I27139- 01/03 FC40SA50FK Applications ! Switch Mode Power Supply (SMPS) ! Uninterruptible Power Supply ! High Speed Power Switching ! Hard Switched and High Frequency Circuits HEXFET® Power MOSFET VDSS RDS(on) typ. ID 0.084 Ω 40A 500V Benefits ! Low Gate Charge Qg results in Simple Drive Requirement ! Improved Gate, Avalanche and Dynamic dv/dt Ruggedness ! Fully Characterized Capacitance and Avalanche Voltage and Current ! Low RDS(on) ! Fully Insulated Package SOT-227 Absolute Maximum Ratings Parameter ID @ TC = 25°C ID @ TC = 100°C IDM PD @TC = 25°C VGS dv/dt TJ TSTG Continuous Drain Current, VGS @ 10V Continuous Drain Current, VGS @ 10V Pulsed Drain Current " Power Dissipation Linear Derating Factor Gate-to-Source Voltage Peak Diode Recovery dv/dt # Operating Junction and Storage Temperature Range Max. Units 40 26 160 430 3.45 ± 30 9.0 -55 to + 150 A W W/°C V V/ns °C Avalanche Characteristics Symbol EAS IAR EAR Parameter Single Pulse Avalanche Energy$ Avalanche Current" Repetitive Avalanche Energy" Typ. Max. Units – – – 1240 40 43 mJ A mJ Typ. Max. Units – 0.05 0.29 – °C/W Thermal Resistance Symbol RθJC RθCS www.irf.com Parameter Junction-to-Case Case-to-Sink, Flat, Greased Surface 1 I27139- 01/03 FC40SA50FK Static @ TJ = 25°C (unless otherwise specified) Symbol V(BR)DSS RDS(on) VGS(th) Parameter Drain-to-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient Static Drain-to-Source On-Resistance Gate Threshold Voltage IDSS Drain-to-Source Leakage Current IGSS Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage ∆V(BR)DSS/∆TJ Min. Typ. Max. Units Conditions 500 – – V VGS = 0V, ID = 250µA – 0.60 – V/°C Reference to 25°C, ID = 1mA( – 0.084 0.10 Ω VGS = 10V, ID = 24A % 3.0 – 5.0 V VDS = VGS, ID = 250µA – – 50 VDS = 500V, VGS = 0V µA – – 250 VDS = 400V, VGS = 0V, TJ = 125°C – – 250 VGS = 30V nA – – -250 VGS = -30V Dynamic @ TJ = 25°C (unless otherwise specified) Symbol gfs Qg Qgs Qgd td(on) tr td(off) tf Ciss Coss Crss Coss Coss Coss eff. Parameter Forward Transconductance Total Gate Charge Gate-to-Source Charge Gate-to-Drain ("Miller") Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Input Capacitance Output Capacitance Reverse Transfer Capacitance Output Capacitance Output Capacitance Effective Output Capacitance Min. Typ. Max. Units Conditions 23 – – S VDS = 50V, ID = 28A – – 270 ID = 40A – – 84 nC VDS = 400V – – 130 VGS = 10V, See Fig. 6 and 13 % – 25 – VDD = 250V – 140 – I D = 40A ns – 55 – RG = 1.0Ω – 74 – VGS = 10V,See Fig. 10 % – 8310 – VGS = 0V – 960 – VDS = 25V – 120 – pF ƒ = 1.0MHz, See Fig. 5 – 10170 – VGS = 0V, VDS = 1.0V, ƒ = 1.0MHz – 240 – VGS = 0V, VDS = 480V, ƒ = 1.0MHz – 440 – VGS = 0V, VDS = 0V to 480V ' Diode Characteristics Symbol IS ISM Parameter Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) " Min. Typ. Max. Units Conditions – – 40 MOSFET symbol showing the A – – 160 integral reverse p-n junction diode. VSD Diode Forward Voltage – – 1 trr Reverse Recovery Time – 620 940 Qrr Reverse Recovery Charge – 14 21 38 - V ns µC A D G S TJ = 25°C, IS = 40A, VGS = 0V % TJ = 25°C, IF = 47A di/dt = 100A/µs % IRRM Reverse Recovery Current – TJ = 25°C ton Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD) Notes: " Repetitive rating; pulse width limited by max. junction temperature. (See Fig. 11) $ Starting TJ = 25°C, L = 1.55mH, RG = 25Ω, IAS = 40A, dv/dt =5.5V/ns (See Figure 12a) % Pulse width ≤ 300µs; duty cycle ≤ 2%. ' Coss eff. is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 80% VDSS # ISD ≤ 40A, di/dt ≤ 150A/µs, VDD ≤ V(BR)DSS, TJ ≤ 150°C 2 www.irf.com I27139- 01/03 FC40SA50FK 1000 1000 V GS VGS 15 10 8.0 7.0 6.0 5.5 B O TTO M 5.0 100 10 TO P ID, Drain-to-Source Current (A) ID, Drain-to-Source Current (A) TO P 1 5V 0.1 20 µs PULSE WIDTH TJ=25°C 0.01 15 10 8.0 7.0 6.0 5.5 5.0 B O TTO M 4.5 100 10 4.5 V 1 20 µs PULSE WIDTH T 150°C 0.1 0.1 1 10 100 0.1 VDS, Drain-to-Source Voltage (V) 10 100 Fig 2. Typical Output Characteristics Fig 1. Typical Output Characteristics 3.5 100 RDS(on), Drain-to-Source On Resistance (Normalized) 1000 ID, Drain-to-Source