IRF IRF7NJZ44V

PD - 94433
HEXFET® POWER MOSFET
SURFACE MOUNT (SMD-0.5)
IRF7NJZ44V
60V, N-CHANNEL
Product Summary
Part Number
BVDSS
IRF7NJZ44V
60V
RDS(on)
0.0165Ω
ID
22A*
Seventh Generation HEXFET® power MOSFETs from
International Rectifier utilize advanced processing
techniques to achieve the lowest possible on-resistance
per silicon unit area. This benefit, combined with the
fast switching speed and ruggedized device design
that HEXFET power MOSFETs are well known for,
provides the designer with an extremely efficient device
for use in a wide variety of applications.
These devices are well-suited for applications such
as switching power supplies, motor controls, inverters, choppers, audio amplifiers and high-energy pulse
circuits.
SMD-0.5
Features:
n
n
n
n
n
n
n
n
Low RDS(on)
Avalanche Energy Ratings
Dynamic dv/dt Rating
Simple Drive Requirements
Ease of Paralleling
Hermetically Sealed
Surface Mount
Light Weight
Absolute Maximum Ratings
Parameter
ID @ VGS = 10V, TC = 25°C
ID @ VGS = 10V, TC = 100°C
IDM
PD @ TC = 25°C
VGS
EAS
IAR
EAR
dv/dt
TJ
T STG
Units
Continuous Drain Current
Continuous Drain Current
Pulsed Drain Current ➀
Max. Power Dissipation
Linear Derating Factor
Gate-to-Source Voltage
Single Pulse Avalanche Energy ➁
Avalanche Current ➀
Repetitive Avalanche Energy ➀
Peak Diode Recovery dv/dt ➂
Operating Junction
Storage Temperature Range
22*
22*
88
50
0.4
±20
66
22
5.0
2.2
-55 to 150
Package Mounting Surface Temp.
Weight
300 (for 5s)
1.0 (Typical)
A
W
W/°C
V
mJ
A
mJ
V/ns
o
C
g
* Current is limited by package and internal wires
For footnotes refer to the last page
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1
04/24/02
IRF7NJZ44V
Electrical Characteristics @ Tj = 25°C (Unless Otherwise Specified)
Min
Typ Max Units
Test Conditions
60
—
—
V
VGS = 0V, ID = 250µA
—
0.056
—
V/°C
Reference to 25°C, ID = 1.0mA
—
—
0.0165
Ω
2.0
24
—
—
—
—
—
—
4.0
—
25
250
V
S( )
IGSS
IGSS
Qg
Q gs
Q gd
td(on)
tr
td(off)
tf
LS + LD
Gate-to-Source Leakage Forward
Gate-to-Source Leakage Reverse
Total Gate Charge
Gate-to-Source Charge
Gate-to-Drain (‘Miller’) Charge
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Total Inductance
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
4.0
100
-100
67
18
25
20
120
60
90
—
Ciss
C oss
C rss
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
—
—
—
1723
370
70
—
—
—
VGS = 10V, ID = 22A ➃
Ω
Parameter
BVDSS
Drain-to-Source Breakdown Voltage
∆BV DSS/∆T J Temperature Coefficient of Breakdown
Voltage
RDS(on)
Static Drain-to-Source On-State
Resistance
VGS(th)
Gate Threshold Voltage
gfs
Forward Transconductance
IDSS
Zero Gate Voltage Drain Current
µA
nA
nC
VDS = VGS, ID = 250µA
VDS =15V, IDS = 22A ➃
VDS = 60V ,VGS=0V
VDS = 48V,
VGS = 0V, TJ =125°C
VGS =-20V
VGS = -20V
VGS =10V, ID = 22A
VDS = 48V
VDD = 30V, ID = 22A,
VGS = 10V, RG = 7.5Ω
ns
nH Measured from the center of drain
pad to the center of source pad
l
VGS = 0V, VDS = 25V
f = 1.0MHz
pF
Source-Drain Diode Ratings and Characteristics
Parameter
IS
ISM
VSD
t rr
QRR
ton
Min Typ Max Units
Continuous Source Current (Body Diode)
Pulse Source Current (Body Diode) ➀
Diode Forward Voltage
Reverse Recovery Time
Reverse Recovery Charge
Forward Turn-On Time
—
—
—
—
—
—
—
—
—
—
22*
88
1.5
105
250
Test Conditions
A
V
ns
nC
Tj = 25°C, IS = 22A, VGS = 0V ➃
Tj = 25°C, IF = 22A, di/dt ≤ 100A/µs
VDD ≤ 25V ➃
Intrinsic turn-on time is negligible. Turn-on speed is substantially controlled by LS + LD.
* Current is limited by package and internal wires
Thermal Resistance
Parameter
RthJC
Junction-to-Case
Min Typ Max Units
—
—
2.5
Test Conditions
°C/W
Note: Corresponding Spice and Saber models are available on the G&S Website.
