PHILIPS BRY39

DISCRETE SEMICONDUCTORS
DATA SHEET
M3D082
BRY39
Programmable unijunction
transistor/
Silicon controlled switch
Product specification
Supersedes data of September 1994
File under Discrete Semiconductors, SC04
1997 Jul 24
Philips Semiconductors
Product specification
Programmable unijunction transistor/
Silicon controlled switch
FEATURES
BRY39
PINNING
• Silicon controlled switch
PIN
• Programmable unijunction
transistor.
APPLICATIONS
DESCRIPTION
1
cathode
2
cathode gate
3
anode gate (connected to case)
4
anode
• Switching applications such as:
– Motor control
– Oscillators
– Relay replacement
a
handbook, halfpage
1
– Timers
book, halfpage
ag
2
– Pulse shapers, etc.
4
kg
3
MSB028
DESCRIPTION
k
Silicon planar PNPN switch or trigger
device in a TO-72 metal package.
It is an integrated PNP/NPN transistor
pair with all electrodes accessible.
MGL168
Fig.1 Simplified outline (TO-72) and symbol.
QUICK REFERENCE DATA
SYMBOL
PARAMETER
CONDITIONS
MAX.
UNIT
Silicon controlled switch
PNP TRANSISTOR
VEBO
emitter-base voltage
open collector
−70
V
NPN TRANSISTOR
VCBO
collector-base voltage
IERM
repetitive peak emitter current
Ptot
total power dissipation
open emitter
70
V
−2.5
A
Tamb ≤ 25 °C
275
mW
Tj
junction temperature
150
°C
VAK
forward on-state voltage
IA = 50 mA; IAG = 0; RKG-K = 10 kΩ
1.4
V
IH
holding current
IAG = 10 mA; VBB = −2 V; RKG-K = 10 kΩ
1
mA
ton
turn-on time
0.25
µs
toff
turn-off time
15
µs
70
V
175
mA
150
°C
0.2
µA
Programmable unijunction transistor
VGA
gate-anode voltage
IA
anode current (DC)
Tj
junction temperature
Ip
peak point current
1997 Jul 24
Tamb ≤ 25 °C
VS = 10 V; RG = 10 kΩ
2
Philips Semiconductors
Product specification
Programmable unijunction transistor/
Silicon controlled switch
BRY39
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 134).
SYMBOL
PARAMETER
CONDITIONS
Tamb ≤ 25 °C
MIN.
MAX.
UNIT
Ptot
total power dissipation
−
275
mW
Tstg
storage temperature
−65
+200
°C
Tj
junction temperature
−
150
°C
Tamb
operating ambient temperature
−65
+150
°C
Silicon controlled switch
VCBO
VCER
collector-base voltage
open emitter
PNP
−
−70
V
NPN
−
70
V
−
−
V
−
70
V
−
−70
V
−
−
V
−
−70
V
−
5
V
−
−
−
175
PNP
−
−
NPN
−
175
mA
PNP
−
175
mA
NPN
−
−175
mA
PNP
−
2.5
A
NPN
−
−2.5
A
−
70
V
−
175
mA
collector-emitter voltage
RBE = 10 kΩ
PNP
NPN
VCEO
collector-emitter voltage
open base
PNP
NPN
VEBO
emitter-base voltage
open collector
PNP
NPN
IC
collector current (DC)
note 1
PNP
NPN
ICM
IE
IERM
peak collector current
mA
note 2
emitter current (DC)
repetitive peak emitter current
tp = 10 µs; δ = 0.01
Programmable unijunction transistor
VGA
gate-anode voltage
IA
anode current (AV)
1997 Jul 24
Tamb ≤ 25 °C
3
Philips Semiconductors
Product specification
Programmable unijunction transistor/
Silicon controlled switch
SYMBOL
IARM
BRY39
PARAMETER
repetitive peak anode current
CONDITIONS
tp = 10 µs; δ = 0.01
MIN.
−
MAX.
2.5
UNIT
A
IASM
non-repetitive peak anode current
tp = 10 µs; Tj = 150 °C
−
3
A
dIA/dt
rate of rise of anode current
IA ≤ 2.5 A
−
20
A/µs
Notes
1. Provided the IE rating is not exceeded.
2. During switching on, the device can withstand the discharge of a capacitor of a maximum value of 500 pF. This
capacitor is charged when the transistor is in cut-off condition, with a collector supply voltage of 160 V and a series
resistance of 100 kΩ.
