L3R 2Z8, Tel: (905) 475 1897 IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590 IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111 IR FAR EAST: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo Japan 171 Tel: 81 3 3983 0086 IR SOUTHEAST ASIA: 315 Outram Road, #10-02 Tan Boon Liat Building, Singapore 0316 Tel: 65 221 8371 http://www.irf.com/ Data and specifications subject to change without notice. 8/97