For footnotes refer to the last page
2
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IRF7NJZ44V
1000
1000
VGS
15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM 4.5V
100
100
10
4.5V
1
20µs PULSE WIDTH
T = 25 C
1
10
100
2.5
R DS(on) , Drain-to-Source On Resistance
(Normalized)
ID, Drain-to-Source Current (Α )
T J = 150°C
T J = 25°C
10
VDS = 25V
15
20µs PULSE
WIDTH
1
5.5
6.0
6.5
7.0
7.5
8.0
VGS, Gate-to-Source Voltage (V)
Fig 3. Typical Transfer Characteristics
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10
100
Fig 2. Typical Output Characteristics
100
5.0
°
J
1
VDS , Drain-to-Source Voltage (V)
Fig 1. Typical Output Characteristics
4.5
20µs PULSE WIDTH
T = 150 C
1
0.1
VDS , Drain-to-Source Voltage (V)
4.0
4.5V
10
°
J
0.1
0.1
VGS
15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM 4.5V
TOP
I D , Drain-to-Source Current (A)
I D , Drain-to-Source Current (A)
TOP
ID = 22A
2.0
1.5
1.0
0.5
0.0
-60 -40 -20
VGS = 10V
0
20
40
60
80 100 120 140 160
TJ , Junction Temperature( °C)
Fig 4. Normalized On-Resistance
Vs. Temperature
3
IRF7NJZ44V
VGS = 0V,
f = 1MHz
Ciss = Cgs + Cgd , Cds SHORTED
Crss = Cgd
Coss = Cds + Cgd
2000
1500
1000
500
0
ID = 22A
16
12
8
4
FOR TEST CIRCUIT
SEE FIGURE 13
10
100
0
20
VDS , Drain-to-Source Voltage (V)
40
60
80
QG , Total Gate Charge (nC)
Fig 5. Typical Capacitance Vs.
Drain-to-Source Voltage
Fig 6. Typical Gate Charge Vs.
Gate-to-Source Voltage
1000
100
ID, Drain-to-Source Current (A)
TJ = 150 ° C
TJ = 25 ° C
1
V GS = 0 V
0.6
OPERATION IN THIS AREA LIMITED
BY RDS(on)
100
10
0.1
0.4
0.8
1.0
1.2
VSD ,Source-to-Drain Voltage (V)
Fig 7. Typical Source-Drain Diode
Forward Voltage
4
VDS = 48V
VDS = 30V
VDS = 12V
0
1
ISD , Reverse Drain Current (A)
C, Capacitance (pF)
2500
20
VGS , Gate-to-Source Voltage (V)
3000
1.4
100µs
10
1ms
1
10ms
Tc = 25°C
Tj = 150°C
Single Pulse
0.1
1
10
100
1000
VDS , Drain-toSource Voltage (V)
Fig 8. Maximum Safe Operating Area
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IRF7NJZ44V
40
RD
V DS
LIMITED BY PACKAGE
I D , Drain Current (A)
VGS
D.U.T.
30
RG
20
Pulse Width ≤ 1 µs
Duty Factor ≤ 0.1 %
+
-V DD
VGS
Fig 10a. Switching Time Test Circuit
10
VDS
90%
0
25
50
75
100
125
150
TC , Case Temperature ( ° C)
Fig 9. Maximum Drain Current Vs.
Case Temperature
10%
VGS
td(on)
tr
t d(off)
tf
Fig 10b. Switching Time Waveforms
Thermal Response (Z thJC )
10
D = 0.50
1
0.20
0.10
0.05
0.1
0.02
0.01
P DM
SINGLE PULSE
(THERMAL RESPONSE)
t1
t2
Notes:
1. Duty factor D = t 1 / t 2
2. Peak T J = P DM x Z thJC + TC
0.01
0.00001
0.0001
0.001
0.01
0.1
1
t1 , Rectangular Pulse Duration (sec)
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
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5
IRF7NJZ44V
1 5V
D R IV E R
L
VD S
D .U .T.
RG
+
V
- DD
IA S
VGS
20V
tp
A
0 .0 1 Ω
Fig 12a. Unclamped Inductive Test Circuit
EAS , Single Pulse Avalanche Energy (mJ)
120
TOP
100
BOTTOM
ID
10A
14A
22A
80
60
40
20
0
25
50
75
100
125
150
Starting TJ , Junction Temperature ( °C)
V (B R )D S S
tp
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
IAS
Current Regulator
Same Type as D.U.T.
Fig 12b. Unclamped Inductive Waveforms
50KΩ
.2µF
12V
.3µF
QG
10V
D.U.T.
QGS
+
V
- DS
QGD
VGS
VG
3mA
IG
Charge
Fig 13a. Basic Gate Charge Waveform
6
ID
Current Sampling Resistors
Fig 13b. Gate Charge Test Circuit
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IRF7NJZ44V
Footnotes:
 Repetitive Rating; Pulse width limited by
ƒ ISD ≤ 22A, di/dt ≤ 278A/µs,
maximum junction temperature.
‚ VDD = 25 V, Starting TJ = 25°C, L= 0.27mH
Peak IAS = 22A, VGS = 10V, RG= 25Ω
„ Pulse width ≤ 300 µs; Duty Cycle ≤ 2%
VDD ≤ 22V, TJ ≤ 150°C
Case Outline and Dimensions — SMD-0.5
PAD ASSIGNMENTS
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.
Data and specifications subject to change without notice. 04/02
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