THERMAL CHARACTERISTICS
SYMBOL
Rth j-a
PARAMETER
CONDITIONS
thermal resistance from junction to ambient
VALUE
UNIT
450
K/W
in free air
CHARACTERISTICS
Tamb = 25 °C unless otherwise specified.
SYMBOL
PARAMETER
CONDITIONS
MIN.
MAX.
UNIT
Silicon controlled switch
INDIVIDUAL PNP TRANSISTOR
IB = 0; VCE = −70 V; Tj = 150 °C
−
−10
µA
emitter cut-off current
IC = 0; VEB = −70 V; Tj = 150 °C
−
−10
µA
DC current gain
IE = 1 mA; VCE = −5 V
3
15
VCE = 70 V; RBE = 10 kΩ
−
100
nA
VCE = 70 V; RBE = 10 kΩ; Tj = 150 °C −
10
µA
ICEO
collector cut-off current
IEBO
hFE
INDIVIDUAL NPN TRANSISTOR
ICER
collector cut-off current
IEBO
emitter cut-off current
IC = 0; VEB = 5 V; Tj = 150 °C
−
10
µA
VCEsat
collector-emitter saturation voltage
IC = 10 mA; IB = 1 mA
−
0.5
V
VBEsat
base-emitter saturation voltage
IC = 10 mA; IB = 1 mA
−
0.9
V
hFE
DC current gain
IC = 10 mA; VCE = 2 V
50
−
Cc
collector capacitance
IE = ie = 0; VCB = 20 V
−
5
pF
Ce
emitter capacitance
IC = ic = 0; VEB = 1 V; f = 1 MHz
−
25
pF
fT
transition frequency
IC = 10 mA; VCE = 2 V; f = 100 MHz
100
−
MHz
COMBINED DEVICE
VAK
IH
1997 Jul 24
forward on-state voltage
holding current
RKG-K = 10 kΩ
IA = 50 mA; IAG = 0
−
1.4
V
IA = 50 mA; IAG = 0; Tj = −55 °C
−
1.9
V
IA = 1 mA; IAG = 10 mA
−
1.2
V
−
1
mA
VBB = −2 V; IAG = 10 mA;
RKG-K = 10 kΩ; see Fig.14
4
Philips Semiconductors
Product specification
Programmable unijunction transistor/
Silicon controlled switch
SYMBOL
BRY39
PARAMETER
CONDITIONS
MIN.
MAX.
UNIT
SWITCHING TIMES
ton
turn-on time
toff
turn-off time
VKG-K = −0.5 to 4.5 V; RKG-K = 1 kΩ;
see Figs 15 and 16
−
0.25
µs
VKG-K = −0.5 to 0.5 V; RKG-K = 10 kΩ
−
1.5
µs
RKG-K = 10 kΩ; see Figs 17 and 18
−
15
µs
VS = 10 V; RG = 10 kΩ;
see Figs 3 and 8
−
0.2
µA
VS = 10 V; RG = 100 kΩ;
see Figs 3 and 8
−
0.06
µA
VS = 10 V; RG = 10 kΩ;
see Figs 3 and 8
−
2
µA
VS = 10 V; RG = 100 kΩ;
see Figs 3 and 8
−
1
µA
Programmable unijunction transistor
peak point current
Ip
Iv
valley point current
Voffset
offset voltage
typical curve; IA = 0; for VP and VS
see Fig.8
−
−
V
IGAO
gate-anode leakage current
IK = 0; VGA = 70 V
−
10
nA
IGKS
gate-cathode leakage current
VAK = 0; VKG = 70 V
−
100
nA
VAK
anode-cathode voltage
IA = 100 mA
−
1.4
V
VOM
peak output voltage
VAA = 20 V; C = 10 nF;
see Figs 9 and 11
6
−
V
tr
rise time
VAA = 20 V; C = 10 nF; see Fig.11
−
80
ns
Explanation of symbols
For application of the BRY39 as a programmable
unijunction transistor, only the anode gate is used. To
simplify the symbols, the term gate instead of anode gate
will be used (see Fig.2).
handbook, halfpage
anode
a
g
gate
k
cathode
Fig.2
1997 Jul 24
MBB700
Programmable unijunction transistor
explanation of symbols.