Current (A) 1 VDS, Drain-to-Source Voltage (V) TJ =150°C 10 TJ =25°C 1 V DS =20V 20µs PULSE WIDTH 3.0 ID=24A 2.5 2.0 1.5 1.0 V GS =10V 0.5 0.0 0.1 4 5 6 7 8 9 10 11 V GS , Gate-to-Source Voltage (V) Fig 3. Typical Transfer Characteristics www.irf.com 12 -60 -40 -20 0 20 40 60 80 100 120 140 160 TJ , Junction Temperature (°C) Fig 4. Normalized On-Resistance Vs. Temperature 3 I27139- 01/03 FC40SA50FK 20 100000 C, Capacitance(pF) 10000 = 0V, f = 1 MHZ = Cgs + C gd, Cds SHORTED =C gd = Cds + C gd ID =40A VGS, Gate-to-Source Voltage (V) VGS Ciss C rss Coss Ciss 1000 Coss 100 Crss 15 10 5 0 10 1 10 100 0 1000 VDS, Drain-to-Source Voltage (V) 200 300 QG, Total Gate Charge (nC) Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage 1000 1000 OPERATION IN THIS AREA LIMITED BY RDS(on) 100 ID, Drain Current (A) ISD, Reverse Drain Current (A) 100 TJ=150°C 10 TJ=25°C 100 100us 10 1 VGS=0 10ms 1 0.1 0.2 0.7 1.2 VSD, Source-to-Drain Voltage (V) Fig 7. Typical Source-Drain Diode Forward Voltage 4 1ms TC = 25°C TJ = 150°C Single Pulse 1.7 10 100 1000 V DS, Drain-to-Source Voltage (V) Fig 8. Maximum Safe Operating Area www.irf.com I27139- 01/03 FC40SA50FK 40 RD VDS ID, Drain Current (A) VGS D.U.T. 30 RG 20 Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 % + -VDD 10V Fig 10a. Switching Time Test Circuit 10 VDS 90% 0 25 50 75 100 125 150 TC, Case Temperature (°C) 10% VGS Fig 9. Maximum Drain Current Vs. Case Temperature td(on) tr t d(off) tf Fig 10b. Switching Time Waveforms Thermal Response ( ZthJC 1.000 D = 0.50 0.30 0.100 τJ 0.10 0.05 0.010 0.02 0.01 0.001 0.00001 SINGLE PULSE (THERMAL RESPONSE) 0.0001 0.001 R1 R1 τJ τ1 τ1 R2 R2 τ2 Ci= τi/Ri Ci i/Ri R3 R3 τC τ τ2 τ3 τ3 Ri (°C/W) 0.161 τi (sec) 0.000759 0.210 0.017991 0.147 0.06094 Notes: 1. Duty factor D = t1/t2 2. Peak TJ=PDM x ZthJC + TC 0.01 0.1 1 t1, Rectangular Pulse Duration (s) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case www.irf.com 5 I27139- 01/03 FC40SA50FK EAS, Single Pulse Avalanche Energy (mJ) 3000 ID ... 18A 26A 40A TOP 2500 BOTTOM 15V 2000 DRIVER L VDS 1500 D.U.T RG 1000 + V - DD IAS 20V 0.01Ω tp 500 A Fig 12c. Unclamped Inductive Test Circuit 0 25 50 75 100 125 150 S tarting TJ, Junction Tem perature (°C) Fig 12a. Maximum Avalanche Energy Vs. Drain Current V(BR)DSS tp I AS Fig 12d. Unclamped Inductive Waveforms R L QG + D.U .T. VG S V DS - VGS V QGS 1m A QGD ID VG Charge Fig 13a. Gate Charge Test Circuit 6 Fig 13b. Basic Gate Charge Waveform www.irf.com I27139- 01/03 FC40SA50FK Peak Diode Recovery dv/dt Test Circuit + D.U.T Circuit Layout Considerations • Low Stray Inductance • Ground Plane • Low Leakage Inductance Current Transformer # + $ - - % + " • • • • RG Driver Gate Drive P.W. + dv/dt controlled by RG Driver same type as D.U.T. ISD controlled by Duty Factor "D" D.U.T. - Device Under Test Period D= - VDD P.W. Period VGS=10V * D.U.T. ISD Waveform Reverse Recovery Current Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt Re-Applied Voltage Body Diode VDD Forward Drop Inductor Curent Ripple ≤ 5% ISD * VGS = 5V for Logic Level Devices Fig 14. For N-Channel HEXFET® Power MOSFETs www.irf.com 7 I27139- 01/03 FC40SA50FK SOT-227 Package Details 38.30 ( 1.508 ) 37.80 ( 1.488 ) 4.40 (.173 ) 4.20 (.165 ) CHAMFER 2.00 ( .079 ) X 457 -A4 LEAD ASSIGMENTS E C S 3 6.25 ( .246 ) 12.50 ( .492 ) 1 D 4 1 25.70 ( 1.012 ) 25.20 ( .992 ) E G IGBT -B- A1 K2 4 Note : 1 2 R FULL 7.50 ( .295 ) 3 2 AUX-S S G HEXFET HEXFET 3 2 AUX-S is a low current input K1 A2 intended for driving purpose only HEXFRED 15.00 ( .590 ) 30.20 ( 1.189 ) 29.80 ( 1.173 ) 4X 2.10 ( .082 ) 1.90 ( .075 ) 8.10 ( .319 ) 7.70 ( .303 ) 0.25 ( .010 ) M C A M B M 2.10 ( .082 ) 1.90 ( .075 ) 12.30 ( .484 ) 11.80 ( .464 ) -C0.12 ( .005 ) QUANTITY PER TUBE IS 10 M4 SREW AND WASHER INCLUDED Data and specifications subject to change without notice. This product has been designed and qualified for Industrial Level. IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 TAC Fax: (310) 252-7903 Visit us at www.irf.com for sales contact information.01/02 8 www.irf.com