5
Philips Semiconductors
Product specification
Programmable unijunction transistor/
Silicon controlled switch
BRY39
+VB
handbook, halfpage
handbook, halfpage
a
IA
(1)
C
1 nF
RG
g
R2
DUT
DUT
VS
k
R1
MEA142
MEA141
Fig.3
Programmable unijunction transistor test
circuit for peak and valley points.
handbook, halfpage
Fig.4
Programmable unijunction transistor with
‘program’ resistors R1 and R2.
IA
handbook, halfpage
RG =
VAK
DUT
VS =
DUT
R1 R2
R1 R2
R1
R1 R2
I GAO
VB
VGA
MBB697
MBB699
Fig.5
1997 Jul 24
Programmable unijunction transistor
equivalent test circuit for characteristics
testing.
Fig.6
6
Programmable unijunction transistor
equivalent test circuit for gate-anode
leakage current.
Philips Semiconductors
Product specification
Programmable unijunction transistor/
Silicon controlled switch
BRY39
IA
handbook, halfpage
I GKS
handbook, halfpage
DUT
VGK
I(V)
MBB696
I(P)
VS V(P)
VAK
MEA143
Fig.7
Programmable unijunction transistor
equivalent test circuit for gate-cathode
leakage current.
Fig.8
Programmable unijunction transistor
offset voltage.
handbook, halfpage
VAA
handbook, halfpage
1.5
MΩ
MBB701
VO
VOM
90 %
16 kΩ
DUT
C
VO
20 Ω
27 kΩ
10 %
MBB698
tr
Fig.9
1997 Jul 24
Programmable unijunction transistor test
circuit for peak output voltage.
time
Fig.10 Programmable unijunction transistor peak
output voltage.
7
Philips Semiconductors
Product specification
Programmable unijunction transistor/
Silicon controlled switch
BRY39
a (anode)
(e2 )
e2
handbook, halfpage
ag (anode gate)
(c 1,b 2)
PNP transistor
b 1,c 2
kg (cathode gate)
(b1 ,c 2)
P
N
P
NPN transistor
MBB681
e1
k (cathode)
(e1 )
MBB680
Fig.11 Silicon controlled switch two transistor
equivalent circuit.
handbook, halfpage
Fig.12 PNPN silicon controlled switch structure.
a
IA
IA
handbook, halfpage
IAG
IAG
a
ag
IKG
c 1,b 2
N
P
N
VAK
ag
RKG-K
kg
−IK
VBB
k
kg
k
DUT
MBB683
MBB682
Fig.14 Silicon controlled switch equivalent test
circuit for holding current.
Fig.13 Silicon controlled switch symbol.
1997 Jul 24
8
Philips Semiconductors
Product specification
Programmable unijunction transistor/
Silicon controlled switch
BRY39
V
(V)
i
handbook, halfpage
MBB687
4.5
90 %
handbook, halfpage
+12 V
0
–0.5
2.7 kΩ
VAK
16 kΩ
10 %
time
+50 V
RKG-K
VI
VAG-K
MBB685
time
ton
Fig.15 Silicon controlled switch test circuit for
turn-on time.
Fig.16 Silicon controlled switch pulse duration
increased until dashed curve disappears.
VAK halfpage
handbook,
MBB686
(V)
+12 V
handbook, halfpage
12
+50 V
1 kΩ
2.7 kΩ
C = Copt
16 kΩ
C
VAK
tq
mercury
wetted
contact
0
C < Copt
time
RKG-K
MBB684
– 12
Fig.18 Silicon controlled switch capacitance
increased until C = Copt dashed curve
disappears.
Fig.17 Silicon controlled switch test circuit for
turn-on time.
1997 Jul 24
9
Philips Semiconductors
Product specification
Programmable unijunction transistor/
Silicon controlled switch
BRY39
MBB583
MBB584
1.8
1.2
handbook, halfpage
handbook, halfpage
hFE
h FE
X
VAG-K = 5 V
X
1.4
0.8
2V
1.0
0.4
0.6
0
0
50
IAG (mA)
0
100
X = value of hFE at IC = 10 mA; VAG-K = 2 V; Tamb = 25 °C.
50
100
Tamb ( o C)
150
X = value of hFE at IAG = 10 mA; VAG-K = 2 V; Tamb = 25 °C.
Fig.19 Silicon controlled switch normalized
DC current gain as a function of
anode gate current.
Fig.20 Silicon controlled switch normalized
DC current gain as a function of
ambient temperature.
MBB581
MBB587
1.2
1.2
handbook, halfpage
handbook, halfpage
IH
VAK
X
X
1.1
1
1
0.8
0.9
0.8
−50
0.6
50
0
50
100
150
Tamb ( o C)
X = value of VAK at IA = 1 mA; IAG = 10 mA; VBB = −2 V;
RKG-K = 10 kΩ; Tamb = 25 °C.
50
100
150
Tamb (oC)
X = value of IH at IAG = 10 mA; VBB = −2 V; RKG-K = 10 kΩ;
Tamb = 25 °C.
Fig.21 Silicon controlled switch normalized
anode-cathode voltage as a function of
ambient temperature.
1997 Jul 24
0
Fig.22 Silicon controlled switch normalized
holding current as a function of
ambient temperature.
10
Philips Semiconductors
Product specification
Programmable unijunction transistor/
Silicon controlled switch
BRY39
MBB580
300
handbook, halfpage
P tot
(mW)
200
100
0
0
50
150
Tamb ( o C)
150
Fig.23 Silicon controlled switch power
derating curve.
MBB582
10 4
handbook, full pagewidth
Z thj-a
(K/W)
10 3
10
2
10
1
10 5
10 4
10 3
10 2
10 1
1
10
10 2
10 3
Fig.24 Silicon controlled switch thermal impedance as a function of pulse duration.
1997 Jul 24
11
t p (s)
10 4
Philips Semiconductors
Product specification
Programmable unijunction transistor/
Silicon controlled switch
BRY39
MBB585
10
handbook, full pagewidth
IA
(A)
δ = 0.01
0.02
0.05
1
0.1
0.2
0.5
10−1
10−2
10−2
10−1
1
10
tp (ms)
102
Tamb = 25 °C.
Fig.25 Silicon controlled switch anode current as a function of pulse duration.
MBB586
10
handbook, full pagewidth
IA
(A)
δ = 0.01
0.02
1
0.05
0.1
0.2
0.5
10−1
10−2
10−2
10−1
1
10
tp (ms)
Tamb = 70 °C.
Fig.26 Silicon controlled switch anode current as a function of pulse duration.
1997 Jul 24
12
102
Philips Semiconductors
Product specification
Programmable unijunction transistor/
Silicon controlled switch
BRY39
PACKAGE OUTLINE
Metal-can cylindrical single-ended package; 4 leads
SOT18/9
α
j
seating plane
B
w M A M B M
1
b
4
k
D1
2
3
a
D
A
A
0
5
L
10 mm
scale
DIMENSIONS (millimetre dimensions are derived from the original inch dimensions)
UNIT
A
a
b
D
D1
j
k
L
w
α
mm
5.31
4.74
2.54
0.46
0.42
5.45
5.30
4.70
4.55
1.05
0.95
1.0
0.9
14.5
13.5
0.36
45°
REFERENCES
OUTLINE
VERSION
IEC
JEDEC
SOT18/9
B12/C7 type 3
TO-72
1997 Jul 24
EIAJ
EUROPEAN
PROJECTION
ISSUE DATE
97-04-18
13
Philips Semiconductors
Product specification
Programmable unijunction transistor/
Silicon controlled switch
BRY39
DEFINITIONS
Data sheet status
Objective specification
This data sheet contains target or goal specifications for product development.
Preliminary specification
This data sheet contains preliminary data; supplementary data may be published later.
Product specification
This data sheet contains final product specifications.
Limiting values
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or
more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation
of the device at these or at any other conditions above those given in the Characteristics sections of the specification
is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices, or systems where malfunction of these
products can reasonably be expected to result in personal injury. Philips customers using or selling these products for
use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such
improper use or sale.
1997 Jul 24
14
Philips Semiconductors
Product specification
Programmable unijunction transistor/
Silicon controlled switch
BRY39
NOTES
1997 Jul 24
15
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© Philips Electronics N.V. 1997
SCA55
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Printed in The Netherlands
117047/00/01/pp16
Date of release: 1997 Jul 24
Document order number:
9397 750 02639